TWI320497B - Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display - Google Patents

Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Info

Publication number
TWI320497B
TWI320497B TW094143671A TW94143671A TWI320497B TW I320497 B TWI320497 B TW I320497B TW 094143671 A TW094143671 A TW 094143671A TW 94143671 A TW94143671 A TW 94143671A TW I320497 B TWI320497 B TW I320497B
Authority
TW
Taiwan
Prior art keywords
angle
blemish
measurement
flat panel
panel display
Prior art date
Application number
TW094143671A
Other languages
English (en)
Chinese (zh)
Other versions
TW200722825A (en
Inventor
Wei Hsiumg Tsai
Chao Hua Wen
Cheng Han Kuo
Tung Fa Liu
Hong Tu Yu
Original Assignee
Taiwan Tft Lcd Ass
Chunghwa Picture Tubes Ltd
Au Optronics Corp
Quanta Display Inc
Hannstar Display Corp
Chi Mei Optoelectronics Corp
Ind Tech Res Inst
Toppoly Optoelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Tft Lcd Ass, Chunghwa Picture Tubes Ltd, Au Optronics Corp, Quanta Display Inc, Hannstar Display Corp, Chi Mei Optoelectronics Corp, Ind Tech Res Inst, Toppoly Optoelectronics Corp filed Critical Taiwan Tft Lcd Ass
Priority to TW094143671A priority Critical patent/TWI320497B/zh
Priority to JP2006036263A priority patent/JP4436810B2/ja
Priority to KR1020060017825A priority patent/KR100805486B1/ko
Publication of TW200722825A publication Critical patent/TW200722825A/zh
Priority to JP2009252691A priority patent/JP5176014B2/ja
Application granted granted Critical
Publication of TWI320497B publication Critical patent/TWI320497B/zh

Links

Classifications

    • A—HUMAN NECESSITIES
    • A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
    • A01G9/00—Cultivation in receptacles, forcing-frames or greenhouses; Edging for beds, lawn or the like
    • A01G9/14—Greenhouses
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04H—BUILDINGS OR LIKE STRUCTURES FOR PARTICULAR PURPOSES; SWIMMING OR SPLASH BATHS OR POOLS; MASTS; FENCING; TENTS OR CANOPIES, IN GENERAL
    • E04H9/00—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate
    • E04H9/16—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate against adverse conditions, e.g. extreme climate, pests

Landscapes

  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Civil Engineering (AREA)
  • Business, Economics & Management (AREA)
  • Pest Control & Pesticides (AREA)
  • Emergency Management (AREA)
  • Environmental & Geological Engineering (AREA)
  • Environmental Sciences (AREA)
  • Structural Engineering (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
TW094143671A 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display TWI320497B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display
JP2006036263A JP4436810B2 (ja) 2005-12-09 2006-02-14 ディスプレーの多角度計測システム及び方法
KR1020060017825A KR100805486B1 (ko) 2005-12-09 2006-02-23 디스플레이의 다각도 계측 시스템 및 방법
JP2009252691A JP5176014B2 (ja) 2005-12-09 2009-11-04 ディスプレーの多角度計測システム及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Publications (2)

Publication Number Publication Date
TW200722825A TW200722825A (en) 2007-06-16
TWI320497B true TWI320497B (en) 2010-02-11

Family

ID=38246502

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094143671A TWI320497B (en) 2005-12-09 2005-12-09 Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display

Country Status (3)

Country Link
JP (2) JP4436810B2 (ko)
KR (1) KR100805486B1 (ko)
TW (1) TWI320497B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690748B (zh) * 2018-07-23 2020-04-11 財團法人工業技術研究院 透明顯示系統及其操作方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012060332A (ja) * 2010-09-07 2012-03-22 Iix Inc 表示装置
CN103217436B (zh) * 2013-03-06 2015-05-20 京东方科技集团股份有限公司 一种背光模组瑕疵的检测方法及设备
KR20160032909A (ko) * 2014-09-17 2016-03-25 한화테크윈 주식회사 멀티 영상 전처리 장치 및 방법
CN109985846B (zh) * 2019-01-11 2022-07-08 贵州电网有限责任公司 一种变电站带电水冲洗机器人的激光雷达标定方法
CN110031470A (zh) * 2019-05-16 2019-07-19 武汉精立电子技术有限公司 光学检测设备
CN110148131B (zh) * 2019-05-28 2023-04-25 易诚高科（大连）科技有限公司 一种针对oled屏的mura检测方法
CN110723478A (zh) * 2019-09-27 2020-01-24 苏州精濑光电有限公司 一种显示面板检修装置
KR102443798B1 (ko) * 2020-09-25 2022-09-19 주식회사 맥사이언스 광측정 장치 및 이를 이용한 다채널 디스플레이 소자 화상 수명 측정 시스템 및 방법
TWI816060B (zh) * 2020-10-28 2023-09-21 友達光電股份有限公司 監測系統及其方法
CN113362751B (zh) * 2021-06-01 2023-11-28 深圳市华星光电半导体显示技术有限公司 显示面板的数据补偿方法、数据补偿装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW410524B (en) * 1994-07-14 2000-11-01 Advantest Corp LCD panel image quality examining device and LCD image sampling method
JPH10336707A (ja) * 1997-06-03 1998-12-18 Sefuto Kenkyusho:Kk Ｃｒｔの画歪み測定装置
KR100304649B1 (ko) * 1999-02-02 2001-09-13 윤종용 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치
JP3421299B2 (ja) * 2000-03-28 2003-06-30 科学技術振興事業団 輝度の視野角依存性ならびに場所依存性測定装置及びその測定方法
JP2002333407A (ja) * 2001-05-09 2002-11-22 Horiba Ltd 平面表示装置の欠陥検査装置
JP2003106936A (ja) * 2001-09-27 2003-04-09 Japan Science & Technology Corp センサヘッド、これを具備した輝度分布測定装置、外観検査装置及び表示ムラ検査評価装置
JP4154156B2 (ja) 2002-02-08 2008-09-24 ソニーマニュファクチュアリングシステムズ株式会社 欠陥分類検査装置
KR20040060019A (ko) * 2002-12-30 2004-07-06 삼성전자주식회사 Ｌｃｄ 모듈용 검사장치
KR20050014127A (ko) * 2003-07-30 2005-02-07 삼성전자주식회사 Ｌｃｄ 패널 검사장치
JP4230880B2 (ja) * 2003-10-17 2009-02-25 株式会社東芝 欠陥検査方法
JP4429683B2 (ja) * 2003-10-17 2010-03-10 大日本印刷株式会社 画像入力装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690748B (zh) * 2018-07-23 2020-04-11 財團法人工業技術研究院 透明顯示系統及其操作方法
US10891917B2 (en) 2018-07-23 2021-01-12 Industrial Technology Research Institute Transparent display system and operation method thereof

Also Published As

Publication number Publication date
JP2010019868A (ja) 2010-01-28
KR20070060965A (ko) 2007-06-13
JP5176014B2 (ja) 2013-04-03
KR100805486B1 (ko) 2008-02-20
JP2007163450A (ja) 2007-06-28
TW200722825A (en) 2007-06-16
JP4436810B2 (ja) 2010-03-24

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees