TW201607713A - Brittle material substrate breaking method, substrate holding member for breaking brittle material substrate, and frame for stretching adhesive film when breaking brittle material substrate - Google Patents
Brittle material substrate breaking method, substrate holding member for breaking brittle material substrate, and frame for stretching adhesive film when breaking brittle material substrate Download PDFInfo
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Abstract
Description
本發明係關於一種分斷脆性材料基板之方法,尤其是關於一種在該分斷中使用之黏著薄膜張設用之框體。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a method of breaking a substrate of a brittle material, and more particularly to a frame for affixing an adhesive film used in the breaking.
電子元件或光元件等半導體元件,一般是藉由如下之程序製作:在半導體基板等之圓形或矩形狀之脆性材料基板即母基板上,呈二維地反覆形成有構成各個元件之電路圖案後,分斷該元件形成後之母基板而單片化(晶片化)成為多個元件(晶片)單位。 A semiconductor element such as an electronic component or an optical component is generally produced by a process of forming a circuit pattern constituting each component in two dimensions on a mother substrate which is a circular or rectangular brittle material substrate such as a semiconductor substrate. Thereafter, the mother substrate after the formation of the element is separated and singulated (wafered) into a plurality of element (wafer) units.
作為分割(晶片之單片化)半導體基板等脆性材料基板之手段方法,公知的態樣(例如,參照專利文獻1)有:利用圓形輪等之刃前端或雷射而在被稱為路徑(street)的分割預定線形成成為分割起點之刻劃線,之後,利用裂斷裝置對脆性材料基板以三點彎曲的手段方法施加彎曲應力而從分割起點使裂紋(龜裂)伸展,藉此分斷基板。 A well-known aspect (for example, refer patent document 1) is a method of dividing a chip (a singulation of a wafer) into a brittle material substrate such as a semiconductor substrate, and is referred to as a path by a blade tip or a laser such as a circular wheel. The predetermined dividing line of the (street) is formed as a scribe line which is a starting point of the dividing, and then the bending stress is applied to the brittle material substrate by a three-point bending method by the breaking means, and the crack (crack) is extended from the dividing starting point. Break the substrate.
該分斷,一般係以在張設於圓形環狀之框體即切割框架(dicing frame)的具有黏著性的切割膠帶(dicing tape)之被黏著面,黏貼固定有作為分斷對象之脆性材料基板的狀態進行。 The breaking is generally performed by adhering an adhesive surface of an adhesive dicing tape which is placed on a circular ring-shaped frame, that is, a dicing frame, and is adhered and fixed as a breaking object. The state of the material substrate is performed.
專利文獻1:日本特開2014-83821號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2014-83821
在進行單片化時以三點彎曲方式進行脆性材料基板分斷的 情形,由於分斷後之各個單片處於相互接觸的狀態,因此有藉由使黏貼有脆性材料基板之切割膠帶伸張(擴展)而將各個單片分開的情形。在進行該伸張時,由於有必要使切割膠帶等向性地(isotropically)伸張,因此作為框體有必要使用圓形環狀者。 Breaking of the brittle material substrate in a three-point bending manner during singulation In this case, since the individual pieces after the breaking are in contact with each other, there is a case where the individual pieces are separated by stretching (expanding) the dicing tape to which the brittle material substrate is pasted. At the time of this stretching, since it is necessary to make the dicing tape is isotropically stretched, it is necessary to use a circular ring as the frame.
另一方面,有必要設定成用於基板分斷之上刃(裂斷刃)不與 張設有切割膠帶之框體接觸。 On the other hand, it is necessary to set the upper edge (breaking edge) for the substrate to be broken. The frame is in contact with the cutting tape.
此外,作為切割框架,一般係使用依循SEMI規格者。 In addition, as a cutting frame, generally, those who follow the SEMI specifications are used.
根據這些要求,在以往係使用較作為分斷對象之脆性材料基 板更大一圈尺寸的切割框架。例如,對於12吋基板,係使用依循SEMI規格的18吋尺寸之切割框架。 According to these requirements, in the past, brittle material bases were used as the object of breaking. The board has a larger circle of cut frames. For example, for a 12-inch substrate, a 18-inch size cutting frame that conforms to SEMI specifications is used.
然而,在使用如此般之與脆性材料基板存在有尺寸差之切割 框架的情形,有必要使用比脆性材料基板尺寸更大尺寸之切割膠帶。此外,在元件之量產過程等中連續性地分斷多個脆性材料基板的情形,有必要以卡匣(cassette)等搬送手段搬送該多個脆性材料基板,但若切割框架較大則該搬送手段之尺寸亦變大,而導致重量化。進一步地,必定產生分斷中所使用的裂斷裝置之尺寸亦大型化。這些均成為元件製作程序中使成本變高的要因。 However, there is a size difference in the use of such a substrate with a brittle material. In the case of a frame, it is necessary to use a dicing tape that is larger than the size of the brittle material substrate. Further, in the case where a plurality of brittle material substrates are continuously separated in the mass production process of the element or the like, it is necessary to transport the plurality of brittle material substrates by a transport means such as a cassette, but if the cutting frame is large, The size of the transport means also becomes large, resulting in weight. Further, the size of the breaking device used in the breaking must be increased in size. These have become the factors that make the cost higher in the component manufacturing process.
本發明係有鑑於上述課題而完成者,目的在於提供一種能夠 抑制分斷脆性材料基板時之成本並且不會對後段步驟中的擴展(expand)實施帶來妨礙的脆性材料基板之分斷方法、及其中使用的分斷用之基板保持構件、以及構成該基板保持構件之框體。 The present invention has been made in view of the above problems, and an object thereof is to provide an ability to provide a method for breaking a brittle material substrate which does not hinder the expansion of the subsequent step in the step of breaking the brittle material substrate, a substrate holding member for breaking the substrate used therein, and a substrate constituting the substrate Hold the frame of the component.
為了解決上述課題,請求項1或請求項5之發明,係分斷脆 性材料基板之方法,其特徵在於,具備:刻劃線形成步驟,在脆性材料基板之一主面側之分斷對象位置形成刻劃線;基板黏貼步驟,將形成有該刻劃線之該脆性材料基板之該一主面,黏貼於在框體張設有黏著膜而成之基板保持構件之該黏著膜;以及分斷步驟,在從下方支承該脆性材料基板的狀態下,一邊使上刃之前端抵接於與該刻劃線之形成位置對應之另一主面側之分斷預定位置並一邊下降,藉此分斷該脆性材料基板;該框體形成為矩形環狀;較佳為:該基板保持構件中的可黏貼該脆性材料基板之區域一邊的長度,為該脆性材料基板之最大外形尺寸的1.2倍以上、1.4倍以下。 In order to solve the above problem, the invention of claim 1 or claim 5 is broken and brittle. A method for forming a material substrate, comprising: a step of forming a scribe line, forming a scribe line at a position of a dividing object on one main surface side of the brittle material substrate; and a step of adhering the substrate, the scribe line is formed The main surface of the brittle material substrate is adhered to the adhesive film of the substrate holding member in which the adhesive film is formed in the frame; and the breaking step is performed while supporting the brittle material substrate from below. The front end of the blade abuts on a predetermined predetermined position of the other main surface side corresponding to the position at which the scribe line is formed, and is lowered while separating the brittle material substrate; the frame is formed in a rectangular ring shape; preferably The length of one side of the substrate holding member to which the brittle material substrate can be adhered is 1.2 times or more and 1.4 times or less of the maximum outer shape of the brittle material substrate.
請求項2之發明,係分斷脆性材料基板之方法,其特徵在 於,具備:刻劃線形成步驟,在脆性材料基板之一主面側之分斷對象位置形成刻劃線;基板黏貼步驟,將形成有該刻劃線之該脆性材料基板之該一主面,黏貼於在框體張設有黏著膜而成之基板保持構件之該黏著膜;以及分斷步驟,在從下方支承該脆性材料基板的狀態下,一邊使上刃之前端抵接於與該刻劃線之形成位置對應之另一主面側之分斷預定位置並一邊下降,藉此分斷該脆性材料基板;該框體形成為矩形環狀;在該脆性材料基板已黏貼於該黏著膜的狀態下,在該脆性材料基板與該框體間設置可黏貼圓形環狀之第2框體的區域。 The invention of claim 2 is a method for breaking a substrate of a brittle material, characterized in that And a step of forming a scribe line, forming a scribe line at a position of the dividing object on one side of the main surface of the brittle material substrate; and a step of adhering the substrate, the main surface of the substrate of the brittle material on which the scribe line is formed Adhesive film adhered to the substrate holding member in which the adhesive film is formed on the frame; and a breaking step of abutting the front end of the upper blade while supporting the brittle material substrate from below The brittle material substrate is separated by a predetermined position corresponding to the other main surface side of the scribe line, and the brittle material substrate is separated; the frame is formed in a rectangular ring shape; the brittle material substrate is adhered to the adhesive film In the state of the brittle material substrate and the frame, a region in which the second frame of the circular ring shape can be adhered is provided.
