TWI349812B - - Google Patents
Info
- Publication number
- TWI349812B TWI349812B TW099129094A TW99129094A TWI349812B TW I349812 B TWI349812 B TW I349812B TW 099129094 A TW099129094 A TW 099129094A TW 99129094 A TW99129094 A TW 99129094A TW I349812 B TWI349812 B TW I349812B
- Authority
- TW
- Taiwan
Links
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133528—Polarisers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
- Y10T156/1056—Perforating lamina
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
- Y10T156/1056—Perforating lamina
- Y10T156/1057—Subsequent to assembly of laminae
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009236091A JP4503692B1 (ja) | 2009-10-13 | 2009-10-13 | 液晶表示素子を連続製造する装置において用いられる情報格納読出演算システム及び情報格納読出演算システムの製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201113601A TW201113601A (en) | 2011-04-16 |
TWI349812B true TWI349812B (zh) | 2011-10-01 |
Family
ID=42575707
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW099129094A TW201113601A (en) | 2009-10-13 | 2010-08-30 | Information storing, readout and calculation system for use in a system for continuously manufacturing liquid-crystal display elements, and methods for producing the same |
Country Status (6)
Country | Link |
---|---|
US (1) | US8016965B2 (zh) |
EP (2) | EP2631710A1 (zh) |
JP (1) | JP4503692B1 (zh) |
KR (1) | KR101019618B1 (zh) |
CN (1) | CN102043277B (zh) |
TW (1) | TW201113601A (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101179071B1 (ko) | 2009-03-10 | 2012-09-03 | 주식회사 엘지화학 | 사각형 단위체의 제조방법 |
CN102947923B (zh) * | 2010-06-02 | 2015-11-25 | 库卡系统有限责任公司 | 制造装置和方法 |
JP5478553B2 (ja) * | 2010-09-03 | 2014-04-23 | 日東電工株式会社 | 連続ウェブ状光学フィルム積層体ロール及びその製造方法 |
JP5502023B2 (ja) * | 2010-09-03 | 2014-05-28 | 日東電工株式会社 | 偏光膜を有する光学フィルム積層体ロールの製造方法 |
JP5361941B2 (ja) * | 2010-09-03 | 2013-12-04 | 日東電工株式会社 | 偏光膜を有する積層体ストリップロールの製造方法 |
JP5474869B2 (ja) * | 2010-09-03 | 2014-04-16 | 日東電工株式会社 | 偏光膜を有する積層体ストリップロールの製造方法 |
JP5511730B2 (ja) | 2010-09-03 | 2014-06-04 | 日東電工株式会社 | 光学的パネル組立体の連続的製造方法及び装置 |
KR20120036446A (ko) * | 2010-10-08 | 2012-04-18 | 삼성전자주식회사 | 보드 온 칩 패키지용 인쇄회로기판, 이를 포함하는 보드 온 칩 패키지 및 이의 제조 방법 |
JP5429837B2 (ja) * | 2011-11-30 | 2014-02-26 | 住友化学株式会社 | 光学表示デバイスの生産システム及び生産方法 |
KR102023581B1 (ko) * | 2012-11-23 | 2019-09-24 | 해성디에스 주식회사 | 릴-투-릴 검사장치 및 릴-투-릴 검사방법 |
DE102013108308A1 (de) * | 2013-08-01 | 2015-02-19 | Schott Ag | Verfahren und Vorrichtung zur Detektion in Bandrollen aus sprödhartem oder sprödbrechendem, zumindest teiltransparentem Material, sowie deren Verwendung |
KR101561970B1 (ko) | 2013-11-04 | 2015-10-20 | 주식회사 엘지화학 | 라미네이션 장치 |
CN105080855B (zh) * | 2015-06-03 | 2017-08-25 | 合肥京东方光电科技有限公司 | 基板标记检测装置和基板标记检测方法 |
KR102432335B1 (ko) * | 2015-08-18 | 2022-08-16 | 엘지전자 주식회사 | 패널 필름 부착 시스템 |
CN107924013B (zh) | 2015-08-21 | 2019-08-16 | 3M创新有限公司 | 具有光轴的光学膜及用于处理光学膜的系统和方法 |
US20170284943A1 (en) * | 2016-03-29 | 2017-10-05 | Nilanjan Ghosh | Detecting voids and delamination in photoresist layer |
JP7433827B2 (ja) * | 2018-10-18 | 2024-02-20 | 日東電工株式会社 | データ取得方法および信号計測システム |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5752017A (en) * | 1980-08-08 | 1982-03-27 | Sharp Corp | Tacky-polarizing-plate defective removing device automatic tacky-polarizing-plate sticking machine |
JP3616866B2 (ja) | 1997-09-19 | 2005-02-02 | 住友化学株式会社 | 光学フィルム貼合基板の製造方法 |
JP2002023151A (ja) | 2000-07-12 | 2002-01-23 | Toshiba Corp | 偏光板を備える液晶表示装置の製造方法及び製造装置 |
KR100400399B1 (ko) * | 2001-11-23 | 2003-10-01 | 주식회사 엘지이아이 | 무전극 조명기기의 전등장치 |
US7202923B2 (en) | 2001-11-27 | 2007-04-10 | Sharp Kabushiki Kaisha | Liquid crystal display with polarizer with inclined edge portion |
KR100563896B1 (ko) | 2001-11-27 | 2006-03-27 | 샤프 가부시키가이샤 | 액정 패널, 액정 패널 제조 방법, 액정 패널 제조 장치 및 편광판 부착 장치 |
JP2003161935A (ja) | 2001-11-27 | 2003-06-06 | Sharp Corp | 偏光板貼付装置 |
JP3974400B2 (ja) * | 2002-01-07 | 2007-09-12 | 日東電工株式会社 | シート状成形体の検査結果記録方法及び検査結果記録システム及びロール状成形体 |
JP2003344302A (ja) * | 2002-05-31 | 2003-12-03 | Sumitomo Chem Co Ltd | 偏光フィルムの検査法および検査装置 |
KR20040002796A (ko) * | 2002-06-28 | 2004-01-07 | 후지 샤신 필름 가부시기가이샤 | 편광판 점착방법 및 그 장치 |
JP2004144913A (ja) | 2002-10-23 | 2004-05-20 | Yodogawa Medekku Kk | 偏光板貼付装置 |
JP4340788B2 (ja) | 2003-04-22 | 2009-10-07 | シャープ株式会社 | 基板への偏光板貼付装置 |
JP4371709B2 (ja) | 2003-06-05 | 2009-11-25 | 富士フイルム株式会社 | 光学フィルム貼付装置及び方法 |
JP2005062165A (ja) * | 2003-07-28 | 2005-03-10 | Nitto Denko Corp | シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置 |
JP2005114624A (ja) * | 2003-10-09 | 2005-04-28 | Nitto Denko Corp | シート状製品の検査方法及びシート状製品の検査システム及びシート状製品及び枚葉物 |
JP4255433B2 (ja) | 2004-03-15 | 2009-04-15 | 日東電工株式会社 | 枚葉体の貼合せ方法およびこれを用いた装置 |
CN100454053C (zh) * | 2004-04-19 | 2009-01-21 | 柯尼卡美能达精密光学株式会社 | 卷筒状相位差膜的制造方法、相位差膜、偏振片及显示装置 |
JP2006058411A (ja) | 2004-08-18 | 2006-03-02 | Takatori Corp | 液晶パネルへの偏光板貼り付け方法及び装置 |
KR100734749B1 (ko) | 2005-03-31 | 2007-07-03 | 에버테크노 주식회사 | 편광필름 검사장치 및 방법 |
JP4775948B2 (ja) * | 2005-11-17 | 2011-09-21 | 日東電工株式会社 | 光学表示装置の製造システム及びその製造方法 |
JP4140736B2 (ja) * | 2006-03-15 | 2008-08-27 | 日東電工株式会社 | 粘着型光学フィルム、積層光学フィルムおよび画像表示装置 |
JP4361103B2 (ja) | 2006-10-17 | 2009-11-11 | 日東電工株式会社 | 光学部材貼合せ方法およびそれを用いた装置 |
JP4514059B2 (ja) | 2006-12-11 | 2010-07-28 | 日東電工株式会社 | シート状成形体の検査結果記録方法及び検査結果記録システム |
JP2008028426A (ja) * | 2007-10-15 | 2008-02-07 | Renesas Technology Corp | 半導体装置の製造方法 |
WO2009066604A1 (ja) * | 2007-11-19 | 2009-05-28 | Nitto Denko Corporation | 連結シート製品の製造方法、連結シート製品および光学表示ユニットの製造方法 |
JP4737569B2 (ja) * | 2008-01-29 | 2011-08-03 | 日東電工株式会社 | 光学表示ユニットの製造方法および光学表示ユニットの製造システム |
JP2009244064A (ja) * | 2008-03-31 | 2009-10-22 | Sumitomo Chemical Co Ltd | 偏光フィルムの検査方法 |
WO2009128115A1 (ja) * | 2008-04-15 | 2009-10-22 | 日東電工株式会社 | 光学フィルム積層体ロールならびにその製造方法および装置 |
-
2009
- 2009-10-13 JP JP2009236091A patent/JP4503692B1/ja active Active
-
2010
- 2010-06-03 KR KR1020100052549A patent/KR101019618B1/ko active IP Right Grant
- 2010-07-09 CN CN2010102294410A patent/CN102043277B/zh active Active
- 2010-08-30 TW TW099129094A patent/TW201113601A/zh unknown
- 2010-10-04 EP EP13168475.5A patent/EP2631710A1/en not_active Withdrawn
- 2010-10-04 EP EP10186442A patent/EP2312382A1/en not_active Ceased
- 2010-10-13 US US12/903,937 patent/US8016965B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR101019618B1 (ko) | 2011-03-07 |
EP2631710A1 (en) | 2013-08-28 |
US8016965B2 (en) | 2011-09-13 |
CN102043277B (zh) | 2013-04-10 |
US20110083791A1 (en) | 2011-04-14 |
CN102043277A (zh) | 2011-05-04 |
TW201113601A (en) | 2011-04-16 |
JP4503692B1 (ja) | 2010-07-14 |
JP2011085631A (ja) | 2011-04-28 |
EP2312382A1 (en) | 2011-04-20 |