TWI346961B - Coaxil cable, double twisted cable, coaxil cable unit, test device and cpu system - Google Patents

Coaxil cable, double twisted cable, coaxil cable unit, test device and cpu system

Info

Publication number
TWI346961B
TWI346961B TW093139323A TW93139323A TWI346961B TW I346961 B TWI346961 B TW I346961B TW 093139323 A TW093139323 A TW 093139323A TW 93139323 A TW93139323 A TW 93139323A TW I346961 B TWI346961 B TW I346961B
Authority
TW
Taiwan
Prior art keywords
cable
coaxil
test device
cpu system
double twisted
Prior art date
Application number
TW093139323A
Other languages
English (en)
Other versions
TW200535870A (en
Inventor
Hironori Tanaka
Kunihiro Katsuura
Satoshi Kodera
Hiroki Ando
Yasuhiro Urabe
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200535870A publication Critical patent/TW200535870A/zh
Application granted granted Critical
Publication of TWI346961B publication Critical patent/TWI346961B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Communication Cables (AREA)
TW093139323A 2003-12-17 2004-12-17 Coaxil cable, double twisted cable, coaxil cable unit, test device and cpu system TWI346961B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/738,617 US7098647B2 (en) 2003-12-17 2003-12-17 Coaxial cable unit, test apparatus, and CPU system

Publications (2)

Publication Number Publication Date
TW200535870A TW200535870A (en) 2005-11-01
TWI346961B true TWI346961B (en) 2011-08-11

Family

ID=34677419

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093139323A TWI346961B (en) 2003-12-17 2004-12-17 Coaxil cable, double twisted cable, coaxil cable unit, test device and cpu system

Country Status (4)

Country Link
US (1) US7098647B2 (zh)
JP (1) JP4465320B2 (zh)
TW (1) TWI346961B (zh)
WO (1) WO2005059926A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7388366B2 (en) * 2006-02-03 2008-06-17 Keithley Instruments, Inc. Test system connection system with triaxial cables
CA2664571C (en) * 2008-05-06 2013-10-01 Guildline Instruments Limited Precision ac current measurement shunts
US8410804B1 (en) * 2009-02-24 2013-04-02 Keithley Instruments, Inc. Measurement system with high frequency ground switch
TW201326848A (zh) * 2011-12-21 2013-07-01 Inventec Corp 輔助測試裝置
JP2014173999A (ja) * 2013-03-08 2014-09-22 Mitsubishi Electric Corp 測定装置
US9983228B2 (en) 2014-09-24 2018-05-29 Keithley Instruments, Llc Triaxial DC-AC connection system
JP6699378B2 (ja) * 2016-06-14 2020-05-27 Tdk株式会社 コイル部品
TWI659219B (zh) * 2018-06-13 2019-05-11 中原大學 具市電與環境雜訊屏蔽之電纜量測裝置及其方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1860052A (en) * 1928-12-08 1932-05-24 Rca Corp Transmission line
JPS5675032A (en) 1979-11-26 1981-06-20 Hideaki Nishi Japanese cedar bark ball for horticulture
JPH0119103Y2 (zh) * 1981-05-23 1989-06-02
JPS6229013A (ja) 1985-07-31 1987-02-07 オ−デイオエンジニアリング株式会社 多層同軸ケ−ブル
JP2873376B2 (ja) 1989-04-25 1999-03-24 株式会社ソディック 電 線
JPH0559354A (ja) 1991-09-02 1993-03-09 Sekisui Chem Co Ltd エレクトロクロミツク素子
JPH0559354U (ja) * 1992-01-28 1993-08-06 株式会社アドバンテスト Ｉｃ試験装置
JPH07218598A (ja) 1994-02-03 1995-08-18 Advantest Corp Ｉｃテスタ用発振検出回路
JPH09180550A (ja) 1995-12-26 1997-07-11 Sumitomo Wiring Syst Ltd 電線の配置方法及びケーブル
US5652558A (en) * 1996-04-10 1997-07-29 The Narda Microwave Corporation Double pole double throw RF switch
JP2000097994A (ja) 1998-09-18 2000-04-07 Advantest Corp 半導体試験装置
JP2003031044A (ja) 2001-07-13 2003-01-31 Yazaki Corp フラット回路体
JP2003130919A (ja) 2001-10-25 2003-05-08 Agilent Technologies Japan Ltd コネクションボックス及びｄｕｔボード評価システム及びその評価方法

Also Published As

Publication number Publication date
JPWO2005059926A1 (ja) 2007-12-13
JP4465320B2 (ja) 2010-05-19
US7098647B2 (en) 2006-08-29
WO2005059926A1 (ja) 2005-06-30
US20050134255A1 (en) 2005-06-23
TW200535870A (en) 2005-11-01

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