TWI505401B - Suction table - Google Patents
Suction table Download PDFInfo
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- TWI505401B TWI505401B TW102121067A TW102121067A TWI505401B TW I505401 B TWI505401 B TW I505401B TW 102121067 A TW102121067 A TW 102121067A TW 102121067 A TW102121067 A TW 102121067A TW I505401 B TWI505401 B TW I505401B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Accommodation For Nursing Or Treatment Tables (AREA)
- Liquid Crystal (AREA)
Description
本發明係關於一種適於如液晶顯示面板或有機發光面板等之顯示板的保持的吸著台。The present invention relates to a sorption table suitable for holding a display panel such as a liquid crystal display panel or an organic light-emitting panel.
在玻璃基板上形成電路之液晶顯示面板的顯示板,例如在製程中,係使用探針台(prober)來接受電性檢查。在此試驗中,一般而言,於組裝在探針台之吸著台上,利用負壓來保持作為被檢查體的液晶顯示面板。A display panel of a liquid crystal display panel in which a circuit is formed on a glass substrate, for example, in a process, a probe is used to receive an electrical inspection. In this test, generally, a liquid crystal display panel as an object to be inspected is held by a negative pressure on a sorption table assembled on a probe station.
為了將已接受檢查的被檢查體從吸著台安全且迅速地移除,吸著台上設置有能夠從吸著面突出之複數個升降銷,以使被檢查體從吸著台之吸著面浮起(例如,參照專利文獻1)。In order to safely and quickly remove the inspected object to be inspected from the suction table, a plurality of lifting pins protruding from the suction surface are provided on the suction table to suck the object to be inspected from the suction table. The surface floats (for example, refer to Patent Document 1).
位在突出位置之升降銷係在吸著面之上方從搬運機器人接受被檢查體時,下降至吸著面下。當被檢查體依該升降銷之下降而移動至前述吸著面上時,利用組裝在吸著台之負壓機構使負壓作用於前述吸著面。在前述被檢查體接受檢查之期間,該被檢查體能藉由前述負壓而確實地保持於前述吸著面。檢查後,隨著升降銷之上升,被檢查體從吸著面被舉起。依前述升降銷而從吸著面被舉 起的前述被檢查體,不會受到作用於吸著面與被檢查體之間的靜電之強大影響,而藉由搬運機器人從吸著台移除。When the lift pin positioned at the protruding position receives the test object from the transport robot above the suction surface, it descends to the suction surface. When the object to be inspected moves to the suction surface by the lowering of the lift pin, a negative pressure is applied to the suction surface by a negative pressure mechanism incorporated in the suction table. During the inspection of the test object, the test object can be reliably held by the suction surface by the negative pressure. After the inspection, the object to be inspected is lifted from the suction surface as the lift pin rises. Lifted from the suction surface according to the aforementioned lifting pin The aforementioned object to be inspected is not strongly affected by static electricity acting between the absorbing surface and the object to be inspected, but is removed from the sorption table by the transport robot.
但是,由於前述的升降銷與被檢查體之接觸面積較小,所以隨著因被檢查體之大型化而造成的重量增加,被檢查體在與升降銷之接觸部所受的局部應力將會變大。由於包含如此的玻璃基板的被檢查體之局部應力的集中,會對被檢查體造成較大之畸變力而希望可避免。However, since the contact area between the lift pin and the object to be inspected is small, the local stress on the contact portion of the test object with the lift pin will increase as the weight increases due to the enlargement of the test object. Become bigger. Due to the concentration of the local stress of the object to be inspected including such a glass substrate, it is desirable to avoid a large distortion force on the object to be inspected.
因此,已有提案以下之技術:由多數個相互地隔開間隔而平行配置的固定保持構件,以及在各固定構件間以能夠升降之於該固定構件而配置的多數個帶狀之升降構件來構成吸著面,且在將被檢查體交接至該吸著面時,使前述升降構件相對於前述固定保持構件降低(例如,參照專利文獻2)。Therefore, there has been proposed a technique in which a plurality of fixed holding members arranged in parallel with each other at intervals and a plurality of belt-shaped lifting members that are arranged to be lifted and lowered between the fixing members are provided. When the object to be inspected is transferred to the suction surface, the elevating member is lowered with respect to the fixed holding member (see, for example, Patent Document 2).
依據專利文獻2所記載之裝置,前述升降構件係在其上升位置與前述固定保持構件共同地構成平坦的吸著面。在進行吸著面與機器臂(robot arm)之被檢查體的交接時,由於機器臂能夠插入於藉由多數個帶狀之前述升降構件下降所形成的空間,所以機器臂和吸著面不會干涉,而且相互地平行配置的複數個固定保持構件會在較寬之帶狀面積支撐被檢查體,故而不會使較強之局部應力作用於被檢查體而可以合適地處理被檢查體。According to the device described in Patent Document 2, the elevating member forms a flat absorbing surface together with the fixed holding member at the raised position. When the suction surface is transferred to the object to be inspected by the robot arm, since the robot arm can be inserted into the space formed by the descending of the plurality of belt-shaped lifting members, the robot arm and the suction surface are not The plurality of fixed holding members which are arranged in parallel and which are arranged in parallel with each other support the object to be inspected in a wide strip-shaped area, so that the strong object can be applied to the object to be inspected without being subjected to strong local stress.
然而,在專利文獻2所記載之裝置中,使吸附保持被檢查體之負壓作用的吸著面係由多數個固定保持構件,以及能夠各別在該固定保持構件間升降的升降構件 所構成。因此,形成吸著面的支撐台之構成會複雜化,並且有必要將使多數個升降構件同時升降的機構設置於支撐台之內部,由於支撐台之構成複雜化,所以有吸著裝置之構成因複雜化而變高價的缺點。However, in the device described in Patent Document 2, the suction surface that adsorbs and holds the negative pressure of the test object is composed of a plurality of fixed holding members and lifting members that can be lifted and lowered between the fixed holding members. Composition. Therefore, the configuration of the support table forming the absorbing surface is complicated, and it is necessary to provide a mechanism for raising and lowering a plurality of lifting members at the same time inside the support table. Since the configuration of the support table is complicated, the absorbing device is constituted. The disadvantage of becoming expensive due to complexity.
(專利文獻1)日本特開2002-246450號公報(Patent Document 1) Japanese Patent Laid-Open Publication No. 2002-246450
(專利文獻2)日本特開2011-29565號公報(Patent Document 2) Japanese Patent Laid-Open Publication No. 2011-29565
因而,本發明之目的係在於提供一種吸著台,其不會招來構成之複雜化,且不會使較強之應力局部作用於作為被檢查體之顯示面板而可以使該顯示面板進行交接時在吸著面上升降。Accordingly, it is an object of the present invention to provide a absorbing table which does not complicate the configuration and which does not cause a strong stress to locally act on the display panel as the object to be inspected, so that the display panel can be handed over. When lifting on the suction surface.
本發明係一種用以保持顯示面板的吸著台,其包含:支撐台,其係具有負壓開口呈開放之吸著面;複數個升降桿,其係橫跨前述吸著面所配置;複數個凹槽,其係為了將前述升降桿不從前述吸著面突出地收容於前述支撐台內而相互地平行設置於前述吸著面;支撐機構,其係在複數個前述凹槽呈開放的前述支撐台之側部以能夠升降之方式支撐前述升降桿;以及升降裝置,其係為了使前述升降桿在從前述凹槽突出的上升位置,以及收容於前述凹槽的下降位置之間升降而連結設置於前述支撐機構,前 述支撐機構係具備:一對支柱,其係用以在該升降桿之兩端部支撐前述升降桿;導銷,其係由該支柱及前述升降桿之其中一方所支撐;以及槽孔,其係為了允許該導銷之貫通而設置於前述支柱及前述升降桿之另一方。The present invention relates to a sorption table for holding a display panel, comprising: a support table having a suction surface with a negative pressure opening; and a plurality of lifting rods disposed across the absorbing surface; a groove for arranging the lifting rods in parallel with each other in the support base so as not to protrude from the suction surface; the support mechanism is open to the plurality of grooves The side of the support table supports the lifting rod in a manner capable of lifting and lowering; and the lifting device is configured to raise and lower the lifting rod between a rising position protruding from the groove and a lowering position of the groove. The connection is set in the aforementioned support mechanism, before The supporting mechanism is provided with: a pair of pillars for supporting the lifting rod at both ends of the lifting rod; a guide pin supported by one of the pillar and the lifting rod; and a slot In order to allow the guide pin to pass through, the other of the support post and the lift rod is provided.
本發明之前述吸著台中,在前述支撐台形成有橫切前述支撐台之前述吸著面之用以收容前述升降桿的前述凹槽。能夠收容於前述凹槽的前述升降桿係藉由設置於前述支撐台之側部的前述支撐機構,在收容於前述凹槽的後退(下降)位置與從前述吸著面突出的突出(上升)位置之間升降。因而,由於不必將前述支撐台如先前般地形成為多數個固定構件及可動構件之集合體,又為了將前述顯示面板交接至前述吸著台而可以用複數個前述升降桿使該顯示面板升降於前述吸著面上,所以不會招來前述吸著台之構成的複雜化,且即便是大型之顯示面板亦可以防止較強之應力局部作用於該顯示面板。In the absorbing table according to the present invention, the support base is formed with the groove for accommodating the lifting rod across the suction surface of the support table. The lifting rod that can be accommodated in the groove is protruded (raised) protruding from the suction surface by a support mechanism provided at a side portion of the support base at a retracted (lowering) position of the groove. Lift between positions. Therefore, since it is not necessary to form the support table as a plurality of sets of the fixed member and the movable member as before, and in order to transfer the display panel to the absorbing table, the display panel can be raised and lowered by using the plurality of lifting rods. Since the absorbing surface is complicated, the configuration of the absorbing table is not complicated, and even a large display panel can prevent a strong stress from locally acting on the display panel.
可以將分別設置於前述一對支柱或前述升降桿之兩端部的一對槽孔之至少一方,形成為沿著前述升降桿之長邊方向伸長的細長之槽孔。藉由此細長之槽孔,由於可以允許朝向前述升降桿之長邊方向的傾斜,所以可以補償在該升降桿之兩端部的升降動作之偏移。At least one of a pair of slits respectively provided at both end portions of the pair of pillars or the lifter bar may be formed as an elongated slot extending in the longitudinal direction of the lifter. By the elongated slot, since the inclination toward the longitudinal direction of the lift lever can be allowed, the offset of the lifting operation at both end portions of the lift lever can be compensated.
前述槽孔可以設置於前述升降桿,且前述槽孔係可以貫通前述升降桿的厚度方向,且沿著該升降桿之長邊方向伸長。The slot may be provided in the lifting rod, and the slot may penetrate the thickness direction of the lifting rod and extend along the longitudinal direction of the lifting rod.
可以在前述支撐機構設置彈簧構件,其係 連結於前述導銷,對於所對應之前述升降桿,賦予朝向該升降桿之長邊方向外方的張力。藉由該彈簧構件之張力,可以抑制前述升降桿之撓曲。A spring member may be disposed on the support mechanism The guide pin is coupled to the tension rod that is outwardly directed toward the longitudinal direction of the lift rod. The deflection of the lifter can be suppressed by the tension of the spring member.
前述升降桿可以在端部附近設置與前述導銷平行之對應的卡止銷,該卡止銷係設置於該升降桿之較設置前述槽孔之位置更靠近內側的位置,而前述彈簧構件可以採用兩端卡止於前述導銷以及與該導銷對應之前述卡止銷的拉伸螺旋彈簧。The lifting rod may be provided with a corresponding locking pin parallel to the guiding pin in the vicinity of the end portion, and the locking pin is disposed at a position closer to the inner side of the lifting rod than the position where the slot is provided, and the spring member may be A tension coil spring that is locked at both ends to the aforementioned guide pin and the aforementioned locking pin corresponding to the guide pin is used.
可在前述支撐機構設置緩和作用於前述升降桿之衝擊的衝擊緩和機構。藉由該衝擊緩和機構,例如當在與機器臂之間交接前述顯示面板時,沒有必要為了避免衝擊作用於該顯示面板而如先前般地使機器臂之動作顯著減速。因此,由於不需要機器臂之緩慢的移動,所以可以謀求產距時間(takt time)之降低。An impact mitigation mechanism that mitigates an impact acting on the lifter can be provided in the support mechanism. With the impact mitigating mechanism, for example, when the display panel is handed over to the robot arm, it is not necessary to significantly decelerate the motion of the robot arm as before to prevent the impact from acting on the display panel. Therefore, since the slow movement of the robot arm is not required, the takt time can be reduced.
前述衝擊緩和機構可以由支柱及壓縮螺旋彈簧所構成,該支柱係由前述支撐台所支撐,且在頂部形成導槽,該導槽能夠於上下方向導引地容納前述升降桿,該壓縮螺旋彈簧係配置於前述導槽之底部與前述升降桿之間。The impact mitigation mechanism may be composed of a struts and a compression coil spring supported by the support base, and a guide groove is formed at the top, and the guide groove can guide the lifting rod in the up and down direction, and the compression coil spring system The utility model is disposed between the bottom of the guiding groove and the lifting rod.
前述升降桿可以設置抵接於前述壓縮螺旋彈簧之端部,用以調整該螺旋彈簧之壓縮量的調整螺桿。藉由取決於該調整螺桿之壓縮量的調整,並按照所能處理的前述顯示面板之大小即重量之變化,就可以適當地調整該壓縮螺旋彈簧之彈簧力,俾使前述壓縮螺旋彈簧之位移 量成為大致一定。The lifting rod may be provided with an adjusting screw that abuts against the end of the compression coil spring for adjusting the compression amount of the coil spring. The spring force of the compression coil spring can be appropriately adjusted according to the adjustment of the compression amount of the adjustment screw, and according to the change of the size of the display panel, that is, the weight of the display panel, and the displacement of the compression coil spring The amount becomes roughly constant.
各支柱係可以設置能夠調整該支柱之長度方向尺寸的高度調整機構。設置於各支柱之各高度調整機構係能夠依前述各升降桿調整該升降桿之傾斜及高度位置。Each of the pillars may be provided with a height adjusting mechanism capable of adjusting the length direction of the pillar. Each height adjusting mechanism provided in each of the pillars can adjust the inclination and height position of the lifting rod according to each of the lifting rods.
前述支撐機構係可以設置在前述支撐台之兩側沿著該支撐台而配置的一對樑構件。該一對樑構件係能夠朝向上下方向移動地由前述支撐台所支撐,可以藉由前述升降裝置之動作而能夠於上下方向移動。在該情況,各梁構件係可以透過前述支柱來支撐對應的前述升降桿之端部。The support mechanism may be provided with a pair of beam members disposed along the support table on both sides of the support table. The pair of beam members are supported by the support table so as to be movable in the vertical direction, and can be moved in the vertical direction by the operation of the lifting device. In this case, each of the beam members can support the end of the corresponding lifting rod through the struts.
又,前述樑構件與各支柱之間係設置有用以調整該支柱之高度位置的前述高度調整機構。Further, the height adjusting mechanism for adjusting the height position of the pillar is provided between the beam member and each of the pillars.
各升降桿可以形成抵接於該升降桿上之前述顯示面板的邊緣,以防止該顯示面板之脫落的肩部。藉由該肩部之止擋功能,可以確實地防止前述顯示面板從前述升降桿不經意的脫落。Each lifting rod may form an edge of the aforementioned display panel that abuts the lifting rod to prevent the falling edge of the display panel. By the stop function of the shoulder, it is possible to surely prevent the aforementioned display panel from being inadvertently detached from the lifting rod.
