TWI370027B - - Google Patents

Info

Publication number
TWI370027B
TWI370027B TW094147614A TW94147614A TWI370027B TW I370027 B TWI370027 B TW I370027B TW 094147614 A TW094147614 A TW 094147614A TW 94147614 A TW94147614 A TW 94147614A TW I370027 B TWI370027 B TW I370027B
Authority
TW
Taiwan
Application number
TW094147614A
Other languages
Chinese (zh)
Other versions
TW200631677A (en
Inventor
Motohiro Kawashima
Satoshi Nonaka
Original Assignee
Humo Lab Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Humo Lab Ltd filed Critical Humo Lab Ltd
Publication of TW200631677A publication Critical patent/TW200631677A/zh
Application granted granted Critical
Publication of TWI370027B publication Critical patent/TWI370027B/zh

Links

Classifications

    • A—HUMAN NECESSITIES
    • A44—HABERDASHERY; JEWELLERY
    • A44B—BUTTONS, PINS, BUCKLES, SLIDE FASTENERS, OR THE LIKE
    • A44B6/00—Retainers or tethers for neckties, cravats, neckerchiefs, or the like, e.g. tie-clips, spring clips with attached tie-tethers, woggles, pins with associated sheathing members tetherable to clothing
    • A—HUMAN NECESSITIES
    • A41—WEARING APPAREL
    • A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
    • A41D25/00—Neckties

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW094147614A 2005-01-17 2005-12-30 Apparatus for inspecting and sorting the characteristics of chip-type electronic part TW200631677A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005009383A JP2006194831A (ja) 2005-01-17 2005-01-17 チップ形電子部品特性検査分類装置

Publications (2)

Publication Number Publication Date
TW200631677A TW200631677A (en) 2006-09-16
TWI370027B true TWI370027B (ko) 2012-08-11

Family

ID=36801019

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094147614A TW200631677A (en) 2005-01-17 2005-12-30 Apparatus for inspecting and sorting the characteristics of chip-type electronic part

Country Status (4)

Country Link
JP (1) JP2006194831A (ko)
KR (1) KR101216105B1 (ko)
CN (1) CN1806941B (ko)
TW (1) TW200631677A (ko)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7443179B2 (en) * 2006-11-30 2008-10-28 Electro Scientific Industries, Inc. Zero motion contact actuation
US7839138B2 (en) * 2007-01-29 2010-11-23 Electro Scientific Industries, Inc. Adjustable force electrical contactor
JP5030624B2 (ja) * 2007-03-13 2012-09-19 株式会社ヒューモラボラトリー 回転式電極子装置
JP5383430B2 (ja) * 2009-10-27 2014-01-08 株式会社ヒューモラボラトリー チップ形電子部品特性検査分類装置
TWI417967B (zh) * 2009-11-02 2013-12-01 Chroma Ate Inc A method for marking a grain bearing tray, a sorting machine and a characteristic mark
JP6223694B2 (ja) * 2013-03-05 2017-11-01 株式会社ヒューモラボラトリー チップ電子部品の特性検査と分類のための装置
CN105102088B (zh) * 2014-02-25 2017-10-10 日立欧姆龙金融系统有限公司 检查装置及检查方法
CN106796261B (zh) * 2014-09-05 2020-08-28 慧萌高新科技有限公司 芯片电子部件的特性检查和分类用的装置
TWI636265B (zh) * 2014-09-05 2018-09-21 慧萌高新科技有限公司 Device for inspection and classification of characteristics of chip electronic parts
JP6506552B2 (ja) * 2014-12-26 2019-04-24 株式会社ヒューモラボラトリー チップ電子部品検査選別装置
JP6459882B2 (ja) * 2015-10-06 2019-01-30 株式会社村田製作所 通電装置
JP2018054594A (ja) * 2016-09-26 2018-04-05 セイコーインスツル株式会社 接触式プローブ
JP6852171B2 (ja) * 2017-09-19 2021-03-31 株式会社Ｆｕｊｉ 測定装置
JP6679552B2 (ja) * 2017-10-02 2020-04-15 株式会社ヒューモラボラトリー チップ電子部品の検査選別方法
JP7107589B2 (ja) * 2020-08-28 2022-07-27 株式会社ヒューモラボラトリー チップ電子部品検査用のローラ電極接触子を備えた装置
KR20240047101A (ko) 2022-10-04 2024-04-12 오승훈 휴대가 용이한 마사지기구

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0471172U (ko) * 1990-10-30 1992-06-24
CN2101952U (zh) * 1991-08-09 1992-04-15 温州市精密电子仪器厂 滚动式电刷大功率电力稳压器
JPH0620756A (ja) * 1992-07-02 1994-01-28 Tanaka Kikinzoku Kogyo Kk ブラシ接点の製造方法
JP3090389B2 (ja) * 1993-11-24 2000-09-18 田中貴金属工業株式会社 マルチワイヤープローブの製造方法
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
JP2000180470A (ja) * 1998-12-15 2000-06-30 Casio Comput Co Ltd 検査用プロ―ブ
CN2525654Y (zh) * 2002-02-08 2002-12-11 林林 可变电阻器电刷导电膜装置
JP4161761B2 (ja) * 2002-04-25 2008-10-08 株式会社村田製作所 電子部品の特性測定装置
JP2004212287A (ja) * 2003-01-07 2004-07-29 Jst Mfg Co Ltd コイルスプリング状コンタクト

Also Published As

Publication number Publication date
TW200631677A (en) 2006-09-16
CN1806941B (zh) 2010-12-08
JP2006194831A (ja) 2006-07-27
KR101216105B1 (ko) 2012-12-27
KR20060083871A (ko) 2006-07-21
CN1806941A (zh) 2006-07-26

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