TWI360195B - - Google Patents
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- Publication number
- TWI360195B TWI360195B TW096119595A TW96119595A TWI360195B TW I360195 B TWI360195 B TW I360195B TW 096119595 A TW096119595 A TW 096119595A TW 96119595 A TW96119595 A TW 96119595A TW I360195 B TWI360195 B TW I360195B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- valve
- state
- vacuum
- open state
- Prior art date
Links
- 239000000758 substrate Substances 0.000 claims description 115
- 238000001179 sorption measurement Methods 0.000 claims description 43
- 238000000576 coating method Methods 0.000 claims description 41
- 239000011248 coating agent Substances 0.000 claims description 34
- 238000010926 purge Methods 0.000 claims description 15
- 239000011521 glass Substances 0.000 claims description 11
- 230000008859 change Effects 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 230000007704 transition Effects 0.000 claims description 2
- 238000009826 distribution Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 10
- 238000000605 extraction Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000012546 transfer Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Coating Apparatus (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006227245A JP4771893B2 (ja) | 2006-08-24 | 2006-08-24 | 基板保持装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200816358A TW200816358A (en) | 2008-04-01 |
| TWI360195B true TWI360195B (enExample) | 2012-03-11 |
Family
ID=39129152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096119595A TW200816358A (en) | 2006-08-24 | 2007-05-31 | Board retainer |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4771893B2 (enExample) |
| KR (1) | KR100906554B1 (enExample) |
| CN (1) | CN100521144C (enExample) |
| TW (1) | TW200816358A (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5210060B2 (ja) * | 2008-07-02 | 2013-06-12 | 東京応化工業株式会社 | 剥離装置および剥離方法 |
| CN102179881A (zh) * | 2011-04-01 | 2011-09-14 | 石金精密科技(深圳)有限公司 | 平面薄板吸附固定系统 |
| CN102496595B (zh) * | 2011-11-25 | 2014-06-11 | 清华大学 | 晶圆托架、晶圆交换装置以及晶圆在位检测方法 |
| CN102496587B (zh) * | 2011-11-25 | 2014-06-11 | 清华大学 | 晶圆在位检测装置以及晶圆在位检测方法 |
| JP6057599B2 (ja) * | 2012-08-09 | 2017-01-11 | タツモ株式会社 | 吸着定盤及びその製造方法 |
| TW201509544A (zh) * | 2013-09-05 | 2015-03-16 | Rich Chen Automatically Controlled Co Ltd | 基板塗佈裝置及塗佈方法 |
| CN106853432B (zh) * | 2016-11-24 | 2019-04-16 | 重庆市永川区锐峰玻璃制品有限公司 | 旋转涂胶台 |
| CN110124908B (zh) * | 2019-06-21 | 2021-09-07 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 晶片真空吸附装置 |
| CN111132539A (zh) * | 2020-01-17 | 2020-05-08 | 安徽博微长安电子有限公司 | 一种手动点胶贴片机无损贴装凝胶盒中芯片的工装及方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2880264B2 (ja) * | 1990-07-12 | 1999-04-05 | キヤノン株式会社 | 基板保持装置 |
| JPH08125000A (ja) * | 1994-10-24 | 1996-05-17 | Nec Kyushu Ltd | ウェーハチャック |
| JPH0927541A (ja) * | 1995-07-10 | 1997-01-28 | Nikon Corp | 基板ホルダ |
| JPH0945755A (ja) * | 1995-07-26 | 1997-02-14 | Hitachi Ltd | ウェハチャックおよびウェハ吸着方法 |
| JP2003023060A (ja) * | 2001-07-10 | 2003-01-24 | Shimadzu Corp | 吊り下げ型基板保持装置および液晶パネル製造装置 |
-
2006
- 2006-08-24 JP JP2006227245A patent/JP4771893B2/ja active Active
-
2007
- 2007-05-31 TW TW096119595A patent/TW200816358A/zh unknown
- 2007-08-17 CN CNB2007101452754A patent/CN100521144C/zh active Active
- 2007-08-20 KR KR1020070083176A patent/KR100906554B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080018808A (ko) | 2008-02-28 |
| JP4771893B2 (ja) | 2011-09-14 |
| TW200816358A (en) | 2008-04-01 |
| CN100521144C (zh) | 2009-07-29 |
| KR100906554B1 (ko) | 2009-07-07 |
| CN101131954A (zh) | 2008-02-27 |
| JP2008053391A (ja) | 2008-03-06 |
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