KR102066316B1 - Laminate and copper-clad laminate using same - Google Patents

Laminate and copper-clad laminate using same Download PDF

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KR102066316B1
KR102066316B1 KR1020157022482A KR20157022482A KR102066316B1 KR 102066316 B1 KR102066316 B1 KR 102066316B1 KR 1020157022482 A KR1020157022482 A KR 1020157022482A KR 20157022482 A KR20157022482 A KR 20157022482A KR 102066316 B1 KR102066316 B1 KR 102066316B1
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copper foil
roughening process
roughening
average roughness
resin
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Korean (ko)
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KR20150103306A (en
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히데타 아라이
아츠시 미키
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제이엑스금속주식회사
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
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    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
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    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • C25D5/028Electroplating of selected surface areas one side electroplating, e.g. substrate conveyed in a bath with inhibited background plating
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    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
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    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • C25D5/14Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
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    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/16Electroplating with layers of varying thickness
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/627Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
    • CCHEMISTRY; METALLURGY
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    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • C25D7/0614Strips or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/033 layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/40Symmetrical or sandwich layers, e.g. ABA, ABCBA, ABCCBA
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/408Matt, dull surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/412Transparent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/22Electroplating: Baths therefor from solutions of zinc
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/562Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/58Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0104Properties and characteristics in general
    • H05K2201/0108Transparent
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0154Polyimide

Abstract

수지와 양호하게 접착하고, 또한, 구리박을 에칭으로 제거한 후의 수지의 투명성이 우수한 구리 피복 적층 기판용 표면 처리 구리박을 제공한다. 구리 피복 적층판용 표면 처리 구리박은, 구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 1.3 ㎛ 이고, 조화 처리 표면의 광택도가 0.5 ∼ 68 이고, 상기 조화 입자의 표면적 A 와, 상기 조화 입자를 상기 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 면적 B 의 비 A/B 가 2.00 ∼ 2.45 이다.The surface-treated copper foil for copper clad laminated boards which adheres favorably to resin and is excellent in transparency of resin after copper foil is removed by etching is provided. In the surface-treated copper foil for copper clad laminates, roughened particles are formed on the copper foil surface by roughening, the average roughness Rz of the roughened surface is 0.5 to 1.3 µm, and the glossiness of the roughened surface is 0.5 to 68. The ratio A / B of the surface area A of a roughened particle | grain, and the area B obtained when the said roughened particle is planarly viewed from the said copper foil surface side is 2.00-2.45.

Description

표면 처리 구리박 및 그것을 사용한 구리 피복 적층판, 프린트 배선판, 전자 기기 {LAMINATE AND COPPER-CLAD LAMINATE USING SAME}Surface-treated copper foil and copper clad laminates using this, printed wiring boards, electronic devices {LAMINATE AND COPPER-CLAD LAMINATE USING SAME}

본 발명은, 표면 처리 구리박 및 그것을 사용한 구리 피복 적층판, 프린트 배선판, 전자 기기에 관한 것으로, 특히, 구리박을 에칭한 후의 잔부의 수지의 투명성이 요구되는 분야에 바람직한 표면 처리 구리박 및 그것을 사용한 구리 피복 적층판, 프린트 배선판, 전자 기기에 관한 것이다.This invention relates to a surface-treated copper foil and the copper clad laminated board using the same, a printed wiring board, and an electronic device, The surface-treated copper foil which is especially suitable for the field where transparency of resin of the remainder after etching copper foil is calculated | required It relates to a copper clad laminated board, a printed wiring board, and an electronic device.

스마트 폰이나 태블릿 PC 와 같은 소형 전자기기에는, 배선의 용이성이나 경량성에서 플렉시블 프린트 배선판 (이하, FPC) 이 채용되고 있다. 최근, 이들 전자기기의 고기능화에 의해 신호 전송 속도의 고속화가 진행되어, FPC 에 있어서도 임피던스 정합이 중요한 요소가 되고 있다. 신호 용량의 증가에 대한 임피던스 정합의 방책으로서 FPC 의 베이스가 되는 수지 절연층 (예를 들어, 폴리이미드) 의 후층화가 진행되고 있다. 한편, FPC 는 액정 기재에 대한 접합이나 IC 칩의 탑재 등의 가공이 실시되는데, 이 때의 위치 맞춤은 구리 피복 적층판의 구리박을 에칭한 후에 남는 수지 절연층을 투과하여 시인되는 위치 결정 패턴을 통하여 실시되기 때문에, 수지 절연층의 시인성이 중요해진다.In small electronic devices such as smartphones and tablet PCs, flexible printed wiring boards (FPCs) have been adopted for ease of wiring and lightness. In recent years, as the electronic devices become more functional, signal transmission speeds have increased, and impedance matching has become an important factor even in FPC. As a measure of impedance matching with respect to an increase in signal capacity, a thickening of a resin insulating layer (for example, polyimide) serving as a base of an FPC is being progressed. On the other hand, the FPC is subjected to processing such as bonding to a liquid crystal substrate, mounting of an IC chip, and the like, in which the alignment is performed by passing through the resin insulating layer remaining after etching the copper foil of the copper clad laminate. Since it is implemented through, the visibility of the resin insulating layer becomes important.

또, 구리 피복 적층판은, 표면에 조화 도금이 실시된 압연 구리박을 사용해도 제조할 수 있다. 이 압연 구리박은, 통상적으로 터프 피치 구리 (산소 함유량 100 ∼ 500 중량 ppm) 또는 무산소 구리 (산소 함유량 10 중량 ppm 이하) 를 소재로서 사용하고, 이들의 잉곳을 열간 압연한 후, 소정의 두께까지 냉간 압연과 어닐링을 반복하여 제조된다. 특허문헌 1 에는 표면의 광택도가 높은 저조도 (低粗度) 전해박을 도체층으로서 사용하는 것이 제안되어 있다.Moreover, a copper clad laminated board can be manufactured even if it uses the rolled copper foil with which roughening plating was given to the surface. This rolled copper foil is usually made of tough pitch copper (oxygen content of 100 to 500 weight ppm) or oxygen free copper (oxygen content of 10 weight ppm or less) as a material, and after hot rolling these ingots, they are cold to a predetermined thickness. It is produced by repeating rolling and annealing. In patent document 1, using the low roughness electrolytic foil with high glossiness of the surface as a conductor layer is proposed.

한편, 특허문헌 2 에서는 굴곡성이 우수한 구리박으로서 유막 제어 등의 조건하의 냉간 압연 공정으로 형성된 표면 상의 오일 피트의 깊이가 2.0 ㎛ 이하인 압연 구리박이 제안되어 있다.On the other hand, in patent document 2, the rolled copper foil whose depth of the oil pit on the surface formed by the cold rolling process under conditions, such as oil film control, as copper foil excellent in flexibility is 2.0 micrometers or less is proposed.

일본 공개특허공보 2004-98659호Japanese Unexamined Patent Publication No. 2004-98659 일본 공개특허공보 2001-58203호Japanese Laid-Open Patent Publication 2001-58203

특허문헌 1 에 있어서, 흑화 처리 또는 도금 처리 후의 유기 처리제에 의해 접착성이 개량 처리되어 얻어지는 저조도 구리박은, 구리 피복 적층판에 굴곡성이 요구되는 용도에서는, 피로에 의해 단선되는 경우가 있고, 수지 투시성이 떨어지는 경우가 있다. 또, 특허문헌 2 에 기재된 정도의 오일 피트 상태를 갖는 압연 구리박을 사용해도 수지의 충분한 투명성은 얻어지지 않는다. 이와 같이 종래 기술에서는 압연 구리박을 에칭으로 제거한 후의 수지 투시성이 낮아, 칩의 위치 맞춤을 원활히 실시할 수 없었다.In patent document 1, the low roughness copper foil obtained by the adhesive improvement improvement process by the organic treatment agent after a blackening process or plating process may be disconnected by fatigue in the use which requires flexibility | flexibility to a copper clad laminated board, and resin transparency You may fall. Moreover, even if it uses the rolled copper foil which has the oil pit state of the grade described in patent document 2, sufficient transparency of resin is not obtained. Thus, in the prior art, the resin transparency after removing the rolled copper foil by etching was low, and the chip alignment could not be performed smoothly.

본 발명은, 수지와 양호하게 접착하고, 또한, 구리박을 에칭으로 제거한 후의 수지의 투명성이 우수한 구리 피복 적층 기판용 구리박을 제공한다.This invention provides the copper foil for copper clad laminated boards excellent in transparency of resin after adhere | attaching with resin favorably and removing copper foil by the etching.

본 발명자들은 예의 연구를 거듭한 결과, 구리박의 수지 기판에 접착하고 있는 측의 표면 평균 조도 Rz 가, 구리박을 에칭 제거한 후의 수지 투명성에 영향을 미치는 것을 알아냈다. 즉, 구리박의 수지 기판에 접착하고 있는 측의 표면 평균 조도 Rz 가 클수록 구리박을 에칭 제거한 후의 수지 투명성이 불량이 되는 것을 알아냈다.MEANS TO SOLVE THE PROBLEM As a result of earnestly researching, the inventors discovered that surface average roughness Rz of the side adhering to the resin substrate of copper foil affects resin transparency after etching removal of copper foil. That is, it turned out that resin transparency after etching removal of copper foil becomes bad, so that surface average roughness Rz of the side adhering to the resin substrate of copper foil is large.

이상의 지견 (知見) 을 기초로 하여 완성된 본 발명은 일 측면에 있어서, 구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 1.3 ㎛ 이고, 조화 처리 표면의 광택도가 0.5 ∼ 68 이고, 상기 조화 입자의 표면적 A 와, 상기 조화 입자를 상기 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 면적 B 의 비 A/B 가 2.00 ∼ 2.45 인 구리 피복 적층판용 표면 처리 구리박이다.According to the present invention completed based on the above findings, in one aspect, roughened particles are formed on a copper foil surface by a roughening treatment, and the average roughness Rz of the roughened surface is 0.5 to 1.3 µm, and the roughened surface The surface treatment for copper clad laminated boards whose glossiness is 0.5-68 and ratio A / B of the area B obtained when the surface area A of the said roughening particle and the said roughening particle are planarly viewed from the said copper foil surface side are 2.00-2.45. Copper foil.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 일 실시형태에 있어서는, 상기 평균 조도 Rz 가 0.5 ∼ 1.1 ㎛ 이다.In one embodiment of the surface-treated copper foil for copper clad laminated board which concerns on this invention, the said average roughness Rz is 0.5-1.1 micrometers.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 다른 실시형태에 있어서는, 상기 평균 조도 Rz 가 0.6 ∼ 0.9 ㎛ 이다.In another embodiment of the surface-treated copper foil for copper clad laminated boards which concerns on this invention, the said average roughness Rz is 0.6-0.9 micrometer.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 또 다른 실시형태에 있어서는, 상기 광택도가 1.0 ∼ 40 이다.In another embodiment of the surface-treated copper foil for copper clad laminated boards which concerns on this invention, the said glossiness is 1.0-40.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 또 다른 실시형태에 있어서는, 상기 광택도가 4.8 ∼ 35 이다.In another embodiment of the surface-treated copper foil for copper clad laminated boards which concerns on this invention, the said glossiness is 4.8-35.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 또 다른 실시형태에 있어서는, 상기 A/B 가 2.00 ∼ 2.30 이다.In another embodiment of the surface-treated copper foil for copper clad laminated boards which concerns on this invention, said A / B is 2.00-2.30.

본 발명에 관련된 구리 피복 적층판용 표면 처리 구리박의 또 다른 실시형태에 있어서는, 상기 A/B 가 2.00 ∼ 2.15 이다.In another embodiment of the surface-treated copper foil for copper clad laminated boards which concerns on this invention, said A / B is 2.00-2.15.

상기 구리박을 조화 처리 표면측에서 두께 50 ㎛ 의 수지 기판의 양면에 첩합 (貼合) 시킨 후, 에칭으로 상기 구리박을 제거했을 때, 상기 수지 기판의 광 투과율이 30 % 이상이 된다.When the said copper foil is bonded together on both surfaces of a 50-micrometer-thick resin substrate on the roughening process surface side, when the said copper foil is removed by etching, the light transmittance of the said resin substrate will be 30% or more.

본 발명은 다른 측면에 있어서, 상기 표면 처리 구리박과 수지 기판을 적층하여 구성한 구리 피복 적층판이다.This invention is the copper clad laminated board which laminated | stacked and comprised the said surface-treated copper foil and the resin substrate in another aspect.

본 발명에 의하면, 수지와 양호하게 접착하고, 또한, 구리박을 에칭으로 제거한 후의 수지의 투명성이 우수한 구리 피복 적층 기판용 표면 처리 구리박을 제공할 수 있다.ADVANTAGE OF THE INVENTION According to this invention, the surface-treated copper foil for copper clad laminated boards which adheres favorably with resin and is excellent in transparency of resin after copper foil is removed by etching can be provided.

