TWD173714S - 積體電路插座用探針引腳之部分 - Google Patents

積體電路插座用探針引腳之部分

Info

Publication number
TWD173714S
TWD173714S TW104303165F TW104303165F TWD173714S TW D173714 S TWD173714 S TW D173714S TW 104303165 F TW104303165 F TW 104303165F TW 104303165 F TW104303165 F TW 104303165F TW D173714 S TWD173714 S TW D173714S
Authority
TW
Taiwan
Prior art keywords
case
integrated circuit
design
socket
probe pin
Prior art date
Application number
TW104303165F
Other languages
English (en)
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司 filed Critical 歐姆龍股份有限公司
Publication of TWD173714S publication Critical patent/TWD173714S/zh

Links

TW104303165F 2014-12-15 2015-06-11 積體電路插座用探針引腳之部分 TWD173714S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27891F JP1529606S (fr) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD173714S true TWD173714S (zh) 2016-02-11

Family

ID=53764633

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303165F TWD173714S (zh) 2014-12-15 2015-06-11 積體電路插座用探針引腳之部分

Country Status (3)

Country Link
US (1) USD769747S1 (fr)
JP (1) JP1529606S (fr)
TW (1) TWD173714S (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (fr) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contacteur et dispositif de connexion électrique
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
TWD138876S1 (zh) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 電接觸元件
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
JP5352525B2 (ja) 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
JP1529606S (fr) 2015-07-27
USD769747S1 (en) 2016-10-25

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