JP2007528993A5 - - Google Patents
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- JP2007528993A5 JP2007528993A5 JP2006519571A JP2006519571A JP2007528993A5 JP 2007528993 A5 JP2007528993 A5 JP 2007528993A5 JP 2006519571 A JP2006519571 A JP 2006519571A JP 2006519571 A JP2006519571 A JP 2006519571A JP 2007528993 A5 JP2007528993 A5 JP 2007528993A5
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57357704P | 2004-05-22 | 2004-05-22 | |
| US10/918,714 US7197417B2 (en) | 2003-02-14 | 2004-08-13 | Method and structure to develop a test program for semiconductor integrated circuits |
| PCT/JP2005/009813 WO2005114235A2 (en) | 2004-05-22 | 2005-05-23 | Method and structure to develop a test program for semiconductor integrated circuits |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007528993A JP2007528993A (ja) | 2007-10-18 |
| JP2007528993A5 true JP2007528993A5 (enExample) | 2010-02-12 |
| JP4516961B2 JP4516961B2 (ja) | 2010-08-04 |
Family
ID=34975206
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006519571A Expired - Fee Related JP4516961B2 (ja) | 2004-05-22 | 2005-05-23 | 半導体試験システム、試験プログラムを生成するための方法、及びプリヘッダ |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7197417B2 (enExample) |
| EP (1) | EP1756601B1 (enExample) |
| JP (1) | JP4516961B2 (enExample) |
| KR (1) | KR20070014206A (enExample) |
| TW (1) | TWI365387B (enExample) |
| WO (1) | WO2005114235A2 (enExample) |
Families Citing this family (63)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7184917B2 (en) | 2003-02-14 | 2007-02-27 | Advantest America R&D Center, Inc. | Method and system for controlling interchangeable components in a modular test system |
| US7437261B2 (en) * | 2003-02-14 | 2008-10-14 | Advantest Corporation | Method and apparatus for testing integrated circuits |
| US7197417B2 (en) * | 2003-02-14 | 2007-03-27 | Advantest America R&D Center, Inc. | Method and structure to develop a test program for semiconductor integrated circuits |
| US7340364B1 (en) * | 2003-02-26 | 2008-03-04 | Advantest Corporation | Test apparatus, and control method |
| CN1567223A (zh) * | 2003-07-09 | 2005-01-19 | 松下电器产业株式会社 | 程序生成装置、方法及程序 |
| US7197416B2 (en) * | 2004-05-22 | 2007-03-27 | Advantest America R&D Center, Inc. | Supporting calibration and diagnostics in an open architecture test system |
| US7430486B2 (en) * | 2004-05-22 | 2008-09-30 | Advantest America R&D Center, Inc. | Datalog support in a modular test system |
| US7210087B2 (en) * | 2004-05-22 | 2007-04-24 | Advantest America R&D Center, Inc. | Method and system for simulating a modular test system |
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| DE102006001776A1 (de) * | 2005-01-12 | 2006-11-09 | Advanced Testing Technologies, Inc. | Testprogrammsatz Minimierung der Veralterung durch Software- und automatische Testgeräteprozesse |
| US8484618B2 (en) | 2005-01-12 | 2013-07-09 | Advanced Testing Technologies, Inc. | Test program set obsolescence mitigation through software and automatic test equipment processes |
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| JP4427002B2 (ja) * | 2005-05-20 | 2010-03-03 | 株式会社アドバンテスト | 半導体試験用プログラムデバッグ装置 |
| US7528622B2 (en) * | 2005-07-06 | 2009-05-05 | Optimal Test Ltd. | Methods for slow test time detection of an integrated circuit during parallel testing |
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| US7567947B2 (en) * | 2006-04-04 | 2009-07-28 | Optimaltest Ltd. | Methods and systems for semiconductor testing using a testing scenario language |
| US10838714B2 (en) * | 2006-04-24 | 2020-11-17 | Servicenow, Inc. | Applying packages to configure software stacks |
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| US7558770B2 (en) * | 2006-08-23 | 2009-07-07 | International Business Machines Corporation | Method and system to detect application non-conformance |
| US8359585B1 (en) | 2007-01-18 | 2013-01-22 | Advanced Testing Technologies, Inc. | Instrumentation ATS/TPS mitigation utilizing I/O data stream |
| US7761471B1 (en) * | 2007-10-16 | 2010-07-20 | Jpmorgan Chase Bank, N.A. | Document management techniques to account for user-specific patterns in document metadata |
| US7809520B2 (en) * | 2007-11-05 | 2010-10-05 | Advantest Corporation | Test equipment, method for loading test plan and program product |
| US20090319997A1 (en) * | 2008-06-20 | 2009-12-24 | Microsoft Corporation | Precondition rules for static verification of code |
| WO2010055964A1 (en) * | 2008-11-17 | 2010-05-20 | Industry-University Cooperation Foundation Hanyang University | Method of testing semiconductor device |
| US8149721B2 (en) * | 2008-12-08 | 2012-04-03 | Advantest Corporation | Test apparatus and test method |
| US20110012902A1 (en) * | 2009-07-16 | 2011-01-20 | Jaganathan Rajagopalan | Method and system for visualizing the performance of applications |
| KR101028359B1 (ko) * | 2009-12-10 | 2011-04-11 | 주식회사 이노와이어리스 | 스크립트를 이용한 ｄｕｔ 자동화 테스트 장치 |
| US10089119B2 (en) | 2009-12-18 | 2018-10-02 | Microsoft Technology Licensing, Llc | API namespace virtualization |
| CN103038656B (zh) * | 2010-05-05 | 2015-01-14 | 泰拉丁公司 | 用于半导体装置的并行测试的系统 |
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| JP5626786B2 (ja) * | 2010-11-09 | 2014-11-19 | インターナショナル・ビジネス・マシーンズ・コーポレーションＩｎｔｅｒｎａｔｉｏｎａｌ Ｂｕｓｉｎｅｓｓ Ｍａｃｈｉｎｅｓ Ｃｏｒｐｏｒａｔｉｏｎ | ソフトウエア開発支援方法とソフトウエア開発支援装置とソフトウエア開発支援プログラム |
| TW201301135A (zh) * | 2011-06-16 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | 零件資料轉檔系統及方法 |
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| EP2557501B1 (en) * | 2011-08-11 | 2016-03-16 | Intel Deutschland GmbH | Circuit arrangement and method for testing same |
| US8695021B2 (en) | 2011-08-31 | 2014-04-08 | Microsoft Corporation | Projecting native application programming interfaces of an operating system into other programming languages |
| US9217772B2 (en) * | 2012-07-31 | 2015-12-22 | Infineon Technologies Ag | Systems and methods for characterizing devices |
| US8789006B2 (en) * | 2012-11-01 | 2014-07-22 | Nvidia Corporation | System, method, and computer program product for testing an integrated circuit from a command line |
| CN103092156B (zh) * | 2012-12-26 | 2016-02-10 | 莱诺斯科技(北京)有限公司 | 设备可替换型自动化测试系统及方法 |
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| US9785526B2 (en) * | 2013-04-30 | 2017-10-10 | Advantest Corporation | Automated generation of a test class pre-header from an interactive graphical user interface |
| US10635504B2 (en) | 2014-10-16 | 2020-04-28 | Microsoft Technology Licensing, Llc | API versioning independent of product releases |
| EP3213214B1 (fr) * | 2014-10-30 | 2021-03-03 | SPHEREA Test & Services | Banc et logiciel pour tester un appareillage electrique, notamment un calculateur |
| EP3032270A1 (en) * | 2014-12-12 | 2016-06-15 | Airbus Defence and Space, S.A. | Method and system for performing electrical tests to complex devices |
| KR101688632B1 (ko) * | 2015-07-31 | 2016-12-22 | 한국전자통신연구원 | 라이브러리 적재 탐지를 위한 방법 및 장치 |
| US10095596B1 (en) * | 2015-12-18 | 2018-10-09 | Amazon Technologies, Inc. | Executing integration tests in a distributed load and performance evaluation framework |
| US9733930B2 (en) * | 2015-12-21 | 2017-08-15 | Successfactors, Inc. | Logical level difference detection between software revisions |
| US10191736B2 (en) * | 2017-04-28 | 2019-01-29 | Servicenow, Inc. | Systems and methods for tracking configuration file changes |
| TWI676906B (zh) * | 2018-04-13 | 2019-11-11 | 和碩聯合科技股份有限公司 | 提示方法及其電腦系統 |
| KR102583174B1 (ko) | 2018-06-12 | 2023-09-26 | 삼성전자주식회사 | 테스트 인터페이스 보드, 이를 포함하는 테스트 시스템 및 이의 동작 방법 |
| US11159303B1 (en) | 2018-11-20 | 2021-10-26 | Mitsubishi Electric Corporation | Communication system, list distribution station, communication method, and computer readable medium |
| JP7122236B2 (ja) * | 2018-11-28 | 2022-08-19 | 東京エレクトロン株式会社 | 検査装置、メンテナンス方法、及びプログラム |
| US11182265B2 (en) * | 2019-01-09 | 2021-11-23 | International Business Machines Corporation | Method and apparatus for test generation |
| CN110082666B (zh) * | 2019-04-10 | 2022-02-22 | 杭州微纳核芯电子科技有限公司 | 芯片测试分析方法、装置、设备及存储介质 |
| US11656270B2 (en) * | 2019-05-09 | 2023-05-23 | Ase Test, Inc. | Apparatus and method of testing electronic components |
| CN111880079B (zh) * | 2020-07-24 | 2022-12-13 | 安测半导体技术(江苏)有限公司 | 一种芯片测试监控方法及服务器 |
| CN112100954B (zh) * | 2020-08-31 | 2024-07-09 | 北京百度网讯科技有限公司 | 验证芯片的方法、装置和计算机存储介质 |
| CN113051114A (zh) * | 2021-03-19 | 2021-06-29 | 无锡市软测认证有限公司 | 一种用于提高芯片测试效率的方法 |
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| DK557884A (da) * | 1983-11-25 | 1985-05-26 | Mars Inc | Automatisk testudstyr |
| US5488573A (en) | 1993-09-02 | 1996-01-30 | Matsushita Electric Industrial Co., Ltd. | Method for generating test programs |
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| JP2003173266A (ja) * | 2001-12-05 | 2003-06-20 | Mitsubishi Electric Corp | プログラム生成システム、プログラム変換システム、プログラム変換方法、半導体装置開発システム、記録媒体及びプログラム |
| JP4508657B2 (ja) * | 2002-04-11 | 2010-07-21 | 株式会社アドバンテスト | Ａｓｉｃ／ｓｏｃ製造におけるプロトタイプホールドを回避するための製造方法と装置 |
| US7437261B2 (en) | 2003-02-14 | 2008-10-14 | Advantest Corporation | Method and apparatus for testing integrated circuits |
| US7197417B2 (en) * | 2003-02-14 | 2007-03-27 | Advantest America R&D Center, Inc. | Method and structure to develop a test program for semiconductor integrated circuits |
| US7184917B2 (en) | 2003-02-14 | 2007-02-27 | Advantest America R&D Center, Inc. | Method and system for controlling interchangeable components in a modular test system |
| TWI344595B (en) | 2003-02-14 | 2011-07-01 | Advantest Corp | Method and structure to develop a test program for semiconductor integrated circuits |
-
2004
- 2004-08-13 US US10/918,714 patent/US7197417B2/en not_active Expired - Lifetime
-
2005
- 2005-05-18 TW TW094116145A patent/TWI365387B/zh not_active IP Right Cessation
- 2005-05-23 JP JP2006519571A patent/JP4516961B2/ja not_active Expired - Fee Related
- 2005-05-23 KR KR1020067027010A patent/KR20070014206A/ko not_active Withdrawn
- 2005-05-23 EP EP05743229A patent/EP1756601B1/en not_active Expired - Lifetime
- 2005-05-23 WO PCT/JP2005/009813 patent/WO2005114235A2/en not_active Ceased
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