TW201939042A - Inspection unit and inspection device - Google Patents

Abstract

This inspection unit comprises a first inspection tool and second inspection tool that are disposed so as to be aligned in a first direction and that each have: a contact element having formed, on the ends thereof, a first contact part capable of touching an object of inspection and a second contact part capable of touching an inspection device; and a housing for accommodating therein the contact element in a state where the first contact part is exposed to the outside. At least one from among the first inspection tool and second inspection tool is disposed so as to be capable of being moved along the first direction. Moving at least one from among the first inspection tool and second inspection tool along the first direction in a state in which an object of inspection has been brought close to the first contact parts from a second direction causes the first contact parts to come into contact with the object of inspection from the first direction.

Description

Inspection unit and inspection device

The present disclosure relates to an inspection unit and an inspection device including the inspection unit.

In an electronic component module such as a camera or a liquid crystal panel, a continuity check and an operation characteristic check are usually performed in a manufacturing step thereof. These inspections use a probe to connect a flexible printed circuit (Flexible Printed Circuit (FPC)) contact electrode or a mounted board-to-board connector to the main board provided in the electronic component module. The electrode unit is connected to the inspection device.

As a jig for performing such an inspection, there is, for example, a socket for electronic parts described in Patent Document 1. The socket for an electronic component includes an electrode portion having a pair of contacts that can be respectively contacted with an electrode terminal of the electronic component and an electrode terminal of the connected electronic component, and a socket body that houses the electrode inside. In the socket for electronic parts, the electrode portion is configured to expand and contract along an arrangement direction connecting a pair of contacts, whereby each contact moves back and forth along the arrangement direction, and in the arrangement direction It is in contact with the electrode terminal of the electronic component and the electrode terminal of the connected electronic component.
[Prior Art Literature]
[Patent Literature]

Patent Document 1: Japanese Patent Laid-Open No. 2002-134202

[Problems to be Solved by the Invention]

In recent years, with the diversification of inspection devices and inspection objects, it is difficult to cope with the so-called linear electronic component sockets in which the contacts approach the inspection object in the same direction and make contact in the approach direction. increase.

For example, the inspection of the display module may be performed in a state where an electrode portion is disposed on the display panel. If the socket for electronic parts is used in such inspection, one side contacts the electrode portion on the display panel in the approach direction, and the other side contacts the inspection device. However, if the display panel includes an electromechanical excitation, A material with weak intensity like Electroluminescence (EL), when the probe contacts in the approach direction, an excessive force acts on the display, and the display panel may be broken.

An object of the present disclosure is to provide an inspection unit capable of contacting a contact portion of a contact in a direction different from an approaching direction with respect to an inspection target, and an inspection device including the inspection unit.
[Means for solving problems]

An inspection unit according to an example of the present disclosure includes a first inspection jig and a second inspection jig arranged along a first direction, and the first inspection jig and the second inspection jig each have:
The contact is provided with a first contact portion that can contact the inspection object and a second contact portion that can contact the inspection device at both ends, and a case in which the first contact portion is exposed to the outside. The contact is stored inside;
At least one of the first inspection jig and the second inspection jig is arranged so as to be movable along the first direction, and the inspection object is relatively close to each place from the second direction. In a state of the first contact portion, at least one of the first inspection jig and the second inspection jig is moved in the first direction, whereby each of the first contact portions is The first direction contacts the inspection object, and the second direction intersects the first direction.

The inspection device according to an example of the present disclosure includes at least one of the inspection units.
[Effect of the invention]

According to the inspection unit, at least one of the first inspection jig and the second inspection jig is disposed so as to be movable along the first direction, so that the inspection object approaches each of the first contact portions from the second direction. In the state, any one of the first inspection jig and the second inspection jig is moved in the first direction, whereby each first contact portion contacts the inspection object in the first direction. Thereby, it is possible to realize an inspection unit that can make the first contact portion of the contact in a first direction different from the second direction (ie, the approach direction) with respect to the inspection object.

In addition, according to the inspection device, the inspection unit can realize an inspection device capable of responding to a variety of inspection devices and inspection objects.

An example of the present disclosure will be described below with reference to the accompanying drawings. In addition, in the following description, terms (such as "up", "down", "right", and "left") are used to indicate specific directions or positions as necessary, but these terms are used for the purpose of To facilitate understanding of the present disclosure with reference to the drawings, the technical scope of the present disclosure is not limited by the meaning of these terms. In addition, the following description is merely exemplary in nature, and is not intended to limit the present disclosure, its application, or its use. Furthermore, the drawings are schematic, and the ratios and the like of the dimensions do not necessarily agree with those of a real person.

As shown in FIG. 1, an inspection unit 1 according to an embodiment of the present disclosure includes a first inspection jig 2 and a second inspection jig 3. As shown in FIG. 2, the first inspection jig 2 and the second inspection jig 3 The gaps 4 are arranged in a line along the first direction X.

As shown in FIG. 2, the first inspection jig 2 and the second inspection jig 3 each have a conductive contact 10 and an insulating case 20 in which the contact 10 is housed. In this inspection unit 1, as an example, as shown in FIG. 1, each of the first inspection jig 2 and the second inspection jig 3 has a plurality of rods extending in a second direction Y orthogonal to the first direction X.状 的 件 件 10。 Contacts 10. The contact pieces 10 of each inspection jig 2 and inspection jig 3 are arranged in a line at regular intervals along a third direction Z orthogonal to the first direction X and the second direction Y.

As shown in FIG. 2, each contact 10 includes a first contact portion 11 and a second contact portion 12 provided at both ends in the extending direction. The first contact portion 11 is configured to be in contact with an inspection object (for example, the electrode portion 111 of the substrate-to-substrate connector 110 disposed on the display panel), and the second contact portion 12 is provided to be accessible to the inspection device. The structure of the terminals 101 on the surface of the substrate 100 is configured.

Furthermore, in this embodiment, the substrate 100 and the substrate-to-substrate connector 110 of the inspection device are arranged so that the terminal 101 of the substrate 100 and the electrode portion 111 of the substrate-to-substrate connector 110 face each other in the Y direction. In addition, although not shown, the display panel is disposed on the opposite side of the substrate-to-substrate connector 110 in the second direction Y of the substrate 100 of the inspection apparatus. That is, the board-to-board connector 110 is located between the display panel and the board 100 of the inspection apparatus.

As shown in FIG. 2, each case 20 has a plurality of accommodating portions 21 in which the contacts 10 can be accommodated. An opening portion 22 and an opening portion 23 are provided at both end portions of the storage portion 21 in the second direction Y, respectively. Each contact 10 protrudes from the opening portion 22 and the opening portion 23 to the outside of the housing 20 at both ends thereof, and the contact portions 11 and 12 are exposed to the outside of the housing 20 in a state where they are exposed to the outside of the housing 20. Department 21. That is, in the inspection unit 1, in addition to the first contact portion 11, the second contact portion 12 is also exposed to the outside of the housing 20.

In addition, as shown in FIG. 2, the inspection unit 1 includes a gap 4 disposed between the first inspection jig 2 and the second inspection jig 3, and a case 20 and a second inspection with the first inspection jig 2. The movable portion 30 is connected to the case 20 of the jig 3. The movable portion 30 has an elastic member (for example, a coil spring) that expands and contracts in the first direction X, so that the first inspection jig 2 and the second inspection jig 3 can move forward and backward independently in the first direction X, respectively. Way of posing.

Furthermore, in this embodiment, along with the movement of each inspection jig 2 and inspection jig 3, the substrate 100 having the terminal 101 is also moved forward and backward independently in the first direction X, and the terminal 101 is each inspection The second contact portion 12 of the contact 10 of the jig 2 and the inspection jig 3 is in contact.

Further, as shown in FIG. 2, the inspection unit 1 includes a first movement restriction portion 41 and a second movement restriction portion 42 arranged in a line with the first inspection jig 2 and the second inspection jig 3 in the first direction X. As an example, each of the first movement restriction portion 41 and the second movement restriction portion 42 includes an insulating rigid body.

In the first direction X, the first movement restricting portion 41 is spaced apart from the gap 5 and is disposed on the opposite side of the second inspection fixture 3 relative to the first inspection fixture 2, and the second movement restricting portion 42 is opened from the gap 6 and It is arranged on the opposite side of the first inspection jig 2 from the second inspection jig 3. That is, the first inspection jig 2 is disposed between the first movement restriction portion 41 and the second inspection jig 3, and the second inspection jig is disposed between the second movement restriction portion 42 and the first inspection jig 2. 3.

As shown in FIG. 2, the first movement restricting portion 41 restricts movement of the first inspection jig 2 in the first direction X and away from the second inspection jig 3 (ie, leftward in FIG. 2). In addition, the second movement restricting portion 42 restricts movement of the second inspection jig 3 in the first direction X and away from the first inspection jig 2 (ie, rightward in FIG. 2).

Furthermore, in the inspection unit 1, as an example, the first movement restriction portion 41 and the second movement restriction portion 42 are fixed to the substrate 100 of the inspection apparatus.

Next, an operation when each first contact portion 11 of the inspection unit 1 is connected to an inspection object (for example, the electrode portion 111 of the board-to-board connector 110) will be described with reference to FIGS. 3 to 6. Furthermore, the board-to-board connector 110 has two recessed portions 112 opened in the second direction Y, and electrode portions 111 are provided on the outer surfaces of the recessed portions 112 in the first direction X, respectively.

First, as shown in FIG. 3, an external force in a direction of a first direction X and a direction in which the two approach each other is applied to the first inspection jig 2 and the second inspection jig 3, and each inspection jig 2 and inspection jig 3 are applied. The first contact portion 11 of the contact 10 of each inspection jig 2, inspection jig 3 and the two recesses 112 of the board-to-board connector 110 are opposed to each other by moving in the direction of arrow A against the elastic force of the movable portion 30. .

Then, as shown in FIG. 4, the substrate-to-board connector 110 is moved in the second direction Y and in a direction close to the inspection unit 1 (ie, the direction of the arrow B in FIG. 4). As shown in FIG. 5, each inspection is performed. The first contact portion 11 of the contact 10 of the jig 2 and the inspection jig 3 is located inside the recess 112 of the substrate-to-substrate connector 110 and does not contact the insertion position of the bottom surface 113 of the recess 112.

At this time, the substrate-to-board connector 110 can be moved so that the first contact portion 11 contacts one of the pair of side surfaces of the recessed portion 112 facing in the first direction X while moving to the insertion position in the recessed portion 112. By relatively approaching the inspection unit 1, the substrate can be aligned so that the first contact portion 11 does not contact one of a pair of side surfaces of the recessed portion 112 facing in the first direction X to the insertion position in the recessed portion 112. The substrate connector 110 is relatively close to the inspection unit 1.

When the first contact portion 11 of the contact 10 of each inspection jig 2 and inspection jig 3 moves to the insertion position, the external force applied to each inspection jig 2 and inspection jig 3 is released, and the movable part The restoring force of the elastic member of 30 moves each inspection jig 2 and inspection jig 3 in the first direction X and in a direction separated from each other (that is, the direction of arrow C in FIG. 5). Thereby, as shown in FIG. 6, the inspection unit is moved until the first contact portion 11 of the contact 10 of each inspection jig 2 and inspection jig 3 reaches the contact position between the contact substrate and the electrode portion 111 of the substrate connector 110. 1 is electrically connected to the board-to-board connector 110.

In the inspection unit 1, the first inspection jig 2 and the second inspection jig 3 are arranged in such a manner that they can move along the first direction X, respectively, so that the board-to-board connector 110 approaches from the second direction Y. In the state of each of the first contact portions 11, the first inspection jig 2 and the second inspection jig 3 are moved along the first direction X, whereby each first contact portion 11 contacts the substrate in the first direction X On the substrate connector 110. Thereby, the first contact portion 11 of the contact 10 can be brought into contact with the first direction X which is different from the second direction Y (ie, the approaching direction) with respect to the board-to-board connector 110, and thus excessively approaches the approaching direction. It is possible to realize the inspection unit 1 capable of preventing the display panel from being damaged, without exerting a force on the display panel via the substrate-to-board connector 110.

The inspection unit 1 further includes a movable portion 30 that moves the first inspection jig 2 and the second inspection jig 3 in the first direction X. With this movable portion 30, the first inspection jig 2 and the second inspection jig 3 can be easily moved in the first direction X.

In addition, the movable portion 30 is connected to the case 20 of the first inspection jig 2 and the case 20 of the second inspection jig 3 and has an elastic member that expands and contracts in the first direction X. Thereby, in the first direction X, the first contact portion 11 of the contact 10 of each inspection jig 2 and inspection jig 3 can be pressed against the electrode portion 111 of the substrate-to-substrate connector 110, which can improve The contact reliability between the first contact portion 11 and the board-to-board connector 110 is reliable.

In addition, the inspection unit 1 further includes, in a first direction X, a first movement restricting portion 41 arranged in alignment with the first inspection fixture 2 and the second inspection fixture 3, and the first movement restricting portion 41 and the second movement restricting portion 41 The first inspection jig 2 is arranged between the inspection jigs 3, and the first inspection jig 2 is restricted by the first movement restricting portion 41 in the first direction X and moves away from the second inspection jig 3. For example, when the first inspection jig 2 moves in the first direction X and moves away from the second inspection jig 3, the contact 10 of the first inspection jig 2 can be prevented by the first movement restriction portion 41 Excessive force is applied to the first contact portion 11 of the first contact portion 11 and the contact 10 of the first inspection jig 2 is damaged.

In addition, the inspection unit 1 further includes, in a first direction X, a second movement restriction portion 42 which is arranged in alignment with the first movement restriction portion 41, the first inspection jig 2 and the second inspection jig 3. A second inspection jig 3 is arranged between the movement restriction part 42 and the first inspection jig 2, and the second inspection jig 3 is restricted by the second movement restriction part 42 in the first direction X and away from the first inspection jig With 2 directions of movement. For example, when the second inspection jig 3 is moved in the first direction X and away from the first inspection jig 2, the contact 10 of the second inspection jig 3 may be prevented by the second movement restriction portion 42. Excessive force is applied to the first contact portion 11 of the first contact portion 11 and the contact 10 of the second inspection jig 3 is damaged.

In addition, each of the gaps 5 and 6 between each of the movement restricting portions 41 and 42 and the housing 20 of each inspection jig 2 and inspection jig 3 is configured as follows: The contact pressure between the contact portion 11 and the electrode portion 111 of the substrate-to-board connector 110 can prevent the first contact portion 11 of the contact 10 of the first inspection jig 2 from being applied with an excessive force to cause the first The contact 10 of the inspection jig 2 is broken. For example, the dimensions of the first direction X of each of the gaps 5 and 6 can be configured within a range in which the first contact portion 11 contacts a side surface of the recessed portion 112 of the substrate-to-board connector 110. The range in which the shortest distance between the first contact point 11 in the first direction X and the side surface of the recessed portion 112 in the inserted state is not more than the size of the first direction X of the recessed portion 112 of the board-to-board connector 110.

In addition, according to the inspection device, the inspection unit 1 can realize an inspection device capable of responding to a variety of inspection devices and inspection objects.

In addition, at least one of the first inspection jig 2 and the second inspection jig 3 may be arranged so as to be movable along the first direction X. For example, as shown in FIG. 7, the first inspection jig 2 may be fixed to the substrate 100 of the inspection device, and a movable portion 30 may be provided between the second inspection jig 3 and the second movement restriction portion 41. In this case, the movable unit 30 moves at least any one of the first inspection jig 2 and the second inspection jig 3 (the second inspection jig 3 in FIG. 7) along the first direction X. Make up. Furthermore, in the inspection unit 1 shown in FIG. 7, the first movement restriction portion 41 is omitted.

As long as each contact 10 of the first inspection jig 2 and the second inspection jig 3 is provided with a first contact portion 11 capable of contacting an inspection object and a second contact portion 12 of an accessible inspection device at both end portions, respectively, That is, the contact 10 having an arbitrary structure may be used in accordance with the design and the like of the inspection unit 1. For example, as shown in FIGS. 8 and 9, it is also possible to use a contact 10 having a meandering shape having a straight belt portion 13 extending in the first direction X and a curved belt portion 14 connected to the straight belt portion 13 alternately and continuously. . In addition, for example, the first contact portion 11 and the second contact portion 12 may correspond to various forms of an inspection device or an inspection object, and may be appropriately changed in shape and position.

The movable portion 30, the first movement restriction portion 41, and the second movement restriction portion 42 may be omitted. For example, when the movable portion 30 is omitted, the user may manually move the first inspection jig 2 and the second inspection jig 3 separately, thereby causing each first contact portion 11 to contact the substrate pair in the first direction X. The electrode portion 111 of the substrate connector 110.

The movable portion 30 is not limited to an elastic member that expands and contracts in the first direction X, and any one that can move at least one of the first inspection jig 2 and the second inspection jig 3 in the first direction X may be used. structure. In addition, the movable portion 30 is not limited to the case where it is connected to the case 20 of the first inspection jig 2 and the case 20 of the second inspection jig 3. For example, the movable portion 30 may be connected to the first inspection jig. The substrate 100 of the inspection device of the second contact portion 12 of 2 and the substrate 100 of the inspection device of the second contact portion 12 of the second inspection jig 3 are connected.

The inspection unit 1 can correspond to various forms of the inspection device, and its structure can be appropriately changed. For example, as shown in FIGS. 10 and 11, the inspection unit 1 can also be configured so that each terminal 101 of a pair of substrates 100 and an electrode portion 111 of the substrate-to-substrate connector 110 of the inspection device can be contacted. The pair of substrates 100 are arranged so as to face each other, and the substrate-to-board connector 110 is arranged in a direction crossing (eg, orthogonal) to a direction in which the pair of substrates 100 face each other.

In the inspection unit 1 shown in FIG. 10 and FIG. 11, each inspection jig 2, inspection jig 3, an end portion on the first contact portion 11 side of the contact 10 extended along the first direction X is located on the first side. They are arranged so as to face each other in one direction X. Each of the inspection jigs 2 and 3 of the contact 10 of the inspection jig 3 is bent from a first direction X toward a second direction Y, and a first contact portion 11 is provided at a front end thereof. Each of the first contact portions 11 is disposed so as to be able to contact the electrode portion 111 of the substrate-to-board connector 110 in the second direction Y. In addition, the second contact portion 12 of the contact 10 of each inspection jig 2 and inspection jig 3 is capable of contacting the terminals 101 of the pair of substrates 100 facing each other in the first direction X in the first direction X, respectively. Configuration.

In addition, the inspection unit 1 shown in FIG. 10 and FIG. 11 includes a movable portion (a pair of substrates 100 of the inspection apparatus that can move in the first direction X together with the inspection jigs 2 and 3). (Not shown), and each first contact portion 11 is configured so that the movable portion can contact the electrode portion 111 of the substrate-to-board connector 110 in the first direction X.

Furthermore, each of the inspection jigs 2 and 3 of the inspection unit 1 shown in FIGS. 10 and 11 includes a contact 10 having a linear band portion 13 extending in the first direction X, And the curved belt portion 14 connected to the straight belt portion 13 alternately and continuously meanders.

The various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various aspects of the present disclosure are described. In addition, in the following description, as an example, a reference numeral is added and described.

The inspection unit 1 of the first aspect of the present disclosure includes a first inspection jig 2 and a second inspection jig 3 arranged in a line along a first direction. The first inspection jig 2 and the second inspection jig 3 each have :
The contact 10 is provided at both ends with a first contact portion 11 capable of contacting an inspection object and a second contact portion 12 capable of contacting an inspection device; and a housing 20 at the first contact portion 11. Accommodating the contact 10 inside when exposed to the outside;
At least one of the first inspection jig 2 and the second inspection jig 3 is arranged so as to be movable along the first direction X, and is configured to make the inspection object approach from the second direction Y In a state of each of the first contact portions 11, at least one of the first inspection jig 2 and the second inspection jig 3 is moved along the first direction X, whereby each of the The first contact portion 11 contacts the inspection object in the first direction X, and the second direction Y intersects the first direction X.

According to the inspection unit of the first aspect, it is possible to realize an inspection unit that can contact the first contact portion 11 of the contact 10 in a first direction X that is different from the second direction Y (ie, the approach direction) with respect to the inspection object. 1.

In the inspection unit 1 of the second aspect of the present disclosure,
Furthermore, it includes a movable portion 30 that moves at least one of the first inspection jig 2 and the second inspection jig 3 in the first direction X.

According to the inspection unit 1 of the second aspect, the first inspection jig 2 and the second inspection jig 3 can be easily moved in the first direction X by the movable section 30.

In the inspection unit 1 according to the third aspect of the present disclosure,
The movable portion 30 includes an elastic member that expands and contracts in the first direction X.

According to the inspection unit 1 of the third aspect, the first contact portion 11 of the contact 10 of each of the inspection jig 2 and the inspection jig 3 can be pressed against the inspection object in the first direction X. The contact between the one contact portion 11 and the inspection object is reliable.

In the inspection unit 1 of the fourth aspect of the present disclosure,
In the first direction X, it further includes a movement restricting portion 41 arranged in alignment with the first inspection jig 2 and the second inspection jig 3, and the movement restricting portion 41 and the second The first inspection jig 2 is arranged between the inspection jigs 3, and the first inspection jig 2 is restricted by the movement restricting portion 41 in the first direction X and away from the second inspection Movement in the direction of the jig 3.

According to the inspection unit 1 of the fourth aspect, for example, when the first inspection jig 2 moves in the first direction X and moves away from the second inspection jig 3, the first inspection jig can be prevented by the movement restriction portion 41. Excessive force is applied to the first contact portion 11 and the second contact portion 12 of the contact 10 of the tool 2 and the contact 10 of the first inspection jig 2 is damaged.

In the inspection unit 1 of the fifth aspect of the present disclosure,
The movement restriction portion is a first movement restriction portion 41,
In the first direction X, it further includes a second movement restriction portion 42 arranged in alignment with the first movement restriction portion 41, the first inspection jig 2 and the second inspection jig 3.
The second inspection jig 3 is disposed between the second movement restriction unit 42 and the first inspection jig 2, and the second inspection jig 3 is restricted by the second movement restriction unit 42. Movement in the first direction X and in a direction away from the first inspection jig 2.

According to the inspection unit 1 of the fifth aspect, for example, when the second inspection jig 3 moves in the first direction X and moves away from the first inspection jig 2, the second movement restricting portion 42 can prevent the second Excessive force is applied to the first contact portion 11 and the second contact portion 12 of the contact 10 of the inspection jig 3 and the contact 10 of the second inspection jig 3 is damaged.

An inspection apparatus of a sixth aspect of the present disclosure includes at least one inspection unit 1 of the aforementioned aspect.

According to the inspection apparatus of the sixth aspect, the inspection unit 1 can realize an inspection apparatus that can respond to a variety of inspection apparatuses and inspection objects.

Furthermore, by appropriately combining any of the various embodiments or modifications described above, the respective effects can be obtained. In addition, a combination of the embodiments, a combination of the examples, or a combination of the embodiments and the examples may be performed, and a combination of features in different embodiments or examples may also be performed.

The present disclosure is fully described in association with the preferred embodiments with reference to the accompanying drawings, but various modifications or corrections will be apparent to those skilled in the art. Such variations or modifications should be understood to be included therein as long as they do not depart from the scope of the present disclosure as defined by the scope of the accompanying application.
[Industrial availability]

The inspection unit of the present disclosure can be applied to, for example, an inspection device for a liquid crystal panel.

The inspection device of the present disclosure can be used for inspection of a liquid crystal panel, for example.

1‧‧‧ Inspection Unit

2‧‧‧The first inspection fixture

3‧‧‧Second Inspection Fixture

4, 5, 6‧‧‧ clearance

10‧‧‧Contact

11‧‧‧First contact department

12‧‧‧Second Contact Section

13‧‧‧Straight belt section

14‧‧‧ curved belt

20‧‧‧shell

21‧‧‧Storage

22, 23‧‧‧ opening

30‧‧‧ Movable section

41‧‧‧First movement restriction section

42‧‧‧Second Movement Restriction Section

100‧‧‧ substrate

101‧‧‧terminal

110‧‧‧board-to-board connector

111‧‧‧electrode section

112‧‧‧ Recess

113‧‧‧ underside

X‧‧‧ first direction

Y‧‧‧ second direction

Z‧‧‧ Third direction

A, B, C‧‧‧ directions

FIG. 1 is a perspective view showing an inspection unit according to an embodiment of the present disclosure.

FIG. 2 is a cross-sectional view taken along the line II-II in FIG. 1.

FIG. 3 is a first schematic diagram for explaining an operation when the board-to-board connector is brought into contact with the inspection unit of FIG. 1.

FIG. 4 is a second schematic diagram for explaining an operation when the substrate-to-board connector is brought into contact with the inspection unit of FIG. 1.

FIG. 5 is a third schematic diagram for explaining an operation when the substrate-to-board connector is brought into contact with the inspection unit of FIG. 1.

FIG. 6 is a fourth schematic diagram for explaining an operation when the substrate-to-board connector is brought into contact with the inspection unit of FIG. 1.

FIG. 7 is a sectional view showing a first modified example of the inspection unit of FIG. 1.

FIG. 8 is a perspective view showing a second modification of the inspection unit of FIG. 1.

FIG. 9 is a cross-sectional view taken along the line IX-IX in FIG. 8.

FIG. 10 is a perspective view showing a third modified example of the inspection unit of FIG. 1.

FIG. 11 is a cross-sectional view taken along the line XI-XI in FIG. 10.

Claims (6)

An inspection unit includes a first inspection jig and a second inspection jig arranged along a first direction. The first inspection jig and the second inspection jig have: A contact, each of which is provided with a first contact portion capable of contacting the inspection object and a second contact portion capable of contacting the inspection device at both end portions; and A housing for accommodating the contacts in the state where the first contact portion is exposed to the outside; At least one of the first inspection jig and the second inspection jig is configured to be movable along the first direction, and And at least one of the first inspection jig and the second inspection jig along the state in a state where the inspection object is relatively close to each of the first contact portions from the second direction. The first direction moves so that each of the first contact portions contacts the inspection object in the first direction, and the second direction intersects the first direction. The inspection unit described in item 1 of the patent application scope further includes: The movable part moves at least one of the first inspection jig and the second inspection jig in the first direction. The inspection unit according to item 2 of the patent application scope, wherein The movable portion includes an elastic member that expands and contracts in the first direction. The inspection unit according to any one of claims 1 to 3 in the scope of patent application, further comprising: The movement restricting portion is arranged in alignment with the first inspection jig and the second inspection jig, and The first inspection jig is disposed between the movement restriction part and the second inspection jig, and the first inspection jig is restricted by the movement restriction part in the first direction and toward the first direction. Move away from the direction of the second inspection jig. The inspection unit according to item 4 of the scope of patent application, wherein The movement restriction portion is a first movement restriction portion, In the first direction, it further includes a second movement restricting portion arranged in alignment with the first movement restricting portion, the first inspection jig, and the second inspection jig, The second inspection jig is arranged between the second movement restriction part and the first inspection jig, and the second inspection jig is restricted by the second movement restriction part to the first inspection jig. Moving in a direction and away from the first inspection jig. An inspection device includes: At least one inspection unit according to any one of claims 1 to 5 of the scope of patent application.