TWI338785B - - Google Patents
Download PDFInfo
- Publication number
- TWI338785B TWI338785B TW96107571A TW96107571A TWI338785B TW I338785 B TWI338785 B TW I338785B TW 96107571 A TW96107571 A TW 96107571A TW 96107571 A TW96107571 A TW 96107571A TW I338785 B TWI338785 B TW I338785B
- Authority
- TW
- Taiwan
- Prior art keywords
- component
- tested
- detecting
- carrier
- test
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200837364A TW200837364A (en) | 2008-09-16 |
TWI338785B true TWI338785B (ja) | 2011-03-11 |
Family
ID=44820185
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200837364A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9373534B2 (en) | 2012-09-05 | 2016-06-21 | Industrial Technology Research Institute | Rotary positioning apparatus with dome carrier, automatic pick-and-place system, and operating method thereof |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416652B (zh) * | 2010-08-20 | 2013-11-21 | Chroma Ate Inc | With a single through the shuttle shuttle of the semiconductor components test machine |
TWI760897B (zh) * | 2019-12-05 | 2022-04-11 | 仁寶電腦工業股份有限公司 | 測試治具及測試方法 |
-
2007
- 2007-03-05 TW TW96107571A patent/TW200837364A/zh not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9373534B2 (en) | 2012-09-05 | 2016-06-21 | Industrial Technology Research Institute | Rotary positioning apparatus with dome carrier, automatic pick-and-place system, and operating method thereof |
Also Published As
Publication number | Publication date |
---|---|
TW200837364A (en) | 2008-09-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100187559B1 (ko) | 전기적특성의 측정방법 및 그의 측정장치 | |
US8574932B2 (en) | PCB-mounted integrated circuits | |
KR100681772B1 (ko) | 반도체 시험 방법 및 반도체 시험 장치 | |
JP2009510396A (ja) | 個片化されたダイを検査するデバイスおよび方法 | |
US20080059095A1 (en) | Electronic Device Handling Apparatus and Defective Terminal Determination Method | |
TW201347062A (zh) | 測試半導體封裝堆疊晶片之測試系統及其半導體自動化測試機台 | |
TWI338785B (ja) | ||
KR100688564B1 (ko) | 반도체 칩 검사용 지그 및 이를 이용한 반도체 칩 검사방법 | |
JP2007333697A (ja) | 電子部品試験装置のキャリブレーション方法 | |
CN106558513B (zh) | 检测设备及其检测方法 | |
JP4247076B2 (ja) | 基板検査システム、及び基板検査方法 | |
JP2005150224A (ja) | プローブ情報を用いた半導体検査装置及び検査方法 | |
JPH09274066A (ja) | 半導体試験装置及びこれを利用した試験方法及び半導体装置 | |
CN115407179A (zh) | 一种利用测试焊点对应关系提高准确性的晶圆测试方法 | |
JP4902986B2 (ja) | プローバ、及び、プローバのウェハステージ加熱、又は、冷却方法 | |
JP3346369B2 (ja) | ベアチップ検査方法 | |
JP2020047860A (ja) | 検査装置及び検査方法 | |
JPH0329335A (ja) | 半導体チッププローバ | |
JP2002185103A (ja) | 実装用基板の実装面における電極パッドの平坦性評価方法 | |
JP3153834B2 (ja) | 半導体装置のテスト装置及び半導体装置の検査方法 | |
JP2008309540A (ja) | 半導体チップの検査方法及び検査用治具 | |
TWI311350B (en) | A testing method of ball grid array package | |
JP3063899B2 (ja) | 半導体集積回路用ハンドラ | |
JP2007095766A (ja) | プローバ装置及び半導体デバイスの検査方法 | |
CN113161251A (zh) | 芯片封装的工艺内测试方法及装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MC4A | Revocation of granted patent | ||
MC4A | Revocation of granted patent |