TW201220451A - characterized by using plasma to clean the core surface prior to coating a plating on the core - Google Patents
characterized by using plasma to clean the core surface prior to coating a plating on the core Download PDFInfo
- Publication number
- TW201220451A TW201220451A TW099138388A TW99138388A TW201220451A TW 201220451 A TW201220451 A TW 201220451A TW 099138388 A TW099138388 A TW 099138388A TW 99138388 A TW99138388 A TW 99138388A TW 201220451 A TW201220451 A TW 201220451A
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- silver
- core
- core wire
- wire
- alloy
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- Wire Bonding (AREA)
Description
201220451 六、發明說明: 【發明所屬之技術領域】 本發明係有關於封裝用之導線,特別是指一種封裝用 導線及其製造方法,可快速且完全地將芯線表面清洗乾 淨’並可使鍍層穩固地被覆於芯線外。 【先前技術】 習知封裝用導線以純金線為主,金線在封裝應用上具 • 有良好的電性及穩定的作業性,然而近來因金線成本價格 大漲,致使業界開始尋求替代金線之材料。在電性上具有 良好特性的銅及銀為目前業界嘗試用來取代金的主要標 的,但純銅及純銀線易受溫度及濕度影響,致使在保存及 封裝作業上不如金線之穩定,造成封裝良率的降低,遂有 表面加以鍍層被覆的複合導線產生,鍍層可形成有效保 °蒦,使複合導線達到與金線相當的特性功能。 _ 習知封裝用導線之製造方法是先取一芯線,進行脫脂 處理(degrease)以去除芯線表面之油汙,並以水沖洗後,再 以酸性藥水進行活化處理(acidactive),以及二次水洗,接 著再於忍線表面以電鑛方式形成一鍍層。惟,形成鍍層前 所進行之脫脂與活化處理,不僅費事,且常因藥水效性變 異,無法完全將芯線表面清潔乾淨,影響鍍層之附著性, 造成鍍層可能意外脫落,並導致封裝導線功能失效。 【發明内容】 201220451 有鑑於此,本發明之主要目的在於提供一種封裝用導 線及其製造方法,可㈣且完全地㈣線表面清洗乾淨, 並可使鍍層穩固地被覆於芯線外。 為達成上揭目的,本發明所提供之封裝用導線包含有 一芯線與一鍍層,該芯線係由銀、銀-金合金、銀-銅合金、 銀-纪合金、銅、IS或其合金所製成,賴層被覆於該芯線 表面且由金、銀、鈀、鉑、釕、鎳或其合金所製成。 本發明所提供之封襞用導線之製造方法包含有以下步 驟.(a)將一芯線通過一反應室,於該反應室中產生電漿以 清潔該芯線表面;以及(b)於該芯線表面被覆一鍍層。 由於電漿可快速且完全地將芯線表面清洗乾淨並加以 活化,故鍍層可穩固地被覆於芯線表面而不易脫落。 【實施方式】 為了詳細說明本發明之結構、特徵及功效所在,茲列 舉一較佳實施例並配合下列圖式說明如後。 第一圖為本發明一較佳實施例之產品立體圖; 第二圖為本發明一較佳實施例之製造方法示意圖。 請參閱第一圖,為本發明一較佳實施例所提供之製造 方法所製成之封裝用導線10,該導線丨〇具有一芯線12以 及一鍵層14 ’該芯線12直徑為o oioomm〜0.0508mm,該 鍵層14厚度則為5nm〜0.001mm,該芯線12係由銀、銅、 鋁或其合金所製成;或者’該芯線可由銀-金合金所製成, 其中金之含量為l〇ppm〜4〇 wt% ;又,該芯線可由銀·銅合 201220451 金所製成,其中銅之含量為10 PPm〜10 wt% :另’該芯線 亦可由銀-鈀合金所製成,其中鈀之含量為10 ppm〜35 wt%。而該鍍層則可由金、銀、鈀、鉑、釕、鎳或其合金 所製成。 如第二圖所杀,該封裝用導線10之製造方法係先將該 芯線12通過一反應室20 ’將氮氣與3°/◦以下氫氣之混合氣 體以每分鐘10扑之流量通入該反應室20中’利用一電源 施以電壓以生成電漿,該電漿即可轟擊該芯線12表面進行 • 清潔、活化處理,完成表面清潔處理後的芯線丨2可直接以 濺鍍或電鍍方式於該芯線12表面被覆一鍍層Η ’即完成 封裝用導線1〇之製造程序。 由於本發明所提供之製造方法利用電漿清洗芯線 12,不僅快速,清潔更為確實。芯線12採捲對捲(Roll t0 Roll) 方式進出反應室20 ’放線速度(wire speed)每分鐘可達三百 来以上,芯線12在反應室20僅需幾亳秒時間即可完全將 φ 芯線12表面之雜質如碳、氧或有機物質去除殆盡,非常適 合封裝用導線10之生產。芯線12進行鍍層14被覆作業後 所形成之導線10,其鍍層14與芯線12之結合性極佳,即 使針對導線10進行後續加工如拉伸處理,鍍層14亦不易 意外脫落。 〃需特別說明的是,形成電漿之氣體可依需要採用氣 氣氯氣、氫氣或其混合氣體,而於这線表面被覆錄層之 方法亦可採用電鍍、濺鑛、蒸錢、化學蒸汽沉積或其複合 方式’其他等效步驟的替代或變化,亦應為本案之申請專 201220451 利範圍所涵蓋。 201220451 【圖式簡單說明】 第一圖為本發明一較佳實施例之產品立體圖; 第二圖為本發明一較佳實施例之製造方法示意圖。 【主要元件符號說明】 10導線 12芯線 14鍍層 20反應室
Claims (1)
- 201220451 七、申請專利範圍: 1. 一種封裝用導線之製造方法,包含有以下步驟: (a) 將一芯線通過一反應室,於該反應室中產生電漿 以清潔該芯線表面;以及 (b) 於該芯線表面被覆一鍍層。 2. 如請求項1所述封裝用導線之製造方法,於步驟(a) 中該電漿係採用氮氣、氬氣、氫氣或其混合氣體所生成。 3. 如請求項1所述封裝用導線之製造方法,於步驟(a) 中係將氮氣與至多3%氫氣之混合氣體以10升/分鐘通入反 應室中,以生成該電漿。 4. 如請求項1所述封裝用導線之製造方法,於步驟(b) 中該鍍層係以電鍍、濺鍍、蒸鍍、化學蒸汽沉積或其複合 方式被覆於芯線表面。 5. —種封裝用導線,包含有: 一芯線,係由銀、銀-金合金、銀-銅合金、銀-Ιε合金、 銅、鋁或其合金所製成;以及 一鑛層,被覆於該芯線表面,該鍵層係由金、銀、把、 鉑、釕、鎳或其合金所製成。 6. 如請求項5所述之封裝用導線,其中該銀-金合金 中金之含量為10 ppm〜40 wt%。 7. 如請求項5所述之封裝用導線,其中該銀-銅合金 中銅之含量為10ppm〜10wt°/〇。 8. 如請求項5所述之封裝用導線,其中該銀鈀合金 中纪之含量為10 ppm〜35 wt%。
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TW099138388A TW201220451A (en) | 2010-11-08 | 2010-11-08 | characterized by using plasma to clean the core surface prior to coating a plating on the core |
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Cited By (1)
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US10332658B2 (en) | 2013-10-10 | 2019-06-25 | General Cable Technologies Corporation | Method of forming a coated overhead conductor |
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US10332658B2 (en) | 2013-10-10 | 2019-06-25 | General Cable Technologies Corporation | Method of forming a coated overhead conductor |
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