CN209640378U - The adapter base structure of test fixture - Google Patents

The adapter base structure of test fixture Download PDF

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Publication number
CN209640378U
CN209640378U CN201822036592.9U CN201822036592U CN209640378U CN 209640378 U CN209640378 U CN 209640378U CN 201822036592 U CN201822036592 U CN 201822036592U CN 209640378 U CN209640378 U CN 209640378U
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China
Prior art keywords
plural number
probe
contact point
test
plural
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CN201822036592.9U
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Chinese (zh)
Inventor
陈福全
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Guanquan Technology Industry Co ltd
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Guanquan Technology Industry Co ltd
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Priority to CN201822036592.9U priority Critical patent/CN209640378U/en
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Abstract

The utility model provides a kind of adapter base structure of test fixture, in having plural test point on a part to be measured, plural number test contact point is equipped with using the one side of a pinboard, plural number test contact point pair should the plural number test point of part to be measured be electrically connected, and the another side plural number probe contact point of pinboard, it is electrically connected between the plural number probe contact point and plural number test contact point using plural internal wiring, and probe card has plural probe, the first end of the plural number probe and the plural number probe contact point of the pinboard are electrically connected, the second end of the plural number probe is electrically connected using complex lead and a tester table, with splendid convenience, the advantages of testing time and cost can be saved.

Description

The adapter base structure of test fixture
Technical field
The utility model relates to a kind of adapter base structures of test fixture, and espespecially one kind is led between probe card and part to be measured It crosses adapter to be electrically connected, the prior art can effectively be overcome to utilize the electrical characteristic of enameled wire bad and vulnerable to external collision The shortcomings that, have the advantages that splendid convenience, testing time and cost can be saved.
Background technique
Probe card (Probe Card) is applied before integrated circuit (IC) not yet encapsulates, to bare crystalline with probe (Probe) Test point conducting or out of circuit test are done, and then filters out the encapsulation engineering after being carried out after defective products again.Therefore, it is sticked into probe Line integrated circuit test, is the critical processes of integrated circuit;This, which carries out probe card test, can make the qualification rate of finished product by original 70% is promoted to 90%, wherein promoted 20% qualification rate contribution degree for the semiconductor factory that qualification rate is haggled over every penny, this The influence of one processing procedure is very huge and is necessary.And probe card is interface between a tester table and wafer (Wafer), each collection The purpose at least needing a corresponding probe card to be tested, and carry out probe card test at circuit is after cutting wafer Make to enter next encapsulation procedure by test non-defective unit, and avoidable defective products continues processing and causes bigger waste.
In the used wafer of current industry (Wafer) or printed circuit board (PCB) test device, wherein test fixture is logical The plural probe of the institute of setting in a probe card is crossed, the plural number test dot of the plural number probe and wafer to be measured or printed circuit board is made At electric connection, and the electronic signal of test point is obtained by probe and passes through complex lead and is sent in a tester table, it should Tester table show the wafer or printed circuit to be measured plural number test point whether be conducting or open circuit state, due to probe Connect enameled wire must can generate electric connection by manually welding one by one between test point, and due to human weld's Enameled wire is limited to manually cut out and weld and be unable to accurately control length of wires, therefore be easy to cause line between probe and test point Material is too long to cause impedance to increase, and the detection time of tester table is caused also to extend therewith.Meanwhile the paint between probe and test point Envelope curve is exposed state, is easily pullled generation desoldering by external collision or wire rod or wire rod falls off, cause the test of tester table As a result mistake, and but also consumption cost not only time-consuming using human weld's wire rod, due to being electrically connected knot between foregoing probes and test point Structure has shortcomings, therefore needing to be engaged in this journey dealer is improved.
Utility model content
Therefore, the utility model designer is collecting related data via more in view of above-mentioned existing problem and missing Side assessment and consider, and using engage in the industry many years research and development experience constantly study and modify, beginning have such test The adapter base structure new patent of jig is born.
In order to achieve the above purposes, the technical solution adopted by the utility model is:
A kind of adapter base structure of test fixture, it is characterized in that including:
One part to be measured has plural test point;
One pinboard has one first face and one second face, is equipped with plural number test contact point in first face, which surveys Contact of trying corresponds to the plural number test point of the part to be measured and is electrically connected, and is equipped with plural probe contact in second face Point is electrically connected between the plural number probe contact point and plural number test contact point using plural internal wiring;And
One probe card has plural probe, which has a first end and a second end, which is somebody's turn to do First end and the plural number probe contact point of the pinboard are electrically connected, and the second end of the plural number probe utilizes plural number Conducting wire is electrically connected with a tester table.
The adapter base structure of the test fixture, in which: the pinboard is assembled with a pedestal by a upper cover and constituted, should Plural number test contact point is set to the surface of the upper cover, and the plural number probe contact point is set to the bottom of the pedestal, and electrically It connects the plural number probe contact point and the internal wiring of plural number test contact point is made of an enameled wire.
The adapter base structure of the test fixture, in which: the adjacent contact of the plural number test contact point of the pinboard The spacing of point is greater than the spacing of the adjacent contact points of the plural number probe contact point.
It, can be effective due to being electrically connected between the probe card of the utility model and the part to be measured by the adapter Overcome the prior art bad and the shortcomings that vulnerable to external collision using the electrical characteristic of exposed enameled wire, there is splendid convenience Property can save the advantages of testing time and cost.
Detailed description of the invention
Fig. 1 is the dimensional decomposition structure figure of the adapter of the utility model test fixture.
Fig. 2 is another dimensional decomposition structure figure of the adapter of the utility model test fixture.
Fig. 3 is the plan structure in the first face of the utility model pinboard.
Fig. 4 is the plan structure in the second face of the utility model pinboard
Fig. 5 is the side elevational cross-section local structural graph of the utility model pinboard.
Description of symbols: 1- part to be measured;11- test point;2- pinboard;The first face 21-;211- tests contact point;22- Second face;221- probe contact point;23- internal wiring;3- probe card;31- probe;311- first end;312- second end;4- is supported Plate;5- conducting wire;6- tester table.
Specific embodiment
To reach above-mentioned purpose and effect, technological means and its construction used by the utility model, hereby draw with regard to this reality With novel preferred embodiment elaborate, its construction is as follows with function, is understood completely with sharp.
It please refers to shown in Fig. 1 to Fig. 5, the dimensional decomposition structure figure of the adapter out of the ordinary for the utility model test fixture, Another dimensional decomposition structure figure of the adapter of test fixture, the plan structure in the first face of pinboard, the second face of pinboard are bowed Depending on the side elevational cross-section local structural graph of structure, pinboard, the adapter base structure of the utility model test fixture include part 1 to be measured, Pinboard 2, probe card 3 support plate 4, conducting wire 5 and tester table 6, and details are as follows for each component:
The part 1 to be measured has plural test point 11, which refers to wafer (Wafer) or printed circuit board (PCB), lifts All wafers or printed circuit board are equipped with plural test point 11, can all become the embodiments of the present invention.And wafer or printing electricity The implementation structure of plural test point 11 on the plate of road is weld pad (Pad) or convex block (Bump).
The pinboard 2 has one first face 21 and one second face 22, is equipped with plural number test contact point in first face 21 211, the plural number test point 11 of the corresponding part 1 to be measured in plural number test contact point 211 is electrically connected, and in second face 22 are equipped with plural probe contact point 221, utilize plural number between the plural number probe contact point 221 and plural number test contact point 211 Internal wiring 23 is electrically connected.And the first face 21 of the pinboard 2 fits in the lower surface of part 1 to be measured, and part to be measured 1 is answered Number test point 11 and the electric connection of the test contact point 211 of pinboard 2 are by surface adhering technical (Surface Mount Technology, SMT) Lai Dacheng, and the upper surface of the part 1 to be measured is then provided with one and supports plate 4, this is supported is equipped with above plate 4 One for supporting mechanism (do not show, and this supports the non-emphasis for this case of mechanism in figure, therefore do not formed and repeated herein), this supports plate 4, which provide the part 1 to be measured, a resist force, so that pinboard 2 and probe card 3 that the lower surface of the part 1 to be measured is connected can be really It fits closely, to reach a steady testing structure.
The pinboard 2, which is assembled by a upper cover with a pedestal, to be constituted, and plural number test contact point 211 is set to the upper cover Surface, the surface of the upper cover is first face 21, and the plural number probe contact point 221 is set to the bottom of the pedestal, the bottom The bottom of seat is second face 22, and is electrically connected the plural number probe contact point 221 and tests being somebody's turn to do for contact point 211 with the plural number Internal wiring 23 is made of an enameled wire or other plain conductors (such as gold thread, silver wire, copper wire), but application enameled wire is more Economic selection facilitates the manufacturing cost for reducing pinboard 2.But in the pinboard 2 in addition to the group by a upper cover and a pedestal Outside assembling structure, it can also be made of respectively plural plate more than two, three pieces or three pieces, may achieve the knot of foregoing advantages such as Structure should all be covered by the utility model, and such simple modification and equivalent structure variation should all similarly be included in the utility model The scope of the patents in.And the upper cover and pedestal of the pinboard 2 pass through plural fixing piece (not showing in figure, can be screw or rivet) Set fixation hole on the upper cover and pedestal is worn to be locked, and the fixed structure of the upper cover and pedestal, non-is originally practical new Type emphasis, therefore do not add inking herein, Chen Ming is given in conjunction.
Aforementioned pinboard 2 be set to internal wiring 23 between the first face 21 and the second face 22 be tight and line of shortest length away from knot Structure can accurately control length of wires, and connection wire hinders between the probe card 3 and the plural number test point 11 of the part 1 to be measured It is anti-to can ensure that it is lowest impedance, the detection time of tester table 6 can also be made substantially to shorten.Meanwhile the internal wiring 23 of the pinboard 2 By the protection of upper cover and pedestal, generation desoldering is not pullled vulnerable to external collision or wire rod or wire rod falls off, it can be ensured that test machine The accuracy of the test result of platform.
The spacing of the adjacent contact points of the plural number test contact point 211 of the pinboard 2 is greater than the plural number probe contact point The spacing of 221 adjacent contact points can make the corresponding wafer in plural number test contact point 211 or printing using this design structure The test point 11 of the larger spacing of circuit board, and the plural number probe contact point 221 is able to maintain fixed and is connected with lesser spacing In tester table 6, the design and manufacture cost of the pinboard 2 can be reduced using such 2 structure of pinboard.
The probe card 3 has plural probe 31, which has a first end 311 and a second end 312, this is multiple The first end 311 of number probe 31 and the plural number probe contact point 221 of the pinboard 2 are electrically connected, and the plural number is visited The second end 312 of needle 31 is electrically connected using complex lead 5 and a tester table 6.The probe card 3 passes through complex lead 5 are electrically connected at the structure of tester table 6, are the general prior arts, therefore are not adding inking herein, and Chen Ming is given in conjunction.
By the announcement of above-mentioned Fig. 1 to Fig. 5, that is, it can be appreciated that the utility model is a kind of adapter base structure of test fixture, It predominantly provides a kind of adapter base structure of test fixture, in having plural test point on a part to be measured, utilizes a pinboard One side be equipped with plural number test contact point, plural number test contact point pair should the plural number test point of part to be measured form electrical connect It connects, and the another side plural number probe contact point of pinboard, it is utilized between the plural number probe contact point and plural number test contact point Plural internal wiring is electrically connected, and probe card has plural probe, the first end and the pinboard of the plural number probe The plural number probe contact point is electrically connected, and the second end of the plural number probe is formed using complex lead and a tester table It is electrically connected, due to being electrically connected between the probe card of the utility model and the part to be measured by the adapter, can have Effect overcomes the prior art bad and the shortcomings that vulnerable to external collision using the electrical characteristic of exposed enameled wire, have it is splendid just Benefit can save the advantages of testing time and cost.
It is described above to be merely exemplary for the utility model, and not restrictive, those of ordinary skill in the art Understand, without departing from the spirit and scope defined by the claims, can many modifications may be made, variation or it is equivalent, but It falls within the protection scope of the utility model.

