TW201708971A - Exposure device and method for inspecting the same - Google Patents

Exposure device and method for inspecting the same Download PDF

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TW201708971A
TW201708971A TW105107036A TW105107036A TW201708971A TW 201708971 A TW201708971 A TW 201708971A TW 105107036 A TW105107036 A TW 105107036A TW 105107036 A TW105107036 A TW 105107036A TW 201708971 A TW201708971 A TW 201708971A
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voltage
discharge lamp
lamp
incandescent lamp
light source
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TW105107036A
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Chinese (zh)
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TWI609249B (en
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谷田敏昭
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鳳凰電機股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591Testing optical components
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/24Testing of discharge tubes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/20Responsive to malfunctions or to light source life; for protection
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2002Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/2004Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • G03F7/70016Production of exposure light, i.e. light sources by discharge lamps
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605Workpiece metrology
    • G03F7/70616Monitoring the printed patterns
    • G03F7/7065Defects, e.g. optical inspection of patterned layer for defects

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)

Abstract

An exposure device 100 includes: one or a plurality of light source devices 4 each being composed of a discharge lamp 1, an incandescent lamp 2, and a reflector housing 3; a frame 5 on which the light source devices 4 are mounted; a constant-current power supply 8 which supplies a current to the incandescent lamp 2; a switch 10 which tums on and off the current supplied from the constant-current power supply 8; a controller 9 which turns on and off the switch 10 for a predetermined period; a measurement unit 11 which measures voltage between both ends of the incandescent lamp 2; a comparator 12 which compares the voltage between the both ends with a predetermined voltage range; a determination unit 13 which determines whether the discharge lamp 1 is a genuine product by using the result of the comparison; and a display unit 14.

Description

曝光裝置及其檢查方法 Exposure device and inspection method thereof

本發明,係於在印刷電路板等的曝光所使用的曝光裝置,有關具備供於針對成為光源的放電燈是否為純正品作檢測用的白熾燈的曝光裝置及其檢查方法。 The present invention relates to an exposure apparatus for use in exposure to a printed circuit board or the like, and an exposure apparatus including an incandescent lamp for detecting whether or not a discharge lamp as a light source is a pure genuine product, and an inspection method therefor.

歷來,為了將構件安裝於電子機器而採用在樹脂、玻璃環氧材等的基板上以銅等的金屬形成配線圖案的印刷電路板。往此等的印刷電路板上的配線圖案的形成係採用光蝕刻技術。此係在成為配線的金屬層被形成於整面的基板上整面,塗佈是感光性的藥劑的光阻,對此通過與配線圖案相同的光罩而照射來自曝光裝置的照射光。在光阻方面,係存在因照射光使得光阻的溶解性降低的負型光阻、及相反地因照射光使得光阻的溶解性增大的正型光阻。對因照射光使得溶解性相對增大的光阻部分作化學處理而除去,將曝露的金屬層藉蝕刻而除去時僅殘留存在於殘留了光阻的部分之下的金屬層,將光阻除去使得配線圖案形成於基板上。對正型、負型任一方的光阻以照射光作 照射的情況下,皆為了確保遍及照射面整面為均勻的曝光量,而需要均勻的照度下一定時間、穩定的照射光的照射。 In order to attach a member to an electronic device, a printed circuit board in which a wiring pattern is formed of a metal such as copper on a substrate such as a resin or a glass epoxy material is used. The formation of wiring patterns on such printed circuit boards is by photolithography. In this case, the metal layer to be wired is formed on the entire surface of the substrate, and the photoresist of the photosensitive agent is applied, and the irradiation light from the exposure device is irradiated by the same mask as the wiring pattern. In terms of photoresist, there are a negative photoresist which reduces the solubility of the photoresist due to irradiation of light, and a positive photoresist which in turn increases the solubility of the photoresist due to the irradiation of light. The photoresist portion which is relatively increased in solubility due to irradiation with light is chemically removed, and when the exposed metal layer is removed by etching, only the metal layer remaining under the portion where the photoresist remains is removed, and the photoresist is removed. The wiring pattern is formed on the substrate. The light resistance of either the positive or negative type is illuminated by light. In the case of irradiation, in order to ensure a uniform exposure amount over the entire surface of the irradiation surface, it is necessary to irradiate a stable irradiation light for a certain period of time under uniform illumination.

另一方面,於印刷電路板,為了製程的效率化而進行:將印刷電路板大型化,在基板完成後作分割而小型化,使用於期望的電子機器。隨著印刷電路板的大型化,曝光裝置製造商係打算將是光源的放電燈大型化為高照度,或以使用複數個低照度的小型的放電燈的多燈的光源而確保均勻之曝光量。例如,代替使用1個8kW的高壓放電燈的光源而使用4個2kW的高壓放電燈的光源等。低照度的放電燈係比起高照度的放電燈,於製造難易度、製造成本等方面優勢,多數販售具有多燈的光源的曝光裝置。 On the other hand, in the printed circuit board, in order to increase the efficiency of the process, the printed circuit board is increased in size, and after the substrate is completed, it is divided and reduced in size, and used in a desired electronic device. With the increase in size of printed circuit boards, exposure device manufacturers intend to increase the size of discharge lamps that are light sources to high illumination, or to ensure uniform exposure with multiple lamps that use multiple low-illuminance small discharge lamps. . For example, instead of using a light source of one 8 kW high pressure discharge lamp, four light sources of a 2 kW high pressure discharge lamp or the like are used. The low-illumination discharge lamp is superior to the high-illumination discharge lamp in terms of manufacturing difficulty, manufacturing cost, and the like, and most of the exposure devices having a multi-lamp light source are sold.

然而,隨著光源的多燈化,從均勻之曝光量的確保的必要性變成複數個放電燈彼此的均質性更重要。為此,要使曝光裝置的性能穩定,製造可靠性高的印刷電路板,係需要僅使用由相同製造商以相同材料、相同工法而製作的純正品的放電燈,需要識別放電燈是否為純正品的裝置及檢查方法。 However, as the light source is multi-lit, it becomes more important to ensure the uniformity of the exposure amount from the uniformity of the plurality of discharge lamps. Therefore, in order to stabilize the performance of the exposure apparatus and to manufacture a printed circuit board with high reliability, it is necessary to use only a purely genuine discharge lamp made of the same material and the same method by the same manufacturer, and it is necessary to identify whether the discharge lamp is pure or not. Equipment and inspection methods.

不限於曝光裝置而於光學裝置,已知一些識別所使用的放電燈、光源等的方法(例如,日本發明專利平成7-52677號公報(專利文獻1)、日本發明專利公表2010-527504號公報(專利文獻2)、及日本發明專利公開昭和62-43059號公報(專利文獻3)參照)。例如,在 記載於專利文獻1之燈異常檢測裝置,係作成對鹵素燈等使用燈絲的白熾燈泡供應既定電壓,比較燈絲半斷狀態時的電流值、及燈絲正常時的電流值而檢測出存在異常之燈。然而,藉此,係即使可檢測出燈的壽命,仍難以識別燈是否為純正品。 In the optical device, there is known a method of recognizing a discharge lamp, a light source, and the like used (for example, Japanese Patent Application Laid-Open No. Hei 7-52677 (Patent Document 1), Japanese Patent Laid-Open Publication No. 2010-527504 (Patent Document 2), and Japanese Patent Laid-Open Publication No. SHO 62-43059 (Patent Document 3). For example, in The lamp abnormality detecting device disclosed in Patent Document 1 is configured to supply a predetermined voltage to an incandescent bulb using a filament such as a halogen lamp, and to compare a current value when the filament is in a half-off state and a current value when the filament is normal, and detect an abnormal lamp. . However, by this, even if the life of the lamp can be detected, it is difficult to recognize whether the lamp is a genuine product.

此外,在例如專利文獻2中,係作成將連接有電阻及電容器的電路與白熾燈或螢光燈如此之光源並聯連接,測定對此光源的兩端供應既定電壓時的時間常數(電阻值與電容值的積)而檢測光源是白熾燈或螢光燈。然而,藉此,係即使可檢測出時間常數大的差異(白熾燈與螢光燈係時間常數非常不同),仍難以識別是否為同白熾燈間下的純正品。此外,在例如專利文獻3中,係作成在封入相同白熾燈泡的燈泡內的複數個燈絲放射紫外線,同時測定該等燈絲間的放電開始電壓,檢測出不良品。然而,藉此係即使可檢測出不良品,仍難以識別燈是否為純正品。 Further, for example, in Patent Document 2, a circuit in which a resistor and a capacitor are connected is connected in parallel with a light source such as an incandescent lamp or a fluorescent lamp, and a time constant (resistance value and time) when a predetermined voltage is supplied to both ends of the light source is measured. The product of the capacitance value) and the detection source is an incandescent lamp or a fluorescent lamp. However, by this, even if the difference in the time constant can be detected (the incandescent lamp and the fluorescent lamp system have very different time constants), it is difficult to recognize whether it is a pure genuine product under the same incandescent lamp. Further, for example, in Patent Document 3, a plurality of filaments in a bulb enclosed with the same incandescent bulb are irradiated with ultraviolet rays, and a discharge start voltage between the filaments is measured to detect a defective product. However, it is difficult to recognize whether the lamp is a genuine product even if a defective product can be detected.

要將純正品的光源與由其他製造商所製造的類似品的光源作識別係比如專利文獻1及3識別光源是否不良,或比如專利文獻2識別是否為不同種類的光源,需要精度更高的識別裝置。此外,亦需要同時解決複數個光源的檢查時間不大幅超過曝光裝置的啟動時間、及不會大 幅增加曝光裝置整體的成本如此的課題。 It is necessary to identify a purely authentic light source with a light source of a similar product manufactured by another manufacturer. For example, Patent Documents 1 and 3 recognize whether or not the light source is defective, or if, for example, Patent Document 2 identifies whether it is a different kind of light source, higher precision is required. Identification device. In addition, it is also necessary to simultaneously solve the inspection time of the plurality of light sources not significantly exceeding the startup time of the exposure device, and is not large This increases the cost of the overall exposure device.

本發明,係鑒於前述之課題而創作者,其目的係在於:於在印刷電路板等的曝光所使用的曝光裝置,提供具備供於針對成為光源的放電燈是否為純正品以高精度、短時間且低成本作識別用的白熾燈的曝光裝置及其檢查方法。 The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide an exposure apparatus for exposure to a printed circuit board or the like, which is provided with high precision and shortness for providing a discharge lamp for a light source. An exposure device for an incandescent lamp for identification and a low cost, and an inspection method thereof.

為了解決上述課題,本發明中的如申請專利範圍第1項之發明,係如例如示於圖1,將第1曝光裝置100構成為如下。亦即,第1曝光裝置100,係具備:以成為光源的放電燈1、檢測前述放電燈1是否為純正品的白熾燈2、及裝戴前述放電燈1及前述白熾燈2的反射器容器3而構成的1至複數個光源裝置;將前述光源裝置4朝向被照射物而裝戴的框5;對前述白熾燈2供應電流的定電流電源8;將來自前述定電流電源8的前述電流作導通/關斷的開關10;在前述放電燈1的點燈中將前述開關10作導通/關斷而使前述白熾燈2既定時間點燈的控制部9;測定點燈中的前述白熾燈2的兩端電壓的測定部11;比較以前述測定部11所測定的前述兩端電壓與針對放電燈1的正確與否作判定的既定的上限值及下限值的電壓範圍的比較部12;接收來自前述比較部12的信號,前述兩端電壓為前述既定的上限值及下限值的電壓範圍內的情況下,係判定檢查對象放電燈為純正品,前述兩端電壓 為前述既定的上限值及下限值的電壓範圍外的情況下,係判定檢查對象放電燈為非純正品的判定部13;以及顯示判定結果的顯示部14。 In order to solve the above problems, the invention according to the first aspect of the invention is as follows, for example, as shown in Fig. 1, and the first exposure apparatus 100 is configured as follows. In other words, the first exposure apparatus 100 includes a discharge lamp 1 that is a light source, an incandescent lamp 2 that detects whether the discharge lamp 1 is a genuine product, and a reflector container that mounts the discharge lamp 1 and the incandescent lamp 2 described above. 3 to a plurality of light source devices; a frame 5 for mounting the light source device 4 toward the object to be irradiated; a constant current power source 8 for supplying current to the incandescent lamp 2; and the current from the constant current source 8 a switch 10 for turning on/off; a control unit 9 that turns on/off the switch 10 to turn on the incandescent lamp 2 at a predetermined time in the lighting of the discharge lamp 1; and measures the incandescent lamp in the lighting The measuring unit 11 of the voltage at both ends of the two ends; a comparison unit that compares the voltage between the two-terminal voltage measured by the measuring unit 11 and the predetermined upper limit value and the lower limit value for determining whether the discharge lamp 1 is correct or not When receiving the signal from the comparison unit 12 and the voltage between the two ends is within the voltage range of the predetermined upper limit value and the lower limit value, it is determined that the discharge lamp to be inspected is a genuine product, and the voltage at both ends is When the voltage range outside the predetermined upper limit value and the lower limit value is outside, the determination unit 13 that determines that the discharge lamp to be inspected is an impure product is determined, and the display unit 14 that displays the determination result.

此外,如申請專利範圍第2項之發明,係如例如示於圖1,將第2曝光裝置101構成為如下。亦即,第2曝光裝置101,係具備:以成為光源的放電燈1、檢測前述放電燈1是否為純正品的白熾燈2、及裝戴前述放電燈1及前述白熾燈2的反射器容器3而構成的1至複數個光源裝置;將前述光源裝置4朝向被照射物而裝戴的框5;對前述白熾燈2供應電流的定電流電源8;將來自前述定電流電源8的前述電流作導通/關斷的開關10;在前述放電燈1的點燈中將前述開關10作導通/關斷而使前述白熾燈2既定時間點燈的控制部9;針對點燈中的前述白熾燈2的兩端電壓2次分別在既定時間作測定的測定部15;比較於前述測定部15該白熾燈2的第1次測定時的電壓與第2次測定時的電壓的差、及針對放電燈的正確與否作判定的既定的上限值及下限值的電壓差範圍的比較部16;接收來自前述比較部16的信號,前述第1次測定時的電壓與第2次測定時的電壓的差在前述既定的上限值及下限值的電壓差範圍內的情況下,係判定檢查對象放電燈為純正品,前述第1次測定時的電壓與第2次測定時的電壓的差在前述既定的上限值及下限值的電壓差範圍外的情況下,係判定檢查對象放電燈為非純正品的判定部17;以及顯示判定結果的顯示部14。 Further, as in the invention of claim 2, for example, as shown in Fig. 1, the second exposure apparatus 101 is configured as follows. In other words, the second exposure apparatus 101 includes a discharge lamp 1 that is a light source, an incandescent lamp 2 that detects whether the discharge lamp 1 is a genuine product, and a reflector container that mounts the discharge lamp 1 and the incandescent lamp 2 described above. 3 to a plurality of light source devices; a frame 5 for mounting the light source device 4 toward the object to be irradiated; a constant current power source 8 for supplying current to the incandescent lamp 2; and the current from the constant current source 8 a switch 10 for turning on/off; a control unit 9 for turning on/off the switch 10 to turn on the incandescent lamp 2 at a predetermined time in the lighting of the discharge lamp 1; for the incandescent lamp in the lighting The measurement unit 15 that measures the voltage at both ends of the two ends at a predetermined time; the difference between the voltage at the first measurement of the incandescent lamp 2 and the voltage at the second measurement, and the discharge The comparison unit 16 for determining the voltage difference range between the predetermined upper limit value and the lower limit value for determining whether the lamp is correct or not; receiving the signal from the comparison unit 16, the voltage during the first measurement, and the time during the second measurement The difference in voltage is at the aforementioned upper and lower limit values In the case of the voltage difference range, it is determined that the discharge lamp to be inspected is a genuine product, and the voltage between the voltage at the first measurement and the voltage at the second measurement is at the predetermined upper limit and lower limit voltage. When the difference is outside the range, the determination unit 17 that determines that the discharge lamp to be inspected is a non-pure product is determined; and the display unit 14 that displays the determination result.

此外,如申請專利範圍第3項之發明,係有關前述放電燈1的檢查方法,於裝備以成為光源的前述放電燈1、檢測前述放電燈1是否為純正品的前述白熾燈2、及裝載前述放電燈1及前述白熾燈2的前述反射器容器3而構成的複數個前述光源裝置4的如申請專利範圍第1項之曝光裝置100或如申請專利範圍第2項之曝光裝置101,前述控制部9,係在前述放電燈1的點燈中將前述白熾燈2依次導通/關斷而依次檢查前述放電燈1的正確與否。 Further, the invention of the third aspect of the invention is related to the inspection method of the discharge lamp 1 described above, the apparatus 1 for arranging the discharge lamp 1 as a light source, the incandescent lamp 2 for detecting whether the discharge lamp 1 is a genuine product, and the loading. The plurality of the light source devices 4 of the discharge lamp 1 and the reflector container 3 of the incandescent lamp 2, the exposure device 100 of the first aspect of the patent application, or the exposure device 101 of the second application of the patent scope, the aforementioned The control unit 9 sequentially turns on/off the incandescent lamp 2 in the lighting of the discharge lamp 1, and sequentially checks whether the discharge lamp 1 is correct or not.

依記載於申請專利範圍第1項之發明時,於收納於相同的反射器容器的放電燈與白熾燈,放電燈係作為光源,白熾燈係利用為產生供於識別放電燈是否為純正用的固有的電壓的電阻裝置。將白熾燈裝入反射器容器前,對白熾燈單體供應定電流,測定既定時間經過後的白熾燈的兩端的電壓。同條件下測定複數個白熾燈的兩端的電壓,確定電壓分布範圍。之後,於收納於相同的反射器容器的放電燈與白熾燈,比較與上述同條件下所測定的白熾燈的兩端的電壓與上述的電壓分布範圍,所測定的電壓在該電壓分布範圍內時,可識別為所測定的白熾燈與相同的反射器容器內的放電燈係純正品。於上述的曝光裝置,係針對全部的放電燈依次進行上述的比較判定,能以短時間、低成本且高精度識別放電燈是否為純正品。此外,在 上述的發明,係測定白熾燈的兩端的電壓1次即可識別是否為純正品。 According to the invention of the first application of the patent application, in the discharge lamp and the incandescent lamp housed in the same reflector container, the discharge lamp is used as the light source, and the incandescent lamp is used to generate whether the identification discharge lamp is pure or not. Intrinsic voltage resistance device. Before the incandescent lamp is placed in the reflector vessel, a constant current is supplied to the incandescent lamp unit, and the voltage across the incandescent lamp after a predetermined period of time is measured. The voltage across the plurality of incandescent lamps is measured under the same conditions to determine the voltage distribution range. Thereafter, the discharge lamp and the incandescent lamp housed in the same reflector container are compared with the voltages at both ends of the incandescent lamp measured under the same conditions and the voltage distribution range described above, and the measured voltage is within the voltage distribution range. It can be recognized that the measured incandescent lamp and the discharge lamp in the same reflector container are purely genuine. In the above-described exposure apparatus, the above-described comparison determination is sequentially performed for all the discharge lamps, and it is possible to recognize whether or not the discharge lamp is a pure genuine product in a short time, at low cost, and with high precision. In addition, in In the above invention, it is possible to identify whether it is a pure genuine product by measuring the voltage of both ends of the incandescent lamp once.

在本發明的曝光裝置所使用者係一般的白熾燈,其燈絲的材質係鎢等且燈絲的電阻值依燈絲所發的熱而展現固有的溫度變動。為此,在緊接著對白熾燈供應定電流後,燈絲的溫度尚低時該電阻值係非常小(數歐姆程度),測定此時的白熾燈的兩端的電壓,接著在燈絲的溫度充分上升時(攝氏600度以上),係該電阻值係增加為數倍,測定此時的電壓,而測定兩者的電壓的差時即成為燈絲固有的電壓差。 In the case of a general incandescent lamp used in the exposure apparatus of the present invention, the material of the filament is tungsten or the like, and the resistance value of the filament exhibits an inherent temperature variation depending on the heat generated by the filament. For this reason, immediately after the constant current is supplied to the incandescent lamp, the resistance value is very small (a few ohms) when the temperature of the filament is still low, and the voltage across the incandescent lamp at this time is measured, and then the temperature of the filament is sufficiently raised. At the time (600 degrees Celsius or more), the resistance value is increased by several times, and the voltage at this time is measured, and when the difference between the voltages of the two is measured, the voltage difference inherent to the filament is obtained.

依記載於申請專利範圍第2項之發明時,利用上述的燈絲固有的溫度所致的電壓差,使得可進一步以高精度識別純正品。將白熾燈裝入反射器容器前,對白熾燈單體供應定電流,首先測定在緊接著往白熾燈的定電流供應開始後燈絲的溫度低時的白熾燈的兩端的電壓,接著在既定時間經過後測定燈絲的溫度充分上升時的兩端的電壓,而測定兩者的電壓差。同條件下測定複數個白熾燈的兩端的電壓,確定電壓差分布範圍。之後,於收納於相同的反射器容器的放電燈與白熾燈,比較與上述同條件下所測定的白熾燈的電壓差與上述的電壓差分布範圍,所測定的電壓差在該電壓差分布範圍內時,可識別為白熾燈與相同的反射器容器內的放電燈係純正品。於上述的曝光裝置,係針對全部的放電燈依次進行上述的比較判定,能以短時間、低成本且更高精度識別放電燈是否為純正品。 According to the invention described in the second paragraph of the patent application, the voltage difference due to the temperature inherent to the filament is utilized, so that the pure product can be further recognized with high precision. Before charging the incandescent lamp into the reflector vessel, a constant current is supplied to the incandescent lamp unit, first determining the voltage across the incandescent lamp immediately after the temperature of the filament is low after the start of the constant current supply to the incandescent lamp, and then at a predetermined time After the lapse, the voltage at both ends when the temperature of the filament was sufficiently increased was measured, and the voltage difference between the two was measured. The voltage across the plurality of incandescent lamps is measured under the same conditions to determine the voltage difference distribution range. Thereafter, the discharge lamp and the incandescent lamp housed in the same reflector container are compared with the voltage difference between the incandescent lamp measured under the same conditions and the voltage difference distribution range described above, and the measured voltage difference is in the voltage difference distribution range. In the meantime, it can be recognized that the incandescent lamp and the discharge lamp in the same reflector container are purely genuine. In the above-described exposure apparatus, the above-described comparison determination is sequentially performed for all the discharge lamps, and it is possible to recognize whether or not the discharge lamp is a pure genuine product in a short time, at low cost, and with higher precision.

在上述的發明,係測定白熾燈的兩端的電壓2次,比較第1次與第2次的溫度所致的電壓差作比較,故代替白熾燈,針對具備連接著具有與白熾燈的燈絲同樣的電阻值的固定電阻等的非純正品的放電燈的光學裝置作比較判定的情況下,固定電阻等的溫度所致的電壓差與白熾燈仍大為不同,故可識別該光學裝置的放電燈非純正品。 In the above invention, the voltage across the incandescent lamp is measured twice, and the voltage difference between the first and second temperatures is compared. Therefore, instead of the incandescent lamp, the filament having the same connection as the incandescent lamp is connected. When the optical device of the non-pure genuine discharge lamp such as a fixed resistance of the resistance value is compared and judged, the voltage difference due to the temperature of the fixed resistor or the like is still largely different from that of the incandescent lamp, so that the discharge of the optical device can be recognized. The lamp is not purely genuine.

1‧‧‧放電燈 1‧‧‧discharge lamp

1a‧‧‧內部空間 1a‧‧‧Internal space

1b‧‧‧發光部 1b‧‧‧Lighting Department

1c‧‧‧密封部 1c‧‧‧ Sealing Department

1d‧‧‧發光管 1d‧‧‧Light tube

1e‧‧‧電極 1e‧‧‧electrode

1f‧‧‧供電線 1f‧‧‧Power supply line

2‧‧‧白熾燈 2‧‧‧ incandescent lamps

2a‧‧‧燈絲 2a‧‧‧filament

2b‧‧‧供電線 2b‧‧‧Power supply line

3‧‧‧反射器容器 3‧‧‧ reflector container

3a‧‧‧反射面 3a‧‧‧reflecting surface

3b‧‧‧基底部 3b‧‧‧ base

3c‧‧‧蓋部 3c‧‧‧ Cover

3d‧‧‧插入孔 3d‧‧‧ insertion hole

3e‧‧‧接著劑 3e‧‧‧Binder

3f‧‧‧插入孔 3f‧‧‧ insertion hole

3g‧‧‧收容空間 3g‧‧‧ accommodating space

4‧‧‧光源裝置 4‧‧‧Light source device

5‧‧‧框 5‧‧‧ box

6‧‧‧光源部 6‧‧‧Light source department

7‧‧‧點燈電路 7‧‧‧Lighting circuit

8‧‧‧定電流電源 8‧‧‧Constant current source

9‧‧‧控制部 9‧‧‧Control Department

10‧‧‧開關 10‧‧‧ switch

11‧‧‧測定部 11‧‧‧Determination Department

11a‧‧‧電阻 11a‧‧‧resistance

12‧‧‧比較部 12‧‧‧Comparative Department

13‧‧‧判定部 13‧‧‧Decision Department

14‧‧‧顯示部 14‧‧‧Display Department

15‧‧‧測定部 15‧‧‧Determination Department

15a‧‧‧電阻 15a‧‧‧resistance

16‧‧‧比較部 16‧‧‧Comparative Department

17‧‧‧判定部 17‧‧‧Decision Department

30‧‧‧電阻 30‧‧‧resistance

100‧‧‧曝光裝置 100‧‧‧Exposure device

101‧‧‧曝光裝置 101‧‧‧Exposure device

[圖1]針對本發明的一實施例的曝光裝置作繪示的示意圖。 Fig. 1 is a schematic view showing an exposure apparatus according to an embodiment of the present invention.

[圖2]針對本發明的一實施例的光源部作繪示的平面圖。 Fig. 2 is a plan view showing a light source unit according to an embodiment of the present invention.

[圖3]針對本發明的一實施例的光源裝置作繪示的剖面圖。 Fig. 3 is a cross-sectional view showing a light source device according to an embodiment of the present invention.

[圖4]針對本發明的實施例1的開關的導通/關斷與白熾燈的兩端電壓測定的時機作繪示的時序圖。 Fig. 4 is a timing chart showing the timing of turning on/off the switch of the embodiment 1 of the present invention and measuring the voltage across the incandescent lamp.

[圖5]針對本發明的實施例2的開關的導通/關斷與白熾燈的兩端電壓測定的時機作繪示的時序圖。 Fig. 5 is a timing chart showing the timing of turning on/off the switch of the embodiment 2 of the present invention and measuring the voltage across the incandescent lamp.

以下,針對本發明依圖1至5作說明。另外,於各符號,以上位概念表示各部位的情況下係不加上字母的分枝編號而僅以阿拉伯數字表示,需要區別各部位 的情況(亦即以下位概念表示的情況)下係將小寫字母的分枝編號附加於阿拉伯數字作區別。此外,於圖式的說明,對於相同要素係附加相同符號,省略重複之說明。 Hereinafter, the present invention will be described with reference to Figs. In addition, in each symbol, the above concept indicates that each part is not added with the branch number of the letter but only by the Arabic numeral, and it is necessary to distinguish each part. In the case of the case (that is, the case indicated by the following concept), the branch number of the lowercase letter is attached to the Arabic numeral for distinction. In the description of the drawings, the same reference numerals are attached to the same elements, and the description thereof will not be repeated.

圖3,係針對本發明相關之一實施例的光源裝置4作繪示的剖面圖。放電燈1,係具有:具有封入水銀等的發光物質的內部空間1a的發光部1b及具有將發光部1b的內部空間1a密封的一對的密封部1c的發光管1d、在發光部1b內彼此對向而配置的一對的電極1e、及使用於供電的一對的供電線1f。白熾燈2係一般的白熾燈,在燈絲2a方面係使用將鎢等加工為線圈狀者。鎢的電阻值係常溫下非常小,惟燈絲的發熱(攝氏600度以上),使得電阻值會變大為數倍。在反射器容器3的材質方面,係考慮玻璃或鋁等,在內側係形成具有旋轉拋物面的反射面3a。反射器容器3,係在碗狀底部的外側予以蓋上基底部3b,其接合部係以接著劑3e固著。另外基底部3b的底部係以蓋部3c覆蓋,其接合部係以金屬接口構造作固定。基底部3b及蓋部3c,係在內部具有收容白熾燈2的收容空間3g的構材,已絕緣性及熱導性高的材料而形成為適合。 Fig. 3 is a cross-sectional view showing a light source device 4 according to an embodiment of the present invention. The discharge lamp 1 includes a light-emitting portion 1b having an internal space 1a in which a light-emitting substance such as mercury is sealed, and an arc tube 1d having a pair of seal portions 1c that seal the internal space 1a of the light-emitting portion 1b, and the light-emitting portion 1b. A pair of electrodes 1e arranged to face each other and a pair of power supply lines 1f for supplying power. The incandescent lamp 2 is a general incandescent lamp, and in the case of the filament 2a, a tungsten or the like is processed into a coil shape. The resistance value of tungsten is very small at normal temperature, but the heating of the filament (above 600 degrees Celsius) makes the resistance value become several times larger. In the material of the reflector container 3, glass, aluminum, or the like is considered, and a reflecting surface 3a having a paraboloid of revolution is formed inside. The reflector container 3 is covered with a base portion 3b on the outer side of the bowl-shaped bottom portion, and the joint portion is fixed by the adhesive 3e. Further, the bottom portion of the base portion 3b is covered with a lid portion 3c, and the joint portion is fixed by a metal interface structure. The base portion 3b and the lid portion 3c are formed of a material having a housing space 3g for accommodating the incandescent lamp 2, and are formed of a material having high insulation and thermal conductivity.

放電燈1的密封部1c的一方插入形成於反射器容器3的碗狀底部的插入孔3f,與插入孔3f係以接著劑等作固著。此外,密封部1c的一方,係配置為貫通基底部3b的插入孔3d而到達於蓋部3c的內部空間。白熾燈2,係配置於由基底部3b與蓋部3c而形成的收容空間 3g。在光源裝置4,係連接著放電燈1的一對的供電線1f與白熾燈2的一對的供電線2b的合計4個供電線。 One of the sealing portions 1c of the discharge lamp 1 is inserted into the insertion hole 3f formed in the bowl-shaped bottom portion of the reflector container 3, and is fixed to the insertion hole 3f by an adhesive or the like. Further, one of the sealing portions 1c is disposed so as to penetrate the insertion hole 3d of the base portion 3b and reach the internal space of the lid portion 3c. The incandescent lamp 2 is disposed in a receiving space formed by the base portion 3b and the lid portion 3c. 3g. The light source device 4 is connected to a total of four power supply lines of a pair of power supply lines 1f of the discharge lamp 1 and a pair of power supply lines 2b of the incandescent lamp 2.

圖2,係本發明相關之一實施例的光源部6的平面圖。在框5分別裝戴光源裝置4縱向4列、橫向6列,構成光源部6。 Fig. 2 is a plan view showing a light source unit 6 according to an embodiment of the present invention. In the frame 5, the light source device 4 is mounted in four rows in the vertical direction and six columns in the horizontal direction to constitute the light source unit 6.

圖1,係針對本發明的實施例1及2的曝光裝置作繪示的示意圖,在對被照射物以照射光作照射的光源部6,係裝戴複數個光源裝置4,在各個光源裝置4,係連接著對放電燈1供應電力的點燈電路7及對白熾燈2供應定電流的定電流電源8。在定電流電源8與白熾燈2之間,係串聯連接將定電流作導通/關斷的開關10,此開關10係由控制部9作導通/關斷。此外,在定電流電源8與白熾燈2之間,係串聯連接電阻30,白熾燈2短路故障之情況下,保護定電流電源8。白熾燈2的兩端係為了可測定電壓而亦連接於測定部11,電阻11a係表示測定部11的內部電阻,比白熾燈2的燈絲2a的電阻值充分大的電阻值(數百萬歐姆程度),為此測定部11係可正確測定在燈絲2a產生的電壓。 1 is a schematic view showing an exposure apparatus according to Embodiments 1 and 2 of the present invention, in which a plurality of light source devices 4 are attached to a light source unit 6 that illuminates an object to be irradiated with light, in each light source device. 4. A lighting circuit 7 that supplies electric power to the discharge lamp 1 and a constant current power supply 8 that supplies a constant current to the incandescent lamp 2 are connected. Between the constant current power source 8 and the incandescent lamp 2, a switch 10 for turning on/off the constant current is connected in series, and the switch 10 is turned on/off by the control unit 9. Further, between the constant current power source 8 and the incandescent lamp 2, the resistor 30 is connected in series, and in the case where the incandescent lamp 2 is short-circuited, the constant current source 8 is protected. Both ends of the incandescent lamp 2 are connected to the measuring unit 11 in order to measure the voltage, and the resistor 11a indicates the internal resistance of the measuring unit 11, and is sufficiently larger than the resistance value of the filament 2a of the incandescent lamp 2 (million megaohms). To this extent, the measuring unit 11 can accurately measure the voltage generated in the filament 2a.

在比較部12係預先登錄以既定條件而測定的複數個純正品檢測用的白熾燈的電壓分布範圍,判定部13係依比較部12的比較結果判定放電燈是否為純正品,顯示部14係顯示該判定結果。於圖1,參考號為括號書寫的測定部15、比較部16、判定部17及曝光裝置101,係於實施例2,在與實施例1的測定部11、比較部12、 判定部13各者同樣的構成下作使用,表示該情況下係曝光裝置101。在比較部16係預先登錄以既定條件針對複數個純正品檢測用的白熾燈以既定時間間隔作了2次測定時的電壓差的分布範圍。 The comparison unit 12 registers in advance a voltage distribution range of a plurality of incandescent lamps for pure genuine detection measured under predetermined conditions, and the determination unit 13 determines whether or not the discharge lamp is a genuine product based on the comparison result of the comparison unit 12, and the display unit 14 The result of this determination is displayed. In FIG. 1, the measurement unit 15, the comparison unit 16, the determination unit 17, and the exposure apparatus 101, which are written in parentheses, are in the second embodiment, and the measurement unit 11 and the comparison unit 12 in the first embodiment. Each of the determination units 13 is used in the same configuration, and indicates that the exposure apparatus 101 is in this case. The comparison unit 16 registers in advance the distribution range of the voltage difference when the incandescent lamps for a plurality of pure genuine detections are measured twice at predetermined time intervals under predetermined conditions.

[實施例1] [Example 1]

於圖1,導通曝光裝置100的電源開關時,點燈電路7係對全部的放電燈1供應電力。一般而言,放電燈1完全立升係需要數分鐘。在緊接著曝光裝置100的電源開關導通後控制部9,係使連接於光源裝置4內的第1白熾燈2的第1開關10為導通,從定電流電源8供應定電流。從第1開關10的導通時的既定時間後,例如10秒後測定部11測定第1白熾燈2的兩端電壓,將該結果送至比較部12,比較部12係比較該結果與預先登錄於比較部12的複數個純正品檢測用的白熾燈的電壓分布範圍,將是否為登錄電壓範圍內送至判定部13,登錄電壓範圍內時判定部13係判定對應的放電燈1係純正品,登錄範圍外時判定為對應的放電燈1係非純正品,將該判定結果顯示於顯示部14。從測定至顯示為止的檢查,係自動進行故以極短時間結束。 In FIG. 1, when the power switch of the exposure apparatus 100 is turned on, the lighting circuit 7 supplies electric power to all of the discharge lamps 1. In general, it takes several minutes for the discharge lamp 1 to completely rise. Immediately after the power switch of the exposure apparatus 100 is turned on, the control unit 9 turns on the first switch 10 of the first incandescent lamp 2 connected to the light source device 4, and supplies a constant current from the constant current source 8. After a predetermined time from the conduction of the first switch 10, for example, the measurement unit 11 measures the voltage across the first incandescent lamp 2, and sends the result to the comparison unit 12, and the comparison unit 12 compares the result with the pre-registration. The voltage distribution range of the plurality of incandescent lamps for the pure genuine detection in the comparison unit 12 is sent to the determination unit 13 within the registration voltage range, and the determination unit 13 determines that the corresponding discharge lamp 1 is genuine. When it is outside the registration range, it is determined that the corresponding discharge lamp 1 is a non-pure genuine product, and the determination result is displayed on the display unit 14. The inspection from the measurement to the display is automatically performed and ends in a very short time.

第1白熾燈2的電壓測定結束後,控制部9,係使連接於第1白熾燈2的第1開關10為關斷,使連接於第2白熾燈2的第2開關10為導通,從定電流電源8供應定電流。之後,係如同第1白熾燈2的情況判定對應 的放電燈1是否為純正品,進行同樣的檢查直到結束全部的白熾燈2的檢查。 After the voltage measurement of the first incandescent lamp 2 is completed, the control unit 9 turns off the first switch 10 connected to the first incandescent lamp 2, and turns on the second switch 10 connected to the second incandescent lamp 2. The constant current source 8 supplies a constant current. After that, it is determined as the case of the first incandescent lamp 2 Whether the discharge lamp 1 is pure or not, the same inspection is performed until the inspection of all the incandescent lamps 2 is completed.

光源部6以24燈的放電燈而構成的情況下,係每1燈耗例如10秒,此情況下係以240秒(4分)結束檢查。為此,一般的放電燈的立升時間為數分鐘程度,考量曝光裝置整體的啟動時間通常為10分鐘程度時,能以充分短的時間結束檢查。 When the light source unit 6 is configured by a 24-lamp discharge lamp, it consumes 10 seconds per lamp, and in this case, the inspection is completed in 240 seconds (4 minutes). For this reason, the general rise time of the discharge lamp is several minutes, and when the total start-up time of the exposure apparatus is usually about 10 minutes, the inspection can be completed in a sufficiently short time.

此時,白熾燈2的電壓為登錄電壓範圍外,判定部13判定對應的放電燈1係非純正品的情況下,係優選上作成:顯示部14顯示確定該放電燈的位置的資訊的顯示及該放電燈為非純正品之旨,控制部9暫時中斷檢查,之後由操作員等的確認後,可再開始檢查。此外,在別的應對方面,更優選上作成:檢測出非純正品的放電燈的情況下仍不中斷檢查下進行全部的放電燈的檢查,針對檢查結果將與以顯示部14顯示的情況同樣的資訊另外儲存於記憶裝置等,全部的放電燈的檢查結束後,可總括顯示非純正品的放電燈的位置資訊等。 In this case, when the voltage of the incandescent lamp 2 is outside the registration voltage range, and the determination unit 13 determines that the corresponding discharge lamp 1 is a non-pure genuine product, it is preferable that the display unit 14 displays a display indicating information indicating the position of the discharge lamp. And the discharge lamp is a non-pure genuine product, and the control unit 9 temporarily interrupts the inspection, and after checking by the operator or the like, the inspection can be resumed. Further, in the case of other countermeasures, it is more preferable to perform the inspection of all the discharge lamps without interrupting the inspection in the case where the discharge lamp of the non-pure quality is detected, and the inspection result will be the same as that displayed on the display unit 14. The information is stored in a memory device, etc., and after the inspection of all the discharge lamps is completed, the position information of the discharge lamp of the non-pure genuine product can be collectively displayed.

在圖4,係示出開關10的導通/關斷的時機與以測定部11的測定時機的關係。在圖4係示出:連接於第1白熾燈2的第1開關10成為導通時的既定時間後測定第1白熾燈2的兩端的電壓,在緊接著測定後使連接於第1白熾燈2的第1開關10成為關斷,連接於第2白熾燈2的第2開關10成為導通,既定時間後測定第2白熾燈2的兩端的電壓,之後同樣地測定全部的白熾燈2的 兩端電壓。上述的構成,係在歷來的多燈型的曝光裝置,追加定電流電源8、開關10、控制部9、測定部11、比較部12、判定部13、顯示部14的構成,尤其控制部9、比較部12、判定部13係能以1台微電腦等實現,非大幅增加曝光裝置的成本者。 FIG. 4 shows the relationship between the timing at which the switch 10 is turned on/off and the timing of measurement by the measuring unit 11. FIG. 4 shows that the voltage of both ends of the first incandescent lamp 2 is measured after a predetermined time when the first switch 10 connected to the first incandescent lamp 2 is turned on, and is connected to the first incandescent lamp 2 immediately after the measurement. The first switch 10 is turned off, and the second switch 10 connected to the second incandescent lamp 2 is turned on. The voltage across the second incandescent lamp 2 is measured after a predetermined period of time, and then all the incandescent lamps 2 are measured in the same manner. Voltage at both ends. In the above-described configuration, the constant current power source 8, the switch 10, the control unit 9, the measuring unit 11, the comparing unit 12, the determining unit 13, and the display unit 14 are added to the conventional multi-lamp type exposure apparatus, and in particular, the control unit 9 The comparison unit 12 and the determination unit 13 can be realized by one microcomputer or the like, and the cost of the exposure apparatus is not greatly increased.

[實施例2] [Embodiment 2]

於圖1,與實施例1不同的要素,係測定部15(內部電阻係電阻15a)、比較部16、判定部17,其他要素相同。與實施例1相同的要素係省略說明。在緊接著曝光裝置101的電源開關導通後,使連接於光源裝置4內的第1白熾燈2的第1開關10為導通並從定電流電源8供應定電流。在緊接著其後測定部15針對第1白熾燈2的兩端電壓進行第1次的測定,將該結果送至比較部16。接著從第1次的測定的既定時間後,例如在10秒後測定部15針對第1白熾燈2的兩端電壓進行第2次的測定,將該結果送至比較部16,比較部16係針對2次的測定電壓之差的電壓、及預先登錄於比較部16的複數個純正品檢測用的白熾燈的電壓差分布範圍作比較,將是否為所登錄之電壓差範圍內送至判定部17,登錄範圍內時判定部17判定對應的放電燈1係純正品,登錄範圍外時判定為對應的放電燈1係非純正品,將該判定結果顯示於顯示部14。從測定至顯示為止的檢查,係自動進行故以極短時間結束。 In FIG. 1, elements different from the first embodiment are the measurement unit 15 (internal resistance-type resistor 15a), the comparison unit 16, and the determination unit 17, and the other elements are the same. The same elements as those in the first embodiment are omitted. Immediately after the power switch of the exposure device 101 is turned on, the first switch 10 connected to the first incandescent lamp 2 in the light source device 4 is turned on and a constant current is supplied from the constant current source 8. Immediately thereafter, the measuring unit 15 performs the first measurement on the voltages of both ends of the first incandescent lamp 2, and sends the result to the comparing unit 16. Then, after the predetermined time of the first measurement, for example, after 10 seconds, the measurement unit 15 performs the second measurement on the voltages of both ends of the first incandescent lamp 2, and sends the result to the comparison unit 16, and the comparison unit 16 The voltage difference between the voltages of the secondary measurement voltages and the voltage difference distribution range of the plurality of incandescent lamps for the pure genuine detection previously registered in the comparison unit 16 are compared, and whether or not the voltage difference range is registered is sent to the determination unit. The determination unit 17 determines that the corresponding discharge lamp 1 is a genuine product, and determines that the corresponding discharge lamp 1 is a non-pure genuine product, and displays the determination result on the display unit 14. The inspection from the measurement to the display is automatically performed and ends in a very short time.

第1白熾燈2的2次的電壓測定結束後,控制部9,係使連接於第1白熾燈2的第1開關10為關斷,使連接於第2白熾燈2的第2開關10為導通,從定電流電源8供應定電流。之後,係如同第1白熾燈2的情況判定對應的放電燈1是否為純正品,進行同樣的檢查直到結束全部的白熾燈的檢查。 After the second voltage measurement of the first incandescent lamp 2 is completed, the control unit 9 turns off the first switch 10 connected to the first incandescent lamp 2, and turns on the second switch 10 connected to the second incandescent lamp 2. Turned on, a constant current is supplied from the constant current source 8. Thereafter, it is determined whether or not the corresponding discharge lamp 1 is a genuine one as in the case of the first incandescent lamp 2, and the same inspection is performed until the inspection of all the incandescent lamps is completed.

在圖5,係示出開關10的導通/關斷的時機與以測定部15的測定時機的關係。在圖5係示出:在緊接著連接於第1白熾燈2的第1開關10成為導通後進行第1次的第1白熾燈2的兩端的電壓測定,進一步在既定時間後進行第2次的第1白熾燈2的兩端的電壓測定,在緊接著第2次的測定後使連接於第1白熾燈2的第1開關10成為關斷,連接於第2白熾燈2的第2開關10成為導通,在緊接著其後進行第1次的第2白熾燈2的兩端的電壓測定,進一步在既定時間後進行第2次的第2白熾燈2的兩端的電壓測定,在緊接著第2次的測定後使連接於第2白熾燈2的第2開關10成為關斷,之後同樣地2次測定全部的白熾燈2的兩端電壓。 FIG. 5 shows the relationship between the timing of turning on/off the switch 10 and the measuring timing of the measuring unit 15. In FIG. 5, after the first switch 10 connected to the first incandescent lamp 2 is turned on, the voltage of both ends of the first incandescent lamp 2 is measured, and the second time is performed after a predetermined time. The voltage measurement at both ends of the first incandescent lamp 2 is such that the first switch 10 connected to the first incandescent lamp 2 is turned off immediately after the second measurement, and the second switch 10 connected to the second incandescent lamp 2 is turned off. When it is turned on, the voltage measurement at both ends of the second incandescent lamp 2 is performed immediately thereafter, and the voltage measurement at both ends of the second incandescent lamp 2 is performed after a predetermined time, and immediately after the second After the second measurement, the second switch 10 connected to the second incandescent lamp 2 was turned off, and thereafter, the voltages across the incandescent lamps 2 were measured twice in the same manner.

在實施例2,第1次及第2次的電壓測定時間的設定,開關10為導通狀態的時區,係任何時間皆可設定。白熾燈的電壓差為所登錄的電壓差範圍外,判定部17判定對應的放電燈1係非純正品的情況下,係採取如同實施例1的情況的應對為優選。此外,於實施例1,不需藉針對控制部9、測定部11、比較部12、判定部13、 顯示部14作控制的電腦程式的變更以變更硬體構成下,仍可實現實施例2。 In the second embodiment, the voltage measurement time of the first and second times is set, and the time zone in which the switch 10 is in the on state can be set at any time. When the voltage difference of the incandescent lamp is outside the range of the registered voltage difference, and the determination unit 17 determines that the corresponding discharge lamp 1 is a non-pure genuine product, it is preferable to take a countermeasure as in the case of the first embodiment. Further, in the first embodiment, the control unit 9, the measuring unit 11, the comparing unit 12, the determining unit 13, and the like are not required. The second embodiment can be realized by changing the computer program to be controlled by the display unit 14 to change the hardware configuration.

在本發明的曝光裝置100(101),係光源裝置4的台數多,該等的白熾燈2的檢查時間大幅超過曝光裝置100(101)的啟動時間的情況下,係將控制部9、定電流電源8、測定部11(15)、比較部12(16)、判定部13(17)、顯示部14增設白熾燈2的檢查所需之台數份,使此等並列運轉,並行進行白熾燈2的檢查,使得可不使檢查時間增加下應對於光源裝置4的台數增加作檢查。 In the exposure apparatus 100 (101) of the present invention, the number of the light source devices 4 is large, and when the inspection time of the incandescent lamps 2 greatly exceeds the startup time of the exposure apparatus 100 (101), the control unit 9 is provided. The constant current power source 8, the measuring unit 11 (15), the comparing unit 12 (16), the determining unit 13 (17), and the display unit 14 add the number of units required for the inspection of the incandescent lamp 2, and the parallel operation is performed in parallel. The inspection of the incandescent lamp 2 makes it possible to check the increase in the number of the light source devices 4 without increasing the inspection time.

本發明,係不僅在印刷電路板上形成配線圖案的曝光程序用的曝光裝置,於利用放電燈的液晶顯示面板用、半導體裝置用等全部的曝光裝置與構件的外觀檢查裝置等具有複數個燈的光源裝置,可利用於需要純正品的放電燈的裝置。 The present invention is an exposure apparatus for an exposure program that forms not only a wiring pattern on a printed circuit board, but also a plurality of lamps, such as a liquid crystal display panel for a discharge lamp, an appearance inspection device for a semiconductor device, and the like. The light source device can be used for a device that requires a purely genuine discharge lamp.

1‧‧‧放電燈 1‧‧‧discharge lamp

4‧‧‧光源裝置 4‧‧‧Light source device

5‧‧‧框 5‧‧‧ box

6‧‧‧光源部 6‧‧‧Light source department

7‧‧‧點燈電路 7‧‧‧Lighting circuit

8‧‧‧定電流電源 8‧‧‧Constant current source

9‧‧‧控制部 9‧‧‧Control Department

10‧‧‧開關 10‧‧‧ switch

11(15)‧‧‧測定部 11(15)‧‧‧Determination Department

11a(15a)‧‧‧電阻 11a (15a) ‧ ‧ resistance

12(16)‧‧‧比較部 12(16)‧‧‧Comparative Department

13(17)‧‧‧判定部 13(17)‧‧‧Decision Department

14‧‧‧顯示部 14‧‧‧Display Department

15‧‧‧測定部 15‧‧‧Determination Department

30‧‧‧電阻 30‧‧‧resistance

100(101)‧‧‧曝光裝置 100(101)‧‧‧Exposure device

Claims (3)

一種曝光裝置,特徵在於:具備:以成為光源的放電燈、檢測前述放電燈是否為純正品的白熾燈、及裝戴前述放電燈及前述白熾燈的反射器容器而構成的1至複數個光源裝置;將前述光源裝置朝向被照射物而裝戴的框;對前述白熾燈供應電流的定電流電源;將來自前述定電流電源的前述電流作導通/關斷的開關;在前述放電燈的點燈中將前述開關作導通/關斷而使前述白熾燈既定時間點燈的控制部;測定點燈中的前述白熾燈的兩端電壓的測定部;比較以前述測定部所測定的前述兩端電壓與針對放電燈的正確與否作判定的既定的上限值及下限值的電壓範圍的比較部;接收來自前述比較部的信號,前述兩端電壓為前述既定的上限值及下限值的電壓範圍內的情況下,係判定檢查對象放電燈為純正品,前述兩端電壓為前述既定的上限值及下限值的電壓範圍外的情況下,係判定檢查對象放電燈為非純正品的判定部;以及顯示判定結果的顯示部。 An exposure apparatus comprising: a discharge lamp that is a light source, an incandescent lamp that detects whether the discharge lamp is a genuine product, and one or more light sources that are configured to mount the discharge lamp and the reflector container of the incandescent lamp a device for mounting the light source device toward the object to be irradiated; a constant current power source for supplying current to the incandescent lamp; a switch for turning on/off the current from the constant current power source; at a point of the discharge lamp a control unit that turns on and off the switch to turn on the incandescent lamp at a predetermined time; a measuring unit that measures a voltage between the two ends of the incandescent lamp in the lighting; and compares the two ends measured by the measuring unit a comparison unit of a voltage and a predetermined upper limit value and a lower limit voltage range for determining whether the discharge lamp is correct or not; receiving a signal from the comparison unit, wherein the two-terminal voltage is the predetermined upper limit value and the lower limit value In the case of the voltage range of the value, it is determined that the discharge lamp to be inspected is a genuine product, and the voltage at both ends is outside the voltage range of the predetermined upper limit value and the lower limit value. Under conditions, is determined based inspection target discharge lamp a non genuine product determination unit; and a display unit displaying the determination result. 一種曝光裝置,特徵在於:具備: 以成為光源的放電燈、檢測前述放電燈是否為純正品的白熾燈、及裝戴前述放電燈及前述白熾燈的反射器容器而構成的1至複數個光源裝置;將前述光源裝置朝向被照射物而裝戴的框;對前述白熾燈供應電流的定電流電源;將來自前述定電流電源的前述電流作導通/關斷的開關;在前述放電燈的點燈中將前述開關作導通/關斷而使前述白熾燈既定時間點燈的控制部;針對點燈中的前述白熾燈的兩端電壓2次分別在既定時間作測定的測定部;比較於前述測定部該白熾燈的第1次測定時的電壓與第2次測定時的電壓的差、及針對放電燈的正確與否作判定的既定的上限值及下限值的電壓差範圍的比較部;接收來自前述比較部的信號,前述第1次測定時的電壓與第2次測定時的電壓的差在前述既定的上限值及下限值的電壓差範圍內的情況下,係判定檢查對象放電燈為純正品,前述第1次測定時的電壓與第2次測定時的電壓的差在前述既定的上限值及下限值的電壓差範圍外的情況下,係判定檢查對象放電燈為非純正品的判定部;以及顯示判定結果的顯示部。 An exposure apparatus characterized by having: a plurality of light source devices configured to be a discharge lamp that is a light source, an incandescent lamp that detects whether the discharge lamp is a genuine product, and a reflector container that mounts the discharge lamp and the incandescent lamp; and the light source device is irradiated toward the light source device a frame mounted on the object; a constant current power source for supplying current to the incandescent lamp; a switch for turning on/off the current from the constant current power source; and turning on/off the switch in the lighting of the discharge lamp a control unit that turns off the incandescent lamp at a predetermined time; a measurement unit that measures the voltage at both ends of the incandescent lamp twice in the lighting for a predetermined time; and compares the first time of the incandescent lamp in the measuring unit a comparison unit of a difference between a voltage at the time of measurement and a voltage at the second measurement, and a voltage difference range between a predetermined upper limit value and a lower limit value for determining whether the discharge lamp is correct or not; and receiving a signal from the comparison unit When the difference between the voltage at the time of the first measurement and the voltage at the second measurement is within the range of the voltage difference between the predetermined upper limit value and the lower limit value, it is determined that the discharge lamp to be inspected is In the case where the difference between the voltage at the time of the first measurement and the voltage at the second measurement is outside the range of the voltage difference between the predetermined upper limit value and the lower limit value, it is determined that the discharge lamp to be inspected is not purely genuine. a determination unit; and a display unit that displays the determination result. 一種放電燈的檢查方法,特徵在於:於裝備以成為光源的前述放電燈、檢測前述放電燈是否為純正品的前述白熾燈、及裝戴前述放電燈及前述白熾 燈的前述反射器容器而構成的複數個前述光源裝置的如申請專利範圍第1或2項之曝光裝置中,前述控制部,係在前述放電燈的點燈中將前述白熾燈依次導通/關斷而依次檢查前述放電燈的正確與否。 A method for inspecting a discharge lamp, comprising: arranging the discharge lamp as a light source, detecting the incandescent lamp as to whether the discharge lamp is genuine, and mounting the discharge lamp and the incandescent lamp; In the exposure apparatus according to the first or second aspect of the invention, the control unit is configured to sequentially turn on/off the incandescent lamp in the lighting of the discharge lamp. The correctness of the aforementioned discharge lamp is checked in turn.
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