TWI367611B - Euv light source mirror and method for fabricating the same, euv light source mirror assembly and method for fabricating and aligning a light source collector mirror - Google Patents

Euv light source mirror and method for fabricating the same, euv light source mirror assembly and method for fabricating and aligning a light source collector mirror

Info

Publication number
TWI367611B
TWI367611B TW096127084A TW96127084A TWI367611B TW I367611 B TWI367611 B TW I367611B TW 096127084 A TW096127084 A TW 096127084A TW 96127084 A TW96127084 A TW 96127084A TW I367611 B TWI367611 B TW I367611B
Authority
TW
Taiwan
Prior art keywords
light source
fabricating
mirror
euv light
aligning
Prior art date
Application number
TW096127084A
Other languages
English (en)
Other versions
TW200820526A (en
Inventor
Norbert R Bowering
Igor V Fomenkov
Original Assignee
Cymer Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cymer Inc filed Critical Cymer Inc
Publication of TW200820526A publication Critical patent/TW200820526A/zh
Application granted granted Critical
Publication of TWI367611B publication Critical patent/TWI367611B/zh

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/08Mirrors
    • G02B5/0891Ultraviolet [UV] mirrors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/7015Details of optical elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/702Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062Devices having a multilayer structure
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/4998Combined manufacture including applying or shaping of fluent material
    • Y10T29/49982Coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Optical Elements Other Than Lenses (AREA)
TW096127084A 2006-08-16 2007-07-25 Euv light source mirror and method for fabricating the same, euv light source mirror assembly and method for fabricating and aligning a light source collector mirror TWI367611B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/505,177 US7843632B2 (en) 2006-08-16 2006-08-16 EUV optics

Publications (2)

Publication Number Publication Date
TW200820526A TW200820526A (en) 2008-05-01
TWI367611B true TWI367611B (en) 2012-07-01

Family

ID=39082516

Family Applications (2)

Application Number Title Priority Date Filing Date
TW096127084A TWI367611B (en) 2006-08-16 2007-07-25 Euv light source mirror and method for fabricating the same, euv light source mirror assembly and method for fabricating and aligning a light source collector mirror
TW100131687A TWI489155B (zh) 2006-08-16 2007-07-25 極遠紫外光光學部件

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW100131687A TWI489155B (zh) 2006-08-16 2007-07-25 極遠紫外光光學部件

Country Status (5)

Country Link
US (3) US7843632B2 (zh)
JP (2) JP2010500776A (zh)
KR (2) KR20090040434A (zh)
TW (2) TWI367611B (zh)
WO (1) WO2008020965A2 (zh)

Families Citing this family (73)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7856044B2 (en) 1999-05-10 2010-12-21 Cymer, Inc. Extendable electrode for gas discharge laser
US7843632B2 (en) * 2006-08-16 2010-11-30 Cymer, Inc. EUV optics
US7897947B2 (en) * 2007-07-13 2011-03-01 Cymer, Inc. Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave
US7916388B2 (en) * 2007-12-20 2011-03-29 Cymer, Inc. Drive laser for EUV light source
US7598509B2 (en) * 2004-11-01 2009-10-06 Cymer, Inc. Laser produced plasma EUV light source
US8653437B2 (en) 2010-10-04 2014-02-18 Cymer, Llc EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods
US7671349B2 (en) 2003-04-08 2010-03-02 Cymer, Inc. Laser produced plasma EUV light source
US8654438B2 (en) 2010-06-24 2014-02-18 Cymer, Llc Master oscillator-power amplifier drive laser with pre-pulse for EUV light source
DE102006006283B4 (de) * 2006-02-10 2015-05-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thermisch stabiler Multilayer-Spiegel für den EUV-Spektralbereich
US8513629B2 (en) 2011-05-13 2013-08-20 Cymer, Llc Droplet generator with actuator induced nozzle cleaning
US8158960B2 (en) 2007-07-13 2012-04-17 Cymer, Inc. Laser produced plasma EUV light source
WO2008065821A1 (fr) * 2006-11-27 2008-06-05 Nikon Corporation Elément optique, unité d'exposition associée et procédé de production du dispositif
DE102006056035A1 (de) * 2006-11-28 2008-05-29 Carl Zeiss Smt Ag Beleuchtungsoptik für die EUV-Projektions-Mikrolithographie, Beleuchtungssystem mit einer derartigen Beleuchtungsoptik, Projektionsbelichtungsanlage mit einem derartigen Beleuchtungssystem, Verfahren zur Herstellung eines mikrostrukturierten Bauteils sowie durch das Verfahren hergestelltes mikrostrukturiertes Bauteil
DE102007008448A1 (de) * 2007-02-19 2008-08-21 Carl Zeiss Smt Ag Verfahren zur Herstellung von Spiegelfacetten für einen Facettenspiegel
JP5295515B2 (ja) * 2007-03-30 2013-09-18 東京エレクトロン株式会社 載置台の表面処理方法
US20080280539A1 (en) * 2007-05-11 2008-11-13 Asml Holding N.V. Optical component fabrication using amorphous oxide coated substrates
US20080318066A1 (en) * 2007-05-11 2008-12-25 Asml Holding N.V. Optical Component Fabrication Using Coated Substrates
US7812329B2 (en) * 2007-12-14 2010-10-12 Cymer, Inc. System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus
US7655925B2 (en) * 2007-08-31 2010-02-02 Cymer, Inc. Gas management system for a laser-produced-plasma EUV light source
US7960701B2 (en) 2007-12-20 2011-06-14 Cymer, Inc. EUV light source components and methods for producing, using and refurbishing same
US20090219497A1 (en) * 2008-02-28 2009-09-03 Carl Zeiss Smt Ag Optical device with stiff housing
US7872245B2 (en) * 2008-03-17 2011-01-18 Cymer, Inc. Systems and methods for target material delivery in a laser produced plasma EUV light source
DE102008000788A1 (de) * 2008-03-20 2009-09-24 Carl Zeiss Smt Ag Beleuchtungssystem für eine Mikrolithographie-Projektionsbelichtungsanlage
BRPI0802096E2 (pt) 2008-05-30 2010-03-16 Da Silva Denivaldo Goncalves aperfeiçoamentos introduzidos em aparelho para alisamento de cabelos com escova acoplada
US8198612B2 (en) * 2008-07-31 2012-06-12 Cymer, Inc. Systems and methods for heating an EUV collector mirror
US8519366B2 (en) * 2008-08-06 2013-08-27 Cymer, Inc. Debris protection system having a magnetic field for an EUV light source
DE102008042212A1 (de) * 2008-09-19 2010-04-01 Carl Zeiss Smt Ag Reflektives optisches Element und Verfahren zu seiner Herstellung
US7641349B1 (en) 2008-09-22 2010-01-05 Cymer, Inc. Systems and methods for collector mirror temperature control using direct contact heat transfer
US8283643B2 (en) * 2008-11-24 2012-10-09 Cymer, Inc. Systems and methods for drive laser beam delivery in an EUV light source
JP5455661B2 (ja) * 2009-01-29 2014-03-26 ギガフォトン株式会社 極端紫外光源装置
US8969838B2 (en) * 2009-04-09 2015-03-03 Asml Netherlands B.V. Systems and methods for protecting an EUV light source chamber from high pressure source material leaks
US8237132B2 (en) * 2009-06-17 2012-08-07 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for reducing down time of a lithography system
DE102009039400A1 (de) * 2009-08-31 2011-03-03 Carl Zeiss Laser Optics Gmbh Reflektives optisches Element zur Verwendung in einem EUV-System
DE102009040785A1 (de) * 2009-09-09 2011-03-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Substrat aus einer Aluminium-Silizium-Legierung oder kristallinem Silizium, Metallspiegel, Verfahren zu dessen Herstellung sowie dessen Verwendung
US8525139B2 (en) * 2009-10-27 2013-09-03 Lam Research Corporation Method and apparatus of halogen removal
US8232538B2 (en) * 2009-10-27 2012-07-31 Lam Research Corporation Method and apparatus of halogen removal using optimal ozone and UV exposure
JP5687488B2 (ja) 2010-02-22 2015-03-18 ギガフォトン株式会社 極端紫外光生成装置
JP2011222958A (ja) * 2010-03-25 2011-11-04 Komatsu Ltd ミラーおよび極端紫外光生成装置
US8263953B2 (en) 2010-04-09 2012-09-11 Cymer, Inc. Systems and methods for target material delivery protection in a laser produced plasma EUV light source
US9066412B2 (en) 2010-04-15 2015-06-23 Asml Netherlands B.V. Systems and methods for cooling an optic
WO2012013227A1 (en) * 2010-07-28 2012-02-02 Carl Zeiss Smt Gmbh Facet mirror device
US8462425B2 (en) 2010-10-18 2013-06-11 Cymer, Inc. Oscillator-amplifier drive laser with seed protection for an EUV light source
DE102010043498A1 (de) 2010-11-05 2012-05-10 Carl Zeiss Smt Gmbh Projektionsobjektiv einer für EUV ausgelegten mikrolithographischen Projektionsbelichtungsanlage, sowie Verfahren zum optischen Justieren eines Projektionsobjektives
US8633459B2 (en) 2011-03-02 2014-01-21 Cymer, Llc Systems and methods for optics cleaning in an EUV light source
DE102011015141A1 (de) 2011-03-16 2012-09-20 Carl Zeiss Laser Optics Gmbh Verfahren zum Herstellen eines reflektiven optischen Bauelements für eine EUV-Projektionsbelichtungsanlage und derartiges Bauelement
US8604452B2 (en) 2011-03-17 2013-12-10 Cymer, Llc Drive laser delivery systems for EUV light source
KR101952465B1 (ko) * 2011-03-23 2019-02-26 칼 짜이스 에스엠테 게엠베하 Euv 미러 배열체, euv 미러 배열체를 포함하는 광학 시스템 및 euv 미러 배열체를 포함하는 광학 시스템을 작동시키는 방법
US9516730B2 (en) * 2011-06-08 2016-12-06 Asml Netherlands B.V. Systems and methods for buffer gas flow stabilization in a laser produced plasma light source
DE102011087331A1 (de) * 2011-11-29 2013-01-10 Carl Zeiss Smt Gmbh Temperaturempfindliches optisches Element aus SiSiC-Verbund und Halterung hierfür sowie Verfahren zu seiner Herstellung
DE102012204142A1 (de) * 2012-03-16 2013-03-21 Carl Zeiss Smt Gmbh Kollektor
KR101887054B1 (ko) * 2012-03-23 2018-08-09 삼성전자주식회사 적외선 검출 장치 및 이를 포함하는 가열 조리 장치
US10185234B2 (en) * 2012-10-04 2019-01-22 Asml Netherlands B.V. Harsh environment optical element protection
DE102013204441A1 (de) * 2013-03-14 2014-04-03 Carl Zeiss Smt Gmbh Kollektor
CN104345569B (zh) * 2013-07-24 2017-03-29 中芯国际集成电路制造(上海)有限公司 极紫外光刻机光源系统及极紫外曝光方法
DE102013215541A1 (de) * 2013-08-07 2015-02-12 Carl Zeiss Smt Gmbh Spiegel, insbesondere für eine mikrolithographische Projektionsbelichtungsanlage
US9696467B2 (en) * 2014-01-31 2017-07-04 Corning Incorporated UV and DUV expanded cold mirrors
EP2905637A1 (en) 2014-02-07 2015-08-12 ASML Netherlands B.V. EUV optical element having blister-resistant multilayer cap
US9271381B2 (en) 2014-02-10 2016-02-23 Asml Netherlands B.V. Methods and apparatus for laser produced plasma EUV light source
US9506871B1 (en) 2014-05-25 2016-11-29 Kla-Tencor Corporation Pulsed laser induced plasma light source
KR101630050B1 (ko) * 2014-07-25 2016-06-13 삼성전기주식회사 적층 세라믹 전자부품
US9546901B2 (en) * 2014-08-19 2017-01-17 Asml Netherlands B.V. Minimizing grazing incidence reflections for reliable EUV power measurements having a light source comprising plural tubes with centerlines disposed between a radiation region and corresponding photodetector modules
CN105573061B (zh) * 2014-10-16 2018-03-06 中芯国际集成电路制造(上海)有限公司 Euv光源和曝光装置
US9541840B2 (en) * 2014-12-18 2017-01-10 Asml Netherlands B.V. Faceted EUV optical element
DE102015208831B4 (de) * 2015-05-12 2024-06-06 Carl Zeiss Smt Gmbh Verfahren zum Herstellen eines EUV-Moduls, EUV-Modul und EUV-Lithographiesystem
CN106154378A (zh) * 2016-08-30 2016-11-23 哈尔滨工业大学 一种SiC球面反射镜及利用该反射镜聚焦46.9nm激光的方法
DE102016217735A1 (de) * 2016-09-16 2018-03-22 Carl Zeiss Smt Gmbh Komponente für eine Spiegelanordnung für die EUV-Lithographie
US10732378B2 (en) * 2017-01-25 2020-08-04 Flir Systems, Inc. Mounting optical elements in optical systems
CN109407188B (zh) * 2017-08-17 2021-08-20 中国科学院长春光学精密机械与物理研究所 碳纤维复合材料反射镜的制备方法及相关反射镜
CN111295623B (zh) * 2017-10-30 2022-05-24 Asml控股股份有限公司 用于半导体光刻术的组件及其制造方法
DE102018207759A1 (de) * 2018-05-17 2019-11-21 Carl Zeiss Smt Gmbh Verfahren zum Herstellen eines Substrats für ein optisches Element und reflektierendes optisches Element
EP3844535A2 (en) * 2018-08-27 2021-07-07 Materion Corporation Uv reflective mirrors for display fabrication
CN112771999A (zh) * 2018-09-25 2021-05-07 Asml荷兰有限公司 在euv光源中用于靶量测和改变的激光系统
US11226438B2 (en) * 2018-10-03 2022-01-18 Corning Incorporated Reflective optical element

Family Cites Families (89)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3268409D1 (en) * 1981-08-24 1986-02-20 Walter Meier Installation for the projection of pairs of stereoscopic images anamorphotically compressed on a spherical surface
DE3427611A1 (de) * 1984-07-26 1988-06-09 Bille Josef Laserstrahl-lithograph
US4958363A (en) * 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
JP2566564B2 (ja) * 1986-10-01 1996-12-25 キヤノン株式会社 軟x線又は真空紫外線用多層膜反射鏡
US5310603A (en) * 1986-10-01 1994-05-10 Canon Kabushiki Kaisha Multi-layer reflection mirror for soft X-ray to vacuum ultraviolet ray
JPH02168614A (ja) * 1988-09-27 1990-06-28 Mitsubishi Electric Corp X線露光用マスクおよびそれを用いた露光方法
FR2682486B1 (fr) * 1991-10-15 1993-11-12 Commissariat A Energie Atomique Miroir dielectrique interferentiel et procede de fabrication d'un tel miroir.
JPH06140303A (ja) * 1992-10-23 1994-05-20 Hitachi Ltd 投影露光装置
JPH0868897A (ja) * 1994-08-29 1996-03-12 Nikon Corp 反射鏡およびその製造方法
US5630902A (en) * 1994-12-30 1997-05-20 Honeywell Inc. Apparatus for use in high fidelty replication of diffractive optical elements
US5597613A (en) * 1994-12-30 1997-01-28 Honeywell Inc. Scale-up process for replicating large area diffractive optical elements
US5719706A (en) * 1995-03-15 1998-02-17 Matsushita Electric Industrial Co., Ltd. Illuminating apparatus, projection lens, and display apparatus including the illumination apparatus and the projection lens
US5870176A (en) * 1996-06-19 1999-02-09 Sandia Corporation Maskless lithography
US6423879B1 (en) * 1997-10-02 2002-07-23 Exxonmobil Oil Corporation Selective para-xylene production by toluene methylation
US5958605A (en) * 1997-11-10 1999-09-28 Regents Of The University Of California Passivating overcoat bilayer for multilayer reflective coatings for extreme ultraviolet lithography
SE9800665D0 (sv) * 1998-03-02 1998-03-02 Micronic Laser Systems Ab Improved method for projection printing using a micromirror SLM
DE10138313A1 (de) * 2001-01-23 2002-07-25 Zeiss Carl Kollektor für Beleuchtugnssysteme mit einer Wellenlänge < 193 nm
DE19830449A1 (de) * 1998-07-08 2000-01-27 Zeiss Carl Fa SiO¶2¶-beschichtetes Spiegelsubstrat für EUV
US6989924B1 (en) * 1998-08-06 2006-01-24 Midwest Research Institute Durable corrosion and ultraviolet-resistant silver mirror
US6210865B1 (en) * 1998-08-06 2001-04-03 Euv Llc Extreme-UV lithography condenser
US6295164B1 (en) * 1998-09-08 2001-09-25 Nikon Corporation Multi-layered mirror
JP2000147198A (ja) * 1998-09-08 2000-05-26 Nikon Corp 多層膜反射鏡及びその製造方法
US6567450B2 (en) * 1999-12-10 2003-05-20 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
JP2000162414A (ja) * 1998-09-22 2000-06-16 Nikon Corp 反射鏡の製造方法又は反射型照明装置又は半導体露光装置
JP2000162415A (ja) * 1998-09-22 2000-06-16 Nikon Corp 反射鏡の製造方法又は反射型照明装置又は半導体露光装置
JP2000098114A (ja) * 1998-09-22 2000-04-07 Nikon Corp 多光源形成反射鏡の製造方法及び該反射鏡を用いた光学装置
US6229652B1 (en) * 1998-11-25 2001-05-08 The Regents Of The University Of California High reflectance and low stress Mo2C/Be multilayers
US6140255A (en) * 1998-12-15 2000-10-31 Advanced Micro Devices, Inc. Method for depositing silicon nitride using low temperatures
US6498685B1 (en) * 1999-01-11 2002-12-24 Kenneth C. Johnson Maskless, microlens EUV lithography system
EP1085367A4 (en) * 1999-03-31 2003-08-27 Matsushita Electric Ind Co Ltd LIGHT SOURCE DEVICE, ASSOCIATED ADJUSTING DEVICE AND MANUFACTURING METHOD THEREOF, AND LIGHTING DEVICE AND PROJECTION SYSTEM PROVIDED WITH LIGHT SOURCE DEVICE
US6549551B2 (en) * 1999-09-27 2003-04-15 Cymer, Inc. Injection seeded laser with precise timing control
US6625191B2 (en) * 1999-12-10 2003-09-23 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
US6228512B1 (en) * 1999-05-26 2001-05-08 The Regents Of The University Of California MoRu/Be multilayers for extreme ultraviolet applications
TW561279B (en) * 1999-07-02 2003-11-11 Asml Netherlands Bv Reflector for reflecting radiation in a desired wavelength range, lithographic projection apparatus containing the same and method for their preparation
US6319635B1 (en) * 1999-12-06 2001-11-20 The Regents Of The University Of California Mitigation of substrate defects in reticles using multilayer buffer layers
JP2002006096A (ja) * 2000-06-23 2002-01-09 Nikon Corp 電磁波発生装置、これを用いた半導体製造装置並びに半導体デバイスの製造方法
TW575771B (en) * 2000-07-13 2004-02-11 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
JP2002072267A (ja) * 2000-08-25 2002-03-12 National Institute For Materials Science 光機能素子、該素子用単結晶基板、およびその使用方法
JP5371162B2 (ja) * 2000-10-13 2013-12-18 三星電子株式会社 反射型フォトマスク
US20040070726A1 (en) * 2000-11-03 2004-04-15 Andrew Ishak Waterman's sunglass lens
US6902773B1 (en) * 2000-11-21 2005-06-07 Hitachi Global Storage Technologies Netherlands, B.V. Energy gradient ion beam deposition of carbon overcoats on rigid disk media for magnetic recordings
EP1296162A4 (en) * 2001-02-23 2007-02-28 Nikon Corp POLYGON REFLECTOR, AND OPTICAL LIGHTING SYSTEM AND SEMICONDUCTOR EXPOSURE DEVICE USING THE POLYGON REFLECTOR
JP2002299228A (ja) * 2001-04-03 2002-10-11 Nikon Corp レチクル、それを用いた露光装置及び露光方法
JP2002318334A (ja) * 2001-04-24 2002-10-31 Nikon Corp 反射鏡の保持方法、反射鏡及び露光装置
US7439530B2 (en) * 2005-06-29 2008-10-21 Cymer, Inc. LPP EUV light source drive laser system
US7843632B2 (en) * 2006-08-16 2010-11-30 Cymer, Inc. EUV optics
DE10123768C2 (de) * 2001-05-16 2003-04-30 Infineon Technologies Ag Verfahren zur Herstellung einer lithographischen Reflexionsmaske insbesondere für die Strukturierung eines Halbleiterwafers sowie Reflexionsmaske
NL1018139C2 (nl) * 2001-05-23 2002-11-26 Stichting Fund Ond Material Meerlagenspiegel voor straling in het XUV-golflengtegebied en werkwijze voor de vervaardiging daarvan.
US20030008148A1 (en) * 2001-07-03 2003-01-09 Sasa Bajt Optimized capping layers for EUV multilayers
EP1282011B1 (de) * 2001-08-01 2006-11-22 Carl Zeiss SMT AG Reflektives Projektionsobjektiv für EUV-Photolithographie
US6634760B2 (en) * 2001-08-27 2003-10-21 The Regents Of The University Of California Low-cost method for producing extreme ultraviolet lithography optics
DE10150874A1 (de) * 2001-10-04 2003-04-30 Zeiss Carl Optisches Element und Verfahren zu dessen Herstellung sowie ein Lithographiegerät und ein Verfahren zur Herstellung eines Halbleiterbauelements
US20040016718A1 (en) * 2002-03-20 2004-01-29 Ruey-Jen Hwu Micro-optic elements and method for making the same
AU2003218416A1 (en) * 2002-04-05 2003-10-27 Joseph Bronner Masonry connectors and twist-on hook and method
DE10219514A1 (de) * 2002-04-30 2003-11-13 Zeiss Carl Smt Ag Beleuchtungssystem, insbesondere für die EUV-Lithographie
JP3919599B2 (ja) * 2002-05-17 2007-05-30 キヤノン株式会社 光学素子、当該光学素子を有する光源装置及び露光装置
US20040036993A1 (en) * 2002-05-17 2004-02-26 Tin Hla Ngwe Transparent heat mirror for solar and heat gain and methods of making
US20030224620A1 (en) * 2002-05-31 2003-12-04 Kools Jacques C.S. Method and apparatus for smoothing surfaces on an atomic scale
TWI227380B (en) * 2002-06-06 2005-02-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
JP2004056125A (ja) * 2002-06-20 2004-02-19 Nikon Corp 個別アクチュエータを有する反射投影光学系
