TWI711829B - Handler for testing electronic component - Google Patents

Abstract

The invention relates to a processor for testing electronic components. The processor for testing electronic components of the present invention divides the transfer section in charge of a specific transfer device into a first charge zone and a second charge zone, and makes the part of the test tray held during the transfer in the first charge zone and The parts where the test tray is held during the second responsible section transfer are different. When multiple electronic components loaded on multiple test trays are tested together, the multiple test trays can be transferred independently and simultaneously in the corresponding transfer section. According to the present invention, the structure of the conveying device is simplified and reduced, thereby having the effect of reducing the production cost and the size of the equipment.

Description

Processor for testing electronic components

Invention field The present invention relates to a test tray used when testing electronic components and a processor (HANDLER) for testing electronic components. The processor performs testing of the electronic components while moving the corresponding test tray.

Background of the invention For example, the electronic components of the produced semiconductor device are tested by a tester, and then divided into qualified products and unqualified products, and only qualified products are shipped.

The electrical connection between the tester and the electronic component is realized by a processor (hereinafter referred to as "processor") for testing the electronic component.

The processor is manufactured in various forms according to the test type of the electronic component to be tested. In this processor, continuous research and development have been carried out on the electrical connection technology between the electronic components and the tester, temperature control technology, processing speed-related technology, technology to reduce production costs, and technology to miniaturize equipment. .

Processors can be mainly divided into test trays with applied and unused electronic components to be transported. The present invention relates to applied test trays.

The applicant of the invention proposed a processor (hereinafter referred to as the "prior application technique") to which a test tray was applied before the invention, as Korean Patent Application No. 10-2018-000000.

According to the prior application technique as shown in the reference diagram of FIG. 1, the test tray TT cyclically moves along a constant circulation path C, and simultaneously tests a plurality of electronic components loaded on two test trays TT. Here, the two test trays TT divide the movement paths C1 and C2 in a part of the section where the constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC are connected. In addition, although not shown in FIG. 1, the test tray TT and the processor HR have a characteristic structure that can divide the electronic components loaded on the test tray TT into half and perform testing in two stages.

According to the characteristic structure of the prior application technology, the electronic components loaded on the two test trays TT are tested simultaneously, and the processing capacity is also expanded, and the production cost and miniaturization are achieved by minimizing the increase in structure and space.

On the other hand, the processor HR should be equipped with various conveying devices for circulating the test tray TT. Therefore, as shown in the prior art, in order to test the electronic components loaded on the two test trays TT at the same time, it is necessary to have a corresponding transfer device. Korean Patent Publication No. 10-2000-0068397 (hereinafter, referred to as "prior art") discloses a technique for transferring two test trays in an integrated state with each other. However, in order to convey the two test trays in an integrated state with each other as described above, the conveying device also needs to be arranged accordingly.

In addition, the conveyor must ensure a corresponding operating distance in order to transfer the test tray to the required distance.

That is, as shown in the prior art or the prior art, if the constant temperature chamber, the test chamber, and the heat removal chamber are to accommodate two test trays together, the size of the conveying device must be enlarged and complicated accordingly, but, This caused the device to be too large.

Summary of the invention Problems to be solved The present invention is derived based on the expansion of the prior art. The purpose of the present invention is to provide a technique that can minimize the size of multiple conveying devices for conveying test trays. Means to solve the problem

The processor for testing electronic components according to the first aspect of the present invention includes: a loading device that loads a plurality of electronic components to be tested on a test tray located at a loading position; and a connecting device that uses the loading device to complete After the electronic component is loaded, the electronic component loaded in the test tray that comes to the test position is electrically connected to the tester; the unloading device comes after the completion of the test of the electronic component electrically connected to the tester by the connecting device The test tray in the unloading position unloads a plurality of electronic components that have been tested; a plurality of conveying devices are used to connect to the loading position along the loading position, the test position, and the unloading position. The test tray is conveyed by the circulation path of the position; and a control device that controls the loading device, the connecting device, the unloading device, and the multiple conveying devices, and the multiple conveying devices convey only one in one operation Test trays, so that a plurality of test trays conveyed along the circulation path can be independently conveyed independently of each other, and at least one specific conveying device of the plurality of conveying devices selectively holds the front edge or rear of the test tray The end edge is conveyed along the circulation path, the front edge refers to the edge located in the front when the test tray is transferred along the circulation path, and the rear edge refers to the rear edge opposite to the front edge On the other hand, the control device divides the conveying section in charge of the specific conveying device into a first conveying area and a second conveying area sequentially along the conveying direction of the test tray, and controls the specific conveying device so as to When the specific conveying device conveys the test tray in the first conveying area, the specific conveying device holds the front edge of the test tray, and when the specific conveying device conveys the test tray in the second conveying area When the test tray is being tested, the specific conveying device is made to hold the rear end of the test tray.

The processor for testing electronic components according to the second aspect of the present invention includes: a loading device, which loads a plurality of electronic components to be tested on a test tray located at a loading position; and a connecting device, which will be completed by the loading device After the electronic component is loaded, the electronic component loaded in the test tray that comes to the test position is electrically connected to the tester; the unloading device comes after the completion of the test of the electronic component electrically connected to the tester by the connecting device The test tray in the unloading position unloads a plurality of electronic components that have been tested; a plurality of conveying devices are used to connect to the loading position along the loading position, the test position, and the unloading position. Position of the circulation path to transport the test tray; and a control device that controls the loading device, the connecting device, the unloading device, and the multiple conveying devices, and the multiple test trays can be placed side by side at the test location, The connecting device can electrically connect the plurality of electronic components loaded on the plurality of test trays to the tester, and the plurality of conveying devices are responsible for the conveying of the plurality of test trays into the test position. There are a plurality of specific conveying devices for conveying in a section or a conveying section advancing from the test position to correspond to the number of the plurality of test trays. Therefore, the plurality of test trays are independent of each other but can be conveyed simultaneously.

The specific conveying device selectively grips the front edge or the rear edge of the test tray to convey it along the circulation path. Here, the front edge refers to the side located forward when the test tray is conveyed along the circulation path, and the rear edge refers to the side located at the rear opposite to the front edge.

The specific conveying device includes: a holder having a holding member capable of selectively holding a front end or a rear end of the test tray; and a mover that positions the holding member, The holding member is made to selectively hold the front edge or the rear edge of the test tray, and the holding member is moved to convey the test tray held by the holder along the circulation path .

The holder further includes a lifting source that lifts and lowers the holding member so that the holding member can hold or release the front edge or the rear edge of the test tray , The holding member has a holding groove, and the front edge or the rear edge of the test tray can be inserted into the holding groove, so that the front edge or the rear edge of the test tray can be held by lifting Or lift the grip.

The holder includes a rotation source that rotates the holding member so that the holding member can hold or release the front edge of the test tray, and the test tray includes: A plurality of loading elements for loading a plurality of electronic components; and a setting frame, provided with a plurality of the loading elements, and forming the outer frame of the test tray, the front and rear sides of the setting frame have a The front or rear opening of the buckle slot,-the front refers to the direction in which the test tray is going to advance when transported along the circulation path, and the rear refers to the opposite direction to the front-the gripping member can be inserted into the buckle slot, and The gripping member has a gripping portion, and in a state where the gripping member is inserted into the buckle groove, the gripping portion can hang the front and rear sides of the setting frame according to the rotating state to align the The test tray is held or released.

The processor for testing electronic components further includes: a constant temperature chamber, accommodating the test tray that is loaded with the electronic component to be tested by the loading device, and performing processing on the electronic components loaded in the stored test tray Preheating or pre-cooling; a test chamber, which contains the test tray from the constant temperature chamber, and supports a temperature environment so that the electronic components loaded in the stored test tray can be tested; and a heat removal chamber, which contains The test tray of the test chamber is used to restore the plurality of electronic components loaded on the test tray to normal temperature before the test tray is transferred to the unloading position, the constant temperature chamber, the test The chamber and the heat removal chamber are arranged side by side on the circulation path, and among the plurality of transfer devices, the second transfer device that transfers the test tray from the constant temperature chamber to the test chamber includes: a second grip A device having a second holding member capable of holding the rear end of the test tray; and a second mover that positions the second holding member to hold the test tray The rear end, and by moving the second holding member to transfer the test tray held by the second holder to transfer from the constant temperature chamber to the test chamber, the plurality of transfers The third transfer device for transferring the test tray from the test chamber to the heat removal chamber in the device may include: a third holder having a third holding member, and the third holding member can be selectively Holding the front or rear end of the test tray; and a third mover, positioning the third holding member to selectively hold the front or rear end of the test tray, and moving The third holding member transfers the test tray held by the third holder to transfer the test tray from the test chamber to the heat removal chamber.

The second holding member can use the lifting of the second holding member or the lifting of the test tray to hold or release the holding of the test tray, and the third holding device includes: a third holding device The holding member can selectively hold the front edge or the rear edge of the test tray and the rotation source, so that the third holding member can be rotated forward and backward, so that the third holding member can be aligned The front edge or the rear edge of the test tray is held or released. Invention effect

According to the present invention, it has the effect of simplifying the structure of the conveying device to minimize the complexity of the design caused by mechanical interference with other structures, thereby reducing the production cost, and due to the reduction in size, preventing the equipment is too big.

Detailed description of the preferred embodiment The preferred embodiments of the present invention will be described with reference to the accompanying drawings, and the description is concise, and the description of repeated or substantially identical structures is omitted or compressed as much as possible. >Definition of terms>

In this description, among the names used in the structure of the test tray, the term "front edge" refers to the side located in front of the forward direction side of the test tray when the test tray is conveyed along the circulation path, and the term "rear edge" "Refers to the side opposite to the front edge.

Therefore, referring to FIG. 2, when the test tray TT is transported in the first arrow direction a, the rear side S3 on the Y axis is the front end side, and the front side S1 is the rear end side. In addition, when the test tray TT is transported in the second arrow direction b, the right side S4 on the X axis is the front end, and the left side S2 is the rear end.

Likewise, the term "front" refers to the direction to travel when the test tray TT is conveyed along the circular path, and the term "rear" refers to the reverse of the front. >Description of the test tray>

2, the test tray TT includes a plurality of loading elements LE and a setting frame IF.

A plurality of loading components LE are used for loading electronic components D.

The mounting frame IF is provided with a loading element LE, and constitutes the outer frame of the test tray TT. The two sides in the X-axis direction of this setting frame IF have snap grooves JG partially open to the outside (front side and rear side). Therefore, when viewed on a plane, the two locking grooves JG have an axisymmetric "T" shape with a tail in the X-axis direction.

As shown in FIG. 3, the test tray TT uses a plurality of conveying devices to cyclically move along a closed circulation path C, which is connected via a loading position LP, a test position TP, an unloading position UP, and a standby position WP. To the loading position LP.

When the test tray TT is located at the loading position LP, a plurality of electronic components D to be tested are loaded on the test tray TT.

When the test tray TT is located at the test position TP, the multiple electronic components D loaded on the test tray TT are electrically connected to the tester, so that the multiple electronic components D can be tested by the tester.

At the unloading position UP, the plurality of electronic components D that have completed the test are unloaded from the test tray TT.

In the standby position WP, the previous test tray TT that performs the loading operation at the current loading position LP is transferred to the constant temperature chamber SC after the loading operation is completed, and the latter empty test tray TT waits before moving to the loading position LP.

For reference, in the conceptual diagram of FIG. 3, as shown in the prior art, a processor HR having a structure in which a plurality of electronic components D loaded on two test trays TT at a time are simultaneously tested in order to expand the processing capacity is shown. Therefore, when viewed on a plane, two test trays TT are each contained in the constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC. Therefore, the conveying paths C1 and C2 from the constant temperature chamber SC to the test position TP in the test chamber TC or from the test position TP to the heat removal chamber DC are divided into two. In the conveying paths C1, C2, two test trays TT They are independent of each other and not combined, but they can be transmitted simultaneously. Of course, according to the implementation method, it can of course also be considered to be simplified to a structure in which only multiple electronic components D loaded in one test tray TT are tested at a time, or multiple electronic components loaded in more than three test trays TT can be considered. D is the structure for testing to achieve expansion of processing capacity. >Outline description of the processor>

4 is a conceptual top view for explaining the structure of a processor HR (hereinafter, simply referred to as "processor") for testing electronic components according to an embodiment of the present invention.

As shown in FIG. 4, the processor HR according to this embodiment includes: a loading device 100, a constant temperature chamber SC, a test chamber TC, a connecting device 200, a heat removal chamber DC, an unloading device 300, a first conveying device 400, and two second The second conveying device 500, the two third conveying devices 600, the fourth conveying device 700, the fifth conveying device 800, and the control device 900.

The loading device 100 loads a plurality of electronic components D to be tested from the customer tray CT1 to the test tray TT located at the loading position LP.

When viewed on a plane, the thermostatic chamber SC can accommodate two test trays TT, and the plurality of electronic components D loaded in the accommodated test trays TT are heated or cooled in advance. That is, the constant temperature chamber SC accommodates the test tray TT loaded with the electronic component D to be tested by the loading device 100, and is used to preheat or pre-cool the plurality of electronic components D loaded in the accommodated test tray TT.

The test chamber TC can accommodate two test trays TT from the constant temperature chamber SC, and is used to provide a temperature environment capable of testing a plurality of electronic components D loaded in the accommodated test tray TT. In this test chamber TC, a plurality of electronic components D loaded on the test tray TT are electrically connected to a tester (not shown) located below, so that the tester performs testing.

The connecting device 200 presses the plurality of electronic components D loaded in the two test trays TT placed side by side at the test position TP inside the test chamber TC downward, so that the plurality of electronic components D are electrically connected to the tester. connection.

When viewed on a plane, the heat removal chamber 260 can accommodate two test trays TT, and before the test tray TT is sent to the unloading position UP, the multiple electronic components D loaded in the test tray TT from the test chamber TC are restored to Normal temperature or close to normal temperature, so that proper unloading operation of a plurality of electronic components D can be performed later.

The constant temperature chamber SC, the test chamber TC, and the heat removal chamber DC as described above are placed side by side along the X-axis direction on the circulation path C.

The unloading device 300 unloads the plurality of electronic components D loaded in the test tray TT moved from the heat removal chamber DC to the unloading position UP from the test tray TT, classifies the plurality of electronic components according to the test category, and then classifies the classified plurality The electronic component D is loaded on the empty customer tray CT2.

The first transfer device 400 to the fifth transfer device 800 transfer the test tray TT along the circulation path C.

The first transfer device 400 transfers the test tray TT in the first transfer section ① from the loading position LP to the inside of the constant temperature chamber SC.

The second transfer device 500 transfers the test tray TT in the second transfer sections ②-1 and ②-2 from the inside of the constant temperature chamber SC to the test position TP.

The third transfer device 600 transfers the test tray TT in the third transfer sections ③-1 and ③-2 from the test position TP to the inside of the heat removal chamber DC.

The fourth transfer device 700 transfers the test tray TT in the fourth transfer section ④ from the inside of the heat removal chamber DC to the unloading position UP.

The fifth conveying device 800 conveys the test tray TT in the fifth conveying section ⑤ from the unloading position UP through the standby position WP to the loading position LP.

The above-mentioned first transfer device 400 to the fifth transfer device 800 transfer only one test tray TT in one operation, so that the multiple test trays TT transferred along the circulation path C are transferred independently of each other. Of course, the two second transfer devices 500 can also transfer the two test trays TT from the constant temperature chamber SC to the test position TP independently of each other, but they can also be controlled to transfer simultaneously, and the two third transfer devices 600 can also transfer the two test trays. The test trays TT are independently transferred from the test position TP to the heat removal chamber DC, and can also be controlled to be transferred simultaneously.

The control device 900 controls each structure described above. >Description of characteristic structure> 1. The first conveyor

The first transfer device 400 transfers the test tray TT on which the multiple electronic components D have been loaded from the loading position LP to the inside of the constant temperature chamber SC. To this end, the first transfer device 400 is located above the test tray TT in the constant temperature chamber SC, as shown in the partial perspective exploded view of FIG. 5, the first transfer device 400 includes a first holder 410 and a first mover 420.

The first gripper 410 grips or releases the grip of the front edge or the rear edge of the test tray TT. Here, the front end side and the rear end side are sides opposite to each other in the Y-axis direction. Such a first holder 410 includes: a first holding member 411, a first coupling member 412, a first lifting rail 413, and a first lifting source 414.

The first holding member 411 may hold or release the holding or release of the front end or the rear end of the test tray TT that should be moved in the Y-axis direction, and be coupled to the first coupling member 412 in a manner capable of lifting. To this end, the first gripping member 411 includes a gripping groove GG, and the front or rear end of the test tray TT can be inserted into the gripping groove GG, so that the lifting of the first gripping member 411 can be used to test The front edge or the rear edge of the tray TT is held or released. In addition, the first coupling member 412 has an insertion protrusion IP that can be inserted into the rail groove RG of the first lifting rail 413 described later.

The first coupling member 412 is coupled with the first conveyor belt 421 of the first mover 420, and when the first mover 420 is operated, the first coupling member 412 moves in the Y-axis direction. Therefore, the first holding member 411 coupled to the first coupling member 412 also moves together, and finally the test tray TT held by the first holding member 411 moves along the Y-axis direction.

The first lifting rail 413 has a long rail groove RG in the Y-axis direction, and is configured to be capable of lifting. The above-mentioned insertion protrusion IP is inserted into the guide rail groove RG of the first lifting rail 413, so that the first holding member 411 and the first lifting rail 413 are lifted in conjunction with the lifting. In addition, when the first holding member 411 moves in the Y-axis direction with the insertion protrusion IP inserted into the guide groove RG, the first lifting rail 413 is not only used to transmit the lifting power of the first lifting source 414 to the holding member 411 is also used to guide the movement of the first holding member 411 while supporting the first holding member 411.

The first lifting source 414 lifts the first lifting rail 413 and finally lifts the first holding member 411. Therefore, as shown in Figures 6(a) and 6(b), when the first lifting source 414 lowers the first holding member 411, the test tray TT is held by the first holding member 411, and when the first lifting source When the first holding member 411 is raised by 414, the holding of the test tray TT by the first holding member 411 is released. Of course, according to the embodiment, instead of raising and lowering the first holding member 411, it is of course possible to consider a manner in which the first holding member 411 grips or releases the test tray TT by lifting the test tray TT.

The first mover 420 positions the first gripping member 411 to selectively grip the front or rear end of the test tray TT, and moves the first gripping member 411 along the Y-axis direction, so as to be The test tray TT held by the holder 410 is conveyed along the circulation path C in the Y-axis direction. To this end, the first mover 420 includes a first conveyor belt 421 and a first driving source 422.

The first conveyor belt 421 rotates forward and backward with a pair of pulleys P1 and P2 provided at a constant interval in the Y-axis direction as rotation turning points. Therefore, the first coupling member 412 coupled to the first conveyor belt 421 can move forward and backward in the Y-axis direction. Finally, the first holding member 411 and the test held by the first holding member 411 The tray TT can move forward and backward in the Y axis direction.

The first driving source 422 rotates the first conveyor belt 421 forward and reverse.

The movement in the Y-axis direction of the test tray TT using this first transfer device 400 will be described.

Referring to FIG. 7 and the like, the transfer section ① of the first transfer device 400 is divided into a first charge section ① _{1 in the} front and a second charge section ① _{2 in the} rear in the transfer direction of the test tray TT. The second responsible section ① ₂ and the first responsible section ① ₁ respectively correspond to the first transmission area and the second transmission area in the scope of the patent application.

First, as shown in FIG. 7, the first holding member 411 is controlled to hold the front edge of the previous test tray TTf at the loading position LP. As shown in FIG. 8, when the previous test tray TTf is transferred from the second When the responsible section ① ₂ enters the first responsible section ① ₁ (that is, the previous test tray TTf is transferred from the first transfer area), the previous test pallet TTf conveys the distance degree of the second responsible section ① ₂ . Then, as shown in FIG. 9, the first holding member 411 is controlled to hold the rear edge of the previous test tray TTf. As shown in FIG. 10, when the previous test tray TTf is transferred from the second transfer area, the front a test tray TTf responsible for transmitting the first distance interval ① ₁ degree. At this time, as shown in FIG. 9 and FIG. 10, the next test tray TTr, which is a later launch, is transferred from the standby position WP to the loading position LP.

As shown in FIG. 10, when the transfer of the previous test tray TTf is completed, as shown in FIG. 11, the first holding member 411 is controlled to hold the front edge of the next test tray TTr, as shown in FIG. TTr test tray 400 by the second transfer charge of a first transfer section from ① degree ₂ apparatus.

As described above, the previous test tray TTf and the next test tray TTr are sequentially entered and contained in the inside of the constant temperature chamber SC using the first transfer device 400, and are placed side by side in the Y-axis direction.

In this way, the first conveying device 400 is controlled so that the first holding member 411 can selectively hold the front end or the rear end of the test tray TT, so that the operating distance can be reduced, and thus, the first The size of the conveyor 400 is minimized. 2. The second conveyor

A pair of second transfer devices 500 placed side by side in the Y-axis direction separately transfer the two test trays TT in the constant temperature chamber SC along the X-axis direction on the side of the test chamber TC, thereby, the two test trays TT It is conveyed in the second conveyance interval ②-1 and ②-2, and moves from the constant temperature chamber SC to the test position TP. Here, reducing the transfer time of the test tray TT will also bring about the effect of increasing the processing capacity. Therefore, preferably, a pair of second transfer devices 500 are operated at the same time to control the simultaneous transfer of the two test trays TT.

To this end, the second transfer device 500 is located below the test tray TT placed in the constant temperature chamber SC, and as shown in the exploded perspective view of FIG. 13, the second transfer device 500 includes a second holder 510 and a second movement器520.

The second holder 510 can hold the rear edge of the test tray TT. Here, the rear end side is the side on the left side in the X-axis direction in the figure. This second holder 510 includes a second holding member 511 and a second coupling member 512.

The second holding member 511 has a T-shaped holding portion GP capable of holding the rear end edge of the test tray TT. The holding part GP has a T-shape with a tail in the left direction in the figure, and can be inserted into the buckle groove JG located at the rear end of the test tray TT. Therefore, as shown in FIG. 14, the T-shaped grip portion GP is inserted into the T-shaped snap groove JG of the test tray TT, whereby the second grip member 511 can be in a gripping state to be able to push the test Tray TT. At this time, the way that the grip part GP is inserted into the buckle groove JG can be achieved by lowering the test tray TT in the Z-axis direction, but it can also be considered to be raised in the Z-axis direction by the second grip member 511 The test tray TT is gripped, or the third conveying device 600 is realized by rotating the second gripping member 511 to grip the test tray TT as described later.

The second coupling member 512 is coupled with the second conveyor belt 521 of the second mover 520, and the holding member 511 is coupled to this second coupling member 512.

The second mover 520 can position the second holding member 511 to hold the rear edge of the test tray TT, and move the second holding member 511 in the X-axis direction, and finally, the second holding member 510 can be held by the second holding member 510. The held test tray TT moves along the circulation path C in the X-axis direction. Therefore, as shown in FIGS. 15(a) and 15(b), the test tray TT is pushed by the second conveying device 500 to be conveyed in the second conveying section ②-1, ②-2, whereby the test The tray TT moves from the constant temperature chamber SC to the test position TP in the test chamber TC. To this end, similar to the first conveying device 400, the second mover 520 has a second conveyor belt 521 and a second driving source 522.

For reference, the second driving source 522 in this embodiment is preferably implemented as a structure shared in a pair of second conveying devices 500 to reduce cost and simplify the structure. 3. The third conveyor

When the test of the electronic components loaded on the test tray TT is completed at the test position TP, the third transfer device 600 transfers the test tray TT in the third transfer interval ③-1, ③-2, and moves the test tray TT to remove heat The interior of room DC. To this end, the third transfer device 600 is located below the test tray TT in the heat removal chamber DC, and as shown in the exploded perspective view of FIG. 16, the third transfer device 600 includes a third holder 610 and a mover 620 .

The third gripper 610 grips or releases the front edge or the rear edge of the test tray TT. Here, the front end side and the rear end side are sides opposed to each other in the X-axis direction. Such a third holder 610 includes: a third holding member 611, a third coupling member 612, and a rotation source 613.

The third gripping member 611 can grip or release the grip of the front edge or the rear edge of the test tray TT by rotating. To this end, the third gripping member 611 has a gripping portion GP that is arranged to be bent at 90 degrees with the rotation axis of the third gripping member 611 (ie, arranged to be along an orthogonal direction to the rotation axis Direction extension), so that the front edge or the rear edge of the test tray TT can be selectively held.

The third transfer device 620 pulls the test tray TT for transfer. Therefore, when the third gripping member 611 grips the front or rear end of the test tray TT, as shown in FIG. 17(a), the grip portion GP is held When the test tray TT is in a state where the test tray TT can be pulled to the right in the X-axis direction, the gripping part GP is inserted into the buckle groove JG of the test tray TT. State, when the third holding member 611 releases the holding state of the test tray TT, as shown in FIG. 17(b), the holding part GP rotates in the reverse direction, so that when the holding part GP is in contact with the test tray When the buckle groove JG of the TT is separated, the third gripping member 611 can be released.

The third coupling member 612 is coupled to the conveyor belt 621 of the third mover 620, and when the third mover 620 operates, the third coupling member 612 moves in the X-axis direction. Therefore, the third holding member 611 combined with the third joining member 612 also moves together, and finally, the test tray TT held by the third holding member 611 moves in the X-axis direction.

When the third gripping member 611 wants to grip or release the grip of the front or rear end of the test tray TT, the rotation source 613 causes the third gripping member 611 to rotate forward or backward, thereby, The third gripping member 611 can grip or release the test tray TT. Here, the rotation source 613 is provided as an air cylinder, and the uniaxial element SE is sandwiched between the rotation source 613 and the third holding member 611, so that the rotation source 613 is in contact with the rotation axis of the third holding member 611. The third holding member 611 is pushed or pulled at positions separated by a predetermined interval, so as to realize the rotation of the third holding member 611. However, according to the embodiment, it is of course also possible to consider using a rotation motor as the rotation source 613 to directly rotate the third holding member 611.

In this embodiment, the third gripping member 611 is rotated forward and backward, thereby enabling the third gripper 610 to grip or release the grip of the test tray TT. According to the embodiment, Similarly, the second conveying device 500 may of course also be a structure in which the test tray TT is held or released by the lifting of the third holding member 611 or the lifting of the test tray TT. That is, it can be fully considered that the second transfer device 500 and the third transfer device 600 adopt the same structure at the same time, but the following aspects are considered: the second transfer device 500 pushes the test tray TT and the third transfer device 600 pulls the test tray TT The second conveying device 500 uses one operation to complete the transmission of the test tray TT on the second conveying interval ②-1, ②-2, and the third conveying device 600 uses two operations to complete the third conveying interval ③-1 ③ Regarding the transfer work of the test tray TT on -2, the second transfer device 500 only needs to hold the rear edge of the test tray TT, while the third transfer device 600 needs to handle both the front and rear edges of the test tray TT. In terms of being able to be held, as described in this embodiment, preferably, the second conveying device 500 and the third conveying device 600 have different holding structures.

The third mover 620 positions the third holding member 611 to selectively hold the front or rear end of the test tray TT, and moves the third holding member 611 in the X-axis direction, thereby causing the third The test tray TT held by the holder 610 is conveyed along the circulation path C in the X-axis direction. Similarly, preferably, a pair of third conveying devices 600 share the third driving source 622 provided in the third mover 620.

Next, the movement in the X-axis direction of the test tray TT using the third conveyor 600 will be described.

As shown, the third transfer means the third transfer section ③-1, is responsible for the second section ③ ③-2 is responsible for is divided into a first front section and the rear ③ ₁ 600 _218. The second responsible section ③ ₂ and the first responsible section ③ ₁ respectively correspond to the first transfer area and the second transfer area in the scope of the patent application.

First, when the test tray TT is transferred in the second responsible section ③ ₂ (first transfer area), as shown in FIG. 18, if the third holding member 611 grips the front end of the test tray TT, as shown in FIG. 19 , The third mover 620 operates to transfer the test tray TT, so that the front edge of the test tray TT is located in the first responsible section ③ ₁ (second transfer area), and the rear edge of the test tray TT is located in the second responsible section ③ ₂ within. Thereafter, as shown in FIG. 20, if the third gripping member 611 grips the rear edge of the test tray TT, as shown in FIG. 21, the third mover 620 operates to further transfer the test tray TT so that the test tray TT The front and rear edges of both are located in the first responsible interval ③ ₁ . In this way, the third transfer device 600 transfers the plurality of test trays TT from the test position TP to the inside of the heat removal chamber DC through a two-time transfer process. With this operation method, the third holding member 611 does not need to enter the depths of the tester chamber TC, so not only the operation distance can be shortened, but the size of the third conveying device 600 can be minimized according to its proportion.

This third conveying device 600 is also arranged in pairs in the Y-axis direction side by side. A pair of third conveying devices 600 can be held independently of each other, but in order to increase the processing speed and reduce the cost, a third driving source is shared. 622, in order to be able to realize the transfer work simultaneously during operation. Therefore, although the two test trays TT are independent of each other, they are transferred at the same time.

Of course, as described above, the second conveying device 500 and the third conveying device 600 are different only in terms of pushing and pulling, so it is preferable to consider having the same structure. Therefore, like the third conveying device 600, the second conveying device 500 can also be implemented as a way to convey the test tray TT through two processes. 4. Fourth conveyor

The fourth conveying device 700 is used to convey the test tray TT in the heat removal chamber TC to the unloading position UP, and its structure is basically the same as that of the first conveying device 400, so its description will be omitted. However, the fourth transfer device 700 first transfers the test tray TT located in the front to the unloading position UP, and then transfers the test tray TT located in the rear to the unloading position UP, and therefore undergoes two processes. 5. Fifth conveyor

The fifth conveying device 800 is provided to convey the test tray TT located at the unloading position UP to the loading position LP via the standby position WP, and its structure and operation are basically the same as the third conveying device 600. However, it is preferable to provide a lifting source for lifting and lowering the gripping member of the test tray TT to lift the gripping member according to the operation of the lifting source, and to position the gripping member at the edge capable of hanging the test tray TT. Status, or can be released. Of course, even in the case of the fifth conveying device 800, it can be fully considered that the test tray TT is raised and lowered instead of the lifting source to rotate the holding member, so that the holding member can hold or release the test tray TT. hold. In some cases, of course, it is also possible to consider arranging the holding member to be capable of lifting and rotating. >Other considerations>

According to the present invention, the first conveying device 400, the third conveying device 600, the fourth conveying device 700, and the fifth conveying device 800 are implemented in a manner of dividing into two transmissions in order to minimize the size. In addition, in some cases, when it is necessary to transfer the long-distance fifth transfer device 800 via the standby position WP, it may also be implemented in a manner of transferring the test tray TT in three or more processes. In this case, the test tray TT must be accurately positioned in the correct position in order to properly hold the test tray TT by the gripping members 411, 611, 811. Therefore, preferably, it may be considered to provide a liftable stopper so that the test tray TT can be transferred to an accurate position.

For example, consider a path that uses the fourth transfer device 700 to transfer the test tray TT from the heat removal chamber DC to the unloading position UP, and then uses the fifth transfer device 800 to transfer the test tray TT to the loading position via the standby position WP. Location LP. On this path, in order to properly hold the test tray TT by the fifth conveyor 800, as shown in the schematic view of FIG. 22, four stoppers SP1, SP2, SP3, Each of SP4 can be raised and lowered by the lifter UD.

The functions of the stoppers SP1, SP2, SP3, and SP4 will be described with reference to Figs. 23(a) to 23(f).

First, when the test tray TT is transferred to the unloading position UP in the Y-axis direction by the fourth transfer device 700, as shown in FIG. 23(a), from the state where the first stopper SP1 is lowered, as shown in FIG. 23( As shown in b), the first stopper SP1 starts to rise to locate the position of the test tray TT in the Y-axis direction. At this time, the second stopper SP2 is in a raised state, so the X-axis direction of the test tray TT is accurately set.

Next, when the test tray TT is to be transferred to the standby position WP in the X-axis direction, as shown in FIG. 23(c), first, the second stopper SP2 is lowered. In this state, as shown in FIG. 23(d), when the test tray TT is transferred to the standby position WP, the third stopper SP3 in a raised state prevents excessive transfer of the test tray TT, and The second stopper SP2 is raised, thereby accurately positioning the position of the test tray TT in the X-axis direction.

Similarly, even when the test tray TT is transferred from the standby position WP to the loading position LP, as shown in FIG. 23(e) and FIG. 23(f), the lowering and raising of the third stopper SP3 and the fourth stop The stopper SP4 prevents excessive transfer of the test tray TT, and the test tray can be accurately located at the loading position LP.

A required number of such stoppers SP and lifters UD can be provided at required positions in the entire conveying path.

For reference, as shown in FIG. 23, the first stopper SP1 can be implemented by the lifting rail GR to guide the test tray TT to move in the X-axis direction, and the fourth stopper SP4 can also be implemented by the lifting rail to The test tray TT is guided to move in the Y-axis direction. That is, preferably, it may be considered to replace a part of the multiple stoppers for accurately setting the position of the test tray TT with a guide rail for guiding the transfer of the test tray TT on the transfer path of the test tray TT. In addition, in the above manner, in the portion where the guide rail is used as a stopper, the guide rail must be raised and lowered so that the guide rail does not interfere with the transfer of the test tray TT.

As mentioned above, the specific description of the present invention is obtained by referring to the embodiments of the drawings. However, the above-mentioned embodiments are only to illustrate the preferred examples of the present invention. Therefore, it should be understood that the present invention is not limited to the disclosed embodiments. The scope of the present invention should be understood to be within the scope of the attached patent application and its equivalents.

100: loading device 200: Connecting device 260: Heat removal chamber 300: Uninstall device 400: The first conveyor 410: First Holder 411: Grip member 412: The first joining member 413: The first lifting track 414: First Lifting Source 420: first mover 421: The first conveyor belt 422: first drive source 500: second conveyor 510: Second Holder 511: second holding member 512: The second joining member 520: second mover 521: Second conveyor belt 522: second drive source 600: third conveyor 610: Third Holder 611: third holding member 612: Third Combination Member 613: Rotation Source 620: Mover 621: Conveyor Belt 622: third drive source 700: Fourth Transmission Device 800: Fifth Transmission Device 811: Grip member 900: control device a: the direction of the first arrow b: second arrow direction C: loop path C1, C2: Transmission path CT2: customer tray D: Electronic components DC: Heat removal chamber GG: Grip slot GP: grip part HR: Processor for testing electronic components IF: set frame IP: Insert bump JG: buckle slot LE: Load components LP: Loading position P1, P2: pulley RG: Rail groove S1: Front side S2: left side S3: back side S4: Right side SC: Constant temperature room SP1, SP2, SP3, SP4: stopper TC: test room TP: test location TT, TTf, TTr: test tray UD: Lifter UP: Uninstall location WP: Standby position

FIG. 1 is a conceptual top view of a processor for testing electronic components according to the prior art. 2 is a perspective view of a test tray that can be applied to the processor for testing electronic components according to the present invention. 3 is a conceptual top view of a processor for testing electronic components according to an embodiment of the present invention to which the test tray of FIG. 2 is applied. 4 is a conceptual plan view for explaining the configuration of the processor for testing electronic components of FIG. 3. FIG. 5 is a schematic partial perspective exploded view of the first transmission device applied to the processor for testing electronic components of FIG. 3. 6(a) and 6(b) are reference diagrams for explaining the operation of holding and releasing the test tray by the first conveying device of FIG. 5. 7 to 12 are reference diagrams for explaining the first transfer operation performed by the first transfer device of FIG. 5. FIG. 13 is an exploded perspective view of a second transfer device applied to the processor for testing electronic components of FIG. 3. FIG. 14 is a reference diagram for explaining the action of the second conveying device in FIG. 13 holding the test tray. 15(a) and 15(b) are reference diagrams for explaining the transfer operation of the second transfer device of FIG. 14. FIG. 16 is a perspective exploded view of a third transfer device applied to the processor for testing electronic components of FIG. 3. 17(a) and FIG. 17(b) are reference diagrams for explaining the operation of the third conveying device of FIG. 16 to hold and release the test tray. 18 to 21 are reference diagrams for explaining the transfer operation of the third transfer device of FIG. 16. FIGS. 22(a), 22(b), and FIGS. 23(a) to 23(f) are schematic reference diagrams for explaining the processor stopper for testing electronic components that can be applied to FIG. 3.

400: The first conveyor

410: First Holder

411: Grip member

412: The first joining member

413: The first lifting track

414: First Lifting Source

420: first mover

421: The first conveyor belt

422: first drive source

GG: Grip slot

IP: Insert bump

P1, P2: pulley

RG: Rail groove

Claims (8)