Claims (3)

1. a kind of adapter base structure of test fixture characterized by comprising
One part to be measured has plural test point;
One pinboard has one first face and one second face, is equipped with plural number test contact point in first face, plural number test connects The plural number test point that contact corresponds to the part to be measured is electrically connected, and is equipped with plural probe contact point in second face, should It is electrically connected between plural probe contact point and plural number test contact point using plural internal wiring;And
One probe card, has a plural probe, the plural number probe with a first end and a second end, the plural number probe this first It holds and is electrically connected with the plural number probe contact point of the pinboard, and the second end of the plural number probe utilizes complex lead It is electrically connected with a tester table.
2. the adapter base structure of test fixture according to claim 1, it is characterised in that: the pinboard is by a upper cover and one Pedestal assembles composition, and plural number test contact point is set to the surface of the upper cover, and the plural number probe contact point is set to this The bottom of pedestal, and the internal wiring of the plural number probe contact point and plural number test contact point is electrically connected by an enameled wire institute It constitutes.
3. the adapter base structure of test fixture according to claim 1, it is characterised in that: the plural number of the pinboard is tested The spacing of the adjacent contact points of contact point is greater than the spacing of the adjacent contact points of the plural number probe contact point.
CN201822036592.9U 2018-12-05 2018-12-05 The adapter base structure of test fixture Active CN209640378U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201822036592.9U CN209640378U (en) 2018-12-05 2018-12-05 The adapter base structure of test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201822036592.9U CN209640378U (en) 2018-12-05 2018-12-05 The adapter base structure of test fixture

Publications (1)

Publication Number Publication Date
CN209640378U true CN209640378U (en) 2019-11-15

Family

ID=68474506

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201822036592.9U Active CN209640378U (en) 2018-12-05 2018-12-05 The adapter base structure of test fixture

Country Status (1)

Country Link
CN (1) CN209640378U (en)

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