JP4516961B2 - 半導体試験システム、試験プログラムを生成するための方法、及びプリヘッダ - Google Patents

半導体試験システム、試験プログラムを生成するための方法、及びプリヘッダ Download PDF

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Publication number
JP4516961B2
JP4516961B2 JP2006519571A JP2006519571A JP4516961B2 JP 4516961 B2 JP4516961 B2 JP 4516961B2 JP 2006519571 A JP2006519571 A JP 2006519571A JP 2006519571 A JP2006519571 A JP 2006519571A JP 4516961 B2 JP4516961 B2 JP 4516961B2
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test
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program
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JP2007528993A (ja
JP2007528993A5 (enExample
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プラマニック、アンカン
エルストン、マーク
クリッシュナスワミィ、ラマチャンドラン
敏明 足立
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Advantest Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/40—Transformation of program code
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2006519571A 2004-05-22 2005-05-23 半導体試験システム、試験プログラムを生成するための方法、及びプリヘッダ Expired - Fee Related JP4516961B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US57357704P 2004-05-22 2004-05-22
US10/918,714 US7197417B2 (en) 2003-02-14 2004-08-13 Method and structure to develop a test program for semiconductor integrated circuits
PCT/JP2005/009813 WO2005114235A2 (en) 2004-05-22 2005-05-23 Method and structure to develop a test program for semiconductor integrated circuits

Publications (3)

Publication Number Publication Date
JP2007528993A JP2007528993A (ja) 2007-10-18
JP2007528993A5 JP2007528993A5 (enExample) 2010-02-12
JP4516961B2 true JP4516961B2 (ja) 2010-08-04

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JP2006519571A Expired - Fee Related JP4516961B2 (ja) 2004-05-22 2005-05-23 半導体試験システム、試験プログラムを生成するための方法、及びプリヘッダ

Country Status (6)

Country Link
US (1) US7197417B2 (enExample)
EP (1) EP1756601B1 (enExample)
JP (1) JP4516961B2 (enExample)
KR (1) KR20070014206A (enExample)
TW (1) TWI365387B (enExample)
WO (1) WO2005114235A2 (enExample)

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Also Published As

Publication number Publication date
KR20070014206A (ko) 2007-01-31
WO2005114235A2 (en) 2005-12-01
EP1756601A2 (en) 2007-02-28
US20050154551A1 (en) 2005-07-14
JP2007528993A (ja) 2007-10-18
TWI365387B (en) 2012-06-01
EP1756601B1 (en) 2009-12-09
WO2005114235A3 (en) 2006-04-20
TW200617704A (en) 2006-06-01
US7197417B2 (en) 2007-03-27

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