又,與前述肩部相關地,在前述升降桿之上面,可以設置接近前述肩部,用以防止因前述升降桿上之前述被檢查體的傾斜所引起的該被檢查體之邊緣與前述上面之干涉的餘隙槽。藉此,將前述被檢查體配置於前述升降桿上或從該升降桿上移除時,即便前述被檢查體相對於前述升降桿傾斜,亦可以防止該被檢查體之邊緣與前述升降桿之上面的抵接,所以可以防止因該抵接所引起的被 檢查體之損傷。Further, in relation to the shoulder portion, an upper surface of the lifting rod may be disposed adjacent to the shoulder portion for preventing an edge of the object to be inspected and the foregoing surface caused by the inclination of the object to be inspected on the lifting rod The interference slot of the interference. Thereby, when the object to be inspected is placed on or removed from the lifting rod, even if the object to be inspected is inclined with respect to the lifting rod, the edge of the object to be inspected and the lifting rod can be prevented. The abutment above, so it can be prevented from being caused by the abutment Check the damage of the body.
依據本發明,沒有必要如先前般地形成支撐台作為多數個固定構件及可動構件之集合體,而可以將前述支撐台形成為具有用以收容前述升降桿之前述凹槽的一體構成,又可以用設置於前述支撐台之側方的前述升降裝置使前述升降桿升降。因而,可以提供比較廉價的吸著台,其不會招來前述吸著台之構成的複雜化,即便是大型的顯示面板,亦不會使較強之應力局部作用於該顯示面板而可以處理該顯示面板。According to the present invention, it is not necessary to form the support table as a plurality of sets of the fixed member and the movable member as before, and the support stand may be formed to have an integral structure for accommodating the aforementioned groove of the lift rod, or The lifting rod is raised and lowered by the lifting device provided on the side of the support table. Therefore, it is possible to provide a relatively inexpensive absorbing table which does not entail the complication of the configuration of the absorbing table, and even a large display panel does not cause a strong stress to locally act on the display panel and can be processed. The display panel.
10‧‧‧吸著台10‧‧‧ suction table
12‧‧‧被檢查體(顯示面板)12‧‧‧Inspected body (display panel)
14‧‧‧搬運機器人14‧‧‧Handling robot
16‧‧‧基座16‧‧‧Base
18‧‧‧可動台18‧‧‧ movable platform
20‧‧‧支柱20‧‧‧ pillar
22‧‧‧軸構件22‧‧‧Axis components
24‧‧‧機器臂24‧‧‧ robot arm
26‧‧‧支撐台26‧‧‧Support table
26a‧‧‧吸著面26a‧‧‧Sucking face
28‧‧‧XYZ θ載物台28‧‧‧XYZ θ stage
30a‧‧‧細槽30a‧‧‧Slot
30b‧‧‧負壓槽30b‧‧‧ Negative pressure tank
32‧‧‧凹槽32‧‧‧ Groove
34‧‧‧升降桿34‧‧‧ Lifting rod
34a‧‧‧升降桿之上面34a‧‧‧Upper pole
34b‧‧‧肩部34b‧‧‧Shoulder
36‧‧‧支撐機構36‧‧‧Support institutions
38‧‧‧升降裝置38‧‧‧ Lifting device
38a‧‧‧壓力缸本體38a‧‧‧Cylinder body
38b‧‧‧活塞桿38b‧‧‧Piston rod
40‧‧‧樑構件40‧‧‧beam components
42‧‧‧導引裝置42‧‧‧Guide
44‧‧‧安裝板44‧‧‧Installation board
46‧‧‧導軌46‧‧‧ rails
46a‧‧‧止動件46a‧‧‧stops
48‧‧‧滑動構件48‧‧‧Sliding members
50‧‧‧安裝板50‧‧‧Installation board
52‧‧‧結合構件52‧‧‧Combined components
54‧‧‧支柱54‧‧‧ pillar
56‧‧‧衝擊緩和機構56‧‧‧ Shock mitigation agency
58‧‧‧支柱之凹部58‧‧‧The recess of the pillar
58a‧‧‧凹部之垂直壁58a‧‧‧ vertical wall of the recess
58b‧‧‧凹部之底壁58b‧‧‧Bottom of the recess
60‧‧‧槽孔60‧‧‧ slots
62‧‧‧導銷62‧‧ ‧ sales guide
64‧‧‧壓縮螺旋彈簧64‧‧‧Compressed coil spring
66‧‧‧孔66‧‧‧ hole
68‧‧‧固定螺桿構件(調整螺桿)68‧‧‧Fixed screw components (adjusting screw)
70‧‧‧餘隙槽70‧‧‧ clearance slot
72‧‧‧高度調整機構72‧‧‧ Height adjustment mechanism
74‧‧‧固定螺釘74‧‧‧ fixing screws
76‧‧‧錨構件76‧‧‧ Anchor members
78‧‧‧緊固具78‧‧‧ fastenings
80‧‧‧固定螺釘80‧‧‧ fixing screws
82‧‧‧槽孔82‧‧‧Slots
84‧‧‧螺孔84‧‧‧ screw holes
86‧‧‧螺釘台86‧‧‧screw table
86a‧‧‧螺釘台之螺孔86a‧‧‧ Screw hole
88‧‧‧卡止銷88‧‧‧ card sales
90‧‧‧彈簧構件(拉伸螺旋彈簧)90‧‧‧Spring member (stretching coil spring)
第1圖係一起顯示搬運機器人與本發明之吸著台的立體圖。Fig. 1 is a perspective view showing the transfer robot and the sorption table of the present invention together.
第2圖係第1圖所示之吸著台的俯視圖。Fig. 2 is a plan view of the sorption table shown in Fig. 1.
第3圖係第1圖所示之吸著台的側視圖。Figure 3 is a side view of the sorption table shown in Figure 1.
第4圖係沿著第3圖所示之線IV-IV而得的剖視圖。Fig. 4 is a cross-sectional view taken along line IV-IV shown in Fig. 3.
第5圖係沿著第3圖所示之線V-V而得的剖視圖。Fig. 5 is a cross-sectional view taken along line V-V shown in Fig. 3.
第6圖係沿著第3圖所示之線VI-VI而得的剖視圖。Fig. 6 is a cross-sectional view taken along line VI-VI shown in Fig. 3.
第7圖係放大顯示第3圖中符號A所示之圓形圈記號所包圍的部分之圖。Fig. 7 is an enlarged view showing a portion surrounded by a circular circle symbol shown by a symbol A in Fig. 3.
第8圖係朝向第6圖所示之符號B所示的箭頭方向所看到的支柱之高度調整機構的前視圖。Fig. 8 is a front view of the height adjusting mechanism of the pillar as seen in the direction of the arrow indicated by the symbol B shown in Fig. 6.
第9圖係第1圖所示之吸著台的前視圖,其中(a)係顯 示升降桿位在上升位置的狀態,(b)係顯示升降桿位在下降位置的狀態。Figure 9 is a front view of the sorption table shown in Figure 1, where (a) shows The state in which the lifter is in the raised position is shown, and (b) shows the state in which the lifter is in the lowered position.
第10圖係破斷顯示本發明之其他實施形態之一部分的立體圖。Fig. 10 is a perspective view showing a part of another embodiment of the present invention broken.
第11圖係顯示本發明之其他實施形態的立體圖。Figure 11 is a perspective view showing another embodiment of the present invention.
如第1圖所示,本發明之吸著台10係組裝於用以檢查如液晶面板或有機發光面板等之顯示板12的探針台(未圖示)來使用。第1圖係顯示在與搬運機器人14之間交接被檢查體12之例。As shown in Fig. 1, the absorbing table 10 of the present invention is used in a probe station (not shown) for inspecting the display panel 12 such as a liquid crystal panel or an organic light-emitting panel. The first figure shows an example in which the object 12 to be inspected is transferred to and from the transfer robot 14.
搬運機器人14係如先前所周知般,具備:可動台18,其係能夠朝向吸著台10及遠離此之方向移動於基座(base)16上;以及軸構件22,其係同軸地支撐於該可動台上設置之支柱20,繞軸線之周圍旋轉動作,且沿著前述軸線對支柱20進行伸縮動作。在能夠進行該旋轉及伸縮動作的軸構件22係如先前所周知般,固設有用以載置被檢查體12之叉狀的機器臂24。As described above, the transport robot 14 includes a movable table 18 that is movable toward the absorbing table 10 and away from the base 16 and a shaft member 22 that is coaxially supported. The pillar 20 provided on the movable table rotates around the axis and expands and contracts the pillar 20 along the axis. The shaft member 22 capable of performing the rotation and the expansion and contraction operation is provided with a fork-shaped robot arm 24 on which the test object 12 is placed, as is conventionally known.
搬運機器人14係從例如未圖示之卡匣(cassette)將被收容於該卡匣的顯示板(即被檢查體12)收取於機器臂24上時,以使軸構件22伸長之狀態下,將機器臂24朝向吸著台10上移動,而使可動台18動作。之後,軸構件22收縮動作,將被檢查體12移至吸著台10時,可動台18係動作,以於此收縮狀態下,使機器臂24遠離吸著台10。When the conveyance robot 14 receives the display panel (that is, the inspection object 12) accommodated in the cassette from the cassette (not shown), the conveyance robot 14 is in a state in which the shaft member 22 is extended. The movable arm 18 is moved by moving the robot arm 24 toward the absorbing table 10. Thereafter, when the shaft member 22 is contracted and the subject 12 is moved to the absorbing table 10, the movable table 18 is operated to move the robot arm 24 away from the absorbing table 10 in the contracted state.
又,當吸著台10上之被檢查體12的電性或視覺上的檢查結束時,搬運機器人14在使軸構件22收縮之狀態下,以機器臂24被插入於吸著台10上之被檢查體12之下方的方式,使可動台18朝向吸著台10動作。之後,藉由軸構件22伸長動作,將吸著台10上之被檢查體12移至機器臂24上時,搬運機器人14就在此伸長狀態下以機器臂24遠離吸著台10之方式,使可動台18動作。藉由此搬運機器人14之動作,將被檢查體12從吸著台10經由搬運機器人14而移至前述卡匣。Further, when the electrical or visual inspection of the test object 12 on the absorbing table 10 is completed, the transfer robot 14 is inserted into the absorbing table 10 with the robot arm 24 in a state where the shaft member 22 is contracted. The movable table 18 is moved toward the absorbing table 10 so as to be below the object 12 to be inspected. Thereafter, when the shaft member 22 is extended and the object 12 to be inspected on the absorbing table 10 is moved to the robot arm 24, the transport robot 14 is moved away from the absorbing table 10 by the robot arm 24 in this extended state. The movable table 18 is operated. By the operation of the transport robot 14, the object 12 to be inspected is moved from the absorbing table 10 to the cassette via the transport robot 14.
在與搬運機器人14之間交接被檢查體12的吸著台10係具備支撐台26,該支撐台26具有吸著面26a。吸著台10之支撐台26係在第1圖所示之例中,被載置於先前所周知的XYZ θ載物台(stage)28上。因而,支撐台26係與先前同樣能夠繞垂直軸之Z軸的周圍旋轉,且能夠在與Z軸呈直角之XY面上分別沿著X軸及Y軸而移動。The absorbing table 10 that transfers the test object 12 to and from the transfer robot 14 is provided with a support table 26 having a absorbing surface 26a. The support table 26 of the sorption table 10 is placed on the previously known XYZ θ stage 28 in the example shown in Fig. 1. Therefore, the support table 26 can rotate around the Z axis of the vertical axis as before, and can move along the X axis and the Y axis on the XY plane at right angles to the Z axis.
吸著台10係用其支撐台26之吸著面26a來保持來自搬運機器人14之被檢查體12。此吸著面26a係在第1圖及第2圖之例中,在XY面上具有長邊及短邊的矩形形狀。又,如第2圖的明確顯示,吸著面26a上係形成有沿著其長邊而伸長,且兩端朝向支撐台26之兩側開放之先前所周知的複數個細槽30a,又在吸著面26a上形成有描繪矩形的負壓槽30b。The absorbing table 10 holds the object 12 to be inspected from the transfer robot 14 by the absorbing surface 26a of the support table 26. This absorbing surface 26a is a rectangular shape having a long side and a short side on the XY plane in the examples of Figs. 1 and 2 . Further, as clearly shown in Fig. 2, the suction surface 26a is formed with a plurality of previously known plurality of narrow grooves 30a which are elongated along the long sides thereof and which are open to both sides of the support table 26, and A negative pressure groove 30b that draws a rectangle is formed on the absorbing surface 26a.
負壓槽30b係如先前所周知般,在吸著面 26a保持被檢查體12時,從負壓源(未圖示)導入用以吸著該被檢查體之負壓。細槽30a為帶電防止用的槽。細槽30a係於使被檢查體12從吸著面26a離開時,如先前所周知般,藉由導引空氣至被檢查體12與吸著面26a之間,而減弱在兩者12、26a間產生的空氣流,藉此,抑制依此空氣流而導入於被檢查體12的靜電之發生。The negative pressure groove 30b is as previously known, in the suction surface When the object to be inspected 12 is held by 26a, the negative pressure for sucking the object to be inspected is introduced from a negative pressure source (not shown). The narrow groove 30a is a groove for preventing electrification. When the small groove 30a is used to separate the object 12 to be inspected from the absorbing surface 26a, it is weakened in both 12, 26a by guiding air between the object 12 and the absorbing surface 26a as previously known. The generated air flow thereby suppresses the occurrence of static electricity introduced into the test object 12 in accordance with the air flow.
再者,如第2圖所示,吸著面26a係形成有沿著其長邊直線狀地延伸的複數個凹槽32。如第3圖的明確顯示,各凹槽32係達至支撐台26之兩側,且在該兩側開放。又,對應各凹槽32,設置有朝其長邊方向橫切吸著面26a的升降桿34。凹槽32係具有可充分收容對應的升降桿34之寬度尺寸,且具有所收容的升降桿34之上面與吸著面26a一致的深度尺寸。Further, as shown in Fig. 2, the absorbing surface 26a is formed with a plurality of grooves 32 extending linearly along the long sides thereof. As clearly shown in Fig. 3, each of the grooves 32 reaches both sides of the support table 26 and is open on both sides. Further, a lifting lever 34 that crosses the suction surface 26a in the longitudinal direction thereof is provided corresponding to each of the grooves 32. The recess 32 has a width dimension sufficient to accommodate the corresponding lifting rod 34, and has a depth dimension in which the upper surface of the elevating rod 34 accommodated coincides with the absorbing surface 26a.
如第2圖及第3圖所示,在支撐台26之兩側分別配置有升降桿34之支撐機構36及升降裝置38。如第2圖及第3圖所示,支撐機構36係具備:在支撐台26之側方沿著該支撐台而大致水平配置的樑構件40;以及將該樑構件沿著Z軸朝向垂直方向導引的複數個導引裝置42(參照第3圖)。As shown in FIGS. 2 and 3, the support mechanism 36 and the lifting device 38 of the lifting rod 34 are disposed on both sides of the support base 26, respectively. As shown in FIGS. 2 and 3, the support mechanism 36 includes a beam member 40 that is disposed substantially horizontally along the support base on the side of the support base 26, and a vertical direction of the beam member along the Z axis. A plurality of guiding devices 42 are guided (see Fig. 3).
如第4圖的明確顯示,各導引裝置42係具備:以從支撐台26朝向下方伸長之方式固定於該支撐台的安裝板44;安裝於該安裝板且朝向垂直方向延伸的導軌46;以及固定於樑構件40,藉由導軌46而朝向垂直方向導引的滑動構件48。在導軌46之兩端係設置有抵接於滑 動構件48以拘束其移動範圍的止動件46a、46a。As clearly shown in Fig. 4, each guide device 42 includes a mounting plate 44 fixed to the support base so as to extend downward from the support base 26, and a guide rail 46 attached to the mounting plate and extending in the vertical direction; And a sliding member 48 fixed to the beam member 40 and guided in the vertical direction by the guide rail 46. Abutting on the both ends of the guide rail 46 The moving member 48 restrains the stoppers 46a, 46a of its range of movement.
因而,配置於支撐台26之兩側的一對樑構件40係藉由各導引裝置42而在支撐台26之兩側,以能夠在兩止動件46a、46a間朝向垂直方向移動的方式由支撐台26所保持。Therefore, the pair of beam members 40 disposed on both sides of the support table 26 are moved on both sides of the support table 26 by the respective guiding devices 42 so as to be movable in the vertical direction between the two stoppers 46a and 46a. It is held by the support table 26.
升降裝置38係為了使一對樑構件40在兩止動件46a、46a間升降,而設置於支撐台26之兩側。第3圖及第5圖之例中,升降裝置38係由流體壓力缸裝置38所構成(以下亦有將升降裝置38稱為流體壓力缸裝置38的情形),該流體壓力缸裝置38係具備:透過安裝板50而固定於支撐台26的壓力缸本體38a;以及從該壓力缸本體突出的活塞桿38b。流體壓力缸裝置38係利用空氣壓或油壓來動作。流體壓力缸裝置38係其軸線沿著垂直方向而配置,活塞桿38b之前端係固定在樑構件40上所固定的結合構件52。The lifting device 38 is provided on both sides of the support base 26 in order to elevate and lower the pair of beam members 40 between the two stoppers 46a and 46a. In the examples of Figs. 3 and 5, the lifting device 38 is constituted by a fluid pressure cylinder device 38 (hereinafter, the lifting device 38 is also referred to as a fluid pressure cylinder device 38), and the fluid pressure cylinder device 38 is provided. a cylinder body 38a fixed to the support base 26 through the mounting plate 50; and a piston rod 38b protruding from the cylinder body. The fluid pressure cylinder device 38 is operated by air pressure or oil pressure. The fluid pressure cylinder device 38 has its axis arranged in the vertical direction, and the front end of the piston rod 38b is fixed to the coupling member 52 fixed to the beam member 40.
因而,藉由使配置於支撐台26之兩側的一對流體壓力缸裝置38同步動作,可使在支撐台26之兩側沿著該支撐台而配置的一對樑構件40同步升降。Therefore, by simultaneously operating the pair of fluid pressure cylinder devices 38 disposed on both sides of the support base 26, the pair of beam members 40 disposed along the support table on both sides of the support base 26 can be simultaneously raised and lowered.
再者,如第3圖所示,前述支撐機構36係具備將各升降桿34結合於對應的樑構件40之支柱54。如第6圖及第7圖所示,各支柱54之上端部係設置有衝擊緩和機構56,各升降桿34之端部係透過各衝擊緩和機構56而彈性地結合於對應的支柱54之上端部。Further, as shown in FIG. 3, the support mechanism 36 is provided with a support 54 that couples the lift rods 34 to the corresponding beam members 40. As shown in FIGS. 6 and 7, the upper end portion of each of the pillars 54 is provided with an impact mitigation mechanism 56, and the end portions of the respective lifting rods 34 are elastically coupled to the upper ends of the corresponding pillars 54 through the respective impact mitigation mechanisms 56. unit.
各衝擊緩和機構56係具備:開放於支柱54 之上端,留有間隙地容納對應的升降桿34之端部的凹部58;橫切升降桿34而形成,且於略水平方向貫通該升降桿之端部的槽孔60;貫通該槽孔內,且兩端係由凹部58之垂直壁58a所支撐的導銷62;以及配置於升降桿34之端部與凹部58之底壁58b之間的壓縮螺旋彈簧64。Each of the impact mitigation mechanisms 56 is provided to be open to the pillar 54 a recess 58 that accommodates an end portion of the corresponding lift rod 34 with a gap; a slot 60 that is formed across the lift rod 34 and penetrates the end portion of the lift rod in a horizontal direction; penetrates the slot And a guide pin 62 supported by the vertical wall 58a of the recess 58 at both ends; and a compression coil spring 64 disposed between the end of the lift rod 34 and the bottom wall 58b of the recess 58.
壓縮螺旋彈簧64之下端係容納於凹部58之底壁58b所設置的孔66,且壓縮螺旋彈簧64之上端係抵接於附切口之固定螺桿構件68。固定螺桿構件68係在升降桿34之端部從該升降桿之上方螺合於升降桿34,且使下端從升降桿34之下面突出。壓縮螺旋彈簧64係藉由抵接於附切口之固定螺桿構件68的下端而定位於升降桿34及底壁58b之間。又,槽孔60係為了允許伴隨壓縮螺旋彈簧64之壓縮變形之升降桿34的上下方向的移動,而於上下(Z軸)方向伸長。因而,升降桿34之各端部係藉由壓縮螺旋彈簧64之彈簧力而相對於朝向重力方向作用的外力由支柱54彈性支撐。The lower end of the compression coil spring 64 is received in a hole 66 provided in the bottom wall 58b of the recess 58, and the upper end of the compression coil spring 64 abuts against the fixed screw member 68 of the slit. The fixing screw member 68 is screwed to the lifting rod 34 from the upper end of the lifting rod 34 from the end of the lifting rod 34, and the lower end protrudes from the lower surface of the lifting rod 34. The compression coil spring 64 is positioned between the lift rod 34 and the bottom wall 58b by abutting against the lower end of the fixed screw member 68 with the slit. Further, the slot 60 is elongated in the vertical direction (Z-axis) in order to allow the vertical movement of the lift rod 34 accompanying the compression deformation of the compression coil spring 64. Therefore, each end portion of the lifter lever 34 is elastically supported by the stay 54 by the spring force of the compression coil spring 64 with respect to the external force acting in the direction of gravity.
由於能藉由槽孔60與容納於該槽孔的導銷62之干涉來限制升降桿34及凹部58之底壁58b間的距離,所以可以藉由來自固定螺桿構件68之上端的旋轉操作而將壓縮螺旋彈簧64進行壓縮,藉此,可以調整壓縮螺旋彈簧64之彈簧力。其結果,固定螺桿構件68係發揮作為調整壓縮螺旋彈簧64之壓縮量的調整螺桿之功能。Since the distance between the lift rod 34 and the bottom wall 58b of the recess 58 can be restricted by the interference of the slot 60 with the guide pin 62 accommodated in the slot, the rotation from the upper end of the fixed screw member 68 can be performed. The compression coil spring 64 is compressed, whereby the spring force of the compression coil spring 64 can be adjusted. As a result, the fixed screw member 68 functions as an adjusting screw that adjusts the amount of compression of the compression coil spring 64.
又,如第6圖所示,在各升降桿34之端部,係形成有肩部34b,係當在升降桿34之上面34a載置有被 檢查體12時,抵接於該被檢查體之緣部而防止被檢查體12超出升降桿34之端部。再者,在接近升降桿34之上面34a的肩部34b之區域係形成有凹狀之餘隙槽70,其係用以防止因被檢查體12於升降桿34上的傾斜而造成之被檢查體12之緣部抵接於升降桿34之上面34a。Further, as shown in Fig. 6, at the end of each of the lifting rods 34, a shoulder portion 34b is formed, which is placed on the upper surface 34a of the lifting rod 34. When the body 12 is inspected, it abuts against the edge of the object to be inspected to prevent the object 12 from exceeding the end of the lifter 34. Further, a region of the shoulder portion 34b close to the upper surface 34a of the lifting rod 34 is formed with a concave clearance groove 70 for preventing the inspection of the object to be inspected by the inclination of the lifting rod 34. The edge of the body 12 abuts against the upper surface 34a of the lifting rod 34.
