TWI499294B - Solid state camera device - Google Patents
Solid state camera device Download PDFInfo
- Publication number
- TWI499294B TWI499294B TW099102710A TW99102710A TWI499294B TW I499294 B TWI499294 B TW I499294B TW 099102710 A TW099102710 A TW 099102710A TW 99102710 A TW99102710 A TW 99102710A TW I499294 B TWI499294 B TW I499294B
- Authority
- TW
- Taiwan
- Prior art keywords
- register
- charge
- output
- angular
- electrodes
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/72—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors using frame transfer [FT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D44/00—Charge transfer devices
- H10D44/40—Charge-coupled devices [CCD]
- H10D44/45—Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes
- H10D44/454—Output structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/15—Charge-coupled device [CCD] image sensors
- H10F39/158—Charge-coupled device [CCD] image sensors having arrangements for blooming suppression
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009020453A JP5270392B2 (ja) | 2009-01-30 | 2009-01-30 | 固体撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201119373A TW201119373A (en) | 2011-06-01 |
| TWI499294B true TWI499294B (zh) | 2015-09-01 |
Family
ID=42395541
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW099102710A TWI499294B (zh) | 2009-01-30 | 2010-01-29 | Solid state camera device |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8552352B2 (enExample) |
| EP (1) | EP2249390B1 (enExample) |
| JP (1) | JP5270392B2 (enExample) |
| KR (1) | KR101066341B1 (enExample) |
| CN (1) | CN101960597B (enExample) |
| TW (1) | TWI499294B (enExample) |
| WO (1) | WO2010087279A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5330001B2 (ja) * | 2009-01-30 | 2013-10-30 | 浜松ホトニクス株式会社 | 固体撮像装置 |
| JP5243983B2 (ja) * | 2009-01-30 | 2013-07-24 | 浜松ホトニクス株式会社 | 電子増倍機能内蔵型の固体撮像素子 |
| US8773563B2 (en) | 2011-05-25 | 2014-07-08 | Truesense Imaging, Inc. | Multi-purpose architecture for CCD image sensors |
| US8800130B2 (en) | 2011-05-25 | 2014-08-12 | Truesense Imaging, Inc. | Methods for producing image sensors having multi-purpose architecture |
| US8411189B2 (en) * | 2011-05-25 | 2013-04-02 | Truesense Imaging, Inc. | Multi-purpose architecture for CCD image sensors |
| CN110335882B (zh) * | 2019-06-25 | 2021-05-07 | 中国电子科技集团公司第四十四研究所 | 一种可提高帧转移ccd响应度像元结构 |
| DE112020006344T5 (de) * | 2019-12-26 | 2022-10-27 | Hamamatsu Photonics K.K. | Range-Imaging-Sensor und Verfahren zur Herstellung dieses Sensors |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6278142B1 (en) * | 1999-08-30 | 2001-08-21 | Isetex, Inc | Semiconductor image intensifier |
| US6444968B1 (en) * | 1997-03-22 | 2002-09-03 | Eev Ltd | CCD imager with separate charge multiplication elements |
| US20020191093A1 (en) * | 2001-06-04 | 2002-12-19 | Jaroslav Hynecek | Charge multiplier with logarithmic dynamic range compression implemented in charge domain |
| US20030035057A1 (en) * | 2001-08-20 | 2003-02-20 | Fuji Photo Film Co., Ltd | Charge multiplying solid-state electronic image sensing device and method of controlling same |
| US20070146521A1 (en) * | 2005-10-24 | 2007-06-28 | E2V Technologies (Uk) Limited | Gain measurement structure |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100298039B1 (ko) | 1991-07-11 | 2001-10-24 | 윌리엄 비. 켐플러 | 전하증배장치및그제조방법 |
| JPH0530432A (ja) * | 1991-07-19 | 1993-02-05 | Sharp Corp | 固体撮像装置 |
| EP1152469B1 (en) | 2000-04-28 | 2015-12-02 | Texas Instruments Japan Limited | High dynamic range charge readout system |
| US6509616B2 (en) * | 2000-09-29 | 2003-01-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and its manufacturing method |
| JP2002218327A (ja) * | 2001-01-15 | 2002-08-02 | Sony Corp | 固体撮像装置およびカメラシステム |
| US7420605B2 (en) * | 2001-01-18 | 2008-09-02 | E2V Technologies (Uk) Limited | Solid state imager arrangements |
| JP2002325720A (ja) * | 2001-04-27 | 2002-11-12 | Fuji Photo Film Co Ltd | 内視鏡装置 |
| JP2003158679A (ja) * | 2001-08-20 | 2003-05-30 | Fuji Photo Film Co Ltd | 電荷増倍型固体電子撮像装置およびその制御方法 |
| US6784412B2 (en) * | 2001-08-29 | 2004-08-31 | Texas Instruments Incorporated | Compact image sensor layout with charge multiplying register |
| US6917041B2 (en) * | 2002-03-18 | 2005-07-12 | Massachusetts Institute Of Technology | Event-driven charge-coupled device design and applications therefor |
| JP3689866B2 (ja) | 2002-05-30 | 2005-08-31 | 日本テキサス・インスツルメンツ株式会社 | Cmd及びcmd搭載ccd装置 |
| US20050029553A1 (en) | 2003-08-04 | 2005-02-10 | Jaroslav Hynecek | Clocked barrier virtual phase charge coupled device image sensor |
| GB2413007A (en) | 2004-04-07 | 2005-10-12 | E2V Tech Uk Ltd | Multiplication register for amplifying signal charge |
| US7522205B2 (en) * | 2004-09-10 | 2009-04-21 | Eastman Kodak Company | Image sensor with charge multiplication |
| JP4772337B2 (ja) * | 2005-02-17 | 2011-09-14 | 浜松ホトニクス株式会社 | 撮像装置、撮像システム、及び共焦点顕微鏡 |
| GB2424758A (en) | 2005-03-31 | 2006-10-04 | E2V Tech | CCD device |
-
2009
- 2009-01-30 JP JP2009020453A patent/JP5270392B2/ja active Active
-
2010
- 2010-01-22 US US12/920,114 patent/US8552352B2/en active Active
- 2010-01-22 KR KR1020107019369A patent/KR101066341B1/ko active Active
- 2010-01-22 EP EP10735748.5A patent/EP2249390B1/en active Active
- 2010-01-22 CN CN201080001167XA patent/CN101960597B/zh active Active
- 2010-01-22 WO PCT/JP2010/050778 patent/WO2010087279A1/ja not_active Ceased
- 2010-01-29 TW TW099102710A patent/TWI499294B/zh active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6444968B1 (en) * | 1997-03-22 | 2002-09-03 | Eev Ltd | CCD imager with separate charge multiplication elements |
| US6278142B1 (en) * | 1999-08-30 | 2001-08-21 | Isetex, Inc | Semiconductor image intensifier |
| US20020191093A1 (en) * | 2001-06-04 | 2002-12-19 | Jaroslav Hynecek | Charge multiplier with logarithmic dynamic range compression implemented in charge domain |
| US20030035057A1 (en) * | 2001-08-20 | 2003-02-20 | Fuji Photo Film Co., Ltd | Charge multiplying solid-state electronic image sensing device and method of controlling same |
| US20070146521A1 (en) * | 2005-10-24 | 2007-06-28 | E2V Technologies (Uk) Limited | Gain measurement structure |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101960597A (zh) | 2011-01-26 |
| WO2010087279A1 (ja) | 2010-08-05 |
| US20110024606A1 (en) | 2011-02-03 |
| CN101960597B (zh) | 2012-07-04 |
| TW201119373A (en) | 2011-06-01 |
| EP2249390B1 (en) | 2013-10-09 |
| JP5270392B2 (ja) | 2013-08-21 |
| EP2249390A1 (en) | 2010-11-10 |
| US8552352B2 (en) | 2013-10-08 |
| EP2249390A4 (en) | 2012-03-07 |
| KR20100107067A (ko) | 2010-10-04 |
| KR101066341B1 (ko) | 2011-09-20 |
| JP2010177564A (ja) | 2010-08-12 |
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