CN102692578A - Test card used for testing card reader having a plurality of memory card specifications - Google Patents
Test card used for testing card reader having a plurality of memory card specifications Download PDFInfo
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- CN102692578A CN102692578A CN2011100673826A CN201110067382A CN102692578A CN 102692578 A CN102692578 A CN 102692578A CN 2011100673826 A CN2011100673826 A CN 2011100673826A CN 201110067382 A CN201110067382 A CN 201110067382A CN 102692578 A CN102692578 A CN 102692578A
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Abstract
The invention provides a test card used for testing a card reader having a plurality of memory card specifications. The test card comprises a first substrate, a second substrate, a first connection terminal group and a second connection terminal group, wherein the second substrate is partially embedded in a surface of the first substrate, the length of the second substrate is substantially smaller than the length of the first substrate, the first connection terminal group is arranged at one end of the surface of the first substrate, is not shielded by the second substrate and is used for contacting with a first transmission terminal group of the card reader to realize electricity conduction, and the second connection terminal group is arranged at one end of the second substrate and is used for contacting with a second transmission terminal group of the card reader to realize the electricity conduction when the first connection terminal group contacts with the first transmission terminal group. According to the invention, test time is greatly reduced; and productivity is improved effectively by avoiding human abnormal operation and saving manpower cost.
Description
Technical field
The present invention relates to a kind of test card that is used for testing card reader, refer to a kind of test card that can be used to test card reader especially with multiple memory card specifications.
Background technology
In general, portable electron device, a notebook computer for example can be provided with the card reader of the storage card that can read plurality of specifications, usually so that the user reads or the data of storage memory card.The type of storage card can be divided into secure digital storage card (Secure Digital Memory Card, SD card), digital picture card (Extreme Digital-Picture Card, XD card) or memory stick card (Memory Stick Card, MS card) etc.The qualitative control of carrying out product at factory end is during with validation test, and the tester needs respectively the storage card of different size is inserted in the corresponding slot of card reader, just can carry out qualification rate to the slot of this specification and test.For instance, during the qualification rate of the secure digital storage card slot of desire test card reader, the tester inserts the secure digital storage card slot of card reader with a secure digital storage card, and utilizes automatic test technology to carry out the qualification rate test.Then when desire is tested the qualification rate of digital picture card slot of card reader; The tester needs the card (like the secure digital storage card) that the last time test is used is extracted out; Just can the digital picture card be inserted the digital picture card slot of card reader, to proceed the checking of digital picture card slot, meaning is the storage card that traditional method need be prepared a plurality of different sizes; And each storage card inserted each draw-in groove of card reader respectively, to carry out test and validation respectively.Thus, the suitable very complicated of traditional test formality of card reader easily because of the human operational error reduces accuracy of test, and need expend higher man-hour, ties down the overall throughput of production line.
Therefore, a kind of test card that is used for testing the card reader with multiple memory card specifications need be provided, to address the above problem.
Summary of the invention
The present invention provides a kind of test card that can be used to test the card reader with multiple memory card specifications, to solve the above problems.
The present invention discloses a kind of test card that is used for testing the card reader with multiple memory card specifications, and this test card includes one first substrate, one second substrate, one first splicing ear group and one second splicing ear group; This second substrate portion is embedded in a surface of this first substrate, and a length of this second substrate is in fact less than a length of this first substrate; This first splicing ear group is arranged at an end on this surface of this first substrate, and is not covered by this second substrate, and this first splicing ear group is used for one first transmission terminal groups of contact with a card reader to electrically conduct; This second splicing ear group is arranged at an end of this second substrate, this second splicing ear group be used for when this first splicing ear group and this first transmission terminal groups of contact and one second transmission terminal groups of contact of this card reader to electrically conduct.
The present invention also disclose this second splicing ear group be used for when this first substrate inserts this card reader and only be butted on a retaining part of this card reader and this second transmission terminal groups of contact of this card reader to electrically conduct.
The present invention also discloses between each adjacent first splicing ear of this first splicing ear group and is provided with a test resistance.
The present invention also discloses between each adjacent second splicing ear of this second splicing ear group and is provided with a test resistance.
The present invention also discloses this test card and also includes one and grip the end, and it coats the other end of this first substrate and this second substrate, and this grips the end and when this first substrate and this card reader of this second substrate insertion, exposes to this card reader.
