DE602004011320T2 - Verfahren und struktur zur entwicklung eines testprogramms für integrierte halbleiterschaltungen - Google Patents
Verfahren und struktur zur entwicklung eines testprogramms für integrierte halbleiterschaltungen Download PDFInfo
- Publication number
- DE602004011320T2 DE602004011320T2 DE602004011320T DE602004011320T DE602004011320T2 DE 602004011320 T2 DE602004011320 T2 DE 602004011320T2 DE 602004011320 T DE602004011320 T DE 602004011320T DE 602004011320 T DE602004011320 T DE 602004011320T DE 602004011320 T2 DE602004011320 T2 DE 602004011320T2
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims abstract description 171
- 239000004065 semiconductor Substances 0.000 title claims abstract description 16
- 230000008569 process Effects 0.000 title description 70
- PWPJGUXAGUPAHP-UHFFFAOYSA-N lufenuron Chemical compound C1=C(Cl)C(OC(F)(F)C(C(F)(F)F)F)=CC(Cl)=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F PWPJGUXAGUPAHP-UHFFFAOYSA-N 0.000 title 1
- 238000012360 testing method Methods 0.000 claims abstract description 711
- 230000014509 gene expression Effects 0.000 claims description 38
- 239000011159 matrix material Substances 0.000 claims description 32
- 230000000694 effects Effects 0.000 claims description 19
- 230000007704 transition Effects 0.000 claims description 12
- 238000012550 audit Methods 0.000 claims description 7
- 230000009471 action Effects 0.000 claims description 6
- 230000006870 function Effects 0.000 description 60
- 238000012545 processing Methods 0.000 description 46
- 230000015654 memory Effects 0.000 description 32
- 239000013598 vector Substances 0.000 description 29
- 241001136792 Alle Species 0.000 description 22
- 230000008676 import Effects 0.000 description 22
- 230000009969 flowable effect Effects 0.000 description 19
- 230000007246 mechanism Effects 0.000 description 18
- 238000011161 development Methods 0.000 description 16
- 230000000007 visual effect Effects 0.000 description 15
- 230000008859 change Effects 0.000 description 13
- 238000011990 functional testing Methods 0.000 description 13
- 239000000243 solution Substances 0.000 description 13
- 230000008901 benefit Effects 0.000 description 11
- 230000001419 dependent effect Effects 0.000 description 10
- 238000013461 design Methods 0.000 description 10
- 238000011156 evaluation Methods 0.000 description 10
- 238000013507 mapping Methods 0.000 description 10
- 238000009434 installation Methods 0.000 description 9
- 238000007726 management method Methods 0.000 description 9
- 238000011867 re-evaluation Methods 0.000 description 8
- 238000010998 test method Methods 0.000 description 8
- 230000027455 binding Effects 0.000 description 7
- 238000009739 binding Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 7
- 230000002123 temporal effect Effects 0.000 description 7
- 230000006399 behavior Effects 0.000 description 6
- 238000013480 data collection Methods 0.000 description 6
- 238000012986 modification Methods 0.000 description 6
- 230000004048 modification Effects 0.000 description 6
- 238000004088 simulation Methods 0.000 description 6
- 210000002023 somite Anatomy 0.000 description 5
- 238000013519 translation Methods 0.000 description 5
- 238000010200 validation analysis Methods 0.000 description 5
- 102100036300 Golgi-associated olfactory signaling regulator Human genes 0.000 description 4
- 101710204059 Golgi-associated olfactory signaling regulator Proteins 0.000 description 4
- 108010052919 Hydroxyethylthiazole kinase Proteins 0.000 description 4
- 108010027436 Hydroxymethylpyrimidine kinase Proteins 0.000 description 4
- 101100084025 Mus musculus Alpg gene Proteins 0.000 description 4
- 229920006465 Styrenic thermoplastic elastomer Polymers 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 230000002452 interceptive effect Effects 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 238000000547 structure data Methods 0.000 description 4
- 229920006348 thermoplastic styrenic block copolymer Polymers 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 241000132023 Bellis perennis Species 0.000 description 3
- 235000005633 Chrysanthemum balsamita Nutrition 0.000 description 3
- 101100244014 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) ppi-5 gene Proteins 0.000 description 3
- 101150023294 PIN4 gene Proteins 0.000 description 3
- 238000004422 calculation algorithm Methods 0.000 description 3
- 238000012797 qualification Methods 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 102100025677 Alkaline phosphatase, germ cell type Human genes 0.000 description 2
- 101000574440 Homo sapiens Alkaline phosphatase, germ cell type Proteins 0.000 description 2
- 102100028029 SCL-interrupting locus protein Human genes 0.000 description 2
- 101100045596 Schizosaccharomyces pombe (strain 972 / ATCC 24843) tcg1 gene Proteins 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 2
- ZINJLDJMHCUBIP-UHFFFAOYSA-N ethametsulfuron-methyl Chemical compound CCOC1=NC(NC)=NC(NC(=O)NS(=O)(=O)C=2C(=CC=CC=2)C(=O)OC)=N1 ZINJLDJMHCUBIP-UHFFFAOYSA-N 0.000 description 2
- 238000007667 floating Methods 0.000 description 2
- 230000008774 maternal effect Effects 0.000 description 2
- 230000008520 organization Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 238000013024 troubleshooting Methods 0.000 description 2
- 101100369802 Caenorhabditis elegans tim-1 gene Proteins 0.000 description 1
- 206010016173 Fall Diseases 0.000 description 1
- 241001295925 Gegenes Species 0.000 description 1
- HEFNNWSXXWATRW-UHFFFAOYSA-N Ibuprofen Chemical compound CC(C)CC1=CC=C(C(C)C(O)=O)C=C1 HEFNNWSXXWATRW-UHFFFAOYSA-N 0.000 description 1
- 101001128814 Pandinus imperator Pandinin-1 Proteins 0.000 description 1
- 101001024685 Pandinus imperator Pandinin-2 Proteins 0.000 description 1
- 241000244510 Pinus canariensis Species 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- RBNWAMSGVWEHFP-UHFFFAOYSA-N cis-p-Menthan-1,8-diol Natural products CC(C)(O)C1CCC(C)(O)CC1 RBNWAMSGVWEHFP-UHFFFAOYSA-N 0.000 description 1
- 238000010367 cloning Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000009432 framing Methods 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000006855 networking Effects 0.000 description 1
- VIKNJXKGJWUCNN-XGXHKTLJSA-N norethisterone Chemical compound O=C1CC[C@@H]2[C@H]3CC[C@](C)([C@](CC4)(O)C#C)[C@@H]4[C@@H]3CCC2=C1 VIKNJXKGJWUCNN-XGXHKTLJSA-N 0.000 description 1
- 229930006948 p-menthane-3,8-diol Natural products 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000002085 persistent effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000012163 sequencing technique Methods 0.000 description 1
- 230000003319 supportive effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- RBNWAMSGVWEHFP-WAAGHKOSSA-N terpin Chemical compound CC(C)(O)[C@H]1CC[C@@](C)(O)CC1 RBNWAMSGVWEHFP-WAAGHKOSSA-N 0.000 description 1
- 229950010257 terpin Drugs 0.000 description 1
- 239000012224 working solution Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US44783903P | 2003-02-14 | 2003-02-14 | |
| US447839P | 2003-02-14 | ||
| US44962203P | 2003-02-24 | 2003-02-24 | |
| US449622P | 2003-02-24 | ||
| US403817 | 2003-03-31 | ||
| US10/404,002 US7460988B2 (en) | 2003-03-31 | 2003-03-31 | Test emulator, test module emulator, and record medium storing program therein |
| US10/403,817 US7290192B2 (en) | 2003-03-31 | 2003-03-31 | Test apparatus and test method for testing plurality of devices in parallel |
| US404002 | 2003-03-31 | ||
| PCT/JP2004/001649 WO2004072670A1 (en) | 2003-02-14 | 2004-02-16 | Method and structure to develop a test program for semiconductor integrated circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE602004011320D1 DE602004011320D1 (de) | 2008-03-06 |
| DE602004011320T2 true DE602004011320T2 (de) | 2009-02-05 |
Family
ID=32872965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE602004011320T Expired - Lifetime DE602004011320T2 (de) | 2003-02-14 | 2004-02-16 | Verfahren und struktur zur entwicklung eines testprogramms für integrierte halbleiterschaltungen |
Country Status (8)
| Country | Link |
|---|---|
| EP (2) | EP1592975B1 (enExample) |
| JP (3) | JP3939336B2 (enExample) |
| KR (2) | KR20050101216A (enExample) |
| CN (1) | CN1784609B (enExample) |
| AT (1) | ATE384269T1 (enExample) |
| DE (1) | DE602004011320T2 (enExample) |
| TW (1) | TWI344595B (enExample) |
| WO (2) | WO2004072670A1 (enExample) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040225459A1 (en) | 2003-02-14 | 2004-11-11 | Advantest Corporation | Method and structure to develop a test program for semiconductor integrated circuits |
| US7197417B2 (en) | 2003-02-14 | 2007-03-27 | Advantest America R&D Center, Inc. | Method and structure to develop a test program for semiconductor integrated circuits |
| US7184917B2 (en) | 2003-02-14 | 2007-02-27 | Advantest America R&D Center, Inc. | Method and system for controlling interchangeable components in a modular test system |
| US7197416B2 (en) | 2004-05-22 | 2007-03-27 | Advantest America R&D Center, Inc. | Supporting calibration and diagnostics in an open architecture test system |
| US7430486B2 (en) | 2004-05-22 | 2008-09-30 | Advantest America R&D Center, Inc. | Datalog support in a modular test system |
| US7210087B2 (en) | 2004-05-22 | 2007-04-24 | Advantest America R&D Center, Inc. | Method and system for simulating a modular test system |
| US7543200B2 (en) * | 2005-02-17 | 2009-06-02 | Advantest Corporation | Method and system for scheduling tests in a parallel test system |
| US8214800B2 (en) * | 2005-03-02 | 2012-07-03 | Advantest Corporation | Compact representation of vendor hardware module revisions in an open architecture test system |
| JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
| US7253607B2 (en) * | 2005-04-29 | 2007-08-07 | Teradyne, Inc. | Site-aware objects |
| EP1724599B1 (en) * | 2005-05-20 | 2007-08-22 | Agilent Technologies, Inc. | Test device with test parameter adaptation |
| US7788562B2 (en) * | 2006-11-29 | 2010-08-31 | Advantest Corporation | Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data |
| JP5022262B2 (ja) * | 2008-02-12 | 2012-09-12 | 株式会社アドバンテスト | デバッグ中にツールを使用可能な試験システム及び方法 |
| US8949784B2 (en) | 2008-10-03 | 2015-02-03 | Microsoft Technology Licensing, Llc | Type system for declarative data scripting language |
| US8692566B2 (en) | 2008-12-08 | 2014-04-08 | Advantest Corporation | Test apparatus and test method |
| US7906981B1 (en) | 2009-09-10 | 2011-03-15 | Advantest Corporation | Test apparatus and test method |
| US8405415B2 (en) | 2009-09-10 | 2013-03-26 | Advantest Corporation | Test apparatus synchronous module and synchronous method |
| US8261119B2 (en) | 2009-09-10 | 2012-09-04 | Advantest Corporation | Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module |
| CN102193553A (zh) * | 2010-03-02 | 2011-09-21 | 珠海格力电器股份有限公司 | 空调控制器功能的测试方法、装置及系统 |
| TWI470421B (zh) * | 2010-03-16 | 2015-01-21 | Via Tech Inc | 微處理器及其除錯方法 |
| US8868371B2 (en) * | 2011-09-09 | 2014-10-21 | Infineon Technologies Ag | Method and device for determining test sets of operating parameter values for an electronic component |
| US9400307B2 (en) | 2013-03-13 | 2016-07-26 | Keysight Technologies, Inc. | Test system for improving throughout or maintenance properties of semiconductor testing |
| CN104144084B (zh) * | 2013-05-10 | 2017-12-01 | 腾讯科技（深圳）有限公司 | 终端状态的监控方法及装置 |
| CN104298590B (zh) * | 2013-07-16 | 2019-05-10 | 爱德万测试公司 | 用于按管脚apg的快速语义处理器 |
| US10539609B2 (en) * | 2014-12-08 | 2020-01-21 | Nxp Usa, Inc. | Method of converting high-level test specification language to low-level test implementation language |
| KR20180084385A (ko) | 2017-01-17 | 2018-07-25 | 한국항공우주산업 주식회사 | 데이터베이스 기반의 자동시험장비의 운용 시스템 및 그 운용 방법 |
| US10592370B2 (en) * | 2017-04-28 | 2020-03-17 | Advantest Corporation | User control of automated test features with software application programming interface (API) |
| US10890621B2 (en) * | 2017-05-30 | 2021-01-12 | Raytheon Company | Systems and methods for testing an embedded controller |
| KR102179508B1 (ko) | 2019-07-05 | 2020-11-16 | 한국항공우주산업 주식회사 | 자동화 시험장비의 운용 시스템 |
| TWI748300B (zh) * | 2019-12-09 | 2021-12-01 | 新唐科技股份有限公司 | 測試系統和測試方法 |
| CN111459840A (zh) * | 2020-04-26 | 2020-07-28 | 恩亿科(北京)数据科技有限公司 | 一种进程的调试方法及装置 |
| CN112311627B (zh) * | 2020-10-29 | 2022-09-09 | 许昌许继软件技术有限公司 | 一种基于xml格式的规约描述文件的电力规约通用测试方法及系统 |
| CN113051114A (zh) * | 2021-03-19 | 2021-06-29 | 无锡市软测认证有限公司 | 一种用于提高芯片测试效率的方法 |
| US11574696B2 (en) * | 2021-04-12 | 2023-02-07 | Nanya Technology Corporation | Semiconductor test system and method |
| KR102314419B1 (ko) * | 2021-07-27 | 2021-10-19 | (주) 에이블리 | 반도체 테스트 패턴 발생 장치 및 방법 |
| CN114818669B (zh) * | 2022-04-26 | 2023-06-27 | 北京中科智加科技有限公司 | 一种人名纠错模型的构建方法和计算机设备 |
| KR102790875B1 (ko) * | 2022-06-27 | 2025-04-04 | 주식회사 와이씨 | 반도체 디바이스 할당 정보에 따른 전원 공급 제어를 위한 반도체 디바이스 테스트 장치 및 그 시스템 |
| CN115630594B (zh) * | 2022-12-19 | 2023-03-21 | 杭州加速科技有限公司 | 一种芯片设计仿真文件到Pattern文件的转换方法及其系统 |
| CN116520754B (zh) * | 2023-06-27 | 2023-09-22 | 厦门芯泰达集成电路有限公司 | 基于预加载模式的dps模块控制方法、系统 |
| CN117291145A (zh) * | 2023-11-24 | 2023-12-26 | 之江实验室 | 片上系统的验证方法、系统和电子装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02246841A (ja) * | 1989-03-17 | 1990-10-02 | Hitachi Ltd | 自動車の制御装置及び制御方法 |
| US5488573A (en) * | 1993-09-02 | 1996-01-30 | Matsushita Electric Industrial Co., Ltd. | Method for generating test programs |
| US6182258B1 (en) * | 1997-06-03 | 2001-01-30 | Verisity Ltd. | Method and apparatus for test generation during circuit design |
| US6028439A (en) * | 1997-10-31 | 2000-02-22 | Credence Systems Corporation | Modular integrated circuit tester with distributed synchronization and control |
| US6195774B1 (en) * | 1998-08-13 | 2001-02-27 | Xilinx, Inc. | Boundary-scan method using object-oriented programming language |
| US6779140B2 (en) * | 2001-06-29 | 2004-08-17 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with test sites operating in a slave mode |
-
2004
- 2004-02-13 TW TW093103547A patent/TWI344595B/zh not_active IP Right Cessation
- 2004-02-16 JP JP2006502670A patent/JP3939336B2/ja not_active Expired - Fee Related
- 2004-02-16 KR KR1020057015016A patent/KR20050101216A/ko not_active Ceased
- 2004-02-16 JP JP2006502669A patent/JP3954639B2/ja not_active Expired - Fee Related
- 2004-02-16 WO PCT/JP2004/001649 patent/WO2004072670A1/en not_active Ceased
- 2004-02-16 KR KR1020057015017A patent/KR20050099626A/ko not_active Ceased
- 2004-02-16 EP EP04711445A patent/EP1592975B1/en not_active Expired - Lifetime
- 2004-02-16 EP EP04711471A patent/EP1592976B1/en not_active Expired - Lifetime
- 2004-02-16 DE DE602004011320T patent/DE602004011320T2/de not_active Expired - Lifetime
- 2004-02-16 AT AT04711471T patent/ATE384269T1/de not_active IP Right Cessation
- 2004-02-16 WO PCT/JP2004/001648 patent/WO2004072669A1/en not_active Ceased
- 2004-02-16 CN CN2004800096901A patent/CN1784609B/zh not_active Expired - Fee Related
-
2006
- 2006-09-19 JP JP2006252498A patent/JP2007052028A/ja not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| CN1784609B (zh) | 2011-02-23 |
| EP1592975A1 (en) | 2005-11-09 |
| JP3939336B2 (ja) | 2007-07-04 |
| JP2006518460A (ja) | 2006-08-10 |
| KR20050099626A (ko) | 2005-10-14 |
| KR20050101216A (ko) | 2005-10-20 |
| TW200508855A (en) | 2005-03-01 |
| CN1784609A (zh) | 2006-06-07 |
| ATE384269T1 (de) | 2008-02-15 |
| WO2004072669A1 (en) | 2004-08-26 |
| EP1592975B1 (en) | 2008-03-26 |
| DE602004011320D1 (de) | 2008-03-06 |
| JP2006520947A (ja) | 2006-09-14 |
| EP1592976A1 (en) | 2005-11-09 |
| EP1592976B1 (en) | 2008-01-16 |
| JP3954639B2 (ja) | 2007-08-08 |
| WO2004072670A1 (en) | 2004-08-26 |
| JP2007052028A (ja) | 2007-03-01 |
| TWI344595B (en) | 2011-07-01 |
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