TW201343381A - Laminate and copper-clad laminate using same - Google Patents

Laminate and copper-clad laminate using same Download PDF

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TW201343381A
TW201343381A TW102101922A TW102101922A TW201343381A TW 201343381 A TW201343381 A TW 201343381A TW 102101922 A TW102101922 A TW 102101922A TW 102101922 A TW102101922 A TW 102101922A TW 201343381 A TW201343381 A TW 201343381A
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printed wiring
copper foil
wiring board
copper
clad laminate
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TW102101922A
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Chinese (zh)
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TWI460068B (en
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Hideta Arai
Atsushi Miki
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Jx Nippon Mining & Metals Corp
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • C25D5/028Electroplating of selected surface areas one side electroplating, e.g. substrate conveyed in a bath with inhibited background plating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/627Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • C25D7/0614Strips or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/033 layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/40Symmetrical or sandwich layers, e.g. ABA, ABCBA, ABCCBA
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/408Matt, dull surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/412Transparent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/22Electroplating: Baths therefor from solutions of zinc
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/562Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/58Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • C25D5/14Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0104Properties and characteristics in general
    • H05K2201/0108Transparent
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0154Polyimide

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Laminated Bodies (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

Provided is a surface-treated copper foil for copper-clad laminate, where the copper foil adheres favorably to resin and leaves the resin with outstanding transparency after the copper foil is removed by etching. In the surface-treated copper foil for copper-clad laminate, roughening particles are formed on the surface of the copper foil by means of a roughening treatment. The average roughness (Rz) of the roughening treatment surface is 0.5-1.3 μm. The gloss of the roughening treatment surface is 0.5-68, and the ratio (A/B) of the surface area (A) of the roughening particles to the area (B) obtained when the roughening particles are viewed in plan view from the copper foil surface side, is 2.00-2.45.

Description

覆銅積層板用表面處理銅箔及使用其之覆銅積層板 Surface treated copper foil for copper clad laminate and copper clad laminate using same

本發明係關於一種覆銅積層板用表面處理銅箔及使用其之覆銅積層板,尤其關於一種於要求在蝕刻銅箔後剩餘部分之樹脂的透明性此領域中較佳之覆銅積層板用表面處理銅箔及使用其之覆銅積層板。 The present invention relates to a surface-treated copper foil for a copper-clad laminate and a copper-clad laminate using the same, and more particularly to a copper-clad laminate which is preferable in the field of transparency of a resin which is required to be etched after the copper foil is etched. Surface treated copper foil and copper clad laminate using the same.

對於智慧型手機或平板PC等小型電子機器,因配線之容易性或輕量性,而採用可撓性印刷配線板(以下稱為FPC)。近年來,藉由該等電子機器之高功能化,訊號傳輸速度之高速化不斷發展,亦於FPC中阻抗匹配成為重要之要素。作為因應訊號容量增加之阻抗匹配的方法,正發展有成為FPC之基底之樹脂絕緣層(例如聚醯亞胺)的厚層化。另一方面,FPC係實施對液晶基材之接合或IC晶片之搭載等加工,但此時之對位係隔著透過覆銅積層板之銅箔經蝕刻後剩餘之樹脂絕緣層進行視認的定位圖案來進行,故而樹脂絕緣層之視認性變得重要。 For small electronic devices such as smart phones and tablet PCs, flexible printed wiring boards (hereinafter referred to as FPCs) are used because of the ease of wiring or light weight. In recent years, with the high functionality of these electronic devices, the speed of signal transmission has been increasing, and impedance matching has become an important factor in FPC. As a method of impedance matching in response to an increase in signal capacity, a thick layer of a resin insulating layer (for example, polyimide) which is a base of an FPC has been developed. On the other hand, the FPC is processed such as bonding of a liquid crystal substrate or mounting of an IC wafer, but in this case, the alignment is visually recognized by a resin insulating layer remaining after etching through a copper foil that has passed through the copper clad laminate. Since the pattern is carried out, the visibility of the resin insulating layer becomes important.

又,覆銅積層板亦可使用表面經實施粗化鍍敷之壓延銅箔來製造。該壓延銅箔通常藉由下述方式來製造:使用精銅(氧含量為100~500重量ppm)或無氧銅(氧含量為10重量ppm以下)作為素材,對該等鑄錠進行熱壓延後,重複進行冷壓延與退火直至達到特定厚度為止。於專利文獻1中提出有使用表面光澤度高之低粗糙度電解箔作為導體層。 Further, the copper clad laminate may be produced by using a rolled copper foil whose surface is subjected to rough plating. The rolled copper foil is usually produced by using hot copper (oxygen content of 100 to 500 ppm by weight) or oxygen-free copper (oxygen content of 10 ppm by weight or less) as a material for hot pressing the ingots. After the delay, the cold rolling and annealing are repeated until a certain thickness is reached. Patent Document 1 proposes to use a low-roughness electrolytic foil having a high surface gloss as a conductor layer.

另一方面,於專利文獻2中作為彎曲性優異之銅箔,提出有下述壓延銅箔:藉由油膜控制等條件下之冷壓延步驟所形成之表面上的油坑深度為2.0μm以下。 On the other hand, in Patent Document 2, as a copper foil having excellent flexibility, a rolled copper foil having a depth of sump of 2.0 μm or less on a surface formed by a cold rolling step under conditions such as oil film control has been proposed.

[專利文獻1]日本特開2004-98659號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2004-98659

[專利文獻2]日本特開2001-58203號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2001-58203

於專利文獻1中,藉由黑化處理或鍍敷處理後之有機處理劑來對接著性進行改良處理所得之低粗糙度銅箔於對覆銅積層板要求彎曲性之用途中,存在因疲勞而斷線之情況,有樹脂透視性差之情形。又,即便使用具有專利文獻2中記載之程度的油坑狀態之壓延銅箔,亦無法獲得樹脂之充分的透明性。如此,於先前技術中,藉由蝕刻去除壓延銅箔後之樹脂透視性低,無法順利地進行晶片之對位。 In Patent Document 1, the low-roughness copper foil obtained by the improvement of the adhesiveness by the blackening treatment or the organic treatment agent after the plating treatment is used for the purpose of requiring flexibility for the copper-clad laminate. In the case of disconnection, there is a case where the resin has poor transparency. Further, even if a rolled copper foil having a sump state as described in Patent Document 2 is used, sufficient transparency of the resin cannot be obtained. As described above, in the prior art, the resin after the rolled copper foil is removed by etching has low transparency, and the alignment of the wafer cannot be smoothly performed.

本發明係提供一種與樹脂良好地接著且藉由蝕刻將銅箔去除後之樹脂的透明性優異之覆銅積層基板用銅箔。 The present invention provides a copper foil for a copper-clad laminate substrate which is excellent in transparency of a resin which is excellent in adhesion to a resin and which is removed by etching.

本發明人等反覆潛心研究,結果發現銅箔之與樹脂基板接著之側的表面平均粗糙度Rz對藉由蝕刻而將銅箔去除後之樹脂透明性造成影響。即,發現銅箔之與樹脂基板接著之側的表面平均粗糙度Rz越大,將銅箔蝕刻去除後之樹脂透明性則變得越不良。 As a result of intensive studies, the present inventors have found that the surface average roughness Rz of the side of the copper foil and the resin substrate is affected by the transparency of the resin after the copper foil is removed by etching. In other words, it was found that the larger the surface average roughness Rz of the side of the copper foil and the resin substrate, the worse the resin transparency after etching the copper foil.

以如上之見解為基礎完成之本發明於一態樣中為一種覆銅積層板用表面處理銅箔,其藉由粗化處理而於銅箔表面形成有粗化粒子,粗化處理表面之平均粗糙度Rz為0.5~1.3μm,粗化處理表面之光澤度為0.5~68,上述粗化粒子之表面積A與自上述銅箔表面側平面觀察上述粗化粒子時所得之面積B的比A/B為2.00~2.45。 The present invention, which is based on the above findings, is a surface-treated copper foil for a copper-clad laminate which has roughened particles formed on the surface of the copper foil by roughening treatment, and the average of the roughened surface is obtained. The roughness Rz is 0.5 to 1.3 μm, and the gloss of the roughened surface is 0.5 to 68, and the ratio A of the surface area A of the roughened particles to the area B obtained when the roughened particles are observed from the surface side surface of the copper foil. B is 2.00~2.45.

於本發明之覆銅積層板用表面處理銅箔之一實施形態中,上述平均粗糙度Rz為0.5~1.1μm。 In one embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the average roughness Rz is 0.5 to 1.1 μm.

於本發明之覆銅積層板用表面處理銅箔之另一實施形態中,上述平均粗糙度Rz為0.6~0.9μm。 In another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the average roughness Rz is 0.6 to 0.9 μm.

於本發明之覆銅積層板用表面處理銅箔之又一實施形態中,上述光澤度為1.0~40。 In still another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the gloss is 1.0 to 40.

於本發明之覆銅積層板用表面處理銅箔之又一實施形態中,上述光澤度為4.8~35。 In still another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the gloss is 4.8 to 35.

於本發明之覆銅積層板用表面處理銅箔之又一實施形態中,上述A/B為2.00~2.30。 In still another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the A/B is 2.00 to 2.30.

於本發明之覆銅積層板用表面處理銅箔之又一實施形態中,上述A/B為2.00~2.15。 In still another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the A/B is 2.00 to 2.15.

於使上述銅箔自粗化處理表面側貼合於厚度50μm之樹脂基板的兩面後,當藉由蝕刻而將上述銅箔去除時,上述樹脂基板之透光率成為30%以上。 After the copper foil is bonded to both surfaces of the resin substrate having a thickness of 50 μm from the roughened surface side, when the copper foil is removed by etching, the light transmittance of the resin substrate is 30% or more.

本發明於另一態樣中為一種覆銅積層板,其係將上述表面處理銅箔與樹脂基板積層而構成。 In another aspect, the present invention provides a copper clad laminate which is formed by laminating the surface-treated copper foil and a resin substrate.

本發明於又一態樣中為一種印刷配線板,其使用有本發明之表面處理銅箔。 In still another aspect, the present invention is a printed wiring board using the surface treated copper foil of the present invention.

本發明於又一態樣中為一種電子機器,其使用有本發明之印刷配線板。 In another aspect, the invention is an electronic machine using the printed wiring board of the invention.

本發明於又一態樣中為一種將2個以上本發明之印刷配線板連接,製造連接有2個以上印刷配線板的印刷配線板之方法。 In still another aspect of the invention, there is provided a method of manufacturing a printed wiring board in which two or more printed wiring boards are connected by connecting two or more printed wiring boards of the present invention.

本發明於又一態樣中為一種製造連接有2個以上印刷配線板之印刷配線板的方法,其至少包含將至少一個本發明之印刷配線板與另一個本發明之印刷配線板或並不相當於本發明之印刷配線板的印刷配線板連接之步驟。 In another aspect, the present invention is a method of manufacturing a printed wiring board to which two or more printed wiring boards are connected, comprising at least one printed wiring board of the present invention and another printed wiring board of the present invention or not The step of connecting the printed wiring boards corresponding to the printed wiring board of the present invention.

本發明於又一態樣中為一種電子機器,其使用有1個以上之連接有至少1個本發明之印刷配線板的印刷配線板。 In still another aspect, the present invention is an electronic device using one or more printed wiring boards to which at least one printed wiring board of the present invention is connected.

本發明於又一態樣中為一種製造印刷配線板之方法,其至少包含將本發明之印刷配線板與零件連接的步驟。 In still another aspect, the present invention is a method of manufacturing a printed wiring board comprising at least the step of connecting the printed wiring board of the present invention to a component.

本發明於又一態樣中為一種製造連接有2個以上印刷配線板之印刷配線板的方法,其至少包含下述步驟:將至少1個本發明之印刷配線板與另一個本發明之印刷配線板或並不相當於本發明之印刷配線板的印刷配線板連接之步驟;及將本發明之連接有2個以上印刷配線板的印刷配線板與零件連接之步驟。 In another aspect, the present invention provides a method of manufacturing a printed wiring board to which two or more printed wiring boards are connected, comprising at least one step of printing at least one printed wiring board of the present invention and another printing of the present invention. A wiring board or a step of connecting the printed wiring board which does not correspond to the printed wiring board of the present invention; and a step of connecting the printed wiring board to which the two or more printed wiring boards of the present invention are connected, to the component.

根據本發明,可提供一種與樹脂良好地接著且利用蝕刻將銅箔去除後之樹脂的透明性優異之覆銅積層基板用表面處理銅箔。 According to the present invention, it is possible to provide a surface-treated copper foil for a copper-clad laminate substrate which is excellent in transparency of a resin which is excellent in adhesion to a resin and which is removed by etching.

圖1係視認性評價時之(a)比較例1、(b)實施例1、(c)實施例2、(d)實施例7及(e)實施例3之印刷物的觀察照片。 Fig. 1 is an observation photograph of the printed matter of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7, and (e) Example 3 at the time of visual evaluation.

圖2係Rz評價時之(a)比較例1、(b)實施例1、(c)實施例2、(d)實施例7及(e)實施例3之銅箔表面的SEM觀察照片。 Fig. 2 is a SEM observation photograph of the surface of the copper foil of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7 and (e) Example 3 at the time of Rz evaluation.

(表面處理銅箔之形態及製造方法) (Form of surface treated copper foil and manufacturing method)

本發明中使用之銅箔可為電解銅箔或壓延銅箔中之任一者。通常以於銅箔之與樹脂基材接著之面、即粗化面提昇積層後之銅箔之剝離強度為目的,實施對脫脂後之銅箔表面進行節瘤狀電鍍之粗化處理。電解銅箔於製造時具有凹凸,但藉由粗化處理而使電解銅箔之凸部增強,使凹凸進一步增大。於本發明中,該粗化處理可藉由銅-鈷-鎳合金鍍敷來進行。作為粗化前之預處理,有進行通常之鍍銅等,作為粗化後之精加工處理,亦存在為了防止電鍍物之脫落而進行通常之鍍銅等。亦存在於壓延銅箔與電解銅箔中,使處理之內容略微不同之情況。於本發明中,亦包含如此之預處 理及精加工處理,且視需要將與銅箔粗化有關之公知處理包含在內,統稱為粗化處理。 The copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil. In general, the roughening treatment of the surface of the copper foil after degreasing is performed by the nodular plating for the purpose of improving the peeling strength of the copper foil after the copper foil is adhered to the surface of the resin substrate, that is, the roughened surface. The electrolytic copper foil has irregularities at the time of production, but the convex portion of the electrolytic copper foil is reinforced by the roughening treatment, and the unevenness is further increased. In the present invention, the roughening treatment can be carried out by copper-cobalt-nickel alloy plating. As a pretreatment before roughening, conventional copper plating or the like is performed, and as a roughening finishing treatment, usual copper plating or the like is performed in order to prevent the plating material from falling off. It is also present in the case of rolling copper foil and electrolytic copper foil, so that the contents of the treatment are slightly different. In the present invention, such an advance is also included The processing and the finishing treatment are included, and the known processing relating to the roughening of the copper foil is included as needed, and is collectively referred to as roughening treatment.

本發明中之作為粗化處理之銅-鈷-鎳合金鍍敷可以藉由電鍍而形成附著量為15~40mg/dm2之銅-100~3000μg/dm2之鈷-100~900μg/dm2之鎳之類的3元系合金層之方式來實施。若Co附著量未達100μg/dm2,則存在耐熱性變差,導致蝕刻性變差之情況。若Co附著量超過3000μg/dm2,則於必需考慮磁性影響之情形時變得欠佳,產生蝕刻污斑,且,存在耐酸性及耐化學品性變差之情況。若Ni附著量未達100μg/dm2,則存在耐熱性變差之情況。另一方面,若Ni附著量超過900μg/dm2,則蝕刻殘留變多。較佳之Co附著量為1000~2000μg/dm2,較佳之鎳附著量為200~400μg/dm2。此處,所謂蝕刻污斑係指藉由氯化銅進行蝕刻之情形時,Co不溶解而殘留之情況,而且,所謂蝕刻殘留係指藉由氯化銨進行鹼蝕刻之情形時,Ni不溶解而殘留之情況。 Copper roughening treatment of the present invention as - Co - Ni alloy plating may be formed by a plating deposition amount of 15 ~ 40mg / dm 2 of copper -100 ~ 3000μg / dm 2 of cobalt -100 ~ 900μg / dm 2 It is implemented by means of a ternary alloy layer such as nickel. When the Co adhesion amount is less than 100 μg/dm 2 , the heat resistance is deteriorated, and the etching property is deteriorated. When the amount of Co adhesion exceeds 3000 μg/dm 2 , it is necessary to take into consideration the influence of magnetic influence, and etch stains are generated, and acid resistance and chemical resistance may be deteriorated. If the Ni adhesion amount is less than 100 μg/dm 2 , the heat resistance may be deteriorated. On the other hand, when the Ni adhesion amount exceeds 900 μg/dm 2 , the etching residue increases. Preferably, the Co adhesion amount is 1000 to 2000 μg/dm 2 , and preferably the nickel adhesion amount is 200 to 400 μg/dm 2 . Here, the term "etching stain" refers to a case where Co is not dissolved and is left in the case of etching by copper chloride, and the term "etching residue" refers to a case where alkali etching is performed by ammonium chloride, and Ni is not dissolved. And the residual situation.

用以形成此種3元系銅-鈷-鎳合金鍍敷之普通浴及鍍敷條件之一例係如下所述:鍍浴組成:Cu 10~20g/L、Co 1~10g/L、Ni 1~10g/L An example of a common bath and plating conditions for forming such a ternary copper-cobalt-nickel alloy plating is as follows: plating bath composition: Cu 10-20 g/L, Co 1 10 g/L, Ni 1 ~10g/L

pH:1~4 pH: 1~4

溫度:40~50℃ Temperature: 40~50°C

電流密度Dk:20~30A/dm2 Current density D k : 20~30A/dm 2

鍍敷時間:1~5秒 Plating time: 1~5 seconds

粗化處理後,可於粗化面上形成附著量為200~3000μg/dm2之鈷-100~700μg/dm2之鎳的鈷-鎳合金鍍敷層。該處理於廣泛意義上可視為一種防銹處理。該鈷-鎳合金鍍敷層必需實施至避免銅箔與基板之接著強度實質上降低之程度。若鈷附著量未達200μg/dm2,則存在耐熱剝離強度降低,導致抗氧化性及耐化學品性變差之情況。又,作為另一個 原因,若鈷量少,則導致處理表面變得偏紅,故而不佳。若鈷附著量超過3000μg/dm2,則於必需考慮磁性影響之情形時變得欠佳,產生蝕刻污斑,且,需考慮耐酸性及耐化學品性之變差。較佳之鈷附著量為500~3000μg/dm2。另一方面,若鎳附著量未達100μg/dm2,則耐熱剝離強度降低,抗氧化性及耐化學品性變差。若鎳超過700μg/dm2,則鹼蝕刻性變差。較佳之鎳附著量為200~600μg/dm2After the roughening treatment, a cobalt-nickel alloy plating layer having a cobalt content of from 200 to 3000 μg/dm 2 to 100 to 700 μg/dm 2 of nickel may be formed on the roughened surface. This treatment can be regarded as a rust-proof treatment in a broad sense. The cobalt-nickel alloy plating layer must be applied to such an extent that the adhesion strength between the copper foil and the substrate is substantially reduced. When the cobalt adhesion amount is less than 200 μg/dm 2 , the heat-resistant peel strength is lowered, and the oxidation resistance and chemical resistance are deteriorated. Further, as another reason, if the amount of cobalt is small, the treated surface becomes reddish, which is not preferable. When the cobalt adhesion amount exceeds 3000 μg/dm 2 , it is unfavorable when it is necessary to consider the influence of magnetic properties, and etch stains are generated, and deterioration of acid resistance and chemical resistance is considered. A preferred amount of cobalt adhesion is 500 to 3000 μg/dm 2 . On the other hand, when the nickel adhesion amount is less than 100 μg/dm 2 , the heat-resistant peel strength is lowered, and the oxidation resistance and chemical resistance are deteriorated. If the nickel exceeds 700 μg/dm 2 , the alkali etching property is deteriorated. A preferred nickel adhesion amount is 200 to 600 μg/dm 2 .

又,鈷一鎳合金鍍敷之條件之一例係如下所述:鍍浴組成:Co 1~20g/L、Ni 1~20g/L Further, one example of the conditions of cobalt-nickel alloy plating is as follows: plating bath composition: Co 1~20g/L, Ni 1~20g/L

pH:1.5~3.5 pH: 1.5~3.5

溫度:30~80℃ Temperature: 30~80°C

電流密度Dk:1.0~20.0A/dm2 Current density D k : 1.0~20.0A/dm 2

鍍敷時間:0.5~4秒 Plating time: 0.5~4 seconds

根據本發明,於鈷-鎳合金鍍敷上進而形成附著量為10~80μg/dm2之鋅鍍敷層。若鋅附著量未達10μg/dm2,則存在耐熱劣化率改善效果消失之情況。另一方面,若鋅附著量超過80μg/dm2,則存在耐鹽酸劣化率極端地變差之情況。較佳為,鋅附著量為20~60μg/dm2,更佳為30~50μg/dm2According to the present invention, a zinc plating layer having an adhesion amount of 10 to 80 μg/dm 2 is further formed on the cobalt-nickel alloy plating. When the amount of zinc adhesion is less than 10 μg/dm 2 , the effect of improving the heat deterioration rate may be lost. On the other hand, if the Zn deposition amount exceeds 80μg / dm 2, the situation is extremely deteriorated resistance ratio to hydrochloric acid deterioration of the presence. Preferably, the zinc adhesion amount is 20 to 60 μg/dm 2 , more preferably 30 to 50 μg/dm 2 .

上述鋅鍍敷之條件之一例係如下所述:鍍浴組成:Zn 100~300g/L One example of the above zinc plating conditions is as follows: plating bath composition: Zn 100~300g/L

pH:3~4 pH: 3~4

溫度:50~60℃ Temperature: 50~60°C

電流密度Dk:0.1~0.5A/dm2 Current density D k : 0.1~0.5A/dm 2

鍍敷時間:1~3秒 Plating time: 1~3 seconds

再者,亦可形成鋅-鎳合金鍍敷等鋅合金鍍敷層來取代鋅鍍敷層,進而亦可藉由鉻酸鹽處理或矽烷偶合劑之塗佈等而於最表面形成防 銹層。 Further, a zinc alloy plating layer such as zinc-nickel alloy plating may be formed instead of the zinc plating layer, or may be formed on the outermost surface by a chromate treatment or a coating of a decane coupling agent. Rust layer.

又,本發明之表面處理銅箔係亦可於銅箔表面預先形成銅之一次粒子層後,於一次粒子層上形成由三元系合金構成之二次粒子層,而作為粗化處理,其中,上述三元系合金係由銅、鈷及鎳構成。於此情形時,銅之一次粒子之鍍敷條件之一例係如下所述:鍍浴組成:Cu 10~25g/L、硫酸50~100g/L Further, in the surface-treated copper foil of the present invention, a secondary particle layer of copper may be formed on the surface of the copper foil, and a secondary particle layer composed of a ternary alloy may be formed on the primary particle layer as a roughening treatment. The ternary alloy is composed of copper, cobalt and nickel. In this case, one of the plating conditions of the primary particles of copper is as follows: plating bath composition: Cu 10~25g/L, sulfuric acid 50~100g/L

溫度:25~50℃ Temperature: 25~50°C

電流密度Dk:10~70A/dm2 Current density D k : 10~70A/dm 2

鍍敷時間:5~25秒 Plating time: 5~25 seconds

庫侖量50~500As/dm2 Coulomb amount 50~500As/dm 2

二次粒子之鍍敷條件之一例係如下所述:鍍浴組成:Cu 10~20g/L、鎳5~15g/L、鈷5~15g/L One example of the plating conditions of the secondary particles is as follows: plating bath composition: Cu 10~20g/L, nickel 5~15g/L, cobalt 5~15g/L

pH:2~3 pH: 2~3

溫度:30~50℃ Temperature: 30~50°C

電流密度Dk:20~60A/dm2 Current density D k : 20~60A/dm 2

鍍敷時間:1~5秒 Plating time: 1~5 seconds

庫侖量30~70As/dm2 Coulomb amount 30~70As/dm 2

(表面粗糙度Rz) (surface roughness Rz)

本發明之表面處理銅箔係藉由粗化處理而於銅箔表面形成粗化粒子,且,粗化處理表面之平均粗糙度Rz為0.5~1.3μm。藉由如此之構成,剝離強度變高,與樹脂良好地接著,且,藉由蝕刻而將銅箔去除後之樹脂之透光性變得良好。其結果,經由透過該樹脂進行視認之定位圖案而進行之IC晶片搭載時之對位等變得容易。若平均粗糙度Rz未達0.5μm,則銅箔表面之粗化處理不充分,無法充分地與樹脂接著。另一方面,若平均粗糙度Rz超過1.3μm,則藉由蝕刻而將銅箔去除後之樹脂表面之凹凸變大,其結果, 樹脂之透光性變得不良。粗化處理表面之平均粗糙度Rz較佳為0.5~1.1μm,更佳為0.6~0.9μm。 In the surface-treated copper foil of the present invention, roughened particles are formed on the surface of the copper foil by roughening treatment, and the average roughness Rz of the roughened surface is 0.5 to 1.3 μm. With such a configuration, the peeling strength is increased, and the resin is satisfactorily adhered to, and the light transmittance of the resin after the copper foil is removed by etching is improved. As a result, alignment or the like at the time of mounting the IC wafer via the positioning pattern that is visually recognized by the resin is facilitated. When the average roughness Rz is less than 0.5 μm, the roughening treatment of the surface of the copper foil is insufficient, and it is not possible to sufficiently adhere to the resin. On the other hand, when the average roughness Rz exceeds 1.3 μm, the unevenness of the surface of the resin after the copper foil is removed by etching is increased, and as a result, The light transmittance of the resin becomes poor. The average roughness Rz of the roughened surface is preferably from 0.5 to 1.1 μm, more preferably from 0.6 to 0.9 μm.

(透光率) (Transmittance)

本發明之表面處理銅箔係如上所述,粗化處理表面之平均粗糙度Rz得到控制,故而貼合於樹脂基板後,銅箔經去除之部分之樹脂基板的透光率變得良好。具體而言,本發明之表面處理銅箔係自粗化處理表面側貼合於厚度50μm之樹脂基板之兩面後,於藉由蝕刻將該銅箔去除時,樹脂基板之透光率可為30%以上,較佳為50%以上。 Since the surface-treated copper foil of the present invention has the average roughness Rz of the roughened surface as described above, the light transmittance of the resin substrate on which the copper foil is removed is good after being bonded to the resin substrate. Specifically, the surface-treated copper foil of the present invention is bonded to the both sides of the resin substrate having a thickness of 50 μm from the roughened surface side, and when the copper foil is removed by etching, the light transmittance of the resin substrate can be 30. More than %, preferably more than 50%.

(光澤度) (Gloss)

表面處理銅箔之粗化面之光澤度係對上述樹脂之透光率造成極大影響。即,粗化面之光澤度越大之銅箔,上述樹脂之穿透率越良好。因此,本發明之表面處理銅箔係粗化面之光澤度為0.5~68,較佳為1.0~40,更佳為4.8~35。 The gloss of the roughened surface of the surface treated copper foil greatly affects the light transmittance of the above resin. That is, the copper foil having a higher glossiness of the roughened surface has a better penetration rate of the above resin. Therefore, the surface treated copper foil of the present invention has a gloss of 0.5 to 68, preferably 1.0 to 40, more preferably 4.8 to 35.

(粒子之表面積) (surface area of particles)

粗化粒子之表面積A與自銅箔表面側平面觀察粗化粒子時所得之面積B的比A/B對上述之樹脂透光率造成較大影響。即,若表面粗糙度Rz相同,則比A/B越小之銅箔,上述樹脂之穿透率越良好。因此,本發明之表面處理銅箔係該比A/B為2.00~2.45,較佳為2.00~2.30,更佳為2.00~2.15。 The ratio A/B of the surface area A of the roughened particles to the area B obtained when the roughened particles are observed from the surface side of the copper foil surface has a large influence on the light transmittance of the above resin. That is, when the surface roughness Rz is the same, the copper foil having a smaller A/B ratio has a better transmittance of the resin. Therefore, the surface treated copper foil of the present invention has a ratio A/B of 2.00 to 2.45, preferably 2.00 to 2.30, more preferably 2.00 to 2.15.

可藉由控制粒子形成時之電流密度與鍍敷時間,而決定粒子之形態或形成密度,且控制上述表面粗糙度Rz、光澤度及粒子之面積比A/B。 The morphology or formation density of the particles can be determined by controlling the current density at the time of particle formation and the plating time, and the surface roughness Rz, the glossiness, and the area ratio A/B of the particles can be controlled.

可將本發明之表面處理銅箔自粗化處理面側貼合於樹脂基板,製造覆銅積層體。樹脂基板若為具有可應用於印刷配線板等之特性者,則並不受特別限制,例如對於硬質PWB用途,可使用紙基材酚樹脂、紙基材環氧樹脂、合成纖維布基材環氧樹脂、玻璃布-紙複合基材環氧樹脂、玻璃布-玻璃不織布複合基材環氧樹脂及玻璃布基材環氧樹脂等,且對於 FPC用途,可使用聚酯膜或聚醯亞胺膜等。 The surface-treated copper foil of the present invention can be bonded to the resin substrate from the roughened surface side to produce a copper clad laminate. The resin substrate is not particularly limited as long as it has characteristics suitable for use in a printed wiring board or the like. For example, for a rigid PWB application, a paper substrate phenol resin, a paper substrate epoxy resin, or a synthetic fiber cloth substrate ring can be used. Oxygen resin, glass cloth-paper composite substrate epoxy resin, glass cloth-glass non-woven composite substrate epoxy resin, glass cloth substrate epoxy resin, etc. For FPC use, a polyester film or a polyimide film can be used.

貼合之方法於硬質PWB用途之情形時,準備預浸物,該預浸物係使玻璃布等基材含浸樹脂,使樹脂硬化至半硬化狀態為止。可藉由使銅箔自被覆層之相反側之面疊合於預浸物並進行加熱加壓而實施。 In the case of hard PWB use, a prepreg is prepared in which a substrate such as a glass cloth is impregnated with a resin to cure the resin to a semi-hardened state. This can be carried out by laminating the surface of the copper foil from the opposite side of the coating layer to the prepreg and heating and pressing it.