各支柱54係透過設置於其下部之高度調整機構72而支撐於對應的樑構件40。如第6圖及第8圖所示,各高度調整機構72係具備:用固定螺釘74固定於各支柱54之下部的錨(anchor)構件76;將該支撐台以能夠解除之方式結合於對應的樑構件40之緊固具78;以及用以在鬆開緊固具78之狀態下調整錨構件76對樑構件40之高度位置的附切口之固定螺釘80。Each of the pillars 54 is supported by the corresponding beam member 40 through the height adjusting mechanism 72 provided at the lower portion thereof. As shown in FIGS. 6 and 8, each height adjustment mechanism 72 includes an anchor member 76 that is fixed to a lower portion of each of the pillars 54 by a fixing screw 74, and is coupled to the support base so as to be detachable. The fastening member 78 of the beam member 40; and a fixing screw 80 for adjusting the height position of the anchor member 76 to the beam member 40 in a state where the fastening member 78 is loosened.
錨構件76係為了允許緊固具78之插通而形成有朝向樑構件40貫通錨構件76的一對槽孔82。如第6圖的明確顯示,槽孔82係為了在上下方向留有間隙地容納對應的緊固具78,而將錨構件76朝向上下方向伸長。貫通各槽孔82之緊固具78係由前端與樑構件40上形成之螺孔84螺合的螺栓構件所構成(以下亦有將緊固具78稱為螺栓構件78的情形)。因而,在鬆開螺栓構件78之狀態下,可在槽孔82之上下方向的長度尺寸之範圍內,調整錨構件76以及下端固定於該支撐台的支柱54之高度位置。The anchor member 76 is formed with a pair of slots 82 that penetrate the anchor member 76 toward the beam member 40 in order to allow the insertion of the fastener 78. As clearly shown in Fig. 6, the slot 82 is configured to extend the anchor member 76 in the vertical direction so as to accommodate the corresponding fastener 78 with a gap in the vertical direction. The fastener 78 that penetrates each of the slits 82 is constituted by a bolt member whose front end is screwed with the screw hole 84 formed in the beam member 40 (hereinafter, the fastener 78 is referred to as a bolt member 78). Therefore, in a state where the bolt member 78 is loosened, the anchor member 76 and the height position at which the lower end is fixed to the stay 54 of the support table can be adjusted within the range of the length dimension of the upper and lower sides of the slot 82.
為了容易進行此錨構件76之高度位置即支柱54之高度位置的調整,固定螺釘80係上端可突出於固定於樑構件40的螺釘台86之螺孔86a而螺合。螺孔86a 係於上下方向貫通螺釘台86,從該螺孔突出的固定螺釘80之上端係抵接於錨構件76之底面。In order to facilitate the adjustment of the height position of the anchor member 76, that is, the height position of the support post 54, the upper end of the fixing screw 80 can protrude from the screw hole 86a of the screw table 86 fixed to the beam member 40 to be screwed. Screw hole 86a The screw table 86 is inserted in the vertical direction, and the upper end of the fixing screw 80 projecting from the screw hole abuts against the bottom surface of the anchor member 76.
因而,如前述般,在鬆開螺栓構件78之狀態下,藉由旋轉操作固定螺釘80,可以由該固定螺釘之上端將錨構件76例如頂起,藉此,可以在槽孔82之前述長度尺寸的範圍內,調整支柱54之高度位置。在藉由此固定螺釘80進行高度位置之調整後,用螺栓構件78將錨構件76緊固於樑構件40,完成各支柱54之高度調整作業。Therefore, as described above, by loosely fixing the screw 80 in a state where the bolt member 78 is loosened, the anchor member 76 can be lifted, for example, from the upper end of the fixing screw, whereby the aforementioned length of the slot 82 can be Within the range of dimensions, the height position of the strut 54 is adjusted. After the height position is adjusted by the fixing screw 80, the anchor member 76 is fastened to the beam member 40 by the bolt member 78, and the height adjustment operation of each of the pillars 54 is completed.
藉由此支柱54之高度位置的調整,可以修正將端部支撐在各支柱54的升降桿34之傾斜或高度位置的不均等,且可以使升降桿34之上面34a與平行於支撐台26之吸著面26a的虛擬平面一致。By adjusting the height position of the support post 54, the unevenness of the tilting or height position of the lifting rod 34 supporting the end portion of each of the pillars 54 can be corrected, and the upper surface 34a of the lifting rod 34 can be parallel to the support table 26. The virtual planes of the absorbing faces 26a are identical.
前述之錨構件76與支柱54可一體地成形。又,可以不需要高度調整機構72。The aforementioned anchor member 76 and the post 54 can be integrally formed. Also, the height adjustment mechanism 72 may not be required.
一對流體壓力缸裝置38進行同步動作,以使全部的升降桿34在上升位置與下降位置之間同步動作,該上升位置係如第圖(9a)所示,全部的升降桿34從支撐台26之吸著面26a的凹槽32(參照第5圖)突出而位在吸著面26a之上方的位置,該下降位置係如第9圖(b)所示,升降桿34收容於凹槽32且其上面34a位在吸著面26a以下的位置。The pair of fluid pressure cylinder devices 38 perform a synchronous operation such that all of the lifting rods 34 are synchronized between the raised position and the lowered position, as shown in the figure (9a), and all the lifting rods 34 are supported from the support table. The groove 32 of the absorbing surface 26a of 26 (refer to FIG. 5) protrudes and is positioned above the absorbing surface 26a. The lowered position is as shown in FIG. 9(b), and the lifting rod 34 is received in the groove. 32 and its upper 34a position is below the suction surface 26a.
如前述般,在第9圖(a)所示之上升位置,搬運機器人14之機器臂24上的被檢查體12係移至升降桿34上。此時,伴隨因搬運機器人14之軸構件22的收縮動 作所造成的機器臂24之下降動作,使得相應於被檢查體12之重量的衝擊會作用於升降桿34。然而,當被檢查體12移至升降桿34時,藉由被設置於各升降桿34與支柱54之間的衝擊緩和機構56之彈性支撐作用,使得被檢查體12不會受到衝擊。As described above, at the rising position shown in Fig. 9(a), the object 12 to be inspected on the robot arm 24 of the transport robot 14 is moved to the lifter lever 34. At this time, the contraction of the shaft member 22 due to the transfer robot 14 is accompanied. The lowering action of the robot arm 24 caused by the action causes the impact corresponding to the weight of the object to be inspected 12 to act on the lifting rod 34. However, when the object to be inspected 12 is moved to the elevating rod 34, the object to be inspected 12 is not subjected to an impact by the elastic supporting action of the impact relieving mechanism 56 provided between each of the elevating rods 34 and the strut 54.
又,由於設置有衝擊緩和機構56,所以不需將前述的機器臂24之下降動作如先前般地進行減速,而可以防止作用於被檢查體12的衝擊,故而不需要機器臂24之緩慢的移動,而可以謀求作業時間之縮短化。Further, since the impact mitigation mechanism 56 is provided, it is not necessary to decelerate the lowering operation of the above-described robot arm 24 as before, and the impact on the object to be inspected 12 can be prevented, so that the slow movement of the robot arm 24 is not required. By moving, it is possible to shorten the working time.
如前述般,衝擊緩和機構56係藉由與處理的被檢查體12之重量之增減相應的固定螺桿構件68之旋轉操作,而無論被檢查體12之重量的增減與否,皆可以將因被檢查體12之重量所引起的壓縮螺旋彈簧64之變形量保持於大致一定。因而,藉由與被檢查體12之重量相應的固定螺桿構件68之旋轉操作,就可以利用衝擊緩和機構56有效地吸收衝擊。As described above, the impact mitigation mechanism 56 can be rotated by the weight of the workpiece 12 to be inspected, regardless of the weight of the workpiece 12 to be inspected, regardless of whether the weight of the object 12 is increased or decreased. The amount of deformation of the compression coil spring 64 due to the weight of the object to be inspected 12 is kept substantially constant. Therefore, the impact mitigation mechanism 56 can effectively absorb the impact by the rotation operation of the fixed screw member 68 corresponding to the weight of the object to be inspected 12.
當被檢查體12從機器臂24移至各升降桿34時,該被檢查體即便相對於升降桿34之長邊方向發生傾斜,由於在各升降桿34之兩端部,形成有靠近肩部34b的餘隙槽70,所以傾斜於被檢查體12之下方的緣部不會抵接於升降桿34之上面34a。藉此,被檢查體12係能以不會受到因與升降桿34之抵接造成的損壞而移至該升降桿,而移至升降桿34上的被檢查體12係藉由升降桿34之肩部34b,而能確實地防止從升降桿34脫落。When the object to be inspected 12 is moved from the robot arm 24 to each of the lifting rods 34, the object to be inspected is inclined with respect to the longitudinal direction of the lifting rod 34, and the shoulder portions are formed at both end portions of the respective lifting rods 34. Since the clearance groove 70 of the 34b is inclined, the edge portion inclined below the inspection object 12 does not abut against the upper surface 34a of the lift rod 34. Thereby, the object to be inspected 12 can be moved to the lifting rod without being damaged by the contact with the lifting rod 34, and the object to be inspected 12 moved to the lifting rod 34 is supported by the lifting rod 34. The shoulder portion 34b can surely prevent falling off from the lifting rod 34.
當被檢查體12移至升降桿34上,且機器臂24從支撐台26後退時,一對流體壓力缸裝置38係同步收縮動作,藉此,升降桿34係保持於第9圖(b)所示之下降位置。When the object to be inspected 12 is moved to the elevating rod 34 and the robot arm 24 is retracted from the support table 26, the pair of fluid pressure cylinder devices 38 are synchronized and contracted, whereby the elevating rod 34 is held in Fig. 9(b) The lowered position shown.
當升降桿34移動至下降位置時,如前述般,藉由作用於負壓槽30b之負壓,確實地將被檢查體12保持在支撐台26,且使被檢查體12接受預定之檢查。When the elevating rod 34 is moved to the lowered position, as described above, the subject 12 is reliably held on the support table 26 by the negative pressure acting on the negative pressure groove 30b, and the subject 12 is subjected to a predetermined inspection.
當被檢查體12之前述檢查結束時,藉由一對流體壓力缸裝置38之動作,使升降桿34朝向第9圖(a)所示之上升位置移動。伴隨著此流體壓力缸裝置38,當支撐台26上之被檢查體12藉由升降桿34而欲從支撐台26之吸著面26a浮起時,就能如前述般地藉由細槽30a之空氣導引作用,來抑制在被檢查體12之靜電發生。When the aforementioned inspection of the test object 12 is completed, the lift rod 34 is moved toward the raised position shown in Fig. 9(a) by the operation of the pair of fluid pressure cylinder devices 38. With the fluid pressure cylinder device 38, when the test object 12 on the support table 26 is to be floated from the suction surface 26a of the support table 26 by the lift lever 34, the thin groove 30a can be used as described above. The air guiding action suppresses the occurrence of static electricity in the object to be inspected 12.
位在上升位置的升降桿34上之檢查完的被檢查體12,係在搬運機器人14之機器臂24插入於升降桿34間的狀態下,使軸構件22進行伸長動作,藉此被移至機器臂24,之後藉由搬運機器人14而回到前述卡匣。The inspected body 12 that has been inspected on the elevating rod 34 at the ascending position is moved to the state in which the robot arm 24 of the transport robot 14 is inserted between the elevating rods 34, and the shaft member 22 is extended. The robot arm 24 is then returned to the aforementioned cassette by the transport robot 14.
依據本發明之吸著台10,可以將用以收容升降桿34之凹槽32形成於支撐台26,且利用設置於支撐台26之側方的升降裝置38使升降桿34升降。因而,可以比較廉價地提供一種不會招來吸著台10之構成的複雜化,且即便是大型之顯示面板12,亦不會使較強之應力局部作用於該顯示面板而可以處理該顯示面板的吸著台10。According to the absorbing table 10 of the present invention, the recess 32 for accommodating the lifting rod 34 can be formed on the support table 26, and the lifting rod 34 can be raised and lowered by the lifting device 38 provided on the side of the support table 26. Therefore, it is possible to provide a complication that does not attract the structure of the absorbing table 10 relatively inexpensively, and even if the display panel 12 is large, the strong stress is not locally applied to the display panel, and the display can be processed. The suction table 10 of the panel.
前述中,已顯示將凹槽32平行地形成於吸 著面26a之長邊之例,但是取而代之,亦可為以凹槽32與吸著面26a之長邊呈預定角度地延伸的方式,平行地形成複數個凹槽32。In the foregoing, it has been shown that the grooves 32 are formed in parallel in the suction Instead of the long side of the face 26a, a plurality of grooves 32 may be formed in parallel so that the groove 32 and the long side of the absorbing surface 26a extend at a predetermined angle.
又,可以將此凹槽32之深度尺寸形成比升降桿34之高度尺寸還更為大,並在升降桿34之下降位置,將該升降桿之上面設定在吸著面26a之下方。Further, the depth of the recess 32 may be formed larger than the height of the lifter 34, and the upper surface of the lifter 34 may be positioned below the suction surface 26a at the lowered position of the lifter 34.
升降裝置38中可以適當使用電動馬達及齒條與小齒輪(rack-and-pinion)或是線性馬達等各式各樣的升降裝置,來取代前述的流體壓力缸裝置。Instead of the aforementioned fluid pressure cylinder device, various types of lifting devices such as an electric motor, a rack-and-pinion or a linear motor can be suitably used in the lifting device 38.
如第10圖所示,為了容納由支柱54所支撐之具有圓形橫剖面的導銷62,而可以將設置於接受被檢查體12的升降桿34之兩端部的槽孔60形成為朝向升降桿之長邊(X軸)方向伸長之橫向的細長之槽孔。在此情況,衝擊緩和機構56之壓縮螺旋彈簧64由於不具功能故而可以不設置。橫向伸長的細長之槽孔60係允許升降桿34之傾斜,而藉以補償設置於升降桿34之兩端側的一對升降裝置38間之同步的偏移As shown in Fig. 10, in order to accommodate the guide pin 62 having a circular cross section supported by the support post 54, the slot 60 provided at both end portions of the elevating lever 34 that receives the test object 12 can be formed to face. A slender slot in the lateral direction of the elongate side of the elevating rod (X-axis). In this case, the compression coil spring 64 of the impact mitigation mechanism 56 may not be provided because it has no function. The laterally elongated elongated slot 60 allows the tilting of the lifter 34 to compensate for the synchronized offset between the pair of lifts 38 disposed on opposite ends of the lifter 34.
可以將一對槽孔60之一方形成為在前述之橫向的細長之槽孔,且將另一方面形成為容納導銷62之具有圓形橫剖面的槽孔,來取代將設置於升降桿34之兩端部的一對槽孔60形成為橫向伸長之前述橫向的細長之槽孔。藉此,由於升降桿34可傾斜,所以亦可補償一對升降裝置38間之同步的偏移。One of the pair of slots 60 may be squared into the aforementioned elongated slot in the lateral direction, and on the other hand formed to receive the slot of the guide pin 62 having a circular cross section instead of being disposed on the lift bar 34. A pair of slots 60 at both ends are formed as the laterally elongated slots that are laterally elongated. Thereby, since the lifting rod 34 can be tilted, the synchronization between the pair of lifting devices 38 can be compensated for.