도 1 은 시인성 평가시의 (a) 비교예 1, (b) 실시예 1, (c) 참고예 2, (d) 실시예 7, (e) 실시예 3 의 인쇄물의 관찰 사진이다.
도 2 는 Rz 평가시의 (a) 비교예 1, (b) 실시예 1, (c) 참고예 2, (d) 실시예 7, (e) 실시예 3 의 구리박 표면의 SEM 관찰 사진이다.
BRIEF DESCRIPTION OF THE DRAWINGS It is an observation photograph of the printed matter of (a) Comparative Example 1, (b) Example 1, (c) Reference Example 2, (d) Example 7, (e) Example 3 at the time of visibility evaluation.
2 is an SEM observation photograph of the copper foil surface of (a) Comparative Example 1, (b) Example 1, (c) Reference Example 2, (d) Example 7, (e) Example 3 at the time of Rz evaluation. .

〔표면 처리 구리박의 형태 및 제조 방법〕[Form of surface-treated copper foil and manufacturing method]

본 발명에 있어서 사용하는 구리박은, 전해 구리박 또는 압연 구리박의 어느 것이여도 된다. 통상적으로 구리박의 수지 기재와 접착하는 면, 즉 조화면에는 적층 후의 구리박의 박리 강도를 향상시키는 것을 목적으로 하여, 탈지 후의 구리박의 표면에 울퉁불퉁한 형상의 전착을 실시하는 조화 처리가 실시된다. 전해 구리박은 제조 시점에서 요철을 갖고 있지만, 조화 처리에 의해 전해 구리박의 볼록부를 증강하여 요철을 한층 더 크게 한다. 본 발명에 있어서는, 이 조화 처리는 구리-코발트-니켈 합금 도금에 의해 실시할 수 있다. 조화 전의 전처리로서 통상적인 구리 도금 등이 실시되는 경우가 있고, 조화 후의 마무리 처리로서 전착물의 탈락을 방지하기 위하여 통상적인 구리 도금 등이 실시되는 경우도 있다. 압연 구리박과 전해 구리박에서는 처리 내용을 어느 정도 달리하는 경우도 있다. 본 발명에 있어서는, 이러한 전처리 및 마무리 처리도 포함하여 구리박 조화와 관련되는 공지된 처리를 필요에 따라 포함하고, 총칭하여 조화 처리라고 하는 것으로 한다.The copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil. Usually, the surface which adhere | attaches with the resin base material of copper foil, ie, a roughening surface, performs the roughening process which gives an uneven electrodeposition to the surface of copper foil after degreasing for the purpose of improving the peeling strength of copper foil after lamination. do. Electrolytic copper foil has unevenness | corrugation at the time of manufacture, but it raises the convex part of electrolytic copper foil by roughening process, and makes an unevenness | corrugation further larger. In this invention, this roughening process can be performed by copper-cobalt-nickel alloy plating. As a pretreatment before roughening, normal copper plating etc. may be performed, and in order to prevent the fall of an electrodeposition thing as a finishing process after roughening, normal copper plating etc. may be given. In rolled copper foil and electrolytic copper foil, a process content may differ to some extent. In this invention, the well-known process related to copper foil roughening including this pretreatment and finishing process is also included as needed, and it is collectively called a roughening process.

본 발명에 있어서의 조화 처리로서의 구리-코발트-니켈 합금 도금은, 전해 도금에 의해, 부착량이 15 ∼ 40 ㎎/d㎡ 의 구리 - 100 ∼ 3000 ㎍/d㎡ 의 코발트 - 100 ∼ 900 ㎍/d㎡ 의 니켈인 3 원계 합금층을 형성하도록 실시할 수 있다. Co 부착량이 100 ㎍/d㎡ 미만에서는, 내열성이 악화되고, 에칭성이 나빠지는 경우가 있다. Co 부착량이 3000 ㎍/d㎡ 를 초과하면, 자성의 영향을 고려해야 하는 경우에는 바람직하지 않고, 에칭 얼룩이 생기며, 또, 내산성 및 내약품성이 악화되는 경우가 있다. Ni 부착량이 100 ㎍/d㎡ 미만이면, 내열성이 나빠지는 경우가 있다. 한편, Ni 부착량이 900 ㎍/d㎡ 를 초과하면, 에칭 잔류물이 많아진다. 바람직한 Co 부착량은 1000 ∼ 2000 ㎍/d㎡ 이고, 바람직한 니켈 부착량은 200 ∼ 400 ㎍/d㎡ 이다. 여기서, 에칭 얼룩이란, 염화구리로 에칭한 경우, Co 가 용해되지 않고 남아 버리는 것을 의미하고 그리고 에칭 잔류물이란 염화암모늄으로 알칼리 에칭한 경우, Ni 가 용해되지 않고 남아 버리는 것을 의미하는 것이다.Copper-cobalt-nickel alloy plating as a roughening process in this invention is a copper-coated 100-100-3000 microgram / dm <2> cobalt-100-900 microgram / d of adhesion amount by 15-40 mg / dm <2> by electrolytic plating. It can be performed to form a ternary alloy layer of nickel of m 2. When Co adhesion amount is less than 100 microgram / dm <2>, heat resistance may deteriorate and etching property may worsen. When Co adhesion amount exceeds 3000 microgram / dm <2>, it is unpreferable when a magnetic influence should be considered, etching unevenness may occur, and acid resistance and chemical resistance may worsen. If Ni adhesion amount is less than 100 microgram / dm <2>, heat resistance may worsen. On the other hand, when Ni adhesion amount exceeds 900 microgram / dm <2>, etching residue will increase. Preferable Co adhesion amount is 1000-2000 microgram / dm <2>, and preferable nickel adhesion amount is 200-400 microgram / dm <2>. Here, the etching stain means that Co remains undissolved when etched with copper chloride, and the etching residue means that Ni remains undissolved when alkali etching with ammonium chloride.

이와 같은 3 원계 구리-코발트-니켈 합금 도금을 형성하기 위한 일반적 욕 및 도금 조건의 일례는 다음과 같다 : Examples of general bath and plating conditions for forming such ternary copper-cobalt-nickel alloy plating are as follows:

도금욕 조성 : Cu 10 ∼ 20 g/ℓ, Co 1 ∼ 10 g/ℓ, Ni 1 ∼ 10 g/ℓPlating bath composition: Cu 10-20 g / l, Co 1-10 g / l, Ni 1-10 g / l

pH : 1 ∼ 4pH: 1-4

온도 : 40 ∼ 50 ℃Temperature: 40-50 ℃

전류 밀도 Dk : 20 ∼ 30 A/d㎡Current density D k : 20 to 30 A / dm 2

도금 시간 : 1 ∼ 5 초Plating time: 1 to 5 seconds

조화 처리 후, 조화면 상에 부착량이 200 ∼ 3000 ㎍/d㎡ 인 코발트 - 100 ∼ 700 ㎍/d㎡ 인 니켈의 코발트-니켈 합금 도금층을 형성할 수 있다. 이 처리는 넓은 의미로 일종의 방청 처리로 볼 수 있다. 이 코발트-니켈 합금 도금층은, 구리박과 기판의 접착 강도를 실질적으로 저하시키지 않을 정도로 실시할 필요가 있다. 코발트 부착량이 200 ㎍/d㎡ 미만에서는, 내열 박리 강도가 저하되고, 내산화성 및 내약품성이 악화되는 경우가 있다. 또, 또 하나의 이유로서 코발트량이 적으면 처리 표면이 불그스름해지기 때문에 바람직하지 않다. 코발트 부착량이 3000 ㎍/d㎡ 를 초과하면, 자성의 영향을 고려해야 하는 경우에는 바람직하지 않고, 에칭 얼룩이 생기며, 또, 내산성 및 내약품성의 악화가 고려된다. 바람직한 코발트 부착량은 500 ∼ 3000 ㎍/d㎡ 이다. 한편, 니켈 부착량이 100 ㎍/d㎡ 미만에서는 내열 박리 강도가 저하되고 내산화성 및 내약품성이 악화된다. 니켈이 700 ㎍/d㎡ 를 초과하면, 알칼리 에칭성이 나빠진다. 바람직한 니켈 부착량은 200 ∼ 600 ㎍/d㎡ 이다.After the roughening treatment, a cobalt-nickel alloy plating layer of nickel having cobalt -100 to 700 µg / dm 2 having an adhesion amount of 200 to 3000 µg / dm 2 can be formed on the roughened surface. This process can be regarded as a kind of antirust process in a broad sense. It is necessary to perform this cobalt- nickel alloy plating layer so that the adhesive strength of copper foil and a board | substrate may not substantially fall. When cobalt adhesion amount is less than 200 microgram / dm <2>, heat-resistant peeling strength may fall and oxidation resistance and chemical resistance may deteriorate. As another reason, a small amount of cobalt is not preferable because the treated surface becomes reddish. If the cobalt adhesion amount exceeds 3000 µg / dm 2, it is not preferable when the magnetic influence is to be considered, etching stains occur, and deterioration of acid resistance and chemical resistance is considered. Preferable cobalt adhesion amount is 500-3000 microgram / dm <2>. On the other hand, when nickel adhesion amount is less than 100 microgram / dm <2>, heat peeling strength falls and oxidation resistance and chemical-resistance deteriorate. When nickel exceeds 700 microgram / dm <2>, alkali-etchability will worsen. Preferable nickel adhesion amount is 200-600 microgram / dm <2>.

또, 코발트-니켈 합금 도금의 조건의 일례는 다음과 같다 : Moreover, an example of the conditions of cobalt- nickel alloy plating is as follows:

도금욕 조성 : Co 1 ∼ 20 g/ℓ, Ni 1 ∼ 20 g/ℓPlating bath composition: Co 1-20 g / ℓ, Ni 1-20 g / ℓ

pH : 1.5 ∼ 3.5pH: 1.5 ~ 3.5

온도 : 30 ∼ 80 ℃Temperature: 30 to 80 ℃

전류 밀도 Dk : 1.0 ∼ 20.0 A/d㎡Current density D k : 1.0 to 20.0 A / dm 2

도금 시간 : 0.5 ∼ 4 초Plating time: 0.5-4 seconds

본 발명에 따르면, 코발트-니켈 합금 도금 상에 추가로 부착량이 10 ∼ 80 ㎍/d㎡ 인 아연 도금층이 형성된다. 아연 부착량이 10 ㎍/d㎡ 미만에서는 내열 열화율 개선 효과가 없어지는 경우가 있다. 한편, 아연 부착량이 80 ㎍/d㎡ 를 초과하면 내염산 열화율이 극단적으로 나빠지는 경우가 있다. 바람직하게는, 아연 부착량은 20 ∼ 60 ㎍/d㎡ 이고, 보다 바람직하게는 30 ∼ 50 ㎍/d㎡ 이다.According to the present invention, a zinc plating layer having an adhesion amount of 10 to 80 µg / dm 2 is further formed on the cobalt-nickel alloy plating. If the zinc adhesion amount is less than 10 µg / dm 2, the effect of improving the heat resistance deterioration rate may be lost. On the other hand, when zinc adhesion amount exceeds 80 microgram / dm <2>, hydrochloric acid deterioration rate may become extremely bad. Preferably, zinc adhesion amount is 20-60 microgram / dm <2>, More preferably, it is 30-50 microgram / dm <2>.

상기 아연 도금의 조건의 일례는 다음과 같다 : An example of the conditions of the galvanizing is as follows:

도금욕 조성 : Zn 100 ∼ 300 g/ℓPlating bath composition: Zn 100 ~ 300 g / ℓ

pH : 3 ∼ 4pH: 3-4

온도 : 50 ∼ 60 ℃Temperature: 50-60 ℃

전류 밀도 Dk : 0.1 ∼ 0.5 A/d㎡Current density D k : 0.1 to 0.5 A / dm 2

도금 시간 : 1 ∼ 3 초Plating time: 1-3 seconds

또한, 아연 도금층 대신에 아연-니켈 합금 도금 등의 아연 합금 도금층을 형성해도 되고, 또한 최표면에는 크로메이트 처리나 실란 커플링제의 도포 등에 의해 방청층을 형성해도 된다.In addition, a zinc alloy plating layer such as zinc-nickel alloy plating may be formed instead of the zinc plating layer, and an antirust layer may be formed on the outermost surface by chromate treatment, application of a silane coupling agent, or the like.

또, 본 발명의 표면 처리 구리박은, 조화 처리로서, 구리박의 표면에 사전에 구리의 1 차 입자층을 형성한 후, 1 차 입자층 상에 구리, 코발트 및 니켈로 이루어지는 3 원계 합금으로 이루어지는 2 차 입자층을 형성해도 된다. 이 경우, 구리의 1 차 입자의 도금 조건의 일례는 이하와 같다 : Moreover, the surface-treated copper foil of this invention is a roughening process, After forming the primary particle layer of copper on the surface of copper foil beforehand, The secondary which consists of ternary alloys which consist of copper, cobalt, and nickel on a primary particle layer. You may form a particle layer. In this case, an example of the plating conditions of the primary particles of copper is as follows:

도금욕 조성 : Cu 10 ∼ 25 g/ℓ, 황산 50 ∼ 100 g/ℓPlating bath composition: Cu 10-25 g / l, Sulfuric acid 50-100 g / l

온도 : 25 ∼ 50 ℃Temperature: 25-50 ℃

전류 밀도 Dk : 10 ∼ 70 A/d㎡Current density D k : 10 to 70 A / dm 2

도금 시간 : 5 ∼ 25 초Plating time: 5-25 seconds

쿨롬량 50 ∼ 500 As/d㎡Coulomb amount 50 to 500 As / dm

2 차 입자의 도금 조건의 일례는 이하와 같다 : An example of the plating conditions of the secondary particles is as follows:

도금욕 조성 : Cu 10 ∼ 20 g/ℓ, 니켈 5 ∼ 15 g/ℓ, 코발트 5 ∼ 15 g/ℓPlating bath composition: Cu 10-20 g / l, Nickel 5-15 g / l, Cobalt 5-15 g / l

pH : 2 ∼ 3pH: 2-3

온도 : 30 ∼ 50 ℃Temperature: 30-50 ℃

전류 밀도 Dk : 20 ∼ 60 A/d㎡Current density D k : 20 to 60 A / dm 2

도금 시간 : 1 ∼ 5 초Plating time: 1 to 5 seconds

쿨롬량 30 ∼ 70 As/d㎡Coulomb amount 30 to 70 As / dm 2

〔표면 조도 Rz〕(Surface roughness Rz)

본 발명의 표면 처리 구리박은, 구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 또한, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 1.3 ㎛ 이다. 이와 같은 구성에 의해, 필 강도가 높아져 수지와 양호하게 접착하고, 또한, 구리박을 에칭으로 제거한 후의 수지의 광 투과성이 양호해진다. 그 결과, 당해 수지를 투과하여 시인되는 위치 결정 패턴을 통하여 실시하는 IC 칩 탑재시의 위치 맞춤 등이 용이해진다. 평균 조도 Rz 가 0.5 ㎛ 미만이면, 구리박 표면의 조화 처리가 불충분하고, 수지와 충분히 접착할 수 없다. 한편, 평균 조도 Rz 가 1.3 ㎛ 초과이면, 구리박을 에칭으로 제거한 후의 수지 표면의 요철이 커져, 그 결과 수지의 광 투과성이 불량해진다. 조화 처리 표면의 평균 조도 Rz 는, 0.5 ∼ 1.1 ㎛ 가 바람직하고, 0.6 ∼ 0.9 ㎛ 가 보다 바람직하다.In the surface-treated copper foil of this invention, a roughening particle is formed by the roughening process on the copper foil surface, and the average roughness Rz of the roughening process surface is 0.5-1.3 micrometer. By such a structure, peeling strength becomes high, it adheres favorably with resin, and the light transmittance of resin after removing copper foil by etching becomes favorable. As a result, positioning etc. at the time of IC chip mounting performed through the positioning pattern which permeate | transmits the said resin and is visualized becomes easy. If average roughness Rz is less than 0.5 micrometer, the roughening process of the copper foil surface is inadequate, and it cannot fully adhere | attach with resin. On the other hand, when average roughness Rz is more than 1.3 micrometers, the unevenness | corrugation of the resin surface after removing copper foil by etching becomes large, and as a result, the light transmittance of resin becomes bad. 0.5-1.1 micrometers is preferable and, as for the average roughness Rz of a roughening process surface, 0.6-0.9 micrometer is more preferable.

〔광 투과율〕[Light transmittance]

본 발명의 표면 처리 구리박은, 상기 서술한 바와 같이 조화 처리 표면의 평균 조도 Rz 가 제어되고 있기 때문에, 수지 기판에 첩합시킨 후, 구리박을 제거한 부분의 수지 기판의 광 투과율이 양호해진다. 구체적으로는, 본 발명의 표면 처리 구리박은, 조화 처리 표면측에서 두께 50 ㎛ 의 수지 기판의 양면에 첩합시킨 후, 에칭으로 당해 구리박을 제거했을 때, 수지 기판의 광 투과율이 30 % 이상, 바람직하게는 50 % 이상이어도 된다.Since the average roughness Rz of the roughening process surface of the surface-treated copper foil of this invention is controlled as mentioned above, after bonding to a resin substrate, the light transmittance of the resin substrate of the part which removed the copper foil becomes favorable. Specifically, after the surface-treated copper foil of the present invention is bonded to both surfaces of a resin substrate having a thickness of 50 μm on the roughened surface side, when the copper foil is removed by etching, the light transmittance of the resin substrate is 30% or more, Preferably 50% or more may be sufficient.

〔광택도〕[Glossiness]

표면 처리 구리박의 조화면의 광택도는, 상기 서술한 수지의 광 투과율에 크게 영향을 미친다. 즉, 조화면의 광택도가 큰 구리박일수록, 상기 서술한 수지의 투과율이 양호해진다. 이 때문에, 본 발명의 표면 처리 구리박은, 조화면의 광택도가 0.5 ∼ 68 이고, 1.0 ∼ 40 인 것이 바람직하고, 4.8 ∼ 35 인 것이 보다 바람직하다.The glossiness of the roughening surface of surface-treated copper foil has big influence on the light transmittance of resin mentioned above. That is, the transmittance of resin mentioned above becomes favorable, so that the copper foil with a glossiness of a roughening surface is large. For this reason, the glossiness of a roughening surface is 0.5-68, it is preferable that it is 1.0-40, and, as for the surface-treated copper foil of this invention, it is more preferable that it is 4.8-35.

〔입자의 표면적〕[Surface Area of Particles]

조화 입자의 표면적 A 와, 조화 입자를 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 면적 B 의 비 A/B 는, 상기 서술한 수지의 광 투과율에 많이 영향을 미친다. 즉, 표면 조도 Rz 가 동일하면, 비 A/B 가 작은 구리박일수록, 상기 서술한 수지의 투과율이 양호해진다. 이 때문에, 본 발명의 표면 처리 구리박은, 당해 비 A/B 가 2.00 ∼ 2.45 이고, 2.00 ∼ 2.30 인 것이 바람직하고, 2.00 ∼ 2.15 인 것이 보다 바람직하다.The surface area A of the roughened particle and the ratio A / B of the area B obtained when the roughened particle is viewed in a plan view from the copper foil surface side greatly influence the light transmittance of the resin described above. That is, when surface roughness Rz is the same, the transmittance | permeability of resin mentioned above will become so favorable that it is copper foil with a small ratio A / B. For this reason, it is preferable that the said ratio A / B is 2.00-2.45, it is 2.00-2.30, and, as for the surface-treated copper foil of this invention, it is more preferable that it is 2.00-2.15.

입자 형성시의 전류 밀도와 도금 시간을 제어함으로써, 입자의 형태나 형성 밀도가 정해져, 상기 표면 조도 Rz, 광택도 및 입자의 면적비 A/B 를 제어할 수 있다.By controlling the current density and the plating time at the time of particle formation, the form and formation density of the particle are determined, and the surface roughness Rz, glossiness, and area ratio A / B of the particle can be controlled.

본 발명의 표면 처리 구리박을 조화 처리면측으로부터 수지 기판에 첩합시켜 구리 피복 적층체를 제조할 수 있다. 수지 기판은 프린트 배선판 등에 적용 가능한 특성을 갖는 것이면 특별히 제한을 받지 않지만, 예를 들어, 리지드 PWB 용으로 종이 기재 페놀 수지, 종이 기재 에폭시 수지, 합성 섬유 포 (布) 기재 에폭시 수지, 유리포·종이 복합 기재 에폭시 수지, 유리포·유리 부직포 복합 기재 에폭시 수지 및 유리포 기재 에폭시 수지 등을 사용하고, FPC 용으로 폴리에스테르 필름이나 폴리이미드 필름 등을 사용할 수 있다.The surface-treated copper foil of this invention can be bonded to a resin substrate from the roughening process surface side, and a copper clad laminated body can be manufactured. The resin substrate is not particularly limited as long as it has properties applicable to printed wiring boards. For example, a paper-based phenolic resin, a paper-based epoxy resin, a synthetic fiber cloth-based epoxy resin, glass cloth, or paper for rigid PWB. Composite base material epoxy resin, glass cloth, glass nonwoven fabric Composite base material epoxy resin, glass cloth base material epoxy resin, etc. can be used, A polyester film, a polyimide film, etc. can be used for FPC.

첩합 방법은, 리지드 PWB 용의 경우, 유리포 등의 기재에 수지를 함침시켜, 수지를 반경화 상태까지 경화시킨 프리프레그를 준비한다. 구리박을 피복층의 반대측의 면으로부터 프리프레그에 겹쳐 가열 가압시킴으로써 실시할 수 있다.In the bonding method, in the case of a rigid PWB, the base material, such as glass cloth, is impregnated with resin, and the prepreg which hardened resin to the semi-hardened state is prepared. It can carry out by heating and pressing copper foil overlapping a prepreg from the surface on the opposite side of a coating layer.

본 발명의 구리 피복 적층체는 각종의 프린트 배선판 (PWB) 에 사용 가능하고, 특별히 제한되는 것은 아니지만, 예를 들어, 도체 패턴의 층 수의 관점에서는 편면 PWB, 양면 PWB, 다층 PWB (3 층 이상) 에 적용 가능하고, 절연 기판 재료의 종류의 관점에서는 리지드 PWB, 플렉시블 PWB (FPC), 리지드·플렉스 PWB 에 적용 가능하다.Although the copper clad laminated body of this invention can be used for various printed wiring boards (PWB), it does not restrict | limit especially, For example, single-sided PWB, double-sided PWB, multilayer PWB (three or more layers) from a viewpoint of the number of layers of a conductor pattern. It is applicable to rigid PWB, flexible PWB (FPC), and rigid flex PWB from a viewpoint of the kind of insulated substrate material.

실시예Example

실시예 1, 3 ~ 5, 7 ~ 9, 13 ∼ 15, 참고예 2, 6, 10 ~ 12 및 비교예 1 ∼ 8 로서 구리박을 준비하고, 일방의 표면에 조화 처리로서 표 1 ∼ 4 에 기재된 조건에서 도금 처리를 실시하였다. 여기서, 실시예 1, 3 ~ 5, 7 ~ 9, 참고예 2, 6, 10 ∼ 12, 비교예 2 ∼ 6, 8 의 구리박으로서 JX 닛코 닛세키 금속사 제조 터프 피치 구리 (JIS H 3100 C1100R) 의 압연 구리박을 사용하였다. 또, 실시예 13 ∼ 15, 비교예 1, 7 의 구리박으로서 JX 닛코 닛세키 금속사 제조 전해 구리박 HLPLC 박을 사용하였다.Copper foil is prepared as Examples 1, 3-5, 7-9, 13-15, Reference Examples 2, 6, 10-12, and Comparative Examples 1-8, and it shows in Table 1-4 as a roughening process to one surface. The plating treatment was performed under the conditions described. Here, as a copper foil of Examples 1, 3-5, 7-9, Reference Examples 2, 6, 10-12, and Comparative Examples 2-6, 8, tough pitch copper (JIS H 3100 C1100R manufactured by JX Nikko Niseki Metal Co., Ltd.) Rolled copper foil). In addition, electrolytic copper foil HLPLC foil manufactured by JX Nikko Niseki Metal Co., Ltd. was used as the copper foil of Examples 13 to 15 and Comparative Examples 1 and 7.

Figure 112015080513625-pat00001
Figure 112015080513625-pat00001

Figure 112015080513625-pat00002
Figure 112015080513625-pat00002

Figure 112015080513625-pat00003
Figure 112015080513625-pat00003

Figure 112015080513625-pat00004
Figure 112015080513625-pat00004

상기 서술한 바와 같이 하여 제작한 실시예 및 비교예의 각 샘플에 대해, 각종 평가를 하기와 같이 실시하였다.Various evaluation was performed about each sample of the Example and comparative example produced as mentioned above as follows.

(1) 표면 조도 (Rz) 의 측정 ; (1) measurement of surface roughness Rz;

주식회사 코사카 연구소 제조 접촉 조도계 SP-11 을 사용하여 JIS B 0601-1994 에 준거하여 10 점 평균 조도를 조화면에 대해 측정하였다. 측정 기준 길이 0.8 ㎜, 평가 길이 4 ㎜, 컷 오프치 0.8 ㎜, 이송 속도 0.1 ㎜/초의 조건에서 압연 방향과 평행하게 측정 위치를 바꾸어 10 회 실시하고, 10 회의 측정에서의 값을 구하였다.The 10-point average roughness was measured with respect to the roughening surface in accordance with JIS B0601-1994 using the contact roughness meter SP-11 manufactured by Kosaka Research Institute. The measurement position was changed 10 times in parallel with the rolling direction on the conditions of 0.8 mm of measurement lengths, 4 mm of evaluation lengths, 0.8 mm of cut-off values, and 0.1 mm / sec of feed rates, and the value in 10 measurements was calculated | required.

(2) 입자의 면적비 (A/B) ; (2) the area ratio of the particles (A / B);

조화 입자의 표면적은 레이저 현미경에 의한 측정법을 사용하였다. 주식회사 키엔스 제조 레이저 마이크로스코프 VK8500 을 사용하여 조화 처리면의 100×100 ㎛ 상당 면적 (실데이터에서는 9924.4 ㎛2) 에 있어서의 삼차원 표면적 A 를 측정하고, 삼차원 표면적 A÷이차원 표면적 B=면적비 (A/B) 로 하는 수법에 의해 설정을 실시하였다.The surface area of a roughened particle used the measuring method by a laser microscope. Three-dimensional surface area A in 100 × 100 μm equivalent area (9924.4 μm 2 in real data) of the roughened surface was measured using the laser microscope VK8500 manufactured by Keyence Co., Ltd., and three-dimensional surface area A ÷ two-dimensional surface area B = area ratio (A / The setting was performed by the method of B).

