CN102692578B - Be used for testing the test card of the card reader with multiple memory card specifications - Google Patents
Be used for testing the test card of the card reader with multiple memory card specifications Download PDFInfo
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- CN102692578B CN102692578B CN201110067382.6A CN201110067382A CN102692578B CN 102692578 B CN102692578 B CN 102692578B CN 201110067382 A CN201110067382 A CN 201110067382A CN 102692578 B CN102692578 B CN 102692578B
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Abstract
A kind of test card being used for testing the card reader with multiple memory card specifications.This test card being used for testing the card reader with multiple memory card specifications includes a first substrate, a second substrate, one first link subgroup and one second link subgroup; This second substrate part is embedded in a surface of this first substrate, and a length of this second substrate is less than in fact a length of this first substrate; This first link subgroup is arranged at the one end on this surface of this first substrate, and is not covered by this second substrate, and this first link subgroup is used for contacting to electrically conduct with one first transmission ends subgroup of a card reader; This second link subgroup is arranged at one end of this second substrate, and this second link subgroup is used for contacting to electrically conduct with one second transmission ends subgroup of this card reader when this first link subgroup contacts with this first transmission ends subgroup.The present invention significantly reduces the test duration, effectively avoids manual operation exception and saves human cost to promote production capacity.
Description
Technical field
The present invention relates to a kind of test card being used for testing card reader, espespecially a kind of test card that can be used to test the card reader with multiple memory card specifications.
Background technology
In general, portable electron device, such as a notebook computer, can be provided with the card reader of the storage card that can read plurality of specifications usually, so that user reads or the data of storage memory card.The type of storage card can be divided into safety digital storage card (SecureDigitalMemoryCard, SD card), digital picture card (ExtremeDigital-PictureCard, XD card) or memory stick card (MemoryStickCard, MS card) etc.When factory's end carries out qualitative control and the validation test of product, tester needs to be inserted in the corresponding slot of card reader by the storage card of different size respectively, just can carry out qualification rate test to the slot of this specification.For example, when wish tests the qualification rate of the safety digital storage card slot of card reader, a safety digital storage card is inserted the safety digital storage card slot of card reader by tester, and utilizes automatic test technology to carry out qualification rate test.Then when the qualification rate of the digital picture card slot for test card reader, the card (as safety digital storage card) that last time test uses need be extracted out by tester, just digital picture card can be inserted the digital picture card slot of card reader, to proceed the checking of digital picture card slot, meaning and traditional method need prepare the storage card of multiple different size, and each storage card is inserted respectively each draw-in groove of card reader, to carry out test and validation respectively.Thus, the suitable very complicated of traditional test formality of card reader, easily reduces the accuracy of test because of human operational error, and need expend comparatively senior engineer time, tie down the overall throughput of production line.
Therefore, need to provide a kind of test card being used for testing the card reader with multiple memory card specifications, to solve the problem.
Summary of the invention
The invention provides a kind of test card that can be used to test the card reader with multiple memory card specifications, to solve the above problems.
The present invention discloses a kind of test card being used for testing the card reader with multiple memory card specifications, and this test card includes a first substrate, a second substrate, one first link subgroup and one second link subgroup; This second substrate part is embedded in a surface of this first substrate, and a length of this second substrate is less than in fact a length of this first substrate; This first link subgroup is arranged at the one end on this surface of this first substrate, and is not covered by this second substrate, and this first link subgroup is used for contacting to electrically conduct with one first transmission ends subgroup of a card reader; This second link subgroup is arranged at one end of this second substrate, and this second link subgroup is used for contacting to electrically conduct with one second transmission ends subgroup of this card reader when this first link subgroup contacts with this first transmission ends subgroup.
The present invention also discloses this second link subgroup and is used for contacting to electrically conduct with this second transmission ends subgroup of this card reader when this first substrate inserts this card reader and is only butted on a retaining part of this card reader.
A test resistance is provided with between each adjacent first splicing ear that the present invention also discloses this first link subgroup.
A test resistance is provided with between each adjacent second splicing ear that the present invention also discloses this second link subgroup.
The present invention also discloses this test card and also includes a gripping end, the other end of its this first substrate coated and this second substrate, and this gripping end exposes to this card reader when this first substrate and this second substrate insert this card reader.
The surface that the present invention also discloses this second substrate is formed with a pilot hole, and this pilot hole is used for this second substrate auxiliary to be partly fitted together to this surface that mode is positioned this first substrate.
The thickness that the present invention also discloses the combination of this first substrate and this second substrate is less than the summation of a thickness of this first substrate and a thickness of this second substrate.
The present invention also discloses this test card and also includes a lead angle structure, and it is formed at this end of this first substrate, and this lead angle structure is used for guiding this first substrate and inserts this card reader.
The side that the present invention also discloses this second substrate is formed with a disappointing groove.
The present invention also discloses this test card and also includes one the 3rd substrate and one the 3rd link subgroup.This first substrate part that 3rd substrate is fitted together to this second substrate is embedded in a surface of the 3rd substrate, and this length of this first substrate is less than in fact a length of the 3rd substrate.3rd link subgroup is arranged at the one end on this surface of the 3rd substrate, and is not covered by this first substrate.3rd link subgroup is used for contacting to electrically conduct with one the 3rd transmission ends subgroup of this card reader.
The present invention also discloses this second link subgroup and is used for contacting to electrically conduct with this second transmission ends subgroup of this card reader when the 3rd substrate inserts this card reader and is only butted on a retaining part of this card reader.
A test resistance is provided with between each adjacent 3rd splicing ear that the present invention also discloses the 3rd link subgroup.
The thickness that the present invention also discloses the combination of this first substrate, this second substrate and the 3rd substrate is less than the summation of a thickness of a thickness of this first substrate, a thickness of this second substrate and the 3rd substrate.
The present invention also discloses shape and the size that the shape of this first substrate, this second substrate and the 3rd substrate and size can meet a safety digital storage card, a digital picture card and a memory stick card respectively, and the specification of this first link subgroup, this second link subgroup and the 3rd link subgroup meets the specification of this safety digital storage card, this digital picture card and this memory stick card in fact respectively.
It is a card-type structure that the present invention also discloses this test card.
Multiple test storage card with different size and size is integrated into the card-type test card of an All-in-One by the present invention.Test card of the present invention is by special structural design, with each corresponding draw-in groove making multiple substrates of test card can insert card reader simultaneously, and the multiple link subgroup be arranged on different substrate can contact to electrically conduct with the corresponding transmission ends subgroup of each draw-in groove simultaneously.Therefore the present invention can in a test process, such as test card (test storage card) is inserted card reader, multiple draw-in grooves with different size of card reader are carried out to the verification and testing of reliability or qualification rate simultaneously, therefore significantly can reduce the time of test process, and then effectively avoid manual operation exception and save human cost, use lifting production capacity.
Accompanying drawing explanation
Fig. 1 is the assembly decomposing schematic representation of the test card of first embodiment of the invention.
Fig. 2 is the test card of first embodiment of the invention and the schematic appearance of card reader.
Fig. 3 is the side view of the test card of first embodiment of the invention.
Fig. 4 is the inner structure schematic diagram of test card of the present invention and card reader.
Fig. 5 is the schematic appearance of the test card of second embodiment of the invention.
Fig. 6 is the side view of the test card of second embodiment of the invention.
Fig. 7 and Fig. 8 is respectively schematic appearance and the side view of the test card of third embodiment of the invention.
Fig. 9 and Figure 10 is respectively schematic appearance and the side view of the test card of fourth embodiment of the invention.
