TW201113211A - Testing sorter machine for micro electric sensor elements - Google Patents

Abstract

A testing sorter machine for micro electric sensor elements comprises a feeding device, a receiving device, an angular movement testing device and a conveying device. The feeding device is provided to receive the micro electric sensor elements to be tested. The receiving device is provided to receive the micro electric sensor elements which have been sorted. The angular movement testing device is a multi-axis articulated angular testing machine provided with at least one testing base. The conveying device is provided to take out the micro electric sensor elements to be tested from the feeding device and transfer the micro electric sensor elements to the testing base of the angular testing machine. The angular testing machine moves the testing base and the micro electric sensor element for performing multi-axis angular movement test. After finishing the test, the conveying device takes out the micro electric sensor elements which have been tested from the testing base and places the micro electric sensor elements which have been tested on the receiving device depending on the test result for sorting storage. As such, the arrangement of mechanism is efficiently reduced and facilitates the multi-axis angular movement test for reducing cost and enhancing test quality.

Description

201113211 VI. Description of the Invention: [Technical Field] The present invention provides a test sorting machine that can effectively reduce the configuration of the mechanism and is easy to save cost and improve test quality. 纩, sensing electronic components are produced. After the completion, 'it must be tried to ensure the quality' and the defective products are eliminated. Please refer to the test and classification machine for electronic components, which is provided on the machine 1Q ^11, a plurality of receiving devices 12 and an empty device 13, In the middle, the ^11 series is equipped with micro-sensing electronic components, and the plurality of money-based electronic components are installed in different grades. The rear end of the air Wei-zu is equipped with an angle motion test device 丄4, which is read at the corner. Figure 2 'All angle testers;: Yes, γ (four) _ mechanism and χ axial secrets, the elevator motor 141 is driven by a transmission group 1 4 2 to drive a slab 43 for lifting, = χ axial rotation The mechanism, the Χ axial rotation mechanism is attached to the first frame 145 as an axial rotation angle movement, and is configured to transmit a γ-axis rotation mechanism, and the γ-axis rotary machine motor 14 6 drives the second frame 14 7 as the axial rotation angle of the transport 4 8 , soil 4 7 bearing The test board with a plurality of test sockets 1 4 9 = not,), the tester will then test the results of the second 'profit machine' 1 g on the financial conveying device and then can be used as X-Y-Z axial displacement Second pick and place device 153 at the first - 201113211

The micro-sensing electronic component 16 to be tested is taken out from the stage 15 2 and transferred to the test stand 14 9 of the angle test machine for performing the rotation angle test operation. After the test operation is completed, one can be used as X-Y. The Z-axis displacement third pick-and-place device 15 4 takes the measured micro-sensing electronic component 16 on the test socket 14 9 and transfers it to a second stage 15 5 which can be X-axis displaced. The second stage 15 5 carries the measured micro-sensing electronic component 16 out of the angular motion testing device 14, and a fourth pick-and-placer that can be used for X-γ~Ζ axial displacement is in the second The stage 255 takes out the measured micro-sensing electronic component 16 and sorts it according to the detection result to the receiving device 丄2; however, the angle testing machine must be equipped with a lifting mechanism for assembly and axial rotation. The mechanism and the axial rotation mechanism are used to drive the test seat 14 9 to move up and down, and the X-axis rotation mechanism must be equipped with the axial rotation mechanism, so that the test seat 1 4 g and the sensing electronic component 16 can be used as two The axial rotation angle motion test not only makes the design of each mechanism of the angle tester complicated, but also makes the production cumbersome and time-consuming. Increasing the cost, the test operation is also limited to the χ-γ axial rotation angle test, so that the detection quality helmet method is effectively raised. Furthermore, the conveyor device i 5 must be equipped with the g second pick-and-place device 15 at the angle test machine. 3 and the third pick-and-place device 15 4 are used for respectively picking and dropping the micro-sensing electronic components 16 to be tested/finished, which not only increases the manufacturing cost, but also occupies the space of the machine bench, which is unfavorable for spatial configuration. SUMMARY OF THE INVENTION The object of the present invention is to provide a test device, a receiving device, an angular load test device and a transport device, which are equipped with micro-sensing. The electronic component and the receiving device are equipped with the micro-electronic components of the g-level test, and the limb transport test system is provided with at least the multi-axial articulated angle machine of the test stand, which is transported and recorded in the feeding device. The micro (four) electronic components to be tested 'and transferred to the angle machine test machine that is equipped with _ test stand and micro-electronic components to carry out the classification and collection, which can effectively reduce the organization configuration and simplify the group = ^ ^ 201113211 The practical benefit of saving equipment costs. , the second hair ^:, provide - a kind of micro-sensing electronic component test classification machine on the ^ seat motion test device is attached to - multi-axial joint angle tester ίί spine to make the test seat The electronic components are tested for more than four axes, so that the micro-electronic components can be tested in all directions, and the test operations are not carried out to achieve the practical benefits of improving the test quality. Providing a test sorting machine for micro-sensing electronic components ==_cost and reducing the occupation of machine space by the mechanism, to = [Embodiment] In order to enable the reviewing committee to further understand the present invention and cooperate with the schema For details, please refer to Figure 3: The test section of the present invention is based on the feeding device 30 of the machine 2, the receiving device 40 and the empty device 50, the machine 2 The rear end of 0 is provided with an angle movement device 60, and the ribs micro-electronic component is provided with a conveying device 7〇 on the machine table 20 for the supply and receiving device parts, and the supply core is arranged for 30 At least—recording the micro-sensing electronic disk 3 1 'receiving device 40 is equipped with a plurality of empty trays 4 1 and can be used to classify the finished products to measure the micro-sensing electronic components and defective products. After measuring the micro-inductance = the electronic component and the end of the product, the empty slot is placed in the feeding device 30 empty tray 31 ' or the empty tray 31 is added to the tilting device 4 0 ' Please refer to Figures 4 and 5 for the angle motion test split 6 ' with at least - angle tester 61, the angle tester 6 丄There are a number of axial 'angles of the arm's arm 6 ii, the multi-axis articulated motion mechanism 61 1 can be used for four-axis (such as 乂 γ ζ ζ - $) above the angular movement of the moon' There is a frame 612 for mounting a plurality of test seats 614 of 201113211

The iHL3/ test stand 614 can be a normally closed test stand or a normally open test stand. The test stand 6 1 4 is a normally open test stand, and the support 6 1 moves down the normally open test stand. 6 1 4 inner micro-sensing electronic components are the following pressure positioning micro-sensing electronic components 'if the test seat 6 1 4, , only, ° ° seat, the frame 6 1 2 can be moved down the pressing member 6 1 5, ΐ会ί Move down to open the normally closed test socket for the micro-sensing electronic component to be tested, and then press the lower pressing member 6 1 5 to remove the detachment (4) closed type measurement 'The often difficult test seat will automatically close the micro-sensing electronic components, regardless of the normally closed type of turtle or the constant-open test stand, so that the micro-lying electronic components can be avoided from the rotational angle motion test process from the test stand 6 14 Pulling out, the angular motion mechanism 611 can drive the test 剌丨4 and the micro-sense electronic component to be tested to perform a multi-axis rotational angle motion test operation, and cause the tester (not shown) to transmit the test knot to The central control unit controls the operation of each device by a central control unit, and the transport device 70 includes a carrier The loading mechanism 71 has at least one loading platform, and the supporting mechanism 7 i of the embodiment is provided with a feeding carrier 7丄丄 behind the feeding device 30 for Carrying the micro-sensing electronic component to be tested, and after receiving the device 40, a receiving carrier 7丄2 is provided for carrying the measured micro-sensing electronic component, and the loading mechanism 7 2 is provided with at least The pick-and-place mechanism 7 2 of the embodiment is provided with a first pick-and-placer 721 and a second pick-and-placer 7 2 2, and the first pick-and-placer 7 21 can be used as an X-Y-Z axis. The displacement device is used for picking up the micro-sensing electronic component to be tested/finished between the feeding and receiving device 30, 4Q and the carrying mechanism 71, and the second pick-and-place device 7 2 2 is set at the angle testing machine 61. The frame 612 can be used for Y-Z axial displacement for picking up the micro-sensing electronic components to be tested/finished between the test socket 614 and the support mechanism 71. Referring to Figure 6, the present invention In the initial state, the transfer mechanism 7 2 of the transfer device 7 is axially displaced by the first pick-and-placer 7 2 1 , and the micro-discharge is taken on the tray 31 of the feeding device 30. Sensing the electronic component 81, and Mounted on the feeding stage 711. Please refer to Figures 7, 8, and 9, because the angle tester 61 angles the fresh rod 6 201113211 structure 61 1 can be at least χ - γ - ζ - 0 four axial displacement The mechanism 61 1 can drive the second pick-and-placer 7 2 2 to directly shift to the feeding stage, and the second pick-and-placer 72 2 takes out the micro-sensing electronic component to be tested, to the test stand 614 ' After the test stand 614 is placed on the micro-sensing electronic component 81 to be tested, the lower pressing member 615 moves the depressed micro-sensing electronic component 8 to sense the stable electrical contact of the electronic component 81 with the test seat 6丄4. The kinetic motion mechanism 611 drives the test socket 614 and the micro-sensing electronic component 8 to perform the rotational angle motion θ of θ and causes the test board 6 i 3 to transmit the test signal of the 3 electronic component 8 1 to be tested to the server. The tester then transmits the test result of the micro-sensing electronic component 81 to the central control unit. "' Read the i0 diagram, when the angle tester 61 performs the test operation, the shifting material = 7 2 is the XY-Z axial displacement with the first pick-and-placer 7 2 1 , and the feed device is 30 1 Take out - the micro-sensing electrons to be tested are placed on the feeding stage 7 ! i. The electric cymbal rides W, and the component i1^12 is shown. When the angle tester 61 completes the micro-sensing electronic operation, the lower pressing member 615 is separated from the measured micro-second pick-and-place device 7 2 2 to be the ¥-2 axial direction. Displacement, take out the micro-sensing electronic component 8 i in the ^6 4 4, after that, the angle = structure 61 1 drives the second pick-and-placer 7 2 2 to the receiving stage 7 i 2 The measuring electronic component 8 1 is placed in the drawing. The angular moving mechanism 6 1 1 can further drive the first pick-and-placer 722 to the feeding stage 71 2 to take out the next micro-sensing electronic component 8 to be tested. Work: = 2 1 4, in order to continue the test operation, at this time the seat = the release T for XYZ axial displacement, in the piece ^ ΐ 电子 electronic reading or secondary product micro ❹ m sub-secret), will be completed ί shifting the load to the tray 41 on the receiving _ 4 0 201113211 0 ◦ 2 2 〇 at the end is equipped with a plurality of angular movements: 5: use: test micro-sensing electronic components, and set on the machine 20 Move ^ test ί ί 21 = at the supply and receiving device 3 0, 4 0 and all angles transport two two two sew 6 3 B 2 ◦ C transfer between the measured / completed micro-sensing: Jian? The device 30 is configured to accommodate at least one micro-sensing electronic component to be tested: cattle=disc 3 1, the receiving device 4 (10) is provided with a plurality of empty feeding trays 41, and can be divided into fine sensing electronic components and defective products. After the test? /, '7C cattle and - human grade measurement of micro-sensing

In the receiving device 40, each of the short-range motions is recorded 6 Q == test machines 61A, 61B, 61C, ! L 』6 =j 'The angle tester 6 iA has a multi-axis closed T „ degree motion mechanism 61 1A for the mechanical arm, the multi-axis articulated angular motion mechanism 6 axis (such as χ γ γ - z - illusion The above omnidirectional angle motion, w〇x frame 6 1 2 eight for the test board 6 13 A with a plurality of test sockets 6 1 4 A, the test seat 6 4A is a normally open test seat, and Support 6 workers 2 A is provided - movable down pressure normally open type test seat 6 i 4a micro-sensing electronic components of the press part 6 1 5 A, with the following granules micro-sensing electronic components, making micro-sensing The electronic component is prevented from coming out of the test seat 6丄4A during the rotation angle motion test. 'The angled motion mechanism 61 1A can drive the test socket 6丄4a and the smart sensor to be tested to execute the axis money. Turning the test to the test, and letting the tester (not shown) transmit the test result to the central control unit, the central control unit controls the operation of each device, and the transport device 7 设有a is provided with a transfer mechanism 7 2 A, the moving mechanism 72A is provided with a first pick-and-placer 7 21Α and a second pick-and-placer 7 2 2 A which can be synchronously displaced as χγ, and the first The second pick-and-placer 7 2 1 A, 7 2 2A can be respectively displaced in the Z-axis, so that the first pick-and-placer 7 2 is inserted into the feeding device 30 and the test seat 614A to pick up and measure the micro-sensing to be tested. Electronic components, --S ] 8 201113211 Pick and place A between the receiving device 4 Q and the test stand 6 i 4 A for the second two = the moving mechanism 7 2 A is the first sensory 7 2 1 Measured electronic element %: Set 3 〇 of the tray 3 1 to take the i element 2 =:===8 3, so that the micro sense

Nowadays, the test seat 614 and the micro-sensation: the sub-element ^, the head I 丨 material /5 of the rotation angle _ test, and the test board 6 1 3 A will be 3 test signals mixed to the tester, test The test result of the micro-sensing electronic farming 8 3 is transmitted to the central control unit. Face.S3 1 ^图' When the 1 degree tester 6 1 A performs the test operation, the first pick-and-placer 721A of the shifting machine 2 is again taken out on the tray 31 of the feeding device 3 - to be tested The micro-sensing electronic component 84 is transferred and placed in the test socket 6 1 4 B of the angle tester 6 1 B to perform the rotary (four) degree motion test operation. Please refer to the figure 20 and 21 'when the angle tester 6 iA completes the angular motion test of the micro-sensing electronic component 8 3 , the lower pressing part 6 ^ 5A is finished

The micro-sensing electronic component 8 3 is measured, and the transfer mechanism 7 2A takes out the micro-sensing electronic component 8 3 in the test socket 6 14A with the second pick-and-placer 7 2 2A, because the first pick-and-place device 7 21A has taken out another micro-sensing electronic component 8 5 to be tested at the feeding device 3 ,, and the first pick-and-place device 7 21A can place the micro-sensing electronic component 8 5 to be tested into the test seat. In 614 A, the test operation is continued; see Figure 22, the second pick-and-placer 72 2A of the transfer mechanism 72A can be based on test results (such as good micro-sensing electronic components, defective micro-sensing electronic components or The sub-product micro-sensing electronic component) 'transfers the measured micro-sensing electronic component 8 3 to the tray 41 of the receiving device 40 to complete the sorting and collecting operation. Accordingly, the test sorting machine of the present invention can effectively reduce the configuration of the mechanism and perform multi-axial angular motion test to save cost and improve test quality, which is a cookware, 9 201113211

No identical products and publications were disclosed. 申请Apply in accordance with the law. </ RTI> Figure 3: Figure 4: Figure 5: Figure. Configuration diagram of each device of the test sorter of the present invention. Figure 1: Configuration diagram of the test test sorter. ί f Schematic diagram of the angle motion test device of the test sorter. The invention is a schematic diagram of the angle test device for testing the split shaft. (I) The angle of the test device according to the invention is shown in Fig. (2). Fig. 6 is a schematic view showing the use of the test sorter of the present invention (1). Figure 7: Schematic diagram of the use of the test sorter of the present invention (2). Figure 8: Schematic diagram of the use of the test sorter of the present invention (3). Figure 9: Schematic diagram of the use of the test sorter of the present invention (fourth Figure 10: Schematic diagram of the use of the test sorter of the present invention (five Figure 1: Schematic diagram of the use of the test sorter of the present invention (six). Figure 1 2 : Schematic diagram of the use of the test sorter of the present invention (7). Fig. 13: Schematic diagram of the use of the test sorter of the present invention (8). Fig. 14: Configuration diagram of each apparatus of another embodiment of the test sorter of the present invention. Figure: Schematic diagram of the use of another embodiment of the test sorter of the present invention (1). Figure 16: Schematic diagram of the use of another embodiment of the test sorter of the present invention (2). Figure 17: Another implementation of the test sorter of the present invention Schematic diagram of the use of the example (3). Figure 18: Schematic diagram of the use of another embodiment of the test sorter of the present invention (4). Figure 19: Schematic diagram of the use of another embodiment of the test sorter of the present invention (5). Figure: Schematic diagram of the use of another embodiment of the test sorting machine of the present invention (6). Figure 21: Schematic diagram of the use of another embodiment of the test sorting machine of the present invention (7). Figure 22: Test sorting machine of the present invention Schematic diagram of the use of an embodiment (8) [Description of main component symbols] [Law] Machine: 1 0 Feeding device: 11 Receiving device: 12 Empty disk device: 13 Angle motion testing device: 14 Motor: 141 r 201113211

Transmission group: 14 2 Motor: 14 4 Motor: 14 6 Test board: 14 8 Conveying device: 15 First stage: 15 2 Third pick-and-place: 15 4 Fourth pick-and-place: 15 6 [Invention]

Machine: 2 0 Feeding device: 3 0 Receiving device: 40 Empty disk device: 5 0 Angle motion testing device: 6 0, 6 Angle testing machine: 61, 61 A, Angle motion mechanism: 611, 61 Shelf: 612, 612A Test board: 613, 613 A Bearing board: 14 3 First bracket: 14 5 Second bracket: 14 7 Test seat: 14 9 First pick-and-place: 151 Second pick-and-place: 15 3 Second stage: 15 5 micro-sensing electronic components: 16 tray: 3 1 tray: 4 1

, 6 0B, 6 0 C 6 1 B, 6 1 C 1 A

Test stand: 614, 614A, 614B

Lower pressing parts: 615, 615 A Conveying device: 7 0, 7 0 A Bearing mechanism: 71 Feeding platform: 711 Receiving platform: 712

Transfer mechanism: 7 2, 7 2 A First pick and place: 7 21, 7 21 A

Second pick and place: 7 2 2, 7 2 2A Micro-sensing electronic components: 81, 82, 83, 84, 85

Claims (1)

201113211 VII. Patent application scope: 1. A test classification machine for micro-sensing electronic components, comprising: a machine table; a feeding device: is arranged on the machine platform to accommodate the micro-sensing electronic components to be tested; Device: It is installed on the machine to accommodate the measured micro-sensing electronic components; The angle motion measuring device is set on the machine and has a multi-axis angle test with test stand. The machine's test stand is equipped with micro-sensing electronic components' to enable the angle tester to drive the micro-sensing electronic components for multi-axis rotation angle motion test; Conveying device: is arranged on the machine platform for transferring the micro sensing component to be tested/completed between the feeding and receiving device and the angle motion testing device; the central control unit is used for controlling and integrating the devices To perform automated work. 2. The test sorting machine for micro-sensing electronic components according to claim 1, wherein the feeding device is provided with a plurality of trays for receiving micro-sensing electronic components. m shape 3 ·4 · According to the test classification of the micro-sensing electronic components described in item 1 of the patent application scope, wherein the receiving device is provided with a plurality of trays for measuring the micro-sensing of the test results Electronic component. ° “ 6 ·7 · According to the residual test classification of the micro-sensing electronic components mentioned in the first paragraph of the patent application range, the angle test machine of the angle motion test device is provided with a multi-turn angle movement mechanism, and at an angle The movement mechanism is provided with a support frame for the test board of at least one test seat for the purpose of the angle sensing test of the micro-sensing electronic component. The test machine of the component 'where' the angular motion mechanism is a mechanical arm. The test extension of the 4th _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ According to the patent classification of the micro-m sub-component of the application of the patent model, the 2011 20111111 machine, wherein the angle tester is provided with a movable lower pressing micro-inductive electronic component under the pressure member. 8. According to the test classification machine for micro-sensing electronic components described in item 4 of the patent scope, the test seat on the test board is a normally closed test seat. 9 · According to the application for the eighth item Test classification of the micro-sensors , Wherein the supporting frame of the machine test system this angle is provided at a movable test classified under pressure to open the normally closed pressure test socket member. 1〇. Micro by sensing electronics in item 1 of the scope of patent The machine 'where' the transporting agricultural system is provided with a carrying mechanism and a moving material mechanism, which carries the micro-sensing electronic components to be tested/finished between the feeding and receiving device and the angular motion testing device, and the moving mechanism The micro-sensing electronic component to be tested/completed is transferred between the feeding and receiving device, the angular motion testing device and the supporting mechanism. 11. The test sorting machine for micro-sensing electronic components according to the scope of the patent application, wherein the load-bearing mechanism is provided with at least one stage for carrying the micro-sensing electrons to be tested/completed. element. 12. The test sorting machine for micro-sensing electronic components according to claim 11 of the patent application scope, wherein the carrier mechanism is provided with a feeding carrier and a receiving carrier for respectively carrying the test/testing Micro-sensing electronic components. 13. The test sorting machine for micro-sensing electronic components according to the first aspect of the patent application scope, wherein the moving mechanism is provided with a first pick-and-place device and a second pick-and-place device, the first pick-and-place device It is arranged above the supply and receiving device and can be used as a γ-Ζ axial displacement for transferring the micro-sensing electronic components to be tested/completed between the supply and receiving devices and the supporting mechanism. The pick-and-place device is mounted on the angle tester of the angle motion test device, and can be used as the γ-Z axial displacement for transferring the micro-sensing to be tested/completed between the test stand and the load-bearing mechanism of the angle tester. Electronic component. 14' The test classification machine for micro-sensing electronic components according to claim 1, wherein the conveying device is provided with a material-feeding mechanism for supplying and receiving oxygen 201113211 and the angle motion testing device. Transfer the micro-sensing electronic components to be tested/completed. 15. The test classification machine for micro-sensing electronic components according to claim 14, wherein the material-feeding mechanism is provided with first and second pick-and-placers for axial displacement of χ-γ-ζ The first pick-and-place device is for transplanting the micro-sensing electronic component to be tested between the feeding device and the angle motion testing device, and the second pick-and-place device is transferred between the receiving device and the angle 5 motion testing device. Micro-sensing electronic components. 1 6 2 = application of the scope of the patent application described in item 1 of the measuring and measuring machine for micro-sensing electronic components is further included in the machine is equipped with an empty disk device for collecting empty trays, and as needed The empty tray is replenished to the receiving device. 17 A test and classification machine for micro-sensing electronic components, comprising: a machine; a feeding device: disposed on the machine to accommodate the micro-sensing electronic components to be tested; and a receiving device: disposed on the machine , for accommodating the measured micro-sensing electronic components; the angle motion testing device: is set on the machine, and is provided with an angle testing machine, the angle testing machine has a multi-axial joint type angular motion mechanism The angle movement mechanism is provided with a support frame for at least one test seat for performing multi-axial rotation angle motion test on the micro-sensing electronic component; the conveying device is disposed on the machine platform for For the supply and receiving devices and angle movement. Transfer the micro-sensing components to be tested/completed between test devices; Central control unit: Gather to control and integrate the devices to operate. The test of the micro-sensing electronic component described in Item 17 of the enchantment range is provided with a plurality of trays for receiving the micro-sensing electronic components to be tested. 4 9 test results of the micro-sensing electronic components described in item 17 of the habitat. (4) The different types of the test equipment for micro-sensing electronic components as described in claim 17 of the patent application scope, wherein the angular motion mechanism is a mechanical arm. 21. The test classification machine for micro-sensing electronic components according to claim 17, wherein the test socket on the test board is a normally open test socket. 2 2. The test sorting machine for micro-sensing electronic components according to claim 21 of the patent application scope, wherein the angle tester is provided with a movable lower pressing micro-sensing electronic component under the pressing member . </ RTI> </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; 2 4 . The test sorting machine for micro-sensing electronic components according to item 23 of the patent application scope, wherein the angle tester is provided with a movable lower press-opening normally-closed test seat under pressure Pieces. 2 5 Brain Patent Range Test No. 17 of the micro-sensing electronic tree test> The transport device is provided with a load-bearing mechanism and a material-feeding mechanism, and the mechanism is attached to the feeding and receiving device and the angle motion test. The micro-sensing electronic component carrying the device to be tested/measured is connected to the micro-sensing electrons of the feeding and receiving device and the transfer device/loading mechanism/measurement = 2 6^^ The test component of the micro-sensing electronic component described in item 25 of the scope is - wherein the carrier mechanism is provided with at least one stage for measuring the micro-sensing electronic component. ' 2 Saki's micro-sub-component test score, bearer to be tested =: structure: = stage and receiving stage 'for classification' Shen: η: the test of the micro-sensing electronic components - Pick and place and second pick and place, tnr weaving lion / finish first pick and place device is set on the angle test machine 箄 oxygen 201113211 angle test machine, and can be used for Y-z axial displacement for angle test The micro-sensing electronic components to be tested/completed are transferred between the test stand and the carrying mechanism of the machine. 2 9 . The test sorting machine for micro-sensing electronic components according to claim 17, wherein the conveying device is provided with a material moving mechanism for moving between the feeding and receiving device and the angular motion testing device Micro-sensing electronic components to be tested/completed. 3 0. The test sorting machine for micro-sensing electronic components according to claim 29, wherein the moving mechanism is provided with a first and second pick-and-place device capable of axial displacement of χγ-Ζ The first pick-and-place device transfers the micro-sensing electronic component to be tested between the feeding device and the angular motion testing device, and the second pick-and-place device transfers the measurement between the receiving device and the angular motion testing device. Sensing electronic components. ~ 31· The test sorting machine for micro-sensing electronic components according to item 17 of the patent application scope includes an empty disk device on the machine table for collecting empty trays and, if necessary, An empty tray is added to the receiving device.