(3) 광택도 ; (3) glossiness;

JIS Z 8741 에 준거한 닛폰 전색 주식회사 제조 광택도계 핸디 글로스 미터 PG-1 을 사용하여, 압연 방향에 직각인 방향의 입사각 60 도로 조화면에 대해 측정하였다.Using Nippon Denshi Color Co., Ltd. glossimeter handy gloss meter PG-1 based on JIS Z 8741, it measured about the roughening surface of 60 degrees of incidence angles in the direction orthogonal to a rolling direction.

(4) 광 투과율 ; (4) light transmittance;

구리박을 라미네이트용 열경화성 접착제가 형성된 폴리이미드 필름 (두께 50 ㎛) 의 양면에 첩합시키고, 구리박을 에칭 (염화제2철 수용액) 으로 제거하여 샘플 필름을 제작하였다. 얻어진 수지층에 대해, 닛폰 분광 주식회사 제조 분광 광도계 V-660 을 사용하여, 슬릿 10 ㎜ 이고, 파장 620 ㎚ 의 설정에 의해 광 투과율을 측정하였다.Copper foil was bonded to both surfaces of the polyimide film (50 micrometers in thickness) in which the thermosetting adhesive for lamination was formed, and copper foil was removed by the etching (ferric chloride aqueous solution), and the sample film was produced. About the obtained resin layer, the light transmittance was measured by setting the wavelength of 620 nm with a slit of 10 mm using the Nippon spectrophotometer V-660.

(5) 시인성 (수지 투명성) ; (5) visibility (resin transparency);

구리박을 라미네이트용 열경화성 접착제가 형성된 폴리이미드 필름 (두께 50 ㎛) 의 양면에 첩합시키고, 구리박을 에칭 (염화제2철 수용액) 으로 제거하여 샘플 필름을 제작하였다. 얻어진 수지층의 일면에 인쇄물을 첩부 (貼付) 하고, 반대면으로부터 수지층 너머로 인쇄물의 시인성을 판정하였다. 인쇄물의 윤곽이 뚜렷한 것을 「○」(합격), 윤곽이 흐트러진 것을 「×」(불합격) 로 평가하였다.Copper foil was bonded to both surfaces of the polyimide film (50 micrometers in thickness) in which the thermosetting adhesive for lamination was formed, and copper foil was removed by the etching (ferric chloride aqueous solution), and the sample film was produced. The printed matter was affixed on one surface of the obtained resin layer, and the visibility of the printed matter was determined from the opposite surface over the resin layer. It was evaluated as "(circle)" (passed) that the outline of printed matter was clear, and "x" (failed) that the outline was disturbed.

(6) 필 강도 (접착 강도) ; (6) peel strength (adhesive strength);

PC-TM-650 에 준거하여, 인장 시험기 오토 그래프 100 으로 상태 필 강도를 측정하고, 상기 상태 필 강도가 0.7 N/㎜ 이상을 구리 피복 적층 기판 용도로 사용할 수 있는 것으로 하였다.Based on PC-TM-650, the state peeling strength was measured by the tensile tester Autograph 100, and it was assumed that the said state peeling strength can use 0.7 N / mm or more for copper clad laminated board applications.

상기 각 시험의 조건 및 평가를 표 5 에 나타낸다.Table 5 shows the conditions and evaluation of the above tests.

Figure 112015080513625-pat00005
Figure 112015080513625-pat00005

(평가 결과)(Evaluation results)

실시예 1, 3 ~ 5, 7 ~ 9, 13 ∼ 15, 참고예 2, 6, 10 ~ 12 는 모두 투과율, 시인성 및 필 강도가 양호하였다.Examples 1, 3 to 5, 7 to 9, 13 to 15, and Reference Examples 2, 6 and 10 to 12 all had good transmittance, visibility, and peel strength.

비교예 1, 2, 5 는, 조화 처리 표면의 평균 조도 Rz 가 1.3 ㎛ 초과였기 때문에, 투과율이 불량이었다.In Comparative Examples 1, 2 and 5, the average roughness Rz of the roughened surface was greater than 1.3 µm, so that the transmittance was poor.

비교예 3 은, 광택도가 68 초과였기 때문에, 필 강도가 불량이었다.Since the glossiness was more than 68, the comparative example 3 was poor in peeling strength.

비교예 4 는, 면적비 A/B 가 2.00 미만이었기 때문에, 필 강도가 불량이었다.In Comparative Example 4, the peel strength was poor because the area ratio A / B was less than 2.00.

비교예 6 은, 조화 처리 표면의 평균 조도 Rz 가 0.5 ㎛ 미만이었기 때문에, 필 강도가 불량이었다.In Comparative Example 6, since the average roughness Rz of the roughened surface was less than 0.5 µm, the peel strength was poor.

비교예 7 은, 광택도가 0.5 미만이었기 때문에, 투과율이 불량이었다.Since the glossiness was less than 0.5, the comparative example 7 was defective.

비교예 8 은, 면적비 A/B 가 2.45 초과였기 때문에, 투과율이 불량이었다.In Comparative Example 8, the area ratio A / B was more than 2.45, so the transmittance was poor.

도 1 에 상기 시인성 평가시의 (a) 비교예 1, (b) 실시예 1, (c) 참고예 2, (d) 실시예 7, (e) 실시예 3 의 인쇄물의 관찰 사진을 각각 나타낸다.The observation photograph of the printed matter of (a) Comparative Example 1, (b) Example 1, (c) Reference Example 2, (d) Example 7, (e) Example 3 at the time of the said visibility evaluation is shown, respectively in FIG. .

도 2 에 상기 Rz 평가시의 (a) 비교예 1, (b) 실시예 1, (c) 참고예 2, (d) 실시예 7, (e) 실시예 3 의 구리박 표면의 SEM 관찰 사진을 각각 나타낸다.SEM observation photograph of the copper foil surface of (a) Comparative Example 1, (b) Example 1, (c) Reference Example 2, (d) Example 7, (e) Example 3 at the time of said Rz evaluation in FIG. Respectively.

Claims (16)

구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 1.3 ㎛ 이고, 조화 처리 표면의 광택도가 4.8 ∼ 68 이고,
상기 조화 처리 표면의 삼차원 표면적 A 와, 상기 조화 처리 표면을 상기 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 이차원 표면적 B 의 비 A/B 가 2.00 ∼ 2.45 이고, 상기 구리박을 조화 처리 표면측에서 두께 50 ㎛ 의 수지 기판의 양면에 첩합시킨 후, 에칭으로 상기 구리박을 제거했을 때, 상기 수지 기판의 광 투과율이 30 % 이상이 되는 표면 처리 구리박.
Roughening particle | grains are formed in a copper foil surface by a roughening process, the average roughness Rz of a roughening process surface is 0.5-1.3 micrometers, and the glossiness of a roughening process surface is 4.8-68,
The ratio A / B of the three-dimensional surface area A of the said roughening process surface and the two-dimensional surface area B obtained when the said roughening process surface is planarly viewed from the said copper foil surface side is 2.00-2.45, and the said copper foil is thickness in the roughening process surface side Surface bonding copper foil which the light transmittance of the said resin substrate will be 30% or more, after bonding to both surfaces of a 50 micrometers resin substrate, and removing the said copper foil by etching.
구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 1.3 ㎛ 이고, 조화 처리 표면의 광택도가 7.1 ∼ 68 이고,
상기 조화 처리 표면의 삼차원 표면적 A 와, 상기 조화 처리 표면을 상기 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 이차원 표면적 B 의 비 A/B 가 2.00 ∼ 2.45 이고, 상기 구리박을, 조화 처리 표면측에서 두께 50 ㎛ 의 수지 기판의 양면에 첩합시킨 후, 에칭으로 상기 구리박을 제거했을 때, 상기 수지 기판의 광 투과율이 30 % 이상이 되는 표면 처리 구리박.
Roughening particle | grains are formed in a copper foil surface by a roughening process, the average roughness Rz of a roughening process surface is 0.5-1.3 micrometers, and the glossiness of a roughening process surface is 7.1-68,
The ratio A / B of the three-dimensional surface area A of the said roughening process surface and the two-dimensional surface area B obtained when the said roughening process surface is planarly viewed from the said copper foil surface side is 2.00-2.45, and the said copper foil is in the roughening process surface side Surface bonding copper foil which the light transmittance of the said resin substrate will be 30% or more, after bonding to both surfaces of a 50-micrometer-thick resin substrate, and removing the said copper foil by etching.
구리박 표면에 조화 처리에 의해 조화 입자가 형성되고, 조화 처리 표면의 평균 조도 Rz 가 0.5 ∼ 0.9 ㎛ 이고, 조화 처리 표면의 광택도가 4.8 ∼ 68 이고,
상기 조화 처리 표면의 삼차원 표면적 A 와, 상기 조화 처리 표면을 상기 구리박 표면측으로부터 평면에서 보았을 때에 얻어지는 이차원 표면적 B 의 비 A/B 가 2.00 ∼ 2.45 이고, 상기 구리박을, 조화 처리 표면측에서 두께 50 ㎛ 의 수지 기판의 양면에 첩합시킨 후, 에칭으로 상기 구리박을 제거했을 때, 상기 수지 기판의 광 투과율이 30 % 이상이 되는 표면 처리 구리박.
Roughening particle | grains are formed in a copper foil surface by a roughening process, the average roughness Rz of a roughening process surface is 0.5-0.9 micrometer, and the glossiness of a roughening process surface is 4.8-68,
The ratio A / B of the three-dimensional surface area A of the said roughening process surface and the two-dimensional surface area B obtained when the said roughening process surface is planarly viewed from the said copper foil surface side is 2.00-2.45, and the said copper foil is in the roughening process surface side Surface bonding copper foil which the light transmittance of the said resin substrate will be 30% or more, after bonding to both surfaces of a 50-micrometer-thick resin substrate, and removing the said copper foil by etching.
제 1 항에 있어서,
상기 평균 조도 Rz 가 0.5 ∼ 1.1 ㎛ 인 표면 처리 구리박.
The method of claim 1,
Surface-treated copper foil whose said average roughness Rz is 0.5-1.1 micrometers.
제 2 항에 있어서,
상기 평균 조도 Rz 가 0.5 ∼ 1.1 ㎛ 인 표면 처리 구리박.
The method of claim 2,
Surface-treated copper foil whose said average roughness Rz is 0.5-1.1 micrometers.
제 3 항에 있어서,
상기 평균 조도 Rz 가 0.6 ∼ 0.9 ㎛ 인 표면 처리 구리박.
The method of claim 3, wherein
Surface-treated copper foil whose said average roughness Rz is 0.6-0.9 micrometer.
제 4 항에 있어서,
상기 평균 조도 Rz 가 0.6 ∼ 0.9 ㎛ 인 표면 처리 구리박.
The method of claim 4, wherein
Surface-treated copper foil whose said average roughness Rz is 0.6-0.9 micrometer.
제 5 항에 있어서,
상기 평균 조도 Rz 가 0.6 ∼ 0.9 ㎛ 인 표면 처리 구리박.
The method of claim 5,
Surface-treated copper foil whose said average roughness Rz is 0.6-0.9 micrometer.
제 1 항 내지 제 8 항 중 어느 한 항에 있어서,
상기 광택도가 1.0 ∼ 40 인 표면 처리 구리박.
The method according to any one of claims 1 to 8,
Surface-treated copper foil whose said glossiness is 1.0-40.
제 1 항 내지 제 8 항 중 어느 한 항에 있어서,
상기 광택도가 4.8 ∼ 35 인 표면 처리 구리박.
The method according to any one of claims 1 to 8,
Surface-treated copper foil whose said glossiness is 4.8-35.
제 1 항 내지 제 8 항 중 어느 한 항에 있어서,
상기 A/B 가 2.00 ∼ 2.30 인 표면 처리 구리박.
The method according to any one of claims 1 to 8,
Surface-treated copper foil whose said A / B is 2.00-2.30.
제 1 항 내지 제 8 항 중 어느 한 항에 있어서,
상기 A/B 가 2.00 ∼ 2.15 인 표면 처리 구리박.
The method according to any one of claims 1 to 8,
Surface-treated copper foil whose said A / B is 2.00-2.15.
삭제delete 제 1 항 내지 제 8 항 중 어느 한 항에 기재된 표면 처리 구리박과 수지 기판을 적층하여 구성한 구리 피복 적층판. The copper clad laminated board comprised by laminating | stacking the surface-treated copper foil and resin substrate of any one of Claims 1-8. 제 1 항 내지 제 8 항 중 어느 한 항에 기재된 표면 처리 구리박을 이용한 프린트 배선판.The printed wiring board using the surface-treated copper foil in any one of Claims 1-8. 제 15 항에 기재된 프린트 배선판을 이용한 전자 기기.The electronic device using the printed wiring board of Claim 15.
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