TW201302367A - 輸送焊料球體之方法及裝置 - Google Patents
輸送焊料球體之方法及裝置 Download PDFInfo
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3478—Applying solder preforms; Transferring prefabricated solder patterns
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0607—Solder feeding devices
- B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L24/742—Apparatus for manufacturing bump connectors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/11001—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate
- H01L2224/11003—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate for holding or transferring the bump preform
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
- H01L2224/11334—Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/041—Solder preforms in the shape of solder balls
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/08—Treatments involving gases
- H05K2203/082—Suction, e.g. for holding solder balls or components
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Abstract
本發明係關於一種用於輸送焊料球體(110)之方法,其包含以下步驟:-球體室(102)中提供複數個焊料球體(110),-氮氣吹送至該球體室(102)中,以使得該等焊料球體(110)輸送朝向工具板(104),及-該等焊料球體(110)定位於該工具板(104)上之期望位置處。
Description
本發明係關於一種用於輸送焊料球體之方法及裝置。
焊料凸塊係一廣泛用於IC封裝中之技術。焊料凸塊通常係自相應焊料球體在欲與其他主動或被動裝置電接觸之晶圓或其他基板之表面上以期望圖案形成。焊料凸塊係經接合以接觸晶圓或基板(或任何其他晶片或半導體裝置)之墊且隨後用於面向下接合(face-down bonding)之焊料之小球體。可藉助(例如)將焊料球體置於晶片或工具板上並使焊料球體與基板上之接觸墊對準,並(例如)於爐中回焊焊料球體來生成焊料凸塊並建立晶片與基板之間之接合,來最小化(例如)晶片與基板之間之電連接長度。該方法提供具有小的寄生電感及電容之極佳電連接,且接觸墊亦分佈於整個晶片表面上且並不像線接合技術中常見的那樣侷限於邊緣。因此,可更有效地使用矽區域並可增加互連件之最大數。而且,信號互連件縮短。
焊料凸塊技術通常用於倒裝技術(flip chip technology)、晶圓級封裝及球柵陣列技術來提供(例如)兩個基板或晶片之間之互連件。通常,使用用於在半導體晶圓上製作焊料凸塊之三種方法中之一者,即,焊料膏印刷、電鍍或凸塊球體轉印。後者由於其凸塊大小之靈活性及高操作良率而廣泛使用。
通常,藉由降低至球體室中之工具板來拾取球體室中所
提供之焊料球體。將真空施加於工具板以選擇性拾取球體。工具板包含許多以對應於球體欲定位於晶圓或基板上之圖案之圖案佈置之真空孔。為確保每一真空孔可成功拾取一個球體,在球體室內提供構件以提供具有連續運動之焊料球體。
此等構件可係(例如)工具板上或球體室中之超音波振動構件,藉助該等構件使焊料球體保持移動直至其被吸至真空孔上為止。提供球體之此移動之其他可能性係(例如)自室底部將空氣吹送至球體室中以賦予球體移動,以使該等球體可更容易地由工具板拾取。另外,球體之移動及球體間發生之碰撞亦幫助移除一個真空孔中之額外球體。但另一方面,此空氣吹送可導致或加速焊料球體表面之氧化,尤其由於個別球體彼此摩擦接觸之事實。氧化導致在隨後回焊製程中由於(例如)冷連接效應(cold joint effect)、非潤濕效應(non-wetting effect)而使焊接效率降低。
因此,本發明尋找避免或最小化與焊料球體自球體室輸送至工具板相關之氧化效應。
該目標係藉由一種用於輸送焊料球體之包含技術方案1之特徵之方法及一種包含技術方案7之特徵之相應裝置來達成。
藉由將氮吹送至球體室中以使得焊料球體推動或輸送朝向工具板,可避免與用於達成該輸送之先前已知方法相關之負面效應。由於球體室內存在氮(即,產生氮氛圍),因
此可避免與焊料球體之摩擦移動相關之氧化負面效應。本發明提供一種將焊料球體輸送至工具板上之期望位置上之簡單有效方式。
本發明之有利實施例係附屬項之標的物。
根據特別佳之實施例,提供多孔板(例如由陶瓷製成),經由其吹送氮氣。此多孔板有效作為氮氣擴散器,以致經由該板吹送之氮均勻分佈,從而提供平滑氣流,此對於藉由工具板拾取球體係有用的。
若焊料球體於球體室中經受超音波振動亦係有利的。此超音波振動支持由氮氣流提供之焊料球體之移動。由於球體室中存在氮,因此可避免先前技術中所觀察到之與此超音波振動相關之缺點。
有利地,將氮氣自球體室之下部側或自底部吹送至球體室中,並將工具板定位於球體室之上部側或頂部側。因此,可在基本上對應於工具板之整個區域之區域上提供平穩氮氣流。
根據本發明之較佳實施例,焊料球體之定位於工具板上係藉由設有工具板之真空構件來達成。有利地,工具板具有直徑略小於焊料球體直徑之真空孔。真空構件於該等真空孔處產生負壓,以使得焊料球體可被捕獲於真空孔之位置處。
方便地,根據本發明之方法進一步包含,當焊料球體位於工具板上之期望位置處時,將工具板佈置於晶圓或基板上以使得焊料球體與晶圓或基板上之接觸墊對準,之後焊
料球體由工具板釋放,且隨後使焊料球體回焊。
自附圖之描述本發明之其他優勢將變得顯而易見。
應注意,先前提及之特徵及欲在下文進一步闡述之特徵既可用於各別指示之組合中,亦可用於其他組合中或單獨使用,此並不背離本發明之範圍。
本發明之裝置展示於圖1中且通常指定為100。裝置100包含球體室102,其中提供複數個球體110。球體室可充當球體110之儲存室。
在球體室102之上方或上部部分(即,在其上部側)提供工具板104,工具板104可降低至球體室102中。工具板104提供有真空構件106,藉助該真空構件可為工具板104中提供之真空孔104a提供負壓或真空,該負壓或真空充當球體室102內焊料球體110之捕獲力,以使得每一真空孔104a可填充有一個焊料球體110。真空孔104a之直徑係經選擇為略小於焊料球體110之直徑。
當工具板位於基板上且焊料球體與相應墊對準時(未圖示),藉由在隨後階段關閉真空構件,焊料球體可自工具板釋放。
為支持焊料球體110朝向工具板104中之真空孔104a移動,提供氣體吹送構件112(藉助箭頭示意性展示)。吹送構件經由球體室102中之下部側中所提供之孔或噴嘴102a將氮吹送至球體室中。
除此之外,可對工具板104及/或球體室102提供超音波
振動構件,其亦可賦予或支持焊料球體朝向真空孔104a之移動。此超音波振動構件經示意性展示為雙箭頭114(對於工具板104)及116(對於球體室102)。
藉由將氮吹送至球體室102中,在球體室內產生氮氛圍(即,將氧推出該室),以致可避免由於焊料球體之摩擦移動所引起之氧化效應。
總而言之,藉助朝向工具板之氮氣流,推動焊料球體朝向工具板,且在開啟真空構件106之情況下可捕獲於真空孔104a中。
為提供尤其平穩且均勻之氮氣流,在球體室102中在球體室之下部側與工具板104之間提供多孔板120。板120中之小孔經定尺寸以使其可充當氮氣擴散器,該擴散器產生所期望之平穩且均勻氮氣流。此平穩且均勻的流有助於藉由工具板有效拾取焊料球體。
藉助將氮氣吹送至球體室中,可稀釋或去除室之任何氧含量,以便有效避免由球體室中存在之氧所誘導之任何負面效應。
涉及焊料凸塊接合之其他步驟係眾所周知的,且將不予詳細闡述。只談當所有真空孔由焊料球體佔據時,移動工具板以與晶圓或基板對準,該晶圓或基板在對應於工具板上之焊料球體位置(即,真空孔之位置)之位置提供有接觸墊。藉由關閉或去啟動真空構件,使焊料球體自工具板釋放且放置於接觸墊上。有利地,接觸墊已準備有助銲劑。隨後,可使焊料球體回焊,由此於所期望位置處提供焊料
凸塊。
100‧‧‧裝置
102‧‧‧球體室
102a‧‧‧孔/噴嘴
104‧‧‧工具板
104a‧‧‧真空孔
106‧‧‧真空構件
110‧‧‧焊料球體
112‧‧‧氣體吹送構件
114‧‧‧超音波振動構件
116‧‧‧超音波振動構件
120‧‧‧多孔板
圖1展示根據發明之用於輸送焊料球體之裝置之較佳實施例的示意性側視圖。
100‧‧‧裝置
102‧‧‧球體室
102a‧‧‧孔/噴嘴
104‧‧‧工具板
104a‧‧‧真空孔
106‧‧‧真空構件
110‧‧‧焊料球體
112‧‧‧氣體吹送構件
114‧‧‧超音波振動構件
116‧‧‧超音波振動構件
120‧‧‧多孔板
Claims (9)
- 一種用於輸送焊料球體(110)之方法,其包含以下步驟:在球體室(102)中提供複數個焊料球體(110),將氮氣吹送至該球體室(102)中,以使得該等焊料球體(110)輸送朝向工具板(104),及將該等焊料球體(110)定位於該工具板(104)上之期望位置處。
- 如請求項1之方法,其中將該氮氣經由多孔板(120)吹送朝向該工具板。
- 如請求項1或2之方法,其中該等焊料球體(110)經受該球體室(102)中藉由超音波振動構件(114,116)引起之超音波振動。
- 如請求項1或2之方法,其中該氮氣經由在該球體室(102)之下部側之孔(102a)吹送至該球體室(102)中,且該工具板(104)係定位於該球體室(102)之上部側。
- 如請求項1或2之方法,其中該等焊料球體(110)之定位在該工具板(104)上係藉由設有該工具板(104)之真空構件(106)達成。
- 如請求項1或2之方法,其中,當該等焊料球體(110)定位於該等期望位置處時,將該工具板(104)佈置於晶圓或基板上,以使得該等焊料球體(110)與該晶圓或基板上之接觸墊對準,使該等焊料球體(110)由該工具板(104)釋放,且隨後使該等焊料球體回焊。
- 一種用於輸送焊料球體之裝置,其包含球體室(102),於 其中可提供複數個焊料球體(110);用於將氮氣吹送至該球體室中之構件(112);及工具板(104),該等焊料球體可藉助吹送至該球體室(102)中之該氮氣輸送至該工具板上之期望位置。
- 如請求項7之裝置,其包含佈置於該用於將氮吹送至該球體室(102)中之構件(112)與該工具板(104)之間之多孔板(120)。
- 如請求項7或8之裝置,其中該工具板包含真空構件(106),其用於當開啟該等真空構件(106)時,將焊料球體(110)捕獲於該工具板上之該等期望位置處,藉由關閉該等真空構件(106)或減少由該等真空構件(106)所提供之作用於該等焊料球體之真空可使該等焊料球體自該工具板釋放。
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PCT/CN2011/074378 WO2012159241A1 (en) | 2011-05-20 | 2011-05-20 | Method and device for transporting solder spheres |
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TW201302367A true TW201302367A (zh) | 2013-01-16 |
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TW101117874A TW201302367A (zh) | 2011-05-20 | 2012-05-18 | 輸送焊料球體之方法及裝置 |
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EP (1) | EP2710630A4 (zh) |
CN (1) | CN103548128A (zh) |
TW (1) | TW201302367A (zh) |
WO (1) | WO2012159241A1 (zh) |
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CN104384656B (zh) * | 2014-10-22 | 2016-03-23 | 苏州大学 | 一种用于铺设二极管焊锡片的机械手 |
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US5680984A (en) * | 1994-05-13 | 1997-10-28 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for mounting soldering balls onto surfaces of electronic components |
US5657528A (en) * | 1994-08-25 | 1997-08-19 | Matsushita Electric Industrial Co., Ltd. | Method of transferring conductive balls |
JP2926308B2 (ja) * | 1995-03-24 | 1999-07-28 | 澁谷工業株式会社 | ハンダボール供給方法 |
JP3120714B2 (ja) * | 1995-10-31 | 2000-12-25 | 松下電器産業株式会社 | 導電性ボールの搭載装置 |
JP2002093836A (ja) * | 2000-09-13 | 2002-03-29 | Ueno Seiki Kk | 金属球の搭載装置および搭載方法 |
JP2002093843A (ja) * | 2000-09-20 | 2002-03-29 | Ueno Seiki Kk | 金属球の搭載装置および搭載方法 |
JP4053940B2 (ja) * | 2003-07-28 | 2008-02-27 | 新日鉄マテリアルズ株式会社 | 微細導電性ボールの収容容器及び収容方法、微細導電性ボールの配列搭載装置及び配列搭載方法 |
KR101522434B1 (ko) * | 2007-01-24 | 2015-05-21 | 팩 테크-패키징 테크놀로지스 게엠베하 | 레이저 에너지로 땜납 볼 대형의 접촉, 배치 및 충격하는 방법 및 장치 |
US8012866B2 (en) * | 2008-05-30 | 2011-09-06 | Asm Assembly Automation Ltd | Method of bonding semiconductor devices utilizing solder balls |
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- 2011-05-20 EP EP11866365.7A patent/EP2710630A4/en not_active Withdrawn
- 2011-05-20 WO PCT/CN2011/074378 patent/WO2012159241A1/en active Application Filing
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EP2710630A1 (en) | 2014-03-26 |
CN103548128A (zh) | 2014-01-29 |
EP2710630A4 (en) | 2014-11-05 |
WO2012159241A1 (en) | 2012-11-29 |
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