本發明之覆銅積層體可使用於各種印刷配線板(PWB),並無特別限定,但例如就導體圖案之層數之觀點而言,可應用於單面PWB、雙面PWB、多層PWB(3層以上),且就絕緣基板材料之種類之觀點而言,可應用於硬質PWB、可撓性PWB(FPC)、硬質/撓性PWB。 The copper-clad laminate of the present invention can be used for various printed wiring boards (PWB), and is not particularly limited. For example, from the viewpoint of the number of layers of the conductor pattern, it can be applied to a single-sided PWB, a double-sided PWB, or a multilayer PWB ( Three or more layers are applicable to hard PWB, flexible PWB (FPC), and hard/flexible PWB from the viewpoint of the type of the insulating substrate material.

(積層板及使用其之印刷配線板之定位方法) (Layering board and positioning method using the printed wiring board using the same)

對進行本發明之表面處理銅箔與樹脂基板之積層板之定位之方法進行說明。首先,準備表面處理銅箔與樹脂基板之積層板。作為本發明之表面處理銅箔與樹脂基板之積層板之具體例,可列舉下述方式製作之積層板:於由本體基板、附屬之電路基板、用於將該等電性連接之可撓性印刷基板構成之電子機器中,使可撓性印刷基板準確地定位壓接於該本體基板及附屬之電路基板的配線端部,其中,該可撓性印刷基板係於聚醯亞胺等樹脂基板之至少一表面形成有銅配線。即,若為此種情形,則積層板成為藉由壓接而使可撓性印刷基板及本體基板之配線端部貼合之積層體,或藉由壓接而使可撓性印刷基板及電路基板之配線端部貼合之積層板。積層板具有由該銅配線之一部分或其他材料形成之標記。關於標記之位置,只要為可藉由CCD攝影機等攝影手段穿過構成該積層板之樹脂進行攝影之位置,則並無特別限定。此處,所謂標記係指用於檢測積層板或印刷配線板等之位置或進行定位、或者進行對位之記號(標誌)。 A method of positioning the laminated sheet of the surface-treated copper foil and the resin substrate of the present invention will be described. First, a laminate of a surface-treated copper foil and a resin substrate is prepared. Specific examples of the laminated sheet of the surface-treated copper foil and the resin substrate of the present invention include a laminated board produced by the main substrate, the attached circuit board, and the flexibility for electrically connecting the same. In an electronic device having a printed circuit board, the flexible printed circuit board is accurately positioned and pressed against the wiring end portion of the main body substrate and the attached circuit board, wherein the flexible printed circuit board is a resin substrate such as polyimide. At least one surface is formed with a copper wiring. In other words, in this case, the laminated board is a laminated body in which the wiring end portions of the flexible printed circuit board and the main substrate are bonded by pressure bonding, or the flexible printed circuit board and the circuit are bonded by pressure bonding. A laminated board to which the wiring ends of the substrate are bonded. The laminate has indicia formed from a portion of the copper wiring or other material. The position of the mark is not particularly limited as long as it can be photographed by a resin such as a CCD camera through the resin constituting the laminate. Here, the mark refers to a mark (mark) for detecting the position or positioning of a laminated board, a printed wiring board, or the like.

於以此方式準備之積層板中,若藉由攝影手段穿過樹脂對上述標記進行攝影,則可良好地檢測上述標記之位置。而且,可以此種方式檢測上述標記之位置,且基於上述經檢測之標記之位置,可良好地進行表 面處理銅箔與樹脂基板之積層板的定位。又,於使用印刷配線板作為積層板之情形,攝影手段亦可同樣地利用此種定位方法來良好地檢測標記之位置,從而更正確地進行印刷配線板之定位。 In the laminate prepared in this manner, if the mark is photographed by a photographing means through the resin, the position of the mark can be satisfactorily detected. Moreover, the position of the mark can be detected in such a manner, and based on the position of the detected mark, the table can be performed well. The surface of the laminate of the copper foil and the resin substrate is treated. Further, in the case where a printed wiring board is used as the laminated board, the photographing means can similarly detect the position of the mark by such a positioning method, thereby more accurately positioning the printed wiring board.

因此,認為於將一個印刷配線板與另一個印刷配線板連接時,連接不良減少,良率提昇。再者,作為將一個印刷配線板與另一個印刷配線板連接之方法,可使用經由焊接或異向性導電膜(Anisotropic Conductive Film,ACF)之連接、經由異向性導電膏(Anisotropic Conductive Paste,ACP)之連接或經由具有導電性之接著劑之連接等公知之連接方法。再者,於本發明中,使「印刷配線板」中亦含有安裝有零件之印刷配線板、印刷電路板及印刷基板。又,可將本發明之印刷配線板連接2個以上,製造連接有2個以上印刷配線板之印刷配線板,又,亦可將至少1個本發明之印刷配線板與另一個本發明之印刷配線板或並不相當於本發明之印刷配線板的印刷配線板連接,使用此種印刷配線板製造電子機器。再者,於本發明中,使「銅電路」中亦含有銅配線。進而,亦可將本發明之印刷配線板與零件連接而製造印刷配線板。又,亦可將至少1個本發明之印刷配線板與另一個本發明之印刷配線板或並不相當於本發明之印刷配線板的印刷配線板連接,進而,將本發明之連接有2個以上印刷配線板的印刷配線板與零件連接,藉此,製造連接有2個以上印刷配線板之印刷配線板。此處,作為「零件」,可列舉連接器或LCD(Liquid Crystal Display,液晶顯示器)、LCD中使用之玻璃基板等電子零件;包含IC(Integrated Circuit,積體電路)、LSI(Large scale integrated circuit,大型積體電路)、VLSI(Very Large scale integrated circuit,超大型積體電路)、及ULSI(Ultra-Large Scale Integration,極大型積體電路)等半導體積體電路之電子零件(例如IC晶片、LSI晶片、VLSI晶片、ULSI晶片);用以自電磁波等屏蔽(保護)電子電路之零件及將遮罩等固定於印刷配線板所需之零件等。 Therefore, it is considered that when one printed wiring board is connected to another printed wiring board, connection failure is reduced and the yield is improved. Further, as a method of connecting one printed wiring board to another printed wiring board, a connection via solder or an anisotropic conductive film (ACF) or an anisotropic conductive paste (Anisotropic Conductive Paste) can be used. A known connection method such as connection of ACP) or connection via a conductive adhesive. Further, in the present invention, the "printed wiring board" also includes a printed wiring board on which components are mounted, a printed circuit board, and a printed circuit board. Further, two or more printed wiring boards of the present invention may be connected to each other to manufacture a printed wiring board to which two or more printed wiring boards are connected, and at least one printed wiring board of the present invention and another printing of the present invention may be used. A wiring board or a printed wiring board which does not correspond to the printed wiring board of the present invention is connected, and an electronic device is manufactured using such a printed wiring board. Furthermore, in the present invention, the copper wiring is also included in the "copper circuit". Further, the printed wiring board of the present invention can be connected to a component to manufacture a printed wiring board. Further, at least one of the printed wiring boards of the present invention may be connected to another printed wiring board of the present invention or a printed wiring board which does not correspond to the printed wiring board of the present invention, and further, the connection of the present invention is two. The printed wiring board of the above printed wiring board is connected to the component, whereby a printed wiring board in which two or more printed wiring boards are connected is manufactured. Here, examples of the "parts" include electronic components such as a connector, an LCD (Liquid Crystal Display), and a glass substrate used in an LCD, and include an IC (Integrated Circuit) and an LSI (Large scale integrated circuit). Electronic components such as IC chips, large-scale integrated circuits, VLSI (Very Large Scale Integrated Circuit), and ULSI (Ultra-Large Scale Integration) LSI wafer, VLSI wafer, ULSI wafer); components for shielding (protecting) electronic circuits from electromagnetic waves, etc., and parts required for fixing a mask or the like to a printed wiring board.

再者,本發明之實施形態之定位方法亦可包含使積層板(包含銅箔與樹脂基板之積層板或印刷配線板)移動之步驟。於移動步驟中,例如可利用帶式輸送機或鏈式輸送機等輸送機進行移動,亦可利用具備支臂機構之移動裝置進行移動,亦可利用藉由使用氣體使積層板浮動而移動之移動裝置或移動手段而移動,亦可藉由使大致圓筒形等之物體旋轉而使積層板移動之移動裝置或移動手段(包含輥或軸承等)、以油壓為動力源之移動裝置或移動手段、以氣壓為動力源之移動裝置或移動手段、以馬達為動力源之移動裝置或移動手段、及具有支架移動型線性導引平台、支架移動型空氣導引平台、堆疊型線性導引平台及線性馬達驅動平台等平台之移動裝置或移動手段而移動。又,亦可實施公知之移動手段之移動步驟。 Furthermore, the positioning method according to the embodiment of the present invention may include a step of moving a laminate (including a laminate of a copper foil and a resin substrate or a printed wiring board). In the moving step, for example, it can be moved by a conveyor such as a belt conveyor or a chain conveyor, or moved by a moving device having an arm mechanism, or moved by floating the laminated plate by using a gas. a mobile device or a moving means, or a moving device or a moving means (including a roller or a bearing) that moves a laminated plate by rotating an object such as a substantially cylindrical shape, a moving device that uses a hydraulic pressure as a power source, or Moving means, moving device or moving means using air pressure as power source, moving device or moving means using motor as power source, and linear guiding platform with bracket moving type, bracket moving air guiding platform, stacked linear guiding The mobile device or moving means of the platform such as the platform and the linear motor drive platform moves. Further, a moving step of a known moving means can be performed.

再者,本發明之實施形態之定位方法亦可用於表面構裝機或晶片裝載器(Chip Mounter)。 Furthermore, the positioning method of the embodiment of the present invention can also be applied to a surface mounter or a chip mounter.

又,本發明中經定位之表面處理銅箔與樹脂基板之積層板亦可為具有樹脂板及設置於上述樹脂板上之電路的印刷配線板。又,此情形時,上述標記亦可為上述電路。 Further, the laminated board of the surface-treated copper foil and the resin substrate which are positioned in the present invention may be a printed wiring board having a resin board and a circuit provided on the resin board. Moreover, in this case, the above-mentioned mark may be the above circuit.

於本發明中所謂「定位」係包含「檢測標記或物體之位置之情形」。又,於本發明中,所謂「對位」係包含「於檢測標記或物體之位置後,基於上述檢測之位置,使該標記或物體移動至特定之位置之情形」。 In the present invention, "positioning" includes "the case of detecting the position of a mark or an object". Further, in the present invention, the "alignment" includes a case where the marker or the object is moved to a specific position based on the detected position after detecting the position of the marker or the object.

[實施例] [Examples]

作為實施例1~15及比較例1~8,係準備銅箔,於一表面,以表1~4中記載之條件進行鍍敷處理作為粗化處理。此處,使用JX日鑛日石金屬公司製精銅(JIS H3100 C1100R)之壓延銅箔作為實施例1~12、比較例2~6、8之銅箔。又,使用JX日鑛日石金屬公司製電解銅箔HLPLC箔作為實施例13~15、比較例1、7之銅箔。 In Examples 1 to 15 and Comparative Examples 1 to 8, copper foil was prepared, and plating treatment was performed on one surface under the conditions described in Tables 1 to 4 as a roughening treatment. Here, the rolled copper foil of the fine copper (JIS H3100 C1100R) manufactured by JX Nippon Mining & Metal Co., Ltd. was used as the copper foils of Examples 1 to 12 and Comparative Examples 2 to 6, 8. Further, an electrolytic copper foil HLPLC foil manufactured by JX Nippon Mining & Metal Co., Ltd. was used as the copper foils of Examples 13 to 15 and Comparative Examples 1 and 7.

對於以如上方式製作之實施例及比較例之各樣品,按照下述方式進行各種評價。 Each of the samples of the examples and comparative examples produced as described above was subjected to various evaluations as follows.

(1)表面粗糙度(Rz)之測定; (1) Determination of surface roughness (Rz);

使用小阪研究所股份有限公司製接觸粗糙度計SP-11,依據JIS B0601-1994對粗化面測定十點平均粗糙度。以測定基準長度0.8mm、評價長度4mm、截斷值0.8mm、搬送速度0.1mm/秒之條件,與壓延方向平行地改變測定位置,進行10次,求出10次測定中之值。 The ten-point average roughness of the roughened surface was measured in accordance with JIS B0601-1994 using a contact roughness meter SP-11 manufactured by Kosaka Research Institute Co., Ltd. The measurement position was changed in parallel with the rolling direction under the conditions of a measurement reference length of 0.8 mm, an evaluation length of 4 mm, a cutoff value of 0.8 mm, and a conveyance speed of 0.1 mm/sec, and the measurement was performed ten times to obtain the value in ten measurements.

(2)粒子之面積比(A/B); (2) area ratio of particles (A/B);

粗化粒子之表面積係使用雷射顯微鏡進行之測定法。使用KEYENCE股份有限公司製雷射顯微鏡VK8500,對粗化處理面之相當於100×100μm之面積(於真實資料中為9924.4μm2)中之三維表面積A進行測定,且藉由三維表面積A÷二維表面積B=面積比(A/B)之方法進行設定。 The surface area of the roughened particles is determined using a laser microscope. The three-dimensional surface area A in the area equivalent to 100 × 100 μm (9924.4 μm 2 in the actual data) of the roughened surface was measured using a laser microscope VK8500 manufactured by KEYENCE Co., Ltd., and by a three-dimensional surface area A ÷ The method of dimension surface area B = area ratio (A/B) is set.

(3)光澤度; (3) glossiness;

使用依據JIS Z8741之日本電色股份有限公司製光澤度計便攜式光澤計PG-1,以與壓延方向呈直角之方向的入射角60度對粗化面進行測定。 The roughened surface was measured at an incident angle of 60 degrees in a direction perpendicular to the rolling direction using a gloss meter portable gloss meter PG-1 manufactured by Nippon Denshoku Co., Ltd. according to JIS Z8741.

(4)透光率; (4) light transmittance;

使銅箔貼合於附有層壓用熱硬化性接著劑之聚醯亞胺膜(厚度50μm)之兩面,藉由蝕刻(三氯化鐵水溶液)而將銅箔去除,製成樣品膜。對所得之樹脂層,使用日本分光股份有限公司製分光光度計V-660,藉由狹縫10mm且波長620nm之設定來測定透光率。 The copper foil was bonded to both surfaces of a polyimide film (thickness: 50 μm) to which a thermosetting adhesive for lamination was applied, and the copper foil was removed by etching (aqueous solution of ferric chloride) to prepare a sample film. The obtained resin layer was measured using a spectrophotometer V-660 manufactured by JASCO Corporation, and the light transmittance was measured by setting a slit of 10 mm and a wavelength of 620 nm.

(5)視認性(樹脂透明性); (5) visibility (resin transparency);

使銅箔貼合於附有層壓用熱硬化性接著劑之聚醯亞胺膜(厚度50μm)之兩面,藉由蝕刻(二氯化鐵水溶液)而將銅箔去除,製成樣品膜。於所得之樹脂層之一面黏貼印刷物,自相反面穿過樹脂層對印刷物之視認性進行判定。將印刷物之輪廓清晰者評價為「○」(合格),將輪廓變形者評價為「×」(不合格)。 The copper foil was bonded to both surfaces of a polyimide film (thickness: 50 μm) to which a thermosetting adhesive for lamination was applied, and the copper foil was removed by etching (aqueous solution of ferric chloride) to prepare a sample film. The printed matter is adhered to one side of the obtained resin layer, and the visibility of the printed matter is determined from the opposite side through the resin layer. The outline of the printed matter was evaluated as "○" (passed), and the profile deformed was evaluated as "x" (failed).

(6)剝離強度(接著強度); (6) peel strength (follow strength);

依據PC-TM-650,藉由拉伸試驗機AUTOGRAPH100,測定常態剝離強度,將上述常態剝離強度為0.7N/mm以上者作為可用於覆銅積層基板用途者。 According to PC-TM-650, the normal peel strength was measured by a tensile tester AUTOGRAPH 100, and the normal peel strength of 0.7 N/mm or more was used as a substrate for a copper clad laminate.

再者,於印刷配線板或覆銅積層板中,可藉由溶解去除樹脂,而對銅電路或銅箔表面,測定上述(1)表面粗糙度(Rz)、(2)粒子之面積比(A/B)、及(3)光澤度。 Further, in the printed wiring board or the copper clad laminate, the surface roughness (Rz) and the area ratio of the particles (2) can be measured on the surface of the copper circuit or the copper foil by dissolving and removing the resin ( A/B), and (3) gloss.

將上述各試驗之條件及評價示於表5中。 The conditions and evaluation of each of the above tests are shown in Table 5.

(評價結果) (Evaluation results)

實施例1~15係穿透率、視認性及剝離強度均為良好。 The penetration rates, visibility, and peel strength of Examples 1 to 15 were all good.

比較例1、2、5係粗化處理表面之平均粗糙度Rz超過1.3μm,故穿透率不良。 In Comparative Examples 1, 2, and 5, the average roughness Rz of the roughened surface exceeded 1.3 μm, so the transmittance was poor.

比較例3係光澤度超過68,故剝離強度不良。 In Comparative Example 3, the glossiness exceeded 68, so the peel strength was poor.

比較例4係面積比A/B未達2.00,故剝離強度不良。 In Comparative Example 4, the area ratio A/B was less than 2.00, so the peel strength was poor.

比較例6係粗化處理表面之平均粗糙度Rz未達0.5μm,故剝離強度不良。 In Comparative Example 6, the average roughness Rz of the roughened surface was less than 0.5 μm, so the peel strength was poor.

比較例7係光澤度未達0.5,故穿透率不良。 In Comparative Example 7, the glossiness was less than 0.5, so the transmittance was poor.

比較例8係面積比A/B超過2.45,故穿透率不良。 In Comparative Example 8, the area ratio A/B exceeded 2.45, so the transmittance was poor.

於圖1中分別表示上述視認性評價時之(a)比較例1、(b)實施例1、(c)實施例2、(d)實施例7及(e)實施例3之印刷物之觀察照片。 Fig. 1 shows the observations of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7 and (e) Example 3 at the time of the above-mentioned visibility evaluation. photo.

於圖2中分別表示上述Rz評價時之(a)比較例1、(b)實施例1、(c)實施例2、(d)實施例7及(e)實施例3之銅箔表面之SEM觀察照片。 Fig. 2 shows the surface of the copper foil of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7 and (e) Example 3 in the above Rz evaluation. SEM observation photos.

Claims (17)

一種覆銅積層板用表面處理銅箔,其係藉由粗化處理而於銅箔表面形成有粗化粒子,粗化處理表面之平均粗糙度Rz為0.5~1.3μm,粗化處理表面之光澤度為0.5~68,該粗化粒子之表面積A與自該銅箔表面側平面觀察該粗化粒子時所得之面積B的比A/B為2.00~2.45。 A surface-treated copper foil for a copper-clad laminate, wherein coarsened particles are formed on the surface of the copper foil by roughening treatment, and an average roughness Rz of the roughened surface is 0.5 to 1.3 μm, and the surface is roughened The ratio A/B of the surface area A of the roughened particles and the area B obtained by observing the roughened particles from the plane of the surface of the copper foil is from 2.00 to 2.45. 如申請專利範圍第1項之覆銅積層板用表面處理銅箔,其中,該平均粗糙度Rz為0.5~1.1μm。 The surface-treated copper foil for a copper-clad laminate according to the first aspect of the invention, wherein the average roughness Rz is 0.5 to 1.1 μm. 如申請專利範圍第2項之覆銅積層板用表面處理銅箔,其中,該平均粗糙度Rz為0.6~0.9μm。 The surface-treated copper foil for a copper-clad laminate according to the second aspect of the invention, wherein the average roughness Rz is 0.6 to 0.9 μm. 如申請專利範圍第1項之覆銅積層板用表面處理銅箔,其中,該光澤度為1.0~40。 The surface-treated copper foil for a copper-clad laminate according to the first aspect of the invention, wherein the gloss is 1.0 to 40. 如申請專利範圍第4項之覆銅積層板用表面處理銅箔,其中,該光澤度為4.8~35。 A surface-treated copper foil for a copper-clad laminate according to the fourth aspect of the invention, wherein the gloss is 4.8 to 35. 如申請專利範圍第1項之覆銅積層板用表面處理銅箔,其中,該A/B為2.00~2.30。 The surface-treated copper foil for a copper-clad laminate according to the first aspect of the patent application, wherein the A/B is 2.00 to 2.30. 如申請專利範圍第6項之覆銅積層板用表面處理銅箔,其中,該A/B為2.00~2.15。 A surface-treated copper foil for a copper-clad laminate according to claim 6 wherein the A/B is 2.00 to 2.15. 如申請專利範圍第1項之覆銅積層板用表面處理銅箔,其中,於使該銅箔自粗化處理表面側貼合於厚度50μm之樹脂基板之兩面後,當藉由蝕刻而將該銅箔去除時,該樹脂基板之透光率成為30%以上。 The surface-treated copper foil for a copper-clad laminate according to the first aspect of the invention, wherein the copper foil is bonded to both sides of a resin substrate having a thickness of 50 μm from the roughened surface side, and then When the copper foil is removed, the light transmittance of the resin substrate is 30% or more. 一種覆銅積層板,其係將申請專利範圍第1至8項中任一項之表面處理銅箔與樹脂基板積層而構成。 A copper-clad laminate comprising a surface-treated copper foil according to any one of claims 1 to 8 and a resin substrate. 一種印刷配線板,其使用有申請專利範圍第1至8項中任一項之表面處理銅箔。 A printed wiring board using the surface-treated copper foil according to any one of claims 1 to 8. 一種電子機器,其使用有申請專利範圍第10項之印刷配線板。 An electronic machine using the printed wiring board of claim 10 of the patent application. 一種製造連接有2個以上印刷配線板之印刷配線板的方法,其係將2個以上申請專利範圍第10項之印刷配線板連接。 A method of manufacturing a printed wiring board in which two or more printed wiring boards are connected, which is a method of connecting two or more printed wiring boards of claim 10 of the patent application. 一種製造連接有2個以上印刷配線板之印刷配線板的方法,其至少包含將至少1個申請專利範圍第10項之印刷配線板與另一個申請專利範圍第10項之印刷配線板或並不相當於申請專利範圍第10項之印刷配線板的印刷配線板連接之步驟。 A method of manufacturing a printed wiring board to which two or more printed wiring boards are connected, comprising at least one printed wiring board of claim 10 and another printed wiring board of claim 10 or not The step of connecting the printed wiring board of the printed wiring board of claim 10 of the patent application. 一種電子機器,其使用有1個以上連接有至少1個申請專利範圍第12項之印刷配線板的印刷配線板。 An electronic device using one or more printed wiring boards to which at least one printed wiring board of claim 12 is connected. 一種電子機器,其使用有1個以上連接有至少1個申請專利範圍第13項之印刷配線板的印刷配線板。 An electronic device using one or more printed wiring boards to which at least one printed wiring board of claim 13 is connected. 一種製造印刷配線板之方法,其至少包含將申請專利範圍第10項之印刷配線板與零件連接之步驟。 A method of manufacturing a printed wiring board comprising at least the step of connecting a printed wiring board of claim 10 to a component. 一種製造連接有2個以上印刷配線板之印刷配線板的方法,其至少包含下述步驟:將至少1個申請專利範圍第10項之印刷配線板與另一個申請專利範圍第10項之印刷配線板或並不相當於申請專利範圍第10項之印刷配線板的印刷配線板連接之步驟;及將申請專利範圍第10項之印刷配線板或申請專利範圍第13項之連接有2個以上印刷配線板的印刷配線板與零件連接之步驟。 A method of manufacturing a printed wiring board to which two or more printed wiring boards are connected, comprising at least one step of printing at least one printed wiring board of claim 10 and printing wiring of another application patent item 10 The board is not equivalent to the step of connecting the printed wiring board of the printed wiring board of claim 10; and the connection of the printed wiring board of claim 10 or the connection of the patent application section 13 has two or more printing The step of connecting the printed wiring board of the wiring board to the parts.
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Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101623667B1 (en) * 2011-11-04 2016-05-23 제이엑스 킨조쿠 가부시키가이샤 Copper foil for printed circuit
JP6166614B2 (en) * 2013-07-23 2017-07-19 Jx金属株式会社 Surface-treated copper foil, copper foil with carrier, substrate, printed wiring board, printed circuit board, copper-clad laminate, and printed wiring board manufacturing method
JP6335449B2 (en) * 2013-07-24 2018-05-30 Jx金属株式会社 Copper foil with carrier, method for producing copper-clad laminate and method for producing printed wiring board
JP5706026B1 (en) * 2013-07-30 2015-04-22 古河電気工業株式会社 Copper foil for wiring board and wiring board
JP5885790B2 (en) * 2013-08-20 2016-03-15 Jx金属株式会社 Surface treated copper foil and laminated board using the same, copper foil with carrier, printed wiring board, electronic device, method for manufacturing electronic device, and method for manufacturing printed wiring board
JP5885791B2 (en) * 2013-08-20 2016-03-15 Jx金属株式会社 Surface-treated copper foil and laminate using the same, copper foil with carrier, copper foil, printed wiring board, electronic device, method for manufacturing electronic device, and method for manufacturing printed wiring board
JP6343205B2 (en) * 2013-08-21 2018-06-13 Jx金属株式会社 Copper foil with carrier and laminate manufacturing method using the same, printed wiring board, electronic device, printed wiring board manufacturing method, and electronic device manufacturing method
JP5870148B2 (en) * 2013-11-27 2016-02-24 Jx金属株式会社 Copper foil with carrier, method for producing printed circuit board, copper-clad laminate, method for producing copper-clad laminate, and method for producing printed wiring board
JP5756547B1 (en) 2014-04-28 2015-07-29 株式会社Shカッパープロダクツ Surface-treated copper foil and laminate
JP6297011B2 (en) * 2014-08-28 2018-03-20 株式会社有沢製作所 Three-layer flexible metal-clad laminate and double-sided three-layer flexible metal-clad laminate
JP5728118B1 (en) * 2014-09-22 2015-06-03 株式会社Shカッパープロダクツ Surface-treated copper foil, method for producing the surface-treated copper foil, and copper-clad laminate using the surface-treated copper foil
JP2016121394A (en) * 2014-12-23 2016-07-07 エル エス エムトロン リミテッドLS Mtron Ltd. Electrolytic copper foil, and fccl and ccl including the same
KR101897474B1 (en) * 2015-06-26 2018-09-12 케이씨에프테크놀로지스 주식회사 Electrolytic copper foil for lithium secondary battery and Lithium secondary battery comprising the same
JP6782561B2 (en) * 2015-07-16 2020-11-11 Jx金属株式会社 Copper foil with carrier, laminate, manufacturing method of laminate, manufacturing method of printed wiring board and manufacturing method of electronic equipment
CN107709629B (en) 2015-08-12 2019-12-10 古河电气工业株式会社 Surface-treated copper foil and copper-clad laminate or printed wiring board produced using same
KR20170038969A (en) * 2015-09-30 2017-04-10 일진머티리얼즈 주식회사 Surface-treated Copper Foil for PCB having fine-circuit pattern and Method of manufacturing of the same
JP6182584B2 (en) 2015-12-09 2017-08-16 古河電気工業株式会社 Surface-treated copper foil for printed wiring board, copper-clad laminate for printed wiring board, and printed wiring board
CN108603303B (en) 2016-02-10 2020-11-13 古河电气工业株式会社 Surface-treated copper foil and copper-clad laminate produced using same
WO2018047933A1 (en) * 2016-09-12 2018-03-15 古河電気工業株式会社 Copper foil and copper-clad laminate comprising same
JP2018090906A (en) * 2016-12-06 2018-06-14 Jx金属株式会社 Surface-treated copper foil, copper foil with carrier, laminate, method for producing printed wiring board, and method for producing electronic device
CN108697006B (en) * 2017-03-31 2021-07-16 Jx金属株式会社 Surface-treated copper foil, copper foil with carrier, laminate, method for manufacturing printed wiring board, and method for manufacturing electronic device
JP2018172782A (en) * 2017-03-31 2018-11-08 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, laminate, method for producing printed wiring board and method for producing electronic apparatus
JP7356209B2 (en) * 2017-03-31 2023-10-04 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, copper foil with carrier, laminate, method for manufacturing printed wiring boards, and method for manufacturing electronic devices
KR20240030268A (en) * 2022-08-30 2024-03-07 롯데에너지머티리얼즈 주식회사 Surface-treated copper foil with pillar type nodule structure, copper clad laminate comprising the same, and printed wiring board comprising the same

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650794B2 (en) * 1989-05-02 1994-06-29 日鉱グールド・フォイル株式会社 Method of treating copper foil for printed circuits
JP2849059B2 (en) * 1995-09-28 1999-01-20 日鉱グールド・フォイル株式会社 Processing method of copper foil for printed circuit
JP3295308B2 (en) * 1996-06-28 2002-06-24 株式会社日鉱マテリアルズ Electrolytic copper foil
JP2001058203A (en) 1999-08-19 2001-03-06 Nippon Mining & Metals Co Ltd Rolled copper foil excellent in bendability
JP3477460B2 (en) * 2001-07-11 2003-12-10 三井金属鉱業株式会社 Laminated film for COF and COF film carrier tape
JP4295800B2 (en) * 2002-05-13 2009-07-15 三井金属鉱業株式会社 Electrolytic copper foil
CN1301046C (en) * 2002-05-13 2007-02-14 三井金属鉱业株式会社 Flexible printed wiring board for chip-on-film
JP2004098659A (en) 2002-07-19 2004-04-02 Ube Ind Ltd Copper-clad laminate and its manufacturing process
TW200718347A (en) * 2005-07-14 2007-05-01 Mitsui Mining & Smelting Co Blackening surface treated copper foil and electromagnetic wave shielding conductive mesh for front panel of plasma display using the blackening surface treated copper foil
KR20080063159A (en) * 2006-12-28 2008-07-03 미쓰이 긴조꾸 고교 가부시키가이샤 Flexible printed wiring board and semiconductor device
JP5129642B2 (en) * 2007-04-19 2013-01-30 三井金属鉱業株式会社 Surface treated copper foil, copper clad laminate obtained using the surface treated copper foil, and printed wiring board obtained using the copper clad laminate
JP5215631B2 (en) * 2007-10-24 2013-06-19 三井金属鉱業株式会社 Surface treated copper foil
KR101288641B1 (en) * 2008-11-25 2013-07-22 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 Copper foil for printed circuit
WO2011052207A1 (en) * 2009-10-30 2011-05-05 パナソニック電工株式会社 Circuit board and manufacturing method thereof
JP4927963B2 (en) * 2010-01-22 2012-05-09 古河電気工業株式会社 Surface-treated copper foil, method for producing the same, and copper-clad laminate
JP5242710B2 (en) * 2010-01-22 2013-07-24 古河電気工業株式会社 Roughening copper foil, copper clad laminate and printed wiring board
MY162078A (en) * 2010-02-24 2017-05-31 Jx Nippon Mining & Metals Corp Copper foil for printed circuit board and copper-clad laminate for printed circuit board
KR101328235B1 (en) * 2010-05-07 2013-11-14 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 Copper foil for printed circuit

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