The surface that the present invention also discloses this second substrate is formed with a pilot hole, and this pilot hole is used for assisting this second substrate to be positioned this surface of this first substrate with the chimeric mode of part.
The present invention also discloses the thickness of combination of this first substrate and this second substrate less than the summation of a thickness of a thickness of this first substrate and this second substrate.
The present invention also discloses this test card and also includes a lead angle structure, and it is formed at this end of this first substrate, and this lead angle structure is used for guiding this first substrate and inserts this card reader.
The side that the present invention also discloses this second substrate is formed with a disappointing groove.
The present invention also discloses this test card and also includes one the 3rd substrate and one the 3rd splicing ear group.The 3rd substrate is chimeric to have this first substrate portion of this second substrate to be embedded in a surface of the 3rd substrate, and this length of this first substrate is in fact less than a length of the 3rd substrate.The 3rd splicing ear group is arranged at an end on this surface of the 3rd substrate, and is not covered by this first substrate.The 3rd splicing ear group is used for one the 3rd transmission terminal groups of contact with this card reader to electrically conduct.
The present invention also disclose this second splicing ear group be used for when the 3rd substrate inserts this card reader and only be butted on a retaining part of this card reader and this second transmission terminal groups of contact of this card reader to electrically conduct.
The present invention also discloses between each adjacent the 3rd splicing ear of the 3rd splicing ear group and is provided with a test resistance.
The present invention also discloses the thickness of combination of this first substrate, this second substrate and the 3rd substrate less than the summation of a thickness of thickness of a thickness of this first substrate, this second substrate and the 3rd substrate.
The present invention also discloses the shape of this first substrate, this second substrate and the 3rd substrate and shape and the size that size can meet a secure digital storage card, a digital picture card and a memory stick card respectively, and the specification of this first splicing ear group, this second splicing ear group and the 3rd splicing ear group meets the specification of this secure digital storage card, this digital picture card and this memory stick card in fact respectively.
It is a card type structure that the present invention also discloses this test card.
The present invention is integrated into a plurality of tests with different size and size the card type test card of an All-in-One with storage card.Test card of the present invention passes through special structural design; So that a plurality of substrates of test card can insert each corresponding draw-in groove of card reader simultaneously, and be arranged at multiple splicing ear group on the different substrate can be simultaneously with the corresponding transmission terminal groups of contact of each draw-in groove to electrically conduct.Therefore the present invention can be in test process; For example test card (storage card is used in test) is inserted card reader; A plurality of draw-in grooves with different size of reading card device carry out the verification and testing of reliability or qualification rate simultaneously; So can significantly reduce the time of test process, and then effectively avoid the unusual and saving human cost of manual operation, use the lifting production capacity.
Description of drawings
Fig. 1 is the assembly decomposing schematic representation of the test card of first embodiment of the invention.
Fig. 2 is the test card of first embodiment of the invention and the schematic appearance of card reader.
Fig. 3 is the side view of the test card of first embodiment of the invention.
Fig. 4 is the inner structure synoptic diagram of test card of the present invention and card reader.
Fig. 5 is the schematic appearance of the test card of second embodiment of the invention.
Fig. 6 is the side view of the test card of second embodiment of the invention.
Fig. 7 and Fig. 8 are respectively the schematic appearance and the side view of the test card of third embodiment of the invention.
Fig. 9 and Figure 10 are respectively the schematic appearance and the side view of the test card of fourth embodiment of the invention.
The primary clustering symbol description:
10,30,50,70 test cards, 11 card reader
111 first transmission terminal groups, 113 second transmission terminal groups
115 the 3rd transmission terminal groups, 117 retaining parts
12,32,52,72 first substrates, 14,34,54,74 second substrates
141,341 pilot holes, 143,343 disappointing grooves
16 the 3rd substrates, 18,36,56,76 first splicing ear groups
181 test resistance, 20,38,58,78 second splicing ear groups
22 the 3rd splicing ear groups 24,40 grip the end
26,42 lead angle structures, 44 insulation catch
Embodiment
See also Fig. 1 to Fig. 3; Fig. 1 is the assembly decomposing schematic representation of a test card 10 of first embodiment of the invention; Fig. 2 is the test card 10 of first embodiment of the invention and the schematic appearance of a card reader 11, and Fig. 3 is the side view of the test card 10 of first embodiment of the invention.Whether test card 10 is used for testing the card reader 11 with multiple memory card specifications, normal with the function of the draw-in groove of checking card reader 11 corresponding different storing card specifications.User's card reader 11 capable of using reads many storage cards with different size, and in general, the compatible memory card specifications of the slot of common card reader can include the specification of secure digital storage card, digital picture card or memory stick card etc.Therefore test card 10 of the present invention can insert in each slot of card reader 11 simultaneously, so that whether the user can test the read functions of each slot with different storing card specification of card reader 11 simultaneously normal.It is said that wherein the specification of compatible memory card specifications of the slot of card reader 11 and corresponding test card 10 can be not limited to the foregoing description, looks actual demand and decide.
As shown in Figure 1, can be provided with a test resistance 181 between each adjacent first splicing ear of the first splicing ear group 18 (or the second splicing ear group 20, the 3rd splicing ear group 22) (or each adjacent second splicing ear, each adjacent the 3rd splicing ear).When test card 10 inserts card reader 11; And each splicing ear group (first splicing ear group 18, the second splicing ear group 20 and the 3rd splicing ear group 22) and each corresponding transmission terminal groups of contact are when electrically conducting; Whether the user is that an automatic test equipment (ATE) capable of using is verified test card 10 and card reader 11 effectively, normal with the read functions of confirming this each draw-in groove of card reader.
For instance, see also Fig. 4, Fig. 4 is the inner structure synoptic diagram of test card 10 of the present invention and card reader 11.After the first splicing ear group 18 of test card 10 contacts the first transmission terminal group 111 of card reader 11; The user directly contacts the probe of ATE the signal testing point of the first transmission terminal group 111; With the resistance value size by the test resistance 181 between each adjacent first splicing ear that measures the first splicing ear group 18, whether the function of checking card reader 11 is normal.
In addition, to shown in Figure 3, test card 10 also can include one and grip end 24 like Fig. 1, and it coats an end of first substrate 12, second substrate 14 and the 3rd substrate 16.The user grips end 24 and is used for coverage test resistance 181 and exposes, and when first substrate 12, second substrate 14 and the 3rd substrate 16 insert card reader 11, expose to card reader 11, so that can push or pull test card 10 moves relative to card reader 11 to prevent it.The surface of second substrate 14 can be formed with a pilot hole 141; And a side of second substrate 14 can be formed with a disappointing groove 143; Pilot hole 141 is used for auxiliary second substrate 14 and first substrate 12 and is positioned this surface of the 3rd substrate 16 with the chimeric mode of part, and the groove 143 that loses heart is used for when test card 10 inserts card reader 11, getting rid of unnecessary air with adjusting pressure.Test card 10 also can include a lead angle structure 26, and it is formed at this end of the 3rd substrate 16, and lead angle structure 26 is used for guiding the 3rd substrate 16 and inserts card reader 11.What deserves to be mentioned is; Because this surface of chimeric first substrate 12 of second substrate, 14 parts; And this surface of chimeric the 3rd substrate 16 of first substrate, 12 parts; So a thickness of the combination of first substrate 12, second substrate 14 and the 3rd substrate 16 can be in fact less than the summation of a thickness of thickness of a thickness of first substrate 12, second substrate 14 and the 3rd substrate 16, so that each substrate of test card 10 can insert the corresponding draw-in groove of card reader 11 simultaneously.
In the first embodiment of the present invention, the shape of first substrate 12 and size can accord with the shape and the size of a secure digital storage card in fact, and the specification of the first splicing ear group 18 can accord with the specification of this secure digital storage card in fact.The shape of second substrate 14 and size can accord with the shape and the size of a digital picture card in fact, and the specification of the second splicing ear group 20 can accord with the specification of this digital picture card in fact.The shape of the 3rd substrate 16 and size can accord with the shape and the size of a memory stick card in fact, and the specification of the 3rd splicing ear group 22 can accord with the specification of this memory stick card in fact.Therefore the test card 10 of first embodiment of the invention can be used to when inserting card reader 11; Test the read functions of secure digital storage card draw-in groove, digital picture card draw-in groove and the memory stick card draw-in groove of card reader 11 simultaneously, or can one insulation catch 44 (the electrical insulator pad of for example forming) by plastic material be shielded on the first splicing ear group 18 (or the second splicing ear group 20, the 3rd splicing ear group 22).Insulation catch 44 can be used to the electric connection of the isolated first splicing ear group 18 (or the second splicing ear group 20 or the 3rd splicing ear group 22) and the first transmission terminal group 111 (or the second transmission terminal group 113 or the 3rd transmission terminal group 115) of card reader 11, uses the function of the SD card of optionally testing card reader 11 (or XD card, MS card).