Primary clustering symbol description:
10,30,50,70 test card 11 card reader
111 first transmission ends subgroup 113 second transmission ends subgroups
115 the 3rd transmission ends subgroup 117 retaining parts
12,32,52,72 first substrate 14,34,54,74 second substrates
141, the disappointing groove of 341 pilot holes 143,343
16 the 3rd substrate 18,36,56,76 first link subgroups
181 test resistance 20,38,58,78 second link subgroups
22 the 3rd link subgroups 24,40 grip end
26,42 lead angle structures 44 insulate catch
Embodiment
Refer to Fig. 1 to Fig. 3, Fig. 1 is the assembly decomposing schematic representation of a test card 10 of first embodiment of the invention, Fig. 2 is the test card 10 of first embodiment of the invention and the schematic appearance of a card reader 11, and Fig. 3 is the side view of the test card 10 of first embodiment of the invention.Whether test card 10 is used for testing the card reader 11 with multiple memory card specifications, normal with the function of the draw-in groove verifying card reader 11 corresponding different storing card specification.User can utilize card reader 11 to read multiple storage cards with different size, and in general, the compatible memory card specifications of slot of common card reader can include the specification etc. of safety digital storage card, digital picture card or memory stick card.Whether therefore test card 10 of the present invention can insert in each slot of card reader 11 simultaneously, normal to make user can test the read functions with each slot of different storing card specification of card reader 11 simultaneously.Wherein the specification of the compatible memory card specifications of the slot of card reader 11 and corresponding test card 10 can be not limited to described in above-described embodiment, depending on actual demand.
Test card 10 includes first substrate 12, second substrate 14 and one the 3rd substrate 16.Second substrate 14 part is embedded in a surface of first substrate 12, and the chimeric surface having the first substrate 12 of second substrate 14 partly can be embedded in the 3rd substrate 16.The chimeric degree of depth between each substrate designs according to each notch with standardized size of card reader 11, therefore is not described in detail in this.As shown in Figure 2 and Figure 3, a length of second substrate 14 is less than in fact a length of first substrate 12, and this length of first substrate 12 is less than in fact a length of the 3rd substrate 16, and therefore test card 10 can be a staged card-type structure.
Test card 10 also includes one first link subgroup 18,1 second link subgroup 20 and one the 3rd link subgroup 22.First link subgroup 18 is arranged at the one end on this surface of first substrate 12, and is not covered by second substrate 14.Second link subgroup 20 is arranged at one end of second substrate 14.3rd link subgroup 22 is arranged at the one end on this surface of the 3rd substrate 16, and is not covered by first substrate 12.Wherein, the first link subgroup 18, second link subgroup 20 and the 3rd link subgroup 22 are used for contacting electrically conduct (inside that each transmission ends subgroup is arranged at card reader 11) with one the 3rd transmission ends subgroup 115 with one first transmission ends subgroup 111,1 second transmission ends subgroup 113 of card reader 11 respectively.Due to first substrate 12, the length of second substrate 14 and the 3rd substrate 16 designs according to the allocation position of the inner each transmission ends subgroup of card reader 11, therefore when test card 10 inserts this card reader completely, such as, when the 3rd substrate 16 is only butted on a retaining part 117 (retaining part 117 is arranged at the inside of card reader 11) of card reader 11 inside, meaning and test card 10 are when card reader 11 is internally positioned in correct test position, first link subgroup 18, second link subgroup 20 can contact to electrically conduct with each corresponding transmission ends subgroup of card reader 11 with the 3rd link subgroup 22 respectively.
As shown in Figure 1, a test resistance 181 can be provided with between each adjacent first splicing ear (or each adjacent second splicing ear, each adjacent 3rd splicing ear) of the first link subgroup 18 (or the second link subgroup 20, the 3rd link subgroup 22).When test card 10 inserts card reader 11, and each link subgroup (the first link subgroup 18, second link subgroup 20 and the 3rd link subgroup 22) is when contacting to electrically conduct with each corresponding transmission ends subgroup, whether user can utilize an ATE (automatic test equipment) (ATE) effectively to verify test card 10 and card reader 11, normal to confirm the read functions of each draw-in groove of this card reader.
For example, refer to Fig. 4, Fig. 4 is the inner structure schematic diagram of test card 10 of the present invention and card reader 11.After the first link subgroup 18 of test card 10 contacts the first transmission ends subgroup 111 of card reader 11, the probe of ATE (automatic test equipment) is directly contacted the signal testing point of the first transmission ends subgroup 111 by user, with the resistance value size of the test resistance 181 between each adjacent first splicing ear by measurement first link subgroup 18, whether the function of checking card reader 11 is normal.
In addition, as shown in Figure 1 to Figure 3, test card 10 also can include a gripping end 24, one end of its coated first substrate 12, second substrate 14 and the 3rd substrate 16.Grip end 24 to be used for coverage test resistance 181 and to expose to prevent it, and expose to card reader 11 when first substrate 12, second substrate 14 and the 3rd substrate 16 insert card reader 11, so that user can push or pull test card 10 moves relative to card reader 11.The surface of second substrate 14 can be formed with a pilot hole 141, and a side of second substrate 14 can be formed with a disappointing groove 143, pilot hole 141 is used for auxiliary second substrate 14 and first substrate 12 and is positioned this surface of the 3rd substrate 16 in the chimeric mode of part, and disappointing groove 143 is used for getting rid of unnecessary air when test card 10 inserts card reader 11 to regulate pressure.Test card 10 also can include a lead angle structure 26, and it is formed at this end of the 3rd substrate 16, and lead angle structure 26 is used for guiding the 3rd substrate 16 and inserts card reader 11.It is worth mentioning that, because second substrate 14 part is fitted together to this surface of first substrate 12, and first substrate 12 part is fitted together to this surface of the 3rd substrate 16, therefore a thickness of the combination of first substrate 12, second substrate 14 and the 3rd substrate 16 can be less than in fact the summation of a thickness of a thickness of first substrate 12, a thickness of second substrate 14 and the 3rd substrate 16, with the corresponding draw-in groove making each substrate of test card 10 can insert card reader 11 simultaneously.
In the first embodiment of the present invention, the shape of first substrate 12 and size can accord with in fact shape and the size of a safety digital storage card, and the specification of the first link subgroup 18 can accord with in fact the specification of this safety digital storage card.The shape of second substrate 14 and size can accord with in fact shape and the size of a digital picture card, and the specification of the second link subgroup 20 can accord with in fact the specification of this digital picture card.The shape of the 3rd substrate 16 and size can accord with in fact shape and the size of a memory stick card, and the specification of the 3rd link subgroup 22 can accord with in fact the specification of this memory stick card.Therefore the test card 10 of first embodiment of the invention can be used to when inserting card reader 11, test the read functions of the safety digital storage card draw-in groove of card reader 11, digital picture card draw-in groove and memory stick card draw-in groove simultaneously, or insulation catch 44 (the electrical insulator pad be such as made up of plastic material) (or the second link subgroup 20, the 3rd link subgroup 22) in the first link subgroup 18 can be shielded in.Insulation catch 44 can be used to the electric connection of the first transmission ends subgroup 111 (or the second transmission ends subgroup 113 or the 3rd transmission ends subgroup 115) of isolated first link subgroup 18 (or the second link subgroup 20 or the 3rd link subgroup 22) and card reader 11, uses the function of the SD card (or XD card, MS card) optionally testing card reader 11.
Refer to Fig. 5 and Fig. 6, Fig. 5 is the schematic appearance of a test card 30 of second embodiment of the invention, and Fig. 6 is the side view of the test card 30 of second embodiment of the invention.Test card 30 can include first substrate 32, second substrate 34,1 first link subgroup 36 and an one second link subgroup 38.A test resistance is provided with between each adjacent first splicing ear (or each adjacent second splicing ear) of the first link subgroup 36 (or second link subgroup 38).Wherein the configuration of this test resistance, first substrate 32, second substrate 34,1 first link subgroup 36 and one second link subgroup 38 and function are as in the first embodiment, therefore are not described in detail in this.As shown in Figure 6, because second substrate 34 part is embedded in a surface of first substrate 32, therefore first substrate 32 is less than the summation of a thickness of first substrate 32 and a thickness of second substrate 34 with a thickness of the combination of second substrate 34, can insert the corresponding draw-in groove of card reader 11 to make the first substrate 32 of test card 30 with second substrate 34 simultaneously.
In addition, test card 30 also can include a gripping end 40, the other end of its coated first substrate 32 and second substrate 34; Test card 30 also can include a lead angle structure 42, and it is formed at this end of first substrate 32.The surface of second substrate 34 can be formed with a pilot hole 341, and a side of second substrate 34 can be formed with a disappointing groove 343.The structure and fuction of gripping end 40, pilot hole 341, lose heart groove 343 and lead angle structure 42 as in the first embodiment, therefore is not described in detail in this.The difference of the second embodiment and the first embodiment is in and is made up of two substrates in test card 30, therefore user can utilize test card 30 to test wherein two draw-in grooves with different size of card reader 11, for example, the shape of the first substrate 32 of test card 30 and size can accord with in fact shape and the size of this safety digital storage card, the specification of the first link subgroup 36 can accord with in fact the specification of this safety digital storage card, the shape of second substrate 34 and size can accord with in fact shape and the size of this digital picture card, and the specification of the second link subgroup 38 can accord with in fact the specification of this digital picture card, therefore the test card 30 of second embodiment of the invention can be used to test the safety digital storage card draw-in groove of card reader 11 and the read functions of digital picture card draw-in groove simultaneously.
Refer to Fig. 7 and Fig. 8, Fig. 7 and Fig. 8 is respectively schematic appearance and the side view of a test card 50 of third embodiment of the invention.As illustrated in figs. 7 and 8, the test card 50 of the 3rd embodiment includes first substrate 52, second substrate 54,1 first link subgroup 56 and an one second link subgroup 58, the two substrates of test card 50 and the configuration of two link subgroups and function as in the foregoing embodiment, therefore are not described in detail in this.The difference of the 3rd embodiment and previous embodiment is in shape and the size that can accord with in fact this memory stick card in the shape of the first substrate 52 of test card 50 and size, the shape of second substrate 54 and size can accord with in fact shape and the size of this digital picture card, the specification of the first link subgroup 56 can accord with in fact the specification of this memory stick card, and the specification of the second link subgroup 58 can accord with in fact the specification of this digital picture card, therefore the test card 50 of third embodiment of the invention can be used to test the memory stick card draw-in groove of card reader 11 and the read functions of digital picture card draw-in groove simultaneously.
Refer to Fig. 9 and Figure 10, Fig. 9 and Figure 10 is respectively schematic appearance and the side view of a test card 70 of fourth embodiment of the invention.As shown in Figures 9 and 10, the test card 70 of the 4th embodiment includes first substrate 72, second substrate 74,1 first link subgroup 76 and an one second link subgroup 78, the two substrates of test card 70 and the configuration of two link subgroups and function as in the foregoing embodiment, therefore are not described in detail in this.The difference of the 4th embodiment and previous embodiment is in shape and the size that can accord with in fact this memory stick card in the shape of the first substrate 72 of test card 70 and size, the shape of second substrate 74 and size can accord with in fact shape and the size of this safety digital storage card, the specification of the first link subgroup 76 can accord with in fact the specification of this memory stick card, and the specification of the second link subgroup 78 can accord with in fact the specification of this safety digital storage card.Therefore the test card 70 of fourth embodiment of the invention can be used to test the memory stick card draw-in groove of card reader 11 and the read functions of safety digital storage card draw-in groove simultaneously.
Compared to prior art, multiple test storage card with different size and size is integrated into the test card of an All-in-One by the present invention.Test card of the present invention is by special structural design, with each corresponding draw-in groove making multiple substrates of test card can insert card reader simultaneously, and the multiple link subgroup be arranged on different substrate can contact to electrically conduct with the corresponding transmission ends subgroup of each draw-in groove simultaneously.Therefore the present invention can in a test process, such as test card (test storage card) is inserted card reader, multiple draw-in grooves with different size of card reader are carried out to the verification and testing of reliability or qualification rate simultaneously, therefore significantly can reduce the time of test process, and then effectively avoid manual operation exception and save human cost, use lifting production capacity.
The foregoing is only preferred embodiment of the present invention, every equalization done according to the scope of claims of the present invention changes and modifies, and all should belong to covering scope of the present invention.
Claims (35)
1. be used for testing a test card for the card reader with multiple memory card specifications, this test card comprises:
One first substrate;
One second substrate, this second substrate part is embedded in a surface of this first substrate, and a length of this second substrate is less than in fact a length of this first substrate;
One first link subgroup, this first link subgroup is arranged at the one end on this surface of this first substrate, and is not covered by this second substrate, and this first link subgroup is used for contacting to electrically conduct with one first transmission ends subgroup of a card reader; And
One second link subgroup, this the second link subgroup is arranged at one end of this second substrate, and this second link subgroup is used for contacting to electrically conduct with one second transmission ends subgroup of this card reader when this first link subgroup contacts with this first transmission ends subgroup.
2. test card as claimed in claim 1, wherein this second link subgroup is used for contacting to electrically conduct with this second transmission ends subgroup of this card reader when this first substrate inserts this card reader and is only butted on a retaining part of this card reader.
3. test card as claimed in claim 1, is provided with a test resistance between each adjacent first splicing ear of wherein this first link subgroup.
4. the test card as described in claim 1 or 3, is provided with a test resistance between each adjacent second splicing ear of wherein this second link subgroup.
5. test card as claimed in claim 4, this test card also comprises:
One grips end, and the other end of this gripping end this first substrate coated and this second substrate, this gripping end is used for covering this test resistance, and exposes to this card reader when this first substrate and this second substrate insert this card reader.
6. test card as claimed in claim 1, this test card also comprises:
One grips end, the other end of this gripping end this first substrate coated and this second substrate, and this gripping end is used for covering one test resistance, and exposes to this card reader when this first substrate and this second substrate insert this card reader.
7. test card as claimed in claim 1, wherein the surface of this second substrate is formed with a pilot hole, and this pilot hole is used for this second substrate auxiliary to be partly fitted together to this surface that mode is positioned this first substrate.
8. test card as claimed in claim 1, wherein this second substrate is embedded in this surface of this first substrate by gluing mode.
9. test card as claimed in claim 1, a thickness of the wherein combination of this first substrate and this second substrate is less than the summation of a thickness of this first substrate and a thickness of this second substrate.
10. test card as claimed in claim 1, this test card also comprises:
One lead angle structure, this lead angle structure is formed at this end of this first substrate, and this lead angle structure is used for guiding this first substrate and inserts this card reader.
11. test cards as claimed in claim 1, wherein the shape of this first substrate and size accord with in fact shape and the size of a safety digital storage card, and the specification of this first link subgroup accords with in fact the specification of this safety digital storage card.
12. test cards as described in claim 1 or 11, wherein the shape of this second substrate and size accord with in fact shape and the size of a digital picture card, and the specification of this second link subgroup accords with in fact the specification of this digital picture card.
13. test cards as claimed in claim 1, this test card also comprises:
One the 3rd substrate, the chimeric surface having this first substrate part of this second substrate to be embedded in the 3rd substrate, this length of this first substrate is less than in fact a length of the 3rd substrate; And
One the 3rd link subgroup, the 3rd link subgroup is arranged at the one end on this surface of the 3rd substrate, and is not covered by this first substrate, and the 3rd link subgroup is used for contacting to electrically conduct with one the 3rd transmission ends subgroup of this card reader.
14. test cards as claimed in claim 12, this test card also comprises:
One the 3rd substrate, the chimeric surface having this first substrate part of this second substrate to be embedded in the 3rd substrate, this length of this first substrate is less than in fact a length of the 3rd substrate; And
One the 3rd link subgroup, the 3rd link subgroup is arranged at the one end on this surface of the 3rd substrate, and is not covered by this first substrate, and the 3rd link subgroup is used for contacting to electrically conduct with one the 3rd transmission ends subgroup of this card reader.
15. test cards as claimed in claim 13, wherein this second link subgroup is used for contacting to electrically conduct with this second transmission ends subgroup of this card reader when the 3rd substrate inserts this card reader and is only butted on a retaining part of this card reader.
16. test cards as claimed in claim 13, are provided with a test resistance between each adjacent 3rd splicing ear of wherein the 3rd link subgroup.
17. test cards as claimed in claim 13, this test card also comprises:
One grips end, and the other end of this gripping end this first substrate coated, this second substrate and the 3rd substrate, this gripping end exposes to this card reader when this first substrate, this second substrate and the 3rd substrate insert this card reader.
18. test cards as claimed in claim 13, wherein the surface of this second substrate is formed with a pilot hole, and this pilot hole is used for this second substrate auxiliary and this first substrate and is positioned this surface of the 3rd substrate in the chimeric mode of part.
19. test cards as claimed in claim 13, wherein this second substrate and this first substrate are embedded in this surface of the 3rd substrate by gluing mode.
20. test cards as claimed in claim 13, a thickness of the wherein combination of this first substrate, this second substrate and the 3rd substrate is less than in fact the summation of a thickness of a thickness of this first substrate, a thickness of this second substrate and the 3rd substrate.
21. test cards as claimed in claim 13, this test card also comprises:
One lead angle structure, this lead angle structure is formed at this end of the 3rd substrate, and this lead angle structure is used for guiding the 3rd substrate and inserts this card reader.
22. test cards as claimed in claim 13, wherein the shape of the 3rd substrate and size accord with in fact shape and the size of a memory stick card, and the specification of the 3rd link subgroup accords with in fact the specification of this memory stick card.
23. test cards as claimed in claim 14, wherein this second link subgroup is used for contacting to electrically conduct with this second transmission ends subgroup of this card reader when the 3rd substrate inserts this card reader and is only butted on a retaining part of this card reader.
24. test cards as claimed in claim 14, are provided with a test resistance between each adjacent 3rd splicing ear of wherein the 3rd link subgroup.
25. test cards as claimed in claim 14, this test card also comprises:
One grips end, and the other end of this gripping end this first substrate coated, this second substrate and the 3rd substrate, this gripping end exposes to this card reader when this first substrate, this second substrate and the 3rd substrate insert this card reader.
26. test cards as claimed in claim 14, wherein the surface of this second substrate is formed with a pilot hole, and this pilot hole is used for this second substrate auxiliary and this first substrate and is positioned this surface of the 3rd substrate in the chimeric mode of part.
27. test cards as claimed in claim 14, wherein this second substrate and this first substrate are embedded in this surface of the 3rd substrate by gluing mode.
28. test cards as claimed in claim 14, a thickness of the wherein combination of this first substrate, this second substrate and the 3rd substrate is less than in fact the summation of a thickness of a thickness of this first substrate, a thickness of this second substrate and the 3rd substrate.
29. test cards as claimed in claim 14, this test card also comprises:
One lead angle structure, this lead angle structure is formed at this end of the 3rd substrate, and this lead angle structure is used for guiding the 3rd substrate and inserts this card reader.
30. test cards as claimed in claim 14, wherein the shape of the 3rd substrate and size accord with in fact shape and the size of a memory stick card, and the specification of the 3rd link subgroup accords with in fact the specification of this memory stick card.
31. test cards as claimed in claim 1, wherein the shape of this first substrate and size accord with in fact shape and the size of a memory stick card, and the specification of this first link subgroup accords with in fact the specification of this memory stick card.
32. test cards as claimed in claim 31, wherein the shape of this second substrate and size accord with in fact shape and the size of a digital picture card, and the specification of this second link subgroup accords with in fact the specification of this digital picture card.
33. test cards as claimed in claim 31, wherein the shape of this second substrate and size accord with in fact shape and the size of a safety digital storage card, and the specification of this second link subgroup accords with in fact the specification of this safety digital storage card.
34. test cards as described in claim 1 or 13, this test card also comprises:
One insulation catch, this insulation catch is can be covered in this first link subgroup or this second link subgroup by detachable manner.
35. test cards as claimed in claim 14, this test card also comprises:
One insulation catch, this insulation catch is can be covered in this first link subgroup or this second link subgroup by detachable manner.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110067382.6A CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
| TW100109857A TWI470238B (en) | 2011-03-21 | 2011-03-23 | Testing card of testing a card reader comforming to cards with different specifications |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110067382.6A CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102692578A CN102692578A (en) | 2012-09-26 |
| CN102692578B true CN102692578B (en) | 2016-04-27 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110067382.6A Expired - Fee Related CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
Country Status (2)
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| CN (1) | CN102692578B (en) |
| TW (1) | TWI470238B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104034992A (en) * | 2013-03-08 | 2014-09-10 | 达丰(上海)电脑有限公司 | Card reader pin test fixture and method |
| CN105510755A (en) * | 2016-01-25 | 2016-04-20 | 联宝(合肥)电子科技有限公司 | Testing device |
| CN107643134A (en) * | 2017-07-28 | 2018-01-30 | 福建联迪商用设备有限公司 | A kind of IC-card seat elastic force method of testing and terminal and test card and test machine |
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| CN1265762A (en) * | 1997-07-31 | 2000-09-06 | 格姆普拉斯有限公司 | Smart card reader with microcontroller and security component |
| CN2736859Y (en) * | 2004-08-12 | 2005-10-26 | 庆盟工业股份有限公司 | Card reading device for integrated memory card |
| TWM326243U (en) * | 2007-01-18 | 2008-01-21 | Dongguan E Conn Electronic Co | Memory card connector |
| TW200846679A (en) * | 2007-05-18 | 2008-12-01 | Li-Ling Wang | Testing and classifying machine capable of initially using and further reading and writing test card |
| TW200915090A (en) * | 2007-09-28 | 2009-04-01 | Super Talent Electronics Inc | Flash memory controller controlling various flash memory cells |
| TW201100819A (en) * | 2009-06-22 | 2011-01-01 | Hon Hai Prec Ind Co Ltd | Fixture and method for testing a card reader |
| TW201110033A (en) * | 2009-09-07 | 2011-03-16 | Hon Hai Prec Ind Co Ltd | System and method for testing a multi-card reader |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4458447B2 (en) * | 2000-11-10 | 2010-04-28 | 株式会社アドバンテスト | Electronic component test holding device, electronic component test device, and electronic component test method |
| TWI274994B (en) * | 2005-09-23 | 2007-03-01 | Hon Hai Prec Ind Co Ltd | System and method for testing a card reader |
| TWM311087U (en) * | 2006-11-03 | 2007-05-01 | Tai Twun Entpr Co Ltd | Card-reading machine used for memory card |
| CN101923504B (en) * | 2009-06-16 | 2012-11-21 | 鸿富锦精密工业（深圳）有限公司 | Card reader testing tool and card reader testing method |
-
2011
- 2011-03-21 CN CN201110067382.6A patent/CN102692578B/en not_active Expired - Fee Related
- 2011-03-23 TW TW100109857A patent/TWI470238B/en not_active IP Right Cessation
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1265762A (en) * | 1997-07-31 | 2000-09-06 | 格姆普拉斯有限公司 | Smart card reader with microcontroller and security component |
| CN2736859Y (en) * | 2004-08-12 | 2005-10-26 | 庆盟工业股份有限公司 | Card reading device for integrated memory card |
| TWM326243U (en) * | 2007-01-18 | 2008-01-21 | Dongguan E Conn Electronic Co | Memory card connector |
| TW200846679A (en) * | 2007-05-18 | 2008-12-01 | Li-Ling Wang | Testing and classifying machine capable of initially using and further reading and writing test card |
| TW200915090A (en) * | 2007-09-28 | 2009-04-01 | Super Talent Electronics Inc | Flash memory controller controlling various flash memory cells |
| TW201100819A (en) * | 2009-06-22 | 2011-01-01 | Hon Hai Prec Ind Co Ltd | Fixture and method for testing a card reader |
| TW201110033A (en) * | 2009-09-07 | 2011-03-16 | Hon Hai Prec Ind Co Ltd | System and method for testing a multi-card reader |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201307859A (en) | 2013-02-16 |
| TWI470238B (en) | 2015-01-21 |
| CN102692578A (en) | 2012-09-26 |
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