TW200846679A - Testing and classifying machine capable of initially using and further reading and writing test card - Google Patents

Abstract

A testing and classifying machine capable of initially using and further reading and writing test card includes a frame having a feeding magazine, an empty magazine and a plurality of collecting magazines all disposed at the front end thereof, and having initially starting test device and a number of read and written devices. The transporting device is applied to delivery untested memory cards from the feeding magazine to the initially starting test device for processing an initially starting test, thereafter, the defective products are delivered to the collecting magazines, yet the good products are conveyed to the read and written device for having the reading and written test, and then the memory cards are delivered to the collecting magazines based on the testing result, thereby enhancing the testing efficiency and lowering the equipment cost.

Description

200846679 IX. Description of the invention: [Technical field to which the invention pertains] The present invention particularly provides a card opening test for not only performing a memory card, but also automatically reading and writing a memory card on the machine. Jiahua=Sequence matching, memory card testing and sorting machine with card-opening test and item writing test. [Prior Art]

For the age of miscellaneous needles (MemQryCa pool) ^^ is CF card (CompactFlashCard) 'SD memory card (Secure Digital if乂I: MS 2, card (Μ·*1.10, multimedia card (10) tiMediaCard), = = rigorous rtMedia Card) and several other, and depending on the function used in the product 'such as digital camera, personal digital assistant ^ However, § 恍 恍 card in the production process is through multiple processing procedures, the industry = insurance products ^ f 'After the production is completed, the card opening test will be performed (c (4) called the 3 and the read and write test (Read/Write co_ris〇n, Jane ^ 乍, to test whether the memory card is damaged, and eliminate the defective products, The Yixi trial operation is based on a card-opening test machine for card opening; in: ==$if it is a good product, then it is transferred to the reading and writing test machine for the operation; the single machine operation, not only the equipment becomes: Extremely improved 艄 计 计 料 = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = That is, the main objective of the main purpose of the book is to provide The memory of the card-opening test and the read-write test 5 200846679 The card test sorting machine is provided with a feeding magazine, an empty magazine and a receiving magazine at the front end of the machine, and the card is arranged at the rear end of the machine. The test device and several trial farms are installed: the transport device is a test memory card from the supply of the material to the card opening test, to carry out the card opening test, and after completion, the defective product is transferred to the ^ good product transfer ^ write The test device is connected to the memory card for reading and writing test, = after the card is completed (4), the needle is transferred to the magazine according to the job result; thereby, the card opening test device is set on the machine table. And the reading and writing test device ^, not only can first open the card test on the memory card, and can automatically write the test on the machine, and then optimize the timing to achieve the upgrade test: another purpose of the lit Providing a card test with a card-opening test and a read-s test = writing a test garment, and continuing the card-opening test industry on the machine, thereby achieving the purpose of reducing equipment costs. In order to make the Beck Review Committee make more of the present invention One step of understanding, the embodiment and the diagram, as explained below: Niu Wei, please refer to Figure 1, the invention is provided at the front end of the machine 2 分别 respectively for the disk for the ship 2 1 , available The empty tray 2 2, the device 2 5 and several reading and writing test devices 2 6, open the card test and wear a number of test sets 2 5 1 for the memory card to be tested, and respectively connected , card opening: test machine to read the data of the memory card to be tested, and each reading 2 6 also has several test sockets 2 6 1 for intrusion - account for the bow (7) clothing set 6 200846679 5 open about 6 Leap second, and the time of reading and writing test is about 180. The example of 匕本贝 is a card opening test. The front and rear end of the machine are == arm 2 7. Move to arm 5?a 21-Γ^^ 4 °^^??ϊίί * Figure 4, followed by the crimping mechanism 2 5 2 ^ 眚 Refer to and transfer the (8) table 28 to the front end of the machine 2 ,, then the front machine; g and use the transfer receipt S2 3; Please refer to Figure 6, if open test; ^ transfer to defective product _ t arm 3 〇 move the product to the read/write test device 2 ttiii 3 after the mechanical probe does contact, 'make _^_ 2 6 i ^ 2 7 will continue to supply the other on the 2i At the same time, on the front robot arm 28, the transfer table 28]==== is transferred to the transfer station, and then the rear mechanical arm 3 is transported to the machine 2 and then moved to the card opening test device 2 5 test; set | 3 = test 2 words 4 1, and after the operation, please refer to Figure 8, after the completion of the read and write test operation, the rear mechanical arm 3 〇 7 200846679 on the transfer station 2 9 ' And use the transfer station to transfer the test work; please refer to Figure 9 'Complete the literacy test arm 2 7 will be transferred to the defective product according to your lion 9 / 1 ^, ^ 思 card 4 〇 Search 2 3 or good class work. Set 'and then continue to complete the card test and read and write test test, ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ 1 1 Thus [simplified illustration]

F1 diagram: Schematic diagram of the architecture of the present invention. 2 is a schematic diagram of the action of the present invention (1). Figure 3: Schematic diagram of the action of the present invention (2). 4 is a schematic diagram of the action of the present invention (3). 5 is a schematic diagram of the action of the present invention (4). ^6 Figure: Schematic diagram of the action of the present invention (5). Figure 7: Schematic diagram of the action of the present invention (6). Figure: Schematic diagram of the action of the present invention (7). Figure 9: Schematic diagram of the action of the present invention (8). [Description of main component symbols] Part of the present invention: 2 0 : Machine 2 3 : defective product receipt 匣 2 5 : card opening test device 2 6 : read/write test device 21: supply 匣 2 4 : good product receipt 匣 2 51: Test socket 2 61 : Test socket 2 2 : Open 2 5 2 : Crimp mechanism 2 6 2 : Crimp mechanism 8 200846679 2 7 : Front manipulator 3 0 : Rear manipulator 2 8 : Transfer table 4 0 : Memory card 2 9 : Transfer station 41: Memory card

Claims (1)

200846679 X. Shenqing patent scope: 1 · A memory card test sorting machine with card opening test and reading and writing test, 1 series includes: ..., machine table; supply 匣·· is set on the machine platform, brigade supply The memory card to be tested; the defective product receipt 匣: is set on the machine, and is used to hold the test result as a memory card for defective products; good receipt 匣: is set on the machine and is used for bearing test The result is a good memory card; the open card test device: is set on the machine, and has a test socket for inserting the memory card to be tested to perform the card opening test operation; On the machine table, a test socket is provided for inserting a memory card for completing the card opening test operation to perform a read/write test operation; ... a conveying device: transferring the memory card to a predetermined position. 2 · According to the application of the patent scope, the memory card test classification machine with card-opening test and read-write test, including the open space on the machine, can be used to place empty trays. The card opening test and the reading and writing net ^ type ^ card test classification machine described in the third paragraph of the patent scope, wherein the supply line is for the material of the memory card to be tested. The card test sorting machine with the card opening test and the read/write test described in the scope of the third item, wherein the card opening test device is provided with a crimping & structure for lowering the pressing of the memory card, and the test sleeve The probe in the seat does perform the card opening test.啁5 · According to the patent card scope, the memory card test classification machine with card opening test and reading and writing test mentioned in the first paragraph of the patent scope, wherein the test socket of the card opening test device is a card opening test machine to perform the opening Card test operation. 6) The memory card test sorting machine with card opening test and read/write test as described in item 1 of the patent application scope, the towel is further included in the reading test device with crimping & The memory card is in contact with the probe of the test kit, 200846679 7 8 to perform the read and write test operation. • According to the application, the scope of the i-th tearing device, the card test sorting machine, Fuzhong, Jingjinggong (four) Zhuang", the evaluation of the 5th hermit, the Japanese and German "quote" test device test Set the seat transmission, connect to the 5 ah to write the test machine 'to perform the reading and writing test operation', and the △ 儋 儋 幵 幵 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀 肀Carrying the memory card for the opening test and 9 ΐΐ: 二ΐΐί; the test and the test of the read/write test, the memory card with the card test and the literacy test described in the item 'The front arm is based on The test results will be: 匣 收 收 12 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13