A processor for testing electronic components, characterized in that it comprises: Loading device, which loads multiple electronic components to be tested on the test tray at the loading position; A connecting device, which electrically connects a plurality of electronic components loaded in the test tray that comes to the test position after the loading of the electronic components is completed by the loading device to the tester; An unloading device, which unloads a plurality of electronic components that have completed the test from the test tray that comes to the unloading position after the test of the electronic component electrically connected to the tester by the connecting device is completed; A plurality of conveying devices conveying the test tray along a circular path connected to the loading position via the loading position, the test position, and the unloading position; and A control device for controlling the loading device, the connecting device, the unloading device and a plurality of the conveying devices, The plurality of conveying devices convey only one test tray in one operation, so that the test trays conveyed along the circulation path can be conveyed independently of each other, At least one specific conveying device among the plurality of conveying devices selectively grips the front edge or the rear end of the test tray to convey along the circulation path, The front edge refers to the front edge of the test tray when the test tray is conveyed along the circulation path, and the rear edge refers to the back edge of the test tray opposite to the front edge. side, The control device divides the conveying section in charge of the specific conveying device into a first conveying area and a second conveying area sequentially along the conveying direction of the test tray, and controls the specific conveying device so that when the specific conveying device is When the transfer device transfers the test tray in the first transfer area, the specific transfer device holds the front edge of the test tray, and when the specific transfer device transfers the test tray in the second transfer area When the tray is used, the specific conveying device is made to hold the rear edge of the test tray. A processor for testing electronic components, characterized in that it comprises: Loading device, which loads multiple electronic components to be tested on the test tray at the loading position; A connecting device, which electrically connects a plurality of electronic components loaded in the test tray that comes to the test position after the loading of the electronic components is completed by the loading device to the tester; An unloading device, which unloads a plurality of electronic components that have completed the test from the test tray that comes to the unloading position after the test of the electronic component electrically connected to the tester by the connecting device is completed; A plurality of conveying devices conveying the test tray along a circular path connected to the loading position via the loading position, the test position, and the unloading position; and A control device for controlling the loading device, the connecting device, the unloading device and a plurality of the conveying devices, Multiple test trays can be placed side by side at the test position, The connecting device can electrically connect a plurality of electronic components loaded on a plurality of the test trays to a tester together, Among the plurality of conveying devices, there are a plurality of specific conveying devices responsible for the conveying of the plurality of test trays into the conveying section of the test position or the conveying section from the test position to correspond to the plurality of conveying sections. According to the number of the test trays, a plurality of the test trays are independent of each other and can be transported simultaneously. The processor for testing electronic components according to claim 2, characterized in that: The specific conveying device selectively grips the front end or the rear end of the test tray to convey it along the circulation path, The front edge refers to the front edge of the test tray when the test tray is conveyed along the circulation path, and the rear edge refers to the back edge of the test tray opposite to the front edge. side. The processor for testing electronic components according to claim 1 or 3, characterized in that: The specific transmission device includes: A holder having a holding member capable of selectively holding the front edge or the rear edge of the test tray; and A mover for positioning the holding member so that the holding member selectively holds the front or rear end of the test tray, and by moving the holding member, the holding member will be held by the holder The held test tray is transported along the circulation path. The processor for testing electronic components according to claim 4, characterized in that: The holder also includes a lifting source, The lifting source raises and lowers the holding member, so that the holding member can hold or release the front edge or the rear edge of the test tray, The holding member has a holding groove, and the front or rear end of the test tray can be inserted into the holding groove, so that the front or rear end of the test tray can be held or held by lifting or lowering. Lift the grip. The processor for testing electronic components according to claim 4, characterized in that: The holder includes a rotation source, The rotation source rotates the holding member so that the holding member can hold or release the front edge of the test tray, The test tray includes: Multiple loading components for loading multiple electronic components; and A frame is provided with a plurality of the loading elements to form the outer frame of the test tray, The front and rear sides of the setting frame are provided with a buckle slot that is partially open to the front or the rear, The front refers to the direction in which the test tray is to be moved forward when conveying the test tray along the circulating path, and the rear refers to the opposite direction to the front, The holding member can be inserted into the buckle groove, and the holding member has a holding portion, and in a state where the holding member is inserted into the buckle groove, the holding portion The front edge and the rear edge of the setting frame are hung in a partially rotated state to hold or release the holding of the test tray. The processor for testing electronic components according to claim 1 or 3, characterized in that it further comprises: A constant temperature room, containing the test tray that is loaded with the electronic components to be tested by the loading device, and preheating or pre-cooling the electronic components loaded in the stored test tray; A test chamber, which contains the test tray from the constant temperature chamber and provides a temperature environment so that the electronic components loaded in the test tray can be tested; and The heat removal chamber contains the test tray from the test chamber, and restores the multiple electronic components loaded on the test tray to normal temperature before the test tray is transferred to the unloading position, The constant temperature chamber, the test chamber and the heat removal chamber are arranged side by side on the circulation path, Among the plurality of conveying devices, the second conveying device that conveys the test tray from the constant temperature chamber to the test chamber includes: A second gripper having a second gripping member capable of gripping the rear end of the test tray; and A second mover, positioning the second holding member to hold the rear edge of the test tray, and moving the second holding member to move the test held by the second holding device The tray is transferred from the constant temperature chamber to the test chamber, Among the plurality of conveying devices, the third conveying device that conveys the test tray from the test chamber to the heat removal chamber includes: A third gripper having a third gripping member capable of selectively gripping the front edge or the rear edge of the test tray; and A third mover, positioning the third holding member to selectively hold the front edge or the rear edge of the test tray, and by moving the third holding member, the third holding member will be The held test tray is transferred from the test chamber to the heat removal chamber. The processor for testing electronic components according to claim 7, characterized in that: The second holding member can hold or release the test tray by using the lifting of the second holding member or the lifting of the test tray, The third holder includes: A third holding member capable of selectively holding the front edge or the rear edge of the test tray; and The rotation source rotates the third holding member forward and backward so that the third holding member can hold or release the front edge or the rear edge of the test tray.

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