TWI231026B - Planarized plastic package modules for integrated circuits - Google Patents
Planarized plastic package modules for integrated circuits Download PDFInfo
- Publication number
- TWI231026B TWI231026B TW090115294A TW90115294A TWI231026B TW I231026 B TWI231026 B TW I231026B TW 090115294 A TW090115294 A TW 090115294A TW 90115294 A TW90115294 A TW 90115294A TW I231026 B TWI231026 B TW I231026B
- Authority
- TW
- Taiwan
- Prior art keywords
- lead
- patent application
- connecting rod
- encapsulant
- chip package
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
- H01L23/4951—Chip-on-leads or leads-on-chip techniques, i.e. inner lead fingers being used as die pad
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- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Geometry (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Packaging Frangible Articles (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
1231026 A7 ------— _____B7 五、發明説明(1 ~)~" --—-- 曰本發明一般有關於積體電路的塑膠封裝件。更確切地說 是有關於用來減少塑膠封裝模組彎曲和提供更加平坦的模 組的改良結構。更加確切地說是有關於提供更加平坦的模 組之改良引線框。 一 通常,積體電路晶片通過高度導電的引線框而電連接到 外部。晶片的金屬絲鍵合焊點被細軟的直徑丨爪丨1的金屬 絲連接到更厚和更堅韌的引線框導體。晶片、細軟的金屬 絲、和引線框的鄰接部分被包封在模塑塑膠中,以保護晶 片和金屬絲不受損傷,同時,延伸出塑膠的引線框導 分可以用來焊接到諸如印刷電路板之類組件的下一層。每 年有成千上萬的這種類型的模組在出售。 很多問題被認為與這個封裝概念有關聯。其中之一就是 彎曲。使成品模組彎曲的高應力能夠使積體電路晶片破裂 並使之不能正常工作。在封裝過程中,或在晶片封裝件已 經被安裝在客戶使用的電子裝置中以後,都可以出現彎曲 和破裂。成品率的下降明顯增加了封裝晶片的成本,且使 用中出現的失效會使客戶惱怒。 即使晶片不破裂,封裝件的彎曲也能在把模組引線框固 定到印刷電路板的焊接過程中導致嚴重的問題。如果塑膠 封裝模組彎曲’引線端頭的位置就可能移出平面,一些引 線端頭在焊接步驟中可能不接觸到板上的焊點。為了避免 14個問題,一種由J E D E C建立的工業平面化規範M s _ 0 2 4,規定所有的引線必須平坦,不能存在彼此偏離超過 4 m i 1的兩根引線。 -4- 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 1231026 A7 ______Β7 ϋ明説明(2~^ 如果封裝件由具有不同熱膨脹係數(τ c Ε)的不同材料 組成,就會產生封裝件彎曲。矽晶片、金屬引線框、和塑 膠包封劑通常具有非常不同的熱膨脹係數(T CE ),而在 製造過私中或使用過程中,封裝件要經歷溫度的明顯變 化。所以,需要一種塑膠封裝的更好解決辦法,來避免能 導致4曲的/息度應力,以下的本發明提供了這種解決辦 法。 因此,本發明的一個目的是提供一種減少或消除塑膠封 裝件彎曲的方法。 本發明的另一目的是提供一種減少彎曲的引線框設計。 本發明的另-目的是提供_種平衡各個力,以便在溫度 改變時避免彎曲的引線框。 本發明的—個特徵是’引線框在一個層上具有用來電連 接到晶片的元件,並在塑膠包封劑内的帛二層上具有用來 平衡應力的額外的元件。 本發明的優點是,當封裝件經受溫度大改變時,應力被 平衡並避免了彎曲。 本發明的這些和其他目的、特點和優點,借助於包含具 有接觸焊點的半導體晶片和引線框的晶片封裝件被實 該引線框具有與接觸焊點隔開至少第一距離並位於鄰近接 觸焊點的第-層上的引線指條。包封劑把晶片和部分引線 框士封,來。位於第二層上的材料也在包封劑中。此材料 在:-第二層上具有包含長度和寬度的面積。此材料也具 有厚度、比厚度大的長度和寬度。此材料從晶片延伸第二 -5- 1231026 五、發明説明(3 距離’其中該第二距離大於第—距離。第二 用來借助於平衡g+ 61上的材料被 平坦的封裝件_和包封劑之間的熱應力而提供更加 本發明人認識到杏曰& 彎曲問題通常更加明顯小於封裝件的面積時, 小的尺寸生產,而封裝件仍1保代—代的晶片以更 , 策忏仍然保持相同的尺寸時, 題就=大。本發明提供一種在封裝件内提供更小晶片而; 增加相的万法。在本發明的較佳實施例中,材料是引線 =的-個整: 豊部分。這是與電連接到晶片的那部分不同的 曰^的包封劑中的引線框的彎曲部分。在封裝完成時,此 材料可以包;不電連接到引線的那部分引線框。在另外一 個實施例中,此材料是諸如第二半導體晶片的沒有用金屬 絲電連接到晶片的鍵合焊接點的物體。第二半導體晶片可 以被安裝到用來在裝配過程中保持其位置的條帶。 從附圖中該本發明的下列詳細描述中,本發明的上述和 其他的目的、特點、和優點將顯而易見,其中·· 圖la是包含半導體晶片和具有與引線指條分離的下置 部分的引線框的一個模組的三維視圖; 圖lb是圖la的引線框的三維視圖,示出了連接到引 線框指條連接端的下置部分; 圖2是另一實施例的三維視圖,示出了包含半導體晶 片和具有帶下置部分的引線框的一個模組; 圖3疋另一實施例的三維視圖,示出了包含半導體晶 片和具有連接到引線指條的下置部分的引線框的一個模 -6- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 裝 訂 線 1231026 A7 B7 五、發明説明(4 組; 圖4 a是另一實施例的三維視圖,示出.了包含半導體晶 片、引線框、和類比晶片的一個模組,此類比晶 線指條的下〜層; ;5丨 圖4 b是兩個實施例的俯視圖,左邊的那個示出了包本 由支架固足在圖“類比晶片下一層的物體的模組,右邊 的那個示出了厚度相似於晶片並用條帶固定到引線框 的物體; 圖4 c是圖4 b實施例的剖面圖;以及 圖4d-4f是具有各種形狀的物體的俯視圖; 圖4 d - 4 f疋具有各種形狀的物體的側視圖。 本發明人認識到,通過平衡塑膠封裝件内的各個力,可 以減少或避免弯曲。他們認識到,當引線框上面的塑膠的 厚度不同於引線框下面的厚度時,封裝件就好像是雙金屬 條’並根據溫度而彎曲。為了減少或避免彎曲,本發明人 在不同於引線框連接引線的層處的塑膠中提供了額外的材 料層’以便平衡各個力。在—個實施例中,引線框材料的 一部分被彎曲到不同於用作引線框其餘部分的層,以便平 衡各個力。在另-個實施例中,引線指條被向下_曲再回 復向上,以便更好地平衡引線指條上的各個力。 如圖ia所示,引線框22的下置連杆2〇在塑膠包封劑 26内的f點24a和24b處被f曲到明顯低於引線框 22的引線指條32層面30的層28。層28被選擇來提供 雙材料弯曲力’此力使模組36的引線指條32和積體電 表纸張尺度適用中國國家揉準(CNS) A4規格(2i〇x297公I) 1231026 五、發明説明(5 J '------- =曰曰片3 4上的某些或全部的力得到平衡。此外,下置連 從鄰近封裝件一端的位置延伸到鄰近晶# 3 4邊沿 田:X便使下置連杆20的面積最大,並使下置效應 Γ 於是’、封裝件的彎曲被減少或消除。下置連杆20 “ =A孚开y形狀,以便在引線指條3 2所提供的空間 供最大的面積,並提供機械強度和硬度。通過在下置 = '内部提供幾個支撐杆2。,,也增加了穩定二 ^ 20被足向平行於模塑過程中液體塑膠化合物的流 β ’使當硬體塑膠化合物填充物體時’連杆不被突起。提 供二置連杆20的盡可能最大面積,就提供了最大的力來 肖更咼的引線指條32的力。下置連杆2〇最好與引線 十3 2平行,但在不同的平面上。彎點2 4 &、2 4 b通過 使用工具夾住鄰近連杆2()的引線框U,然後用彎曲操 作完成時以及下置連杆2〇被置於所希望的高度並平行於 引線指條32時提供足夠彎曲的工具,壓住連杆2〇而實 現。—下置連杆20被設計成使到鄰近料指條32的最小 s為3 2 m 11而到標稱尺寸和放置的晶片3 *邊沿的最 隔為2 3 m 11,以便避免模組3 6中的電短路或機械接 ^ °這些尺寸具有±lmil的公差。下置連杆2〇也能夠被 提供成在包封劑26内具有向下的斜坡。 所希望的是,通過鍵合金屬絲37連接到晶片34的鍵 合烊點35的引線指條2位於包封劑26中高處。模組36 和其所固定於其上的印刷電路板(未示出)之間的應力被 減少到?丨線指條32在模組36的包封劑26中被突起的程 -8 -
1231026
度因此,借助於把引線指條3 2提供成與其從包封劑 2 6出來時那樣高,就增強了到電路板的連接可靠性,同 時’借助於提供T置連杆20來平衡包封劑26/中的热應 力畎減少了模組3 6内高放置所導致的應力。 在用塑膠完成包封之後,引線指條32的連接端38 (圖1 b )被切斷,並把引線指條3 2彎曲到用以安裝到 印刷電路板的位置。延伸出包封劑26的下置連杆2〇的 連接端3 8,(圖1 b )被沿著包封劑2 6的邊沿2 6,切斷。 現在,下置連杆20就與引線框22的其餘部分和晶片34 完全分離。 下置連杆2 0的引入將薄小外形塑膠封裝件(T §〇p ) 的寶曲從3. 5 mil減少到了 2mil,即減小了 42%。這種 4〇mil厚的塑膠封裝件使用了 tCE約為13的模制包封 劑’具有丁 C E為3 · 5的矽晶片以及由τ C E約為4的合 金4 2製造的引線框。引線指條3 2約為5 m丨1厚,並位 於距包封劑2 6頂部表面約9 m i 1和距包封劑底部約 26mil的地方。晶片34約為I2mil厚,並且位於距包 封劑2 6頂部表面約1 7 m i 1處。引線指條3 2用厚約 3mil的條帶46a安裝在晶片34上(圖4)。下置連杆 2 0被下置在比包封劑2 6内的引線指條3 2低約1 5 m i 1 處’以便提供彎曲改善。借助於增加下置連杆2 〇的面積 或增加下置量,能夠獲得彎曲的進一步改善。下置連杆 2 0被設計成使到鄰近引線指條3 2的最小間隔為 3 2 m i 1,而到晶片3 4端的最小間隔為2 3 m i 1,以便避免 -9 - 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1231026 A7
模組36内的電短路或機械接合。 部Π』::;在變通實施例中,引線指條323的各個 ’向下設置。在這種情況下,引線指條 U32aU 和恨,以便在比引線框22㈣^ :知…的層3〇更低的層28處提供下置區域32&,。 除了或不用下置連杆2〇,能夠提供引線指條仏的下置 邵分32a,。此外,具有下置區域33,的額外的指停” 可以被提供在各引線指们2a之間的通常未被佔用、的空 間内。 4圖3所717 ’在另一個變通實施例中,下置連杆2〇a 能夠被連接到一個或更多個引線指條3 2 b。在這種情況 下,彎點24a,和24b,在比引線框22a的引線指條… 的層30更低的層28處提供下置連杆2〇a。下置連杆 2〇a連接於其上的引線指條3 2b,最好被電連接到地。如 圖3所示,如果希望的話,下置連杆2〇a可以被分開。 如圖4a所示,在另一個變通實施例中,諸如類比半導 體晶片的物體4 4被提供在比引線指條3 2 a的層3 〇更低 的包封劑26中的層28處。物體44提供力來平衡引線指 條3 2 a所提供的力。物體4 4可以被放置在與積體電路晶 片3 4大致相同的層上。在這種情況下,物體* 4和晶片 3 4都被安裝在用來在裝配過程中固定物體4 4和晶片3 4 位置的帶條46a和46b上。另外,如圖4b和圖4c所 示,物體4 4 ’可以被放置在比晶片3 4低的位置。在這種 情況下,支柱5 0用帶條把物體4 4連接到引線指條 -10- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1231026 五 發明説明 A7 B7 3 2 a ’利用支柱的高度可以控制力。支柱5 Q &夠與物體 44成一整體,並且能夠在模塑或衝壓操作中製造。除了 半導之外,物體4 4、4 4,能用諸如合金4 2、殷鋼、柯 伐鐵鎳鈷合金、或銅-殷鋼-銅之類的金屬來製造。也能夠 用诸如陶瓷或液晶聚合物之類的絕緣體來製造。如圖4 d _ 忖所示,物體44、44,可以有各種各樣的形狀4“、 4 4b 4 4 c。可以設計這些形狀來控制裝配過程中包封劑 的泥動,以便分裂大的平坦表面,從而將物體44、* 鎖定在包封劑内的位置上。提供局部延伸通過物體44、 44’的空、洞,使平坦表面破裂,從而增強了與包封劑的接 觸’並避免了溼氣引起的問題。 雖然此處詳細描述了並在附圖中闡述了本發明的幾種實 施例及其修正’但顯然,能夠在設計下置元件的過程中作 出多種進一步修正而不偏離本發明的範圍。在上述說明書 中’沒有比所附申請專利範圍更窄地限制本發明。給出的 例子只疋為了闡述而不是排他性的。 -11 - 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公爱)
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Claims (1)
- π h t 支 Μ 123Έζ9άζϊ%,7Μ) 六、申請專利範園 D8’, 1· 一種晶片封裝件,包含·· (a)具有接觸焊點的半導體晶片; 、、(J3) ?丨線框’具有-第-主要平面的引線指條, 琢罘一主要平面係從該晶片封裝的一端延伸至鄭近該 接觸ϋ的第-階層’㈣、線指條與該接觸焊點間隔 至少一第一距離; ()匕封β曰日片和部分該引線框的包封劑;以及 (d)、在該包封劑中且與該晶片間隔一第二距離的連 杆4連杆包含-彎曲部分,用以提供一與該第一主 要表面平行且與該第一主要平面相隔一段距離的連杆 、、要表面3連杆主要表面係藉由平衡該引線指條和 d G封Μ間的熱應力而提供一阻止該晶片彎曲的 "S? ° 2. 如申請專利範圍帛i項之晶片封裝件,其中該晶片 有明顯小於封裝件的面積。 3. 如申請專利_ !項之晶片封裝件,其中該晶片 有頂:表面和延伸在該頂部表面上的該引線指條, 中孩第一層由該頂部表面確定。 4·如申請專利㈣第丨項之晶片封裝件,其中該連杆是 引線框材料。 5’如申請專利範圍第4項之晶片封裝件’其中該連杆 含該引線框的彎曲部分,其中該彎曲部分在該包封 裝 力 具 具 其 瓠 包 劑 I 桃狀度適财關家辟(CNS) Μ驗 !231〇26 A BCD 、申請專利範圍 内。 力申清專利範圍第5項之該晶片封裝件,其中該連杆 從鄰近該包封劑的邊沿的位置延伸到鄰近該晶片邊沿 的位置。 如申凊專利範圍第5項之晶片封裝件,其中該連杆具 有A字形狀。 8.如申請專利範圍第5項之晶片封裝件,其中該連杆包 含疋向平行於模塑過程中液體塑膠化合物的流向的支 撐杆。 如申叫專利範圍第5項之晶片封裝件,其中該連杆包 士封裝元成時不電連接到引線指條的部分該引線框。 10·如申請專利範圍第9項之晶片封裝件,其中該連杆與 琢引線指條充分地分隔開,以避免到引線指條的短 路。 U·如申請專利範圍第4項之晶片封裝件,其中該連杆包 含被彎曲的部分引線指條。 12. 如申請專利範圍帛i項之晶片封裝件,其中該包封劑 具有第一 T C E,該引線框具有第二T c £,該晶片具有 第三TCE,而該連杆具有第四TCE,其中該第四 T c E明顯地小於該第一 T c E。 13. 如申請專利範圍第12項之晶片封裝件,其中該第四 TCE在該第二和該第三tce之間。 〇 1_ 本紙張尺度適用中國國家標準(CNS) A4規格Τϋ^797公董)------ 1231026 A8 B8 C8 ____ D8 六、申請專利範圍 14·如申请專利範圍第1 2項之晶片封裝件,其中該第四 T C Ε實質上相似於該第二T C Ε。 15. 如申請專利範圍第1項之晶片封裝件,其中該接觸烊 點被金屬絲連接到該引線,其中該連杆包含不用金屬 絲電連接到該引線的物體。 16. 如申请專利範圍第1 5項之晶片封裝件,還包含條帶, 其中該條帶連接該物體和該引線指條,用來在裝配過 程中固定該物體的位置。 Π·如申請專利範圍第1 6項之晶片封裝件,其中該物體還 包含支柱,其中該支柱被安裝到用來在裝配過程中固 定該物體位置的該條帶。 18. 如申請專利範圍第丨項之晶片封裝件,其中該引線指 條在該包封劑外面具有用來連接到襯底的區域,該引 線指條延伸出用來連接到襯底的該區域上的該第一層 上的該包封劑。 19. 一種製造晶片封裝件的方法,包含下列步驟: (a) 提供具有接觸焊點的半導體晶片; (b) 提供一引線框,具有一第一主要平面上的引線 才曰條,違弟一主要平面係從該晶片封裝的一端延伸至 鄰近4接觸干點的第一階層,該引線指條與該接觸焊 點間隔至少一第一距離; (c )包封該晶片和部分該引線框;以及 -3- 本紙張尺度適用中國國家標準(CNS) A4規格7^ϊ〇 X 297公釐) 1231026 申請專利範圍 (d )提供一在該包封劑中 齡^ ^ 、、 ΤΤ且與琢晶片間隔一第二距 、連杆,該連杆包含一彎曲 楚一、弓两邵分,用以提供一與該 罘一王要表面平行且與該第一 , 示王要千面相隔一段距離 勺連杆主要表面,該連杆 把王要表面係精由平衡該引線 才曰‘和孩包封劑間的埶岸 …4刀而棱供—阻止該晶片彎曲 的力量。 20.如申請專利範圍第 “万法,其中該晶片實質上小 於封裝件的面積。 孔如申請專利範圍第19項之方法,其中該晶片具有頂部 表面以及延伸在該頂部表面上的該引線,其中該第一 層由該頂部表面確定。 22. 如申請專利範圍第 ^ ,、足万法,其中該連杆是該引線 框的一個整體部分。 23. 如申請專利範圍第22項之方法,其中該提供步驟⑻ 包3鹜曲部分孩引線框以形成該步驟(d)的該連杆的步 驟’其中該彎曲部分在該包封劑内。 24. 如申請專利範圍第23項之方法,其中在該彎曲部分該 引線框的步驟包含第一彎點和第二彎點,這樣該部分 平仃於该引線框的其他部分,並位於該引線框的該其 他部分下面的特定距離處。 25·如申請專利範圍第24項之方法,其中該彎曲步驟 包含用工具夾住該引線框和壓住該部分以提供該第一 -4- 本紙張尺度適财酬家鮮(CNS) A4規格(21QX297公董)' 1231026 A8 B8 C8包封劑邊沿的位置延伸到鄰近該E 27.如申請專利範圍第2 3項之方法, 和第二彎點的步驟。 26.如中請專利範圍第2 3 形狀。 28.如中請專利範圍第2 3 ’其中該連杆從鄰近該 晶片邊沿的位置。 ,其中該連杆具有A字 元成時並不電連接到引線指條的部分該引線框。 项之方法, 項之方法,其中該連杆包含封裝 該提供步驟(b )包含 其中该連杆在該包封 29·如申請專利範圍第2 3項之方法, 彎曲部分引線指條的步驟。 30·如申請專利範圍第2 3項之方法, 劑内傾斜。 31.如申請專利範圍第19項之方法,其中該包封劑具有第 一 TCE,該引線框具有第二TCE,該晶片具有第三 TCE,而該連杆具有第四TCE,其中第四tce實質 上小於該第一 T C E。 32·如申請專利範圍第3 !項之方法,其中該第四τ c E在 奋亥弟一 TCE和該第三TCE之間。 33·如申請專利範圍第3 1項之方法,其中第四τ c E約等 於該第二T C E。 34·如申請專利範圍第1 9項之方法,其中該接觸焊點被金 屬絲連接到該引線,其中該提供步驟(d)包含提供不被 金屬絲電連接到該引線的物體。 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 1231026 A8 B8 C8 D8 申請專利範圍 5·如申请專利範圍第3 4項之方法,其中該物體包含條 帶’其中該條帶連接該物體和該引線指條,用來在裝 配過程中固定該物體的位置。 6·如申清專利範圍第3 5項之方法,其中該物體還包含支 柱’其中該支柱被安裝到用來在裝配過程中固定該物 體位置的該條帶。 37·如申清專利範圍第1 $項之方法,其中該引線指條在包 封劑外面具有用來連接到襯底的區域,該引線指條延 伸出用來連接到襯底的該區域上的該第一層上的謗包 封劑,其中該第二層在該第一層下面。 38·如申請專利範圍第1 9項之方法,其中該包封劑具有丁貝 部表面和底部表面,且其中該引線指條延伸出距謗項 部表面比該底部表面更近的包封劑。 -6- 本紙張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐)
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US09/605,173 US6603195B1 (en) | 2000-06-28 | 2000-06-28 | Planarized plastic package modules for integrated circuits |
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US (1) | US6603195B1 (zh) |
JP (1) | JP2002043494A (zh) |
KR (1) | KR100444242B1 (zh) |
CN (1) | CN1180478C (zh) |
BR (1) | BR0102606A (zh) |
CA (1) | CA2350057A1 (zh) |
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JP4755214B2 (ja) * | 2008-02-22 | 2011-08-24 | 力成科技股▲分▼有限公司 | リードフレーム及びそれを用いる半導体装置 |
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CN101540307B (zh) * | 2008-03-20 | 2010-10-20 | 力成科技股份有限公司 | 引脚在芯片上的半导体封装构造 |
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-
2000
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- 2001-06-21 MY MYPI20012927A patent/MY119889A/en unknown
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- 2001-06-27 CN CNB011226374A patent/CN1180478C/zh not_active Expired - Fee Related
- 2001-06-27 JP JP2001194587A patent/JP2002043494A/ja active Pending
- 2001-06-28 BR BR0102606-2A patent/BR0102606A/pt not_active IP Right Cessation
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Cited By (1)
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TWI774164B (zh) * | 2016-04-20 | 2022-08-11 | 美商艾馬克科技公司 | 形成具有導電的互連框的半導體封裝之方法及結構 |
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CN1180478C (zh) | 2004-12-15 |
HK1042591B (zh) | 2005-05-13 |
US6603195B1 (en) | 2003-08-05 |
MY119889A (en) | 2005-07-29 |
BR0102606A (pt) | 2002-02-13 |
CN1334603A (zh) | 2002-02-06 |
JP2002043494A (ja) | 2002-02-08 |
KR20020001521A (ko) | 2002-01-09 |
CA2350057A1 (en) | 2001-12-28 |
KR100444242B1 (ko) | 2004-08-11 |
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