KR200485752Y1 - Probe unit clamping device for inspecting display panel - Google Patents

Probe unit clamping device for inspecting display panel Download PDF

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Publication number
KR200485752Y1
KR200485752Y1 KR2020150008369U KR20150008369U KR200485752Y1 KR 200485752 Y1 KR200485752 Y1 KR 200485752Y1 KR 2020150008369 U KR2020150008369 U KR 2020150008369U KR 20150008369 U KR20150008369 U KR 20150008369U KR 200485752 Y1 KR200485752 Y1 KR 200485752Y1
Authority
KR
South Korea
Prior art keywords
probe unit
rod
display panel
probe
rotary cylinder
Prior art date
Application number
KR2020150008369U
Other languages
Korean (ko)
Other versions
KR20170002318U (en
Inventor
박금성
김현겸
Original Assignee
(주)영우디에스피
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by (주)영우디에스피 filed Critical (주)영우디에스피
Priority to KR2020150008369U priority Critical patent/KR200485752Y1/en
Publication of KR20170002318U publication Critical patent/KR20170002318U/en
Application granted granted Critical
Publication of KR200485752Y1 publication Critical patent/KR200485752Y1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

More particularly, the present invention relates to a probe for inspecting a defect of a display panel, and more particularly, to a probe card mounted on a probe unit, the probe unit is firmly and precisely fixed To a probe unit clamping device for inspection of a display panel.
The present invention relates to a probe unit clamping apparatus for a display panel inspection which fixes a probe unit (2) equipped with a probe card to a base (1) on which a display panel is inspected,
A rotary cylinder 110 is vertically installed at both ends of the base to rotate the rod 120. A clamp block 130 is installed at an end of the rod so that the rod is positioned on the seating area of the probe unit only when the rod rotates. ) Are combined,
When the rod of the rotary cylinder rotates toward the probe unit and is pulled into the rotary cylinder, the clamping block moves to the seating area of the probe unit and descends while pressing the upper surface of the probe unit to clamp the probe unit,
The rotary cylinder is installed vertically on the bottom surface of the base,
The rod of the rotary cylinder is installed so as to penetrate through the base.

Description

Technical Field [0001] The present invention relates to a probe unit clamping device for inspecting a display panel,

More particularly, the present invention relates to a probe for inspecting a defect of a display panel, and more particularly, to a probe card mounted on a probe unit, the probe unit is firmly and precisely fixed To a probe unit clamping device for inspection of a display panel.

In general, a plurality of electrode pads are arranged at a narrow pitch in a display panel used in a television, a notebook computer, or a mobile phone so that various electrical signals such as a video signal, a sync signal, and a color signal can be applied to the edge.

Such a display panel is inspected for defective pixels by applying an electrical signal to the electrode pad using a probe after fabrication.

A conventional display panel inspection probe comprises a probe unit on which a probe card is mounted and a base on which a probe unit is fixed and on which a display panel is inspected.

In a state where the probe unit is fixed to the base, the probe card must maintain a precise flatness. If the probe card can not achieve a precise flatness, a plurality of probe pins formed on the probe card at a narrow pitch corresponding to one-to-one correspondence to the electrode pads do not normally contact the electrode pads, thereby greatly reducing the reliability of the inspection.

However, since the probe unit for a conventional display panel inspection is assembled through bolt fastening to the base, it is possible to inspect the display panel of another kind by separating the existing probe unit from the base It was very inconvenient to replace it with a new probe unit.

In order to solve such a problem, a display panel inspection probe having a clamp device capable of easily fixing the probe unit to the base has recently been developed.

1, the above-described display panel inspection probe unit clamping apparatus comprises a pair of first cams 10 formed on both sides of a base 1 so as to be movable in forward and backward directions, And a clamping groove 30 formed in the probe unit 2 so as to correspond to the first cam 10 and the second cam 20. The second cam 20 includes a plurality of second cams 20, do. The clamping grooves 30 are formed to be narrower toward the one side and the cams 10 and 20 are fixed to the moving block 11 and the moving block 11 so that the cam rollers 11 and 20, (12).

In the conventional probe unit clamping apparatus for inspecting a display panel, when the probe unit 2 is placed on the base 1, the cam rollers are inserted into the clamping groove 30. Since the width of the clamping groove 30 is narrowed toward one side when the movable block 11 moves forward or backward or to one side in the left and right direction, the cam roller 12 is stopped from moving in the clamping groove 30 So that the clamping of the probe unit 2 is naturally performed. When the moving blocks 11 move in the opposite direction, the clamping ecology is released. Therefore, it is very easy and simple to separate and connect the probe unit 2.

However, since the conventional clamping device for a display panel inspection probe unit clamps the cams 10 and 20 while being moved to one side, a constant external force is applied to the probe unit 2 in the clamping direction during the clamping process The alignment state of the probe unit 2 is liable to become poor.

As described above, the conventional clamping device for a probe unit for inspection of a display panel can be expected to have some effect that replacement of the probe unit 2 is easy and simple, but the alignment state of the probe unit 2 becomes poor in the clamping process There is a serious problem that accuracy in the flatness of the probe card is significantly lowered.

The present invention has been made to solve the above problems and it is an object of the present invention to provide a display panel inspection probe capable of easily replacing a probe unit and maintaining a flatness of a probe card, And an object thereof is to provide a unit clamping device.

In order to achieve the above object, the present invention provides a probe unit clamping apparatus for inspecting a display panel which fixes a probe unit on which a probe card is mounted to a base on which a display panel is inspected, A clamp block is coupled to the end of the rod so that the rod is positioned on the seating area of the probe unit only when the rod is rotated so that the rod of the rotary cylinder rotates toward the probe unit, The clamping block is clamped by pushing the upper surface of the probe unit while the clamping block moves down to the seating area of the probe unit and the rotary cylinder is vertically installed on the bottom surface of the base, The rod of .

delete

In addition, it is preferable that a protection pad is provided on the bottom surface of the clamping block to prevent damage to the probe unit and prevent slippage.

In the clamping apparatus for a display panel inspection according to the present invention, the clamp block coupled to the rod end of the rotary cylinder installed at both ends of the base presses the upper surface of both ends of the probe unit vertically simultaneously so that clamping is performed The probe unit does not flow in the clamping process, so that the alignment state of the probe unit and the flatness of the probe card mounted on the probe unit are always maintained precisely.

FIG. 1 is a perspective view of a conventional probe unit clamping device for a display panel inspection. FIG.
FIG. 2 is a perspective view showing the use state of the probe unit clamping device for inspection of a display panel according to the present invention. FIG.
3 is a view showing a process of clamping a probe unit by a probe unit clamping device for inspection of a display panel according to the present invention.
Figure 4 is a front view of Figure 3;

The features and advantages of the present invention will become more apparent from the following detailed description of preferred embodiments with reference to the accompanying drawings. Prior to this, terms and words used in the present specification and claims are to be interpreted in accordance with the technical idea of the present invention, on the basis that the inventor can properly define the concept of a term in order to best explain his / It must be interpreted in terms of meaning and concept.

Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings. The same reference numerals are used for the same components, and only the portions that are not redundantly different for the sake of clarity are mainly described.

2, the present invention is applied to a probe apparatus for inspecting a display panel composed of a probe unit 2 on which a probe card is mounted and a base 1 on which a display panel is inspected, (1).

The present invention comprises a rotary cylinder (110) and a clamp block (130).

The rotary cylinder 110 is a cylinder capable of rotating the rod 120 at a predetermined angle as well as in and out of the rod 120. The rotary cylinder 110 is installed at both ends of the base 1 on which the probe unit 2 is seated. The rotary cylinder 110 in this embodiment is set to return to the original position after rotating the rod 120 by 90 degrees.

The rotary cylinder 110 is installed vertically on the bottom surface of the base 1. The rod 120 of the rotary cylinder 110 is installed so as to pass through the base 1 in a space outside the seating area of the probe unit 2.

The clamp block 130 is coupled to the end of the rod 120 of the rotary cylinder 110 passing through the base 1 and is positioned on the seating area of the probe unit 2 only when the rod 120 rotates. do.

In addition, it is preferable that a protection pad 140 is provided on the bottom surface of the clamping block 130 that contacts the upper surface of the probe unit 2 during the clamping process, to prevent damage to the probe unit 2 and prevent slippage.

The probe unit clamping device for inspection of a display panel having the above-described structure is operated as follows.

2, when the probe unit 2 is mounted on the base 1, the rotary cylinder 110 rotates the rod 120 by 90 ° in the clockwise direction in which the probe unit 2 is located.

3, when the rod 120 rotates, the clamp block 130 coupled to the end of the rod 120 waits outside the seating area of the probe unit 2 and then rotates along the rod 120 And is located on the seating area of the probe unit 2. At this time, the rod 120 rotates 90 degrees in the clockwise direction in which the probe unit 2 is located, and at the same time, the rod 120 starts to be drawn into the rotary cylinder 110.

4, the pulling action of the rod 120 after the rod 120 has been fully rotated is maintained until the clamping block 130 presses the upper surface of the probe unit 2 vertically at a constant pressure , Both ends of the probe unit 2 are firmly clamped when the pulling operation of the rod 120 is terminated.

Accordingly, the probe unit 2 is not allowed to flow in the clamping process, and the alignment state of the probe unit 2 before and after the clamping and the flatness of the probe card mounted on the probe unit 2 are ensured with precision.

On the other hand, the turning operation and the pulling-in operation of the rod 120 may be set to be performed simultaneously as described above, or may be set so that the pulling operation is performed after the rotating operation is completed. If the rotating operation and the drawing operation are simultaneously performed, there is an advantage that the operation speed is increased. If the rotating operation and the drawing operation are sequentially performed, the operation speed is relatively slowed but the operation control of the rotary cylinder 110 is facilitated It may be set appropriately considering the working environment.

Although the present invention has been shown and described with respect to specific embodiments thereof, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention as set forth in the following claims It should also be included in the scope of this invention.

1 ... Base 2 ... Probe unit
110 ... rotary cylinder 120 ... rod
130 ... Clamp block 140 ... Protective pad

Claims (3)

A probe unit clamping apparatus for inspecting a display panel for fixing a probe unit having a probe card mounted thereon to a base on which a display panel is inspected,
A rotary cylinder capable of rotating the rod is vertically installed at both ends of the base, and a clamp block is coupled to the end of the rod so that the rod is positioned on the seating area of the probe unit only when the rod rotates,
When the rod of the rotary cylinder rotates toward the probe unit and is pulled into the rotary cylinder, the clamping block moves to the seating area of the probe unit and descends while pressing the upper surface of the probe unit to clamp the probe unit,
The rotary cylinder is installed vertically on the bottom surface of the base,
And the rod of the rotary cylinder is installed to penetrate the base. delete The method according to claim 1,
Wherein the clamping block further comprises a protection pad on the bottom surface of the clamping block for preventing damage to the probe unit and preventing slippage.
KR2020150008369U 2015-12-21 2015-12-21 Probe unit clamping device for inspecting display panel KR200485752Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2020150008369U KR200485752Y1 (en) 2015-12-21 2015-12-21 Probe unit clamping device for inspecting display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2020150008369U KR200485752Y1 (en) 2015-12-21 2015-12-21 Probe unit clamping device for inspecting display panel

Publications (2)

Publication Number Publication Date
KR20170002318U KR20170002318U (en) 2017-06-29
KR200485752Y1 true KR200485752Y1 (en) 2018-02-19

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KR2020150008369U KR200485752Y1 (en) 2015-12-21 2015-12-21 Probe unit clamping device for inspecting display panel

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102171682B1 (en) * 2019-08-07 2020-10-30 주식회사 디엠엔티 Detachment device of probe block for display panel inspection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015036625A (en) * 2013-08-12 2015-02-23 太洋工業株式会社 Printed circuit board inspection apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101561746B1 (en) * 2013-11-27 2015-10-20 세메스 주식회사 Apparatus for inspecting display cells

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015036625A (en) * 2013-08-12 2015-02-23 太洋工業株式会社 Printed circuit board inspection apparatus

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