TW451257B - Plasma display phosphor inspecting device - Google Patents

Plasma display phosphor inspecting device Download PDF

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Publication number
TW451257B
TW451257B TW089108592A TW89108592A TW451257B TW 451257 B TW451257 B TW 451257B TW 089108592 A TW089108592 A TW 089108592A TW 89108592 A TW89108592 A TW 89108592A TW 451257 B TW451257 B TW 451257B
Authority
TW
Taiwan
Prior art keywords
light
phosphor
plasma display
inspection
inspection device
Prior art date
Application number
TW089108592A
Other languages
English (en)
Chinese (zh)
Inventor
Akira Kobayashi
Masatoshi Nakamura
Ryuichi Inoue
Takeshi Nomura
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of TW451257B publication Critical patent/TW451257B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Gas-Filled Discharge Tubes (AREA)
TW089108592A 1998-11-06 2000-05-05 Plasma display phosphor inspecting device TW451257B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP31552898A JP3673657B2 (ja) 1998-11-06 1998-11-06 プラズマディスプレイ蛍光体の検査装置および検査方法
US09/629,365 US6697514B1 (en) 1998-11-06 2000-08-01 Apparatus for inspecting a fluorescent substance on a plasma display

Publications (1)

Publication Number Publication Date
TW451257B true TW451257B (en) 2001-08-21

Family

ID=32396163

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089108592A TW451257B (en) 1998-11-06 2000-05-05 Plasma display phosphor inspecting device

Country Status (3)

Country Link
US (1) US6697514B1 (https=)
JP (1) JP3673657B2 (https=)
TW (1) TW451257B (https=)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1096249B1 (en) * 1999-10-26 2013-05-01 Hitachi-GE Nuclear Energy, Ltd. Nondestructive flaw inspection method and apparatus
JP4514913B2 (ja) * 2000-07-24 2010-07-28 パナソニック株式会社 カラーディスプレイ用部材の目視検査装置及び目視検査方法ならびに製造装置
JP3657930B2 (ja) 2002-07-05 2005-06-08 パイオニアプラズマディスプレイ株式会社 プラズマディスプレイパネルの製造方法、蛍光体層の検査方法及び蛍光体層の検査装置
JP2004085348A (ja) * 2002-08-27 2004-03-18 Dainippon Printing Co Ltd ３色パターンの検査装置および方法
KR100925275B1 (ko) * 2002-11-04 2009-11-05 엘지전자 주식회사 플라즈마 디스플레이 패널의 형광체 검사 장치 및 방법
KR100541449B1 (ko) * 2003-07-23 2006-01-11 삼성전자주식회사 패널검사장치
TW200700799A (en) * 2005-06-24 2007-01-01 Innolux Display Corp Testing system of liquid crystal display
JP4673151B2 (ja) * 2005-06-30 2011-04-20 株式会社日立国際電気 蛍光体の印刷ずれ検査方法
JP4672497B2 (ja) * 2005-09-21 2011-04-20 株式会社日立国際電気 蛍光体パネルの検査装置
US20070128445A1 (en) * 2005-12-05 2007-06-07 Lear Corporation Method of making and inspecting an in mold coated article
EP1969355B1 (de) * 2005-12-16 2012-04-11 Automation W+R GmbH Verfahren und anordnung zur erkennung von materialfehlern in werkstücken
JP2007265679A (ja) * 2006-03-27 2007-10-11 Hitachi Kokusai Electric Inc 蛍光体検査装置
US8111919B2 (en) * 2008-02-04 2012-02-07 Eyep, Inc. Feature encoding system and method for connected component labeling
JP2008216260A (ja) * 2008-03-18 2008-09-18 Hitachi Kokusai Electric Inc 蛍光体検査装置
JP5424660B2 (ja) * 2009-01-23 2014-02-26 株式会社サキコーポレーション 被検査体の検査装置
JP5424659B2 (ja) * 2009-01-23 2014-02-26 株式会社サキコーポレーション 被検査体の検査装置
JP2011023638A (ja) * 2009-07-17 2011-02-03 Toshiba Corp 検査領域設定方法
JP2013205055A (ja) * 2012-03-27 2013-10-07 Sinto S-Precision Ltd 測定機
KR101472444B1 (ko) * 2012-06-18 2014-12-24 삼성테크윈 주식회사 발광 다이오드의 형광체 위치 파악 장치, 발광 다이오드의 형광체 위치 파악 장치를 포함한 부품 실장기, 발광 다이오드의 형광체 위치 파악 방법 및 렌즈 설치 방법
CN105511122B (zh) * 2015-11-25 2019-06-07 武汉精测电子集团股份有限公司 一种基于在线机器视觉检测的自动定位对焦检测装置
JP2024509762A (ja) * 2021-02-22 2024-03-05 アプライド マテリアルズ インコーポレイテッド ディスプレイ製造における基板を検査するための装置及び方法並びに基板を処理するためのシステム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4758728A (en) * 1985-12-24 1988-07-19 Rca Licensing Corporation Method of measuring mask misregistry in kinescope panel assemblies
US5828356A (en) * 1992-08-21 1998-10-27 Photonics Systems Corporation Plasma display gray scale drive system and method
JPH06260091A (ja) * 1993-03-01 1994-09-16 Mitsubishi Electric Corp 陰極線管構成部材の検査方法及びその実施に使用する装置
JP3297950B2 (ja) * 1993-07-13 2002-07-02 シャープ株式会社 平面型表示パネル検査装置
US5663569A (en) * 1993-10-14 1997-09-02 Nikon Corporation Defect inspection method and apparatus, and defect display method
US5928821A (en) * 1995-12-22 1999-07-27 Thomson Consumer Electronics, Inc. Method of manufacturing a phosphor screen for a CRT
US5790913A (en) * 1996-10-09 1998-08-04 Thomson Consumer Electronics, Inc. Method and apparatus for manufacturing a color CRT
US5876884A (en) * 1997-10-02 1999-03-02 Fujitsu Limited Method of fabricating a flat-panel display device and an apparatus therefore

Also Published As

Publication number Publication date
US6697514B1 (en) 2004-02-24
JP3673657B2 (ja) 2005-07-20
JP2000149781A (ja) 2000-05-30

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