TWI320497B - Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display - Google Patents
Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel displayInfo
- Publication number
- TWI320497B TWI320497B TW094143671A TW94143671A TWI320497B TW I320497 B TWI320497 B TW I320497B TW 094143671 A TW094143671 A TW 094143671A TW 94143671 A TW94143671 A TW 94143671A TW I320497 B TWI320497 B TW I320497B
- Authority
- TW
- Taiwan
- Prior art keywords
- angle
- blemish
- measurement
- flat panel
- panel display
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- A—HUMAN NECESSITIES
- A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
- A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
- A01G9/00—Cultivation in receptacles, forcing-frames or greenhouses; Edging for beds, lawn or the like
- A01G9/14—Greenhouses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04H—BUILDINGS OR LIKE STRUCTURES FOR PARTICULAR PURPOSES; SWIMMING OR SPLASH BATHS OR POOLS; MASTS; FENCING; TENTS OR CANOPIES, IN GENERAL
- E04H9/00—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate
- E04H9/16—Buildings, groups of buildings or shelters adapted to withstand or provide protection against abnormal external influences, e.g. war-like action, earthquake or extreme climate against adverse conditions, e.g. extreme climate, pests
Landscapes
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Life Sciences & Earth Sciences (AREA)
- Civil Engineering (AREA)
- Business, Economics & Management (AREA)
- Pest Control & Pesticides (AREA)
- Emergency Management (AREA)
- Environmental & Geological Engineering (AREA)
- Environmental Sciences (AREA)
- Structural Engineering (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094143671A TWI320497B (en) | 2005-12-09 | 2005-12-09 | Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display |
JP2006036263A JP4436810B2 (en) | 2005-12-09 | 2006-02-14 | Display multi-angle measuring system and method |
KR1020060017825A KR100805486B1 (en) | 2005-12-09 | 2006-02-23 | A system and a method of measuring a display at multi-angles |
JP2009252691A JP5176014B2 (en) | 2005-12-09 | 2009-11-04 | Display multi-angle measuring system and method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094143671A TWI320497B (en) | 2005-12-09 | 2005-12-09 | Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200722825A TW200722825A (en) | 2007-06-16 |
TWI320497B true TWI320497B (en) | 2010-02-11 |
Family
ID=38246502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094143671A TWI320497B (en) | 2005-12-09 | 2005-12-09 | Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display |
Country Status (3)
Country | Link |
---|---|
JP (2) | JP4436810B2 (en) |
KR (1) | KR100805486B1 (en) |
TW (1) | TWI320497B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI690748B (en) * | 2018-07-23 | 2020-04-11 | 財團法人工業技術研究院 | Transparent display system and operation method thereof |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012060332A (en) * | 2010-09-07 | 2012-03-22 | Iix Inc | Display device |
CN103217436B (en) * | 2013-03-06 | 2015-05-20 | 京东方科技集团股份有限公司 | Backlight module group defect detection method and equipment |
KR20160032909A (en) * | 2014-09-17 | 2016-03-25 | 한화테크윈 주식회사 | Apparatus for preprocessing of multi-image and method thereof |
CN109985846B (en) * | 2019-01-11 | 2022-07-08 | 贵州电网有限责任公司 | Laser radar calibration method for live-line water washing robot of transformer substation |
CN110031470A (en) * | 2019-05-16 | 2019-07-19 | 武汉精立电子技术有限公司 | Optical detection apparatus |
CN110148131B (en) * | 2019-05-28 | 2023-04-25 | 易诚高科(大连)科技有限公司 | MURA detection method for OLED screen |
CN110723478A (en) * | 2019-09-27 | 2020-01-24 | 苏州精濑光电有限公司 | Display panel overhauls device |
KR102443798B1 (en) * | 2020-09-25 | 2022-09-19 | 주식회사 맥사이언스 | Optical measuring device and multi-channel display image lifetime measuring system and method using the same |
TWI816060B (en) * | 2020-10-28 | 2023-09-21 | 友達光電股份有限公司 | Monitor system and method thereof |
CN114428412A (en) * | 2020-10-29 | 2022-05-03 | 中强光电股份有限公司 | Image recognition device and image recognition method |
CN113362751B (en) * | 2021-06-01 | 2023-11-28 | 深圳市华星光电半导体显示技术有限公司 | Data compensation method and data compensation device of display panel |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW410524B (en) * | 1994-07-14 | 2000-11-01 | Advantest Corp | LCD panel image quality examining device and LCD image sampling method |
JPH10336707A (en) * | 1997-06-03 | 1998-12-18 | Sefuto Kenkyusho:Kk | Picture distortion measuring device for crt |
KR100304649B1 (en) * | 1999-02-02 | 2001-09-13 | 윤종용 | Method for inspecting lead pins of IC package and apparatus therefor |
JP3421299B2 (en) * | 2000-03-28 | 2003-06-30 | 科学技術振興事業団 | Apparatus and method for measuring viewing angle dependence and location dependence of luminance |
JP2002333407A (en) * | 2001-05-09 | 2002-11-22 | Horiba Ltd | Defect inspection device of plane display device |
JP2003106936A (en) * | 2001-09-27 | 2003-04-09 | Japan Science & Technology Corp | Sensor head, luminance distribution measuring device provided with the same, appearance inspection device, and device for inspecting and evaluating display unevenness |
JP4154156B2 (en) | 2002-02-08 | 2008-09-24 | ソニーマニュファクチュアリングシステムズ株式会社 | Defect classification inspection system |
KR20040060019A (en) * | 2002-12-30 | 2004-07-06 | 삼성전자주식회사 | Inspection Equipment for LCD module |
KR20050014127A (en) * | 2003-07-30 | 2005-02-07 | 삼성전자주식회사 | Lcd panel test apparatus |
JP4230880B2 (en) * | 2003-10-17 | 2009-02-25 | 株式会社東芝 | Defect inspection method |
JP4429683B2 (en) * | 2003-10-17 | 2010-03-10 | 大日本印刷株式会社 | Image input device |
-
2005
- 2005-12-09 TW TW094143671A patent/TWI320497B/en not_active IP Right Cessation
-
2006
- 2006-02-14 JP JP2006036263A patent/JP4436810B2/en not_active Expired - Fee Related
- 2006-02-23 KR KR1020060017825A patent/KR100805486B1/en not_active IP Right Cessation
-
2009
- 2009-11-04 JP JP2009252691A patent/JP5176014B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI690748B (en) * | 2018-07-23 | 2020-04-11 | 財團法人工業技術研究院 | Transparent display system and operation method thereof |
US10891917B2 (en) | 2018-07-23 | 2021-01-12 | Industrial Technology Research Institute | Transparent display system and operation method thereof |
Also Published As
Publication number | Publication date |
---|---|
JP2007163450A (en) | 2007-06-28 |
KR20070060965A (en) | 2007-06-13 |
KR100805486B1 (en) | 2008-02-20 |
JP4436810B2 (en) | 2010-03-24 |
JP2010019868A (en) | 2010-01-28 |
TW200722825A (en) | 2007-06-16 |
JP5176014B2 (en) | 2013-04-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |