TW200631677A - Apparatus for inspecting and sorting the characteristics of chip-type electronic part - Google Patents

Apparatus for inspecting and sorting the characteristics of chip-type electronic part

Info

Publication number
TW200631677A
TW200631677A TW094147614A TW94147614A TW200631677A TW 200631677 A TW200631677 A TW 200631677A TW 094147614 A TW094147614 A TW 094147614A TW 94147614 A TW94147614 A TW 94147614A TW 200631677 A TW200631677 A TW 200631677A
Authority
TW
Taiwan
Prior art keywords
type electronic
electronic component
chip type
contact
inspection
Prior art date
Application number
TW094147614A
Other languages
Chinese (zh)
Other versions
TWI370027B (en
Inventor
Motohiro Kawashima
Satoshi Nonaka
Original Assignee
Humo Lab Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Humo Lab Ltd filed Critical Humo Lab Ltd
Publication of TW200631677A publication Critical patent/TW200631677A/en
Application granted granted Critical
Publication of TWI370027B publication Critical patent/TWI370027B/zh

Links

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

To provide an inspection classification device of a chip type electronic component characteristic that conveys a chip type electronic component with a rotating disk or the like, and inspects the electrical characteristic for classification. In a part in contact with an end face electrode 31 of the chip type electronic component of a contact for inspection of the device that inspects the electrical characteristic of the chip type electronic component 30 and classifies the chip type electronic component 30 based on the inspection result, the material of the contact for inspection is an alloy containing palladium, silver, platinum, and gold as base. The shape of the part of the chip type electronic component in contact with the end face electrode is a brush shape where a plurality of narrow wires are bundled, for example.
TW094147614A 2005-01-17 2005-12-30 Apparatus for inspecting and sorting the characteristics of chip-type electronic part TW200631677A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005009383A JP2006194831A (en) 2005-01-17 2005-01-17 Inspection classification device of chip type electronic component characteristic

Publications (2)

Publication Number Publication Date
TW200631677A true TW200631677A (en) 2006-09-16
TWI370027B TWI370027B (en) 2012-08-11

Family

ID=36801019

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094147614A TW200631677A (en) 2005-01-17 2005-12-30 Apparatus for inspecting and sorting the characteristics of chip-type electronic part

Country Status (4)

Country Link
JP (1) JP2006194831A (en)
KR (1) KR101216105B1 (en)
CN (1) CN1806941B (en)
TW (1) TW200631677A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI417967B (en) * 2009-11-02 2013-12-01 Chroma Ate Inc A method for marking a grain bearing tray, a sorting machine and a characteristic mark

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Publication number Priority date Publication date Assignee Title
US7443179B2 (en) * 2006-11-30 2008-10-28 Electro Scientific Industries, Inc. Zero motion contact actuation
US7839138B2 (en) * 2007-01-29 2010-11-23 Electro Scientific Industries, Inc. Adjustable force electrical contactor
JP5030624B2 (en) * 2007-03-13 2012-09-19 株式会社ヒューモラボラトリー Rotary electrode device
JP5383430B2 (en) * 2009-10-27 2014-01-08 株式会社ヒューモラボラトリー Chip type electronic component characteristic inspection and classification system
JP6223694B2 (en) * 2013-03-05 2017-11-01 株式会社ヒューモラボラトリー Equipment for characterization and classification of chip electronic components
CN105102088B (en) * 2014-02-25 2017-10-10 日立欧姆龙金融系统有限公司 Check device and inspection method
CN106796261B (en) * 2014-09-05 2020-08-28 慧萌高新科技有限公司 Device for inspecting and classifying characteristics of chip electronic component
TWI636265B (en) * 2014-09-05 2018-09-21 慧萌高新科技有限公司 Device for inspection and classification of characteristics of chip electronic parts
JP6506552B2 (en) * 2014-12-26 2019-04-24 株式会社ヒューモラボラトリー Chip electronic parts inspection and sorting device
JP6459882B2 (en) * 2015-10-06 2019-01-30 株式会社村田製作所 Energizer
JP2018054594A (en) * 2016-09-26 2018-04-05 セイコーインスツル株式会社 Contact type probe
JP6852171B2 (en) * 2017-09-19 2021-03-31 株式会社Fuji measuring device
JP6679552B2 (en) * 2017-10-02 2020-04-15 株式会社ヒューモラボラトリー Inspection and sorting method for chip electronic components
JP7107589B2 (en) * 2020-08-28 2022-07-27 株式会社ヒューモラボラトリー Equipment with roller electrode contacts for chip electronic component inspection
KR20240047101A (en) 2022-10-04 2024-04-12 오승훈 Portable multi function massage device

Family Cites Families (9)

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Publication number Priority date Publication date Assignee Title
JPH0471172U (en) * 1990-10-30 1992-06-24
CN2101952U (en) * 1991-08-09 1992-04-15 温州市精密电子仪器厂 Large power electric power manostat with rolling type electric brush
JPH0620756A (en) * 1992-07-02 1994-01-28 Tanaka Kikinzoku Kogyo Kk Manufacture of brush contact
JP3090389B2 (en) * 1993-11-24 2000-09-18 田中貴金属工業株式会社 Manufacturing method of multi-wire probe
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
JP2000180470A (en) * 1998-12-15 2000-06-30 Casio Comput Co Ltd Probe for inspection
CN2525654Y (en) * 2002-02-08 2002-12-11 林林 Variable resistor electric brush conductive film device
JP4161761B2 (en) * 2002-04-25 2008-10-08 株式会社村田製作所 Electronic component characteristic measuring device
JP2004212287A (en) * 2003-01-07 2004-07-29 Jst Mfg Co Ltd Coil spring-like contact

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI417967B (en) * 2009-11-02 2013-12-01 Chroma Ate Inc A method for marking a grain bearing tray, a sorting machine and a characteristic mark

Also Published As

Publication number Publication date
CN1806941B (en) 2010-12-08
JP2006194831A (en) 2006-07-27
KR101216105B1 (en) 2012-12-27
KR20060083871A (en) 2006-07-21
CN1806941A (en) 2006-07-26
TWI370027B (en) 2012-08-11

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