TWI350377B - Wide bandwidth attenuator input circuit for a measurement probe - Google Patents

Wide bandwidth attenuator input circuit for a measurement probe

Info

Publication number
TWI350377B
TWI350377B TW094117677A TW94117677A TWI350377B TW I350377 B TWI350377 B TW I350377B TW 094117677 A TW094117677 A TW 094117677A TW 94117677 A TW94117677 A TW 94117677A TW I350377 B TWI350377 B TW I350377B
Authority
TW
Taiwan
Prior art keywords
input circuit
measurement probe
wide bandwidth
attenuator input
bandwidth attenuator
Prior art date
Application number
TW094117677A
Other languages
English (en)
Other versions
TW200600794A (en
Inventor
Ira G Pollock
William A Hagerup
Paul G Chastain
William Q Law
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of TW200600794A publication Critical patent/TW200600794A/zh
Application granted granted Critical
Publication of TWI350377B publication Critical patent/TWI350377B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/24—Frequency- independent attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00—Networks using active elements
    • H03H11/02—Multiple-port networks
    • H03H11/24—Frequency-independent attenuators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Networks Using Active Elements (AREA)
  • Measuring Leads Or Probes (AREA)
TW094117677A 2004-06-01 2005-05-30 Wide bandwidth attenuator input circuit for a measurement probe TWI350377B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US57598004P 2004-06-01 2004-06-01
US11/123,752 US7256575B2 (en) 2004-06-01 2005-05-06 Wide bandwidth attenuator input circuit for a measurement probe

Publications (2)

Publication Number Publication Date
TW200600794A TW200600794A (en) 2006-01-01
TWI350377B true TWI350377B (en) 2011-10-11

Family

ID=35809984

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094117677A TWI350377B (en) 2004-06-01 2005-05-30 Wide bandwidth attenuator input circuit for a measurement probe

Country Status (6)

Country Link
US (3) US7256575B2 (zh)
EP (2) EP1605588B1 (zh)
JP (2) JP4804800B2 (zh)
KR (1) KR101129656B1 (zh)
CN (2) CN1715933B (zh)
TW (1) TWI350377B (zh)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7256575B2 (en) * 2004-06-01 2007-08-14 Tektronix, Inc. Wide bandwidth attenuator input circuit for a measurement probe
ATE412888T1 (de) * 2005-07-14 2008-11-15 Mettler Toledo Ag Signalübertragungsvorrichtung für eine messsonde sowie übertragungsverfahren
US7282935B2 (en) * 2006-01-24 2007-10-16 Agilent Technologies, Inc. Regenerator probe
DE102006017973B4 (de) 2006-04-13 2014-05-28 Atmel Corp. Direkt modulierender Frequenzmodulator
JP4910520B2 (ja) * 2006-07-07 2012-04-04 横河電機株式会社 アクティブプローブ
KR100695064B1 (ko) * 2006-09-11 2007-03-14 주식회사 아나패스 수동 공통 모드 피드백 회로를 가지는 차동 신호 회로
DE102007027155A1 (de) * 2007-04-03 2008-10-23 Rohde & Schwarz Gmbh & Co. Kg Wellenleiter-System mit differenziellem Wellenleiter
JP4936125B2 (ja) * 2007-04-12 2012-05-23 横河電機株式会社 プローブ
JP5007937B2 (ja) * 2007-04-25 2012-08-22 横河電機株式会社 減衰器
JP2009031223A (ja) * 2007-07-30 2009-02-12 Institute Of Physical & Chemical Research 補償回路、プローブ装置、プローブ装置キット
US8164336B1 (en) * 2007-11-10 2012-04-24 Murphree Jr Dennis Haaga Transmission line probe for NMR
EP2068156B1 (de) 2007-12-04 2018-05-30 Rohde & Schwarz GmbH & Co. KG Tastkopf mit Wellenleiter mit konzentrierter Dämpfung
DE102008009961A1 (de) 2007-12-04 2009-06-10 Rohde & Schwarz Gmbh & Co Kg Tastkopf mit Wellenleiter mit konzentrierter Dämpfung
US20100278226A1 (en) * 2009-05-04 2010-11-04 Advantest Corporation Transmission circuit, differential signal transmission circuit, and test apparatus
CN102053177B (zh) * 2009-11-10 2014-12-10 北京普源精电科技有限公司 一种有源差分电压探头
DE102010035456A1 (de) * 2010-02-19 2011-08-25 Rohde & Schwarz GmbH & Co. KG, 81671 Tastkopf-System mit Kompensationsnetzwerk
CN101949961B (zh) * 2010-08-16 2012-09-12 南京国博电子有限公司 射频测试用直流偏置探针卡
CN103185818B (zh) * 2011-12-29 2017-03-29 北京普源精电科技有限公司 一种具有超低输入电容的有源差分探头
GB201201992D0 (en) * 2012-02-03 2012-03-21 Power Electronic Measurements Ltd Temperature compensated current measurement
US20150038096A1 (en) * 2012-02-29 2015-02-05 Micreo Limited Electronic gain shaper and a method for storing parameters
CN103364599B (zh) * 2012-03-29 2017-12-22 北京普源精电科技有限公司 具有衰减功能的探头、信号采集系统和方法
US9374078B2 (en) * 2012-06-30 2016-06-21 Integrated Device Technology Inc. Multi-bit cell attenuator
CN102735887B (zh) * 2012-07-16 2014-08-27 电子科技大学 一种数字示波器单端有源探头电路
WO2014027991A1 (en) * 2012-08-13 2014-02-20 Hewlett-Packard Development Company, L.P. Trans-impedance amplifiers (tia) thermally isolated from optical modules
KR101726965B1 (ko) * 2012-12-17 2017-04-13 주식회사 아도반테스토 Rf 프로브
US20140285180A1 (en) * 2013-03-25 2014-09-25 National Instruments Corporation Circuit to Compensate for Inaccuracies in Current Transformers
RU2535180C1 (ru) * 2013-06-18 2014-12-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Южно-Российский государственный университет экономики и сервиса" (ФГБОУ ВПО "ЮРГУЭС") Дифференциальный аттенюатор с расширенным диапазоном рабочих частот
US9316669B2 (en) * 2013-06-28 2016-04-19 Keysight Technologies, Inc. Measurement probe providing different levels of amplification for signals of different magnitude
CN104901649B (zh) * 2015-06-11 2017-08-25 北京楚捷科技有限公司 一种微惯性测量信号的多功能冗余滤波电路
US9673773B2 (en) 2015-06-23 2017-06-06 Qualcomm Incorporated Signal interconnect with high pass filter
CN107782942B (zh) * 2016-08-31 2021-03-02 北京普源精电科技有限公司 示波器测量电路及其有源前端、测试系统、测量方法
JP2018066689A (ja) * 2016-10-21 2018-04-26 横河電機株式会社 絶縁測定フローティング側システム
EP3563460B1 (en) * 2016-12-30 2021-08-11 Tubitak Frequency adaptive harmonic current generator
CN108333393B (zh) * 2017-01-20 2021-12-24 罗德施瓦兹两合股份有限公司 探针和校正方法
US11300588B2 (en) * 2017-04-21 2022-04-12 Rohde & Schwarz Gmbh & Co. Kg Adapter for a current probe and testing system
US10585118B2 (en) * 2017-05-10 2020-03-10 Tektronix, Inc. Wide range compensation of low frequency response passive probe
US9966908B1 (en) * 2017-06-02 2018-05-08 Xilinx, Inc. Circuit for and method of implementing a differential input receiver
US11287447B2 (en) 2017-06-26 2022-03-29 Rohde & Schwarz Gmbh & Co. Kg Measurement input circuit and measurement device
