TWI421643B - A light source device and an exposure device using the same - Google Patents
A light source device and an exposure device using the same Download PDFInfo
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- TWI421643B TWI421643B TW096130174A TW96130174A TWI421643B TW I421643 B TWI421643 B TW I421643B TW 096130174 A TW096130174 A TW 096130174A TW 96130174 A TW96130174 A TW 96130174A TW I421643 B TWI421643 B TW I421643B
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
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- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
本發明係關於具有放電燈,可長時間射出均勻照度之光的光源裝置以及使用如此之光源裝置的曝光裝置。The present invention relates to a light source device having a discharge lamp that emits light of uniform illumination for a long period of time and an exposure apparatus using such a light source device.
使用放電燈的光源裝置係如半導體製造製程及印刷基板製造製程之光阻劑(photoresist)的曝光製程,頻繁地利用於使用光線來進行物體的加工之工業製程中。在如此工業製程所使用之光源裝置係尤其被要求「可長時間射出均勻照度之光線」,但是,使用於光源裝置的放電燈係因為使用時間變長之同時會劣化而照度降低,故不易因應其要求。A light source device using a discharge lamp, such as a semiconductor manufacturing process and a photoresist exposure process for a printed circuit board manufacturing process, is frequently used in an industrial process in which light is used to process an object. In the light source device used in such an industrial process, it is particularly required to "light that can emit uniform illumination for a long time". However, the discharge lamp used in the light source device is degraded and the illuminance is lowered because the use time is long, so it is difficult to cope with it. Its requirements.
在此從先前就進行有為了回應該要求的研究,其成果係公如有專利文獻1的光源裝置。此光源裝置係使用複數放電燈來構成光源裝置,在光源裝置較新時,藉由使較整體數量少之數量的放電燈點燈,確保必須之照度,而光源裝置的使用時間每經過所定時間,則使剩下的放電燈追加點燈,來禰補放電燈的劣化所致之照度的降低量。Here, the research has been carried out in order to respond to the request, and the result is a light source device of Patent Document 1. The light source device uses a plurality of discharge lamps to constitute a light source device. When the light source device is new, the necessary illumination is ensured by lighting a relatively small number of discharge lamps, and the use time of the light source device is determined by the predetermined time. Then, the remaining discharge lamps are additionally turned on to compensate for the decrease in the illuminance caused by the deterioration of the discharge lamp.
[專利文獻1]日本特開2005-227465號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2005-227465
因為餘放電燈係個別存在有「個體差」,故即使是相同種類相同型號的放電燈,而因放電燈的個體差,於劣化的進行所致之照度的降低程度係有偏差。為此,如先前技術(專利文獻1),無視放電燈的個體差而每於所定時間使放電燈追加點燈會易於產生照度的過或不足,對於提高照度的均勻性有一定限制。亦即,存在有對於即使經過所定使用時間,照度降低的程度較小,亦能射出充分照度之光的光源裝置,進行放電燈追加點燈,會成為賦予過剩的照度,相反地,對於到達所定使用時間時,有超過想定之照度降低的光源裝置,即使進行放電燈追加點燈作為照度的填補亦不充分,會照度不足的問題點。Since the residual discharge lamp has an individual difference, even if it is a discharge lamp of the same type and the same type, the degree of reduction in illuminance due to the deterioration of the discharge lamp varies depending on the individual difference of the discharge lamp. For this reason, as in the prior art (Patent Document 1), regardless of the individual difference of the discharge lamp, it is easy to cause the illuminance to be excessive or insufficient every time the discharge lamp is turned on for a predetermined period of time, and there is a limit to improving the uniformity of the illuminance. In other words, there is a light source device that emits sufficient illuminance even when the illuminance is reduced to a small extent even after a predetermined period of use. When the discharge lamp is additionally turned on, excessive illuminance is provided, and conversely, the arrival is determined. When the time is used, there is a light source device that exceeds the desired illuminance, and even if the discharge lamp is additionally turned on as the illuminance, the illuminance is insufficient, and the illuminance is insufficient.
本發明係有鑒於如此之先前技術的問題點所開發者。因此本發明的主要課題係提供可長時間連續射出均勻照度之光的光源裝置以及使用如此之光源裝置的曝光裝置。The present invention has been developed in view of the problems of the prior art. Therefore, a main object of the present invention is to provide a light source device which can continuously emit light of uniform illuminance for a long period of time and an exposure apparatus using such a light source device.
申請專利範圍第1項所記載之發明係光源裝置10,「具備:燈單元(lamp unit)18,係具有複數放電燈30,及設置於各放電燈30,使從各放電燈30射出之光朝向相同方向反射之反射器31,照度計20,係測定從燈單元18射出之光的照度,及點燈控制裝置22,係具有個別使放電燈30通電,或遮斷通電的功能,起動時在至少遮斷1個預備之放電燈30的通電之狀態下,使其他放電燈30通電,且藉由比較以照度計20測定之實際照度與預先設定之適正照度,判定實際照度的過或不足,並使放電燈30通電或遮斷通電來消解實際照度的過或不足。」The invention is directed to a light source device 10 according to the first aspect of the invention, comprising: a lamp unit 18 having a plurality of discharge lamps 30, and light lamps provided in the respective discharge lamps 30 to emit light from the respective discharge lamps 30. The illuminometer 20 reflects the illuminance of the light emitted from the lamp unit 18, and the lighting control device 22 has a function of individually energizing the discharge lamp 30 or blocking the energization. In the state in which at least one of the preliminary discharge lamps 30 is blocked, the other discharge lamps 30 are energized, and the actual illuminance measured by the illuminometer 20 is compared with a predetermined illuminance which is set in advance to determine whether the actual illuminance is excessive or insufficient. And the discharge lamp 30 is energized or interrupted to eliminate the excessive or insufficient actual illumination."
在本發明,依據從光源裝置10射出之光的照度,進行放電燈30的追加點燈或消燈。亦即,以照度計20測定從光源裝置10射出之光的照度,點燈控制裝置22判斷「照度不足」時,點燈控制裝置22係使預備的放電燈30通電,使從光源裝置10射出之實際照度恢復成適正照度。相反地,實際照度多於適正照度,點燈控制裝置22判斷「照度過剩」時,點燈控制裝置22係遮斷通電中的放電燈30之任一的通電,使從光源裝置10射出之實際照度恢復成適正照度。In the present invention, the additional lighting or the elimination of the discharge lamp 30 is performed in accordance with the illuminance of the light emitted from the light source device 10. That is, the illuminance of the light emitted from the light source device 10 is measured by the illuminance meter 20, and when the lighting control device 22 determines that "illumination is insufficient", the lighting control device 22 energizes the preliminary discharge lamp 30 to emit the light source device 10. The actual illuminance is restored to a positive illuminance. On the other hand, when the actual illuminance is more than the appropriate illuminance, and the lighting control device 22 determines "excess illuminance", the lighting control device 22 blocks the energization of any of the discharge lamps 30 that are energized, so that the actual light source device 10 is emitted. The illuminance is restored to a positive illumination.
如此,依據本發明之光源裝置10,藉由測定從光源裝置10射出之實際照度本身,使最適切數量的放電燈30點燈,故可長期間連續射出均勻之光量。As described above, according to the light source device 10 of the present invention, by measuring the actual illuminance itself emitted from the light source device 10, the optimum number of discharge lamps 30 is turned on, so that a uniform amount of light can be continuously emitted for a long period of time.
再者,於本說明書中,所謂「照度」係指1cm2 的面積,1秒鐘之間接受之光能「mW/cm2 」。In the present specification, the term "illuminance" means an area of 1 cm 2 and the light energy received in one second is "mW/cm 2 ".
申請專利範圍第2項所記載之發明係曝光裝置12,「其特徵為具備:光源裝置10,係申請專利範圍第1項所記載之光源裝置10,支持台14,係支持藉由從光源裝置10射出之光來曝光之曝光對象物X,及光學系16,係將從光源裝置10射出之光,引導至以支持台14支持之曝光對象物X。」The invention is an exposure apparatus 12 according to the second aspect of the invention, which is characterized in that the light source device 10 is provided, and the light source device 10 according to the first aspect of the patent application, the support table 14 is supported by the light source device. The exposure object X exposed by the light emitted by the light and the optical system 16 guide the light emitted from the light source device 10 to the exposure target X supported by the support table 14."
依據本發明,可從光源裝置10長期間連續射出均勻照度之光,故可長時間持續使對曝光對象物X照射來自光源裝置10之光的時間(cycle time),亦即曝光對象物X的曝光所需時間成為一定。所以,使曝光對象物X載置於支持台14之時機(timing)及搬送至下個處理工程的時機成為一定,可使曝光工程前後之工程的等待時間及滯留的發生機率成為極小。According to the present invention, it is possible to continuously emit light of uniform illuminance from the light source device 10 for a long period of time, so that the exposure time X can be irradiated with the light from the light source device 10 for a long time, that is, the exposure object X The time required for exposure becomes constant. Therefore, the timing at which the exposure target X is placed on the support table 14 and the timing of transport to the next processing project are constant, and the waiting time and the probability of occurrence of the retention before and after the exposure engineering can be made extremely small.
申請專利範圍第3項所記載之發明係於第2項所記載之曝光裝置12中,「前述光學系16,係具有使從燈單元(lamp unit)18射出之光的照度分佈均勻化的積光器(integrator)52,照度計20,係接收藉由積光器52而照度分佈成均勻化之光,並測定其實際照度。」The invention described in the third aspect of the invention is the exposure apparatus 12 of the second aspect, wherein the optical system 16 has a product that uniformizes the illuminance distribution of the light emitted from the lamp unit 18. An integrator 52, the illuminometer 20, receives the illuminance distributed by the illuminator 52 to uniformize the light, and measures the actual illuminance."
依據本發明,照度計20接收之光係因為藉由積光器52而照度分佈均勻化者,故照度計20的設置位置無例如「必須對準光源裝置10之光的中心軸」之限制,只要是可接收來自光源裝置10之光的位置,不管在哪設置照度計20,皆可同樣測定照度。亦即,可易於進行照度計20的位置調整。According to the present invention, since the light received by the illuminometer 20 is uniform in illuminance distribution by the illuminator 52, the position of the illuminometer 20 is not limited by, for example, "the central axis of the light of the light source device 10 must be aligned". As long as the position of the light from the light source device 10 can be received, the illuminance can be measured in the same manner regardless of where the illuminometer 20 is installed. That is, the position adjustment of the illuminometer 20 can be easily performed.
依據此發明,可提供可長時間射出均勻照度之光的光源裝置。又,可提供曝光對象物的曝光時間在長時間保持一定的曝光裝置。又,依據申請專利範圍第3項的發明,可易於進行照度計20的位置調整。According to the invention, it is possible to provide a light source device which can emit light of uniform illuminance for a long period of time. Further, it is possible to provide an exposure apparatus in which the exposure time of the object to be exposed is kept constant for a long period of time. Further, according to the invention of claim 3, the position adjustment of the illuminometer 20 can be easily performed.
以下遵從圖面說明本發明。圖1係揭示組入關於本發明之光源裝置10的曝光裝置12之概要的圖。該曝光裝置12係用以將形成於印刷電路基板P上,作為「曝光對象物」的光阻層X加以曝光者,以光源裝置10、支持印刷電路基板P之同時支持光阻層的支持台14及將從光源裝置10射出之光作為平行光來照射光阻層X的光學系16而大略構成。The invention will be described below in accordance with the drawings. Fig. 1 is a view showing an outline of an exposure device 12 incorporated in a light source device 10 of the present invention. The exposure device 12 is configured to expose a photoresist layer X formed as an "exposure target" on a printed circuit board P, and a support table for supporting the photoresist layer while supporting the printed circuit board P. 14 and the light emitted from the light source device 10 is roughly configured by irradiating the optical system 16 of the photoresist layer X as parallel light.
光源裝置10係用以將曝光所需之光(紫外光或者接近紫外光的可視光)以所定照度來射出者,具備有燈單元18、照度計20及點燈控制裝置22。The light source device 10 is configured to emit light required for exposure (ultraviolet light or visible light close to ultraviolet light) with a predetermined illuminance, and includes a lamp unit 18, an illuminometer 20, and a lighting control device 22.
再者,於本說明書中,所謂「照度」係指1cm2 的面積,1秒鐘之間接受之光能「mW/cm2 」。In the present specification, the term "illuminance" means an area of 1 cm 2 and the light energy received in one second is "mW/cm 2 ".
燈單元18係如圖2所示,具有複數燈裝置24、電力供給裝置26及異常判定手段28。進而,燈單元18係為了使來自複數燈裝置24之光朝相同方向射出,具備保持複數燈裝置24的區塊(block)狀的支座(holder)29。As shown in FIG. 2, the lamp unit 18 includes a plurality of lamp devices 24, a power supply device 26, and an abnormality determining means 28. Further, the lamp unit 18 is provided with a block-shaped holder 29 for holding the plurality of lamp devices 24 in order to emit light from the plurality of lamp devices 24 in the same direction.
燈裝置24係個別以放電燈30及使從放電燈30射出之光朝所定方向反射的反射器31所構成。The lamp unit 24 is composed of a discharge lamp 30 and a reflector 31 that reflects the light emitted from the discharge lamp 30 in a predetermined direction.
放電燈30係如圖3所示,是直流點燈式的短弧(short arc)高壓燈,具備:球狀的發光部30a、具有於其兩端藉由收縮封止(shrink seal)方式形成之封止部30b的封體容器30c、電極棒30d、埋設於封止部30b內的鉬箔30e、溶接於鉬箔30e的引導(lead)棒30f及封入於發光部30a內的水銀及其他必要封止物。As shown in FIG. 3, the discharge lamp 30 is a direct-arc type short arc high-pressure lamp, and includes a spherical light-emitting portion 30a having a shrink seal formed at both ends thereof. The sealed container 30c of the sealing portion 30b, the electrode rod 30d, the molybdenum foil 30e embedded in the sealing portion 30b, the lead rod 30f which is melted in the molybdenum foil 30e, and the mercury enclosed in the light-emitting portion 30a and the like Necessary sealing.
於封體容器30c之各封止部的內部係配設有一端突出至發光部30a內部的電極棒30d、一端突出至外部的引導棒30f及電性連接電極棒30d之他端與引導棒30f之他端的鉬箔30e,並且於各電極棒30d的一端係有構成一對電極30g的陽極30h及陰極30i隔開所定間隔(以下稱為「電極間距離L」)而連接。Inside the sealing portion of the sealed container 30c, an electrode rod 30d whose one end protrudes into the light emitting portion 30a, a guiding rod 30f whose one end protrudes to the outside, and a other end of the electrically connecting electrode rod 30d and the guiding rod 30f are disposed. The molybdenum foil 30e at the other end is connected to the anode 30h and the cathode 30i which constitute the pair of electrodes 30g at one end of each electrode rod 30d at a predetermined interval (hereinafter referred to as "interelectrode distance L").
電力供給裝置26係如圖2所示,是為了供給一定電力給構成燈裝置24的放電燈30,用以供給所需電流的鎮流器(ballast),以鎮流器電力部32與鎮流器控制部33大略構成。又,燈單元18係具有與燈裝置24相同數量的電力供給裝置26。As shown in FIG. 2, the power supply device 26 is a ballast for supplying a constant amount of electric power to the discharge lamp 30 constituting the lamp unit 24 for supplying a required current, and the ballast power unit 32 and the ballast. The device control unit 33 is roughly configured. Further, the lamp unit 18 has the same number of power supply devices 26 as the lamp unit 24.
鎮流器電力部32係在接收來自點燈控制裝置22的通電訊號S1時,利用因應來自鎮流器控制部33的脈衝寬度訊號,進行開關動作(switching),將放電燈30的點燈所需之電力供給給放電燈30,或者在接收來自點燈控制裝置22的通電遮斷訊號S2時,停止對於放電燈30的電力供給。When receiving the energization signal S1 from the lighting control device 22, the ballast power unit 32 performs switching operation by means of a pulse width signal from the ballast control unit 33, and turns on the discharge lamp 30. The required electric power is supplied to the discharge lamp 30, or when the energization interruption signal S2 from the lighting control device 22 is received, the supply of electric power to the discharge lamp 30 is stopped.
又,鎮流器控制部33係考慮供給至放電燈30之電壓的偏離及經過時間之電壓變化等,以可供給為了供給一定電力給放電燈30所需之電流之方式,控制鎮流器電力部32。Further, the ballast control unit 33 controls the ballast power in such a manner as to supply a current required to supply a constant amount of electric power to the discharge lamp 30 in consideration of a deviation of a voltage supplied to the discharge lamp 30 and a voltage change over time. Part 32.
異常判定手段28係判定各放電燈30的異常之有無的手段,具有:測定從電力供給裝置26供給至放電燈30之電壓值的測定電路34、及將以測定電路34測定之電壓值與預先設定之基準電壓V1加以比較,在測定之電壓值大於基準電壓V1時,輸出異常訊號S3的比較電路36。又,燈單元18係具有與燈裝置24相同數量的異常判定手段28。The abnormality determining means 28 is a means for determining the presence or absence of an abnormality of each of the discharge lamps 30, and includes a measuring circuit 34 for measuring a voltage value supplied from the power supply device 26 to the discharge lamp 30, and a voltage value measured by the measuring circuit 34 and a predetermined value. The set reference voltage V1 is compared, and when the measured voltage value is greater than the reference voltage V1, the comparison circuit 36 of the abnormal signal S3 is output. Further, the lamp unit 18 has the same number of abnormality determining means 28 as the lamp unit 24.
照度計20係如圖1所示,安裝於光源裝置10之光的射出軸上,亦為構成光學系16的反射鏡54背面中與燈單元18相對的朝向,是設定從光源裝置10射出之光的照度者。又,以照度計20測定之實照度係作為照度值S4輸出至點燈控制裝置22。As shown in FIG. 1, the illuminometer 20 is mounted on the emission axis of the light of the light source device 10, and is also oriented toward the lamp unit 18 on the back surface of the mirror 54 constituting the optical system 16, and is set to be emitted from the light source device 10. Illumination of light. Further, the actual illuminance measured by the illuminance meter 20 is output to the lighting control device 22 as the illuminance value S4.
點燈控制裝置22係使放電燈30個別通電或者遮斷通電的裝置,如圖4所示,具備:積算光量計38、序列器(programmable logic controller:PLC)40及電算處理裝置42。The lighting control device 22 is a device that individually or energizes the discharge lamp 30. As shown in FIG. 4, the lighting control device 22 includes an integrated light meter 38, a programmable logic controller (PLC) 40, and an arithmetic processing device 42.
積算光量計38係具有:依據從照度計20輸出之照度值S4,判定異常之有無的判定電路44、及積算該當照度值S4,計算出光量的積算電路46。 再者,於本說明書中,所謂「光量」係指1cm2 的面積,在所定時間內接收之光能「mJ/cm2 」。The integrated light meter 38 has a determination circuit 44 that determines the presence or absence of an abnormality based on the illuminance value S4 output from the illuminometer 20, and an integrated circuit 46 that calculates the amount of light by integrating the illuminance value S4. In the present specification, the term "light amount" means an area of 1 cm 2 and the light energy received in a predetermined period of time is "mJ/cm 2 ".
判定電路44係判定從照度計20送出之照度值S4是高於或低於預先設定之適正照度值,進而判定照度值S4與適正照度值的差是否與1個放電燈30射出之光的照度相同程度。從照度計20送出之照度值S4高於適正照度值且照度值S4是與適正照度值的差與從1個放電燈30射出之光的照度相同程度時,判定電路44係對於序列器40,傳送照度異常高訊號S5,相反地,從照度計20送出之照度值S4低於適正照度值且照度值S4是與適正照度值的差與從1個放電燈30射出之光的照度相同程度時,判定電路44係對於序列器40,傳送照度異常低訊號S6。The determination circuit 44 determines whether the illuminance value S4 sent from the illuminometer 20 is higher or lower than a predetermined positive illuminance value, and further determines whether or not the difference between the illuminance value S4 and the positive illuminance value is the illuminance of the light emitted from one discharge lamp 30. The same degree. When the illuminance value S4 sent from the illuminometer 20 is higher than the appropriate illuminance value and the illuminance value S4 is equal to the illuminance of the light emitted from the one discharge lamp 30, the determination circuit 44 is for the sequencer 40. The illuminance abnormality high signal S5 is transmitted. Conversely, the illuminance value S4 sent from the illuminometer 20 is lower than the appropriate illuminance value, and the illuminance value S4 is the same as the illuminance of the light emitted from the one discharge lamp 30. The determination circuit 44 transmits an illuminance abnormally low signal S6 to the sequencer 40.
積算電路46係從照度計20接受照度值S4並積算照度值S4,是計算出光量的電路,在接收來自序列器40的積算開始訊號S7時,重設積算值之同時,開始照度值S4的積算。然後,光量成為預先設定之值時,積算電路46係結束照度值S4的積算之同時,對於序列器40,輸出積算結束訊號S8。The integrated circuit 46 receives the illuminance value S4 from the illuminometer 20 and integrates the illuminance value S4, and calculates a light amount. When receiving the integrated start signal S7 from the sequencer 40, the integrated circuit 46 resets the integrated value and starts the illuminance value S4. Total calculation. When the amount of light reaches a predetermined value, the integrating circuit 46 ends the integration of the illuminance value S4, and outputs the integrated end signal S8 to the sequencer 40.
序列器40係具備:控制部40a,係接受從異常判定手段28的比較電路36輸出之異常訊號S3、從積算光量計38的判定電路44輸出之照度異常高訊號S5或照度異常低訊號S6、從積算電路46輸出之積算結束訊號S8、及從電算處理裝置42輸出之照度異常高訊號S12或照度異常低訊號S13,並依據該等訊號,輸出通電訊號S1或通電遮斷訊號S2至各電力供給裝置26;記憶部40b,係記憶作為從放電燈30開始點燈至照度安定為止的時間而預先設定之設定待機時間及預先設定光源裝置10的起動時使哪個燈裝置24點燈哪個燈裝置24消燈之燈裝置使用設定等;及計時器40c,係計算時間。The sequencer 40 includes a control unit 40a that receives an abnormality signal S3 outputted from the comparison circuit 36 of the abnormality determining means 28, an illuminance abnormally high signal S5 or an illuminance abnormally low signal S6 outputted from the determination circuit 44 of the integrated optical quantity meter 38, The integrated end signal S8 output from the integrated circuit 46, and the illuminance abnormally high signal S12 or the illuminating abnormally low signal S13 outputted from the computer processing device 42 are outputted according to the signals, and the power-on signal S1 or the power-on interrupt signal S2 is output to each power. The storage unit 26 stores the setting standby time set in advance as the time from the start of lighting of the discharge lamp 30 to the illuminance stabilization, and which lamp device 24 is turned on at the time of starting the light source device 10 in advance. 24 lamp setting device usage setting, etc.; and timer 40c, is the calculation time.