See also Fig. 5 and Fig. 6, Fig. 5 is the schematic appearance of a test card 30 of second embodiment of the invention, and Fig. 6 is the side view of the test card 30 of second embodiment of the invention.Test card 30 can include one first substrate 32, one second substrate 34, one first splicing ear group 36 and one second splicing ear group 38.Be provided with a test resistance between each adjacent first splicing ear of the first splicing ear group 36 (or second splicing ear group 38) (or each adjacent second splicing ear).Wherein the configuration and the function of this test resistance, first substrate 32, one second substrate 34, one first splicing ear group 36 and one second splicing ear group 38 are of first embodiment, so be not described in detail in this.As shown in Figure 6; Because second substrate, 34 parts are embedded in a surface of first substrate 32; So a thickness of the combination of first substrate 32 and second substrate 34 is less than the summation of a thickness of the thickness of first substrate 32 and second substrate 34, so that first substrate 32 of test card 30 and second substrate 34 can insert the corresponding draw-in groove of card reader 11 simultaneously.
In addition, test card 30 also can include one and grip end 40, and it coats the other end of first substrate 32 and second substrate 34; Test card 30 also can include a lead angle structure 42, and it is formed at this end of first substrate 32.The surface of second substrate 34 can be formed with a pilot hole 341, and a side of second substrate 34 can be formed with a disappointing groove 343.The structure and the function that grip end 40, pilot hole 341, disappointing groove 343 and lead angle structure 42 are of first embodiment, so be not described in detail in this.The difference of second embodiment and first embodiment is in test card 30 and is made up of two substrates; So user's test card 30 capable of using is tested wherein two draw-in grooves with different size of card reader 11; For instance; The shape of first substrate 32 of test card 30 and size can accord with the shape and the size of this secure digital storage card in fact; The specification of the first splicing ear group 36 can accord with the specification of this secure digital storage card in fact; The shape of second substrate 34 and size can accord with the shape and the size of this digital picture card in fact, and the specification of the second splicing ear group 38 can accord with the specification of this digital picture card in fact, so the test card 30 of second embodiment of the invention can be used to test simultaneously the secure digital storage card draw-in groove of card reader 11 and the read functions of digital picture card draw-in groove.
See also Fig. 7 and Fig. 8, Fig. 7 and Fig. 8 are respectively the schematic appearance and the side view of a test card 50 of third embodiment of the invention.Like Fig. 7 and shown in Figure 8; The test card 50 of the 3rd embodiment includes one first substrate 52, one second substrate 54, one first splicing ear group 56 and one second splicing ear group 58; The configuration of the two substrates of test card 50 and two splicing ear groups and function such as previous embodiment are said, so be not described in detail in this.The difference of the 3rd embodiment and previous embodiment is in the shape and the size that can accord with this memory stick card in the shape of first substrate 52 of test card 50 and size in fact; The shape of second substrate 54 and size can accord with the shape and the size of this digital picture card in fact; The specification of the first splicing ear group 56 can accord with the specification of this memory stick card in fact; And the specification of the second splicing ear group 58 can accord with the specification of this digital picture card in fact, so the test card 50 of third embodiment of the invention can be used to test simultaneously the memory stick card draw-in groove of card reader 11 and the read functions of digital picture card draw-in groove.
See also Fig. 9 and Figure 10, Fig. 9 and Figure 10 are respectively the schematic appearance and the side view of a test card 70 of fourth embodiment of the invention.Like Fig. 9 and shown in Figure 10; The test card 70 of the 4th embodiment includes one first substrate 72, one second substrate 74, one first splicing ear group 76 and one second splicing ear group 78; The configuration of the two substrates of test card 70 and two splicing ear groups and function such as previous embodiment are said, so be not described in detail in this.The difference of the 4th embodiment and previous embodiment is in the shape and the size that can accord with this memory stick card in the shape of first substrate 72 of test card 70 and size in fact; The shape of second substrate 74 and size can accord with the shape and the size of this secure digital storage card in fact; The specification of the first splicing ear group 76 can accord with the specification of this memory stick card in fact, and the specification of the second splicing ear group 78 can accord with the specification of this secure digital storage card in fact.Therefore the test card 70 of fourth embodiment of the invention can be used to test simultaneously the memory stick card draw-in groove of card reader 11 and the read functions of secure digital storage card draw-in groove.
Than prior art, the present invention is integrated into a plurality of tests with different size and size the test card of an All-in-One with storage card.Test card of the present invention passes through special structural design; So that a plurality of substrates of test card can insert each corresponding draw-in groove of card reader simultaneously, and be arranged at multiple splicing ear group on the different substrate can be simultaneously with the corresponding transmission terminal groups of contact of each draw-in groove to electrically conduct.Therefore the present invention can be in test process; For example test card (storage card is used in test) is inserted card reader; A plurality of draw-in grooves with different size of reading card device carry out the verification and testing of reliability or qualification rate simultaneously; So can significantly reduce the time of test process, and then effectively avoid the unusual and saving human cost of manual operation, use the lifting production capacity.
The above is merely preferred embodiment of the present invention, and every equalization that the scope of claims is done according to the present invention changes and modifies, and all should belong to covering scope of the present invention.
Claims (24)
1. test card that is used for testing card reader with multiple memory card specifications, this test card comprises:
One first substrate;
One second substrate, this second substrate portion is embedded in a surface of this first substrate, and a length of this second substrate is in fact less than a length of this first substrate;
One first splicing ear group, this first splicing ear group is arranged at an end on this surface of this first substrate, and is not covered by this second substrate, and this first splicing ear group is used for one first transmission terminal groups of contact with a card reader to electrically conduct; And
One second splicing ear group; This second splicing ear group is arranged at an end of this second substrate, this second splicing ear group be used for when this first splicing ear group and this first transmission terminal groups of contact and one second transmission terminal groups of contact of this card reader to electrically conduct.
2. test card as claimed in claim 1, wherein this second splicing ear group be used for when this first substrate inserts this card reader and only be butted on a retaining part of this card reader and this second transmission terminal groups of contact of this card reader to electrically conduct.
3. test card as claimed in claim 1 wherein is provided with a test resistance between each adjacent first splicing ear of this first splicing ear group.
4. like claim 1 or 3 described test cards, wherein be provided with a test resistance between each adjacent second splicing ear of this second splicing ear group.
5. like claim 1 or 4 described test cards, this test card also comprises:
One grips the end, and this grips the other end that the end coats this first substrate and this second substrate, and this grips the end and is used for covering this test resistance, and when this first substrate and this card reader of this second substrate insertion, exposes to this card reader.
6. test card as claimed in claim 1, wherein the surface of this second substrate is formed with a pilot hole, and this pilot hole is used for assisting this second substrate to be positioned this surface of this first substrate with the chimeric mode of part.
7. test card as claimed in claim 1, wherein this second substrate is embedded in this surface of this first substrate by the gluing mode.
8. test card as claimed in claim 1, wherein a thickness of the combination of this first substrate and this second substrate is less than the summation of a thickness of a thickness of this first substrate and this second substrate.
9. test card as claimed in claim 1, this test card also comprises:
One lead angle structure, this lead angle structure is formed at this end of this first substrate, and this lead angle structure is used for guiding this first substrate and inserts this card reader.
10. test card as claimed in claim 1, wherein the shape of this first substrate and size accord with the shape and the size of a secure digital storage card in fact, and the specification of this first splicing ear group accords with the specification of this secure digital storage card in fact.
11. like claim 1 or 10 described test cards, wherein the shape of this second substrate and size accord with the shape and the size of a digital picture card in fact, and the specification of this second splicing ear group accords with the specification of this digital picture card in fact.
12. like claim 1 or 11 described test cards, this test card also comprises:
One the 3rd substrate, the 3rd substrate is chimeric to have this first substrate portion of this second substrate to be embedded in a surface of the 3rd substrate, and this length of this first substrate is in fact less than a length of the 3rd substrate; And
One the 3rd splicing ear group, the 3rd splicing ear group is arranged at an end on this surface of the 3rd substrate, and is not covered by this first substrate, and the 3rd splicing ear group is used for one the 3rd transmission terminal groups of contact with this card reader to electrically conduct.
13. test card as claimed in claim 12, wherein this second splicing ear group be used for when the 3rd substrate inserts this card reader and only be butted on a retaining part of this card reader and this second transmission terminal groups of contact of this card reader to electrically conduct.
14. test card as claimed in claim 12 wherein is provided with a test resistance between each adjacent the 3rd splicing ear of the 3rd splicing ear group.
15. test card as claimed in claim 12, this test card also comprises:
One grips the end, and this grips the other end that the end coats this first substrate, this second substrate and the 3rd substrate, and this grips the end and when this first substrate, this second substrate and the 3rd substrate insert this card reader, exposes to this card reader.
16. test card as claimed in claim 12, wherein the surface of this second substrate is formed with a pilot hole, and this pilot hole is used for assisting this second substrate and this first substrate to be positioned this surface of the 3rd substrate with the chimeric mode of part.
17. test card as claimed in claim 12, wherein this second substrate and this first substrate are embedded in this surface of the 3rd substrate by the gluing mode.
18. test card as claimed in claim 12, wherein a thickness of the combination of this first substrate, this second substrate and the 3rd substrate is in fact less than the summation of a thickness of thickness of a thickness of this first substrate, this second substrate and the 3rd substrate.
19. test card as claimed in claim 12, this test card also comprises:
One lead angle structure, this lead angle structure is formed at this end of the 3rd substrate, and this lead angle structure is used for guiding the 3rd substrate and inserts this card reader.
20. test card as claimed in claim 12, wherein the shape of the 3rd substrate and size accord with the shape and the size of a memory stick card in fact, and the specification of the 3rd splicing ear group accords with the specification of this memory stick card in fact.
21. test card as claimed in claim 1, wherein the shape of this first substrate and size accord with the shape and the size of a memory stick card in fact, and the specification of this first splicing ear group accords with the specification of this memory stick card in fact.
22. test card as claimed in claim 21, wherein the shape of this second substrate and size accord with the shape and the size of a digital picture card in fact, and the specification of this second splicing ear group accords with the specification of this digital picture card in fact.
23. test card as claimed in claim 21, wherein the shape of this second substrate and size accord with the shape and the size of a secure digital storage card in fact, and the specification of this second splicing ear group accords with the specification of this secure digital storage card in fact.
24. like claim 1 or 12 described test cards, this test card also comprises:
One insulation catch, but this insulation catch is covered in this first splicing ear group or this second splicing ear group with the removal mode.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110067382.6A CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
| TW100109857A TWI470238B (en) | 2011-03-21 | 2011-03-23 | Testing card of testing a card reader comforming to cards with different specifications |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110067382.6A CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102692578A true CN102692578A (en) | 2012-09-26 |
| CN102692578B CN102692578B (en) | 2016-04-27 |
Family
ID=46858169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110067382.6A Expired - Fee Related CN102692578B (en) | 2011-03-21 | 2011-03-21 | Be used for testing the test card of the card reader with multiple memory card specifications |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN102692578B (en) |
| TW (1) | TWI470238B (en) |
Cited By (3)
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| CN104034992A (en) * | 2013-03-08 | 2014-09-10 | 达丰(上海)电脑有限公司 | Card reader pin test fixture and method |
| CN105510755A (en) * | 2016-01-25 | 2016-04-20 | 联宝(合肥)电子科技有限公司 | Testing device |
| CN107643134A (en) * | 2017-07-28 | 2018-01-30 | 福建联迪商用设备有限公司 | A kind of IC-card seat elastic force method of testing and terminal and test card and test machine |
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| TW201110033A (en) * | 2009-09-07 | 2011-03-16 | Hon Hai Prec Ind Co Ltd | System and method for testing a multi-card reader |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104034992A (en) * | 2013-03-08 | 2014-09-10 | 达丰(上海)电脑有限公司 | Card reader pin test fixture and method |
| CN105510755A (en) * | 2016-01-25 | 2016-04-20 | 联宝(合肥)电子科技有限公司 | Testing device |
| CN107643134A (en) * | 2017-07-28 | 2018-01-30 | 福建联迪商用设备有限公司 | A kind of IC-card seat elastic force method of testing and terminal and test card and test machine |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102692578B (en) | 2016-04-27 |
| TW201307859A (en) | 2013-02-16 |
| TWI470238B (en) | 2015-01-21 |
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