TWI256840B - Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array - Google Patents

Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array

Info

Publication number
TWI256840B
TWI256840B TW094107090A TW94107090A TWI256840B TW I256840 B TWI256840 B TW I256840B TW 094107090 A TW094107090 A TW 094107090A TW 94107090 A TW94107090 A TW 94107090A TW I256840 B TWI256840 B TW I256840B
Authority
TW
Taiwan
Prior art keywords
pixels
voltage
charges
reset
sampling
Prior art date
Application number
TW094107090A
Other languages
English (en)
Other versions
TW200533191A (en
Inventor
Su-Hun Lim
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020040017675A external-priority patent/KR100994993B1/ko
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200533191A publication Critical patent/TW200533191A/zh
Application granted granted Critical
Publication of TWI256840B publication Critical patent/TWI256840B/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/447—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by preserving the colour pattern with or without loss of information
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
TW094107090A 2004-03-16 2005-03-09 Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array TWI256840B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020040017675A KR100994993B1 (ko) 2004-03-16 2004-03-16 서브 샘플링된 아날로그 신호를 평균화하여 디지털 변환한영상신호를 출력하는 고체 촬상 소자 및 그 구동 방법
US11/068,205 US7554584B2 (en) 2004-03-16 2005-02-28 Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array

Publications (2)

Publication Number Publication Date
TW200533191A TW200533191A (en) 2005-10-01
TWI256840B true TWI256840B (en) 2006-06-11

Family

ID=34921821

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094107090A TWI256840B (en) 2004-03-16 2005-03-09 Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array

Country Status (5)

Country Link
JP (1) JP4764036B2 (zh)
CN (1) CN100594709C (zh)
DE (1) DE102005012509A1 (zh)
FR (1) FR2867936B1 (zh)
TW (1) TWI256840B (zh)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101305602B (zh) * 2005-11-08 2011-11-09 松下电器产业株式会社 相关双取样电路和取样保持电路
JP4546563B2 (ja) * 2006-03-01 2010-09-15 富士通セミコンダクター株式会社 半導体集積回路
EP2677308B1 (en) 2006-12-14 2017-04-26 Life Technologies Corporation Method for fabricating large scale FET arrays
JP5142749B2 (ja) * 2008-02-14 2013-02-13 キヤノン株式会社 撮像装置、撮像装置の制御方法及び撮像システム
CN101557456B (zh) * 2008-04-10 2010-12-29 联咏科技股份有限公司 相关二重取样电路及互补金属氧化物半导体影像感测单元
JP5311954B2 (ja) * 2008-09-30 2013-10-09 キヤノン株式会社 固体撮像装置の駆動方法
CN102301228A (zh) * 2008-10-22 2011-12-28 生命技术公司 用于生物和化学分析的集成式传感器阵列
US20100301398A1 (en) 2009-05-29 2010-12-02 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
US20100137143A1 (en) 2008-10-22 2010-06-03 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
JP5426587B2 (ja) * 2011-01-31 2014-02-26 株式会社東芝 固体撮像装置及びその画素平均化処理方法
US8749656B2 (en) * 2011-03-16 2014-06-10 Analog Devices, Inc. Apparatus and method for image decimation for image sensors
JP6011546B2 (ja) * 2011-12-27 2016-10-19 株式会社ニコン 撮像素子および撮像装置
CN103872065B (zh) * 2014-03-10 2016-09-21 北京空间机电研究所 垂直电荷转移成像探测器像元合并方法
TWI559768B (zh) * 2015-06-22 2016-11-21 友達光電股份有限公司 用於被動畫素之取樣控制電路與其方法
CN113493735B (zh) * 2020-04-02 2023-06-16 成都今是科技有限公司 基因测序阵列结构和基因测序装置
CN113612948B (zh) * 2021-08-27 2024-03-05 锐芯微电子股份有限公司 读出电路及图像传感器

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1013746A (ja) * 1996-06-27 1998-01-16 Sony Corp 固体撮像装置
JP2001036816A (ja) * 1999-06-23 2001-02-09 Taiwan Advanced Sensors Corp Ｃｍｏｓ型イメージセンサ内のａ／ｄ変換器の自動較正
JP2002165132A (ja) * 2000-11-22 2002-06-07 Innotech Corp 固体撮像装置及びその駆動方法
KR100498594B1 (ko) * 2000-12-30 2005-07-01 매그나칩 반도체 유한회사 씨모스 이미지 센서
JP2002330349A (ja) * 2001-04-26 2002-11-15 Fujitsu Ltd Ｘｙアドレス型固体撮像装置
US6914227B2 (en) * 2001-06-25 2005-07-05 Canon Kabushiki Kaisha Image sensing apparatus capable of outputting image by converting resolution by adding and reading out a plurality of pixels, its control method, and image sensing system
US20040246354A1 (en) * 2003-06-04 2004-12-09 Hongli Yang CMOS image sensor having high speed sub sampling

Also Published As

Publication number Publication date
CN100594709C (zh) 2010-03-17
JP4764036B2 (ja) 2011-08-31
JP2005269646A (ja) 2005-09-29
TW200533191A (en) 2005-10-01
FR2867936B1 (fr) 2009-04-17
DE102005012509A1 (de) 2005-10-13
CN1681290A (zh) 2005-10-12
FR2867936A1 (fr) 2005-09-23

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