TW201510512A - Defect inspection system and film manufacturing apparatus - Google Patents

Abstract

A defect inspection system includes: an affixing roll used to affix a first film and a second film and to form a film; a transport line in which the film is transported in the downstream than the affixing roll; a defect inspection device provided in the transport line; and a recording device provided in the transport line further downstream than the defect inspection device and used to record defect information regarding a defect detected by the defect inspection device on the film; wherein the defect inspection device is provided in the transport line further upstream than a roll, other than the affixing roll, that first comes into contact with a surface of the second film which is the surface opposite to the first film.

Description

Defect inspection system and film manufacturing device

The present invention relates to a defect inspection system and a film manufacturing apparatus. The present invention claims priority based on Japanese Patent Application No. 2013-117947, filed on Jan.

A defect inspection system described in Patent Document 1 is known as a defect inspection system for a strip-shaped film. The defect inspection system of Patent Document 1 is a film transfer production line, and includes a defect inspection device and a recording device that records defect information on a film. On the other hand, a film manufacturing apparatus described in Patent Document 2 is known as a film manufacturing apparatus. The film manufacturing apparatus of the patent document 2 is equipped with the bonding roll which laminates the 1st film and the 2nd film, and the film|membrane, and the conveyance line which conveys the film on the downstream of a bonding roll, and the defect inspection apparatus is set in the Transfer the production line.

For example, in a production line for a film, a first film and a second film are bonded together, and are wound into a roll to produce a film roll. When the first film and the second film are bonded together, a problem of incorporation of air bubbles or the like into the foreign matter may occur between the first film and the second film. The defect inspection device is for checking whether there is a foreign matter defect or the like between the first film and the second film. [Prior Technical Literature] [Patent Literature]

Patent Document 1: Japanese Patent Laid-Open No. 2011-7779. Patent Document 2: Japanese Patent Laid-Open No. 2008-49604.

[Problems to be solved by the invention]

The defect inspection device is usually disposed on the downstream side of the transfer line. It is preferable that the defect inspection device is disposed on the downstream side of the conveyance line rather than on the upstream side of the conveyance line because the defects such as scratches generated by the film during conveyance can be collectively checked. For example, the defect inspection device checks whether there is a film defect after the film is in contact with 10 to 20 rolls.

On the other hand, in the case where the second film is peeled off from the first film in the final product, the scratch on the surface of the second film does not cause a problem. For example, even if scratches are formed on the surface of the second film, and there is no foreign matter defect or the like between the first film and the second film, the film can be used as a final product and there is no problem in use.

However, when the film is scratched on the surface of the second film during conveyance, there is a case where the scratch of the surface of the second film which is not originally problematic is erroneously detected as a defect. In this case, the usable film as the final product is regarded as a defective product.

In view of the foregoing, it is an object of the present invention to provide a defect inspection system and a film manufacturing apparatus capable of suppressing false alarms due to detection of scratches. [Means for solving problems]

In order to achieve the above object, the defect inspection system and the film manufacturing apparatus of the present invention adopt the following constitution. (1) A defect inspection system according to a first aspect of the present invention is a defect inspection system having a first film and a strip film which is releasably laminated on the second film of the first film, comprising: a bonding roller, The first film is bonded to the second film to form the film; the transfer line transports the film on the downstream side of the bonding roll; the defect inspection device is disposed on the transfer line; and the recording device is disposed on the film On the downstream side of the defect inspection device of the transfer line, the defect information related to the defect detected by the defect inspection device is recorded on the film; wherein the defect inspection device is disposed in the transfer line and disposed outside the bonding roller The opposite side of the first film of the second film is first contacted at the upstream side of the drum.

(2) The defect inspection system according to (1), wherein the defect inspection device includes: a light source disposed on a first film side of the film to irradiate the film with light; and an imaging device disposed on the film a second film side, the transmitted light image of the film is taken; the first polarizing filter is disposed on the light path between the light source and the film, and has a first absorption axis; and the second polarizing filter is disposed on the second polarizing filter A light absorption path between the imaging device and the film has a second absorption axis orthogonal to the first absorption axis.

(3) The defect inspection system according to (1), wherein the first film is a polarizing element; and the defect inspection device includes a light source disposed on a side of the polarizing element of the film to illuminate the film. The imaging device is disposed on the second film side of the film to capture a transmitted light image of the film; and a polarizing filter disposed on a light path between the imaging device and the film, and having the polarizing element The absorption axis of the absorption axis is orthogonal.

(4) A film manufacturing apparatus according to a second aspect of the present invention, comprising the defect inspection system according to any one of (1) to (3) above. [Effects of the Invention]

According to the aspect of the invention, it is possible to provide a defect inspection system and a film manufacturing apparatus capable of suppressing false alarms due to detection of scratches.

Hereinafter, embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments.

In addition, in the following drawings, the dimensions and proportions of the respective structural elements are appropriately changed for the sake of clarity of the drawings. In the following description and the drawings, the same or corresponding components are denoted by the same reference numerals, and the description thereof will not be repeated.

(First Embodiment) Fig. 1 is a side view showing a film manufacturing apparatus 1 of a first embodiment. In Fig. 1, the element symbol Sf1 is the upper surface of the film F, that is, the surface on the side of the first film F1. The element symbol Sf2 is the lower side of the film F, that is, the surface on the side of the second film F2.

In the following description, the XYZ orthogonal coordinate system is set corresponding to the demand, and the positional relationship of each component is described with reference to the XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the strip film in the X direction is the direction in which the Y direction is perpendicular to the X direction (the width direction of the long film), and the Z direction is orthogonal to the X direction and the Y direction. direction.

As shown in Fig. 1, the film manufacturing apparatus 1 includes a first supply unit 7 that supplies the first film F1, a second supply unit 8 that supplies the second film F2, and a defect inspection system 2 that checks whether the film F is defective. A plurality of rollers (for example, the first guide roller 10, the second guide roller 11, and the third guide roller 12 in the present embodiment) of the transport path of the film F; and a winding portion 9 that winds up the film F.

Further, in the present embodiment, three guide rollers of the first guide roller 10, the second guide roller 11, and the third guide roller 12 are provided as a plurality of rollers that form a conveyance path of the film F, However, it is not limited to this. For example, four or more guide rollers may be provided, or a nip roller or a tension roller other than the guide roller may be provided as a plurality of rollers forming a conveying path of the film F. Further, in addition to such a contact type drum, a non-contact type drum such as an air rod may be provided.

The film F is a strip film having a first film F1 and a second film F2 which is releasably laminated on the first film F1. The film F used in the present embodiment is, for example, a structure in which the second film F2 as a separation film is coated on one side of the first film F1 of the film used as the final product.

The first film F1 is, for example, a film of a triacetyl cellulose (TAC) film, a retardation film, a luminance increasing film, or a wide viewing angle film. The second film F2 is, for example, an adhesive film having a release film. Further, the film F may be a plurality of optical films such as a retardation film or a luminance increasing film laminated on the other surface of the first film F1.

Further, when the second film F2 is peeled off from the first film F1 at the film F, the entire second film F2 is not peeled off from the first film F1. For example, one portion (release film) of the second film F2 in the film F is peeled off, and the peeled film (the first film F1 and the adhesive material) is bonded to the panel or the like from the adhesive material side. That is, after a part of the second film F2 is partially peeled off, the remaining portion (adhesive material) of the second film F2 is placed on one surface of the first film F1.

The first supply unit 7 holds the roll drum R1 around which the strip-shaped first film F1 is wound, and winds up the first film F1 in the longitudinal direction of the first film F1. The first supply unit 7 is disposed on one side of the supply path of the film F (the +Z direction side shown in Fig. 1).

The second supply unit 8 holds the roll drum R2 around which the strip-shaped second film F2 is wound, and winds up the second film F2 in the longitudinal direction of the second film F2. The second supply unit 8 is disposed on the other side of the supply path of the film F (the -Z direction side shown in Fig. 1).

Further, the arrangement configuration of the first supply unit 7 and the second supply unit 8 is not limited thereto. For example, the first supply unit 7 may be disposed on the other side of the supply path of the film F (the -Z direction side shown in FIG. 1), and the second supply unit 8 may be disposed on one of the supply paths of the film F. Side (+Z direction side shown in Figure 1).

The defect inspection system 2 includes a bonding drum 3 that bonds two films of the first film F1 and the second film F2 to form a single film F, and a conveyance line 4 that conveys the film F on the downstream side of the bonding drum 3; The inspection device 5 is provided on the conveyance line 4; and the recording device 6 is provided on the downstream side of the defect inspection device 5 of the conveyance line 4.

