TW201920700A - Copper foil for flexible printed circuit and copper clad laminate and flexible printed circuit and electronic device using the same - Google Patents

Copper foil for flexible printed circuit and copper clad laminate and flexible printed circuit and electronic device using the same Download PDF

Info

Publication number
TW201920700A
TW201920700A TW107123325A TW107123325A TW201920700A TW 201920700 A TW201920700 A TW 201920700A TW 107123325 A TW107123325 A TW 107123325A TW 107123325 A TW107123325 A TW 107123325A TW 201920700 A TW201920700 A TW 201920700A
Authority
TW
Taiwan
Prior art keywords
copper foil
flexible printed
printed circuit
copper
circuit board
Prior art date
Application number
TW107123325A
Other languages
Chinese (zh)
Other versions
TWI663270B (en
Inventor
坂東慎介
Original Assignee
日商Jx金屬股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商Jx金屬股份有限公司 filed Critical 日商Jx金屬股份有限公司
Publication of TW201920700A publication Critical patent/TW201920700A/en
Application granted granted Critical
Publication of TWI663270B publication Critical patent/TWI663270B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/02Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
    • H01B1/026Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B3/00Rolling materials of special alloys so far as the composition of the alloy requires or permits special rolling methods or sequences ; Rolling of aluminium, copper, zinc or other non-ferrous metals
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/02Alloys based on copper with tin as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/04Alloys based on copper with zinc as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/06Alloys based on copper with nickel or cobalt as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/08Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B3/00Rolling materials of special alloys so far as the composition of the alloy requires or permits special rolling methods or sequences ; Rolling of aluminium, copper, zinc or other non-ferrous metals
    • B21B2003/005Copper or its alloys
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils

Abstract

The present invention provides a copper foil for a flexible printed circuit board excellent in bending properties. The rolled copper foil is a copper foil for a flexible printed circuit board, which comprises: 99 mass% or more of copper; and the remaining inevitable impurities. The highest degree of aggregation is less than 5 among four degrees of aggregation of I (111)/I0 (111), I (200)/I0 (200), I (220)/I0 (220), and I (311)/I0 (311), and the conductivity is 75% or greater.

Description

可撓性印刷基板用銅箔、使用其之覆銅積層體、可撓性印刷基板及電子機器 Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device

本發明係關於一種適宜用於可撓性印刷基板等配線構件之銅箔、使用其之覆銅積層體、可撓性配線板及電子機器。 The present invention relates to a copper foil suitable for a wiring member such as a flexible printed circuit board, a copper-clad laminated body using the same, a flexible wiring board, and an electronic device.

可撓性印刷基板(可撓性配線板,以下稱為「FPC」)由於具有可撓性,故而被廣泛用於電子電路之彎折部或可動部。例如,FPC被用於HDD或DVD及CD-ROM等磁碟片相關機器之可動部、或摺疊式行動電話之彎折部等。 Flexible printed circuit boards (flexible wiring boards, hereinafter referred to as "FPCs") are widely used in bent or movable parts of electronic circuits because of their flexibility. For example, FPC is used in the movable part of HDD or DVD- and CD-ROM-related equipment, or the folding part of a folding mobile phone.

FPC係藉由對將銅箔與樹脂積層而成之覆銅積層體(Copper Clad Laminate,以下稱為CCL)進行蝕刻而形成配線,並利用被稱為覆蓋層之樹脂層對其上進行被覆而成。於積層覆蓋層之前階段,作為用以提高銅箔與覆蓋層之密接性之表面改質步驟之一個環節,進行銅箔表面之蝕刻。又,為了減少銅箔之厚度而提高彎曲性,亦有進行減薄蝕刻之情形。 FPC is formed by etching a copper clad laminate (hereinafter referred to as CCL) formed by laminating a copper foil and a resin, and coating the wiring with a resin layer called a cover layer. to make. At the stage before laminating the cover layer, as a part of the surface modification step to improve the adhesion between the copper foil and the cover layer, the surface of the copper foil is etched. In addition, in order to reduce the thickness of the copper foil and improve the bendability, thinning etching may be performed.

然而,隨著電子機器之小型、薄型、高性能化,要求將FPC以高密度構裝於該等機器之內部,但為了進行高密度構裝,必須將FPC彎折地收容於經小型化之機器之內部,即,需要較高之彎折性。 However, with the miniaturization, thinness, and high performance of electronic devices, it is required to construct FPCs inside these devices at a high density. However, in order to perform high-density installations, FPCs must be folded and housed in miniaturized devices. Inside the machine, that is, higher bending properties are required.

另一方面,開發出下述銅箔:其改良了以IPC彎曲性為代表之高循環彎曲性(專利文獻1、2)。 On the other hand, the following copper foils have been developed which have improved high cycle bendability typified by IPC bendability (Patent Documents 1 and 2).

[先前技術文獻] [Prior technical literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特開2010-100887號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2010-100887

[專利文獻2]日本特開2009-111203號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2009-111203

然而,為了如上所述以高密度構裝FPC,必須提高以MIT耐折性為代表之彎折性,習知之銅箔存在彎折性之改善不夠充分之問題。 However, in order to construct FPCs with a high density as described above, it is necessary to improve the bending property represented by the MIT folding resistance. The conventional copper foil has a problem that the improvement of the bending property is insufficient.

本發明係為了解決上述課題而完成者,其目的在於提供一種彎折性優異之可撓性印刷基板用銅箔、使用其之覆銅積層體、可撓性印刷基板及電子機器。 The present invention has been made in order to solve the above-mentioned problems, and an object thereof is to provide a copper foil for a flexible printed circuit board having excellent bendability, a copper-clad laminate using the same, a flexible printed circuit board, and an electronic device.

本發明者等人進行了各種研究,結果發現,若藉由使銅箔之最終冷軋前之結晶粒徑細化,而於冷軋中使在銅箔之整個區域的差排之累積變得均等,則於再結晶時在整個區域產生應變之釋放,再結晶粒不集合於特定之方向生成,因此可望提高彎折性。 The present inventors have conducted various studies, and as a result, it has been found that by reducing the crystal grain size before the final cold rolling of the copper foil, the accumulation of the differential rows in the entire area of the copper foil becomes cold during rolling. If it is equal, strain is released in the entire area during recrystallization, and recrystallized grains are not formed in a specific direction, so it is expected to improve bendability.

即,本發明之可撓性印刷基板用銅箔係由99.0質量%以上之Cu及剩餘部分之不可避免之雜質所構成之軋壓銅箔,且銅箔表面之I(111)/I0(111)、I(200)/I0(200)、I(220)/I0(220)、及I(311)/I0(311)之4個集合度中達成最高值之最大集合度為5以下,該可撓性印刷基板用銅箔之導電率為75%以上。 That is, the copper foil for a flexible printed circuit board of the present invention is a rolled copper foil composed of 99.0% by mass or more of Cu and the remaining inevitable impurities, and the surface of the copper foil is I (111) / I 0 ( 111), I (200) / I 0 (200), I (220) / I 0 (220), and I (311) / I 0 (311) Below 5, the electrical conductivity of the copper foil for a flexible printed circuit board is 75% or more.

於本發明之可撓性印刷基板用銅箔中,使用上述可撓性印刷基板用銅箔製作長邊之長度150mm、短邊之長度12.7mm之短籤狀試片,並基於JIS P 8115測定MIT耐折次數時(其中,彎折夾具之R為0.38mm,荷重為250 g),相對於上述試片之長邊方向為軋壓平行方向時的上述MIT耐折次數,上述試片之長邊方向與軋壓平行方向呈45°時的上述MIT耐折次數之比值、及上述試片之長邊方向為軋壓直角方向時的上述MIT耐折次數之比值分別為0.7~1.3為佳。 In the copper foil for a flexible printed circuit board of the present invention, the above-mentioned copper foil for a flexible printed circuit board was used to prepare a short-sign-shaped test piece having a length of 150 mm on the long side and a length of 12.7 mm on the short side, and measured based on JIS P 8115 When the number of times of MIT bending resistance (where R of the bending jig is 0.38mm, the load is 250 g) The ratio of the number of times of MIT folding resistance when the longitudinal direction of the test piece is parallel to the rolling direction, the ratio of the number of times of MIT folding resistance when the longitudinal direction of the test piece and the parallel direction of rolling is 45 °, And the ratio of the MIT folding resistance times when the long side direction of the test piece is the right angle direction of rolling is preferably 0.7 to 1.3, respectively.

本發明之可撓性印刷基板用銅箔以由JIS-H3100(C1100)所規定之精銅或JIS-H3100(C1020)之無氧銅所構成為佳。 The copper foil for a flexible printed circuit board of the present invention is preferably composed of refined copper specified in JIS-H3100 (C1100) or oxygen-free copper specified in JIS-H3100 (C1020).

本發明之可撓性印刷基板用銅箔以如下為佳:其進一步含有合計0.5質量%以下之選自由P、Ag、Sb、Sn、Ni、Be、Zn、In、及Mg所組成之群中之至少1種或2種以上作為添加元素而成。 The copper foil for a flexible printed circuit board of the present invention is preferably as follows: it further contains 0.5% by mass or less of a total selected from the group consisting of P, Ag, Sb, Sn, Ni, Be, Zn, In, and Mg At least one kind or two or more kinds are added as an additive element.

於本發明之可撓性印刷基板用銅箔中,以300℃×30min退火(其中,升溫速度100℃/min~300℃/min)後,上述最大集合度為5以下為佳。 In the copper foil for a flexible printed circuit board of the present invention, after annealing at 300 ° C. for 30 minutes (wherein, the temperature rise rate is 100 ° C./min to 300 ° C./min), the maximum degree of aggregation is preferably 5 or less.

本發明之覆銅積層體係將上述可撓性印刷基板用銅箔與樹脂層積層而成。 The copper-clad laminated system of the present invention is formed by laminating the above-mentioned copper foil for a flexible printed circuit board and a resin.

本發明之可撓性印刷基板係於上述覆銅積層體中之上述銅箔形成電路而成。 The flexible printed circuit board of the present invention is formed by forming a circuit on the copper foil in the copper-clad laminate.

本發明之電子機器係使用上述可撓性印刷基板而成。 The electronic device of the present invention is formed using the flexible printed circuit board.

根據本發明,可獲得彎折性優異之可撓性印刷基板用銅箔。 According to the present invention, a copper foil for a flexible printed circuit board having excellent bendability can be obtained.

以下,對本發明之銅箔之實施形態進行說明。再者,於本發明 中,%若無特別說明,則表示質量%。 Hereinafter, embodiments of the copper foil of the present invention will be described. Furthermore, in the present invention In the case of%, unless otherwise specified, it means mass%.

<組成> <Composition>

本發明之銅箔係由99.0質量%以上之Cu及剩餘部分之不可避免之雜質構成。 The copper foil of the present invention is composed of 99.0% by mass or more of Cu and inevitable impurities in the remaining portion.

如上所述,若藉由使銅箔之最終冷軋前之結晶粒徑細化,而於冷軋中使在銅箔之各區域的差排之累積變得均等,則於再結晶時在任一區域均產生應變之釋放,再結晶粒不集合於特定之方向生成,因此彎折性提高。 As described above, if the grain size of the copper foil is refined before the final cold rolling, and the accumulation of the differential rows in each area of the copper foil is made equal during cold rolling, it will be at any time during recrystallization. The release of strain occurs in all regions, and the recrystallized grains are not formed in a specific direction, so the bendability is improved.

但是,於上面所敘述之Cu99.0質量%以上之純銅系組成時,難以於銅箔之再結晶時抑制再結晶粒集合於特定之方向,因此藉由在冷軋時之初期(重複退火與冷軋時之初期冷軋時)進行再結晶退火,可藉由冷軋大量地導入加工應變,可抑制再結晶粒集合於特定之方位。 However, when the pure copper-based composition of Cu 99.0 mass% or more is described above, it is difficult to suppress the recrystallization particles from being gathered in a specific direction during the recrystallization of the copper foil. At the time of cold rolling, in the early stage of cold rolling), recrystallization annealing is performed, and a large amount of processing strain can be introduced by cold rolling, so that recrystallized grains can be prevented from being gathered in a specific orientation.

又,為了抑制銅箔之再結晶後集合於特定之方位,於重複退火與軋壓之全部步驟中,宜將最終退火後進行之最終冷軋前之結晶粒徑設為5μm以上且未達10μm。 In addition, in order to prevent the copper foil from being gathered in a specific orientation after recrystallization, in all the steps of repeated annealing and rolling, the crystal grain size before the final cold rolling after the final annealing should be 5 μm or more and less than 10 μm .

具體而言,若調整最終退火之溫度及最終退火前之冷軋之加工度,則可控制上述粒徑。最終退火之溫度亦視銅箔之製造條件而變化,但並無限定,例如設為300~400℃亦可。又,最終退火前之冷軋之加工度亦無限定,例如可將加工度η設為0.91~1.61。 Specifically, if the temperature of the final annealing and the workability of the cold rolling before the final annealing are adjusted, the above-mentioned particle size can be controlled. The temperature of the final annealing also varies depending on the manufacturing conditions of the copper foil, but it is not limited. For example, it may be set to 300 to 400 ° C. The workability of cold rolling before final annealing is also not limited, and for example, the workability η can be set to 0.91 to 1.61.

加工度η係將最終退火前、即將進行冷軋之材料之厚度設為A0,將最終退火前、剛冷軋後之材料之厚度設為A1,以η=ln(A0/A1)表示。 The processing degree η refers to the thickness of the material before the final annealing and about to be cold-rolled to A0, and the thickness of the material before the final annealing and just after cold-rolling to A1, which is expressed by η = ln (A0 / A1).

於最終冷軋前之結晶粒徑為10μm以上之情形時,加工時之差排之合併交互局部地變小,應變之累積變少,因此有於再結晶後並未釋放應變而特定方向之集合度變高之傾向。於最終冷軋前之結晶粒徑小於5μm時,進行加工時差排之合併交互幾乎發生於整張銅箔,而無法形成更多之合併交互,於銅 箔之再結晶時抑制再結晶粒集合於特定之方向之效果無法再提升。因此,將最終冷軋前之結晶粒徑之下限設為5μm。 In the case where the crystal grain size before the final cold rolling is 10 μm or more, the combined interaction of the differential rows during processing is locally reduced, and the accumulation of strain is reduced, so there is a set of specific directions without releasing the strain after recrystallization The tendency to become higher. When the crystal grain size before the final cold rolling is less than 5 μm, the merge interaction of the time difference during processing almost occurs on the entire copper foil, and no more merge interaction can be formed. When the foil is recrystallized, the effect of inhibiting the recrystallized grains from gathering in a specific direction cannot be improved. Therefore, the lower limit of the crystal grain size before the final cold rolling is set to 5 μm.

又,若相對於上述組成,含有合計0.5質量%以下之選自由P、Ag、Sb、Sn、Ni、Be、Zn、In、及Mg所組成之群中之至少1種或2種以上作為添加元素,則可進一步抑制再結晶粒集合於特定之方向。 In addition, if it contains at least one kind or two or more kinds selected from the group consisting of P, Ag, Sb, Sn, Ni, Be, Zn, In, and Mg with respect to the above composition in an amount of 0.5% by mass or less in total Element, it can further inhibit the recrystallized grains from gathering in a specific direction.

上述添加元素於冷軋時會使差排之合併交互之頻率增加,因此可進一步抑制再結晶粒集合於特定之方向。又,若於冷軋時之初期僅進行一次再結晶退火,之後不進行再結晶退火,則藉由利用冷軋使差排之合併交互增加,而大量地導入加工應變,從而可於銅箔之再結晶時進一步抑制再結晶粒集合於特定之方向。 The above-mentioned added elements increase the frequency of the merged interactions of the differential rows during cold rolling, so that the recrystallized grains can be further suppressed from gathering in a specific direction. In addition, if the recrystallization annealing is performed only once in the initial stage of cold rolling, and then the recrystallization annealing is not performed, the combined interaction of differential rows is increased by cold rolling, and a large amount of processing strain is introduced, which can be used for copper foil. At the time of recrystallization, it is further suppressed that the recrystallized particles gather in a specific direction.

若使含有合計超過0.5質量%之上述添加元素,則導電率降低而有不適宜作為可撓性基板用銅箔之情形,因此將0.5質量%設為上限。上述添加元素之含量之下限並無特別限制,例如關於各元素,於工業上難以達到小於0.0005質量%,因此只要將各元素之含量下限設為0.0005質量%即可。 When the total content of the above-mentioned additional elements is more than 0.5% by mass, the electrical conductivity is lowered and the copper foil for flexible substrates is not suitable. Therefore, the upper limit is set to 0.5% by mass. The lower limit of the content of the above-mentioned added elements is not particularly limited. For example, it is difficult to achieve less than 0.0005 mass% for each element in the industry. Therefore, the lower limit of the content of each element may be set to 0.0005 mass%.

亦可將本發明之銅箔組成設為由JIS-H3100(C1100)所規定之精銅(TPC)或JIS-H3100(C1020)之無氧銅(OFC)所構成。 The copper foil composition of the present invention may be made of fine copper (TPC) specified in JIS-H3100 (C1100) or oxygen-free copper (OFC) of JIS-H3100 (C1020).

又,亦可設為下述組成,即,相對於上述TPC或OFC使其含有P而成。 Moreover, it may be set as the composition which contains P with respect to the said TPC or OFC.

<集合度> <Collection degree>

銅箔表面之I(111)/I0(111)、I(200)/I0(200)、I(220)/I0(220)、及I(311)/I0(311)之4個集合度中達成最高值之最大集合度為5以下。 I (111) / I 0 (111), I (200) / I 0 (200), I (220) / I 0 (220), and 4 of I (311) / I 0 (311) on the surface of copper foil The maximum degree of aggregation that reaches the highest value among the five degrees of aggregation is 5 or less.

{111}面、{200}面、{220}面、及{311}面係銅及銅合金之主要之繞射面,若進行熱軋、冷軋、及伴隨再結晶之退火,則4個集合度之任一特定者將為極高之值,有變成向特定之結晶方向配向之集合組織之情況。此時,藉由取該等 4個集合度之最大值(最大集合度),可表示特定之集合度變得極高之程度。 The {111} plane, {200} plane, {220} plane, and {311} plane are the main diffraction surfaces of copper and copper alloys. If hot rolling, cold rolling, and annealing accompanied by recrystallization, there are four Any particular one of the degree of aggregation will have a very high value, and it may become an aggregate organization aligned in a specific crystalline direction. At this time, by taking these The maximum value of the four aggregation degrees (maximum aggregation degree) can indicate the degree to which the specific aggregation degree becomes extremely high.

而且,藉由將最大集合度控制為5以下,4個集合度之任一個不會變得極高,可抑制再結晶粒集合於特定之方向(組織之異向性增大)。 Furthermore, by controlling the maximum degree of aggregation to 5 or less, any of the four degrees of aggregation does not become extremely high, and it is possible to suppress the recrystallization particles from being gathered in a specific direction (the increase in the anisotropy of the structure).

若最大集合度超過5,則銅箔之組織之異向性變大,於用作可撓性印刷基板時,彎曲性之異向性變大,彎折性降低。 When the maximum degree of aggregation exceeds 5, the anisotropy of the structure of the copper foil becomes large, and when used as a flexible printed circuit board, the anisotropy of the bendability becomes large, and the bendability decreases.

於原理上,不存在最大集合度未達1之情況。最大集合度較佳為1~5。 In principle, there is no case where the maximum degree of aggregation does not reach 1. The maximum degree of aggregation is preferably 1 to 5.

集合度係如以下測定。首先,針對銅箔之軋壓面{111}面、{200}面、{220}面、及{311}面測得X射線繞射強度,分別設為I(111)、I(200)、I(220)及I(311)。 The degree of aggregation is measured as follows. First, the X-ray diffraction intensity was measured for the {111} plane, {200} plane, {220} plane, and {311} plane of the rolled surface of copper foil, which were respectively set to I (111), I (200), I (220) and I (311).

又,於相同之條件下,針對純銅粉末(325mesh(JIS Z8801,純度99.5%),於氫氣流中以300℃加熱1小時後使用),測得{111}面、{200}面、{220}面、及{311}面之X射線繞射強度,分別設為I0(111)、I0(200)、I0(220)及I0(311)。 Also, under the same conditions, for pure copper powder (325mesh (JIS Z8801, purity 99.5%), heated at 300 ° C for 1 hour in a hydrogen stream and used), the {111} plane, {200} plane, {220 The X-ray diffraction intensity of the} plane and the {311} plane are set to I 0 (111), I 0 (200), I 0 (220), and I 0 (311), respectively.

繼而,以如下方式標準化。 Then, it is standardized as follows.

‧{111}面集合度:I(111)/I0(111) ‧ {111} surface aggregation: I (111) / I 0 (111)

‧{200}面集合度:I(200)/I0(200) ‧ {200} surface aggregation: I (200) / I 0 (200)

‧{220}面集合度:I(220)/I0(220) ‧ {220} surface aggregation: I (220) / I 0 (220)

‧{311}面集合度:I(311)/I0(311) ‧ {311} surface aggregation: I (311) / I 0 (311)

X射線繞射之測定條件如下所述。 The measurement conditions of X-ray diffraction are as follows.

‧入射X射線源:Co、‧加速電壓:25kV、‧管電流:20mA、‧發散狹縫:1度、‧散射狹縫:1度、 ‧受光狹縫:0.3mm、‧發散縱向限制狹縫:10mm、‧單色受光狹縫0.8mm ‧ Incident X-ray source: Co, ‧ Acceleration voltage: 25kV, ‧ Tube current: 20mA, ‧ Divergence slit: 1 degree, ‧ Diffraction slit: 1 degree, ‧Light-receiving slit: 0.3mm, ‧Divergent longitudinal limit slit: 10mm, ‧Monochromatic light-receiving slit 0.8mm

<拉伸強度(TS)、斷裂伸長率> <Tensile strength (TS), elongation at break>

拉伸強度及斷裂伸長率係藉由依據IPC-TM650之拉伸試驗,以試片寬度12.7mm、室溫(15~35℃)、拉伸速度50.8mm/min、量尺長度50mm,於與銅箔之軋壓方向平行之方向上進行拉伸試驗。 The tensile strength and elongation at break are based on the tensile test according to IPC-TM650. The test piece width is 12.7mm, room temperature (15 ~ 35 ° C), tensile speed is 50.8mm / min, and the length of the scale is 50mm. A tensile test was performed in a direction in which the rolling direction of the copper foil was parallel.

<300℃ 30分鐘之熱處理> <300 ° C for 30 minutes heat treatment>

本發明之銅箔被用於可撓性印刷基板,此時,將銅箔與樹脂積層而成之CCL由於在200~400℃進行用以使樹脂硬化之熱處理,故而有晶粒因再結晶而粗大化之可能性。 The copper foil of the present invention is used for a flexible printed circuit board. At this time, the CCL formed by laminating the copper foil and the resin is subjected to a heat treatment for hardening the resin at 200 to 400 ° C, so that grains are caused by recrystallization. The possibility of coarsening.

因此,於與樹脂積層之前後,銅箔之拉伸強度及斷裂伸長率會發生變化。因此,本案之請求項1之可撓性印刷基板用銅箔係定義成為與樹脂積層後之覆銅積層體後的,經樹脂之硬化熱處理的狀態之銅箔。即,由於已經過熱處理,故而為不進行新的熱處理之狀態之銅箔。 Therefore, before and after lamination with the resin, the tensile strength and elongation at break of the copper foil will change. Therefore, the copper foil for a flexible printed circuit board of claim 1 of the present case is defined as a copper foil which is a state of being cured and heat-treated by a resin after being laminated with a copper-clad laminate. That is, since the heat treatment has been performed, the copper foil is in a state where no new heat treatment is performed.

另一方面,本案之請求項3之可撓性印刷基板用銅箔係定義為對與樹脂積層前之銅箔進行上述熱處理時之狀態。該於300℃時30分鐘之熱處理係模擬於CCL之積層時使樹脂硬化的熱處理之溫度條件。再者,為了防止因熱處理所導致之銅箔表面之氧化,熱處理之環境以還原性或非氧化性之環境為佳,例如只要設為真空環境或者由氬氣、氮氣、氫氣、一氧化碳等或該等之混合氣體所構成之環境等即可。升溫速度只要在100~300℃/min之間即可。 On the other hand, the copper foil for flexible printed circuit board of claim 3 of the present case is defined as a state when the above-mentioned heat treatment is performed on the copper foil before being laminated with the resin. The heat treatment at 300 ° C for 30 minutes is a temperature condition that simulates the heat treatment for curing the resin when the CCL is laminated. Furthermore, in order to prevent oxidation of the surface of the copper foil caused by heat treatment, the environment of the heat treatment is preferably a reducing or non-oxidizing environment. For example, as long as it is a vacuum environment or argon, nitrogen, hydrogen, carbon monoxide, or the like The environment including the mixed gas and the like may be sufficient. The heating rate may be between 100 and 300 ° C / min.

本發明之銅箔舉例可藉由以下方式製造。首先,於將銅錠熔解、鑄造後,進行熱軋,並進行冷軋與退火,最好於冷軋時之初期進行再結晶退火,並且進行上述最終冷軋,藉此可製造箔。 Examples of the copper foil of the present invention can be produced in the following manner. First, after melting and casting a copper ingot, hot rolling, cold rolling, and annealing are performed. It is preferable to perform recrystallization annealing at the initial stage of cold rolling and perform the above-mentioned final cold rolling, thereby manufacturing a foil.

此處,若將最終冷軋前(意指重複冷軋與退火之整個製程中,於最終退火後進行之冷軋)之結晶粒徑細化至5μm以上且未達10μm,則可抑制再結晶粒集合於特定之方向,將最大集合度控制為5以下。 Here, if the crystal grain size before final cold rolling (meaning cold rolling after final annealing throughout the entire process of repeating cold rolling and annealing) is refined to 5 μm or more and less than 10 μm, recrystallization can be suppressed. The particles are aggregated in a specific direction, and the maximum degree of aggregation is controlled to be 5 or less.

<覆銅積層體及可撓性印刷基板> <Copper-clad laminate and flexible printed circuit board>

又,藉由對本發明之銅箔(1)塗佈樹脂前驅物(例如被稱為清漆之聚醯亞胺前驅物)並施加熱使其聚合,(2)使用與基底膜相同種類之熱塑性接著劑將基底膜壓合於本發明之銅箔,可獲得由銅箔與樹脂基材之兩層所構成之覆銅積層體(CCL)。又,藉由對本發明之銅箔層壓合敷有接著劑之基底膜,可獲得由銅箔、樹脂基材及其間之接著層共三層所構成之覆銅積層體(CCL)。於該等CCL製造時對銅箔進行熱處理而使其再結晶。 Furthermore, the copper foil of the present invention (1) is coated with a resin precursor (for example, a polyimide precursor called varnish) and heat is applied to polymerize it, and (2) a thermoplastic adhesive of the same kind as the base film is used. The base film is laminated to the copper foil of the present invention to obtain a copper-clad laminate (CCL) composed of two layers of a copper foil and a resin substrate. In addition, by laminating and laminating the copper foil of the present invention with an adhesive base film, a copper-clad laminate (CCL) composed of a copper foil, a resin substrate, and an adhesive layer therebetween can be obtained. During the production of these CCLs, copper foils are heat-treated to recrystallize them.

藉由對該等使用光蝕刻(photolithography)技術形成電路,視需要對電路實施鍍覆,並壓合覆蓋層膜,可獲得可撓性印刷基板(可撓性配線板)。 A flexible printed circuit board (flexible wiring board) can be obtained by forming a circuit using a photolithography technique, plating the circuit as needed, and laminating a cover film.

因此,本發明之覆銅積層體係將銅箔與樹脂層積層而成。又,本發明之可撓性印刷基板係於覆銅積層體之銅箔形成電路而成。 Therefore, the copper-clad laminated system of the present invention is formed by laminating a copper foil and a resin. The flexible printed circuit board of the present invention is formed by forming a circuit on a copper foil of a copper-clad laminate.

作為樹脂層,可列舉PET(聚對苯二甲酸乙二酯)、PI(聚醯亞胺)、LCP(液晶聚合物)、PEN(聚萘二甲酸乙二酯),但並不限定於此。又,作為樹脂層,亦可使用該等之樹脂膜。 Examples of the resin layer include, but are not limited to, PET (polyethylene terephthalate), PI (polyimide), LCP (liquid crystal polymer), and PEN (polyethylene naphthalate). . As the resin layer, such a resin film may be used.

作為樹脂層與銅箔之積層方法,亦可於銅箔之表面塗佈形成樹脂層之材料並進行加熱成膜。又,亦可使用樹脂膜作為樹脂層,於樹脂膜與銅箔之間使用以下之接著劑,亦可不使用接著劑而將樹脂膜熱壓接合於銅箔。然而,就不對樹脂膜施加多餘之熱之方面而言,以使用接著劑為佳。 As a method for laminating a resin layer and a copper foil, a material for forming a resin layer may be coated on the surface of the copper foil and heated to form a film. Further, a resin film may be used as the resin layer, and the following adhesive may be used between the resin film and the copper foil, or the resin film may be thermally bonded to the copper foil without using an adhesive. However, in terms of not applying excessive heat to the resin film, it is preferable to use an adhesive.

於使用膜作為樹脂層時,經由接著劑層將該膜積層於銅箔即可。於此情形時,以使用成分與膜相同之接著劑為佳。例如,於使用聚醯亞胺膜作為樹脂層時,較佳為接著劑層亦使用聚醯亞胺系接著劑。再者,此處所謂 聚醯亞胺接著劑係指含有醯亞胺鍵之接著劑,亦包含聚醚醯亞胺等。 When a film is used as the resin layer, the film may be laminated on a copper foil via an adhesive layer. In this case, it is preferable to use an adhesive having the same composition as the film. For example, when a polyimide film is used as the resin layer, it is preferable that a polyimide-based adhesive is also used as the adhesive layer. Moreover, what is called here The polyfluorene imine adhesive refers to an adhesive containing a fluorene imine bond, and also includes polyether fluorene.

再者,本發明並不限定於上述實施形態。又,只要發揮本發明之作用效果,則上述實施形態中之銅合金亦可含有其他成分。又,亦可為電解銅箔。 The present invention is not limited to the embodiments described above. Moreover, as long as the effect of this invention is exhibited, the copper alloy in the said embodiment may contain other components. Moreover, it may be electrolytic copper foil.

例如,亦可對銅箔之表面實施粗化處理、防銹處理、耐熱處理、或該等之組合之表面處理。 For example, the surface of the copper foil may be subjected to roughening treatment, rust prevention treatment, heat treatment, or a combination of these.

[實施例1] [Example 1]

其次,列舉實施例進一步詳細地說明本發明,但本發明並不限定於該等實施例。於電解銅中分別添加表1所示之元素而成為表1所示之組成,於氬氣(Ar)環境下進行鑄造而獲得鑄塊。鑄塊中之氧含量未達15ppm。將該鑄塊於900℃進行均質化退火後,進行熱軋,然後以加工度η=1.26進行冷軋,於300℃進行最終退火,將結晶粒徑調整為5μm以上且未達10μm。 Next, the present invention will be described in more detail with examples, but the present invention is not limited to these examples. Each of the elements shown in Table 1 was added to electrolytic copper to have the composition shown in Table 1, and casting was performed in an argon (Ar) atmosphere to obtain an ingot. The oxygen content in the ingot did not reach 15 ppm. This ingot was homogenized and annealed at 900 ° C, then hot-rolled, then cold-rolled at a workability η = 1.26, and finally annealed at 300 ° C to adjust the crystal grain size to 5 μm or more and less than 10 μm.

其後,去除表面上產生之氧化銹皮,以表1所示之加工度η進行最終冷軋而獲得目標之最終厚度之箔。於氬氣環境下對所獲得之箔實施300℃×30分鐘之熱處理,獲得銅箔樣品。熱處理後之銅箔係模擬於CCL之積層時受到熱處理之狀態。 Thereafter, the scale oxidized scale generated on the surface was removed, and final cold rolling was performed at the processing degree η shown in Table 1 to obtain a target final thickness foil. The obtained foil was heat-treated at 300 ° C for 30 minutes under an argon atmosphere to obtain a copper foil sample. The copper foil after heat treatment is simulated in the state of being subjected to heat treatment when the CCL is laminated.

<A.銅箔樣品之評價> <A. Evaluation of copper foil samples>

1.導電率 Electrical conductivity

針對上述熱處理後之各銅箔樣品,基於JIS H 0505,藉由四端子法測得25℃之導電率(%IACS)。 For each copper foil sample after the above heat treatment, a conductivity of 25 ° C. (% IACS) was measured by a four-terminal method based on JIS H 0505.

若導電率大於75%IACS,則導電性良好。 When the electrical conductivity is greater than 75% IACS, the electrical conductivity is good.

2.集合度 2. Degree of collection

針對上述熱處理後之各樣品,使用X射線繞射裝置(RINT-2500:理學電機製造),藉由上述方法測得集合度。 For each sample after the above heat treatment, an X-ray diffraction device (RINT-2500: Rigaku Denki) was used, and the degree of aggregation was measured by the above method.

3.拉伸強度及斷裂伸長率 3.Tensile strength and elongation at break

針對上述熱處理後之各銅箔樣品,藉由依據IPC-TM650之拉伸試驗,以試片寬度12.7mm、室溫(15~35℃)、拉伸速度50.8mm/min、量尺長度50mm,於與銅箔之軋壓方向平行之方向上進行拉伸試驗,藉此測得拉伸強度及斷裂伸長率。 For the copper foil samples after the above heat treatment, through the tensile test according to IPC-TM650, the test piece width is 12.7mm, room temperature (15 ~ 35 ° C), tensile speed is 50.8mm / min, and the length of the scale is 50mm. A tensile test was performed in a direction parallel to the rolling direction of the copper foil, thereby measuring the tensile strength and elongation at break.

4.銅箔之彎折性(MIT耐折性) 4. Bending of copper foil (MIT resistance)

針對上述熱處理後之各銅箔樣品,基於JIS P 8115測得MIT耐折次數(往返彎折次數)。試片設為長邊之長度150mm、短邊之長度12.7mm之短籤狀。其中,彎折夾板之R設為0.38mm,荷重設為250g。 With respect to each of the copper foil samples after the heat treatment, the number of times of MIT bending resistance (the number of round-trip bending) was measured based on JIS P 8115. The test piece is a short-tab-like shape with a length of 150 mm on the long side and a length of 12.7 mm on the short side. The R of the bending splint is set to 0.38 mm, and the load is set to 250 g.

若MIT耐折次數大於相同厚度之比較例,則銅箔之彎折性良好。 If the number of times of MIT resistance is larger than that of the comparative example having the same thickness, the bending property of the copper foil is good.

再者,表中,「軋壓方向」定義為試片之長邊方向為軋壓平行方向。「與軋壓方向呈45°」定義為試片之長邊方向與軋壓平行方向呈45°。「軋壓直角方向」定義為試片之長邊方向為軋壓直角方向(=與軋壓平行方向垂直之方向)。 In the table, "rolling direction" is defined as the longitudinal direction of the test piece is the rolling parallel direction. "45 ° with the rolling direction" is defined as that the longitudinal direction of the test piece is 45 ° parallel to the rolling direction. "Rolling right angle direction" is defined as the longitudinal direction of the test piece is the rolling right angle direction (= the direction perpendicular to the rolling parallel direction).

5.結晶粒徑 5. Crystal size

使用SEM(Scanning Electron Microscope)對上述熱處理前且最終冷軋前(最終退火後)之各樣品進行觀察,基於JIS H 0501求出平均粒徑。但是,雙晶係視為不同之結晶粒進行測定。測定區域設為與軋壓方向平行之剖面之400μm×400μm。 Using SEM (Scanning Electron Microscope), each sample was observed before the heat treatment and before the final cold rolling (after the final annealing), and the average particle diameter was determined based on JIS H 0501. However, the double crystal system was measured as a different crystal grain. The measurement area was set to 400 μm × 400 μm in a cross section parallel to the rolling direction.

將所獲得之結果示於表1、表2。 The obtained results are shown in Tables 1 and 2.

由表1、表2表明,於最大集合度為5以下之各實施例之情形,MIT彎曲性優異。 Tables 1 and 2 show that the MIT bendability is excellent in each example where the maximum degree of aggregation is 5 or less.

又,於表2中,將與軋壓方向呈45°之方向之MIT耐折次數除以軋壓方向之MIT耐折次數所獲得之值作為異向性之指標,同樣地,將軋壓法線方向之MIT耐折次數除以軋壓方向之MIT耐折次數所獲得之值作為異向性之指標。此時,於各實施例之情形,MIT耐折次數之異向性處於0.7~1.3之範圍,彎曲性之異向性亦降低。若彎曲性之異向性低,則於任一方向之MIT耐折次數均變多,具有可撓性印刷基板之配線之設計自由度變高之優點。又,即便相對於銅箔之軋壓方向未適當設計配線之方向,特定之方向上之彎曲性亦不易降低,可撓性印刷 基板之配線之可靠度提高。 In Table 2, the value obtained by dividing the number of times of MIT folding resistance in a direction of 45 ° from the direction of rolling is divided by the number of times of MIT folding resistance in the rolling direction as an index of anisotropy. Similarly, the rolling method is used. The value obtained by dividing the number of times of MIT folding resistance in the line direction by the number of times of MIT folding resistance in the rolling direction is used as an index of anisotropy. At this time, in the case of each embodiment, the anisotropy of the number of times of MIT folding resistance is in the range of 0.7 to 1.3, and the anisotropy of bendability is also reduced. If the bending anisotropy is low, the number of times of MIT folding resistance in any direction is increased, and there is an advantage that the degree of freedom in designing the wiring of the flexible printed circuit board is increased. In addition, even if the direction of the wiring is not properly designed with respect to the rolling direction of the copper foil, the bendability in a specific direction is not easily reduced, and flexible printing is possible. The reliability of the wiring of the substrate is improved.

另一方面,於使最終退火之溫度大於400℃,而最終冷軋前之結晶粒徑達到10μm以上的比較例1中,其最大集合度超過5,MIT耐折次數之異向性超過0.7~1.3,彎曲性之異向性變得較大。具體而言,比較例1之情形,於可撓性印刷基板中,因為必須避免設計沿著與軋壓方向呈45°、及軋壓直角方向之配線,故配線之設計自由度較差。 On the other hand, in Comparative Example 1 in which the final annealing temperature was greater than 400 ° C. and the crystal grain size before the final cold rolling reached 10 μm or more, the maximum degree of aggregation exceeded 5, and the anisotropy of the number of times of MIT resistance exceeded 0.7 ~ 1.3, the anisotropy of bending becomes larger. Specifically, in the case of Comparative Example 1, in a flexible printed circuit board, it is necessary to avoid designing wiring along a direction of 45 ° with respect to the rolling direction and at right angles to the rolling direction, so that the degree of freedom in wiring design is poor.

又,於P之添加量超過0.03%之比較例2之情形,因導電率未達75%,導電性較差。 Moreover, in the case of Comparative Example 2 where the amount of P added exceeds 0.03%, the conductivity is not good because the conductivity is less than 75%.

Claims (8)

一種可撓性印刷基板用銅箔,其係由99.0質量%以上之Cu及剩餘部分之不可避免之雜質所構成之軋壓銅箔,且銅箔表面之I(111)/I0(111)、I(200)/I0(200)、I(220)/I0(220)、及I(311)/I0(311)之4個集合度中成為最高值之最大集合度為5以下,該可撓性印刷基板用銅箔之導電率為75%以上。 A copper foil for a flexible printed circuit board, which is a rolled copper foil composed of 99.0% by mass or more of Cu and inevitable impurities remaining, and the surface of the copper foil is I (111) / I 0 (111) Among the four sets of I, 200, I (200) / I 0 (200), I (220) / I 0 (220), and I (311) / I 0 (311), the maximum set degree is 5 or less The electrical conductivity of the copper foil for a flexible printed circuit board is 75% or more. 如請求項1所述之可撓性印刷基板用銅箔,其中,使用上述可撓性印刷基板用銅箔製作長邊之長度150mm、短邊之長度12.7mm之短籤狀試片,並基於JIS P 8115測定MIT耐折次數時(其中,彎折夾具之R為0.38mm,荷重為250g),相對於上述試片之長邊方向為軋壓平行方向時的上述MIT耐折次數,上述試片之長邊方向與軋壓平行方向呈45°時的上述MIT耐折次數之比值、及上述試片之長邊方向為軋壓直角方向軋壓平行方向時的上述MIT耐折次數之比值分別為0.7~1.3。 The copper foil for a flexible printed circuit board as described in claim 1, wherein the short copper-shaped test piece having a length of 150 mm and a length of 12.7 mm on the short side is produced using the above-mentioned copper foil for flexible printed substrates, and is based on When JIS P 8115 measures the number of times of MIT folding resistance (where R of the bending jig is 0.38 mm and the load is 250 g), the number of times of MIT folding resistance when the longitudinal direction of the test piece is parallel to the rolling direction. The ratio of the number of times of MIT folding resistance when the longitudinal direction of the sheet is parallel to the rolling direction at 45 °, and the ratio of the number of times of MIT folding resistance when the longitudinal direction of the test piece is parallel to the rolling direction It is 0.7 ~ 1.3. 如請求項1所述之可撓性印刷基板用銅箔,其係由JIS-H3100(C1100)所規定之精銅或JIS-H3100(C1020)之無氧銅所構成。 The copper foil for a flexible printed circuit board as described in claim 1 is composed of the fine copper specified in JIS-H3100 (C1100) or the oxygen-free copper of JIS-H3100 (C1020). 如請求項1或2所述之可撓性印刷基板用銅箔,其係進一步含有合計0.5質量%以下之選自由P、Ag、Sb、Sn、Ni、Be、Zn、In、及Mg所組成之群中之至少1種或2種以上作為添加元素而成。 The copper foil for a flexible printed circuit board according to claim 1 or 2, further comprising a total of 0.5% by mass or less selected from the group consisting of P, Ag, Sb, Sn, Ni, Be, Zn, In, and Mg At least one or two or more of these groups are added as an additive element. 如請求項1至3中任一項所述之可撓性印刷基板用銅箔,其中,300℃×30min退火(其中,升溫速度100℃/min~300℃/min)後之上述最大集合度為5以下。 The copper foil for flexible printed substrates according to any one of claims 1 to 3, wherein the above-mentioned maximum degree of aggregation after 300 ° C × 30min annealing (wherein, the heating rate is 100 ° C / min to 300 ° C / min) It is 5 or less. 一種覆銅積層體,其係將請求項1至4中任一項所述之可撓性印 刷基板用銅箔與樹脂層積層而成。 A copper-clad laminate, which is a flexible printed product according to any one of claims 1 to 4. A copper foil for a brush substrate is laminated with a resin. 一種可撓性印刷基板,其係於請求項5所述之覆銅積層體中之上述銅箔形成電路而成。 A flexible printed circuit board is formed by forming a circuit from the copper foil in the copper-clad laminate according to claim 5. 一種電子機器,其使用請求項6所述之可撓性印刷基板。 An electronic device using the flexible printed circuit board according to claim 6.
TW107123325A 2017-08-03 2018-07-05 Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device TWI663270B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017150628A JP6643287B2 (en) 2017-08-03 2017-08-03 Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device
JPJP2017-150628 2017-08-03

Publications (2)

Publication Number Publication Date
TW201920700A true TW201920700A (en) 2019-06-01
TWI663270B TWI663270B (en) 2019-06-21

Family

ID=65366670

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107123325A TWI663270B (en) 2017-08-03 2018-07-05 Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device

Country Status (4)

Country Link
JP (1) JP6643287B2 (en)
KR (1) KR102056543B1 (en)
CN (1) CN109385554B (en)
TW (1) TWI663270B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI747330B (en) * 2019-07-10 2021-11-21 日商Jx金屬股份有限公司 Copper foil for flexible printed circuit boards

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3489376A1 (en) * 2017-11-24 2019-05-29 Siemens Aktiengesellschaft Alloy for gas turbine applications with high oxidation resistance
JP6856688B2 (en) * 2019-03-26 2021-04-07 Jx金属株式会社 Copper foil for flexible printed circuit boards, copper-clad laminates using it, flexible printed circuit boards, and electronic devices

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2505480B2 (en) * 1987-08-27 1996-06-12 日鉱金属株式会社 Copper alloy foil for flexible circuit boards
JP3856616B2 (en) * 2000-03-06 2006-12-13 日鉱金属株式会社 Rolled copper foil and method for producing the same
JP3824593B2 (en) * 2003-02-27 2006-09-20 日鉱金属株式会社 Rolled copper foil with high elongation
JP4668232B2 (en) 2007-04-16 2011-04-13 株式会社フジクラ Flexible printed circuit board
JP5055088B2 (en) * 2007-10-31 2012-10-24 Jx日鉱日石金属株式会社 Copper foil and flexible printed circuit board using the same
JP5057932B2 (en) * 2007-10-31 2012-10-24 Jx日鉱日石金属株式会社 Rolled copper foil and flexible printed wiring board
JP5185066B2 (en) * 2008-10-23 2013-04-17 Jx日鉱日石金属株式会社 Copper foil excellent in flexibility, manufacturing method thereof, and flexible copper-clad laminate
JP5411192B2 (en) * 2011-03-25 2014-02-12 Jx日鉱日石金属株式会社 Rolled copper foil and method for producing the same
JP5933943B2 (en) * 2011-09-01 2016-06-15 Jx金属株式会社 Rolled copper foil for flexible printed wiring boards, copper-clad laminates, flexible printed wiring boards, and electronic equipment
JP6887213B2 (en) 2014-10-10 2021-06-16 Jx金属株式会社 Manufacturing method of rolled copper foil, copper-clad laminate, flexible printed wiring board, electronic equipment and rolled copper foil

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI747330B (en) * 2019-07-10 2021-11-21 日商Jx金屬股份有限公司 Copper foil for flexible printed circuit boards

Also Published As

Publication number Publication date
KR102056543B1 (en) 2019-12-16
CN109385554A (en) 2019-02-26
TWI663270B (en) 2019-06-21
KR20190015109A (en) 2019-02-13
JP6643287B2 (en) 2020-02-12
JP2019029606A (en) 2019-02-21
CN109385554B (en) 2021-02-26

Similar Documents

Publication Publication Date Title
TWI633195B (en) Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device
KR101935128B1 (en) Copper foil for flexible printed wiring board, copper-clad laminate using the same, flexible printed wiring board and electronic device
TWI687526B (en) Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board and electronic equipment
TWI663270B (en) Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device
KR102470725B1 (en) Copper foil for flexible printed circuit, and copper clad laminate, flexible printed circuit and electronic device using copper foil
KR101525368B1 (en) Copper foil for flexible printed wiring board, copper-clad laminate, flexible printed wiring board and electronic device
JP6348621B1 (en) Copper foil for flexible printed circuit board, copper-clad laminate using the same, flexible printed circuit board, and electronic device
CN107046763B (en) Copper foil for flexible printed board and copper-clad laminate using same
JP5933943B2 (en) Rolled copper foil for flexible printed wiring boards, copper-clad laminates, flexible printed wiring boards, and electronic equipment
CN107046768B (en) Copper foil for flexible printed board, copper-clad laminate using same, flexible printed board, and electronic device
TWI731247B (en) Copper foil for flexible printed circuit boards, copper-clad laminates using the same, flexible printed circuit boards and electronic devices
KR102136096B1 (en) Copper foil for flexible printed substrate, and copper clad laminate using the same, flexible printed substrate and electronic equipment
JP2013167013A (en) Rolled copper foil for flexible printed circuit board
JP6712561B2 (en) Rolled copper foil for flexible printed circuit board, copper clad laminate using the same, flexible printed circuit board, and electronic device
KR102260207B1 (en) Copper foil for flexible printed substrate, copper-clad laminate using the same, flexible printed substrate, and electronic equipment