DE69717385D1 - Verfahren und System zur Speichereinrichtungsprüfung - Google Patents

Verfahren und System zur Speichereinrichtungsprüfung

Info

Publication number
DE69717385D1
DE69717385D1 DE69717385T DE69717385T DE69717385D1 DE 69717385 D1 DE69717385 D1 DE 69717385D1 DE 69717385 T DE69717385 T DE 69717385T DE 69717385 T DE69717385 T DE 69717385T DE 69717385 D1 DE69717385 D1 DE 69717385D1
Authority
DE
Germany
Prior art keywords
storage device
inspection method
device inspection
storage
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69717385T
Other languages
English (en)
Other versions
DE69717385T2 (de
Inventor
Brian Tse Deng
Henry N Angulo
Bob Gugel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=21834899&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69717385(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69717385D1 publication Critical patent/DE69717385D1/de
Application granted granted Critical
Publication of DE69717385T2 publication Critical patent/DE69717385T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L12/00—Data switching networks
    • H04L12/28—Data switching networks characterised by path configuration, e.g. LAN [Local Area Networks] or WAN [Wide Area Networks]
    • H04L12/40—Bus networks
    • H04L12/40052—High-speed IEEE 1394 serial bus
    • H04L12/40123—Interconnection of computers and peripherals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69717385T 1996-09-20 1997-09-19 Verfahren und System zur Speichereinrichtungsprüfung Expired - Lifetime DE69717385T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US2697196P 1996-09-20 1996-09-20

Publications (2)

Publication Number Publication Date
DE69717385D1 true DE69717385D1 (de) 2003-01-09
DE69717385T2 DE69717385T2 (de) 2003-06-12

Family

ID=21834899

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69717385T Expired - Lifetime DE69717385T2 (de) 1996-09-20 1997-09-19 Verfahren und System zur Speichereinrichtungsprüfung

Country Status (7)

Country Link
US (1) US5815509A (de)
EP (1) EP0831496B1 (de)
JP (1) JPH10133965A (de)
KR (1) KR19980024806A (de)
DE (1) DE69717385T2 (de)
SG (1) SG63746A1 (de)
TW (1) TW365003B (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6141767A (en) * 1998-04-03 2000-10-31 Sony Corporation Method of and apparatus for verifying reliability of contents within the configuration ROM of IEEE 1394-1995 devices
US6182179B1 (en) * 1998-04-20 2001-01-30 National Instruments Corporation System that is able to read and write using a transmission medium and is able to read stored information via a model information structure using a different transmission medium
US6094530A (en) * 1998-04-29 2000-07-25 Intel Corporation Remotely monitoring execution of a program
GB2338791B (en) * 1998-06-22 2002-09-18 Advanced Risc Mach Ltd Apparatus and method for testing master logic units within a data processing apparatus
US6247151B1 (en) * 1998-06-30 2001-06-12 Intel Corporation Method and apparatus for verifying that data stored in a memory has not been corrupted
KR100295444B1 (ko) * 1998-09-21 2001-07-12 윤종용 원격억세스서버의모뎀가입자정합장치
JP3606133B2 (ja) * 1999-10-15 2005-01-05 セイコーエプソン株式会社 データ転送制御装置及び電子機器
US6704820B1 (en) * 2000-02-18 2004-03-09 Hewlett-Packard Development Company, L.P. Unified cache port consolidation
US6757763B1 (en) * 2000-04-07 2004-06-29 Infineon Technologies North America Corpration Universal serial bus interfacing using FIFO buffers
US6643728B1 (en) 2000-05-30 2003-11-04 Lexmark International, Inc. Method and apparatus for converting IEEE 1284 signals to or from IEEE 1394 signals
US20030204796A1 (en) * 2002-04-24 2003-10-30 Wen-Hsi Lin Serial input/output testing method
US7428678B1 (en) * 2004-09-22 2008-09-23 Cypress Semiconductor Corporation Scan testing of integrated circuits with high-speed serial interface
US8176406B2 (en) * 2008-03-19 2012-05-08 International Business Machines Corporation Hard error detection
JP5309938B2 (ja) * 2008-12-05 2013-10-09 富士通株式会社 要求処理装置、要求処理システムおよびアクセス試験方法
US10489241B2 (en) * 2015-12-30 2019-11-26 Arteris, Inc. Control and address redundancy in storage buffer
CN113126913A (zh) * 2021-03-26 2021-07-16 井芯微电子技术(天津)有限公司 一种基于并行ram的数据阵列管理方法、装置和存储设备

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4788683A (en) * 1986-01-14 1988-11-29 Ibm Corporation Data processing system emulation with microprocessor in place
US5167020A (en) * 1989-05-25 1992-11-24 The Boeing Company Serial data transmitter with dual buffers operating separately and having scan and self test modes
US5428806A (en) * 1993-01-22 1995-06-27 Pocrass; Alan L. Computer networking system including central chassis with processor and input/output modules, remote transceivers, and communication links between the transceivers and input/output modules

Also Published As

Publication number Publication date
US5815509A (en) 1998-09-29
EP0831496B1 (de) 2002-11-27
TW365003B (en) 1999-07-21
JPH10133965A (ja) 1998-05-22
KR19980024806A (ko) 1998-07-06
EP0831496A2 (de) 1998-03-25
DE69717385T2 (de) 2003-06-12
EP0831496A3 (de) 1999-06-02
SG63746A1 (en) 1999-03-30

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Legal Events

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8364 No opposition during term of opposition