The bonding drum 3 has a pair of holding drums 3a, 3b which are arranged in parallel with each other in the axial direction. A predetermined gap is formed between the pair of holding rollers 3a, 3b, and the gap is the bonding position of the first film F1 and the second film F2. The first film F1 and the second film F2 are superposed into the gap. The first film F1 and the second film F2 are pinched at the pinch rolls 3a, 3b and sent to the downstream side. Thereby, the second film F2 is bonded to the surface of one side of the first film F1.

The first film F1 and the second film F2 are bonded together by the bonding roll 3 to form a single film F. The film F is conveyed to the defect inspection device 5.

The defect inspection device 5 includes a light source 20 disposed on the first film F1 side of the film F (the +Z direction side shown in Fig. 1), and the imaging device 22 disposed on the second film F2 side of the film F (first The -Z direction side is shown in the figure; the first polarizing filter 21 is disposed on the light path between the light source 20 and the film F; and the second polarizing filter 23 is disposed on the imaging device 22 and the film F. Between the light paths.

The defect inspection device 5 is disposed in the conveyance line 4 and is disposed on the upstream side of the drum on which the opposing surface Sf2 of the first film F1 of the second film F2 other than the bonding drum 3 is first contacted. The defect inspection device 5 of the present embodiment is disposed in the conveyance line 4 and is disposed on the upstream side of the first guide roller 10 on the downstream side of the bonding drum 3. In the present embodiment, in addition to the bonding drum 3, the first guiding roller 10 is the roller on which the opposing surface Sf2 of the first film F1 of the second film F2 is first contacted.

The center of the light-emitting surface 20a of the light source 20 is disposed coaxially with the center of the light-receiving surface 22a of the imaging device 22 (on the optical axis CL).

Fig. 2 is a view for explaining the arrangement relationship between the first absorption axis V1 of the first polarizing filter 21 and the second absorption axis V2 of the second polarizing filter 23.

As shown in Fig. 2, the first polarizing filter 21 has a first absorption axis V1. The second polarizing filter 23 has a second absorption axis V2 orthogonal to the first absorption axis V1. The first polarizing filter 21 is disposed on the light path between the light source 20 and the imaging device 22 such that the first absorption axis V1 of the first polarizing filter 21 and the second absorption axis V2 of the second polarizing filter 23 are orthogonal to each other. Configuration (orthogonal polarizer configuration).

In the case of this embodiment, the film F (refer to Fig. 1) is a film which does not provide a phase difference with respect to the light which penetrates the first polarizing filter 21. Therefore, when the first absorption axis V1 of the first polarizing filter 21 and the second absorption axis V2 of the second polarizing filter 23 are arranged in a crossed polarizer, the first polarizing filter 21 and the second polarizing filter 23 are At the overlapping portion SV, the light does not penetrate. Therefore, when the overlapping portion SV is imaged by the imaging device 22, it is considered to be a dark field as long as it does not have a factor that disturbs the polarization state of the phase difference between the first polarizing filter 21 and the second polarizing filter 23.

In addition, in the case where the film F is a film that provides a phase difference to the light that penetrates the first polarizing filter 21, the first polarizing filter 21 and the second polarizing filter 23 may be disposed to offset the phase difference. Phase compensation film. In the case where the phase compensation film is not disposed, the transmission axis of the first polarizing filter 21 and the transmission axis of the second polarizing filter 23 may be disposed at an angle shifted from a 90° angle by a specific angle, without foreign matter defects. In the state of the defect, the received light intensity at the photographing device 22 is the smallest (dark field).

Fig. 3 is a plan view of the defect inspection device 5. In Fig. 3, for the sake of convenience, a film F is shown.

As shown in Fig. 3, the light-emitting surface 20a of the light source 20 constituting the defect inspection device 5 has a rectangular shape and has a long side in the Y direction. In the present embodiment, the light-emitting surface 20a of the light source 20 has a long side in the width direction orthogonal to the direction in which the film F is conveyed. The light exit surface 20a of the light source 20 is formed across the width direction with respect to the film F. For example, an LED line source can be used as the light source 20.

The first polarizing filter 21 is disposed to overlap the outer peripheral portion of the light emitting surface 20a of the light source 20. The first polarizing filter 21 has a long side in the Y direction, similarly to the light emitting surface 20a of the light source 20. The length of the first polarizing filter 21 is longer in the X direction and the Y direction than the light emitting surface 20a of the light source 20.

Thereby, in the case where the first polarizing filter 21 is disposed on the light path between the light source 20 and the film F, all of the light emitted from the light source 20 is incident on the first polarizing filter 21.

Similarly to the light emitting surface 20a of the light source 20, the imaging device 22 has a long side in the Y direction. For example, a line type camera can be used as the photographing device 22.

The second polarizing filter 23 is disposed to overlap the outer peripheral portion of the light receiving surface 22a of the imaging device 22. The second polarizing filter 23 has a long side in the Y direction, similarly to the light receiving surface 22a of the imaging device 22. The length of the second polarizing filter 23 is longer in the X direction and the Y direction than the light receiving surface 22a of the imaging device 22.

Returning to Fig. 1, the recording device 6 is disposed on the downstream side of the third guide roller 12 of the conveyance line 4. The recording device 6 records the related defect information detected by the defect inspection device 5 on the film F (for example, the first film F1 in the present embodiment). Defect information includes information about the location and type of defects.

The recording device 6 records, for example, the defect information in the width direction end portion of the first film F1 in the form of an identification code (a one-dimensional bar code, a two-dimensional bar code, a QR code (registered trademark), or the like). The identification code includes, for example, information indicating the position where the defect detected by the defect inspection device 5 is located at a distance from the additional position of the barcode in the film width direction (related information of the defect position). The identification code may also contain information about the type of defect detected.

The recording device 6 can also directly mark the dot-like, linear or frame-shaped marks that can surround the size of the defect at the defect position of the first film F1. At this time, the mark and the mark indicating the type of the defect are displayed at the defect position to record the related information of the defect type.

The film F on which the defect information is recorded by the recording device 6 is conveyed toward the winding unit 9. Further, the take-up portion 9 is wound into a roll shape to manufacture a roll drum R of the film F.

Incidentally, the defect inspection device is usually disposed on the downstream side of the conveyance line. It is preferable that the defect inspection device is disposed on the downstream side of the conveyance line rather than on the upstream side of the conveyance line because the defects such as scratches on the film during conveyance can be collectively checked. For example, the defect inspection device checks whether there is a film defect after the film is in contact with 10 to 20 rolls.

On the other hand, in the case where the second film is peeled off from the first film in the final product, the scratch on the surface of the second film does not cause a problem. For example, even if a scratch is formed on the surface of the second film, and there is no foreign matter defect or the like between the first film and the second film, the film can be used as a final product and there is no problem in use.

However, when the film is scratched on the surface of the second film during conveyance, there is a case where the scratch of the surface of the second film which is not originally problematic is erroneously detected as a defect. In this case, the usable film as the final product is regarded as a defective product.

Therefore, in order to solve the above problems, an embodiment of the present invention adopts the following configuration. The defect inspection system 2 according to the first embodiment of the present invention is a defect inspection system including a first film F1 and a strip film F which is releasably laminated on the second film F2 of the first film F1, and includes a bonding roller 3, The first film F1 and the second film F2 are bonded together to form a film F; the transport line 4 is transported on the downstream side of the bonding drum 3; the defect inspection device 5 is disposed on the transport line 4; and the recording device 6 The defect inspection information is detected on the downstream side of the defect inspection device 5 of the transfer line 4, and the defect information detected by the defect inspection device 5 is recorded on the film F. The defect inspection device 5 is disposed in the transfer line 4, and The upstream side of the roller (first guide roller 10) to which the opposing side surface Sf2 of the first film F1 of the second film F2 other than the bonding drum 3 is first contacted is disposed. In other words, the defect inspection system 2 according to the first embodiment of the present invention is a defect inspection system having a first film F1 and a strip film F which is releasably laminated on the second film F2 of the first film F1, and includes: a bonding roller 3, the first film F1 and the second film F2 are bonded together to form a film F; the transport line 4 is transported on the downstream side of the bonding drum 3; the defect inspection device 5 is disposed on the transport line 4; 6, on the downstream side of the defect inspection device 5 of the transfer line 4, recording related defect information detected by the defect inspection device 5 on the film F; and a plurality of rollers (first guide roller 10, second The guide roller 11 and the third guide roller 12) are disposed on the conveyance line 4; wherein the defect inspection device 5 is disposed in the conveyance line 4, and is disposed in the first film of the second film F2 among the plurality of rollers The opposite side of the F1's opposite side Sf2 is first contacted by the drum (the first guide roller 10).

Hereinafter, the operation and effect of the defect inspection system 2 of the present embodiment will be described using Figs. 4 and 5 .

Fig. 4 is a view for explaining the film F defect inspection of the defect inspection system of Comparative Example 1. In the defect inspection system of the first comparative example, the defect inspection device 5 is disposed in the conveyance line 4 and is placed in contact with the opposing side surface Sf2 of the first film F1 of the second film F2 other than the bonding drum 3. The downstream side of the drum (for example, the guide roller that finally contacts the face Sf2 of the plurality of guide rollers). Fig. 4 is because the defect E1 is present at the film F when the first film F1 and the second film F2 are bonded together, and the film F is in the conveyance because the second film F2 is rubbed against the guide roller. A schematic view of the case where the scratch E2 is generated on the surface of the second film F2.

As shown in Fig. 4, the light ray L1 emitted from the light source 20 toward the film F passes through the first polarizing filter 21 to become linearly polarized light L2. The linearly polarized light L2 obtained by the first polarizing filter 21 is incident on the first film F1. Then, due to the defect E1 existing between the first film F1 and the second film F2, the polarization state of the linearly polarized light L2 is disturbed, and a part of the light (L3) which is disturbed by the polarization state penetrates the second polarizing filter 23.

On the other hand, the polarized state of the linearly polarized light L2 is disturbed by the scratches E2 existing on the surface of the second film F2, and a part of the light (Light L4) disturbed by the polarized state penetrates the second polarizing filter 23.

As a result, the light L3 and the light L4 penetrating the second polarizing filter 23 are incident on the imaging device 22, and the imaging device 22 brightly captures the defect E1 and the scratch E2 which are regarded as bright spots.

Further, even if the defect E1 does not exist between the first film F1 and the second film F2, and the scratch E2 is present on the surface of the second film F2, the light L4 penetrating the second polarizing filter 23 is incident to The imaging device 22 causes the imaging device 22 to brightly capture the scratch E2 that is regarded as a bright spot.

As a result, in Comparative Example 1, when the film F is scratched on the surface of the second film F2 due to friction with the guide roller during the conveyance, the second film F2 is removed from the first film in the final product. In the case where peeling is performed at F1, scratches on the surface of the second film F2 which may be regarded as no problem will be erroneously detected as defects.

Fig. 5 is a view for explaining the defect inspection of the film F of the defect inspection system 2 of the present embodiment. In the defect inspection system 2 of the present embodiment, the defect inspection device 5 is disposed in the conveyance line 4, and the surface Sf2 of the first film F1 disposed on the second film F2 other than the bonding drum 3 is first contacted. At the upstream side of the roller (for example, the first guide roller 10 in the present embodiment). Fig. 5 is a view showing a state in which a defect E1 is present at the film F when the first film F1 and the second film F2 are bonded together. Further, since the film F defect is inspected before the second film F2 is scratched, no scratches are formed on the surface of the second film F2.

As shown in Fig. 5, the light ray L1 emitted from the light source 20 toward the film F passes through the first polarizing filter 21 to become linearly polarized light L2. The linearly polarized light L2 obtained by the first polarizing filter 21 is incident on the first film F1. Then, due to the defect E1 existing between the first film F1 and the second film F2, the polarization state of the linearly polarized light L2 is disturbed, and a part of the light (L3) which is disturbed by the polarization state penetrates the second polarizing filter 23. As a result, the light L3 penetrating the second polarizing filter 23 is incident on the imaging device 22, and the imaging device 22 brightly captures the defect E1 regarded as a bright spot.

On the other hand, in the case where the defect E1 does not exist between the first film F1 and the second film F2, the linearly polarized light L2 cannot penetrate the second polarizing filter 23. As a result, since no light is incident on the imaging device 22, the imaging device 22 captures a black image.

As described above, in the present embodiment, since no scratches are formed on the surface of the second film F2, the scratches on the surface of the second film F2 are not erroneously detected as defects.

As described above, according to the present embodiment, the defect inspection device 5 is disposed in the transport line 4, and is disposed first on the opposite side Sf2 of the first film F1 of the second film F2 other than the bonding roll 3 The upstream side of the drum (for example, the first guide roller 10 in the present embodiment) is used to inspect the defect of the film F before the second film F2 is scratched. That is, in the conveyance of the film F, since the second film F2 does not rub against the guide roller, no scratches are formed on the surface of the second film F2. Therefore, it is possible to suppress the false alarm of the flaw detection (the information of the error defect is detected).

(Second embodiment) Next, a second embodiment of the present invention will be described using Figs. 6 to 9 . Fig. 6 is a side view showing a film manufacturing apparatus 101 according to a second embodiment of the present invention. As shown in FIG. 6, the film manufacturing apparatus 101 of the present embodiment is different from the thin film manufacturing apparatus 1 of the first embodiment in that the first film F1a is a polarizing element, and the defect inspection device 105 includes a light source 20. The image pickup device 22 is disposed on the side of the second film F2 of the film Fa, and the polarizing filter 123 is disposed on the light path between the image forming device 22 and the film Fa. The same components as those in the first embodiment are denoted by the same reference numerals, and the detailed description thereof will be omitted.

The film Fa has a strip-shaped film in which the polarizing element F1a and the second film F2 which can be peeled off from the polarizing element F1a are peeled off. The film F used in the present embodiment has a structure in which, for example, the second film F2 (as a separation film) covers one surface of a polarizing element F1a made of PVA (polyvinyl alcohol) or the like.

Further, a plurality of optical films such as a retardation film or a luminance increasing film may be laminated on the other surface of the polarizing element F1a.

In the case of the present embodiment, the film Fa is a film which does not provide a phase difference with respect to the light penetrating the polarizing element F1a, but the film Fa is a film which provides a phase difference with respect to the light penetrating the polarizing element F1a. In this case, a phase compensation film capable of canceling the phase difference may be disposed between the film Fa and the polarizing filter 123. In the case where the phase compensation film is not disposed, the transmission axis of the polarizing element F1a and the transmission axis of the polarizing filter 123 may be disposed at an angle shifted by a certain angle from the 90° angle, in the absence of defects such as foreign matter defects. The received light intensity at the photographing device 22 is the smallest (dark field).

The defect inspection device 105 is disposed in the transport line 4 and is disposed on the upstream side of the drum on which the opposing surface Sf2 of the polarizing element F1a of the second film F2 other than the bonding drum 3 is first contacted. The defect inspection device 105 of the present embodiment is disposed on the upstream side of the first guide roller 10 on the downstream side of the bonding drum 3 in the conveyance line 4.

Fig. 7 is a view for explaining the arrangement relationship between the absorption axis Va of the polarizing element F1a and the absorption axis V of the polarizing filter 123.

As shown in Fig. 7, the polarizing element F1a has an absorption axis Va. The polarizing filter 123 has an absorption axis V orthogonal to the absorption axis Va. The polarizing filter 123 is disposed on the light path between the light source 20 and the imaging device 22, and the absorption axis Va of the polarizing element F1a and the absorption axis V of the polarizing filter 123 are arranged orthogonal to each other (orthogonal polarizer arrangement).

When the absorption axis Va of the polarizing element F1a and the absorption axis V of the polarizing filter 123 are arranged in a crossed polarizer, the light does not penetrate at the overlapping portion SV of the polarizing element F1a and the polarizing filter 123. Therefore, when the overlapping portion SV is imaged by the imaging device 22, it is considered to be a dark field without causing a factor that disturbs the polarization state of the phase difference between the polarizing element F1a and the polarizing filter 123.

Hereinafter, the operation and effect of the defect inspection system 102 of the present embodiment will be described using Figs. 8 and 9.

Fig. 8 is a view for explaining the film Fa defect inspection of the defect inspection system of Comparative Example 2. In the defect inspection system of the second comparative example, the defect inspection device 105 is disposed in the conveyance line 4 and is disposed on the opposite side of the surface Sf2 of the polarizing element F1a of the second film F2 other than the bonding drum 3 (for example, at the downstream side of the guide rollers of the plurality of guide rollers that are closest to the face Sf2). In the eighth embodiment, since the defect E1 is present in the film Fa when the polarizing element F1a and the second film F2 are bonded together, the film Fa is present in the film Fa due to the friction of the second film F2 and the guide roller. A schematic view of the case where the scratch E2 is generated on the surface of the second film F2.

As shown in Fig. 8, the light ray L1 emitted from the light source 20 toward the film Fa passes through the polarizing element F1a to become linearly polarized light L2. The linearly polarized light L2 obtained by the polarizing element F1a is incident on the second thin film F2. Then, due to the defect E1 existing between the polarizing element F1a and the second film F2, the polarized state of the linearly polarized light L2 is disturbed, and a part of the light (L3) which is disturbed by the polarized state passes through the polarizing filter 123.

On the other hand, the polarized state of the linearly polarized light L2 is disturbed by the scratches E2 existing on the surface of the second film F2, and a part of the light (light L4) disturbed by the polarized state passes through the polarizing filter 123.

As a result, the light L3 and the light ray L4 penetrating the polarizing filter 123 are incident on the imaging device 22, and the imaging device 22 brightly captures the defect E1 and the scratch E2 which are regarded as bright spots.

Further, even if the defect E1 does not exist between the polarizing element F1a and the second film F2, and the scratch E2 is present on the surface of the second film F2, the light L4 penetrating the polarizing filter 123 is incident on the imaging device 22. The image pickup device 22 brightly captures the scratch E2 which is regarded as a bright spot.

As a result, in Comparative Example 2, when the film Fa is scratched on the surface of the second film F2 by the friction with the guide roller during the conveyance, the second film F2 is removed from the polarizing element F1a in the final product. In the case where the peeling is performed, the scratch on the surface of the second film F2 which can be regarded as no problem will be erroneously detected as a defect.

Fig. 9 is a view for explaining the defect inspection of the film Fa of the defect inspection system 102 of the second embodiment. In the defect inspection system 102 of the present embodiment, the defect inspection device 105 is disposed in the conveyance line 4, and the surface Sf2 of the polarizing element F1a disposed on the second film F2 other than the bonding drum 3 is first contacted. The upstream side of the roller (for example, the first guide roller 10 in the present embodiment). Fig. 9 is a view showing a state in which a defect E1 exists in the film Fa by rolling in a bubble or the like when the polarizing element F1a and the second film F2 are bonded together. Further, since the film Fa defect is inspected before the second film F2 is scratched, no scratches are formed on the surface of the second film F2.

As shown in Fig. 9, the light ray L1 emitted from the light source 20 toward the film Fa passes through the polarizing element F1a to become linearly polarized light L2. The linearly polarized light L2 obtained by the polarizing element F1a is incident on the second thin film F2. Then, due to the defect E1 existing between the polarizing element F1a and the second film F2, the polarized state of the linearly polarized light L2 is disturbed, and a part of the light (L3) which is disturbed by the polarized state passes through the polarizing filter 123.

As a result, the light L3 that has passed through the polarizing filter 123 is incident on the imaging device 22, and the imaging device 22 brightly captures the defect E1 that is regarded as a bright spot.

On the other hand, in the case where the defect E1 does not exist between the polarizing element F1a and the second film F2, the linearly polarized light L2 cannot penetrate the polarizing filter 123. As a result, since no light is incident on the imaging device 22, the imaging device 22 captures a black image.

As described above, in the present embodiment, since no scratches are formed on the surface of the second film F2, the scratches on the surface of the second film F2 are not erroneously detected as defects.

As described above, according to the present embodiment, the defect inspection device 105 is disposed in the transport line 4, and is disposed on the opposite side of the surface Sf2 of the polarizing element F1a of the second film F2 other than the bonding drum 3. (for example, at the upstream side of the first guide roller 10 in the present embodiment), the film Fa defect is inspected before the second film F2 is scratched. That is, during the conveyance of the film Fa, since the second film F2 does not rub against the guide roller, no scratches are formed on the surface of the second film F2. Therefore, it is possible to suppress false alarms of scratch detection.

In the above, a preferred embodiment of the embodiment will be described with reference to the attached drawings, and it is needless to say that the invention is not limited to the examples. The outer shape and the combination of the constituent elements shown in the above examples are merely examples, and various modifications can be made according to design requirements and the like without departing from the scope of the invention.

1, 101‧‧‧ film manufacturing equipment
2, 102‧‧‧ defect inspection system
3‧‧‧Finishing roller
3a, 3b‧‧‧Clamping roller
4‧‧‧Transfer production line
5, 105‧‧‧ Defect inspection device
6‧‧‧recording device
7‧‧‧First Supply Department
8‧‧‧Second Supply Department
9‧‧‧Winding Department
10‧‧‧First guide roller
11‧‧‧Second guiding roller
12‧‧‧ Third guide roller
20‧‧‧Light source
20a‧‧‧Light exit surface
21‧‧‧First polarizing filter
22‧‧‧Photographing device
22a‧‧‧Glossy surface
23‧‧‧Second polarizing filter
123‧‧‧ polarizing filter
CL‧‧‧ optical axis
E1‧‧‧ Defects
E2‧‧‧Scratch
F‧‧‧film
F1‧‧‧ first film
F1a‧‧‧ polarizing element
F2‧‧‧second film
L1, L3, L4‧‧‧Light
L2‧‧‧linear polarized light
R, R1, R2‧‧‧ Roller
Sf1‧‧‧ face
Sf2‧‧‧ face
SV‧‧‧ overlap
V‧‧‧ absorption axis
V1‧‧‧first absorption axis
V2‧‧‧second absorption axis
Va‧‧‧ absorption axis

Fig. 1 is a side view showing the film manufacturing apparatus of the first embodiment. Fig. 2 is a view showing the arrangement relationship between the first absorption axis of the first polarizing filter and the second absorption axis of the second polarizing filter. Fig. 3 is a plan view showing the defect inspection device of the first embodiment. Fig. 4 is a view for explaining the film defect inspection of the defect inspection system of Comparative Example 1. Fig. 5 is a view for explaining a film defect inspection of the defect inspection system of the first embodiment. Fig. 6 is a side view showing the film manufacturing apparatus of the second embodiment. Fig. 7 is a view showing the arrangement relationship between the absorption axis of the polarizing element and the absorption axis of the polarizing filter. Fig. 8 is a view for explaining the film defect inspection of the defect inspection system of Comparative Example 2. Fig. 9 is a view for explaining a film defect inspection of the defect inspection system of the second embodiment.

1‧‧‧Film manufacturing equipment

2‧‧‧Defect inspection system

3‧‧‧Finishing roller

3a, 3b‧‧‧ clamping drum

4‧‧‧Transfer production line

5‧‧‧ Defect inspection device

6‧‧‧recording device

7‧‧‧First Supply Department

8‧‧‧Second Supply Department

9‧‧‧Winding Department

10‧‧‧First guide roller

11‧‧‧Second guiding roller

12‧‧‧ Third guide roller

20‧‧‧Light source

20a‧‧‧Light exit surface

21‧‧‧First polarizing filter

22‧‧‧Photographing device

22a‧‧‧Glossy surface

23‧‧‧Second polarizing filter

CL‧‧‧ optical axis

F‧‧‧film

F1‧‧‧ first film

F2‧‧‧second film

R, R1, R2‧‧‧ roll drum

Sf1‧‧‧ face

Sf2‧‧‧ face

Claims (4)

A defect inspection system is a defect inspection system having a first film and a strip film releasably laminated on the second film of the first film, comprising: a bonding roller, the first film and the second film The film is bonded to form the film; the transfer line transports the film on the downstream side of the bonding roll; the defect inspection device is disposed on the transfer line; and the recording device is disposed on the downstream side of the defect inspection device of the transfer line Recording, in the film, the defect information related to the defect detected by the defect inspection device; wherein the defect inspection device is disposed in the transfer line and disposed on the first film of the second film other than the bonding roller The upstream side of the roller that is first contacted by the opposite side. The defect inspection system of claim 1, wherein the defect inspection device comprises: a light source disposed on a first film side of the film to illuminate the film; and an imaging device disposed on the film a film on the second film side, the transmitted light image of the film is taken; the first polarizing filter is disposed on the light path between the light source and the film, and has a first absorption axis; and the second polarizing filter is disposed on the film A light path between the imaging device and the film has a second absorption axis orthogonal to the first absorption axis. The defect inspection system of claim 1, wherein: the first film is a polarizing element; and the defect inspection device comprises: a light source disposed on a side of the polarizing element of the film to irradiate the film with light; The imaging device is disposed on the second film side of the film to capture the transmitted light image of the film; and the polarizing filter is disposed on the light path between the imaging device and the film, and has absorption with the polarizing element Axis orthogonal to the axis of absorption. A film manufacturing apparatus comprising the defect inspection system according to any one of claims 1 to 3.