TWI270879B - Inspection optical disk and manufacturing method thereof - Google Patents

Inspection optical disk and manufacturing method thereof Download PDF

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Publication number
TWI270879B
TWI270879B TW091111606A TW91111606A TWI270879B TW I270879 B TWI270879 B TW I270879B TW 091111606 A TW091111606 A TW 091111606A TW 91111606 A TW91111606 A TW 91111606A TW I270879 B TWI270879 B TW I270879B
Authority
TW
Taiwan
Prior art keywords
disc
optical disc
inspection
manufacturing
processing
Prior art date
Application number
TW091111606A
Other languages
English (en)
Chinese (zh)
Inventor
Mitsuo Shiba
Tatsuo Sasaki
Original Assignee
Teac Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teac Corp filed Critical Teac Corp
Application granted granted Critical
Publication of TWI270879B publication Critical patent/TWI270879B/zh

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00—Record carriers by type
    • G11B2220/20—Disc-shaped record carriers
    • G11B2220/25—Disc-shaped record carriers characterised in that the disc is based on a specific recording technology
    • G11B2220/2537—Optical discs
    • G11B2220/2562—DVDs [digital versatile discs]; Digital video discs; MMCDs; HDCDs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/40—Details of apparatuses used for either manufacturing connectors or connecting the semiconductor or solid-state body
    • H01L2924/401—LASER
    • H01L2924/402—Type
    • H01L2924/4025—Type being a gas
    • H01L2924/40252—CO2 LASER

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
  • Optical Recording Or Reproduction (AREA)
TW091111606A 2001-06-13 2002-05-29 Inspection optical disk and manufacturing method thereof TWI270879B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001178437A JP3674545B2 (ja) 2001-06-13 2001-06-13 検査用光ディスク及びその製造方法

Publications (1)

Publication Number Publication Date
TWI270879B true TWI270879B (en) 2007-01-11

Family

ID=19019138

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091111606A TWI270879B (en) 2001-06-13 2002-05-29 Inspection optical disk and manufacturing method thereof

Country Status (3)

Country Link
JP (1) JP3674545B2 (ko)
KR (1) KR100462285B1 (ko)
TW (1) TWI270879B (ko)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5526341A (en) * 1993-07-30 1996-06-11 Teac Corporation Test disk having defect patterns uniformly distributed in recording areas
KR100188686B1 (ko) * 1996-04-06 1999-06-01 윤종용 콤팩트 디스크 드라이브 테스트용 디스크
KR100285315B1 (ko) * 1997-09-24 2001-04-02 구자홍 광디스크 품질검사 방법 및 장치
JPH11312341A (ja) * 1998-04-28 1999-11-09 Teac Corp 検査用ディスク
JP2000322782A (ja) * 1999-05-12 2000-11-24 Almedio Inc テスト用光ディスク記録媒体及びその製造方法
JP2001084650A (ja) * 1999-09-10 2001-03-30 Matsushita Electric Ind Co Ltd 検査用ディスク

Also Published As

Publication number Publication date
KR100462285B1 (ko) 2004-12-17
JP3674545B2 (ja) 2005-07-20
JP2002367238A (ja) 2002-12-20
KR20020095060A (ko) 2002-12-20

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MM4A Annulment or lapse of patent due to non-payment of fees