TW202436879A - 探針 - Google Patents

探針 Download PDF

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Publication number
TW202436879A
TW202436879A TW113109041A TW113109041A TW202436879A TW 202436879 A TW202436879 A TW 202436879A TW 113109041 A TW113109041 A TW 113109041A TW 113109041 A TW113109041 A TW 113109041A TW 202436879 A TW202436879 A TW 202436879A
Authority
TW
Taiwan
Prior art keywords
plunger
coil portion
coil
plane
coil spring
Prior art date
Application number
TW113109041A
Other languages
English (en)
Chinese (zh)
Inventor
林拓也
Original Assignee
日商友華股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商友華股份有限公司 filed Critical 日商友華股份有限公司
Publication of TW202436879A publication Critical patent/TW202436879A/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW113109041A 2023-03-13 2024-03-12 探針 TW202436879A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023-038240 2023-03-13
JP2023038240A JP2024129204A (ja) 2023-03-13 2023-03-13 プローブ

Publications (1)

Publication Number Publication Date
TW202436879A true TW202436879A (zh) 2024-09-16

Family

ID=92754713

Family Applications (1)

Application Number Title Priority Date Filing Date
TW113109041A TW202436879A (zh) 2023-03-13 2024-03-12 探針

Country Status (5)

Country Link
JP (1) JP2024129204A (https=)
KR (1) KR20250162545A (https=)
CN (1) CN120898135A (https=)
TW (1) TW202436879A (https=)
WO (1) WO2024190069A1 (https=)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001255340A (ja) * 2000-03-13 2001-09-21 Yokowo Co Ltd コンタクトプローブ及び該コンタクトプローブを設けたｉｃパッケージ検査用ソケット
JP2002008761A (ja) * 2000-06-23 2002-01-11 Tyco Electronics Amp Kk スプリングコンタクト
JP5197754B2 (ja) * 2009-11-13 2013-05-15 テスト ツーリング ソリューションズ グループ ピイ ティ イー リミテッド プローブピン
JP5987447B2 (ja) * 2012-04-23 2016-09-07 株式会社デンソー 検査装置
JP2016008904A (ja) * 2014-06-25 2016-01-18 株式会社ミタカ コンタクトプローブ
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Also Published As

Publication number Publication date
WO2024190069A1 (ja) 2024-09-19
CN120898135A (zh) 2025-11-04
JP2024129204A (ja) 2024-09-27
KR20250162545A (ko) 2025-11-18

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