KR20250162545A - 프로브 - Google Patents

프로브

Info

Publication number
KR20250162545A
KR20250162545A KR1020257030369A KR20257030369A KR20250162545A KR 20250162545 A KR20250162545 A KR 20250162545A KR 1020257030369 A KR1020257030369 A KR 1020257030369A KR 20257030369 A KR20257030369 A KR 20257030369A KR 20250162545 A KR20250162545 A KR 20250162545A
Authority
KR
South Korea
Prior art keywords
plunger
coil
plane
barrel
coil portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020257030369A
Other languages
English (en)
Korean (ko)
Inventor
다쿠야 하야시
Original Assignee
가부시키가이샤 요코오
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 요코오 filed Critical 가부시키가이샤 요코오
Publication of KR20250162545A publication Critical patent/KR20250162545A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1020257030369A 2023-03-13 2024-01-18 프로브 Pending KR20250162545A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023038240A JP2024129204A (ja) 2023-03-13 2023-03-13 プローブ
JPJP-P-2023-038240 2023-03-13
PCT/JP2024/001241 WO2024190069A1 (ja) 2023-03-13 2024-01-18 プローブ

Publications (1)

Publication Number Publication Date
KR20250162545A true KR20250162545A (ko) 2025-11-18

Family

ID=92754713

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020257030369A Pending KR20250162545A (ko) 2023-03-13 2024-01-18 프로브

Country Status (5)

Country Link
JP (1) JP2024129204A (https=)
KR (1) KR20250162545A (https=)
CN (1) CN120898135A (https=)
TW (1) TW202436879A (https=)
WO (1) WO2024190069A1 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001255340A (ja) * 2000-03-13 2001-09-21 Yokowo Co Ltd コンタクトプローブ及び該コンタクトプローブを設けたｉｃパッケージ検査用ソケット
JP2002008761A (ja) * 2000-06-23 2002-01-11 Tyco Electronics Amp Kk スプリングコンタクト
JP5197754B2 (ja) * 2009-11-13 2013-05-15 テスト ツーリング ソリューションズ グループ ピイ ティ イー リミテッド プローブピン
JP5987447B2 (ja) * 2012-04-23 2016-09-07 株式会社デンソー 検査装置
JP2016008904A (ja) * 2014-06-25 2016-01-18 株式会社ミタカ コンタクトプローブ

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット

Also Published As

Publication number Publication date
WO2024190069A1 (ja) 2024-09-19
TW202436879A (zh) 2024-09-16
CN120898135A (zh) 2025-11-04
JP2024129204A (ja) 2024-09-27

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Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

Q12 Application published

Free format text: ST27 STATUS EVENT CODE: A-1-1-Q10-Q12-NAP-PG1501 (AS PROVIDED BY THE NATIONAL OFFICE)