TWI300481B - - Google Patents
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- Publication number
- TWI300481B TWI300481B TW95114711A TW95114711A TWI300481B TW I300481 B TWI300481 B TW I300481B TW 95114711 A TW95114711 A TW 95114711A TW 95114711 A TW95114711 A TW 95114711A TW I300481 B TWI300481 B TW I300481B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- unit
- semiconductor component
- rotary
- classification device
- Prior art date
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095114711A TW200741219A (en) | 2006-04-25 | 2006-04-25 | Rotary disk type testing and sorting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095114711A TW200741219A (en) | 2006-04-25 | 2006-04-25 | Rotary disk type testing and sorting device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741219A TW200741219A (en) | 2007-11-01 |
TWI300481B true TWI300481B (ko) | 2008-09-01 |
Family
ID=45069977
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095114711A TW200741219A (en) | 2006-04-25 | 2006-04-25 | Rotary disk type testing and sorting device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200741219A (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI412762B (zh) * | 2009-09-03 | 2013-10-21 | Jt Corp | 半導體裝置分類設備 |
TWI418811B (zh) * | 2011-02-14 | 2013-12-11 | Youngtek Electronics Corp | 封裝晶片檢測與分類裝置 |
TWI593979B (zh) * | 2016-02-22 | 2017-08-01 | 京元電子股份有限公司 | 轉塔式測試裝置之快拆式ic測試座 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI451100B (zh) * | 2009-02-20 | 2014-09-01 | King Yuan Electronics Co Ltd | 翻轉測試模組及其測試系統 |
TWI472778B (zh) * | 2013-08-30 | 2015-02-11 | Chroma Ate Inc | System - level IC test machine automatic retest method and the test machine |
KR102401058B1 (ko) * | 2015-05-12 | 2022-05-23 | (주)제이티 | 소자핸들러 |
TWI638170B (zh) * | 2017-12-29 | 2018-10-11 | 鴻勁精密股份有限公司 | Electronic component working machine |
CN112452821A (zh) * | 2020-11-05 | 2021-03-09 | 方晓娟 | 一种电压内阻测试机快速抓取机械装置 |
-
2006
- 2006-04-25 TW TW095114711A patent/TW200741219A/zh unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI412762B (zh) * | 2009-09-03 | 2013-10-21 | Jt Corp | 半導體裝置分類設備 |
TWI418811B (zh) * | 2011-02-14 | 2013-12-11 | Youngtek Electronics Corp | 封裝晶片檢測與分類裝置 |
TWI593979B (zh) * | 2016-02-22 | 2017-08-01 | 京元電子股份有限公司 | 轉塔式測試裝置之快拆式ic測試座 |
Also Published As
Publication number | Publication date |
---|---|
TW200741219A (en) | 2007-11-01 |
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