JP2013147688A - Surface-treated copper foil for use in copper-clad laminated board, and copper-clad laminated board employing the same - Google Patents

Surface-treated copper foil for use in copper-clad laminated board, and copper-clad laminated board employing the same Download PDF

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JP2013147688A
JP2013147688A JP2012007578A JP2012007578A JP2013147688A JP 2013147688 A JP2013147688 A JP 2013147688A JP 2012007578 A JP2012007578 A JP 2012007578A JP 2012007578 A JP2012007578 A JP 2012007578A JP 2013147688 A JP2013147688 A JP 2013147688A
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copper foil
copper
treated
resin
clad laminated
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JP2013147688A5 (en
JP5497808B2 (en
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Eita Arai
英太 新井
Atsushi Miki
敦史 三木
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JX Nippon Mining and Metals Corp
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JX Nippon Mining and Metals Corp
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Priority to CN201280066269.9A priority patent/CN104040036B/en
Priority to KR1020147015231A priority patent/KR20140084333A/en
Priority to KR1020157022482A priority patent/KR102066316B1/en
Priority to PCT/JP2012/055592 priority patent/WO2013108414A1/en
Priority to TW102101922A priority patent/TWI460068B/en
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • C25D5/028Electroplating of selected surface areas one side electroplating, e.g. substrate conveyed in a bath with inhibited background plating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/627Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • C25D7/0614Strips or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/033 layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/40Symmetrical or sandwich layers, e.g. ABA, ABCBA, ABCCBA
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/408Matt, dull surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/412Transparent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/22Electroplating: Baths therefor from solutions of zinc
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/562Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/58Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • C25D5/14Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0104Properties and characteristics in general
    • H05K2201/0108Transparent
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0154Polyimide

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
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  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Laminated Bodies (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a surface-treated copper foil for use in a copper-clad laminated board, suitably adhering to a resin, with the resin excellent in transparency after removing the copper foil by etching.SOLUTION: A surface-treated copper foil for use in a copper-clad laminated board includes roughened particles formed on the surface of the copper foil by a roughening treatment, with a mean roughness Rz of the roughened surface being 0.5 to 1.3 μm, gloss of the roughened surface being 0.5 to 68, and a ratio A/B of a surface area A of the roughened particles relative to an area B obtained upon viewing the roughened particles in a plan view from the surface side of the copper foil, being 2.00 to 2.45.

Description

本発明は、銅張積層板用表面処理銅箔及びそれを用いた銅張積層板に関し、特に、銅箔をエッチングした後の残部の樹脂の透明性が要求される分野に好適な銅張積層板用表面処理銅箔及びそれを用いた銅張積層板に関する。   The present invention relates to a surface-treated copper foil for a copper-clad laminate and a copper-clad laminate using the same, and in particular, a copper-clad laminate suitable for a field where transparency of the remaining resin after etching the copper foil is required. The present invention relates to a surface-treated copper foil for plates and a copper-clad laminate using the same.

スマートフォンやタブレットPCといった小型電子機器には、配線の容易性や軽量性からフレキシブルプリント配線板(以下、FPC)が採用されている。近年、これら電子機器の高機能化により信号伝送速度の高速化が進み、FPCにおいてもインピーダンス整合が重要な要素となっている。信号容量の増加に対するインピーダンス整合の方策として、FPCのベースとなる樹脂絶縁層(例えば、ポリイミド)の厚層化が進んでいる。一方、FPCは液晶基材への接合やICチップの搭載などの加工が施されるが、この際の位置合わせは銅張積層板の銅箔をエッチングした後に残る樹脂絶縁層を透過して視認される位置決めパターンを介して行われるため、樹脂絶縁層の視認性が重要となる。   In a small electronic device such as a smartphone or a tablet PC, a flexible printed wiring board (hereinafter referred to as FPC) is adopted because of easy wiring and light weight. In recent years, with the enhancement of functions of these electronic devices, the signal transmission speed has been increased, and impedance matching has become an important factor in FPC. As a measure for impedance matching with respect to an increase in signal capacity, a resin insulation layer (for example, polyimide) serving as a base of an FPC has been increased in thickness. On the other hand, the FPC is processed such as bonding to a liquid crystal substrate and mounting of an IC chip. The alignment at this time is visible through the resin insulation layer remaining after etching the copper foil of the copper clad laminate. Therefore, the visibility of the resin insulating layer is important.

また、銅張積層板は、表面に粗化めっきが施された圧延銅箔を使用しても製造できる。この圧延銅箔は、通常タフピッチ銅(酸素含有量100〜500重量ppm)又は無酸素銅(酸素含有量10重量ppm以下)を素材として使用し、これらのインゴットを熱間圧延した後、所定の厚さまで冷間圧延と焼鈍とを繰り返して製造される。特許文献1には表面の光沢度が高い低粗度電解箔を導体層として用いることが提案されている。
一方、特許文献2では屈曲性に優れる銅箔として、油膜制御等の条件下の冷間圧延工程で形成された表面上のオイルピットの深さが2.0μm以下である圧延銅箔が提案されている。
Moreover, a copper clad laminated board can also be manufactured even if it uses the rolled copper foil by which the roughening plating was given to the surface. This rolled copper foil usually uses tough pitch copper (oxygen content of 100 to 500 ppm by weight) or oxygen-free copper (oxygen content of 10 ppm by weight or less) as a raw material, and after hot rolling these ingots, It is manufactured by repeating cold rolling and annealing to a thickness. Patent Document 1 proposes to use a low-roughness electrolytic foil having a high surface glossiness as a conductor layer.
On the other hand, Patent Document 2 proposes a rolled copper foil having an oil pit depth of 2.0 μm or less on the surface formed by a cold rolling process under conditions such as oil film control as a copper foil having excellent flexibility. ing.

特開2004−98659号公報JP 2004-98659 A 特開2001−58203号公報JP 2001-58203 A

特許文献1において、黒化処理又はめっき処理後の有機処理剤により接着性が改良処理されて得られる低粗度銅箔は、銅張積層板に屈曲性が要求される用途では、疲労によって断線することがあり、樹脂透視性に劣る場合がある。又、特許文献2に記載された程度のオイルピット状態を有する圧延銅箔を使用しても樹脂の充分な透明性は得られない。このように従来技術では圧延銅箔をエッチングで除去した後の樹脂透視性が低く、チップの位置合わせを円滑に行うことができなかった。
本発明は、樹脂と良好に接着し、且つ、銅箔をエッチングで除去した後の樹脂の透明性に優れた銅張積層基板用銅箔を提供する。
In Patent Document 1, a low-roughness copper foil obtained by improving adhesion with an organic treatment agent after blackening treatment or plating treatment is broken due to fatigue in applications where flexibility is required for a copper-clad laminate. May be inferior in resin transparency. Further, even if a rolled copper foil having an oil pit state as described in Patent Document 2 is used, sufficient transparency of the resin cannot be obtained. Thus, in the prior art, the resin transparency after removing the rolled copper foil by etching was low, and the chip alignment could not be performed smoothly.
The present invention provides a copper foil for a copper-clad laminate, which adheres well to a resin and is excellent in resin transparency after the copper foil is removed by etching.

本発明者らは鋭意研究を重ねた結果、銅箔の樹脂基板に接着している側の表面平均粗さRzが、銅箔をエッチング除去した後の樹脂透明性に影響を及ぼすことを見出した。すなわち、銅箔の樹脂基板に接着している側の表面平均粗さRzが大きいほど銅箔をエッチング除去した後の樹脂透明性が不良となることを見出した。   As a result of intensive studies, the present inventors have found that the surface average roughness Rz of the copper foil bonded to the resin substrate affects the resin transparency after the copper foil is removed by etching. . That is, it has been found that as the surface average roughness Rz on the side of the copper foil bonded to the resin substrate is larger, the resin transparency after the copper foil is removed by etching becomes poorer.

以上の知見を基礎として完成された本発明は一側面において、銅箔表面に粗化処理により粗化粒子が形成され、粗化処理表面の平均粗さRzが0.5〜1.3μmであり、粗化処理表面の光沢度が0.5〜68であり、前記粗化粒子の表面積Aと、前記粗化粒子を前記銅箔表面側から平面視したときに得られる面積Bとの比A/Bが2.00〜2.45である銅張積層板用表面処理銅箔である。   In one aspect of the present invention completed based on the above knowledge, roughened particles are formed on the surface of the copper foil by the roughening treatment, and the average roughness Rz of the roughened treatment surface is 0.5 to 1.3 μm. The ratio A between the surface roughness A of the roughened particles and the area B obtained when the roughened particles are viewed in plan from the copper foil surface side. It is the surface-treated copper foil for copper clad laminated boards whose / B is 2.00-2.45.

本発明に係る銅張積層板用表面処理銅箔の一実施形態においては、前記平均粗さRzが0.5〜1.1μmである。   In one embodiment of the surface-treated copper foil for copper-clad laminate according to the present invention, the average roughness Rz is 0.5 to 1.1 μm.

本発明に係る銅張積層板用表面処理銅箔の別の実施形態においては、前記平均粗さRzが0.6〜0.9μmである。   In another embodiment of the surface-treated copper foil for a copper clad laminate according to the present invention, the average roughness Rz is 0.6 to 0.9 μm.

本発明に係る銅張積層板用表面処理銅箔の更に別の実施形態においては、前記光沢度が1.0〜40である。   In still another embodiment of the surface-treated copper foil for a copper clad laminate according to the present invention, the glossiness is 1.0 to 40.

本発明に係る銅張積層板用表面処理銅箔の更に別の実施形態においては、前記光沢度が4.8〜35である。   In still another embodiment of the surface-treated copper foil for a copper-clad laminate according to the present invention, the glossiness is 4.8 to 35.

本発明に係る銅張積層板用表面処理銅箔の更に別の実施形態においては、前記A/Bが2.00〜2.30である。   In still another embodiment of the surface-treated copper foil for copper-clad laminate according to the present invention, the A / B is 2.00 to 2.30.

本発明に係る銅張積層板用表面処理銅箔の更に別の実施形態においては、前記A/Bが2.00〜2.15である。   In still another embodiment of the surface-treated copper foil for copper-clad laminate according to the present invention, the A / B is 2.00 to 2.15.

前記銅箔を、粗化処理表面側から厚さ50μmの樹脂基板の両面に貼り合わせた後、エッチングで前記銅箔を除去したとき、前記樹脂基板の光透過率が30%以上となる。   When the copper foil is bonded to both surfaces of a 50 μm thick resin substrate from the surface of the roughened surface and then removed by etching, the light transmittance of the resin substrate becomes 30% or more.

本発明は別の側面において、前記表面処理銅箔と樹脂基板とを積層して構成した銅張積層板である。   In another aspect, the present invention is a copper clad laminate configured by laminating the surface-treated copper foil and a resin substrate.

本発明によれば、樹脂と良好に接着し、且つ、銅箔をエッチングで除去した後の樹脂の透明性に優れた銅張積層基板用表面処理銅箔を提供できる。   ADVANTAGE OF THE INVENTION According to this invention, the surface treatment copper foil for copper clad laminated boards excellent in transparency of resin after adhere | attaching resin favorably and removing the copper foil by etching can be provided.

視認性評価の際の、(a)比較例1、(b)実施例1、(c)実施例2、(d)実施例7、(e)実施例3の印刷物の観察写真である。It is the observation photograph of the printed matter of (a) Comparative example 1, (b) Example 1, (c) Example 2, (d) Example 7, and (e) Example 3 in the case of visibility evaluation. Rz評価の際の、(a)比較例1、(b)実施例1、(c)実施例2、(d)実施例7、(e)実施例3の銅箔表面のSEM観察写真である。It is a SEM observation photograph of the copper foil surface of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7, and (e) Example 3 in the Rz evaluation. .

〔表面処理銅箔の形態及び製造方法〕
本発明において使用する銅箔は、電解銅箔或いは圧延銅箔いずれでも良い。通常、銅箔の、樹脂基材と接着する面、即ち粗化面には積層後の銅箔の引き剥し強さを向上させることを目的として、脱脂後の銅箔の表面にふしこぶ状の電着を行う粗化処理が施される。電解銅箔は製造時点で凹凸を有しているが、粗化処理により電解銅箔の凸部を増強して凹凸を一層大きくする。本発明においては、この粗化処理は銅−コバルト−ニッケル合金めっきにより行なうことができる。粗化前の前処理として通常の銅めっき等が行われることがあり、粗化後の仕上げ処理として電着物の脱落を防止するために通常の銅めっき等が行なわれることもある。圧延銅箔と電解銅箔とでは処理の内容を幾分異にすることもある。本発明においては、こうした前処理及び仕上げ処理をも含め、銅箔粗化と関連する公知の処理を必要に応じて含め、総称して粗化処理と云うものとする。
[Form and manufacturing method of surface-treated copper foil]
The copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil. Usually, the surface of the copper foil that adheres to the resin base material, that is, the roughened surface, has a fist-like shape on the surface of the copper foil after degreasing in order to improve the peel strength of the copper foil after lamination. A roughening process for electrodeposition is performed. Although the electrolytic copper foil has irregularities at the time of manufacture, the irregularities are further increased by enhancing the convex portions of the electrolytic copper foil by roughening treatment. In the present invention, this roughening treatment can be performed by copper-cobalt-nickel alloy plating. Ordinary copper plating or the like may be performed as a pretreatment before roughening, and ordinary copper plating or the like may be performed as a finishing treatment after roughening in order to prevent electrodeposits from dropping off. The content of treatment may be somewhat different between the rolled copper foil and the electrolytic copper foil. In the present invention, including such pretreatment and finishing treatment, known treatments related to copper foil roughening are included as necessary, and are collectively referred to as roughening treatment.

本発明における粗化処理としての銅−コバルト−ニッケル合金めっきは、電解めっきにより、付着量が15〜40mg/dm2の銅−100〜3000μg/dm2のコバルト−100〜900μg/dm2のニッケルであるような3元系合金層を形成するように実施することができる。Co付着量が100μg/dm2未満では、耐熱性が悪化し、エッチング性が悪くなることがある。Co付着量が3000μg/dm2 を超えると、磁性の影響を考慮せねばならない場合には好ましくなく、エッチングシミが生じ、また、耐酸性及び耐薬品性の悪化がすることがある。Ni付着量が100μg/dm2未満であると、耐熱性が悪くなることがある。他方、Ni付着量が900μg/dm2を超えると、エッチング残が多くなる。好ましいCo付着量は1000〜2000μg/dm2であり、好ましいニッケル付着量は200〜400μg/dm2である。ここで、エッチングシミとは、塩化銅でエッチングした場合、Coが溶解せずに残ってしまうことを意味しそしてエッチング残とは塩化アンモニウムでアルカリエッチングした場合、Niが溶解せずに残ってしまうことを意味するものである。 Copper as the roughening treatment in the present invention - cobalt - nickel alloy plating, by electrolytic plating, deposition amount of 15~40mg / dm 2 of copper -100~3000μg / dm 2 of cobalt -100~900μg / dm 2 of nickel The ternary alloy layer can be formed as follows. If the amount of deposited Co is less than 100 μg / dm 2 , the heat resistance may deteriorate and the etching property may deteriorate. When the amount of Co deposition exceeds 3000 μg / dm 2 , it is not preferable when the influence of magnetism must be taken into account, etching spots may occur, and acid resistance and chemical resistance may deteriorate. If the Ni adhesion amount is less than 100 μg / dm 2 , the heat resistance may deteriorate. On the other hand, when the Ni adhesion amount exceeds 900 μg / dm 2 , the etching residue increases. Preferred Co deposition amount is 1000~2000μg / dm 2, preferably nickel coating weight is 200~400μg / dm 2. Here, the etching stain means that Co remains without being dissolved when etched with copper chloride, and the etching residue means that Ni remains without being dissolved when alkaline etching is performed with ammonium chloride. It means that.

このような3元系銅−コバルト−ニッケル合金めっきを形成するための一般的浴及びめっき条件の一例は次の通りである:
めっき浴組成:Cu10〜20g/L、Co1〜10g/L、Ni1〜10g/L
pH:1〜4
温度:40〜50℃
電流密度Dk:20〜30A/dm2
めっき時間:1〜5秒
An example of a general bath and plating conditions for forming such a ternary copper-cobalt-nickel alloy plating is as follows:
Plating bath composition: Cu 10-20 g / L, Co 1-10 g / L, Ni 1-10 g / L
pH: 1-4
Temperature: 40-50 ° C
Current density D k : 20 to 30 A / dm 2
Plating time: 1-5 seconds

粗化処理後、粗化面上に付着量が200〜3000μg/dm2のコバルト−100〜700μg/dm2のニッケルのコバルト−ニッケル合金めっき層を形成することができる。この処理は広い意味で一種の防錆処理とみることができる。このコバルト−ニッケル合金めっき層は、銅箔と基板の接着強度を実質的に低下させない程度に行う必要がある。コバルト付着量が200μg/dm2 未満では、耐熱剥離強度が低下し、耐酸化性及び耐薬品性が悪化することがある。また、もう一つの理由として、コバルト量が少ないと処理表面が赤っぽくなってしまうので好ましくない。コバルト付着量が3000μg/dm2を超えると、磁性の影響を考慮せねばならない場合には好ましくなく、エッチングシミが生じ、また、耐酸性及び耐薬品性の悪化が考慮される。好ましいコバルト付着量は500〜3000μg/dm2である。一方、ニッケル付着量が100μg/dm2 未満では耐熱剥離強度が低下し耐酸化性及び耐薬品性が悪化する。ニッケルが700μg/dm2を超えると、アルカリエッチング性が悪くなる。好ましいニッケル付着量は200〜600μg/dm2である。 After the roughening treatment, a cobalt-nickel alloy plating layer of nickel having an adhesion amount of 200 to 3000 μg / dm 2 and cobalt-100 to 700 μg / dm 2 can be formed on the roughened surface. This treatment can be regarded as a kind of rust prevention treatment in a broad sense. This cobalt-nickel alloy plating layer needs to be performed to such an extent that the adhesive strength between the copper foil and the substrate is not substantially reduced. If the amount of cobalt adhesion is less than 200 μg / dm 2 , the heat-resistant peel strength is lowered, and the oxidation resistance and chemical resistance may be deteriorated. As another reason, if the amount of cobalt is small, the treated surface becomes reddish, which is not preferable. When the amount of cobalt deposition exceeds 3000 μg / dm 2 , it is not preferable when the influence of magnetism must be taken into account, etching spots occur, and deterioration of acid resistance and chemical resistance is considered. A preferable cobalt adhesion amount is 500 to 3000 μg / dm 2 . On the other hand, if the nickel adhesion amount is less than 100 μg / dm 2 , the heat-resistant peel strength is lowered and the oxidation resistance and chemical resistance are deteriorated. When nickel exceeds 700 μg / dm 2 , the alkali etching property is deteriorated. A preferable nickel adhesion amount is 200 to 600 μg / dm 2 .

また、コバルト−ニッケル合金めっきの条件の一例は次の通りである:
めっき浴組成:Co1〜20g/L、Ni1〜20g/L
pH:1.5〜3.5
温度:30〜80℃
電流密度Dk:1.0〜20.0A/dm2
めっき時間:0.5〜4秒
An example of the conditions for cobalt-nickel alloy plating is as follows:
Plating bath composition: Co 1-20 g / L, Ni 1-20 g / L
pH: 1.5-3.5
Temperature: 30-80 ° C
Current density D k : 1.0 to 20.0 A / dm 2
Plating time: 0.5-4 seconds

本発明に従えば、コバルト−ニッケル合金めっき上に更に付着量の10〜80μg/dm2の亜鉛めっき層が形成される。亜鉛付着量が10μg/dm2未満では耐熱劣化率改善効果が無くなることがある。他方、亜鉛付着量が80μg/dm2を超えると耐塩酸劣化率が極端に悪くなることがある。好ましくは、亜鉛付着量は20〜60μg/dm2であり、より好ましくは30〜50μg/dm2である。 According to the present invention, a zinc plating layer having an adhesion amount of 10 to 80 μg / dm 2 is further formed on the cobalt-nickel alloy plating. If the zinc adhesion amount is less than 10 μg / dm 2 , the heat deterioration rate improving effect may be lost. On the other hand, when the zinc adhesion amount exceeds 80 μg / dm 2 , the hydrochloric acid resistance deterioration rate may be extremely deteriorated. Preferably, the zinc adhesion amount is 20 to 60 μg / dm 2 , more preferably 30 to 50 μg / dm 2 .

上記亜鉛めっきの条件の一例は次の通りである:
めっき浴組成:Zn100〜300g/L
pH:3〜4
温度:50〜60℃
電流密度Dk:0.1〜0.5A/dm2
めっき時間:1〜3秒
An example of the galvanizing conditions is as follows:
Plating bath composition: Zn 100 to 300 g / L
pH: 3-4
Temperature: 50-60 ° C
Current density D k : 0.1 to 0.5 A / dm 2
Plating time: 1-3 seconds

なお、亜鉛めっき層の代わりに亜鉛−ニッケル合金めっき等の亜鉛合金めっき層を形成してもよく、さらに最表面にはクロメート処理やシランカップリング剤の塗布等によって防錆層を形成してもよい。   A zinc alloy plating layer such as zinc-nickel alloy plating may be formed instead of the zinc plating layer, and a rust prevention layer may be formed on the outermost surface by chromate treatment or application of a silane coupling agent. Good.

また、本発明の表面処理銅箔は、粗化処理として、銅箔の表面に、事前に銅の一次粒子層を形成した後、一次粒子層の上に、銅、コバルト及びニッケルからなる三元系合金からなる二次粒子層を形成してもよい。この場合、銅の一次粒子のめっき条件の一例は以下の通りである:
めっき浴組成:Cu10〜25g/L、硫酸50〜100g/L
温度:25〜50℃
電流密度Dk:10〜70A/dm2
めっき時間:5〜25秒
クーロン量50〜500As/dm2
Moreover, the surface-treated copper foil of the present invention is a ternary composed of copper, cobalt, and nickel on the primary particle layer after forming a primary particle layer of copper on the surface of the copper foil in advance as a roughening treatment. You may form the secondary particle layer which consists of a system alloy. In this case, an example of plating conditions for the primary particles of copper is as follows:
Plating bath composition: Cu 10-25 g / L, sulfuric acid 50-100 g / L
Temperature: 25-50 ° C
Current density D k : 10 to 70 A / dm 2
Plating time: 5 to 25 seconds Coulomb amount 50 to 500 As / dm 2

二次粒子のめっき条件の一例は以下の通りである:
めっき浴組成:Cu10〜20g/L、ニッケル5〜15g/L、コバルト5〜15g/L
pH:2〜3
温度:30〜50℃
電流密度Dk:20〜60A/dm2
めっき時間:1〜5秒
クーロン量30〜70As/dm2
An example of secondary particle plating conditions is as follows:
Plating bath composition: Cu 10-20 g / L, nickel 5-15 g / L, cobalt 5-15 g / L
pH: 2-3
Temperature: 30-50 ° C
Current density D k : 20 to 60 A / dm 2
Plating time: 1 to 5 seconds Coulomb amount 30 to 70 As / dm 2

〔表面粗さRz〕
本発明の表面処理銅箔は、銅箔表面に粗化処理により粗化粒子が形成され、且つ、粗化処理表面の平均粗さRzが0.5〜1.3μmである。このような構成により、ピール強度が高くなって樹脂と良好に接着し、且つ、銅箔をエッチングで除去した後の樹脂の光透過性が良好となる。その結果、当該樹脂を透過して視認される位置決めパターンを介して行うICチップ搭載時の位置合わせ等が容易となる。平均粗さRzが0.5μm未満であると、銅箔表面の粗化処理が不十分であり、樹脂と十分に接着できない。一方、平均粗さRzが1.3μm超であると、銅箔をエッチングで除去した後の樹脂表面の凹凸が大きくなり、その結果樹脂の光透過性が不良となる。粗化処理表面の平均粗さRzは、0.5〜1.1μmが好ましく、0.6〜0.9μmがより好ましい。
[Surface roughness Rz]
In the surface-treated copper foil of the present invention, roughened particles are formed on the surface of the copper foil by a roughening treatment, and the average roughness Rz of the roughened surface is 0.5 to 1.3 μm. With such a configuration, the peel strength is increased and the resin is satisfactorily adhered to the resin, and the light transmittance of the resin after the copper foil is removed by etching is improved. As a result, it is easy to perform alignment and the like when mounting an IC chip through a positioning pattern that is visible through the resin. When the average roughness Rz is less than 0.5 μm, the copper foil surface is not sufficiently roughened and cannot be sufficiently bonded to the resin. On the other hand, if the average roughness Rz is more than 1.3 μm, the unevenness of the resin surface after the copper foil is removed by etching becomes large, and as a result, the light transmittance of the resin becomes poor. The average roughness Rz of the roughened surface is preferably 0.5 to 1.1 μm, and more preferably 0.6 to 0.9 μm.

〔光透過率〕
本発明の表面処理銅箔は、上述のように粗化処理表面の平均粗さRzが制御されているため、樹脂基板に貼り合わせた後、銅箔を除去した部分の樹脂基板の光透過率が良好となる。具体的には、本発明の表面処理銅箔は、粗化処理表面側から厚さ50μmの樹脂基板の両面に貼り合わせた後、エッチングで当該銅箔を除去したとき、樹脂基板の光透過率が30%以上、好ましくは50%以上であってもよい。
(Light transmittance)
Since the average roughness Rz of the roughened surface is controlled as described above, the surface-treated copper foil of the present invention has a light transmittance of the resin substrate in a portion where the copper foil is removed after being bonded to the resin substrate. Becomes better. Specifically, when the surface-treated copper foil of the present invention is bonded to both surfaces of a 50 μm thick resin substrate from the surface of the roughened surface, the light transmittance of the resin substrate is removed when the copper foil is removed by etching. May be 30% or more, preferably 50% or more.

〔光沢度〕
表面処理銅箔の粗化面の光沢度は、上述の樹脂の光透過率に大いに影響を及ぼす。すなわち、粗化面の光沢度が大きい銅箔ほど、上述の樹脂の透過率が良好となる。このため、本発明の表面処理銅箔は、粗化面の光沢度が0.5〜68であり、1.0〜40であるのが好ましく、4.8〜35であるのがより好ましい。
[Glossiness]
The glossiness of the roughened surface of the surface-treated copper foil greatly affects the light transmittance of the above resin. That is, the higher the glossiness of the roughened surface, the better the transmittance of the resin described above. For this reason, the glossiness of the roughened surface of the surface-treated copper foil of the present invention is 0.5 to 68, preferably 1.0 to 40, and more preferably 4.8 to 35.

〔粒子の表面積〕
粗化粒子の表面積Aと、粗化粒子を銅箔表面側から平面視したときに得られる面積Bとの比A/Bは、上述の樹脂の光透過率に大いに影響を及ぼす。すなわち、表面粗さRzが同じであれば、比A/Bが小さい銅箔ほど、上述の樹脂の透過率が良好となる。このため、本発明の表面処理銅箔は、当該比A/Bが2.00〜2.45であり、2.00〜2.30であるのが好ましく、2.00〜2.15であるのがより好ましい。
[Particle surface area]
The ratio A / B between the surface area A of the roughened particles and the area B obtained when the roughened particles are viewed in plan from the copper foil surface side greatly affects the light transmittance of the resin. That is, if the surface roughness Rz is the same, the smaller the ratio A / B, the better the transmittance of the resin described above. For this reason, the surface-treated copper foil of the present invention has a ratio A / B of 2.00 to 2.45, preferably 2.00 to 2.30, and preferably 2.00 to 2.15. Is more preferable.

粒子形成時の電流密度とメッキ時間とを制御することで、粒子の形態や形成密度が決まり、上記表面粗さRz、光沢度及び粒子の面積比A/Bを制御することができる。   By controlling the current density and the plating time during particle formation, the particle morphology and formation density are determined, and the surface roughness Rz, glossiness, and particle area ratio A / B can be controlled.

本発明の表面処理銅箔を、粗化処理面側から樹脂基板に貼り合わせて銅張積層体を製造することができる。樹脂基板はプリント配線板等に適用可能な特性を有するものであれば特に制限を受けないが、例えば、リジッドPWB用に紙基材フェノール樹脂、紙基材エポキシ樹脂、合成繊維布基材エポキシ樹脂、ガラス布・紙複合基材エポキシ樹脂、ガラス布・ガラス不織布複合基材エポキシ樹脂及びガラス布基材エポキシ樹脂等を使用し、FPC用にポリエステルフィルムやポリイミドフィルム等を使用する事ができる。   The surface-treated copper foil of the present invention can be bonded to a resin substrate from the roughened surface side to produce a copper-clad laminate. The resin substrate is not particularly limited as long as it has characteristics applicable to a printed wiring board or the like. For example, a paper base phenol resin, a paper base epoxy resin, a synthetic fiber cloth base epoxy resin for rigid PWB Glass cloth / paper composite base material epoxy resin, glass cloth / glass nonwoven fabric composite base material epoxy resin, glass cloth base material epoxy resin, etc. can be used, and polyester film, polyimide film, etc. can be used for FPC.

貼り合わせの方法は、リジッドPWB用の場合、ガラス布などの基材に樹脂を含浸させ、樹脂を半硬化状態まで硬化させたプリプレグを用意する。銅箔を被覆層の反対側の面からプリプレグに重ねて加熱加圧させることにより行うことができる。   In the case of the rigid PWB, a prepreg is prepared by impregnating a base material such as a glass cloth with a resin and curing the resin to a semi-cured state. It can be carried out by superposing a copper foil on the prepreg from the opposite surface of the coating layer and heating and pressing.

本発明の銅張積層体は各種のプリント配線板(PWB)に使用可能であり、特に制限されるものではないが、例えば、導体パターンの層数の観点からは片面PWB、両面PWB、多層PWB(3層以上)に適用可能であり、絶縁基板材料の種類の観点からはリジッドPWB、フレキシブルPWB(FPC)、リジッド・フレックスPWBに適用可能である。   The copper-clad laminate of the present invention can be used for various printed wiring boards (PWB) and is not particularly limited. For example, from the viewpoint of the number of layers of the conductor pattern, single-sided PWB, double-sided PWB, and multilayer PWB It can be applied to (three or more layers), and can be applied to rigid PWB, flexible PWB (FPC), and rigid flex PWB from the viewpoint of the type of insulating substrate material.

実施例1〜15及び比較例1〜8として、銅箔を準備し、一方の表面に、粗化処理として表1〜4に記載の条件にてめっき処理を行った。ここで、実施例1〜12、比較例2〜6、8の銅箔としてJX日鉱日石金属社製タフピッチ銅(JIS H3100 C1100R)の圧延銅箔を用いた。また、実施例13〜15、比較例1、7の銅箔として、JX日鉱日石金属社製電解銅箔HLPLC箔を用いた。   Copper foil was prepared as Examples 1-15 and Comparative Examples 1-8, and the plating process was performed on the conditions of Tables 1-4 as a roughening process on one surface. Here, as copper foils of Examples 1 to 12 and Comparative Examples 2 to 6 and 8, rolled copper foil of tough pitch copper (JIS H3100 C1100R) manufactured by JX Nippon Mining & Metals was used. Moreover, as copper foil of Examples 13-15 and Comparative Examples 1 and 7, the electrolytic copper foil HLPLC foil by JX Nippon Mining & Metals was used.

上述のようにして作製した実施例及び比較例の各サンプルについて、各種評価を下記の通り行った。
(1)表面粗さ(Rz)の測定;
株式会社小阪研究所製接触粗さ計SP−11を使用してJIS B0601−1994に準拠して十点平均粗さを粗化面について測定した。測定基準長さ0.8mm、評価長さ4mm、カットオフ値0.8mm、送り速さ0.1mm/秒の条件で圧延方向と平行に測定位置を変えて10回行い、10回の測定での値を求めた。
Various evaluation was performed as follows about each sample of the Example and comparative example which were produced as mentioned above.
(1) Measurement of surface roughness (Rz);
Using a contact roughness meter SP-11 manufactured by Kosaka Laboratories, ten-point average roughness was measured for the roughened surface in accordance with JIS B0601-1994. The measurement position was changed 10 times in parallel with the rolling direction under the conditions of a measurement standard length of 0.8 mm, an evaluation length of 4 mm, a cut-off value of 0.8 mm, and a feed rate of 0.1 mm / sec. The value of was obtained.

(2)粒子の面積比(A/B);
粗化粒子の表面積はレーザー顕微鏡による測定法を使用した。株式会社キーエンス製レーザーマイクロスコープVK8500を用いて粗化処理面の100×100μm相当面積(実データでは9924.4μm2)における三次元表面積Aを測定して、三次元表面積A÷二次元表面積B=面積比(A/B)とする手法により設定を行った。
(2) Particle area ratio (A / B);
The surface area of the roughened particles was measured by a laser microscope. Using a laser microscope VK8500 manufactured by Keyence Corporation, the three-dimensional surface area A in an area equivalent to 100 × 100 μm of the roughened surface (992.44.4 μm 2 in actual data) is measured, and the three-dimensional surface area A ÷ two-dimensional surface area B = Setting was performed by a method of obtaining an area ratio (A / B).

(3)光沢度;
JIS Z8741に準拠した日本電色株式会社製光沢度計ハンディーグロスメーターPG−1を使用し、圧延方向に直角な方向の入射角60度で粗化面について測定した。
(3) Glossiness;
A roughened surface was measured at an incident angle of 60 degrees perpendicular to the rolling direction using a gloss meter PG-1 manufactured by Nippon Denshoku Co., Ltd. in accordance with JIS Z8741.

(4)光透過率;
銅箔をラミネート用熱硬化性接着剤付きポリイミドフィルム(厚み50μm)の両面に貼り合せ、銅箔をエッチング(塩化第二鉄水溶液)で除去してサンプルフィルムを作成した。得られた樹脂層に対し、日本分光株式会社製分光光度計V−660を用いて、スリット10mmで、波長620nmの設定により光透過率を測定した。
(4) Light transmittance;
The copper foil was bonded to both surfaces of a polyimide film with a thermosetting adhesive for lamination (thickness 50 μm), and the copper foil was removed by etching (ferric chloride aqueous solution) to prepare a sample film. With respect to the obtained resin layer, the light transmittance was measured using a spectrophotometer V-660 manufactured by JASCO Corporation with a slit of 10 mm and a wavelength of 620 nm.

(5)視認性(樹脂透明性);
銅箔をラミネート用熱硬化性接着剤付きポリイミドフィルム(厚み50μm)の両面に貼り合わせ、銅箔をエッチング(塩化第二鉄水溶液)で除去してサンプルフィルムを作成した。得られた樹脂層の一面に印刷物を貼り付け、反対面から樹脂層越しに印刷物の視認性を判定した。印刷物の輪郭がはっきりしたものを「○」(合格)、輪郭が崩れたものを「×」(不合格)と評価した。
(5) Visibility (resin transparency);
The copper foil was bonded to both surfaces of a polyimide film with a thermosetting adhesive for lamination (thickness 50 μm), and the copper foil was removed by etching (ferric chloride aqueous solution) to prepare a sample film. The printed material was attached to one surface of the obtained resin layer, and the visibility of the printed material was judged from the opposite surface through the resin layer. The printed product with a clear outline was evaluated as “◯” (passed), and the printed outline was evaluated as “x” (failed).

(6)ピール強度(接着強度);
PC−TM−650に準拠し、引張り試験機オートグラフ100で常態ピール強度を測定し、上記常態ピール強度が0.7N/mm以上を銅張積層基板用途に使用できるものとした。
上記各試験の条件及び評価を表5に示す。
(6) Peel strength (adhesive strength);
In accordance with PC-TM-650, the normal peel strength was measured with a tensile tester Autograph 100, and the normal peel strength of 0.7 N / mm or more could be used for copper-clad laminate applications.
Table 5 shows the conditions and evaluation of each test.

(評価結果)
実施例1〜15は、いずれも透過率、視認性及びピール強度が良好であった。
比較例1、2、5は、粗化処理表面の平均粗さRzが1.3μm超であったため、透過率が不良であった。
比較例3は、光沢度が68超であったため、ピール強度が不良であった。
比較例4は、面積比A/Bが2.00未満であったため、ピール強度が不良であった。
比較例6は、粗化処理表面の平均粗さRzが0.5μm未満であったため、ピール強度が不良であった。
比較例7は、光沢度が0.5未満であったため、透過率が不良であった。
比較例8は、面積比A/Bが2.45超であったため、透過率が不良であった。
図1に、上記視認性評価の際の、(a)比較例1、(b)実施例1、(c)実施例2、(d)実施例7、(e)実施例3の印刷物の観察写真をそれぞれ示す。
図2に、上記Rz評価の際の、(a)比較例1、(b)実施例1、(c)実施例2、(d)実施例7、(e)実施例3の銅箔表面のSEM観察写真をそれぞれ示す。
(Evaluation results)
Examples 1 to 15 all had good transmittance, visibility, and peel strength.
In Comparative Examples 1, 2, and 5, since the average roughness Rz of the roughened surface was more than 1.3 μm, the transmittance was poor.
Since the comparative example 3 had a glossiness of more than 68, the peel strength was poor.
In Comparative Example 4, since the area ratio A / B was less than 2.00, the peel strength was poor.
In Comparative Example 6, since the average roughness Rz of the roughened surface was less than 0.5 μm, the peel strength was poor.
Since the comparative example 7 had a glossiness of less than 0.5, the transmittance was poor.
In Comparative Example 8, since the area ratio A / B was more than 2.45, the transmittance was poor.
FIG. 1 shows the printed matter of (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7, and (e) Example 3 in the above-described visibility evaluation. Each photo is shown.
FIG. 2 shows (a) Comparative Example 1, (b) Example 1, (c) Example 2, (d) Example 7, and (e) Example 3 of the copper foil surface in the above Rz evaluation. SEM observation photographs are shown respectively.

Claims (9)

銅箔表面に粗化処理により粗化粒子が形成され、粗化処理表面の平均粗さRzが0.5〜1.3μmであり、粗化処理表面の光沢度が0.5〜68であり、
前記粗化粒子の表面積Aと、前記粗化粒子を前記銅箔表面側から平面視したときに得られる面積Bとの比A/Bが2.00〜2.45である銅張積層板用表面処理銅箔。
Roughening particles are formed on the surface of the copper foil by roughening treatment, the average roughness Rz of the roughening treatment surface is 0.5 to 1.3 μm, and the glossiness of the roughening treatment surface is 0.5 to 68. ,
For a copper clad laminate in which the ratio A / B between the surface area A of the roughened particles and the area B obtained when the roughened particles are viewed in plan from the copper foil surface side is 2.00 to 2.45. Surface treated copper foil.
前記平均粗さRzが0.5〜1.1μmである請求項1に記載の銅張積層板用表面処理銅箔。   The surface-treated copper foil for copper clad laminates according to claim 1, wherein the average roughness Rz is 0.5 to 1.1 µm. 前記平均粗さRzが0.6〜0.9μmである請求項2に記載の銅張積層板用表面処理銅箔。   The surface-treated copper foil for copper-clad laminate according to claim 2, wherein the average roughness Rz is 0.6 to 0.9 µm. 前記光沢度が1.0〜40である請求項1〜3のいずれかに記載の銅張積層板用表面処理銅箔。   The surface-treated copper foil for a copper-clad laminate according to any one of claims 1 to 3, wherein the glossiness is 1.0 to 40. 前記光沢度が4.8〜35である請求項4に記載の銅張積層板用表面処理銅箔。   The surface-treated copper foil for a copper-clad laminate according to claim 4, wherein the glossiness is 4.8 to 35. 前記A/Bが2.00〜2.30である請求項1〜5のいずれかに記載の銅張積層板用表面処理銅箔。   Said A / B is 2.00-2.30, The surface-treated copper foil for copper clad laminated boards in any one of Claims 1-5. 前記A/Bが2.00〜2.15である請求項6に記載の銅張積層板用表面処理銅箔。   The surface-treated copper foil for a copper clad laminate according to claim 6, wherein the A / B is 2.00 to 2.15. 前記銅箔を、粗化処理表面側から厚さ50μmの樹脂基板の両面に貼り合わせた後、エッチングで前記銅箔を除去したとき、前記樹脂基板の光透過率が30%以上となる請求項1〜7のいずれかに記載の銅張積層板用表面処理銅箔。   The light transmittance of the resin substrate becomes 30% or more when the copper foil is removed by etching after bonding the copper foil to both surfaces of a 50 μm thick resin substrate from the surface of the roughening treatment. The surface-treated copper foil for copper clad laminated boards in any one of 1-7. 請求項1〜8のいずれかに記載の表面処理銅箔と樹脂基板とを積層して構成した銅張積層板。   The copper clad laminated board comprised by laminating | stacking the surface treatment copper foil and resin substrate in any one of Claims 1-8.
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KR102274906B1 (en) 2016-09-12 2021-07-09 후루카와 덴키 고교 가부시키가이샤 Copper foil and copper clad laminate having the same
JP2018090906A (en) * 2016-12-06 2018-06-14 Jx金属株式会社 Surface-treated copper foil, copper foil with carrier, laminate, method for producing printed wiring board, and method for producing electronic device
JP7492807B2 (en) 2016-12-06 2024-05-30 Jx金属株式会社 Surface-treated copper foil, carrier-attached copper foil, laminate, method for manufacturing printed wiring board, and method for manufacturing electronic device
JP2018172782A (en) * 2017-03-31 2018-11-08 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, laminate, method for producing printed wiring board and method for producing electronic apparatus
JP2018172785A (en) * 2017-03-31 2018-11-08 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, copper foil with carrier, laminate, method for producing printed wiring board and method for producing electronic apparatus
JP7356209B2 (en) 2017-03-31 2023-10-04 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, copper foil with carrier, laminate, method for manufacturing printed wiring boards, and method for manufacturing electronic devices
JP7492808B2 (en) 2017-03-31 2024-05-30 Jx金属株式会社 Surface-treated copper foil, surface-treated copper foil with resin layer, copper foil with carrier, laminate, method for manufacturing printed wiring board, and method for manufacturing electronic device

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KR20150103306A (en) 2015-09-09
TWI460068B (en) 2014-11-11
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KR102066316B1 (en) 2020-01-14
TW201343381A (en) 2013-11-01

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