如第11圖所示,可以使導銷62之兩端朝向 支柱54之外方突出。又,可以於升降桿34之兩側設置卡止銷88,該卡止銷88係比各升降桿34上朝向前述長邊方向伸長的槽孔60之位置更靠近升降桿34之內側位置,且平行於附近的導銷62,並將對於對應的導銷62及卡止銷88之間賦予拉伸力的一對彈簧構件90配置於升降桿34之兩側。在第11圖所示之例中,各彈簧構件90係由拉伸螺旋彈簧所構成。As shown in Fig. 11, the ends of the guide pin 62 can be oriented The pillar 54 protrudes outside. Further, a locking pin 88 may be provided on both sides of the lifting rod 34, and the locking pin 88 is closer to the inner side of the lifting rod 34 than the position of the slot 60 extending toward the longitudinal direction of each of the lifting rods 34, and Parallel to the adjacent guide pins 62, a pair of spring members 90 that impart a tensile force between the corresponding guide pins 62 and the locking pins 88 are disposed on both sides of the lift rod 34. In the example shown in Fig. 11, each spring member 90 is constituted by a tension coil spring.
兩端卡止於對應的導銷62及卡止銷88的一對拉伸螺旋彈簧90,係對升降桿34賦予朝向該升降桿34之長邊方向外方的張力。藉由此張力來抑制升降桿34之撓曲變形。因而,為了輕量化而以剛性較低之鋁的平角棒來形成升降桿34的情況時,可以藉由拉伸螺旋彈簧90之張力來抑制升降桿34之撓曲,有效地防止該升降桿上之被檢查體的撓曲。升降桿34由剛性較高之CFRP材所形成的情況時,可以不需要拉伸螺旋彈簧90。The pair of tension coil springs 90, which are locked at the both ends to the corresponding guide pins 62 and the lock pins 88, apply tension to the lift rod 34 outward in the longitudinal direction of the lift rod 34. The deflection of the lift rod 34 is suppressed by the tension. Therefore, in the case where the lifting rod 34 is formed by a flat angle bar of aluminum having a low rigidity for weight reduction, the deflection of the lifting rod 34 can be suppressed by the tension of the tension coil spring 90, and the lifting rod can be effectively prevented. The deflection of the object to be inspected. When the lifting rod 34 is formed of a CFRP material having a relatively high rigidity, the tension coil spring 90 may not be required.
再者,雖然第10圖及第11圖已顯示將導銷62設置於支柱54,將容納導銷62之橫向的細長之槽孔60設置於升降桿34之例,但是可以將導銷62設置於升降桿34,或將橫向的細長之槽孔60設置於支柱54來取代之。Further, although FIGS. 10 and 11 have shown that the guide pin 62 is provided to the stay 54 and the laterally elongated slot 60 for accommodating the guide pin 62 is provided to the lift lever 34, the guide pin 62 can be set. Instead of the lifting rod 34, or a laterally elongated slot 60 is provided in the post 54.
本發明並未被限定於上述實施形態,只要未脫離其意旨,仍可進行各種變更。The present invention is not limited to the above embodiments, and various modifications can be made without departing from the spirit and scope of the invention.
10‧‧‧吸著台10‧‧‧ suction table
12‧‧‧被檢查體(顯示面板)12‧‧‧Inspected body (display panel)
14‧‧‧搬運機器人14‧‧‧Handling robot
16‧‧‧基座16‧‧‧Base
18‧‧‧可動台18‧‧‧ movable platform
20‧‧‧支柱20‧‧‧ pillar
22‧‧‧軸構件22‧‧‧Axis components
24‧‧‧機器臂24‧‧‧ robot arm
26‧‧‧支撐台26‧‧‧Support table
26a‧‧‧吸著面26a‧‧‧Sucking face
28‧‧‧XYZ θ載物台28‧‧‧XYZ θ stage
32‧‧‧凹槽32‧‧‧ Groove
34‧‧‧升降桿34‧‧‧ Lifting rod
36‧‧‧支撐機構36‧‧‧Support institutions
38‧‧‧升降裝置38‧‧‧ Lifting device
Claims (5)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2012193716A JP5956877B2 (en) | 2012-09-04 | 2012-09-04 | Suction table |
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Publication Number | Publication Date |
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TW201411771A TW201411771A (en) | 2014-03-16 |
TWI505401B true TWI505401B (en) | 2015-10-21 |
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TW102121067A TWI505401B (en) | 2012-09-04 | 2013-06-14 | Suction table |
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JP (1) | JP5956877B2 (en) |
KR (1) | KR101485966B1 (en) |
CN (1) | CN103681436B (en) |
TW (1) | TWI505401B (en) |
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CN108897156B (en) * | 2018-08-16 | 2023-10-27 | 武汉精测电子集团股份有限公司 | Perpendicular crimping pogo switching on device |
KR102537104B1 (en) * | 2021-02-05 | 2023-05-26 | 주식회사 야스 | Split-type substrate holding device capable of multi-model correspondence with front-end contactless substrates |
CN114967189B (en) * | 2021-02-22 | 2024-02-06 | 广州视源电子科技股份有限公司 | Attaching device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1808223A (en) * | 2005-01-19 | 2006-07-26 | 富士通株式会社 | Apparatus and method for manufacturing laminated substrate |
KR20110030049A (en) * | 2009-09-17 | 2011-03-23 | 주성엔지니어링(주) | Supporting member for substrate, and substrate heating apparatus including the supporting member for substrate |
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JP3457900B2 (en) * | 1998-11-18 | 2003-10-20 | 東京エレクトロン株式会社 | Substrate heat treatment apparatus and substrate heat treatment method |
KR100519369B1 (en) * | 2002-03-05 | 2005-10-07 | 엘지.필립스 엘시디 주식회사 | bonding device for liquid crystal display |
JP2005165015A (en) * | 2003-12-03 | 2005-06-23 | Seiko Epson Corp | Mask for film deposition, film deposition device, electro-optical device, and electronic appliance |
CN100485874C (en) * | 2004-04-16 | 2009-05-06 | 东京毅力科创株式会社 | Processing equipment for object to be processed |
CN100510874C (en) * | 2004-11-24 | 2009-07-08 | 喜开理株式会社 | Floating unit and floating device with tilting function |
JP2007086186A (en) * | 2005-09-20 | 2007-04-05 | Sharp Corp | Substrate heating device |
JP2010016053A (en) * | 2008-07-01 | 2010-01-21 | Tokyo Electron Ltd | Transfer mechanism for target object to be inspected |
JP4964861B2 (en) * | 2008-12-03 | 2012-07-04 | アドヴァンスド・ディスプレイ・プロセス・エンジニアリング・コーポレーション・リミテッド | Substrate support device |
JP2011029565A (en) * | 2009-07-29 | 2011-02-10 | Toppan Printing Co Ltd | Substrate holding device |
TWI447846B (en) * | 2011-12-23 | 2014-08-01 | Au Optronics Corp | Substrate-securing device |
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2012
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2013
- 2013-06-14 TW TW102121067A patent/TWI505401B/en active
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---|---|---|---|---|
CN1808223A (en) * | 2005-01-19 | 2006-07-26 | 富士通株式会社 | Apparatus and method for manufacturing laminated substrate |
KR20110030049A (en) * | 2009-09-17 | 2011-03-23 | 주성엔지니어링(주) | Supporting member for substrate, and substrate heating apparatus including the supporting member for substrate |
Also Published As
Publication number | Publication date |
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CN103681436A (en) | 2014-03-26 |
TW201411771A (en) | 2014-03-16 |
KR20140031101A (en) | 2014-03-12 |
CN103681436B (en) | 2016-08-17 |
JP2014049703A (en) | 2014-03-17 |
JP5956877B2 (en) | 2016-07-27 |
KR101485966B1 (en) | 2015-01-23 |
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