亦即,從燈單元18的異常判定手段28具有之比較電路26賦予異常訊號S3至序列器40時,序列器40係將通電遮斷訊號S2送至該當異常判定手段28所對應之電力供給裝置26之同時,將通電訊號S1送至到目前為止消燈之預備放電燈30所對應之電力供給裝置26。That is, when the comparison circuit 26 provided by the abnormality determining means 28 of the lamp unit 18 supplies the abnormal signal S3 to the sequencer 40, the sequencer 40 sends the energization interrupting signal S2 to the power supply device corresponding to the abnormality determining means 28. At the same time, the power-on signal S1 is sent to the power supply device 26 corresponding to the preliminary discharge lamp 30 that has been extinguished so far.
又,從積算光量計38的判定電路44賦予照度異常高訊號S5給序列器40時,序列器40係從點燈中的放電燈30中選擇1個放電燈30,並對於該當放電燈30所對應之電力供給裝置26,送出通電遮斷訊號S2。另一方面,賦予照度異常低訊號S6給序列器40時,序列器40係從消燈中的放電燈30中選擇1個放電燈30,並對於被選擇之放電燈30所對應之電力供給裝置26,送出通電訊號S1。When the illuminance abnormality high signal S5 is given to the sequencer 40 from the determination circuit 44 of the integrated light amount meter 38, the sequencer 40 selects one discharge lamp 30 from the discharge lamps 30 in the lighting, and for the discharge lamp 30 The corresponding power supply device 26 sends the power-on blocking signal S2. On the other hand, when the illuminance abnormally low signal S6 is given to the sequencer 40, the sequencer 40 selects one discharge lamp 30 from the discharge lamps 30 in the lamp elimination, and supplies power to the selected discharge lamp 30. 26, send the power signal S1.
進而,序列器40係因為以適正的光量將光阻層X加以曝光,故對於包含於光學系16之曝光控制用遮斷器50,輸出開訊號S10或閉訊號S11。Further, since the sequencer 40 exposes the photoresist layer X with a proper amount of light, the exposure control breaker 50 included in the optical system 16 outputs the ON signal S10 or the OFF signal S11.
又,序列器40係對於曝光控制用遮斷器(shutter)50,輸出開訊號S10時,傳送積算開始訊號S7至積算電路46,同時計時器40c開始時間的計算。然後,序列器40從積算電路46接受積算結束訊號S8時,序列器40係對於曝光控制用遮斷器50輸出閉訊號S11之同時,計時器40c係結束時間的計算。亦即,計時器40c係計算光阻層X的曝光時間。然後,序列器40係將從積算開始訊號S7的傳送至積算結束訊號S8的接收為止被計算之曝光時間值S9,傳送至電算處理裝置42之同時,重設計時器40c的計算。Further, the sequencer 40 transmits the integrated start signal S7 to the integrated circuit 46 when the open signal S10 is output to the exposure control shutter 50, and the timer 40c starts the calculation of the time. When the sequencer 40 receives the integrated end signal S8 from the integrated circuit 46, the sequencer 40 outputs the closed signal S11 to the exposure control interrupter 50, and the timer 40c calculates the end time. That is, the timer 40c calculates the exposure time of the photoresist layer X. Then, the sequencer 40 transmits the exposure time value S9 calculated from the transmission of the integration start signal S7 to the reception of the integration completion signal S8 to the computer processing device 42, and resets the calculation of the timer 40c.
電算處理裝置42係以將從序列器40接受之曝光時間值S9與預先設定之適正曝光時間加以比較,判定曝光時間值S9的問題之有無的判定部42a、及記憶曝光時間值S9的記憶部42b所構成。曝光時間值S9短於適正曝光時間時,電算處理裝置42係對於序列器40,輸出照度異常高訊號S12。相反地,曝光時間值S9長於適正曝光時間時,電算處理裝置42係對於序列器40,輸出照度異常低訊號S13。The computer processing unit 42 compares the exposure time value S9 received from the sequencer 40 with a predetermined exposure time set in advance, and determines the presence or absence of the problem of the exposure time value S9 and the memory unit of the memory exposure time value S9. The composition of 42b. When the exposure time value S9 is shorter than the appropriate exposure time, the computer processing device 42 outputs the illuminance abnormally high signal S12 to the sequencer 40. Conversely, when the exposure time value S9 is longer than the appropriate exposure time, the computer processing device 42 outputs the illuminance abnormally low signal S13 to the sequencer 40.
再者,記憶於記憶部42b之曝光時間資料係作為表示曝光裝置12的運轉履歷而儲存。利用如此儲存曝光時間資料,萬一,發生曝光不良時,可藉由參考過去的曝光時間資料,分析曝光裝置12的運轉狀況,追及不良發生的原因。Further, the exposure time data stored in the storage unit 42b is stored as the operation history of the exposure device 12. By storing the exposure time data in this way, in the event of an exposure failure, the operation state of the exposure device 12 can be analyzed by referring to the past exposure time data, and the cause of the failure can be caught.
支持台14係如圖1所示,是支持印刷電路基板P者,可適切採用目前為止公知的構造。As shown in FIG. 1, the support stand 14 is a structure which supports a printed circuit board P, and can employ the structure currently known.
光學系16係將從光源裝置10射出之光作為平行光引導至被支持台14支持之印刷電路基板P的光阻層X者,以使從光源裝置10射出之光的照度分佈成為均勻(亦即,在照射平面時,於被照射面中不發生照度不均之光)的積光器52(蠅眼鏡:fly-eye lens)、開壁控制從光源裝置10射出之光(在本實施例係通過積光器52之後的光)之射出光路的曝光控制用遮斷器50、使通過曝光控制用遮斷器50之光的光路曲折的反射鏡54、及使在反射鏡54反射之光作為平行光,並誘導至支持台14的凹面鏡56所構成。又,於反射鏡54的略中心部係設置有貫通孔58,在反射鏡54的背面,可接收通過貫通孔58之光的位置,設置照度計20。所以,照度計20係可接收從光源裝置10射出,藉由通過積光器52而照度分佈均勻之光的一部份,並測定其照度。The optical system 16 guides the light emitted from the light source device 10 as parallel light to the photoresist layer X of the printed circuit board P supported by the support table 14 so that the illuminance distribution of the light emitted from the light source device 10 becomes uniform (also In other words, in the present embodiment, the light illuminator 52 (fly-eye lens) that is not illuminating unevenly on the illuminated surface, and the opening control of the light emitted from the light source device 10 (in the present embodiment) The exposure control interrupter 50 that emits the light path through the light after the light collector 52, the mirror 54 that bends the optical path of the light passing through the exposure control interrupter 50, and the light that is reflected by the mirror 54 It is constituted by a concave mirror 56 which is parallel light and is induced to the support table 14. Further, a through hole 58 is provided at a substantially central portion of the mirror 54, and a position of the light passing through the through hole 58 is received on the back surface of the mirror 54, and the illuminometer 20 is provided. Therefore, the illuminance meter 20 can receive a portion of the light that is emitted from the light source device 10 and is evenly distributed by the illuminator 52, and the illuminance is measured.
再者,在此所示之光學系16的構造係其一例,不是限定於本實施例的構造者。例如,作為在反射鏡54反射從光源裝置10射出之光後,入光至積光器52之構造亦可,亦可因應作為目的的光學路徑,適切變更其構造。又,曝光控制用遮斷器50的型式係如圖1所示之百葉(louver)方式之外,亦可使用以所定旋轉控制裝置使以不使光通過之材質形成,且具有從光源裝置10射出之光通過之孔的旋轉盤(未圖示)之方式。In addition, the structure of the optical system 16 shown here is an example, and is not limited to the structure of this embodiment. For example, as the mirror 54 reflects the light emitted from the light source device 10, the light may be incident on the light concentrator 52, and the structure may be appropriately changed depending on the intended optical path. Further, the type of the exposure control interrupter 50 may be formed by a material that does not allow light to pass through a predetermined rotation control device, as shown in FIG. The manner in which the emitted light passes through the rotating disk (not shown) of the hole.
起動點燈控制裝置22時,從序列器40對於所定數量的電力供給裝置26傳送通電訊號S1,燈裝置24會點燈,從燈裝置24射出之光(在本實施例,主要是紫外光)係朝前方射出。再者,在關於本實施例之曝光裝置12所需之照度係可以3個燈裝置24射出之光來供給之量。所以,光源裝置10具備之5個燈裝置24中,原則上3個燈裝置24同時點燈即可,剩下兩個燈裝置24係作為預備而維持消燈狀態。When the lighting control device 22 is activated, the power supply signal S1 is transmitted from the sequencer 40 for a predetermined number of power supply devices 26, and the light device 24 lights up and emits light from the light device 24 (in this embodiment, mainly ultraviolet light). The system shoots forward. Further, the illuminance required for the exposure apparatus 12 of the present embodiment can be supplied by the light emitted from the three lamp units 24. Therefore, in the five lamp devices 24 included in the light source device 10, in principle, the three lamp devices 24 may be turned on at the same time, and the remaining two lamp devices 24 are maintained as a standby state to maintain the light-off state.
從光源裝置10射出之光係藉由通過積光器42而成為照度分佈均勻的光。然後,作為從放電燈30開始點燈到光量安定為止的時間,經過預先設定於序列器40的記憶部40b之設定待機時間時,序列器40係輸出積算開始訊號S7至積算光量計38的積算電路46之同時,將開訊號S10傳送至曝光控制用遮斷器50,開啟曝光控制用遮斷器50。又,同時計時器40c開始時間的計算。The light emitted from the light source device 10 is light having a uniform illuminance distribution by passing through the light concentrator 42. Then, the sequencer 40 outputs the integrated calculation start signal S7 to the integrated light amount meter 38 when the set time is set in advance in the memory unit 40b of the sequencer 40 as the time from the start of the discharge of the discharge lamp 30 to the stabilization of the light amount. At the same time as the circuit 46, the open signal S10 is transmitted to the exposure control interrupter 50, and the exposure control interrupter 50 is turned on. Also, at the same time, the timer 40c starts the calculation of the time.
然後,來自積光器52之光係通過接受來自序列器40之開訊號S10而開啟的曝光控制用遮斷器50。進而,通過曝光控制用遮斷器50之光係藉由反射鏡54朝凹面鏡56反射。Then, the light from the light concentrator 52 passes through the exposure control interrupter 50 that is turned on by receiving the open signal S10 from the sequencer 40. Further, the light passing through the exposure control interrupter 50 is reflected by the mirror 54 toward the concave mirror 56.
此時,朝反射鏡54之光的一部份係通過設置於反射鏡54之貫通孔58而照射照度計20。然後,照度計20係依據通過貫通孔58之光來測定照度,而將測定之照度值S4輸出至點燈控制裝置22的積算光量計38。又,被輸出之照度值S4係利用積算光量計38的判定電路44來判定異常之有無之同時,以積算電路46進行積算。At this time, a portion of the light toward the mirror 54 is irradiated to the illuminometer 20 through the through hole 58 provided in the mirror 54. Then, the illuminance meter 20 measures the illuminance based on the light passing through the through hole 58, and outputs the measured illuminance value S4 to the integrated light amount meter 38 of the lighting control device 22. Further, the output illuminance value S4 is determined by the determination circuit 44 of the integrated light amount meter 38 to determine the presence or absence of an abnormality, and is integrated by the integrated circuit 46.
藉由反射鏡54朝凹面鏡56反射鏡之光係於凹面鏡56中成為平行光,朝支持台14反射。朝支持台14反射之光係經由形成電路圖案之遮罩(mask),照射載置於支持台14上的印刷電路基板P之光阻層X。The light reflected by the mirror 54 toward the concave mirror 56 is incident on the concave mirror 56 as parallel light, and is reflected toward the support table 14. The light reflected toward the support table 14 illuminates the photoresist layer X of the printed circuit board P placed on the support table 14 via a mask forming a circuit pattern.
於積算電路46中被積算之光量值成為預先設定之值時,積算電路46係對於序列器40,傳送積算結束訊號S8。接受積算結束訊號S8的序列器40係輸出閉訊號S11至曝光控制用遮斷器50,關閉曝光控制用遮斷器50並遮斷照射光阻層X之光之同時,在傳送積算開始訊號S7到接收積算結束訊號S8之間,將以計時器40c計算之曝光時間值S9輸出至電算處理裝置42。接收曝光時間值S9的電算處理裝置42係判定曝光時間值S9是否在預先設定之適正曝光時間內,將該當曝光時間值S9作為曝光時間資料而輸出至記憶部42b。When the light amount value integrated in the integrated circuit 46 is a predetermined value, the integrating circuit 46 transmits the integrated end signal S8 to the sequencer 40. The sequencer 40 that has received the integration completion signal S8 outputs the closed signal S11 to the exposure control interrupter 50, closes the exposure control interrupter 50, and blocks the light of the irradiation resist layer X, and transmits the integration start signal S7. Between the reception integration end signal S8, the exposure time value S9 calculated by the timer 40c is output to the computer processing device 42. The computer processing device 42 that receives the exposure time value S9 determines whether or not the exposure time value S9 is within the predetermined exposure time set in advance, and outputs the exposure time value S9 as the exposure time data to the storage unit 42b.
如此一來,結束對於1個光阻層X的曝光時,遮罩M下的印刷電路基板P與未處理物交換,同樣地被曝光。As a result, when the exposure to one photoresist layer X is completed, the printed circuit board P under the mask M is exchanged with the unprocessed material, and is exposed in the same manner.
曝光光阻層X之間,測定被供給至點燈中的放電燈30之電壓值的異常判定手段28檢測出該當放電燈30的異常時,異常判定手段28係輸出異常訊號S3至序列器40。接收該異常訊號S3的序列器40係將通電遮斷訊號S3送出至供給電力給發生異常之放電燈30的電力供給裝置26之同時,將通電訊號S1送出至消燈之預備放電燈30所對應之電力供給裝置26。藉此,發生異常之放電燈30消燈之同時,新的放電燈30將會點燈,故整體觀看光源裝置10,發光之放電燈30的數量不會變化。再者,發生異常之放電燈30係在適切之時期,藉由作業員進行交換,被交換之放電燈30係作為預備的放電燈30,到下個其他放電燈30發生異常為止,維持消燈狀態。When the abnormality determining means 28 for measuring the voltage value of the discharge lamp 30 supplied to the lighting between the exposure resist layers X detects the abnormality of the discharge lamp 30, the abnormality determining means 28 outputs the abnormal signal S3 to the sequencer 40. . The sequencer 40 that receives the abnormality signal S3 sends the power-on blocking signal S3 to the power supply device 26 that supplies power to the discharge lamp 30 that has abnormality, and sends the power-on signal S1 to the preliminary discharge lamp 30 for eliminating the lamp. Power supply device 26. Thereby, the discharge lamp 30 which is abnormal is extinguished, and the new discharge lamp 30 is turned on. Therefore, the light source device 10 is viewed as a whole, and the number of the discharge lamps 30 that emit light does not change. Further, the discharge lamp 30 in which the abnormality occurs is exchanged by the operator, and the exchanged discharge lamp 30 serves as the preliminary discharge lamp 30, and the lamp is maintained until the next other discharge lamp 30 is abnormal. status.
在異常判定手段28,如前述般,依據從電力供給裝置26供給至燈裝置24的放電燈30之電壓值,判定放電燈30的異常。亦即,供給至放電燈30之電壓值係如圖5中A所示,雖然在開始放電燈30的使用之後不久,與使用時間的經過同時電壓值會上升,但是,在這之後係伴隨使用時間的經過,收斂成所定電壓值(將此電壓值稱為收斂電壓值)。發生如此現象係因為如長時間使用放電燈30的話,電極30g會消耗而電極間距離L變長,而為了維持放電狀態所需之電壓值變大。The abnormality determining means 28 determines the abnormality of the discharge lamp 30 based on the voltage value of the discharge lamp 30 supplied from the power supply device 26 to the lamp device 24 as described above. That is, the voltage value supplied to the discharge lamp 30 is as shown in A of FIG. 5, and although the voltage value rises at the same time as the passage of the use time after the start of use of the discharge lamp 30, it is accompanied by the use of the voltage value. The passage of time converges to a predetermined voltage value (this voltage value is referred to as a convergence voltage value). This phenomenon occurs because when the discharge lamp 30 is used for a long period of time, the electrode 30g is consumed and the distance L between the electrodes becomes long, and the voltage value required to maintain the discharge state becomes large.
但是,於數量繁多的放電燈30中係存在有電極的消耗非常快速或者在極早期封體容器30c毀損而失光之不良放電燈30。如此不良放電燈30之電壓值與使用時間的關係係如圖5中B所示,可在短時間見到急激之電壓值的上升。However, in a large number of discharge lamps 30, there is a defective discharge lamp 30 in which the consumption of the electrodes is very fast or the sealed container 30c is destroyed in the very early stage and is lost. The relationship between the voltage value of the poor discharge lamp 30 and the use time is as shown by B in Fig. 5, and the rise of the voltage value of the jerk can be seen in a short time.
在此,作為基準電壓V1設定大於收斂電壓值之電壓值,比較測定之電壓值與基準電壓V1的大小。比較之結果,測定之電壓值較大時,該放電燈30已經失光,或者快要失光之可能性較高,故可判斷為「異常」。Here, a voltage value larger than the convergence voltage value is set as the reference voltage V1, and the measured voltage value and the magnitude of the reference voltage V1 are compared. As a result of the comparison, when the measured voltage value is large, the discharge lamp 30 has lost light, or the possibility of losing light is high, so it can be judged as "abnormal".
在如此關於本實施例之光源裝置10,針對各個放電燈30來個別判斷異常,遮斷被判斷為異常之放電燈30的通電之同時,使預備的放電燈30通電,故無在沒察覺從光源裝置10射出之光的照度降低之狀態下,使光源裝置10持續做動之虞,相反地,在不發生從光源裝置10射出之光的照度不足之正常點燈下,因為不進行伴隨經過所定時間的自動追加點燈,故光源裝置10射出之光量不會發生過或不足。In the light source device 10 of the present embodiment, the abnormality is individually determined for each of the discharge lamps 30, and the discharge of the discharge lamp 30, which is determined to be abnormal, is interrupted, and the preliminary discharge lamp 30 is energized, so that it is not noticed. In a state in which the illuminance of the light emitted from the light source device 10 is lowered, the light source device 10 is continuously operated, and conversely, under normal lighting in which the illuminance of the light emitted from the light source device 10 is insufficient, since the illuminance is not performed, Since the lighting is automatically added for a predetermined period of time, the amount of light emitted from the light source device 10 does not occur excessively or insufficiently.
所以,只要是關於本實施例之光源裝置10,即可長時間連續射出均勻照度之光。Therefore, as long as the light source device 10 of the present embodiment is used, it is possible to continuously emit light of uniform illuminance for a long time.
又,檢測出從光源裝置10射出之照度值S4大於適正照度值,進而照度值S4與適正照度值的差是與從1個放電燈30射出之光的照度相同程度的積算光量計38之判定電路44,係對於序列器40,輸出照度異常高訊號S5。從判定電路44接收照度異常高訊號S5的序列器40係從點燈中的放電燈30中選擇1個放電燈30,並對於該當放電燈30所對應之電力供給裝置26,輸出通電遮斷訊號S2。藉此,點燈之放電燈30的數量會減少,故從光源裝置10射出之光的照度會降低,原來過剩之照度會收容於適正光量值。相反地,檢測出從光源裝置10照射之照度值S4小於適正照度值,進而照度值S4與適正照度值的差是與從1個放電燈30射出之光的照度相同程度的積算光量計38之判定電路44,係對於序列器40,輸出照度異常低訊號S6。從判定電路44接收照度異常低訊號S6的序列器40係從消燈中的放電燈30中選擇1個放電燈30,並對於該當放電燈30所對應之電力供給裝置26,輸出通電訊號S1。藉此,點燈之放電燈30的數量會增加,故從光源裝置10照射之光的照度會增加,原來過小之照度會收容於適正光量值。Further, it is detected that the illuminance value S4 emitted from the light source device 10 is larger than the positive illuminance value, and the difference between the illuminance value S4 and the positive illuminance value is the same as the illuminance of the light emitted from the one discharge lamp 30. The circuit 44 outputs an illuminance abnormally high signal S5 to the sequencer 40. The sequencer 40 that receives the illuminance abnormally high signal S5 from the determination circuit 44 selects one discharge lamp 30 from the discharge lamps 30 in the lighting, and outputs a power-off occlusion signal to the power supply device 26 corresponding to the discharge lamp 30. S2. As a result, the number of the discharge lamps 30 that are turned on is reduced, so that the illuminance of the light emitted from the light source device 10 is lowered, and the original excess illuminance is accommodated in the appropriate amount of light. On the other hand, it is detected that the illuminance value S4 irradiated from the light source device 10 is smaller than the appropriate illuminance value, and the difference between the illuminance value S4 and the positive illuminance value is the same as the illuminance of the light emitted from the one discharge lamp 30. The determination circuit 44 outputs an illuminance abnormally low signal S6 to the sequencer 40. The sequencer 40 that receives the illuminance abnormally low signal S6 from the determination circuit 44 selects one discharge lamp 30 from the discharge lamps 30 in the lamp elimination, and outputs a power-on signal S1 to the power supply device 26 corresponding to the discharge lamp 30. As a result, the number of the discharge lamps 30 that are lit up increases, so that the illuminance of the light irradiated from the light source device 10 increases, and the originally too small illuminance is accommodated in the appropriate amount of light.
藉此,藉由電壓值掌握各放電燈30的異常,不僅可經常使預先設定之數量的放電燈30點燈,亦可測定從光源裝置10射出之光的照度本身,使最適切之數量的放電燈30點燈。Thereby, the abnormality of each of the discharge lamps 30 can be grasped by the voltage value, and not only the predetermined number of discharge lamps 30 can be turned on, but also the illuminance itself of the light emitted from the light source device 10 can be measured, so that the optimum amount can be measured. The discharge lamp 30 lights up.
進而詳細說明,照度計20接收之光係因為藉由積光器52而照度分佈均勻化者,故照度計20的設置位置無例如「必須對準光源裝置10之光的中心軸」之限制,只要是可接收來自光源裝置10之光的位置,不管在哪設置照度計20,皆可同樣測定照度。亦即,可易於進行照度計20的位置調整。More specifically, since the light received by the illuminometer 20 is uniform in illuminance distribution by the illuminator 52, the position of the illuminometer 20 is not limited by, for example, "the central axis of the light of the light source device 10 must be aligned". As long as the position of the light from the light source device 10 can be received, the illuminance can be measured in the same manner regardless of where the illuminometer 20 is installed. That is, the position adjustment of the illuminometer 20 can be easily performed.
進而,檢測出從序列器40輸出之曝光時間值S9長於適正曝光時間(亦即,從光源裝置10射出之光的照度較低)的電算處理裝置42,係對於序列器40,輸出照度異常低訊號S13。從電算處理裝置42接收照度異常低訊號S13的序列器40係從消燈中的放電燈30中選擇1個放電燈30,並對於該當放電燈30所對應之電力供給裝置26,輸出通電訊號S1。藉此,點燈之放電燈30的數量會增加,從光源裝置10射出之光的照度會增加,藉此於積算電路46中被積算之光量成為預先設定之值為止的時間會縮短,故曝光時間值S9收容於適正曝光時間內。相反地,檢測出曝光時間值S9短於適正曝光時間(亦即,從光源裝置10射出之光的照度較高)的電算處理裝置42,係對於序列器40,輸出照度異常高訊號S12。從電算處理裝置42接收照度異常高訊號S12的序列器40係從點燈中的放電燈30中選擇1個放電燈30,並對於該當放電燈30所對應之電力供給裝置26,輸出通電遮斷訊號S2。藉此,點燈之放電燈30的數量會減少,從光源裝置10射出之光的照度會降低,藉此於積算電路46中被積算之光量成為預先設定之值為止的時間會變長,故曝光時間值S9會收容於適正曝光時間內。Further, it is detected that the exposure processing time value S9 output from the sequencer 40 is longer than the appropriate exposure time (that is, the illuminance of the light emitted from the light source device 10 is low), and the output illuminance is abnormally low for the sequencer 40. Signal S13. The sequencer 40 that receives the illuminance abnormally low signal S13 from the computer processing device 42 selects one of the discharge lamps 30 from the discharge lamp 30, and outputs a power-on signal S1 to the power supply device 26 corresponding to the discharge lamp 30. . As a result, the number of the discharge lamps 30 that are lit up increases, and the illuminance of the light emitted from the light source device 10 increases, so that the time until the amount of light integrated in the integrated circuit 46 becomes a predetermined value is shortened. The time value S9 is accommodated in the appropriate exposure time. Conversely, the computer processing device 42 that detects that the exposure time value S9 is shorter than the appropriate exposure time (that is, the illuminance of the light emitted from the light source device 10 is high) is that the illuminance abnormality high signal S12 is output to the sequencer 40. The sequencer 40 that receives the illuminance abnormally high signal S12 from the computer processing device 42 selects one discharge lamp 30 from the discharge lamps 30 in the lighting, and outputs a current interruption for the power supply device 26 corresponding to the discharge lamp 30. Signal S2. As a result, the number of the discharge lamps 30 that are lit up is reduced, and the illuminance of the light emitted from the light source device 10 is lowered, so that the time until the amount of light integrated in the integrated circuit 46 becomes a predetermined value becomes long. The exposure time value S9 will be accommodated within the appropriate exposure time.
藉此,依據曝光時間來判斷從光源裝置10射出之光的照度之妥當性,可使最適切之數量的燈裝置24點燈。Thereby, the illuminance of the light emitted from the light source device 10 is judged based on the exposure time, and the optimum number of the lamp devices 24 can be turned on.
如以上所述,依據關於本實施例之曝光裝置12,可從光源裝置10長期間連續射出均勻照度之光,故可長時間使對曝光對象物X照射來自光源裝置10之光的時間(cycle time),亦即曝光對象物X的曝光所需時間成為一定。所以,使曝光對象物X載置於支持台14之時機及搬送至下個處理工程的時機成為一定,可使曝光工程前後之工程的等待時間及滯留的發生機率成為極小。As described above, according to the exposure apparatus 12 of the present embodiment, it is possible to continuously emit light of uniform illuminance from the light source device 10 for a long period of time, so that the time of irradiating the exposure object X with light from the light source device 10 can be performed for a long time (cycle) Time), that is, the time required for exposure of the exposure target X becomes constant. Therefore, the timing at which the exposure target X is placed on the support table 14 and the timing of transport to the next processing project are constant, and the waiting time and the probability of occurrence of the retention before and after the exposure engineering can be made extremely small.
再者,圖3所示之放電燈30是兩端(double-end)型直流點燈方式燈,但是以交流點燈方式燈及單端(single-end)型燈來代替亦可。進而,放電燈30係不限於於封體容器30c封入水銀的短弧(short arc)型放電燈,使用作為發光物質封入鈉或鈧等之金屬鹵化物質的金屬鹵化物燈,射出紫外光或者可視光亦可。又,作為封體容器30c的材質,使用石英玻璃或有透光性的陶瓷亦可。Further, the discharge lamp 30 shown in FIG. 3 is a double-end type DC lighting type lamp, but may be replaced by an AC lighting type lamp and a single-end type lamp. Further, the discharge lamp 30 is not limited to a short arc type discharge lamp in which mercury is sealed in the sealed container 30c, and a metal halide lamp in which a metal halide such as sodium or barium is sealed as a light-emitting substance is used to emit ultraviolet light or visible. Light can also. Further, as the material of the sealed container 30c, quartz glass or a translucent ceramic may be used.
又,在本實施例,供給給放電燈30之測定電壓值大於設定為高於收斂電壓值之基準電壓V1時,判斷該當放電燈30為「異常」,但是,放電燈30為「異常」的判斷方法係不限於此,有依據使初始放電燈30點燈時的電壓值(稱為「當初電壓值」),將從當初電壓值僅增加所定伏特數之值作為基準電壓V1的方法及從當初電壓值僅增加所定比例之值作為基準電壓V1的方法。又,運算現在的測定電壓值與從現在之所定時間前測定之測定電壓值的差,以該當差大於所定值(亦即,電壓值急激增加)或者該當差是負(亦即,伴隨使用時間的經過,電壓值一起減少)判斷該當放電燈30為「異常」亦可。藉由使用該判斷方法,可檢測出放電燈30的電壓值進行如圖5中之C所示的動態。亦即,於放電燈30中係在使用中,有封體容器30c因熱而膨脹者,而發生如此膨脹時,電壓值係僅在短暫期間減少,之後,放電燈30會失光,而電壓值成為0。所以,藉由運算現在的測定電壓值與經過所定時間後之測定電壓值的差,不僅可檢測出電壓值急激上升之型式的「異常」,亦可檢測出電壓值減少之型式的「異常」。Further, in the present embodiment, when the measured voltage value supplied to the discharge lamp 30 is larger than the reference voltage V1 set to be higher than the convergence voltage value, it is determined that the discharge lamp 30 is "abnormal", but the discharge lamp 30 is "abnormal". The determination method is not limited to this, and there is a method of using the voltage value when the initial discharge lamp 30 is turned on (referred to as "the initial voltage value"), and the method of increasing the value of the predetermined voltage from the initial voltage value as the reference voltage V1. The initial voltage value only increases the value of the predetermined ratio as the reference voltage V1. Further, the difference between the measured voltage value and the measured voltage value measured before the current time is calculated, and the difference is greater than the predetermined value (that is, the voltage value is sharply increased) or the difference is negative (that is, the accompanying time) The passage of the voltage value is reduced. It is judged that the discharge lamp 30 is "abnormal". By using this judging method, the voltage value of the discharge lamp 30 can be detected to perform the dynamics as shown by C in FIG. That is, in the discharge lamp 30, in use, the sealed container 30c expands due to heat, and when such expansion occurs, the voltage value decreases only for a short period of time, after which the discharge lamp 30 loses light and the voltage The value becomes 0. Therefore, by calculating the difference between the current measured voltage value and the measured voltage value after a predetermined period of time, it is possible to detect not only the "abnormality" of the type in which the voltage value is sharply increased, but also the "abnormality" of the type in which the voltage value is reduced. .
又,藉由判定從照度計20送來之照度值S4高於或低於預先設定之適正照度值,控制點燈之放電燈30的數量,使從光源裝置10射出之光的照度成為一定,但是,在從照度計20送來之照度值S4高於適正照度值時係減少供給給放電燈30之電力量,在從照度計20送來之照度值S4低於適正照度值時係增加供給給放電燈30之電力量,而藉此使從光源裝置10射出之光的照度成為一定亦可。進而,組合點燈之放電燈30數量的控制與供給給放電燈30之電力量的控制亦可。Further, by determining that the illuminance value S4 sent from the illuminometer 20 is higher or lower than a predetermined positive illuminance value, the number of the discharge lamps 30 that are turned on is controlled so that the illuminance of the light emitted from the light source device 10 is constant. However, when the illuminance value S4 sent from the illuminometer 20 is higher than the positive illuminance value, the amount of electric power supplied to the discharge lamp 30 is reduced, and when the illuminance value S4 sent from the illuminometer 20 is lower than the appropriate illuminance value, the supply is increased. The amount of electric power applied to the discharge lamp 30 is such that the illuminance of the light emitted from the light source device 10 is constant. Further, the control of the number of the discharge lamps 30 for lighting and the control of the amount of electric power supplied to the discharge lamps 30 may be controlled.
又,於構成光學系16之反射鏡54的背面,配置照度計20,但是,僅在將已曝光的印刷電路基板P交換成印刷電路基板P之間,於遮罩M的正上方配置其他照度計20,測定照射於遮罩M之光的照度,依據該當照度,修正反射鏡54的背面之照度計20測定的照度亦可。如此一來,可依據實際的曝光對象物之光阻層X附近之照度,提高配置於反射鏡54的背面之照度計20的照度測定制度,進行更正確的曝光時間管理。Further, the illuminometer 20 is disposed on the back surface of the mirror 54 constituting the optical system 16. However, only the printed circuit board P that has been exposed is exchanged between the printed circuit boards P, and other illuminances are disposed directly above the mask M. The illuminance of the light irradiated to the mask M is measured, and the illuminance measured by the illuminometer 20 of the back surface of the mirror 54 may be corrected depending on the illuminance. In this manner, the illuminance measurement system of the illuminometer 20 disposed on the back surface of the mirror 54 can be improved in accordance with the illuminance in the vicinity of the photoresist layer X of the object to be exposed, and more accurate exposure time management can be performed.
又,點燈控制裝置22具有之功能係積算光量計38、序列器40及電算處理裝置42個別分擔,但是,將點燈控制裝置22所需之所有功能集中於1台裝置亦可,使功能分攤至多於本實施例的裝置亦可。又,以點燈控制裝置22負擔異常判定手段28的功能之方式構成亦可。Further, the function-based calorimeter 38, the sequencer 40, and the computer processing device 42 are separately shared by the lighting control device 22. However, all the functions required for the lighting control device 22 can be concentrated in one device to make the function It can also be distributed to more than the device of this embodiment. Further, the lighting control device 22 may be configured to bear the function of the abnormality determining means 28.
又,依每個燈裝置24來調整相對於支座29的角度,使燈裝置24的光軸通過積光器52之中心,但是,如圖6所示,使用各燈裝置24所對應之全反射鏡60及具備半反射鏡(half mirror)62的導光單元64,使各燈裝置24的光軸R集束,讓該當集束之光軸R通過積光器52的中心亦可。Further, the angle with respect to the holder 29 is adjusted for each of the lamp units 24, so that the optical axis of the lamp unit 24 passes through the center of the illuminator 52. However, as shown in Fig. 6, the corresponding unit of each of the lamp units 24 is used. The mirror 60 and the light guiding unit 64 including the half mirror 62 bundle the optical axis R of each of the lamp devices 24 so that the optical axis R of the bundle passes through the center of the light collector 52.
進而,將關於發明之光源裝置10使用於曝光裝置12,但是,可長時間射出均勻之光量的光源裝置10係可適用於使用光之所有工業製程。Further, the light source device 10 of the invention is used in the exposure device 12. However, the light source device 10 capable of emitting a uniform amount of light for a long period of time can be applied to all industrial processes using light.
10...光源裝置10. . . Light source device
12...曝光裝置12. . . Exposure device
14...支持台14. . . Support desk
16...光學系16. . . Optical system
18...燈單元(lamp unit)18. . . Lamp unit
20...照度計20. . . Illuminometer
22...點燈控制裝置twenty two. . . Lighting control device
24...燈裝置twenty four. . . Light device
26...電力供給裝置26. . . Power supply device
28...異常判定手段28. . . Abnormal determination
38...積算光量計38. . . Integrated light meter
40...序列器(programmable logic controller:PLC)40. . . Sequencer (programmable logic controller: PLC)
42...電算處理裝置42. . . Computerized processing device
50...曝光控制用遮斷器(shutter)50. . . Exposure control shutter (shutter)
52...積光器(integrator)52. . . Integrator
54...反射鏡54. . . Reflector
56...凹面鏡56. . . concave mirror
58...貫通孔58. . . Through hole
[圖1]揭示關於本發明之曝光裝置的圖。Fig. 1 is a view showing a exposure apparatus relating to the present invention.
[圖2]揭示光源單元的圖。[Fig. 2] A diagram showing a light source unit.
[圖3]揭示放電燈的圖。Fig. 3 is a view showing a discharge lamp.
[圖4]揭示點燈控制裝置的圖。Fig. 4 is a view showing a lighting control device.
[圖5]揭示供給至放電燈之電壓值與該當放電燈之使用時間的關係的圖。Fig. 5 is a view showing the relationship between the voltage value supplied to the discharge lamp and the use time of the discharge lamp.
[圖6]揭示複數燈與積光器與關於位置之其他實施例的圖。[Fig. 6] A diagram showing a plurality of lamps and a concentrator and other embodiments relating to positions.
10...光源裝置10. . . Light source device
12...曝光裝置12. . . Exposure device
14...支持台14. . . Support desk
16...光學系16. . . Optical system
18...燈單元18. . . Lamp unit
20...照度計20. . . Illuminometer
22...點燈控制裝置twenty two. . . Lighting control device
24...燈裝置twenty four. . . Light device
26...電力供給裝置26. . . Power supply device
28...異常判定手段28. . . Abnormal determination
38...積算光量計38. . . Integrated light meter
40...序列器40. . . Sequencer
42...電算處理裝置42. . . Computerized processing device
50...曝光控制用遮斷器50. . . Exposure control interrupter
52...積光器52. . . Light concentrator
54...反射鏡54. . . Reflector
56...凹面鏡56. . . concave mirror
58...貫通孔58. . . Through hole
M...遮罩M. . . Mask
P...印刷電路基板P. . . Printed circuit board
X...光阻層X. . . Photoresist layer
S1...通電訊號S1. . . Power signal
S2...通電遮斷訊號S2. . . Power-on occlusion signal
S3...異常訊號S3. . . Abnormal signal
S4...照度值S4. . . Illuminance value
S10...開訊號S10. . . Signal number
S11...閉訊號S11. . . Closed signal
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JP2007079179A JP4937808B2 (en) | 2007-03-26 | 2007-03-26 | Light source device and exposure apparatus using the same |
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JP5355261B2 (en) * | 2009-07-07 | 2013-11-27 | 株式会社日立ハイテクノロジーズ | Proximity exposure apparatus, exposure light forming method for proximity exposure apparatus, and display panel substrate manufacturing method |
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JPWO2011105461A1 (en) * | 2010-02-24 | 2013-06-20 | Nskテクノロジー株式会社 | Light irradiation apparatus for exposure apparatus, exposure apparatus, exposure method, substrate manufacturing method, mask, and substrate to be exposed |
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TW200839454A (en) | 2008-10-01 |
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JP4937808B2 (en) | 2012-05-23 |
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