TW533520B - Multi-chip bonding method and apparatus - Google Patents

Multi-chip bonding method and apparatus Download PDF

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Publication number
TW533520B
TW533520B TW089124040A TW89124040A TW533520B TW 533520 B TW533520 B TW 533520B TW 089124040 A TW089124040 A TW 089124040A TW 89124040 A TW89124040 A TW 89124040A TW 533520 B TW533520 B TW 533520B
Authority
TW
Taiwan
Prior art keywords
substrate
wafer ring
bonding
wafer
electronic component
Prior art date
Application number
TW089124040A
Other languages
English (en)
Chinese (zh)
Inventor
Tsutomu Mimata
Osamu Kakutani
Original Assignee
Shinkawa Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinkawa Kk filed Critical Shinkawa Kk
Application granted granted Critical
Publication of TW533520B publication Critical patent/TW533520B/zh

Links

Classifications

    • H10P72/0446
    • H10W72/071
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/907Continuous processing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Die Bonding (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
TW089124040A 1999-12-24 2000-11-14 Multi-chip bonding method and apparatus TW533520B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP36616399A JP4128319B2 (ja) 1999-12-24 1999-12-24 マルチチップボンディング方法及び装置

Publications (1)

Publication Number Publication Date
TW533520B true TW533520B (en) 2003-05-21

Family

ID=18486081

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089124040A TW533520B (en) 1999-12-24 2000-11-14 Multi-chip bonding method and apparatus

Country Status (4)

Country Link
US (1) US6383844B2 (enExample)
JP (1) JP4128319B2 (enExample)
KR (1) KR100400106B1 (enExample)
TW (1) TW533520B (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3667241B2 (ja) * 2001-03-09 2005-07-06 松下電器産業株式会社 ボンディング方法および装置
JP4800524B2 (ja) * 2001-09-10 2011-10-26 ルネサスエレクトロニクス株式会社 半導体装置の製造方法、及び、製造装置
JP4390503B2 (ja) * 2003-08-27 2009-12-24 パナソニック株式会社 部品実装装置及び部品実装方法
US7244636B2 (en) * 2005-10-19 2007-07-17 Texas Instruments Incorporated Semiconductor assembly for improved device warpage and solder ball coplanarity
EP1941536B8 (de) * 2005-10-26 2019-06-19 Kulicke and Soffa (Switzerland) Management GmbH Verfahren und vorrichtung zum ablegen von elektronischen bauteilen, insbesondere halbleiterchips, auf einem substrat
JP4714026B2 (ja) * 2006-01-10 2011-06-29 株式会社東芝 電子部品実装装置、電子部品実装方法及び電子部品装置
US7677431B2 (en) * 2006-10-19 2010-03-16 Asm Technology Singapore Pte Ltd. Electronic device handler for a bonding apparatus
KR100787968B1 (ko) 2007-02-13 2007-12-24 세광테크 주식회사 칩공급부가 구비된 cog 장치
EP2299486B1 (de) * 2009-09-18 2015-02-18 EV Group E. Thallner GmbH Verfahren zum Bonden von Chips auf Wafer
US8546802B2 (en) * 2011-11-07 2013-10-01 Taiwan Semiconductor Manufacturing Company, Ltd. Pick-and-place tool for packaging process
US9105760B2 (en) 2011-11-07 2015-08-11 Taiwan Semiconductor Manufacturing Company, Ltd. Pick-and-place tool for packaging process
JP5959948B2 (ja) * 2012-06-13 2016-08-02 キヤノンマシナリー株式会社 ウエハリング交換装置およびチップ実装装置
JP5959949B2 (ja) * 2012-06-13 2016-08-02 キヤノンマシナリー株式会社 チップ実装装置
KR101422401B1 (ko) * 2013-04-03 2014-07-22 세메스 주식회사 발광 소자 칩 본딩 장치
TWI607587B (zh) * 2016-09-13 2017-12-01 台灣琭旦股份有限公司 固晶穩固製程
CN110891726B (zh) * 2017-04-04 2021-08-24 库利克和索夫工业公司 超声焊接系统及其使用方法
CN109638142A (zh) * 2019-01-22 2019-04-16 先进光电器材(深圳)有限公司 晶环装置
WO2023100831A1 (ja) * 2021-11-30 2023-06-08 ボンドテック株式会社 チップ周部剥離装置、チップ供給装置、チップ供給システム、チップ接合システム、ピックアップ装置、チップ周部剥離方法、チップ供給方法、チップ接合方法およびピックアップ方法
CN115714101B (zh) * 2022-11-09 2023-11-14 长园半导体设备(珠海)有限公司 上料装置及切换方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5528397A (en) * 1991-12-03 1996-06-18 Kopin Corporation Single crystal silicon transistors for display panels
US5273622A (en) * 1991-01-28 1993-12-28 Sarcos Group System for continuous fabrication of micro-structures and thin film semiconductor devices on elongate substrates
JP2666788B2 (ja) * 1995-10-19 1997-10-22 日本電気株式会社 チップサイズ半導体装置の製造方法
JP3504543B2 (ja) * 1999-03-03 2004-03-08 株式会社日立製作所 半導体素子の分離方法およびその装置並びに半導体素子の搭載方法
US6312974B1 (en) * 2000-10-26 2001-11-06 Industrial Technology Research Institute Simultaneous bumping/bonding process utilizing edge-type conductive pads and device fabricated

Also Published As

Publication number Publication date
JP4128319B2 (ja) 2008-07-30
KR20010062479A (ko) 2001-07-07
JP2001185565A (ja) 2001-07-06
US6383844B2 (en) 2002-05-07
KR100400106B1 (ko) 2003-09-29
US20010005602A1 (en) 2001-06-28

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