請求項3或請求項5之發明,係分斷脆性材料基板之方法, 其特徵在於:將預先在一主面側之分斷對象位置形成有刻劃線的脆性材料基板之該一主面,黏貼於在矩形環狀之框體張設有黏著膜、且可黏貼該脆性材料基板之區域一邊的長度為該脆性材料基板之最大外形尺寸的1.2倍 以上、1.4倍以下而成的基板保持構件之該黏著膜,之後,從下方支承配置有保護膜之該脆性材料基板,一邊使上刃之前端抵接於與該刻劃線之形成位置對應之該另一主面側之分斷預定位置並一邊下降,藉此分斷該脆性材料基板。 The invention of claim 3 or claim 5 is a method of breaking a substrate of a brittle material, The main surface of the brittle material substrate on which the scribed line is formed in advance on the main surface side is adhered to the rectangular annular frame, and the adhesive film is adhered thereto, and the adhesive film can be adhered thereto. The length of one side of the region of the brittle material substrate is 1.2 times the maximum outer dimension of the brittle material substrate The adhesive film of the substrate holding member formed by the above-mentioned 1.4 times or less, and then the brittle material substrate on which the protective film is placed is supported from below, and the front end of the upper blade is brought into contact with the position where the scribe line is formed. The other main surface side is divided by a predetermined position and lowered while being separated, thereby breaking the brittle material substrate.
請求項4之發明,係分斷脆性材料基板之方法,其特徵在 於:將預先在一主面側之分斷對象位置形成有刻劃線的脆性材料基板之該一主面,黏貼於在矩形環狀之框體張設有黏著膜而成的基板保持構件之該黏著膜,且是以在該脆性材料基板與該框體間設置可黏貼圓形環狀之第2框體的區域的方式黏貼,之後,從下方支承配置有該保護膜之該脆性材料基板,一邊使上刃之前端抵接於與該刻劃線之形成位置對應之該另一主面側之分斷預定位置並一邊下降,藉此分斷該脆性材料基板。 The invention of claim 4 is a method for breaking a substrate of a brittle material, characterized in that The main surface of the brittle material substrate on which the scribed line is formed in advance on the main surface side is adhered to the substrate holding member in which the adhesive film is formed in the rectangular annular frame. The adhesive film is adhered so that a region in which a circular ring-shaped second frame body can be adhered is provided between the brittle material substrate and the frame, and then the brittle material substrate on which the protective film is placed is supported from below. The brittle material substrate is separated by lowering the front end of the upper blade against the predetermined predetermined position of the other main surface side corresponding to the position at which the scribe line is formed.
請求項6或請求項7之發明,係在對脆性材料基板藉由從上 方使上刃抵接的三點彎曲方式進行分斷時,使用於黏貼保持該脆性材料基板的基板保持構件,其特徵在於:在矩形環狀之框體張設有黏著膜,且較佳為可黏貼該脆性材料基板之區域一邊的長度為該脆性材料基板之最大外形尺寸的1.2倍以上、1.4倍以下。 The invention of claim 6 or claim 7 is based on the substrate of the brittle material When the three-point bending method in which the upper blade abuts is broken, the substrate holding member for adhering and holding the brittle material substrate is characterized in that an adhesive film is stretched over the rectangular annular frame, and preferably The length of one side of the region where the brittle material substrate can be adhered is 1.2 times or more and 1.4 times or less of the maximum outer shape of the brittle material substrate.
請求項8或請求項9之發明,係在對脆性材料基板藉由從上 方使上刃抵接的三點彎曲方式進行分斷時使用、且張設用於黏貼保持該脆性材料基板之黏著膜的框體,其特徵在於:形成為矩形環狀,且在張設有用於黏貼保持該脆性材料基板之黏著膜的狀態中、可黏貼該脆性材料基板之區域一邊的長度為該脆性材料基板之最大外形尺寸的1.2倍以上、1.4倍以下。 The invention of claim 8 or claim 9 is based on the substrate of the brittle material A frame for use in the three-point bending method in which the upper blade is abutted, and a frame for adhering the adhesive film for holding the brittle material substrate is formed, and is formed in a rectangular ring shape and is provided for being stretched. In the state in which the adhesive film of the brittle material substrate is adhered and adhered, the length of the side where the brittle material substrate can be adhered is 1.2 times or more and 1.4 times or less of the maximum outer shape of the brittle material substrate.
根據請求項1至請求項9之發明,能夠在進行分斷時上刃(裂 斷刃)與框體間不產生干擾,且使黏著膜之使用面積較以往習知更為減少,能夠減少進行分斷所需之成本。 According to the invention of claim 1 to claim 9, the upper edge (crack) can be performed at the time of breaking There is no interference between the broken blade and the frame, and the use area of the adhesive film is reduced more than conventionally, and the cost required for the breaking can be reduced.
1‧‧‧脆性材料基板 1‧‧‧Battery material substrate
2‧‧‧黏著膜 2‧‧‧Adhesive film
3、3a、3b‧‧‧框體 3, 3a, 3b‧‧‧ frame
4‧‧‧擴展用框體 4‧‧‧Expansion frame
4e‧‧‧(擴展用框體之)外周端部 4e‧‧‧ (expanded frame) peripheral end
101A、101B‧‧‧下刃 101A, 101B‧‧‧ lower blade
102‧‧‧上刃 102‧‧‧Upper
CR‧‧‧裂紋 CR‧‧‧Crack
I1~I4‧‧‧(矩形區域與框體間之)干擾區域 Interference area between I1~I4‧‧‧ (between rectangular area and frame)
RE‧‧‧矩形區域 RE‧‧‧Rectangular area
S‧‧‧刻劃線 S‧‧ scribe
d‧‧‧最大外形尺寸 d‧‧‧Maximum dimensions
圖1,係表示分斷脆性材料基板1之樣子的圖。 Fig. 1 is a view showing a state in which the brittle material substrate 1 is cut.
圖2,係表示將脆性材料基板1黏貼在黏著膜2之樣子的俯視圖。 Fig. 2 is a plan view showing a state in which the brittle material substrate 1 is adhered to the adhesive film 2.
圖3,係用於比較而揭示之表示在使用有圓形環狀之框體3a的基板保持構件黏貼有與圖2相同尺寸之脆性材料基板1之樣子的俯視圖。 Fig. 3 is a plan view showing a state in which a brittle material substrate 1 having the same size as that of Fig. 2 is adhered to a substrate holding member using a circular ring-shaped frame 3a.
圖4,係用於比較而揭示之表示在使用有圓形環狀之框體3b的基板保持構件黏貼有與圖2相同尺寸之脆性材料基板1之樣子的俯視圖。 Fig. 4 is a plan view showing a state in which a brittle material substrate 1 having the same size as that of Fig. 2 is adhered to a substrate holding member using a circular ring-shaped frame 3b.
圖5,係表示移轉處理之順序的圖。 Fig. 5 is a view showing the sequence of the transfer processing.
圖1係表示分斷脆性材料基板1之樣子的圖。本實施形態,係以對脆性材料基板1藉由裂斷裝置並以所謂的三點彎曲方式進行分斷的情形為對象。 Fig. 1 is a view showing a state in which the brittle material substrate 1 is cut. In the present embodiment, the brittle material substrate 1 is broken by a so-called three-point bending method by means of a breaking device.
作為脆性材料基板1,例如,可例舉半導體基板(矽基板等)或玻璃基板等。在半導體基板之一主面,亦可形成有既定元件(例如,CMOS感測器等)用之電路圖案。 The brittle material substrate 1 may, for example, be a semiconductor substrate (such as a germanium substrate) or a glass substrate. A circuit pattern for a predetermined element (for example, a CMOS sensor or the like) may be formed on one main surface of the semiconductor substrate.
當以三點彎曲方式對脆性材料基板1進行分斷時,首先,如圖1所示,將預先在其一主面之分斷預定位置形成有刻劃線S的脆性材料基板1,黏貼於亦被稱為切割膠帶之黏著膜2。黏著膜2,其一主面成為黏 著面,而張設於亦被稱為切割框架之框體3。在黏貼脆性材料基板1時,如以箭頭AR1所示般使形成有刻劃線S之側的主面抵接於黏著膜2,並使另一主面成為上面。之後,將已在框體3張設有黏著膜2者,統稱為基板保持構件。作為框體3之材質,例如,可例舉金屬(鋁、不鏽鋼等)、樹脂等。 When the brittle material substrate 1 is divided by a three-point bending method, first, as shown in FIG. 1, the brittle material substrate 1 having the scribe line S formed in advance at a predetermined position of one main surface thereof is adhered to Also known as the adhesive film 2 of the dicing tape. Adhesive film 2, one of its main faces becomes sticky The face is placed and placed on a frame 3, also referred to as a cutting frame. When the brittle material substrate 1 is adhered, the main surface on the side on which the score line S is formed is brought into contact with the adhesive film 2 as indicated by an arrow AR1, and the other main surface is placed on the upper surface. Thereafter, the adhesive film 2 is placed on the frame 3, and is collectively referred to as a substrate holding member. The material of the frame 3 may, for example, be a metal (aluminum, stainless steel, or the like), a resin, or the like.
在圖1中,表示有在與圖面垂直之方向分斷預定位置及刻劃 線S延伸的情形。刻劃線S,係於脆性材料基板1之厚度方向伸展之裂紋(微小裂紋)在脆性材料基板1之一主面呈線狀連續。 In Fig. 1, it is shown that the predetermined position and the scribe are separated in a direction perpendicular to the plane of the drawing. The case where the line S extends. The scribe line S is a continuous crack in the thickness direction of the brittle material substrate 1 (micro crack) and is continuous in one line on one main surface of the brittle material substrate 1.
另外,在圖1中雖為了圖示簡單化而僅示出一刻劃線S,但 在本實施形態中,係對脆性材料基板1在多個部位進行分斷而獲得短條狀或格子狀之多個單片(參照圖2)。因此,實際上,脆性材料基板1,在所有分斷預定位置形成有刻劃線S之後,黏貼於黏著膜2。 In addition, in FIG. 1, only one scribe line S is shown for simplification of illustration, but In the present embodiment, the brittle material substrate 1 is divided into a plurality of portions to obtain a plurality of single sheets in a short strip shape or a lattice shape (see FIG. 2). Therefore, in actuality, the brittle material substrate 1 is adhered to the adhesive film 2 after the score line S is formed at all predetermined positions.
對於刻劃線S之形成,可運用公知的技術。例如,可為藉由 使切輪(刻劃輪)沿分斷預定位置壓接轉動,而形成刻劃線S之態樣,其中,該切輪(刻劃輪)係由超硬合金、燒結鑽石、單結晶鑽石等構成,形成為圓板狀,且於外周部分具備作為刀刃而發揮功能之稜線;亦可為沿分斷預定位置藉由鑽石尖點進行刻劃而藉此形成刻劃線S的態樣;亦可為藉由雷射(例如,紫外線(UV)雷射)照射所產生之消蝕(ablation)或變質層之形成而形成刻劃線S之態樣;亦可為藉由雷射(例如,紅外線(IR)雷射)之加熱與冷卻所產生之熱應力而形成刻劃線S之態樣。 For the formation of the score line S, a well-known technique can be applied. For example, it can be The cutting wheel (the scoring wheel) is crimped and rotated along the predetermined position to form a scribe line S, wherein the cutting wheel (sculpt wheel) is made of super hard alloy, sintered diamond, single crystal diamond, etc. The structure is formed in a disk shape, and has a ridge line functioning as a blade at the outer peripheral portion; and may be formed by scribing a diamond cusp along the predetermined position to form the scribe line S; The aspect of the scribe line S may be formed by the formation of an ablation or a metamorphic layer generated by laser (for example, ultraviolet (UV) laser irradiation); or by laser (for example, The thermal stress generated by the heating and cooling of the infrared (IR) laser forms a scribe line S.
圖2係表示已將脆性材料基板1黏貼在黏著膜2之樣子的俯 視圖。在本實施形態中,作為框體3,係使用黏著膜2之可黏著區域(框體3內側之區域)為矩形狀之矩形環狀者。另外,若將脆性材料基板1之最大平 面尺寸(外徑)設為d,將黏著膜2之可黏貼區域一邊的長度設為L,則作為框體3,較佳為使用滿足L=1.2d~1.4d者。 Figure 2 is a view showing the state in which the brittle material substrate 1 has been adhered to the adhesive film 2. view. In the present embodiment, as the frame 3, a rectangular ring shape in which the adhesive region (the region inside the frame 3) of the adhesive film 2 is rectangular is used. In addition, if the brittle material substrate 1 is the largest flat When the surface size (outer diameter) is d and the length of one side of the adhesive region of the adhesive film 2 is L, the frame 3 is preferably used to satisfy L = 1.2 d to 1.4 d.
在圖2所示之態樣中,將黏貼有脆性材料基板1之基板保持 構件,供應給裂斷裝置進行分斷。具體而言,如圖1所示,以使刻劃線S之形成部位配置於在水平方向隔離的2個下刃101A、101B間的態樣,換言之,以使刻劃線S分別平行地、且亦與上刃102之延伸方向平行地配置在相互平行地配置成的2個下刃101A、101B間的態樣,使黏貼有脆性材料基板1之狀態之基板保持構件,藉由2個下刃101A、101B而從下方支承。另外,下刃101A、101B,係以相較於脆性材料基板1為十分具有剛性的構件設置。此外,上刃102,具有大於脆性材料基板1之最大外形尺寸d、且小於可黏貼區域一邊之長度L的刃長。另外,在進行分斷時,亦可為在脆性材料基板1之上面配置保護膜之態樣。 In the aspect shown in FIG. 2, the substrate to which the brittle material substrate 1 is adhered is held. The component is supplied to the breaking device for breaking. Specifically, as shown in FIG. 1 , the formation portion of the score line S is disposed between the two lower edges 101A and 101B which are separated in the horizontal direction, in other words, the score lines S are respectively parallel, Further, in a state in which the two lower edges 101A and 101B which are arranged in parallel with each other are arranged in parallel with the extending direction of the upper blade 102, the substrate holding member in a state in which the brittle material substrate 1 is adhered is provided by two lower portions. The blades 101A and 101B are supported from below. Further, the lower blades 101A and 101B are provided as members which are extremely rigid compared to the brittle material substrate 1. Further, the upper blade 102 has a blade length larger than the maximum outer dimension d of the brittle material substrate 1 and smaller than the length L of one side of the attachable region. Further, in the case of breaking, a protective film may be disposed on the upper surface of the brittle material substrate 1.
在進行了上述之支承狀態後,如圖1中以箭頭AR1所示般, 使上刃(裂斷刃)102從上方朝向刻劃線S之形成位置下降,並使其前端與脆性材料基板1抵接,進一步地使上刃102以壓入之方式下降。藉此,裂紋從刻劃線S往基板厚度方向伸展,而將脆性材料基板1分斷。 After the above-mentioned supporting state is performed, as indicated by an arrow AR1 in FIG. The upper blade (breaking blade) 102 is lowered from the upper side toward the position at which the score line S is formed, and the tip end thereof is brought into contact with the brittle material substrate 1, and the upper blade 102 is further lowered by press-fitting. Thereby, the crack extends from the scribe line S toward the thickness direction of the substrate, and the brittle material substrate 1 is broken.
如圖2所示,在設定有多條刻劃線S之情形(圖2中呈格子 狀設定),當在一刻劃線S之形成部位的分斷完成時,有必要使上刃102與黏貼有脆性材料基板1之基板保持構件相對移動,以使上刃102配置在下一分斷部位。因此,圖2中所示之一邊之長度d之矩形區域RE,成為上刃102相對於基板保持構件之相對移動範圍。 As shown in Fig. 2, in the case where a plurality of score lines S are set (the grid in Fig. 2) When the breaking of the formation portion of the scribe line S is completed, it is necessary to relatively move the upper blade 102 and the substrate holding member to which the brittle material substrate 1 is adhered, so that the upper blade 102 is disposed at the next breaking portion. . Therefore, the rectangular area RE of the length d of one side shown in Fig. 2 becomes the relative movement range of the upper blade 102 with respect to the substrate holding member.
圖3及圖4,係用於比較而揭示之表示在使用有尺寸相異之 圓形環狀之框體3a、3b的基板保持構件黏貼有與圖2相同尺寸(最大外形尺寸d)之脆性材料基板1之樣子的俯視圖。只要脆性材料基板1之尺寸相同,矩形區域RE之尺寸就相同,但如圖3所示,在使用內徑較脆性材料基板1之尺寸更大一圈左右(更具體而言,內徑為d的2(1/2)倍以下)的圓形環狀之框體3a的情形,產生了矩形區域RE與框體3a間產生干擾的干擾區域I1~I4。 亦即,其意味著在為了進行分斷而使上刃102下降時,上刃102與框體3a產生了接觸、碰撞。因此,在進行分斷時不能夠使用產生如此般之干擾的框體3a。 3 and 4 are for comparison and show that the substrate holding member using the circular ring-shaped frames 3a, 3b having the same size has the same size (maximum outer dimension d) as the brittleness of FIG. A plan view of the material substrate 1 as it is. As long as the size of the brittle material substrate 1 is the same, the size of the rectangular region RE is the same, but as shown in FIG. 3, the inner diameter of the substrate 1 is larger than the size of the brittle material substrate 1 (more specifically, the inner diameter is d). In the case of the circular ring-shaped frame 3a of 2 (1/2) times or less), interference regions I1 to I4 causing interference between the rectangular region RE and the casing 3a are generated. That is, it means that the upper blade 102 comes into contact with and collides with the casing 3a when the upper blade 102 is lowered for the purpose of breaking. Therefore, the frame 3a which causes such disturbance can not be used at the time of breaking.
另一方面,如圖4中所示之框體3b般,若使用可黏貼區域 十分大(更具體而言,內徑大於d的2(1/2)倍)的框體,則即使為形成圓形環狀的情形,亦能夠在與矩形區域RE間不產生干擾。因此,習知以往係使用該框體3b。然而,在使用該框體3b的情形,在黏著膜2中未黏貼有脆性材料基板1之區域的面積過大。一般而言,由於黏著膜2為消耗品,且為就每個進行分斷之脆性材料基板1而新黏貼於框體者,因此大面積之黏著膜2的使用,成為高成本的要因。 On the other hand, as in the case of the frame 3b shown in Fig. 4, even if a frame having a very large adhesive area (more specifically, an inner diameter larger than 2 (1/2) times d) is used, even if it is formed In the case of a circular ring shape, it is also possible to cause no interference with the rectangular area RE. Therefore, it has been conventionally used to use the frame 3b. However, in the case where the frame 3b is used, the area of the region where the brittle material substrate 1 is not adhered to the adhesive film 2 is excessively large. In general, since the adhesive film 2 is a consumable product and is newly adhered to the frame body for each of the brittle material substrates 1 that are separated, the use of the large-area adhesive film 2 is a high cost factor.
相對於此,在本實施形態之情形,如上述般為使用滿足L >d的矩形環狀之框體3。藉此,矩形區域RE之尺寸成為小於可黏貼區域之尺寸。而且,由於上刃102之刃長小於長度L,因此能夠使在上刃102與框體3間不產生干擾,而良好地進行分斷。此外,與使用框體3b的情形相比,由於黏著膜2之面積為較小,因此亦能抑制成本。 On the other hand, in the case of this embodiment, it is used as described above to satisfy L. >d rectangular rectangular frame 3. Thereby, the size of the rectangular area RE becomes smaller than the size of the attachable area. Further, since the blade length of the upper blade 102 is smaller than the length L, it is possible to perform the breakage without causing interference between the upper blade 102 and the frame 3. Further, since the area of the adhesive film 2 is small as compared with the case of using the frame 3b, the cost can be suppressed.
接著,針對用於將分斷後之脆性材料基板1供應給擴展處理 之移轉處理進行說明。圖5係表示該移轉處理之順序的圖。擴展處理,係 為了使分斷後處於相互接觸狀態的各個單片分開,而為了使黏貼有脆性材料基板1之黏著膜2以從背面側突起的方式伸張(擴展)而利用公知的擴展裝置所進行的處理,但在進行該伸張時,由於必需使黏著膜2等向性地伸張,因此必須使用圓形環狀者。亦即,不能將在形成為矩形環狀的框體3張設有黏著膜2而成之狀態的基板保持構件在維持原狀態下供應給擴展裝置。 因此所進行的動作,係移轉處理。 Next, for supplying the broken brittle material substrate 1 to the expansion processing The transfer process will be described. Fig. 5 is a view showing the sequence of the transfer processing. Extended processing In order to separate the individual sheets that are in contact with each other after the separation, the adhesive film 2 to which the brittle material substrate 1 is adhered is stretched (expanded) so as to protrude from the back side, and is processed by a known expansion device. At the time of this stretching, since it is necessary to make the adhesive film 2 extend in an isotropic manner, it is necessary to use a circular ring. In other words, the substrate holding member in a state in which the adhesive film 2 is formed in the frame 3 formed in a rectangular ring shape cannot be supplied to the expansion device while maintaining the original state. Therefore, the action performed is a transfer process.
首先,圖5(a)所示者,係表示在基板保持構件保持有分斷後 之脆性材料基板1之樣子的俯視圖。在分斷後之脆性材料基板1中,雖裂紋CR伸展至其上面,但經分斷而獲得的單片仍相互接觸。 First, as shown in FIG. 5(a), after the substrate holding member is kept broken, A plan view of the state of the brittle material substrate 1. In the brittle material substrate 1 after the breaking, although the crack CR is stretched thereon, the individual pieces obtained by the breaking are still in contact with each other.
接著,在圖5(a)中存在於分斷後之脆性材料基板1與框體3 間的區域,如圖5(b)所示般配置擴展用框體4,且黏貼於黏著膜2。擴展用框體4,係圓形環狀之框體,其內徑大於脆性材料基板1之最大外形尺寸d但其外徑係黏著膜2之可黏貼區域一邊的長度L以下。另外,亦可為如圖5(b)所示般為其外周端部4e與框體3抵接的態樣。 Next, in FIG. 5(a), the brittle material substrate 1 and the frame 3 are present after being separated. In the inter-region, the expansion frame 4 is placed as shown in FIG. 5(b) and adhered to the adhesive film 2. The expansion frame 4 is a circular annular frame having an inner diameter larger than the maximum outer dimension d of the brittle material substrate 1 but having an outer diameter equal to or less than the length L of the adhesive region of the adhesive film 2. Further, as shown in FIG. 5(b), the outer peripheral end portion 4e may be in contact with the frame body 3.
如上述般,由於框體3滿足L=1.2d~1.4d之要件,因此能夠 較佳地選擇、應用如此般之擴展用框體4。例如,在脆性材料基板1為12吋徑長的情形,作為擴展用框體4,可使用依循SEMI規格的12吋用切割框架。 As described above, since the frame 3 satisfies the requirements of L=1.2d to 1.4d, it is able to The expansion frame 4 is preferably selected and applied. For example, when the brittle material substrate 1 has a length of 12 turns, as the expansion frame 4, a 12-inch cutting frame conforming to the SEMI standard can be used.
如圖5(b)所示般在黏貼有擴展用框體4後,將框體3從黏著 膜2剝除,接著,沿著擴展用框體4之外周端部4e切除黏著膜2。藉此,如圖5(c)所示般,在圓形環狀之擴展用框體4,獲得黏貼有脆性材料基板1(嚴格來講,黏貼有分斷後之多個單片)的黏著膜2張設於圓形環狀之擴展用框 體4的狀態。換言之,可實現已將分斷後之脆性材料基板1移轉到在圓形環狀之擴展用框體4張設有黏著膜2的新的基板保持構件(擴展用基板保持構件)的狀態。 As shown in FIG. 5(b), after the expansion frame 4 is pasted, the frame 3 is adhered. The film 2 is peeled off, and then the adhesive film 2 is cut along the outer peripheral end portion 4e of the expansion frame 4. As a result, as shown in FIG. 5(c), in the circular ring-shaped expansion frame 4, an adhesive film to which the brittle material substrate 1 is adhered (strictly, a plurality of pieces after being separated) is obtained. 2 sets of expansion frames set in a circular ring The state of the body 4. In other words, the state in which the brittle material substrate 1 after the breaking is transferred to the new substrate holding member (the substrate holding member for expansion) in which the adhesive film 2 is stretched in the circular ring-shaped expansion frame 4 can be realized.
利用將該擴展用基板保持構件供應給擴展裝置,能夠進行較 佳的擴展處理。 By supplying the expansion substrate holding member to the expansion device, it is possible to perform comparison Good extension processing.
以上,如所說明般,根據本實施形態,在藉由三點彎曲方式 將脆性材料基板分斷成多個單片時,作為黏貼保持脆性材料基板之基板保持構件,係使用在可黏貼脆性材料基板之可黏貼區域一邊之長度為脆性材料基板之最大外形尺寸之1.2倍以上、1.4倍以下之環狀框體張設有黏貼膜而成者,藉此,能夠在進行分斷時上刃(裂斷刃)與框體間不產生干擾,且使黏著膜之使用面積較以往習知更為減少,能夠減少進行分斷所需之成本。 As described above, according to the present embodiment, the three-point bending method is employed. When the brittle material substrate is divided into a plurality of single sheets, the substrate holding member for adhering and holding the brittle material substrate is used at a side of the attachable region of the pasteable brittle material substrate, and the length is 1.2 times the maximum outer shape of the brittle material substrate. When the above-mentioned ring-shaped frame of 1.4 times or less is provided with an adhesive film, it is possible to prevent interference between the upper blade (cracking blade) and the frame and to use the area of the adhesive film when the cutting is performed. It is more reduced than previously known and can reduce the cost of performing the breaking.
除此之外,在要將分斷後之脆性材料基板供應給擴展處理 時,在脆性材料基板與進行分斷時使用之矩形環狀之框體間的區域黏貼圓形環狀之擴展用框體,沿該擴展用框體之外周切除黏著膜,藉此,能夠獲得已將分斷後之脆性材料基板移轉至在圓形環狀之擴展用框體張設有黏著膜而成之構成的擴展用基板保持構件的狀態。藉此,能夠將處於多個單片相互接觸之狀態的分斷後之脆性材料基板,較佳地供應給使各個單片分開的擴展處理。 In addition, the brittle material substrate after the break is supplied to the expansion processing. When the brittle material substrate and the rectangular annular frame used for the separation are adhered to the circular ring-shaped expansion frame, the adhesive film is cut along the outer periphery of the expansion frame, thereby obtaining The state of the substrate board for expansion which has a structure in which an adhesive film is formed in a circular annular expansion frame is transferred to the state of the substrate. Thereby, the divided brittle material substrate in a state in which a plurality of single sheets are in contact with each other can be preferably supplied to the expansion processing for separating the individual sheets.
1‧‧‧脆性材料基板 1‧‧‧Battery material substrate
2‧‧‧黏著膜 2‧‧‧Adhesive film
3‧‧‧框體 3‧‧‧ frame
RE‧‧‧矩形區域 RE‧‧‧Rectangular area
S‧‧‧刻劃線 S‧‧ scribe
d‧‧‧最大外形尺寸 d‧‧‧Maximum dimensions
L‧‧‧(可黏貼區域一邊之)長度 Length of L‧‧‧ (adhesive side)
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Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4989475A (en) * | 1972-12-27 | 1974-08-27 | ||
JP2000306864A (en) * | 1999-04-22 | 2000-11-02 | Apic Yamada Corp | Film attaching frame for dicing strip type work |
JP2004026539A (en) * | 2002-06-24 | 2004-01-29 | Nakamura Tome Precision Ind Co Ltd | Method and apparatus for cutting glass substrate |
JP2006173269A (en) * | 2004-12-14 | 2006-06-29 | Hamamatsu Photonics Kk | Method for machining substrate and device for extending film |
JP4589201B2 (en) * | 2005-08-23 | 2010-12-01 | 株式会社ディスコ | Substrate cutting equipment |
KR100748305B1 (en) * | 2006-03-02 | 2007-08-09 | 삼성에스디아이 주식회사 | Transferring mehtod for full cutted substrate |
JP5121746B2 (en) * | 2009-01-29 | 2013-01-16 | 昭和電工株式会社 | Substrate cutting method and electronic device manufacturing method |
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JP2013071335A (en) * | 2011-09-28 | 2013-04-22 | Mitsuboshi Diamond Industrial Co Ltd | Method for dicing mother substrate |
JP6039363B2 (en) | 2012-10-26 | 2016-12-07 | 三星ダイヤモンド工業株式会社 | Method and apparatus for dividing brittle material substrate |
-
2014
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2015
- 2015-03-17 TW TW104108443A patent/TWI644774B/en not_active IP Right Cessation
- 2015-06-05 KR KR1020150079948A patent/KR20160022760A/en unknown
- 2015-07-15 CN CN201510417153.0A patent/CN105382945A/en active Pending
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TWI644774B (en) | 2018-12-21 |
JP2016043503A (en) | 2016-04-04 |
KR20160022760A (en) | 2016-03-02 |
CN105382945A (en) | 2016-03-09 |
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