TWI344595B - Method and structure to develop a test program for semiconductor integrated circuits - Google Patents
Method and structure to develop a test program for semiconductor integrated circuits Download PDFInfo
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- TWI344595B TWI344595B TW093103547A TW93103547A TWI344595B TW I344595 B TWI344595 B TW I344595B TW 093103547 A TW093103547 A TW 093103547A TW 93103547 A TW93103547 A TW 93103547A TW I344595 B TWI344595 B TW I344595B
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US44783903P | 2003-02-14 | 2003-02-14 | |
| US44962203P | 2003-02-24 | 2003-02-24 | |
| US10/403,817 US7290192B2 (en) | 2003-03-31 | 2003-03-31 | Test apparatus and test method for testing plurality of devices in parallel |
| US10/404,002 US7460988B2 (en) | 2003-03-31 | 2003-03-31 | Test emulator, test module emulator, and record medium storing program therein |
| US10/772,434 US20040225459A1 (en) | 2003-02-14 | 2004-02-06 | Method and structure to develop a test program for semiconductor integrated circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200508855A TW200508855A (en) | 2005-03-01 |
| TWI344595B true TWI344595B (en) | 2011-07-01 |
Family
ID=32872965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093103547A TWI344595B (en) | 2003-02-14 | 2004-02-13 | Method and structure to develop a test program for semiconductor integrated circuits |
Country Status (8)
| Country | Link |
|---|---|
| EP (2) | EP1592975B1 (enExample) |
| JP (3) | JP3939336B2 (enExample) |
| KR (2) | KR20050099626A (enExample) |
| CN (1) | CN1784609B (enExample) |
| AT (1) | ATE384269T1 (enExample) |
| DE (1) | DE602004011320T2 (enExample) |
| TW (1) | TWI344595B (enExample) |
| WO (2) | WO2004072669A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI793909B (zh) * | 2021-04-12 | 2023-02-21 | 南亞科技股份有限公司 | 半導體測試系統及方法 |
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| US7184917B2 (en) | 2003-02-14 | 2007-02-27 | Advantest America R&D Center, Inc. | Method and system for controlling interchangeable components in a modular test system |
| US7437261B2 (en) | 2003-02-14 | 2008-10-14 | Advantest Corporation | Method and apparatus for testing integrated circuits |
| US7197417B2 (en) * | 2003-02-14 | 2007-03-27 | Advantest America R&D Center, Inc. | Method and structure to develop a test program for semiconductor integrated circuits |
| US7210087B2 (en) | 2004-05-22 | 2007-04-24 | Advantest America R&D Center, Inc. | Method and system for simulating a modular test system |
| US7197416B2 (en) | 2004-05-22 | 2007-03-27 | Advantest America R&D Center, Inc. | Supporting calibration and diagnostics in an open architecture test system |
| US7430486B2 (en) * | 2004-05-22 | 2008-09-30 | Advantest America R&D Center, Inc. | Datalog support in a modular test system |
| US7543200B2 (en) | 2005-02-17 | 2009-06-02 | Advantest Corporation | Method and system for scheduling tests in a parallel test system |
| US8214800B2 (en) * | 2005-03-02 | 2012-07-03 | Advantest Corporation | Compact representation of vendor hardware module revisions in an open architecture test system |
| JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
| US7253607B2 (en) * | 2005-04-29 | 2007-08-07 | Teradyne, Inc. | Site-aware objects |
| DE602005002131T2 (de) | 2005-05-20 | 2008-05-15 | Verigy (Singapore) Pte. Ltd. | Prüfvorrichtung mit Anpassung des Prüfparameters |
| US7788562B2 (en) * | 2006-11-29 | 2010-08-31 | Advantest Corporation | Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data |
| JP5022262B2 (ja) * | 2008-02-12 | 2012-09-12 | 株式会社アドバンテスト | デバッグ中にツールを使用可能な試験システム及び方法 |
| US8949784B2 (en) | 2008-10-03 | 2015-02-03 | Microsoft Technology Licensing, Llc | Type system for declarative data scripting language |
| US8692566B2 (en) | 2008-12-08 | 2014-04-08 | Advantest Corporation | Test apparatus and test method |
| US8405415B2 (en) | 2009-09-10 | 2013-03-26 | Advantest Corporation | Test apparatus synchronous module and synchronous method |
| US8261119B2 (en) | 2009-09-10 | 2012-09-04 | Advantest Corporation | Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module |
| US7906981B1 (en) | 2009-09-10 | 2011-03-15 | Advantest Corporation | Test apparatus and test method |
| CN102193553A (zh) * | 2010-03-02 | 2011-09-21 | 珠海格力电器股份有限公司 | 空调控制器功能的测试方法、装置及系统 |
| TWI470421B (zh) * | 2010-03-16 | 2015-01-21 | Via Tech Inc | 微處理器及其除錯方法 |
| US8868371B2 (en) * | 2011-09-09 | 2014-10-21 | Infineon Technologies Ag | Method and device for determining test sets of operating parameter values for an electronic component |
| US9400307B2 (en) | 2013-03-13 | 2016-07-26 | Keysight Technologies, Inc. | Test system for improving throughout or maintenance properties of semiconductor testing |
| CN104144084B (zh) * | 2013-05-10 | 2017-12-01 | 腾讯科技（深圳）有限公司 | 终端状态的监控方法及装置 |
| CN104298590B (zh) * | 2013-07-16 | 2019-05-10 | 爱德万测试公司 | 用于按管脚apg的快速语义处理器 |
| US10539609B2 (en) * | 2014-12-08 | 2020-01-21 | Nxp Usa, Inc. | Method of converting high-level test specification language to low-level test implementation language |
| KR20180084385A (ko) | 2017-01-17 | 2018-07-25 | 한국항공우주산업 주식회사 | 데이터베이스 기반의 자동시험장비의 운용 시스템 및 그 운용 방법 |
| US10592370B2 (en) * | 2017-04-28 | 2020-03-17 | Advantest Corporation | User control of automated test features with software application programming interface (API) |
| US10890621B2 (en) * | 2017-05-30 | 2021-01-12 | Raytheon Company | Systems and methods for testing an embedded controller |
| KR102179508B1 (ko) | 2019-07-05 | 2020-11-16 | 한국항공우주산업 주식회사 | 자동화 시험장비의 운용 시스템 |
| TWI748300B (zh) * | 2019-12-09 | 2021-12-01 | 新唐科技股份有限公司 | 測試系統和測試方法 |
| CN111459840A (zh) * | 2020-04-26 | 2020-07-28 | 恩亿科(北京)数据科技有限公司 | 一种进程的调试方法及装置 |
| CN112311627B (zh) * | 2020-10-29 | 2022-09-09 | 许昌许继软件技术有限公司 | 一种基于xml格式的规约描述文件的电力规约通用测试方法及系统 |
| CN113051114A (zh) * | 2021-03-19 | 2021-06-29 | 无锡市软测认证有限公司 | 一种用于提高芯片测试效率的方法 |
| KR102314419B1 (ko) * | 2021-07-27 | 2021-10-19 | (주) 에이블리 | 반도체 테스트 패턴 발생 장치 및 방법 |
| CN114818669B (zh) * | 2022-04-26 | 2023-06-27 | 北京中科智加科技有限公司 | 一种人名纠错模型的构建方法和计算机设备 |
| KR102790875B1 (ko) * | 2022-06-27 | 2025-04-04 | 주식회사 와이씨 | 반도체 디바이스 할당 정보에 따른 전원 공급 제어를 위한 반도체 디바이스 테스트 장치 및 그 시스템 |
| CN115630594B (zh) * | 2022-12-19 | 2023-03-21 | 杭州加速科技有限公司 | 一种芯片设计仿真文件到Pattern文件的转换方法及其系统 |
| CN116520754B (zh) * | 2023-06-27 | 2023-09-22 | 厦门芯泰达集成电路有限公司 | 基于预加载模式的dps模块控制方法、系统 |
| CN117291145A (zh) * | 2023-11-24 | 2023-12-26 | 之江实验室 | 片上系统的验证方法、系统和电子装置 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02246841A (ja) * | 1989-03-17 | 1990-10-02 | Hitachi Ltd | 自動車の制御装置及び制御方法 |
| US5488573A (en) * | 1993-09-02 | 1996-01-30 | Matsushita Electric Industrial Co., Ltd. | Method for generating test programs |
| US6182258B1 (en) * | 1997-06-03 | 2001-01-30 | Verisity Ltd. | Method and apparatus for test generation during circuit design |
| US6028439A (en) * | 1997-10-31 | 2000-02-22 | Credence Systems Corporation | Modular integrated circuit tester with distributed synchronization and control |
| US6195774B1 (en) * | 1998-08-13 | 2001-02-27 | Xilinx, Inc. | Boundary-scan method using object-oriented programming language |
| US6779140B2 (en) * | 2001-06-29 | 2004-08-17 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with test sites operating in a slave mode |
-
2004
- 2004-02-13 TW TW093103547A patent/TWI344595B/zh not_active IP Right Cessation
- 2004-02-16 JP JP2006502670A patent/JP3939336B2/ja not_active Expired - Fee Related
- 2004-02-16 AT AT04711471T patent/ATE384269T1/de not_active IP Right Cessation
- 2004-02-16 WO PCT/JP2004/001648 patent/WO2004072669A1/en not_active Ceased
- 2004-02-16 WO PCT/JP2004/001649 patent/WO2004072670A1/en not_active Ceased
- 2004-02-16 DE DE602004011320T patent/DE602004011320T2/de not_active Expired - Lifetime
- 2004-02-16 JP JP2006502669A patent/JP3954639B2/ja not_active Expired - Fee Related
- 2004-02-16 KR KR1020057015017A patent/KR20050099626A/ko not_active Ceased
- 2004-02-16 KR KR1020057015016A patent/KR20050101216A/ko not_active Ceased
- 2004-02-16 EP EP04711445A patent/EP1592975B1/en not_active Expired - Lifetime
- 2004-02-16 EP EP04711471A patent/EP1592976B1/en not_active Expired - Lifetime
- 2004-02-16 CN CN2004800096901A patent/CN1784609B/zh not_active Expired - Fee Related
-
2006
- 2006-09-19 JP JP2006252498A patent/JP2007052028A/ja not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI793909B (zh) * | 2021-04-12 | 2023-02-21 | 南亞科技股份有限公司 | 半導體測試系統及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1592975A1 (en) | 2005-11-09 |
| JP2006518460A (ja) | 2006-08-10 |
| JP3954639B2 (ja) | 2007-08-08 |
| DE602004011320T2 (de) | 2009-02-05 |
| EP1592976B1 (en) | 2008-01-16 |
| JP2006520947A (ja) | 2006-09-14 |
| WO2004072670A1 (en) | 2004-08-26 |
| ATE384269T1 (de) | 2008-02-15 |
| EP1592975B1 (en) | 2008-03-26 |
| WO2004072669A1 (en) | 2004-08-26 |
| JP2007052028A (ja) | 2007-03-01 |
| EP1592976A1 (en) | 2005-11-09 |
| TW200508855A (en) | 2005-03-01 |
| CN1784609B (zh) | 2011-02-23 |
| DE602004011320D1 (de) | 2008-03-06 |
| KR20050099626A (ko) | 2005-10-14 |
| KR20050101216A (ko) | 2005-10-20 |
| CN1784609A (zh) | 2006-06-07 |
| JP3939336B2 (ja) | 2007-07-04 |
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