TWI379068B - - Google Patents

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Publication number
TWI379068B
TWI379068B TW097135902A TW97135902A TWI379068B TW I379068 B TWI379068 B TW I379068B TW 097135902 A TW097135902 A TW 097135902A TW 97135902 A TW97135902 A TW 97135902A TW I379068 B TWI379068 B TW I379068B
Authority
TW
Taiwan
Prior art keywords
light
edge
transparent body
edge position
line sensor
Prior art date
Application number
TW097135902A
Other languages
English (en)
Chinese (zh)
Other versions
TW200921040A (en
Inventor
Yoshihiko Okayama
Original Assignee
Azbil Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Azbil Corp filed Critical Azbil Corp
Publication of TW200921040A publication Critical patent/TW200921040A/zh
Application granted granted Critical
Publication of TWI379068B publication Critical patent/TWI379068B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1876—Diffractive Fresnel lenses; Zone plates; Kinoforms
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0181—Memory or computer-assisted visual determination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW097135902A 2007-09-28 2008-09-18 Edge detection device TW200921040A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007253661A JP4868597B2 (ja) 2007-09-28 2007-09-28 エッジ検出装置

Publications (2)

Publication Number Publication Date
TW200921040A TW200921040A (en) 2009-05-16
TWI379068B true TWI379068B (ja) 2012-12-11

Family

ID=40517008

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097135902A TW200921040A (en) 2007-09-28 2008-09-18 Edge detection device

Country Status (4)

Country Link
JP (1) JP4868597B2 (ja)
KR (1) KR101009598B1 (ja)
CN (1) CN101398292B (ja)
TW (1) TW200921040A (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI481852B (zh) * 2012-03-22 2015-04-21 Hiti Digital Inc 用來偵測透光介質邊緣之偵測裝置與偵測方法
TWI464385B (zh) * 2012-03-22 2014-12-11 Hiti Digital Inc 用來偵測透光光柵結構之偵測裝置與偵測方法
CN103884277A (zh) * 2014-03-10 2014-06-25 杭州电子科技大学 非透明介质的边缘检测装置
JP6329091B2 (ja) * 2015-02-19 2018-05-23 アズビル株式会社 エッジ検出装置
CN108548501A (zh) * 2018-05-31 2018-09-18 广州贝晓德传动配套有限公司 材料边缘位置检测装置
CN111768422A (zh) * 2020-01-16 2020-10-13 北京沃东天骏信息技术有限公司 边缘检测的处理方法、装置、设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3858994B2 (ja) * 2002-11-28 2006-12-20 株式会社山武 位置検出方法および装置
JP2004226372A (ja) * 2003-01-27 2004-08-12 Yamatake Corp 位置検出方法および装置
JP4775946B2 (ja) * 2005-08-30 2011-09-21 株式会社山武 エッジ検出装置

Also Published As

Publication number Publication date
CN101398292B (zh) 2010-12-15
TW200921040A (en) 2009-05-16
JP4868597B2 (ja) 2012-02-01
KR20090033097A (ko) 2009-04-01
KR101009598B1 (ko) 2011-01-20
JP2009085679A (ja) 2009-04-23
CN101398292A (zh) 2009-04-01

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