US11079407B2 (en) * 2017-07-10 2021-08-03 Tektronix, Inc. Probe attenuator for reduced input capacitance
CN107703357B (zh) * 2017-10-27 2019-12-24 深圳市鼎阳科技有限公司 台式万用表的档位校准方法、装置及其前级衰减电路
US10908183B2 (en) * 2017-11-06 2021-02-02 National Instruments Corporation Active probe powered through driven coax cable
TWI750571B (zh) * 2020-01-30 2021-12-21 財團法人國家實驗研究院 偵測電磁干擾之主動式量測探棒
TWI749462B (zh) * 2020-02-11 2021-12-11 創意電子股份有限公司 電壓模式信號收發裝置以及其電壓模式信號發射器
CN111708037B (zh) * 2020-06-24 2023-08-25 清华大学 基于可调谐带通滤光片的无源测头及双光梳测量系统
CN111965410A (zh) * 2020-08-25 2020-11-20 深圳市知用电子有限公司 一种衰减器及差分电压探头
CN112630493A (zh) * 2020-12-29 2021-04-09 北京无线电计量测试研究所 一种宽频分流器
CN115473501B (zh) * 2022-11-15 2023-03-28 上海阿米芯光半导体有限责任公司 跨阻放大器的调控电路及降低杂散电感对电路影响的方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3256484A (en) 1962-09-10 1966-06-14 Tektronix Inc High voltage test probe containing a part gas, part liquid dielectric fluid under pressure and having a transparent housing section for viewing the presence of the liquid therein
US4551636A (en) * 1983-05-25 1985-11-05 Tektronix, Inc. Wide bandwidth signal coupling circuit having a variable voltage-level shift from input to output
JPS6126313A (ja) * 1984-07-16 1986-02-05 Matsushita Electric Ind Co Ltd 広帯域直流増幅回路
US4743839A (en) * 1984-09-07 1988-05-10 Hewlett Packard Company Wide bandwidth probe using pole-zero cancellation
DE3785942T2 (de) * 1986-01-10 1993-11-18 Hitachi Ltd Verstärkeranordnung für ein aktives Filter.
CN2044349U (zh) * 1988-12-15 1989-09-13 中国科学院半导体研究所 高稳定离子或生物检测装置
US4968901A (en) * 1989-05-16 1990-11-06 Burr-Brown Corporation Integrated circuit high frequency input attenuator circuit
JPH0797009B2 (ja) * 1989-12-29 1995-10-18 株式会社荏原製作所 インダクタンス形変位センサ
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
US5256974A (en) * 1991-06-27 1993-10-26 Iomega Corporation Method and apparatus for a floating reference electric field sensor
US5512838A (en) * 1992-09-03 1996-04-30 Hewlett-Packard Company Probe with reduced input capacitance
JPH06331657A (ja) * 1993-05-19 1994-12-02 Yokogawa Electric Corp プローブ
KR100396629B1 (ko) * 1995-01-12 2003-12-01 타케시 이케다 동조회로
JPH11258273A (ja) * 1998-03-09 1999-09-24 Iwatsu Electric Co Ltd 高圧プローブ用減衰器
US6172505B1 (en) * 1998-04-27 2001-01-09 Midtronics, Inc. Electronic battery tester
US6175228B1 (en) * 1998-10-30 2001-01-16 Agilent Technologies Electronic probe for measuring high impedance tri-state logic circuits
CN1128360C (zh) * 1999-01-06 2003-11-19 时代集团公司 超声测量中串扰噪声抑制方法
US6411108B1 (en) * 1999-11-05 2002-06-25 Sensor Technologies, Inc. Noncontact signal analyzer
US6373348B1 (en) * 2000-08-11 2002-04-16 Tektronix, Inc. High speed differential attenuator using a low temperature co-fired ceramic substrate
US6483284B1 (en) * 2001-06-20 2002-11-19 Agilent Technologies, Inc. Wide-bandwidth probe using pole-zero cancellation
US6822463B1 (en) * 2001-12-21 2004-11-23 Lecroy Corporation Active differential test probe with a transmission line input structure
US6841987B2 (en) * 2002-06-19 2005-01-11 Agilent Technologies, Inc. High speed measurement system which selects optimal measurement range on a sample by sample basis
US6856126B2 (en) * 2003-01-21 2005-02-15 Agilent Technologies, Inc. Differential voltage probe
EP1447670A1 (en) * 2003-02-12 2004-08-18 Dialog Semiconductor GmbH Sensor read out
US7256575B2 (en) * 2004-06-01 2007-08-14 Tektronix, Inc. Wide bandwidth attenuator input circuit for a measurement probe

Also Published As

Publication number Publication date
TW200600794A (en) 2006-01-01
US7256575B2 (en) 2007-08-14
EP1605588B1 (en) 2012-08-22
KR101129656B1 (ko) 2012-03-28
EP2273677B1 (en) 2014-01-08
US7402991B2 (en) 2008-07-22
JP5113822B2 (ja) 2013-01-09
US20060284681A1 (en) 2006-12-21
US20070164731A1 (en) 2007-07-19
CN101750522B (zh) 2012-10-10
EP2273677A3 (en) 2011-11-09
EP1605588A3 (en) 2006-11-29
US20070164730A1 (en) 2007-07-19
JP2010025954A (ja) 2010-02-04
CN1715933A (zh) 2006-01-04
CN101750522A (zh) 2010-06-23
CN1715933B (zh) 2010-06-23
JP4804800B2 (ja) 2011-11-02
US7550962B2 (en) 2009-06-23
JP2005345469A (ja) 2005-12-15
EP1605588A2 (en) 2005-12-14
KR20060092804A (ko) 2006-08-23
EP2273677A2 (en) 2011-01-12

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees