TWI438898B - 自我對準之互補雙擴散金氧半導體 - Google Patents

自我對準之互補雙擴散金氧半導體 Download PDF

Info

Publication number
TWI438898B
TWI438898B TW096111844A TW96111844A TWI438898B TW I438898 B TWI438898 B TW I438898B TW 096111844 A TW096111844 A TW 096111844A TW 96111844 A TW96111844 A TW 96111844A TW I438898 B TWI438898 B TW I438898B
Authority
TW
Taiwan
Prior art keywords
source
gate
self
ldmos device
oxide
Prior art date
Application number
TW096111844A
Other languages
English (en)
Other versions
TW200805659A (en
Inventor
Jun Cai
Original Assignee
Fairchild Semiconductor
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fairchild Semiconductor filed Critical Fairchild Semiconductor
Publication of TW200805659A publication Critical patent/TW200805659A/zh
Application granted granted Critical
Publication of TWI438898B publication Critical patent/TWI438898B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843—Source or drain regions of field-effect devices
    • H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
    • H01L29/0852—Source or drain regions of field-effect devices of field-effect transistors with insulated gate of DMOS transistors
    • H01L29/0856—Source regions
    • H01L29/0869—Shape
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823807—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the channel structures, e.g. channel implants, halo or pocket implants, or channel materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823814—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the source or drain structures, e.g. specific source or drain implants or silicided source or drain structures or raised source or drain structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823857—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the gate insulating layers, e.g. different gate insulating layer thicknesses, particular gate insulator materials or particular gate insulator implants
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66674—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/66681—Lateral DMOS transistors, i.e. LDMOS transistors
    • H01L29/66689—Lateral DMOS transistors, i.e. LDMOS transistors with a step of forming an insulating sidewall spacer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7816—Lateral DMOS transistors, i.e. LDMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843—Source or drain regions of field-effect devices
    • H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
    • H01L29/0852—Source or drain regions of field-effect devices of field-effect transistors with insulated gate of DMOS transistors
    • H01L29/0873—Drain regions
    • H01L29/0878—Impurity concentration or distribution
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/107—Substrate region of field-effect devices
    • H01L29/1075—Substrate region of field-effect devices of field-effect transistors
    • H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
    • H01L29/1083—Substrate region of field-effect devices of field-effect transistors with insulated gate with an inactive supplementary region, e.g. for preventing punch-through, improving capacity effect or leakage current
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/107—Substrate region of field-effect devices
    • H01L29/1075—Substrate region of field-effect devices of field-effect transistors
    • H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
    • H01L29/1087—Substrate region of field-effect devices of field-effect transistors with insulated gate characterised by the contact structure of the substrate region, e.g. for controlling or preventing bipolar effect
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42364—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42364—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity
    • H01L29/42368—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity the thickness being non-uniform
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/45—Ohmic electrodes
    • H01L29/456—Ohmic electrodes on silicon

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Description

自我對準之互補雙擴散金氧半導體
本發明係關於半導體裝置，更具體而言係關於橫向LDMOS裝置。
在MOS功率裝置(例如一橫向雙擴散金氧半導體(LDMOS)裝置)中，大體而言，在以下三因素間存在一取捨：崩潰電壓(BVdss)、導通狀態電阻(Rdson)與安全操作區(SOA)，其中BVdss及Rdson具有一衝突關係(例如，BVdss的一增加導致一較高Rdson)，BVdss與SOA彼此輔助(例如，BVdss的一增加導致一較大SOA)，而且Rdson與SOA可具有一衝突或輔助關係。可藉由隔開該汲極區與該閘極進而形成一漂移區，以增加BVdss。然而，此一漂移區增加Rdson，在習知裝置中，Rdson與該汲極及該源極間之間距成比例。因此，在習知裝置中，於一裝置設計中升高BVdss將增加Rdson。
因此需要一種LDMOS裝置，其具有較習知裝置更高的一BVdss、更低之Rdson與更高之SOA的一組合。
本發明的一具體實施例提供一種自我對準LDMOS裝置，其具有含一閘極氧化物的一閘極，及在該閘極之一源極側上的一氧化物間隔物，一源極區具有一嵌入一源極井中的一分接點及一源極間隔物，該分接點與該氧化物間隔物的一邊緣對準，而且該源極間隔物與該閘極多晶矽之邊緣對準，使該源極間隔物完全在該氧化物間隔物之下，而且一汲極區位於該閘極之源極側的相反處，該汲極區具有嵌入一汲極井中的一汲極。
在一形式中，本發明包括一自我對準LDMOS裝置，其具有位於一高電壓井的一閘極，該閘極具有在該高電壓井上的一閘極氧化物及在該閘極氧化物上的一多晶矽層，該高電壓井中的一源極區在該閘極的一源極側，該高電壓井中的一汲極區在該閘極的一汲極側，且其中在該閘極之汲極側的閘極氧化物係厚的。
本發明的一具體實施例係一種形成一自我對準LDMOS裝置之方法，其係藉由提供具有一氧化物層及一多晶矽層的一高電壓井、蝕刻該氧化物層及該多晶矽層以形成一源極區、一汲極區及一閘極區，並且其間有一閘極，而在該高電壓井之源極區中形成一源極井，且在該高電壓井之汲極區中形成一汲極井，在該源極區中植入在該閘極下從該源極井延伸的一源極本體，在該源極井中植入一源極，而且形成在該源極上與該閘極相鄰的一氧化物間隔物，使該氧化物間隔物完全覆蓋該源極。
參閱圖1，其顯示根據本發明之一具體實施例之一完全自我對準互補LDMOS裝置的一n型具體實施例50。如圖1中所示，該LDMOS裝置50係一多閘極裝置。該LNDMOS 50包含一源極52、各具有一厚閘極氧化物60之三閘極54、56與58，及一汲極62。該閘極56介於該源極52與該汲極62之間，然而該閘極54在該源極52之相反側，而且該閘極58在該汲極62之相反側。該源極52及汲極62係在一高電壓HV NWELL 64中形成。該HV NWELL 64之下可為另一層66，取決於該LDMOS 50之使用(例如該LDMOS 50是否整合於一低電壓CMOS平台，及相較於較低電壓裝置，該LDMOS 50從該源極與汲極至該基板是否經受相對較高電壓，抑或在一積體電路中LDMOS裝置50具有隔離之效能要求)，該層可為建造在一P型基板中的一N埋層或一N隔離層。
如圖1中所示，該閘極54具有一右側壁氧化物68，該閘極56具有一左(在其源極側)側壁氧化物70，及一右(在其汲極側)側壁氧化物72，而且該閘極58具有一左側壁氧化物74。該源極52具有一矽化物層76，其具有至一金屬層82的一接點80，該金屬層82在一P＋分接點78之頂部。該P＋分接點78形成一源極區，該源極區由一P井84在其下方並在其大部分之側加以封閉，該P井84向下延伸至該HV NWELL 64中。未由該P井84封閉之P＋分接點78之側部分與兩N＋源極間隔物86及88接觸，該N＋源極間隔物86填充該HV NWELL 64之頂部與該閘極54之右側垂直投影間的間隙，而且該N＋源極間隔物88填充該HV NWELL 64之頂部與該閘極56之左側垂直投影間的間隙。該N＋源極間隔物86與88從該HV NWELL 64之頂部表面向下延伸至該P＋分接點78之頂部邊緣之正下方。從該HV NWELL 64之上側垂直延伸至該HV NWELL 64之頂部表面而且橫向至該等閘極54與56之閘極氧化物60之下分別為兩P本體90與92。
相對較小而且淺之N＋源極間隔物86、88自我對準至該閘極多晶，而且僅在該等側壁氧化物間隔物68、70之下。該P＋分接點78係該源極區域的一很大百分比，並自我對準至該等側壁氧化物間隔物68、70，而且與該等N＋源極間隔物86、88一起放置在該P井84裡面，提供一大SOA、低洩漏，及小裝置大小。再者，該有效通道長度112係由該閘極密封氧化期間P本體90、92之角度植入及橫向擴散所控制。臨限電壓(Vt)係藉由該有效通道區112及該P本體90、92加以控制。該短有效通道長度112提供低通道電阻。結果，該閘極多晶長度110可為最小設計特點之尺寸。
該汲極62具有一矽化物層100，該矽化物層100具有至一金屬層104的一接點102，該金屬層104在一N＋汲極區106之頂部。一N井108在該N＋汲極區106之下方及其側上，該N井108具有一高於該HV NWELL 64之摻雜物濃度。該N井108橫向延伸至該等側壁氧化物72與74之下。該汲極62中之深N井108造成深入該HV NWELL 64之電流縮減汲極區電場。
閘極長度(Lg)係以參考數字110加以指示，而且有效通道區係該區112。
該裝置50之BVdss小於該閘極氧化物崩潰電壓，因而限制該厚閘極氧化物之下限。例如，在本發明的一具體實施例中，一400之閘極氧化物厚度限制BVdss大約為45伏特。
圖2係一分裂閘極氧化物N通道LDMOS裝置110，其係具有分裂閘極氧化物112之圖1之N通道LDMOS裝置50，該等分裂閘極氧化物112具有在該等閘極54、56之源極側上的一較薄部分114，及在該等閘極56、58之汲極側上的一較厚部分116。區118係該分裂閘極氧化物112之有效通道，而且參考數字119指示該LDMOS裝置110之漂移區長度。
通常圖1之厚閘極氧化物裝置用於高電壓裝置，而圖2之分裂閘極氧化物裝置用於低電壓裝置。該BVdss係關於該漂移區119及該分裂閘極氧化物112之厚部分116。再者，該厚部分116縮減該閘極56之汲極側之電場擁擠，而縮減該汲極空乏區及縮減該衝穿電壓。
若該分裂閘極氧化物112之厚部分116之臨限電壓(Vta)係關於該漂移區119之表面累積層，而且若可控制該閘極至源極電壓(Vgs)等於或大於Vta，則由於在該漂移區119頂部之表面累積層，該漂移區119之電阻可顯著縮減。因此，在此等條件下造成該分裂閘極氧化物112之厚部分116之厚度之上限。例如，具有一400之厚閘極氧化物厚度，該Vta大約2伏特，而該閘極氧化物112的一115薄部分114之Vt大約0.9伏特。
圖3係根據本發明之一具體實施例之一多閘極自我對準P通道LDMOS裝置120的一輪廓圖，其與圖1中所示之N通道LDMOS裝置互補。該P通道LDMOS裝置120包含一源極122、各具有一閘極氧化物130之三閘極124、126與128，及一汲極132。該閘極126介於該源極122與該汲極132之間，而該閘極124在該源極122之相反側，並且該閘極128在該汲極132之相反側。該源極122及汲極132係在一高電壓HV PWELL 134中形成。在該HV PWELL 134之下可為另一層66，取決於該LDMOS 120之使用(例如該LDMOS 120是否整合於一低電壓CMOS平台中，及相較於一積體電路中之較低電壓裝置，該LDMOS 120其從該源極與汲極至該基板是否屬於相對較高電壓)，其可為一N埋層或一N隔離層。
如圖3中所示，該閘極124具有一右側壁氧化物138，該閘極126具有一左(在其源極側)側壁氧化物140，及一右(在其汲極側)側壁氧化物142，而且該閘極128具有一左側壁氧化物144。該源極122具有一矽化物層146，該矽化物層146具有至一金屬層152的一接點150，該金屬層152在一N＋分接點148之頂部。該N＋分接點148形成一源極區，該源極區由一N井154在其下方加以封閉並且在其大部分之側，該N井154向下延伸至該HV PWELL 134中。未由該N井154封閉之N＋分接點148之側部分與兩P＋源極間隔物156及158接觸，該P＋源極間隔物156填充該HV PWELL 134之頂部與該閘極124之右側垂直投影間之間隙，而且該P＋源極間隔物158填充該HV PWELL 134之頂部與該閘極126之左側垂直投影間之間隙。該P＋源極間隔物156與158從該HV PWELL 134之頂部表面向下延伸至該N＋分接點148之頂部邊緣之正下方。從該N＋分接點148之上側垂直延伸至該HV PWELL 134之頂部表面並且橫向至該等閘極124與126之閘極氧化物130之下係分別為兩N本體160與162。
該汲極132具有一矽化物層170，該矽化物層170具有至一金屬層174的一接點172，該金屬層174在一P＋汲極區176之頂部。一P井178在該P＋汲極區176之下方及側上，該P井178具有一高於該HV PWELL 134之摻雜物濃度。該P井178橫向延伸至該等側壁氧化物142與144之下。
圖4係一分裂閘極氧化物P通道LDMOS裝置180，其係具有分裂閘極氧化物182之圖3之P通道LDMOS裝置120，該等分裂閘極氧化物182具有在該等閘極124、126之源極側上的一較薄部分184，及在該等閘極126、128之汲極側上的一較厚部分186。
圖5係根據本發明之另一具體實施例之一多閘極自我對準N通道LDMOS裝置200的一輪廓圖，當在一積體電路中該LDMOS裝置為一高電壓裝置時，用以隔離該裝置。圖5中，該HV NWELL 64之底及側係由一高電壓P井(HV PWELL)222及一P埋層223所圍繞。該HV PWELL 222係由一HV NWELL 226環所圍繞，該環亦可為一HV N槽環。若在一P基板上形成該LDMOS裝置，則該P埋層223底下具有連接至該HV NWELL環226以完全隔離該LDMOS裝置與一P基板的一N隔離層66。該HV NWELL環226藉由端子228連接至一局部高電壓，以增強該N通道LDMOS裝置之隔離。已修正圖1之源極52以形成一源極230，其中該P本體90並不存在，而且圖1之P井84已由一P井232加以取代，該P井232之左半進一步橫向延伸，而由在該HV PWELL 222之頂部表面的一場氧化物234加以覆蓋。該場氧化物234在該源極矽化物76與該HV NWELL環226之內部邊緣間橫向延伸。可完成在具有較低電壓裝置的一積體電路中之高電壓LDMOS裝置之製造，而不需通常習知功率組件整合所要求之任何額外熱擴散。
圖6係一分裂閘極氧化物N通道LDMOS裝置240，其係具有該分裂閘極氧化物112之圖5之N通道LDMOS裝置200。
圖7係根據本發明之又另一具體實施例之一多閘極自我對準N通道LDMOS裝置250的一輪廓圖。在圖7中，將圖1之汲極62與該閘極252間隔開並加以修正，以形成該汲極254，其中一N井256係圖1中之N井108，該N井256在該HV NWELL 64之頂部橫向延伸，而且放置在兩場氧化物區258及260下方。該等場氧化物區258及260從該閘極氧化物60延伸至最接近該閘極252之汲極矽化物100之邊緣。該閘極252之多晶矽層在該場氧化物258上方延伸至不到該N井256的一位置，藉以形成一場間隙漂移區262。
圖8係一分裂閘極氧化物N通道LDMOS裝置270，其係具有該分裂閘極氧化物112之圖7之N通道LDMOS裝置250。因為LDMOS裝置270之有效通道區之分裂閘極氧化物112僅位於該分裂閘極氧化物112之薄部分，而且該LDMOS裝置270具有一低於該LDMOS裝置250之臨限電壓，但既然LDMOS裝置250、270兩者於該分裂閘極氧化物112之厚部分與該場氧化物258間具有相同之漂移區設計及類似之電場行為，所以兩LDMOS裝置具有類似之關閉狀態效能。
圖9係根據本發明之另一具體實施例之一多閘極自我對準P通道LDMOS裝置280的一輪廓圖。在圖9中，一P井282取代圖3中之P井178，該P井282進一步在該厚閘極氧化物130之下橫向延伸，而且以HV NWELL 135取代圖3中之HV PWELL 134，因此實質縮減該P井282摻雜濃度所導致之漂移電阻，該摻雜濃度遠大於HV PWELL 135摻雜濃度。
圖10係一分裂閘極氧化物P通道LDMOS裝置290，其係具有一分裂閘極氧化物182之圖9之P通道LDMOS裝置280。在此具體實施例中，該P井282延伸至大約該分裂閘極氧化物182從該薄部分184至該厚部分186之轉移處。
圖11與12分別為根據本發明之又另一具體實施例之多閘極自我對準P通道LDMOS裝置300與310之輪廓圖。圖11與12分別為圖5與6之N通道LDMOS裝置200與240之P通道均等物。在圖11與12中，為作隔離之用途，將圖3中之P通道LDMOS裝置120及圖4之P通道LDMOS裝置180建造在一N型隔離環(該HV NWELL與N型槽226及N型埋層66)中。
圖13係根據本發明之又另一具體實施例之一多閘極自我對準P通道LDMOS裝置320的一輪廓圖。圖13中將圖3之汲極132與該閘極322間隔開並加以修正，以形成該汲極324，其中一P井326係圖3中之P井178，該P井326在該HV PWELL 134之頂部橫向延伸，而且放置在兩場氧化物區258及260下方。該等場氧化物區258及260從該閘極氧化物130延伸至最接近該閘極322之汲極矽化物170之邊緣。該閘極322之多晶矽層在該場氧化物258上方延伸至不到該P井326的一位置，藉以形成一場間隙漂移區328。
圖14係一分裂閘極氧化物P通道LDMOS裝置330，其係具有分裂閘極氧化物182之圖13之P通道LDMOS裝置320。因為LDMOS裝置330之有效通道區之分裂閘極氧化物182僅位於該LDMOS裝置330之分裂閘極氧化物182之薄部分，該LDMOS裝置330具有一低於該LDMOS裝置320之臨限電壓，但既然兩LDMOS裝置於該分裂閘極氧化物182之厚部分與該場氧化物258間具有相同之漂移區設計及類似之電場行為，所以具有類似之關閉狀態效能。
圖15、16、17與18係分別在產生圖1與2之N通道LDMOS裝置及圖3與4之P通道LDMOS裝置中之一第一步驟之輪廓圖，其中顯示圖15、16中之HV NWELL 64及圖17、18中之HV PWELL 134，其選擇性在可能一N埋層或一N隔離層之另一層66之上方。
圖19、20、21與22係分別在產生圖1、2之N通道LDMOS裝置及圖3與4之P通道LDMOS裝置中之一後續步驟之輪廓圖，其中於形成圖1、2之P井84及N井108以及形成圖3與4之N井154及P井178後，形成圖1與2之閘極54、56、58及其個別閘極氧化物以及圖3與4之閘極124、126與128及其個別閘極氧化物。
圖23、24、25與26係分別在產生圖1與2之N通道LDMOS裝置及圖3與4之P通道LDMOS裝置中之又一後續步驟之輪廓圖，其中將光阻400施加於該晶圓並加以圖案化，以形成圖23至26中所示之區。在圖23與24中，如箭號所指示，於該光阻400就定位後離子植入N通道裝置，以形成自我對準之P本體90與92及N＋源極間隔物86與88。該等閘極54與56作為遮罩，以對準該等P本體90與92及該等N＋源極間隔物86與88之邊緣。於此時，圖25與26所示之P通道裝置完全由光阻400所覆蓋。
圖27、28、29與30係分別在產生圖1與2之N通道LDMOS裝置及圖3與4之P通道LDMOS裝置中又一後續步驟之輪廓圖，其中已移除光阻層400並施加另一層420而且加以圖案化，以便藉由如同圖23與24中形成該等P本體90與92及該等N＋源極間隔物86與88之方式形成該等N本體160與162及P＋源極間隔物156與158。
圖31、32、33與34係分別在產生圖1與2之N通道LDMOS裝置及圖3與4之P通道LDMOS裝置中之又一後續步驟之輪廓圖，其中已在該晶圓上放置一氧化物層，然後進行非等向蝕刻，以形成圖31與32中之側壁氧化物68、70、72與74，及圖33與34中之側壁氧化物138、140、142與144。於該等側壁氧化物就定位後，其用以自我對準圖31與32中之P＋源極分接點區78及N＋汲極區106，及用以自我對準圖31與32中之N＋源極分接點區148及P＋汲極區176。
於完成圖31至34中所示之處理後。再次使用用於對準之側壁氧化物形成圖1至4中所示之源極及汲極之矽化物，然後形成圖1至4中所示之接點及金屬化。
由於相對簡單之程序，所以可以一相對較低之成本生產本文所述之具體實施例之LDMOS裝置。
圖35係根據本發明之一具體實施例(即圖1之具體實施例)之一已製造之N通道LDMOS裝置440的一輪廓圖。既然該等閘極氧化物側壁間隔物之邊緣之汲極側與在該HV NWELL 64頂部之N＋汲極區垂直對準，所以該LDMOS裝置440具有一側壁氧化物間隔物漂移區。圖36A、B與C及37A、B與C中顯示該LDMOS裝置440之特徵。用以產生圖36A、B與C中所示特徵之裝置具有一.35 μm之閘極長度(以圖35中之尺寸442加以指示)，而且用以產生37A、B與C中所示特徵之裝置具有一.60 μm之閘極長度。
圖36A與36B顯示關於LDMOS裝置440並且變動閘極至源極電壓位準之汲極電流對源極至汲極電壓。在圖36A與36B兩者中，該汲極電流以100 ma為限，而在圖36A中，該源極至汲極電壓以8伏特為限，而且在圖37B中，該閘極至源極電壓以12伏特為限。下列表中顯示用以產生圖36A、36B、37A與37B中之曲線之閘極至源極電壓：
圖36C顯示該汲極電流對該反轉汲極至源極電壓，其中指示一大約18伏特之崩潰電壓。
圖37A、37B與37C係圖36A、36B與36C中所示之可比較特徵，但其係來自具有一.60 μm之閘極長度之LDMOS裝置440。結果，圖37A與37B中所示之增益分別小於圖36A與36B中所示之增益，但在圖37C中，崩潰電壓增加至大約20伏特。具有一.40 μm之閘極長度之圖35之LDMOS裝置具有一大約1.6 μm之間距。
以下係本發明之一或多個具體實施例中用於具有一400之閘極氧化物厚度之裝置之最佳資料矽的一表：
雖然已經參考較佳具體實施例來說明本發明，不過熟習本技術之人士應瞭解，可對其進行各種變更，且可以等效物來替代其元件以適應於特殊情況，而不會脫離本發明的範疇。所以，本發明並不希望受限於本文所揭示之被視為用於實行本發明之最佳模式的特殊具體實施例，相反地，本發明將包含屬於所附申請專利範圍之範疇與精神之所有具體實施例。
50．．．LDMOS裝置
52、122、230．．．源極
54、56、58、124、126、128、252、322．．．閘極
60、130．．．閘極氧化物
62、132、254、324．．．汲極
64、135、226．．．高電壓N井
66．．．N埋層或N隔離層
68、70、72、74、138、140、142、144．．．側壁氧化物
76、100、146、170．．．矽化物層
78．．．P＋分接點
80、102、150、172．．．接點
82、104、152、174．．．金屬層
84、178、232、282、326．．．P井
86、88．．．N＋源極間隔物
90、92．．．P本體
106．．．N＋汲極區
108．．．N井
110．．．LDMOS裝置
112、118．．．有效通道
114、184．．．較薄部分
116、186．．．較厚部分
119．．．漂移區
120、180、280．．．P通道LDMOS裝置
134、222．．．高電壓P井
148．．．N＋分接點
154．．．N井
156、158．．．P＋源極間隔物
160、162．．．N本體
176．．．P＋汲極區
182．．．分裂閘極氧化物
200、240、250、270、440．．．N通道LDMOS裝置裝置
223．．．P埋層
228．．．端子
234、258、260．．．場氧化物
256．．．N井
262、328．．．場間隙漂移區
290、330．．．分裂閘極氧化物P通道LDMOS裝置裝置
300、310、320．．．多閘極自我對準P通道LDMOS裝置裝置
400、420．．．光阻
藉由參考下列本發明之各種具體實施例的說明併同附圖，本發明之特點與優點及其達成方式將變得明顯而且更可瞭解，其中：圖1係根據本發明之一具體實施例之一多閘極自我對準N通道LDMOS裝置的一輪廓圖；圖2係具有一分裂閘極氧化物之圖1之N通道LDMOS裝置；圖3係根據本發明之一具體實施例之一多閘極自我對準P通道LDMOS裝置的一輪廓圖，其與圖1中所示之N通道LDMOS裝置互補；圖4係具有一分裂閘極氧化物之圖3之P通道LDMOS裝置；圖5係根據本發明之另一具體實施例之一多閘極自我對準N通道LDMOS裝置的一輪廓圖；圖6係具有一分裂閘極氧化物之圖5之N通道LDMOS裝置；圖7係根據本發明之又另一具體實施例之一多閘極自我對準N通道LDMOS裝置的一輪廓圖；圖8係具有一分裂閘極氧化物之圖5之N通道LDMOS裝置；圖9係根據本發明之另一具體實施例之一多閘極自我對準P通道LDMOS裝置的一輪廓圖；圖10係具有一分裂閘極氧化物之圖9之P通道LDMOS裝置；圖11係根據本發明之又另一具體實施例之一多閘極自我對準P通道LDMOS裝置的一輪廓圖；圖12係具有一分裂閘極氧化物之圖11之P通道LDMOS裝置；圖13係根據本發明之又另一具體實施例之一多閘極自我對準P通道LDMOS裝置的一輪廓圖；圖14係具有一分裂閘極氧化物之圖13之P通道LDMOS裝置；圖15係在產生圖1之N通道LDMOS裝置中之一第一步驟的一輪廓圖；圖16係在產生圖2之N通道LDMOS裝置中之一第一步驟的一輪廓圖；圖17係在產生圖3之P通道LDMOS裝置中之一第一步驟的一輪廓圖；圖18係在產生圖4之P通道LDMOS裝置中之一第一步驟的一輪廓圖；圖19係在產生圖1之N通道LDMOS裝置中之一後續步驟的一輪廓圖；圖20係在產生圖2之N通道LDMOS裝置中之一後續步驟的一輪廓圖；圖21係在產生圖3之P通道LDMOS裝置中之一後續步驟的一輪廓圖；圖22係在產生圖4之P通道LDMOS裝置中之一後續步驟的一輪廓圖；圖23係在產生圖1之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖24係在產生圖2之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖25係在產生圖3之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖26係在產生圖4之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖27係在產生圖1之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖28係在產生圖2之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖29係在產生圖3之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖30係在產生圖4之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖31係在產生圖1之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖32係在產生圖2之N通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖33係在產生圖3之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖34係在產生圖4之P通道LDMOS裝置中之又一後續步驟的一輪廓圖；圖35係根據本發明之一具體實施例之一已製造之N通道LDMOS裝置的一輪廓圖；圖36A、36B與36C係圖35中所示之一第一已製造之N通道LDMOS裝置之測量資料；以及圖37A、37B與37C係圖35中所示之一第二已製造之N通道LDMOS裝置之測量資料。
應瞭解：為了清楚之目的，而且只要適當，圖式中將重複參考數字以指示對應特點。同時，某些情況已將圖式之各種物件的相對大小加以扭曲，以較清楚顯示本發明。本文所列之範例說明本發明之一具體實施例，而不應認為以任何方式限制本發明之範疇。
50．．．橫向雙擴散金氧半導體裝置
52．．．源極
54、56、58．．．閘極
60．．．閘極氧化物
62．．．汲極
64．．．高電壓N井
66．．．N埋層或N隔離層
68、70、72、74．．．側壁氧化物
76、100．．．矽化物層
78．．．P＋分接點
80、102．．．接點
82、104．．．金屬層
84．．．P井
86、88．．．N＋源極間隔物
90、92．．．P本體
106．．．N＋汲極區
108．．．N井
112．．．有效通道區

Claims (38)

  1. 一種自我對準LDMOS裝置，其包括：一閘極，其具有一閘極電極及一閘極氧化物，及在該閘極之一源極側上的一氧化物間隔物；一源極，其具有一分接點及嵌入一源極井中的之源極間隔物，其中該分接點與該源極井為第一傳導類型而該源極間隔物為一與第一傳導類型相反之第二傳導類型，該分接點與該氧化物間隔物的一邊緣自我對準，而且該源極間隔物與該閘極之該邊緣自我對準，使該源極間隔物實質上在該氧化物間隔物之下；以及一汲極，其位於該閘極之該源極側之相反處，該汲極具有嵌入一汲極井中的一汲極區。
  2. 如請求項1之自我對準LDMOS裝置，該分接點及該源極井包括一N型摻雜物，而且該源極間隔物、該汲極及該汲極井包括一P型摻雜物。
  3. 如請求項2之自我對準LDMOS裝置，其進一步包括一互補電晶體，其具有一互補閘極、一互補源極區，及一互補汲極區。
  4. 如請求項3之自我對準LDMOS裝置，該互補源極區包括一P型分接點及一P型源極井；而且該汲極區包括一N型源極間隔物、一N型汲極，及一N型汲極井。
  5. 如請求項1之自我對準LDMOS裝置，實質上沿著該閘極之整個斷面的該閘極氧化物係厚的。
  6. 如請求項1之自我對準LDMOS裝置，接近該源極之該閘 極氧化物係薄的，而且接近該汲極係厚的。
  7. 如請求項6之自我對準LDMOS裝置，其進一步包括一第二電晶體閘極，其中實質上沿著該第二電晶體閘極之整個斷面的一第二電晶體閘極氧化物係厚的。
  8. 如請求項1之自我對準LDMOS裝置，其進一步包括一圍繞該閘極、源極及汲極之隔離環。
  9. 如請求項8之自我對準LDMOS裝置，其進一步包括一場氧化物，其從該隔離區延伸至該閘極之該源極側。
  10. 如請求項8之自我對準LDMOS裝置，其進一步包括一高電壓N井，其從該隔離環橫向延伸至該閘極之該源極側上的該源極井。
  11. 如請求項6之自我對準LDMOS裝置，其進一步包括一圍繞該閘極、源極及汲極之隔離環。
  12. 如請求項11之自我對準LDMOS裝置，其進一步包括一場氧化物，其從該隔離區延伸至該閘極之該源極側上的該源極。
  13. 如請求項12之自我對準LDMOS裝置，其進一步包括一高電壓N井，其從該隔離環橫向延伸至該閘極之該源極側上的該源極井。
  14. 如請求項1之自我對準LDMOS裝置，其進一步包括一場氧化物，其從該閘極氧化物延伸至該汲極，而且該閘極具有在該場氧化物上方的一多晶矽層，其朝向該汲極橫向延伸至該場氧化物上的一位置。
  15. 如請求項14之自我對準LDMOS裝置，其中該汲極井在該 場氧化物之下橫向延伸。
  16. 如請求項6之自我對準LDMOS裝置，其進一步包括從該閘極氧化物延伸至該汲極的一場氧化物，而且該閘極具有在該場氧化物上方的一多晶矽層，其朝向該汲極橫向延伸至該場氧化物上的一位置。
  17. 如請求項16之自我對準LDMOS裝置，其中該汲極井在場氧化物之下橫向延伸。
  18. 如請求項1之自我對準LDMOS裝置，其進一步包括一矽化物層，該矽化物層與該分接點及該源極間隔物接觸，但僅與該源極間隔物之一側接觸。
  19. 如請求項1之自我對準LDMOS裝置，其中該源極間隔物為高摻雜。
  20. 如請求項1之自我對準LDMOS裝置，其中該源極區進一步包括該第一傳導類型之一本體，其在該閘極電極下延伸。
  21. 一種自我對準LDMOS裝置，其包括：一閘極，其具有一閘極電極及一閘極氧化物，及在該閘極之一源極側上的一氧化物間隔物；一源極區，其具有一分接點及嵌入一源極井中的之高摻雜源極間隔物，該分接點與該氧化物間隔物的一邊緣自我對準，而且該源極間隔物與該閘極之該邊緣自我對準，使該源極間隔物實質上在該氧化物間隔物之下；及在該閘極的一汲極側上之一汲極區。
  22. 如請求項21之自我對準LDMOS裝置，該閘極氧化物之厚 度大約400Å。
  23. 如請求項21之自我對準LDMOS裝置，在該閘極之該源極側上之該閘極氧化物係厚的。
  24. 如請求項21之自我對準LDMOS裝置，該閘極係在該源極側上具有一薄閘極氧化物的一分裂閘極。
  25. 如請求項24之自我對準LDMOS裝置，該薄閘極氧化物之厚度大約115Å。
  26. 如請求項22之自我對準LDMOS裝置，該閘極包括在該源極側上的一氧化物間隔物，而且該源極區包括完全在該氧化物間隔物之下的一源極。
  27. 如請求項21之自我對準LDMOS裝置，其進一步包括一矽化物層，該矽化物層與該分接點及該源極間隔物接觸，但僅與該源極間隔物之一側接觸。
  28. 如請求項21之自我對準LDMOS裝置，其中該分接點與該源極井為第一傳導類型而該源極間隔物為一與第一傳導類型相反之第二傳導類型。
  29. 如請求項21之自我對準LDMOS裝置，其中該源極區進一步包括該第一傳導類型之一本體，其在該閘極電極下延伸。
  30. 一種形成一自我對準LDMOS裝置之方法，其包括以下步驟：a)提供具有一氧化物層及一多晶矽層的一高電壓井；b)蝕刻該氧化物層及該多晶矽層以形成其間具有一閘極的一源極區及一汲極區； c)在該高電壓井之該源極區中形成一源極井，而且在該高電壓井之該汲極區中形成一汲極井；d)在該源極區中植入一源極本體，其從該源極井延伸而在該閘極之下；e)在該源極井中植入一具有一源極間隔物之源極，該該源極間隔物具有一與該源極井相反之傳導類型；以及f)形成在該源極間隔物上並且與該閘極相鄰的一氧化物間隔物，使該氧化物間隔物本質上覆蓋該源極間隔物。
  31. 如請求項30之方法，其進一步包括在該氧化物間隔物形成步驟後在該源極井中植入一分接點之步驟。
  32. 如請求項31之方法，其進一步包括在該汲極井中植入一汲極之步驟。
  33. 如請求項32之方法，其進一步包括在該源極區及該汲極區中形成一矽化物層之步驟，該源極矽化物層與該分接點及該源極接觸。
  34. 如請求項33之方法，其進一步包括對該源極及該汲極之每一者新增接點。
  35. 如請求項30之方法，該源極本體及該源極與該閘極的一邊緣對準，而且使用相同遮罩形成。
  36. 如請求項30之方法，該源極本體及該源極係以一垂直以外之角度植入。
  37. 如請求項30之方法，該氧化物層之該厚度係由下列厚度組成之群之一：大約115Å及大約400Å。
  38. 如請求項30之方法，該閘極係一分裂閘極，其具有一接近該源極區之薄閘極氧化物及一接近該汲極區之厚閘極氧化物。
TW096111844A 2006-04-03 2007-04-03 自我對準之互補雙擴散金氧半導體 TWI438898B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US78887406P 2006-04-03 2006-04-03
US11/695,199 US20070228463A1 (en) 2006-04-03 2007-04-02 Self-aligned complementary ldmos

Publications (2)

Publication Number Publication Date
TW200805659A TW200805659A (en) 2008-01-16
TWI438898B true TWI438898B (zh) 2014-05-21

Family

ID=38557541

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111844A TWI438898B (zh) 2006-04-03 2007-04-03 自我對準之互補雙擴散金氧半導體

Country Status (3)

Country Link
US (3) US20070228463A1 (zh)
TW (1) TWI438898B (zh)
WO (1) WO2007118060A2 (zh)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101743616B (zh) * 2007-06-28 2012-02-22 株式会社半导体能源研究所 半导体装置的制造方法
US7683427B2 (en) * 2007-09-18 2010-03-23 United Microelectronics Corp. Laterally diffused metal-oxide-semiconductor device and method of making the same
US8299455B2 (en) * 2007-10-15 2012-10-30 International Business Machines Corporation Semiconductor structures having improved contact resistance
US7906810B2 (en) * 2008-08-06 2011-03-15 United Microelectronics Corp. LDMOS device for ESD protection circuit
US8222695B2 (en) 2009-06-30 2012-07-17 Semiconductor Components Industries, Llc Process of forming an electronic device including an integrated circuit with transistors coupled to each other
US8124468B2 (en) 2009-06-30 2012-02-28 Semiconductor Components Industries, Llc Process of forming an electronic device including a well region
US8299560B2 (en) 2010-02-08 2012-10-30 Semiconductor Components Industries, Llc Electronic device including a buried insulating layer and a vertical conductive structure extending therethrough and a process of forming the same
US8298886B2 (en) 2010-02-08 2012-10-30 Semiconductor Components Industries, Llc Electronic device including doped regions between channel and drain regions and a process of forming the same
US8389369B2 (en) 2010-02-08 2013-03-05 Semiconductor Components Industries, Llc Electronic device including a doped region disposed under and having a higher dopant concentration than a channel region and a process of forming the same
US8461647B2 (en) * 2010-03-10 2013-06-11 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device having multi-thickness gate dielectric
US8575691B2 (en) * 2010-03-24 2013-11-05 United Microelectronics Corp. Lateral-diffusion metal-oxide semiconductor device
CN101834207A (zh) * 2010-04-27 2010-09-15 上海北京大学微电子研究院 双扩散金属氧化物半导体场效应管结构及其制造方法
EP2402998B1 (en) * 2010-07-01 2020-04-08 ams AG Method of producing a p-channel LDMOS transistor
CN102637736B (zh) * 2011-02-10 2014-06-25 上海华虹宏力半导体制造有限公司 高压ldmos器件
US20120273883A1 (en) * 2011-04-28 2012-11-01 Taiwan Semiconductor Manufacturing Company, Ltd. High voltage devices and methods for forming the same
US8450814B2 (en) * 2011-09-30 2013-05-28 Micrel, Inc. Extended drain lateral DMOS transistor with reduced gate charge and self-aligned extended drain
US8741704B2 (en) 2012-03-08 2014-06-03 International Business Machines Corporation Metal oxide semiconductor (MOS) device with locally thickened gate oxide
US9041127B2 (en) 2013-05-14 2015-05-26 International Business Machines Corporation FinFET device technology with LDMOS structures for high voltage operations
US9059276B2 (en) * 2013-05-24 2015-06-16 International Business Machines Corporation High voltage laterally diffused metal oxide semiconductor
US9917168B2 (en) 2013-06-27 2018-03-13 Taiwan Semiconductor Manufacturing Company, Ltd. Metal oxide semiconductor field effect transistor having variable thickness gate dielectric
CN103700703B (zh) * 2013-12-30 2016-09-28 杭州电子科技大学 基于soi工艺的漏/源区介质(pn结)隔离前栅n-mosfet射频开关超低损耗器件
CN105097924A (zh) * 2014-05-22 2015-11-25 上海北京大学微电子研究院 功率器件结构
US9537001B2 (en) * 2014-07-30 2017-01-03 Fairchild Semiconductor Corporation Reduction of degradation due to hot carrier injection
US9281379B1 (en) 2014-11-19 2016-03-08 International Business Machines Corporation Gate-all-around fin device
US9978848B2 (en) * 2015-07-17 2018-05-22 Avago Technologies General Ip (Singapore) Pte. Ltd. UTBB FDSOI split gate devices
US9831340B2 (en) * 2016-02-05 2017-11-28 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor structure and associated fabricating method
US10205024B2 (en) * 2016-02-05 2019-02-12 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor structure having field plate and associated fabricating method
CN110021663B (zh) 2018-01-09 2023-08-15 联华电子股份有限公司 半导体元件
US10707345B2 (en) 2018-09-13 2020-07-07 Silanna Asia Pte Ltd Laterally diffused MOSFET with low Rsp*Qg product
CN112242355A (zh) * 2019-07-17 2021-01-19 中芯国际集成电路制造(上海)有限公司 半导体器件及其形成方法
US11195949B2 (en) 2019-10-21 2021-12-07 Semiconductor Components Industries, Llc Laterally diffused metal-oxide-semiconductor (LDMOS) transistors
US11942542B2 (en) 2021-09-29 2024-03-26 Vanguard International Semiconductor Corporation Semiconductor device and fabrication method thereof
TWI821798B (zh) * 2021-11-23 2023-11-11 世界先進積體電路股份有限公司 半導體裝置及其製作方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5557127A (en) * 1995-03-23 1996-09-17 International Rectifier Corporation Termination structure for mosgated device with reduced mask count and process for its manufacture
US6413822B2 (en) * 1999-04-22 2002-07-02 Advanced Analogic Technologies, Inc. Super-self-aligned fabrication process of trench-gate DMOS with overlying device layer
JP4171268B2 (ja) * 2001-09-25 2008-10-22 三洋電機株式会社 半導体装置およびその製造方法
EP1321985B1 (en) * 2001-12-20 2007-10-24 STMicroelectronics S.r.l. Method of integrating metal oxide semiconductor field effect transistors
US6838722B2 (en) * 2002-03-22 2005-01-04 Siliconix Incorporated Structures of and methods of fabricating trench-gated MIS devices
US6844585B1 (en) * 2002-06-17 2005-01-18 National Semiconductor Corporation Circuit and method of forming the circuit having subsurface conductors
US7141455B2 (en) * 2002-11-25 2006-11-28 Texas Instruments Incorporated Method to manufacture LDMOS transistors with improved threshold voltage control
US6989567B2 (en) * 2003-10-03 2006-01-24 Infineon Technologies North America Corp. LDMOS transistor
KR100669597B1 (ko) * 2004-12-30 2007-01-15 동부일렉트로닉스 주식회사 균일한 채널 농도 분포를 갖는 수평형 디모스 트랜지스터

Also Published As

Publication number Publication date
US7875517B2 (en) 2011-01-25
US20100267213A1 (en) 2010-10-21
US20070228463A1 (en) 2007-10-04
US7750401B2 (en) 2010-07-06
TW200805659A (en) 2008-01-16
US20090242982A1 (en) 2009-10-01
WO2007118060A2 (en) 2007-10-18
WO2007118060A3 (en) 2008-04-03

Similar Documents

Publication Publication Date Title
TWI438898B (zh) 自我對準之互補雙擴散金氧半導體
US10381460B2 (en) Semiconductor device and method for manufacturing the same
US9082846B2 (en) Integrated circuits with laterally diffused metal oxide semiconductor structures
US7928508B2 (en) Disconnected DPW structures for improving on-state performance of MOS devices
KR100790257B1 (ko) 반도체 소자 및 그 제조방법
US9660020B2 (en) Integrated circuits with laterally diffused metal oxide semiconductor structures and methods for fabricating the same
KR20010096603A (ko) 반도체 장치 및 그 제조 방법
US9853099B1 (en) Double diffused metal oxide semiconductor device and manufacturing method thereof
JP4308096B2 (ja) 半導体装置及びその製造方法
KR20110078621A (ko) 반도체 소자 및 그 제조 방법
CN108885999B (zh) 半导体装置及其制造方法
CN107871782B (zh) 双扩散金属氧化物半导体元件及其制造方法
JP4713415B2 (ja) 半導体素子
KR100947941B1 (ko) 반도체 소자 및 그 제조방법
JP2004335812A (ja) 高耐圧半導体装置及びその製造方法
CN111785774A (zh) Bcd工艺中cmos器件及其制造方法
KR100922557B1 (ko) Ｃｍｏｓ 트랜지스터 및 그 제조 방법
US8421149B2 (en) Trench power MOSFET structure with high switching speed and fabrication method thereof
JP2005197287A (ja) 半導体装置およびその製造方法
US8912601B2 (en) Double diffused drain metal oxide semiconductor device and manufacturing method thereof
JP2005322723A (ja) 半導体装置およびその製造方法
JP4150704B2 (ja) 横型短チャネルｄｍｏｓ
JPS61177776A (ja) 半導体装置
JP2017034006A (ja) 半導体装置及び半導体装置の製造方法
JP2023177677A (ja) 半導体装置およびその製造方法