US6880942B2 (en) * 2002-06-20 2005-04-19 Nikon Corporation Adaptive optic with discrete actuators for continuous deformation of a deformable mirror system
EP1387220A3 (en) * 2002-07-29 2007-01-03 Canon Kabushiki Kaisha Adjustment method and apparatus of optical system, and exposure apparatus
AU2003280878A1 (en) * 2002-11-16 2004-06-15 Lg Innotek Co., Ltd Light emitting device and fabrication method thereof
SG135934A1 (en) * 2002-12-20 2007-10-29 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
US7217940B2 (en) * 2003-04-08 2007-05-15 Cymer, Inc. Collector for EUV light source
US6992306B2 (en) * 2003-04-15 2006-01-31 Canon Kabushiki Kaisha Temperature adjustment apparatus, exposure apparatus having the same, and device fabricating method
JP4729661B2 (ja) * 2003-07-11 2011-07-20 奇美電子股▲ふん▼有限公司 ヒロックが無いアルミニウム層及びその形成方法
JP2005099587A (ja) * 2003-09-26 2005-04-14 Sanyo Electric Co Ltd 反射型光学部材及びその製造方法及び多灯式照明装置
US20050111007A1 (en) * 2003-09-26 2005-05-26 Zetetic Institute Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces
US6822251B1 (en) * 2003-11-10 2004-11-23 University Of Central Florida Research Foundation Monolithic silicon EUV collector
US7193228B2 (en) * 2004-03-10 2007-03-20 Cymer, Inc. EUV light source optical elements
US7087914B2 (en) * 2004-03-17 2006-08-08 Cymer, Inc High repetition rate laser produced plasma EUV light source
JP2006047384A (ja) * 2004-07-30 2006-02-16 Dainippon Printing Co Ltd 露光装置
FR2877104B1 (fr) * 2004-10-27 2006-12-29 Sagem Dispositif d'imagerie ou d'insolation, notamment pour la realisation d'un micro-circuit electronique
EP1808509A4 (en) * 2004-11-04 2009-11-04 Asahi Glass Co Ltd ION BEAM SPUTTER DEVICE AND METHOD FOR FORMING A MULTILAYER FILM FOR REFLECTING MASK ROLLS FOR EUV LITHOGRAPHY
US7136214B2 (en) * 2004-11-12 2006-11-14 Asml Holding N.V. Active faceted mirror system for lithography
JP2006173490A (ja) * 2004-12-17 2006-06-29 Nikon Corp 光学素子及びこれを用いた投影露光装置
JP2006170916A (ja) * 2004-12-17 2006-06-29 Nikon Corp 光学素子及びこれを用いた投影露光装置
DE102004062289B4 (de) * 2004-12-23 2007-07-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thermisch stabiler Multilayer-Spiegel für den EUV-Spektralbereich
CN101002305A (zh) * 2005-01-12 2007-07-18 株式会社尼康 激光等离子euv光源、靶材构件、胶带构件、靶材构件的制造方法、靶材的提供方法以及euv曝光装置
US7336416B2 (en) * 2005-04-27 2008-02-26 Asml Netherlands B.V. Spectral purity filter for multi-layer mirror, lithographic apparatus including such multi-layer mirror, method for enlarging the ratio of desired radiation and undesired radiation, and device manufacturing method
US7153892B2 (en) * 2005-05-12 2006-12-26 Ecology Coating, Inc. Environmentally friendly, actinic radiation curable coating compositions for coating thermoplastic olefin objects and methods, processes and assemblages for coating thereof
DE102005027697A1 (de) * 2005-06-15 2006-12-28 Infineon Technologies Ag EUV-Reflexionsmaske und Verfahren zu deren Herstellung
US7348193B2 (en) * 2005-06-30 2008-03-25 Corning Incorporated Hermetic seals for micro-electromechanical system devices
JP2007335444A (ja) * 2006-06-12 2007-12-27 Toshiba Corp 光学素子及び光学装置
US7960701B2 (en) * 2007-12-20 2011-06-14 Cymer, Inc. EUV light source components and methods for producing, using and refurbishing same
CN101946190B (zh) * 2008-02-15 2013-06-19 卡尔蔡司Smt有限责任公司 微光刻的投射曝光设备使用的分面镜
US8445876B2 (en) * 2008-10-24 2013-05-21 Gigaphoton Inc. Extreme ultraviolet light source apparatus
JP5946612B2 (ja) * 2010-10-08 2016-07-06 ギガフォトン株式会社 ミラー、ミラー装置、レーザ装置および極端紫外光生成装置

Also Published As

Publication number Publication date
US8598549B2 (en) 2013-12-03
KR20090040434A (ko) 2009-04-24
WO2008020965A3 (en) 2008-10-16
US20080043321A1 (en) 2008-02-21
TWI489155B (zh) 2015-06-21
US7843632B2 (en) 2010-11-30
WO2008020965A2 (en) 2008-02-21
JP2010500776A (ja) 2010-01-07
US8907310B2 (en) 2014-12-09
JP2013016872A (ja) 2013-01-24
KR20130119012A (ko) 2013-10-30
TW201213892A (en) 2012-04-01
US20110075253A1 (en) 2011-03-31
JP5667615B2 (ja) 2015-02-12
US20140176926A1 (en) 2014-06-26
TW200820526A (en) 2008-05-01

Similar Documents

Publication Publication Date Title
TWI367611B (en) Euv light source mirror and method for fabricating the same, euv light source mirror assembly and method for fabricating and aligning a light source collector mirror
EP1953805A4 (en) OPTICAL LIGHTING SYSTEM, EXPOSURE SYSTEM AND EXPOSURE METHOD
PT2235756T (pt) Óptica secundária reflectora e conjunto semicondutor, bem como procedimento para o seu fabrico
HK1125159A1 (en) Light box, light reflector for the same, and method for producing light reflector
EP2040099A4 (en) PHOTOCHROME FILM, PHOTOCHROME LENSES HAVING THE SAME, AND METHOD FOR MANUFACTURING A PHOTOCHROME LENS
EP2187177A4 (en) REFLECTOR PLATE FOR AN OPTICAL CODING DEVICE, METHOD FOR THE PRODUCTION THEREOF, AND OPTICAL CODING DEVICE
FI20085735A (fi) Menetelmä linssimoduulin valmistamiseksi ja menetelmällä valmistettu linssi
EP2113797A4 (en) OPTICAL ELEMENT, OPTICAL SYSTEM USING THE SAME, AND METHOD OF MANUFACTURING THE OPTICAL ELEMENT
EP1970943A4 (en) OPTICAL INTEGRATOR, OPTICAL LIGHTING DEVICE, ALIGNER, AND DEVICE MANUFACTURING METHOD
HK1112323A1 (en) A microelectronic cooling assembly, a method for fabricating the same, and a microelectronic cooling system
GB2438237B (en) Light emitting device and method for fabricating the same
EP2073755A4 (en) Intra-annular mounting frame for aortic valve repair
EP2157456A4 (en) LIGHT REFLECTIVE PLATE, PROCESS FOR THEIR MANUFACTURE AND LIGHT REFLECTING DEVICE
EP1899697A4 (en) EUV LIGHT SOURCE COLLECTOR-LIFE IMPROVEMENTS
EP1890172A4 (en) METHOD FOR FORMING ANTIREFLECTION FILM
EP2157468A4 (en) PIEZOELECTRIC MIRROR DEVICE, OPTICAL DEVICE USING PIEZOELECTRIC MIRROR DEVICE, AND METHOD FOR MANUFACTURING PIEZOELECTRIC MIRROR DEVICE
EP1843385A4 (en) OPTICAL PROJECTION SYSTEM, EXPOSURE SYSTEM AND EXPOSURE METHOD
GB2446693B (en) Optical element and method for manufacturing the same
EP2087510A4 (en) OPTICAL ELEMENT, ASSOCIATED EXPOSURE UNIT AND METHOD FOR PRODUCING THE DEVICE
EP1909119A4 (en) REFLECTIVE LINK, OPTICAL LINK, INTERFEROMETER SYSTEM, STAGE EQUIPMENT AND METHOD FOR MANUFACTURING COMPONENTS
TWI371622B (en) Optical film, light redirecting device and process for forming optical film
EP1921473A4 (en) OPTICAL WAVE CONDUCTIVE FILM AND METHOD FOR MANUFACTURING THE SAME, HYBRID OPTOELECTRIC FILM INCLUDING THE WAVE CONDUCTING FILM, AND ELECTRONIC DEVICE
EP2128681A4 (en) OPTICAL SCANNING MIRROR, SEMICONDUCTOR STRUCTURE, AND METHOD FOR MANUFACTURING SAME
EP1924874A4 (en) OPTICAL LENS SYSTEMS
EP2001042A4 (en) OPTICAL LIGHTING SYSTEM, EXPOSURE SYSTEM AND DEVICE MANUFACTURING METHOD

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees