TW202016559A - Handler for testing electronic component - Google Patents

Abstract

The present invention relates to a processor for testing electronic components. The processor for testing electronic components of the present invention divides a transfer section of a specific transfer device responsible for transfer into a first responsible section and a second responsible section, so that the part that holds the test tray during a transfer in the first section is different from the part that holds the test tray during a transfer in the second section, when multiple electronic components loaded on multiple test trays are tested together, the multiple test trays can be transferred independently and simultaneously in the corresponding transfer section. According to the present invention, the structure of the transfer device is simplified and reduced, thereby having the effects of reducing production costs and reducing the size of the device.

Description

Processor for testing electronic components

Field of invention The invention relates to a test tray used for testing electronic components and a processor (HANDLER) for testing electronic components. The processor performs the testing of electronic components while moving the corresponding test tray.

Background of the invention For example, the electronic components of the produced semiconductor devices are tested by the tester, and then divided into qualified products and unqualified products, and only qualified products are shipped.

The electrical connection between the tester and the electronic component is realized by a processor (hereinafter referred to as "processor") for testing the electronic component.

The processor is manufactured in various forms according to the type of testing of the electronic component to be tested. In this processor, continuous research and development have been conducted on the electrical connection technology between the electronic component and the tester, temperature control technology, technology related to processing speed, technology to reduce production costs, and equipment miniaturization technology .

The processor can be mainly divided into applied and untested test trays for electronic components to be transported. The present invention relates to application test trays.

Prior to the invention, the applicant of the invention proposed a processor (hereinafter referred to as "prior application technology") using a test tray as Korean Patent Application No. 10-2018-000000.

According to the prior application technology shown in the reference diagram of FIG. 1, the test tray TT moves cyclically along a constant circulation path C, and simultaneously tests a plurality of electronic components loaded on the two test trays TT. Here, the two test trays TT divide the moving paths C1 and C2 in a section where the constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC are connected. In addition, although not shown in FIG. 1, the test tray TT and the processor HR have a characteristic structure in which the electronic components loaded on the test tray TT can be divided into half and tested in two stages.

According to the characteristic structure of the prior application technology, the electronic components loaded on the two test trays TT are simultaneously tested, the processing capacity is expanded, and the production cost is reduced and the miniaturization is achieved by minimally increasing the structure and space.

On the other hand, the processor HR should be equipped with various transfer devices for cyclically moving the test tray TT. Therefore, as shown in the prior art, in order to test electronic components loaded on two test trays TT at the same time, it is necessary to provide a corresponding transfer device. Korean Patent Publication No. 10-2000-0068397 (hereinafter, referred to as "prior art") discloses a technique for transferring two test trays in an integrated state with each other. However, in order to transfer the two test trays in an integrated state as described above, the transfer device also needs to be provided accordingly.

In addition, the transfer device must ensure a corresponding operating distance in order to transfer the distance to be transferred when transferring the test tray.

That is, as shown in the prior art or the prior art, if the constant temperature chamber, the test chamber, and the heat removal chamber are to accommodate the two test trays, accordingly, the size of the conveying device must become large and complicated, but, This leads to oversized equipment.

Summary of the invention Problems to be solved The present invention is based on the extension of the prior art, and an object of the present invention is to provide a technology that can minimize the size of a plurality of transfer devices for transferring test trays. Means to solve the problem

The processor for testing electronic components according to the first aspect of the present invention includes: a loading device that loads a plurality of electronic components to be tested onto a test tray at a loading position; a connection device, which will be completed using the loading device After loading of the electronic components, the electronic components loaded in the test tray that came to the test position are electrically connected to the tester; the unloading device comes after the testing of the electronic components electrically connected to the tester using the connection device is completed The test tray at the unloading position unloads a plurality of electronic components that have completed the test; a plurality of conveying devices for connecting to the loading along the loading position, the test position, and the unloading position The circulation path of the position transports the test tray; and a control device that controls the loading device, the connecting device, the unloading device, and the plurality of transport devices, the plurality of transport devices transporting only one in a single operation A test tray, so that a plurality of test trays transported along the circulation path can be transported independently of each other, and at least one specific transport device of the plurality of transport devices selectively holds the front edge or back of the test tray The end edge is conveyed along the circulation path,-the front end edge refers to the edge located at the front when the test tray is transferred along the circulation path, and the rear edge refers to the rear located opposite to the front edge Side -, the control device sequentially divides the transfer section responsible for the specific transfer device into a first transfer region and a second transfer region along the transfer direction of the test tray, and controls the specific transfer device so that when When the specific transfer device transfers the test tray in the first transfer area, the specific transfer device makes the specific transfer device hold the front edge of the test tray, and when the specific transfer device transfers in the second transfer area During the test tray, the specific conveying device is allowed to hold the rear edge of the test tray.

The processor for testing electronic components according to the second aspect of the present invention includes: a loading device that loads a plurality of electronic components to be tested onto a test tray at a loading position; a connecting device, which will be completed using the loading device After loading of the electronic components, the electronic components loaded in the test tray that came to the test position are electrically connected to the tester; the unloading device comes after the testing of the electronic components electrically connected to the tester using the connection device is completed The test tray at the unloading position unloads a plurality of electronic components that have completed the test; a plurality of conveying devices for connecting to the loading along the loading position, the test position, and the unloading position A circulation path at a position to transport the test tray; and a control device to control the loading device, the connecting device, the unloading device and the plurality of transport devices, a plurality of test trays can be placed side by side at the test location, The connecting device can electrically connect a plurality of electronic components loaded on the plurality of test trays to the tester together, and in the plurality of transfer devices, is responsible for transferring the plurality of test trays into the test position There are a plurality of specific conveying devices for conveying in the section or the conveying section advancing from the test position to correspond to the number of the plurality of test trays, whereby the plurality of test trays are independent of each other, but can be conveyed simultaneously.

The specific conveying device selectively holds the front edge or the rear edge of the test tray to convey along the circulation path. Here, the front end side refers to the side located at the front when the test tray is transferred along the circulation path, and the rear side refers to the side located at the rear opposite to the front side.

The specific conveying device includes: a gripper having a gripping member that can selectively grip the front or rear edge of the test tray; and a mover that positions the gripping member, Causing the holding member to selectively hold the front or back edge of the test tray, and by moving the holding member to transfer the test tray held by the holder along the circulation path .

The gripper further includes a lifting source that raises and lowers the gripping member, so that the gripping member can hold or release the front end or rear end of the test tray , The holding member has a holding groove, the front edge or the rear edge of the test tray can be inserted into the holding groove, so that the front edge or the rear edge of the test tray can be held by lifting Or release the grip.

The gripper includes a rotation source that rotates the gripping member so that the gripping member grips or releases the front edge of the test tray, and the test tray includes: A plurality of loading elements for loading a plurality of electronic components; and a setting frame provided with a plurality of the loading elements and forming an outer frame of the test tray, the front and rear edges of the setting frame have a part of the direction The front or rear snap slot-the front refers to the direction that the test tray is going to move along the circulation path, and the rear refers to the opposite direction of the front-the grip member can be inserted into the snap slot, and the The grip member has a grip portion, and in a state where the grip member is inserted into the snap groove, the grip portion can hang the front and rear edges of the setting frame according to the rotation state Hold or release the test tray.

The processor for testing electronic components further includes: a constant temperature chamber that houses the test tray loaded with the electronic components to be tested using the loading device, and carries out the electronic components loaded in the contained test tray Preheating or precooling; a test chamber that houses the test tray from the constant temperature chamber and supports a temperature environment so that the electronic components loaded in the test tray that have been housed can be tested; and a heat removal chamber that houses from The test tray of the test chamber, and used to restore a plurality of electronic components loaded on the test tray to normal temperature before transferring the test tray to the unloading position, the constant temperature chamber, the test The chamber and the heat removal chamber are arranged side by side on the circulation path. Among the plurality of conveying devices, the second conveying device that conveys the test tray from the constant temperature chamber to the test chamber includes: a second grip A second holding member capable of holding the rear edge of the test tray; and a second mover positioning the second holding member to hold the test tray The rear end side, and transfers the test tray held by the second gripper by moving the second holding member to transfer from the constant temperature chamber to the test chamber, the plurality of transfers A third transfer device in the device that transfers the test tray from the test chamber to the heat removal chamber may include: a third gripper having a third gripping member, the third gripping member can be selectively Holding the front or back edge of the test tray; and a third mover, positioning the third holding member to selectively hold the front or back edge of the test tray, and by moving The third holding member transfers the test tray held by the third holder to transfer from the test chamber to the heat removal chamber.

The second holding member can hold or release the test tray by using the lifting of the second holding member or the lifting of the test tray, and the third gripper includes: a third grip A holding member, which can selectively hold the front or back edge of the test tray and the rotation source, and rotate the third holding member forward and reverse, so that the third holding member can The front edge or the rear edge of the test tray is held or released. Invention effect

According to the present invention, it has the effect of simplifying the structure of the conveying device to minimize the complexity of the design due to mechanical interference with other structures, thereby reducing the production cost, and preventing the equipment due to the reduced size is too big.

Detailed description of the preferred embodiment The preferred embodiments of the present invention will be described with reference to the accompanying drawings. The unit is succinct, and the description of repetitive or substantially identical structures is omitted or compressed as much as possible. >Definition of terms>

In this description, in the names used in the structure of the test tray, the term "front end edge" refers to the side located in front of the forward direction side of the test tray when the test tray is transported along the circulation path, and the term "rear edge" "Refers to the rear side opposite to the front side.

Therefore, referring to FIG. 2, when the test tray TT is transported in the first arrow direction a, the rear side S3 on the Y axis is the front side and the front side S1 is the rear side. In addition, when the test tray TT is transported in the second arrow direction b, the right side S4 on the X axis is the front side and the left side S2 is the rear side.

Similarly, the term "front" refers to the direction to be advanced when the test tray TT is transferred along the circulation path, and the term "rear" refers to the opposite reverse of the front. >Description of test tray>

Referring to FIG. 2, the test tray TT includes a plurality of loading elements LE and a setting frame IF.

A plurality of loading elements LE are used to load electronic components D.

The loading element LE is provided in the setting frame IF, and constitutes the outer frame of the test tray TT. Both sides of the installation frame IF in the X-axis direction have snap grooves JG partially open to the outside (front side and rear side). Therefore, when viewed on a plane, the two snap grooves JG have an axisymmetric “T” shape with a tail in the X-axis direction.

As shown in FIG. 3, the test tray TT is circulated and moved along a closed circulation path C using a plurality of conveying devices, the closed circulation path C is connected via a loading position LP, a testing position TP, an unloading position UP, and a standby position WP To the loading position LP.

When the test tray TT is located at the loading position LP, the plurality of electronic components D to be tested are loaded onto the test tray TT.

When the test tray TT is located at the test position TP, the plurality of electronic components D loaded on the test tray TT are electrically connected to the tester, so that the plurality of electronic components D can be tested by the tester.

At the unloading position UP, the plurality of electronic components D that have completed the test are unloaded from the test tray TT.

In the standby position WP, the previous test tray TT that performs the loading operation at the current loading position LP is transferred to the constant temperature chamber SC after the loading operation is completed, and the latter empty test tray TT waits before moving to the loading position LP.

For reference, in the conceptual diagram of FIG. 3, as shown in the prior art, there is shown a processor HR having a structure in which multiple electronic components D loaded to two test trays TT are tested simultaneously in order to expand the processing capacity. Therefore, when viewed on a plane, two test trays TT are accommodated in each of the constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC. Therefore, the transfer paths C1 and C2 that enter the test position TP in the test chamber TC from the constant temperature chamber SC or the heat removal chamber DC from the test position TP are divided into two, and in the transfer paths C1 and C2, two test trays TT They are independent of each other but not combined, but they can be transmitted simultaneously. Of course, depending on the implementation method, it is of course possible to simplify the structure to test only multiple electronic components D loaded in one test tray TT at a time, or multiple electronic components loaded in more than three test trays TT D. Test the structure to achieve the expansion of processing capacity. >Overview of the processor>

4 is a conceptual plan view for explaining the structure of a processor HR (hereinafter, simply referred to as "processor") for testing electronic components according to an embodiment of the present invention.

As shown in FIG. 4, the processor HR according to this embodiment includes: a loading device 100, a constant temperature chamber SC, a test chamber TC, a connecting device 200, a heat removal chamber DC, an unloading device 300, a first conveying device 400, two second The second transmission device 500, the two third transmission devices 600, the fourth transmission device 700, the fifth transmission device 800, and the control device 900.

The loading device 100 loads a plurality of electronic components D to be tested from the customer tray CT1 to the test tray TT located at the loading position LP.

When viewed on a flat surface, the thermostatic chamber SC can accommodate two test trays TT, and a plurality of electronic components D loaded in the accommodated test tray TT are heated or cooled in advance. That is, the thermostatic chamber SC accommodates the test tray TT that has been loaded with the electronic component D to be tested by the loading device 100, and is used to preheat or precool the plurality of electronic components D loaded in the contained test tray TT.

The test chamber TC can accommodate two test trays TT from the constant temperature chamber SC, and is used to provide a temperature environment capable of testing a plurality of electronic components D loaded in the contained test tray TT. In such a test chamber TC, a plurality of electronic components D loaded on the test tray TT are electrically connected to a tester (not shown) located below, so that the tester performs the test.

The connection device 200 presses down on the plurality of electronic components D loaded in the two test trays TT placed side by side at the test position TP inside the test chamber TC to make the plurality of electronic components D and the tester electrically connection.

When viewed on a plane, the heat removal chamber 260 can accommodate two test trays TT, and before sending the test tray TT to the unloading position UP, restore a plurality of electronic components D loaded in the test tray TT from the test chamber TC to Normal temperature or near normal temperature, in order to perform an appropriate unloading operation of the plurality of electronic components D later.

The constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC described above are placed side by side along the X axis direction on the circulation path C.

The unloading device 300 unloads a plurality of electronic components D loaded in the test tray TT from the heat removal chamber DC to the unloading position UP from the test tray TT, classifies them according to the test category, and then classifies the plurality of The electronic component D is loaded onto the empty customer tray CT2.

The first transfer device 400 to the fifth transfer device 800 transfer the test tray TT along the circulation path C.

The first transfer device 400 transfers the test tray TT in the first transfer section ① from the loading position LP to the inside of the constant temperature chamber SC.

The second transfer device 500 transfers the test tray TT in the second transfer section ②-1, ②-2 from the inside of the constant temperature chamber SC to the test position TP.

The third transfer device 600 transfers the test tray TT in the third transfer section ③-1, ③-2 from the test position TP to the inside of the heat removal chamber DC.

The fourth transfer device 700 transfers the test tray TT in the fourth transfer section ④ from the inside of the heat removal chamber DC to the unloading position UP.

The fifth transfer device 800 transfers the test tray TT in the fifth transfer section ⑤ from the unloading position UP via the standby position WP to the loading position LP.

The above-described first transfer device 400 to fifth transfer device 800 transfer only one test tray TT in one operation, so that the plurality of test trays TT transferred along the circulation path C are transferred independently of each other. Of course, the two second transfer devices 500 can also transfer the two test trays TT from the thermostatic chamber SC to the test position TP independently of each other, but they can also be controlled to transfer simultaneously, and the two third transfer devices 600 can also transfer two The test trays TT are independently transferred from the test position TP to the heat removal chamber DC independently of each other, and can also be controlled to be transferred simultaneously.

The control device 900 controls each structure described above. >Description of characteristic structure> 1. The first conveyor

The first transfer device 400 transfers the test tray TT that has loaded the plurality of electronic components D from the loading position LP to the inside of the constant temperature chamber SC. To this end, the first transfer device 400 is located above the test tray TT in the thermostatic chamber SC, as shown in a partially exploded perspective view of FIG. 5, the first transfer device 400 includes a first holder 410 and a first mover 420.

The first gripper 410 grips or releases the front edge or rear edge of the test tray TT. Here, the front end side and the rear end side are sides facing each other in the Y-axis direction. Such a first gripper 410 includes a first gripping member 411, a first coupling member 412, a first lifting rail 413, and a first lifting source 414.

The first holding member 411 can hold or release the front end side or the rear end side of the test tray TT that should be moved in the Y-axis direction, and can be coupled to the first coupling member 412 in a manner capable of raising and lowering. To this end, the first gripping member 411 includes a gripping groove GG, and the front edge or the rear end of the test tray TT can be inserted into the gripping groove GG, so that the first gripping member 411 can be used to lift the test The front side or the rear side of the tray TT is held or released. In addition, the first coupling member 412 has an insertion protrusion IP that can be inserted into the guide groove RG of the first elevating rail 413 described later.

The first coupling member 412 is coupled to the first conveyor belt 421 of the first mover 420, and when the first mover 420 is operated, the first coupling member 412 moves in the Y-axis direction. Therefore, the first holding member 411 coupled to the first coupling member 412 also moves together, and finally the test tray TT held by the first holding member 411 moves in the Y-axis direction.

The first elevating rail 413 has a long guide groove RG in the Y-axis direction, and is provided to be capable of elevating. The above-mentioned insertion protrusion IP is inserted into the guide groove RG of the first lifting rail 413, whereby the first gripping member 411 moves up and down in conjunction with the lifting of the first lifting rail 413. In addition, when the first holding member 411 moves in the Y-axis direction with the projection IP inserted into the guide groove RG, the first lifting rail 413 is not only used to transmit the lifting power of the first lifting source 414 to the holding member 411, also used to support the first gripping member 411 while guiding the movement of the first gripping member 411.

The first elevating source 414 elevates the first elevating rail 413, and finally elevates the first gripping member 411. Therefore, as shown in FIGS. 6(a) and 6(b), when the first lifting source 414 lowers the first holding member 411, the test tray TT is held by the first holding member 411, and when the first lifting source When the first holding member 411 is raised by 414, the holding of the test tray TT by the first holding member 411 is released. Of course, according to the embodiment, instead of raising and lowering the first holding member 411, it is of course possible to consider a manner in which the first holding member 411 holds or unholds the test tray TT by raising and lowering the test tray TT.

The first mover 420 positions the first holding member 411 to selectively hold the front or rear edge of the test tray TT, and moves the first holding member 411 in the Y-axis direction, so that it will be The test tray TT held by the holder 410 is conveyed in the Y-axis direction along the circulation path C. For this, the first mover 420 includes a first conveyor belt 421 and a first driving source 422.

The first conveyor belt 421 rotates forward and backward with a pair of pulleys P1 and P2 provided at a constant interval in the Y-axis direction as rotation turning points. Therefore, the first coupling member 412 coupled to the first conveyor belt 421 can move forward and backward in the Y-axis direction, and finally, the first holding member 411 and the test held by the first holding member 411 The tray TT can move forward and backward in the Y-axis direction.

The first driving source 422 rotates the first conveyor belt 421 forward and backward.

The movement in the Y-axis direction of the test tray TT using this first transfer device 400 will be described.

7 and the like, the transfer section ① of the first transfer device 400 is divided into a first responsible section ① _{1 in the} front and a second responsible section ① _{2 in the} rear in the transfer direction of the test tray TT. The second responsible interval ① ₂ and the first responsible interval ① ₁ correspond to the first transmission area and the second transmission area in the patent application scope, respectively.

First, as shown in FIG. 7, the first holding member 411 is controlled to hold the front edge of the previous test tray TTf at the loading position LP, as shown in FIG. 8, when the previous test tray TTf is transferred from the second When the charge interval ① ₂ enters the first charge interval ① ₁ (that is, the previous test tray TTf is transferred from the first transfer area), the previous test tray TTf transfers the distance degree of the second charge interval ① ₂ . Then, as shown in FIG. 9, the first holding member 411 is controlled to hold the rear edge of the previous test tray TTf. As shown in FIG. 10, when the previous test tray TTf is transferred from the second transfer area, the front A test tray TTf transmits the distance degree of the first responsible interval ① ₁ . At this time, as shown in FIGS. 9 and 10, the next test tray TTr, which is initiated later, is transferred from the standby position WP to the loading position LP.

As shown in FIG. 10, when the transfer of the previous test tray TTf is completed, as shown in FIG. 11, the first holding member 411 is controlled to hold the front edge of the latter test tray TTr, as shown in FIG. 12, the latter The test tray TTr is transferred by the first transfer device 400 to the distance degree of the second responsible interval ① ₂ .

As described above, the former test tray TTf and the latter test tray TTr are sequentially entered into the interior of the thermostatic chamber SC by the first transfer device 400 and accommodated therein, and are placed side by side in the Y-axis direction.

In this way, the first conveying device 400 is controlled so that the first holding member 411 can selectively hold the front or rear edge of the test tray TT, so that the operating distance can be reduced, and thus, the first The size of the transmission device 400 is minimized. 2. Second transmission device

A pair of second conveying devices 500 placed side by side in the Y-axis direction individually convey each of the two test trays TT in the thermostatic chamber SC along the X-axis direction of the test chamber TC, whereby the two test trays TT The transfer is performed in the second transfer section ②-1, ②-2, so as to move from the constant temperature chamber SC to the test position TP. Here, reducing the transfer time of the test tray TT will also bring the effect of increasing the processing capacity. Therefore, it is preferable to simultaneously operate the pair of second transfer devices 500 so as to control the two test trays TT to transfer at the same time.

For this, the second transfer device 500 is located below the test tray TT placed in the thermostatic chamber SC, and as shown in the perspective exploded view of FIG. 13, the second transfer device 500 includes a second holder 510 and a second mobile器520.

The second holder 510 can hold the rear edge of the test tray TT. Here, the rear end side is the left side in the X-axis direction in the figure. This second gripper 510 includes a second gripping member 511 and a second coupling member 512.

The second grip member 511 has a T-shaped grip portion GP capable of gripping the rear end side of the test tray TT. The grip portion GP has a T-shape with a tail in the left direction in the figure, and can be inserted into a snap groove JG located at the rear side of the test tray TT. Therefore, as shown in FIG. 14, the T-shaped grip portion GP is inserted into the T-shaped snap groove JG of the test tray TT, whereby the second grip member 511 can be in a gripped state to be able to push the test Tray TT. At this time, the way in which the grip portion GP is inserted into the snap groove JG can be achieved by lowering the test tray TT in the Z-axis direction, but it may also be considered to be raised in the Z-axis direction by the second grip member 511 This is achieved by holding the test tray TT, or by rotating the second holding member 511 to hold the test tray TT like the third transfer device 600 described later.

The second coupling member 512 is coupled with the second conveyor belt 521 of the second mover 520, and the grip member 511 is coupled to this second coupling member 512.

The second mover 520 may position the second holding member 511 to hold the rear edge of the test tray TT, and move the second holding member 511 in the X-axis direction, and finally, be held by the second holder 510 The held test tray TT moves in the X-axis direction along the circulation path C. Therefore, as shown in FIGS. 15(a) and 15(b), the test tray TT is pushed by the second transfer device 500 to be transferred in the second transfer interval ②-1, ②-2, and thus, the test The tray TT moves from the constant temperature chamber SC to the test position TP in the test chamber TC. For this reason, similar to the first conveyor 400, the second mover 520 has a second conveyor belt 521 and a second drive source 522.

For reference, the second driving source 522 in this embodiment is preferably considered to be implemented as a structure shared by a pair of second transfer devices 500 to reduce cost and simplify the structure. 3. Third transmission device

When the testing of the electronic components loaded on the test tray TT is completed at the test position TP, the third transfer device 600 transfers the test tray TT in the third transfer interval ③-1, ③-2, and moves the test tray TT to heat removal The interior of the room DC. To this end, the third transfer device 600 is located below the test tray TT in the heat removal chamber DC, and as shown in the perspective exploded view of FIG. 16, the third transfer device 600 includes a third holder 610 and a mover 620 .

The third gripper 610 grips or releases the front or rear side of the test tray TT. Here, the front end side and the rear end side are sides facing each other in the X-axis direction. This third gripper 610 includes a third gripping member 611, a third coupling member 612, and a rotation source 613.

The third holding member 611 may hold or unhold the front end side or the rear end side of the test tray TT by rotating. To this end, the third grip member 611 has a grip portion GP that is arranged to be bent at a 90-degree angle with the rotation axis of the third grip member 611 (that is, to be arranged along a direction orthogonal to the rotation axis Direction), so that the front or rear edge of the test tray TT can be selectively held.

The third conveying device 620 pulls the test tray TT for conveying, so when the third holding member 611 holds the front edge or the rear edge of the test tray TT, as shown in FIG. Rotation, whereby the holding part GP is inserted into the snap groove JG of the test tray TT, and when the test tray TT is in a state capable of being pulled in the X-axis direction toward the right direction, the third holding member 611 is held In the state, when the third holding member 611 releases the holding state of the test tray TT, as shown in FIG. 17(b), the holding part GP reversely rotates, so that when the holding part GP is in contact with the test tray In a state where the snap groove JG of TT is separated, the third gripping member 611 can be released from gripping.

The third coupling member 612 is coupled to the conveyor belt 621 of the third mover 620, and when the third mover 620 is operated, the third coupling member 612 moves in the X-axis direction. Therefore, the third holding member 611 coupled with the third coupling member 612 also moves together, and finally, the test tray TT held by the third holding member 611 moves in the X-axis direction.

When the third holding member 611 intends to hold or release the front end or rear end of the test tray TT, the rotation source 613 causes the third holding member 611 to rotate forward or reverse, thereby, The third holding member 611 can hold or release the holding of the test tray TT. Here, the rotation source 613 is provided as an air cylinder, and the uniaxial element SE is interposed between the rotation source 613 and the third gripping member 611 so that the rotation source 613 is in contact with the rotation axis of the third gripping member 611 The third gripping member 611 is pushed or pulled at positions spaced apart by a predetermined interval, thereby achieving the rotation of the third gripping member 611. However, according to the embodiment, it is of course also conceivable to use a rotary motor as the rotation source 613 to directly rotate the third grip member 611.

In this embodiment, the third gripping member 611 is rotated forward and backward, whereby the third gripper 610 grips or releases the grip of the test tray TT. According to the embodiment, the The second conveying device 500 is similarly, of course, a structure that holds or releases the holding of the test tray TT by raising and lowering the third holding member 611 or raising and lowering the test tray TT. That is, it can be sufficiently considered that the second transfer device 500 and the third transfer device 600 adopt the same structure at the same time, but due to consideration of the following aspects: the second transfer device 500 pushes the test tray TT and the third transfer device 600 pulls the test tray TT In the aspect, the second transfer device 500 completes the transfer of the test tray TT on the second transfer interval ②-1, ②-2 with one operation and the third transfer device 600 completes the third transfer interval ③-1 with two operations In the aspect of the transfer work of the test tray TT on ③-2, the second transfer device 500 only needs to hold the rear edge of the test tray TT and the third transfer device 600 needs to control both the front and back edges of the test tray TT In terms of enabling gripping, as described in this embodiment, preferably, the second transfer device 500 and the third transfer device 600 have different gripping structures.

The third mover 620 positions the third holding member 611 to selectively hold the front or rear side of the test tray TT, and moves the third holding member 611 in the X-axis direction, thereby causing the third The test tray TT held by the holder 610 is transported in the X-axis direction along the circulation path C. Also, preferably, the pair of third transfer devices 600 share the third driving source 622 provided in the third mover 620.

Next, the movement in the X-axis direction of the test tray TT by the third conveyor 600 will be explained.

As shown in FIG. 18, the third transmission section ③-1, ③-2 of the third transmission device 600 is divided into a first responsible section ③ _{1 in the} front and a second responsible section ③ _{2 in the} rear. The second responsible interval ③ ₂ and the first responsible interval ③ ₁ correspond to the first transmission area and the second transmission area of the patent application scope, respectively.

First, when the test tray TT is transferred in the second responsible section ③ ₂ (first transfer area), as shown in FIG. 18, if the third holding member 611 holds the front edge of the test tray TT, it is as shown in FIG. 19. , The third mover 620 operates to transfer the test tray TT so that the front end of the test tray TT is located in the first responsible section ③ ₁ (second transfer area), and the rear end of the test tray TT is located in the second responsible section ③ ₂ within. Thereafter, as shown in FIG. 20, if the third holding member 611 holds the rear edge of the test tray TT, as shown in FIG. 21, the third mover 620 operates to further transfer the test tray TT so that the test tray TT The front end and the back end are located in the first responsible interval ③ ₁ . In this way, the third transfer device 600 transfers the plurality of test trays TT from the test position TP to the inside of the heat removal chamber DC through the transfer process divided into two. With this operation method, the third gripping member 611 does not have to enter deep inside the tester chamber TC, so not only can the operation distance be shortened, but also the size of the third transfer device 600 can be minimized in proportion to it.

Such third conveying devices 600 are also arranged side by side in pairs in the Y-axis direction, a pair of third conveying devices 600 can be held independently of each other, but in order to increase processing speed and reduce costs, a third driving source is shared 622, it can be realized that the transmission work can be performed simultaneously with each other during the operation. Therefore, although the two test trays TT are independent of each other, they are simultaneously transferred.

Of course, as described above, the second conveyor 500 and the third conveyor 600 are different only in terms of pushing and pulling, so it is preferable that the same structure can be considered. Therefore, like the third transfer device 600, the second transfer device 500 can also be implemented as a method of transferring the test tray TT through two processes. 4. Fourth transmission device

The fourth transfer device 700 is used to transfer the test tray TT in the heat removal chamber TC to the unloading position UP, and its structure is basically the same as that of the first transfer device 400, and therefore its description will be omitted. However, the fourth transfer device 700 first transfers the test tray TT located at the front to the unloading position UP, and then transfers the test tray TT located at the rear to the unloading position UP, and thus goes through two processes. 5. Fifth transmission device

The fifth transfer device 800 is provided to transfer the test tray TT at the unloading position UP to the loading position LP via the standby position WP, and its structure and operation are substantially the same as the third transfer device 600. However, preferably, a lifting source for lifting the holding member of the test tray TT is provided to raise and lower the holding member according to the operation of the lifting source, and the holding member is placed on the side capable of hanging the test tray TT State, or the state can be released. Of course, even in the case of the fifth transfer device 800, it may be sufficiently considered that the test tray TT is raised and lowered instead of the lifting source to rotate the holding member, so that the holding member can hold or release the holding of the test tray TT hold. In some cases, of course, it is also conceivable to arrange the gripping member so as to be capable of lifting and rotating. >Other considerations>

According to the present invention, in order to minimize the size, the first transfer device 400, the third transfer device 600, the fourth transfer device 700, and the fifth transfer device 800 are implemented in two transfers. In addition, in some cases, when it is necessary to transfer the long-distance fifth transfer device 800 via the standby position WP, the test tray TT may be transferred in a process divided into three or more times. In this case, the test tray TT must be accurately positioned at the correct position in order to properly hold the test tray TT by the holding members 411, 611, 811. Therefore, it is preferable to consider providing a stopper that can be raised and lowered so that the test tray TT can be transferred to an accurate position.

For example, observe a path that uses the fourth transfer device 700 to transfer the test tray TT from the heat removal chamber DC to the unloading position UP, and then uses the fifth transfer device 800 to transfer the test tray TT to the loading via the standby position WP Location LP. In this path, in order to properly hold the test tray TT by the fifth transfer device 800, as shown in the schematic diagram of FIG. 22, four stoppers SP1, SP2, SP3, for setting the exact position of the test tray TT, Each of SP4 can be lifted by the lifter UD.

The function of the stoppers SP1, SP2, SP3, SP4 will be described with reference to FIGS. 23(a) to 23(f).

First, when the test tray TT is transferred to the unloading position UP in the Y-axis direction by the fourth transfer device 700, as shown in FIG. 23(a), from the state where the first stopper SP1 is lowered, as shown in FIG. 23( As shown in b), the first stop SP1 starts to rise to position the test tray TT in the Y-axis direction. At this time, the second stopper SP2 is in a raised state, so the X-axis direction of the test tray TT is accurately set.

Next, when the test tray TT is to be transferred to the standby position WP in the X-axis direction, as shown in FIG. 23(c), first, the second stopper SP2 is lowered. In this state, as shown in FIG. 23(d), when the test tray TT is transferred to the standby position WP, the third stopper SP3 in the raised state is used to prevent excessive transfer of the test tray TT, and the first The second stopper SP2 is raised to accurately position the test tray TT in the X-axis direction.

Similarly, even when the test tray TT is transferred from the standby position WP to the loading position LP, as shown in FIGS. 23(e) and 23(f), the lowering and raising of the third stopper SP3 and the fourth stop The stopper SP4 prevents the test tray TT from being excessively transferred, so that the test tray can be accurately positioned at the loading position LP.

The required number of such stoppers SP and lifters UD can be provided at desired positions in the entire conveying path.

For reference, as shown in FIG. 23, the first stopper SP1 may be implemented by the elevating guide rail GR to guide the test tray TT to move in the X-axis direction, and the fourth stopper SP4 may also be implemented by elevating the guide rail to The test tray TT is guided to move in the Y-axis direction. That is, it is preferable to consider replacing part of the plurality of stoppers for accurately setting the position of the test tray TT with a guide rail for guiding the transfer of the test tray TT on the transfer path of the test tray TT. In addition, in the above-described manner, in the portion where the guide rail is used as the stopper, the guide rail must be lifted so that the guide rail does not interfere with the transfer of the test tray TT.

As described above, the specific description of the present invention is obtained by referring to the embodiments of the drawings. However, the above-mentioned embodiments are only to illustrate the preferred examples of the present invention. Therefore, it should be understood that the present invention is not limited to the disclosed embodiments. The scope of the present invention should be understood to be within the scope of the attached patent application and its equivalent.

100: loading device 200: Connect the device 260: Heat removal room 300: Unloading device 400: the first conveyor 410: first grip 411: Holding member 412: The first coupling member 413: The first lifting track 414: The first lifting source 420: First mover 421: The first conveyor belt 422: First drive source 500: second conveyor 510: second grip 511: second grip member 512: second coupling member 520: Second mover 521: Second conveyor belt 522: Second drive source 600: Third transmission device 610: third grip 611: Third gripping member 612: Third coupling member 613: Rotating source 620: mobile 621: conveyor belt 622: Third drive source 700: Fourth transmission device 800: Fifth transmission device 811: Holding member 900: control device a: first arrow direction b: second arrow direction C: circulation path C1, C2: transmission path CT2: Customer tray D: Electronic components DC: Heat removal room GG: Grip slot GP: holding part HR: processor for testing electronic components IF: Set the frame IP: Insert protrusion JG: snap groove LE: loading element LP: loading location P1, P2: pulley RG: rail groove S1: Front side S2: Left side S3: Rear side S4: right side SC: Constant temperature room SP1, SP2, SP3, SP4: stopper TC: Test room TP: test location TT, TTf, TTr: test tray UD: Lifter UP: Uninstall location WP: Standby position

FIG. 1 is a conceptual top view of a processor for testing electronic components according to the prior art. 2 is a perspective view of a test tray that can be applied to a processor for testing electronic components according to the present invention. 3 is a conceptual top view of a processor for testing electronic components according to an embodiment of the present invention to which the test tray of FIG. 2 is applied. 4 is a conceptual plan view for explaining the configuration of the processor for testing electronic components in FIG. 3. 5 is a schematic partial perspective exploded view of a first transfer device applied to the processor for testing electronic components of FIG. 3. 6(a) and 6(b) are reference diagrams for explaining the operation of the first conveying device of FIG. 5 to hold and unhold the test tray. 7 to 12 are reference diagrams for explaining the first transfer operation performed by the first transfer device of FIG. 5. 13 is an exploded perspective view of a second transfer device applied to the processor for testing electronic components of FIG. 3. 14 is a reference diagram for explaining the operation of the second transfer device of FIG. 13 holding the test tray. 15(a) and 15(b) are reference diagrams for explaining the transfer operation of the second transfer device of FIG. 14. 16 is an exploded perspective view of a third transfer device applied to the processor for testing electronic components of FIG. 3. FIGS. 17( a) and 17 (b) are reference diagrams for explaining the operation of the third transfer device of FIG. 16 to hold and unhold the test tray. 18 to 21 are reference diagrams for explaining the transfer operation of the third transfer device of FIG. 16. 22(a), 22(b), and 23(a) to 23(f) are schematic reference diagrams for explaining the processor stopper for testing electronic components that can be applied to FIG. 3.

400: the first conveyor

410: first grip

411: Holding member

412: The first coupling member

413: The first lifting track

414: The first lifting source

420: First mover

421: The first conveyor belt

422: First drive source

GG: Grip slot

IP: Insert protrusion

P1, P2: pulley

RG: rail groove

Claims (8)

A processor for testing electronic components is characterized by comprising: The loading device loads multiple electronic components to be tested to the test tray at the loading position; A connection device to electrically connect a plurality of electronic components loaded in the test tray that came to the test position after the electronic components are loaded by the loading device to the tester; An unloading device, unloading the plurality of electronic components that have completed the test from the test tray that comes to the unloading position after the testing of the electronic components electrically connected to the tester using the connecting device is completed; A plurality of conveying devices conveying the test tray along a circulation path connected to the loading position via the loading position, the testing position and the unloading position; and A control device that controls the loading device, the connecting device, the unloading device and a plurality of the transferring devices, The plurality of transfer devices transfer only one test tray in one operation, so that the plurality of test trays transferred along the circulation path can be transferred independently of each other, At least one specific conveying device among the plurality of conveying devices selectively holds the front edge or the rear edge of the test tray to convey along the circulation path, The front end edge refers to the front edge of the test tray when the test tray is transferred along the circulation path, and the rear end edge refers to the rear edge of the test tray opposite to the front edge side, The control device sequentially divides the transfer section responsible for the specific transfer device into a first transfer region and a second transfer region along the transfer direction of the test tray, and controls the specific transfer device so that when the specific The transfer device causes the specific transfer device to hold the front edge of the test tray when transferring the test tray in the first transfer region, and when the specific transfer device transfers the test in the second transfer region When palletizing, make the specific conveying device hold the rear edge of the test tray. A processor for testing electronic components is characterized by comprising: The loading device loads multiple electronic components to be tested to the test tray at the loading position; A connection device to electrically connect a plurality of electronic components loaded in the test tray that came to the test position after the electronic components are loaded by the loading device to the tester; An unloading device, unloading the plurality of electronic components that have completed the test from the test tray that comes to the unloading position after the testing of the electronic components electrically connected to the tester using the connecting device is completed; A plurality of conveying devices conveying the test tray along a circulation path connected to the loading position via the loading position, the testing position and the unloading position; and A control device that controls the loading device, the connecting device, the unloading device and a plurality of the transferring devices, Multiple test trays can be placed side by side at the test location, The connection device can electrically connect a plurality of electronic components loaded on the plurality of test trays to the tester together, Among the plurality of conveying apparatuses, there are a plurality of specific conveying apparatuses responsible for conveying in a plurality of test trays into the conveying section of the test position or the conveying section out of the test position to correspond to a plurality of The number of the test trays, whereby a plurality of the test trays are independent of each other and can be transferred at the same time. The processor for testing electronic components according to claim 2, wherein: The specific conveying device selectively holds the front edge or the rear edge of the test tray to convey along the circulation path, The front end edge refers to the front edge of the test tray when the test tray is transferred along the circulation path, and the rear end edge refers to the rear edge of the test tray opposite to the front edge side. The processor for testing electronic components according to claim 1 or 3, characterized in that The specific transmission device includes: A gripper having a gripping member capable of selectively gripping the front or rear edge of the test tray; and The mover positions the holding member so that the holding member selectively holds the front edge or the rear edge of the test tray, and by moving the holding member, it will be held by the holder The held test tray is transported along the circulation path. The processor for testing electronic components according to claim 4, wherein: The gripper also includes a lifting source, The lifting source raises and lowers the holding member, so that the holding member can hold or unhold the front end or rear end of the test tray, The holding member has a holding groove, and the front or back edge of the test tray can be inserted into the holding groove, so that the front or back edge of the test tray can be held or lifted by lifting Release the grip. The processor for testing electronic components according to claim 4, wherein: The gripper includes a rotation source, The rotation source rotates the holding member to enable the holding member to hold or release the front edge of the test tray, The test tray includes: Multiple loading components for loading multiple electronic components; and A frame is provided, a plurality of the loading elements are provided to form an outer frame of the test tray, The front side and the rear side of the setting frame have a part of a snap groove that opens to the front or the back, The front refers to the direction that the test tray is going to travel when being transported along the circulation path, and the rear refers to the opposite direction of the front, The grip member can be inserted into the buckle groove, and the grip member has a grip portion, and in a state where the grip member is inserted into the buckle groove, the grip portion is based on the grip Part of the rotating state hangs the front end and rear end of the setting frame to hold or release the test tray. The processor for testing electronic components according to claim 1 or 3, further comprising: A constant temperature chamber, which houses the test tray that has been loaded with the electronic components to be tested by the loading device, and preheats or precools the electronic components loaded in the contained test tray; A test chamber that houses the test tray from the constant temperature chamber and provides a temperature environment that enables the electronic components loaded in the test tray that have been accommodated to be tested; and The heat removal chamber, which houses the test tray from the test chamber, and restores the plurality of electronic components loaded on the test tray to normal temperature before transferring the test tray to the unloading position, The constant temperature chamber, the test chamber and the heat removal chamber are arranged side by side on the circulation path, Among the plurality of transfer devices, the second transfer device that transfers the test tray from the constant temperature chamber to the test chamber includes: A second gripper having a second gripping member, the second gripping member being able to grip the rear edge of the test tray; and A second mover, positioning the second holding member to hold the rear end edge of the test tray, and by moving the second holding member, the test to be held by the second holder The tray is transferred from the constant temperature chamber to the test chamber, Among the plurality of transfer devices, a third transfer device that transfers the test tray from the test chamber to the heat removal chamber includes: A third gripper having a third gripping member, the third gripping member can selectively grip the front edge or the rear edge of the test tray; and A third mover, positioning the third holding member to selectively hold the front or back edge of the test tray, and by moving the third holding member, the third holding device The held test tray is transferred from the test chamber to the heat removal chamber. The processor for testing electronic components according to claim 7, wherein: The second holding member can hold or release the holding of the test tray by using the lifting of the second holding member or the lifting of the test tray, The third gripper includes: A third holding member capable of selectively holding the front edge or the rear edge of the test tray; and The rotation source rotates the third holding member forward and backward, so that the third holding member can hold or release the front end side or the rear end side of the test tray.

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