TW365003B - Method and system for testing memory - Google Patents

Method and system for testing memory

Info

Publication number
TW365003B
TW365003B TW086113723A TW86113723A TW365003B TW 365003 B TW365003 B TW 365003B TW 086113723 A TW086113723 A TW 086113723A TW 86113723 A TW86113723 A TW 86113723A TW 365003 B TW365003 B TW 365003B
Authority
TW
Taiwan
Prior art keywords
memory
random access
access memory
bus
parallel
Prior art date
Application number
TW086113723A
Other languages
English (en)
Inventor
Brian Tse Deng
Henry N Angulo
Bob Gugel
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=21834899&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TW365003(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of TW365003B publication Critical patent/TW365003B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L12/00—Data switching networks
    • H04L12/28—Data switching networks characterised by path configuration, e.g. LAN [Local Area Networks] or WAN [Wide Area Networks]
    • H04L12/40—Bus networks
    • H04L12/40052—High-speed IEEE 1394 serial bus
    • H04L12/40123—Interconnection of computers and peripherals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
TW086113723A 1996-09-20 1997-09-27 Method and system for testing memory TW365003B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US2697196P 1996-09-20 1996-09-20

Publications (1)

Publication Number Publication Date
TW365003B true TW365003B (en) 1999-07-21

Family

ID=21834899

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086113723A TW365003B (en) 1996-09-20 1997-09-27 Method and system for testing memory

Country Status (7)

Country Link
US (1) US5815509A (zh)
EP (1) EP0831496B1 (zh)
JP (1) JPH10133965A (zh)
KR (1) KR19980024806A (zh)
DE (1) DE69717385T2 (zh)
SG (1) SG63746A1 (zh)
TW (1) TW365003B (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6141767A (en) * 1998-04-03 2000-10-31 Sony Corporation Method of and apparatus for verifying reliability of contents within the configuration ROM of IEEE 1394-1995 devices
US6182179B1 (en) * 1998-04-20 2001-01-30 National Instruments Corporation System that is able to read and write using a transmission medium and is able to read stored information via a model information structure using a different transmission medium
US6094530A (en) * 1998-04-29 2000-07-25 Intel Corporation Remotely monitoring execution of a program
GB2338791B (en) * 1998-06-22 2002-09-18 Advanced Risc Mach Ltd Apparatus and method for testing master logic units within a data processing apparatus
US6247151B1 (en) * 1998-06-30 2001-06-12 Intel Corporation Method and apparatus for verifying that data stored in a memory has not been corrupted
KR100295444B1 (ko) * 1998-09-21 2001-07-12 윤종용 원격억세스서버의모뎀가입자정합장치
JP3606133B2 (ja) * 1999-10-15 2005-01-05 セイコーエプソン株式会社 データ転送制御装置及び電子機器
US6704820B1 (en) * 2000-02-18 2004-03-09 Hewlett-Packard Development Company, L.P. Unified cache port consolidation
US6757763B1 (en) * 2000-04-07 2004-06-29 Infineon Technologies North America Corpration Universal serial bus interfacing using FIFO buffers
US6643728B1 (en) 2000-05-30 2003-11-04 Lexmark International, Inc. Method and apparatus for converting IEEE 1284 signals to or from IEEE 1394 signals
US20030204796A1 (en) * 2002-04-24 2003-10-30 Wen-Hsi Lin Serial input/output testing method
US7428678B1 (en) * 2004-09-22 2008-09-23 Cypress Semiconductor Corporation Scan testing of integrated circuits with high-speed serial interface
US8176406B2 (en) * 2008-03-19 2012-05-08 International Business Machines Corporation Hard error detection
JP5309938B2 (ja) * 2008-12-05 2013-10-09 富士通株式会社 要求処理装置、要求処理システムおよびアクセス試験方法
US10489241B2 (en) * 2015-12-30 2019-11-26 Arteris, Inc. Control and address redundancy in storage buffer
KR102533377B1 (ko) * 2018-04-13 2023-05-18 삼성전자주식회사 로드 생성기를 포함하는 메모리 장치 및 그것을 동작시키는 방법
CN113126913A (zh) * 2021-03-26 2021-07-16 井芯微电子技术(天津)有限公司 一种基于并行ram的数据阵列管理方法、装置和存储设备

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4788683A (en) * 1986-01-14 1988-11-29 Ibm Corporation Data processing system emulation with microprocessor in place
US5167020A (en) * 1989-05-25 1992-11-24 The Boeing Company Serial data transmitter with dual buffers operating separately and having scan and self test modes
US5428806A (en) * 1993-01-22 1995-06-27 Pocrass; Alan L. Computer networking system including central chassis with processor and input/output modules, remote transceivers, and communication links between the transceivers and input/output modules

Also Published As

Publication number Publication date
JPH10133965A (ja) 1998-05-22
DE69717385D1 (de) 2003-01-09
DE69717385T2 (de) 2003-06-12
EP0831496B1 (en) 2002-11-27
SG63746A1 (en) 1999-03-30
EP0831496A2 (en) 1998-03-25
EP0831496A3 (en) 1999-06-02
KR19980024806A (ko) 1998-07-06
US5815509A (en) 1998-09-29

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees