JP2024129204A - プローブ - Google Patents

プローブ Download PDF

Info

Publication number
JP2024129204A
JP2024129204A JP2023038240A JP2023038240A JP2024129204A JP 2024129204 A JP2024129204 A JP 2024129204A JP 2023038240 A JP2023038240 A JP 2023038240A JP 2023038240 A JP2023038240 A JP 2023038240A JP 2024129204 A JP2024129204 A JP 2024129204A
Authority
JP
Japan
Prior art keywords
plunger
coil
coil portion
plane
barrel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023038240A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024129204A5 (https=
Inventor
拓也 林
Takuya Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd, Yokowo Mfg Co Ltd filed Critical Yokowo Co Ltd
Priority to JP2023038240A priority Critical patent/JP2024129204A/ja
Priority to PCT/JP2024/001241 priority patent/WO2024190069A1/ja
Priority to CN202480018337.7A priority patent/CN120898135A/zh
Priority to KR1020257030369A priority patent/KR20250162545A/ko
Priority to TW113109041A priority patent/TW202436879A/zh
Publication of JP2024129204A publication Critical patent/JP2024129204A/ja
Publication of JP2024129204A5 publication Critical patent/JP2024129204A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2023038240A 2023-03-13 2023-03-13 プローブ Pending JP2024129204A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2023038240A JP2024129204A (ja) 2023-03-13 2023-03-13 プローブ
PCT/JP2024/001241 WO2024190069A1 (ja) 2023-03-13 2024-01-18 プローブ
CN202480018337.7A CN120898135A (zh) 2023-03-13 2024-01-18 探针
KR1020257030369A KR20250162545A (ko) 2023-03-13 2024-01-18 프로브
TW113109041A TW202436879A (zh) 2023-03-13 2024-03-12 探針

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023038240A JP2024129204A (ja) 2023-03-13 2023-03-13 プローブ

Publications (2)

Publication Number Publication Date
JP2024129204A true JP2024129204A (ja) 2024-09-27
JP2024129204A5 JP2024129204A5 (https=) 2026-03-19

Family

ID=92754713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023038240A Pending JP2024129204A (ja) 2023-03-13 2023-03-13 プローブ

Country Status (5)

Country Link
JP (1) JP2024129204A (https=)
KR (1) KR20250162545A (https=)
CN (1) CN120898135A (https=)
TW (1) TW202436879A (https=)
WO (1) WO2024190069A1 (https=)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001255340A (ja) * 2000-03-13 2001-09-21 Yokowo Co Ltd コンタクトプローブ及び該コンタクトプローブを設けたｉｃパッケージ検査用ソケット
JP2002008761A (ja) * 2000-06-23 2002-01-11 Tyco Electronics Amp Kk スプリングコンタクト
JP5197754B2 (ja) * 2009-11-13 2013-05-15 テスト ツーリング ソリューションズ グループ ピイ ティ イー リミテッド プローブピン
JP5987447B2 (ja) * 2012-04-23 2016-09-07 株式会社デンソー 検査装置
JP2016008904A (ja) * 2014-06-25 2016-01-18 株式会社ミタカ コンタクトプローブ
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Also Published As

Publication number Publication date
WO2024190069A1 (ja) 2024-09-19
TW202436879A (zh) 2024-09-16
CN120898135A (zh) 2025-11-04
KR20250162545A (ko) 2025-11-18

Similar Documents

Publication Publication Date Title
KR101869335B1 (ko) 프로브 핀 및 그 제조방법
US8710856B2 (en) Terminal for flat test probe
JP5858781B2 (ja) プローブピン及び電気部品用ソケット
TW201730566A (zh) 探針以及使用該探針的檢查裝置
JP2004503750A (ja) 自己保持型ばねプローブ
JP4964754B2 (ja) コンタクト部材
JP6642359B2 (ja) プローブピンおよび検査ユニット
JP6553472B2 (ja) コンタクタ
JP4999079B2 (ja) プローブ
US9784764B2 (en) Probe and method of manufacturing probe
WO2016092916A1 (ja) プローブピン、および、これを備えた電子デバイス
US9236199B2 (en) Switch
US10312621B2 (en) Terminal connection structure
JP2024129204A (ja) プローブ
WO2019131438A1 (ja) プローブピン及びソケット
CN105556758A (zh) 弹簧连接器
JP2019153399A (ja) 接続端子
CN118777649A (zh) 接触探针及用于电气部件测试的插座
JP5567523B2 (ja) 接続ピン
US12596137B2 (en) Pogo pin with adjustable elastic force
JP6322407B2 (ja) 電子機器
CN118946811A (zh) 弹簧连接器
US20230178906A1 (en) Spring connector
US20230058577A1 (en) Contact pin and socket
JP7267799B2 (ja) 音叉振動子を備える荷重センサ

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20260311

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20260311