CN105510755A - Testing device - Google Patents
Testing device Download PDFInfo
- Publication number
- CN105510755A CN105510755A CN201610052795.XA CN201610052795A CN105510755A CN 105510755 A CN105510755 A CN 105510755A CN 201610052795 A CN201610052795 A CN 201610052795A CN 105510755 A CN105510755 A CN 105510755A
- Authority
- CN
- China
- Prior art keywords
- card
- test
- proving installation
- electrically connected
- signal processor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Abstract
The invention discloses a testing device which comprises a substrate, multiple card holders, a testing connector and a regulating part. The card holders are all arranged on the substrate and correspond to various memory cards, the testing connector is arranged on the substrate and used for being connected with an all-in-one card slot, the regulating part is arranged on the substrate and electrically connected with a signal interface of electronic equipment and the testing connector, the regulating part is set to be shifted to be electrically connected with a corresponding card holder in the multiple card holders according to a selection instruction received by the signal interface of the electronic equipment, and therefore the corresponding card holder is electrically connected with the testing connector through the regulating part. The testing device has the advantages that the testing time of the all-in-one card slot is shortened, the production line testing efficiency is improved, the phenomenon that the memory cards are damaged due to frequent inserting and pulling of the memory cards is effectively avoided, the service life of the memory cards is prolonged, and the production test cost is obviously reduced.
Description
Technical field
The present invention relates to a kind of proving installation for the All-in-One draw-in groove in test electronic.
Background technology
In notebook computer and other electronic equipment production runes, in order to improve the production yield of product, need the product of rejecting defective and hiding potential risk, to reach the management and control to production cost and later period maintenance cost.Usually a kind of method for rejecting bad product for adopting at present is tested to the reliability of electronic equipment and functional carrying out, and to carry out test to the function of the All-in-One draw-in groove in notebook computer and some other electronic equipment be one of them important step.
Main board for notebook computer test and notebook computer integrated testability (overall package complete after test) include the functional test of All-in-One draw-in groove.In existing notebook PC testing flow process, all adopt the manual mode plugging entity card (storage card) to carry out for the All-in-One draw-in groove test of main board for notebook computer and the All-in-One draw-in groove test of notebook computer entirety, concrete testing process as shown in Figure 1.In this testing process, after the test procedure startup optimization of notebook computer, the entity card inserted in the All-in-One draw-in groove of notebook computer can be tested automatically, if current entity card is tested successfully, the display end of notebook computer can point out current test result for passing through, and informs that tester inserts next entity card and tests.So repeatedly carry out, until whole All-in-One draw-in groove testing process completes.If there is the test result of an entity card to be unsuccessfully in testing, test procedure meeting automatic pause also locks whole testing process, provide the reason of test crash, maintenance repairer keeps in repair according to the entity card of this reason to test crash, then retests simultaneously.
And the shortcoming of above-mentioned test mode is as follows:
The functional test of All-in-One draw-in groove switches different types of entity card to complete all tests by hand mainly through personnel, and due to the manual frequent hot plug entity card of personnel, not only waste time and energy, and greatly shorten the serviceable life (as occurred the phenomenons such as interface wearing and tearing, soft copy damage) of entity card, namely the shortcoming of above-mentioned test mode is:
A. human cost is higher;
B. have a strong impact on the serviceable life of entity card, add production cost;
C. complete whole testing process consuming time longer, generally need 10-12 second, cause production efficiency low.
Summary of the invention
Problem to be solved by this invention is, provides a kind of cost of labor low, the proving installation of the tested object that just can be automatically switched by plug entity card without the need to operating personnel.
In order to solve the problem, the invention provides a kind of proving installation, for testing the function of the All-in-One draw-in groove on electronic equipment, described proving installation comprises:
Matrix;
Multiple card-inserted device, to be all located on described matrix and the different types of storage card of each correspondence;
Be located at the test splice for being connected with described All-in-One draw-in groove on described matrix, described test splice has the link that can simultaneously be electrically connected with each electrical interface of described All-in-One draw-in groove; And
Be located on described matrix and the regulation and control portion be electrically connected with signaling interface and the described test splice of described electronic equipment respectively, described regulation and control portion is configured to according to the selection instruction received from the signaling interface of described electronic equipment and switches to a card-inserted device corresponding with described multiple card-inserted device to be electrically connected, and is electrically connected by described regulation and control portion to make described correspondence card-inserted device with described test splice.
As preferably, the signal processor that described regulation and control portion comprises electronic switch chip and is electrically connected with signaling interface and the electronic switch chip of described electronic equipment respectively, described signal processor is configured to according to described selection instruction to the instruction of described electronic switch chip output switching.
As preferably, described proving installation also comprises the single step button be located on described matrix, the first change-over switch and carries out the manual test portion that switches and test department automatically by the first change-over switch, and described single step button and the first change-over switch are all electrically connected with described signal processor;
Described single step key configurations is only can start when described manual test portion runs, and under the trigger action of user, can send single step selection instruction to described signal processor between the starting period;
Described signal processor is also configured to when receiving described single step selection instruction to correspondingly the instruction of described electronic switch chip output switching, and to be configured to when described automatic test department runs according to default testing sequence to the instruction of described electronic switch chip output switching.
As preferably, described tester also comprises to be located on described matrix and to be carried out sequential testing portion and the interrupt test portion of switch control rule by the second change-over switch, and described second change-over switch is electrically connected with described signal processor;
Described sequential testing portion is configured to when transmitting sequential testing signal when described manual test portion run duration starts to described signal processor;
Described interrupt test portion is configured to when disconnecting the current described card-inserted device that be in connection based on user to the trigger action of described single step button when described manual test portion run duration starts;
Described signal processor is also configured to when described interrupt test portion starts, itself or by preset testing sequence again to the output switching instruction successively of described electronic switch chip, or according to described single step button to its single step selection instruction sent to correspondingly the instruction of described electronic switch chip output switching.
As preferably, described tester also comprises the multiple pilot lamp be located on described matrix, and described multiple pilot lamp and described card-inserted device one_to_one corresponding are to indicate the current storage card be in test.
As preferably, described tester also comprises being located on described matrix and turning with the USB that described signal processor is electrically connected and is connected in series mouth, and described USB turns data line serial connection mouth being connected with the signaling interface for connecting described electronic equipment.
As preferably, described matrix is a plate body.
As preferably, described electronic equipment is notebook computer.
The beneficial effect of proving installation of the present invention is:
A. shorten the test duration of All-in-One draw-in groove, improve production line testing efficiency.
B. decrease the human cost participating in test, achieve the robotization of All-in-One draw-in groove test.
C. effectively prevent the phenomenon causing storage card to damage owing to frequently plugging storage card, extend the serviceable life of storage card, reduce production test cost.
Accompanying drawing explanation
Fig. 1 is the test flow chart of All-in-One draw-in groove in this prior art.
Fig. 2 is the structural representation of tester in proving installation of the present invention.
Fig. 3 is the structural representation of the test splice in proving installation of the present invention.
Fig. 4 is the structural relation figure of proving installation of the present invention.
Fig. 5 is the use process flow diagram of proving installation of the present invention.
Reference numeral:
1-matrix; 2-card-inserted device; 3-USB turns serial connection mouth; 4-data line; 5-test splice; 6-storage card; 7-first change-over switch; 8-second change-over switch; 9-single step button; 10-regulation and control portion; 11-pilot lamp; 12-link.
Embodiment
Describe the present invention below in conjunction with accompanying drawing.
As shown in Figure 2, the present invention discloses a kind of proving installation, for testing the function of the All-in-One draw-in groove on electronic equipment.Electronic equipment in the present embodiment is notebook computer, disposal system is integrated with in the system end of notebook computer, proving installation is connected by data line 4 with electric room, specifically can install USB and turn serial connection mouth 3 on proving installation, then the two ends of data line 4 be turned with the USB on the signaling interface of notebook computer and proving installation respectively and be connected in series mouth 3 and be connected.When electronic equipment is other electronic products, a notebook computer or desktop computer etc. being integrated with disposal system independently can be set as processing mechanism.
As shown in Figure 2, proving installation comprises matrix 1 and is all located at card-inserted device 2 on matrix 1, test splice 5 and regulation and control portion 10.Particularly: the matrix 1 in the present embodiment is a plate body, other parts with different structure certainly also can be adopted as matrix 1, as installing frame.
Card-inserted device 2 is multiple, the plurality of card-inserted device 2 can read the information of different types of storage card 6 respectively, such as multiple card-inserted device 2 can read SD card respectively, mmc card, XD card, the data of MS card, and the kind of storage card 6 that the plurality of card-inserted device 2 can read is identical with coordinating the kind of the storage card 6 inserted in All-in-One draw-in groove, namely, all storage cards 6 of adaptive All-in-One draw-in groove all have a card-inserted device 2 corresponding with it, namely the plurality of card-inserted device 2 is respectively the elongated end of each subcard groove in All-in-One draw-in groove, make this storage card 6 insert with in the card-inserted device 2 of its adaptation time notebook computer is same can export the information (storage card 6 of adaptive All-in-One draw-in groove and card-inserted device 2 one_to_one corresponding in the present embodiment that store in this storage card 6, certainly, the types of adaptations of card-inserted device 2 also can more than the kind of said memory card 6, namely, card-inserted device 2 can leave dead slot when testing).
Test splice 5 is connected on matrix 1 by a wire.As shown in Figure 3, this test splice 5 has the link 12 that can simultaneously simultaneously be electrically connected with the electrical interface of each subcard groove in All-in-One draw-in groove, namely, link 12 has the multiple contact terminals be electrically connected with these electrical interfaces respectively, to make this test splice 5 can be connected with all-in-one card slot fit, the data that simultaneously can realize each storage card 6 export.
As shown in Figure 4 and Figure 5, regulation and control portion 10 is electrically connected with test splice 5, also be electrically connected with the signaling interface of electronic equipment, with being electrically connected with corresponding card-inserted device 2 for selecting the selection instruction of tested object to switch to of can receiving according to the signaling interface from electronic equipment simultaneously.The connection line of the storage card 6 in test splice 5 card-inserted device 2 corresponding with being inserted in this is namely made to be electrically connected, to test the data whether subcard groove corresponding with this card-inserted device 2 in All-in-One draw-in groove successfully can read this storage card 6.The signal processor that in the present embodiment, this regulation and control portion 10 comprises electronic switch chip and is electrically connected with the signaling interface of electronic switch chip and electronic equipment respectively.Wherein test splice 5 and card-inserted device 2 are all electrically connected with electronic switch chip.When electronic equipment will carry out Function detection to next son draw-in groove after the function of one of them subcard groove having detected All-in-One draw-in groove, selection instruction can be sent to the signal processor of proving installation, the content of signal processor just according to this instruction after receiving selection instruction exports corresponding switching command to electronic switch chip, test splice 5 is electrically connected with the connection line being plugged in the storage card 6 of specifying in card-inserted device 2, and then realizes the automatic switchover of tested object.
Further, as shown in Figure 2, proving installation in the present embodiment also comprises to be located on matrix 1 and to be carried out opening and closing the manual test portion and automatic test department and single step button 9 that control by the first change-over switch 7, and this single step button 9 and the first change-over switch 7 are all electrically connected with signal processor.
As shown in Figure 4 and Figure 5, when the first change-over switch 7 opens automatic test department, all test processs of All-in-One draw-in groove carry out automatically by proving installation, omnidistance without the need to any manual operation, if the namely equal zero defect of each interface of All-in-One draw-in groove, proving installation automatically performs test and switching action from start to finish when testing, and greatly reduces cost of labor.And if certain the subcard groove in All-in-One draw-in groove goes wrong, proving installation can stop test automatically when this subcard groove being detected, and demonstrate the information about test crash at the display end of notebook computer, which such as make mistakes when testing storage card, now staff just can overhaul All-in-One draw-in groove according to this failure cause, significantly improves overhaul efficiency.
And when the first change-over switch 7 opens manual test pattern, the test link of proving installation is completed in a predetermined order by proving installation, need staff by single step button 9 manual switchover tested object simultaneously.Particularly, start when this single step button 9 is configured to only to run in manual test portion, and under the trigger action of user (such as pressing or single-click operation), can send the single step selection instruction being used for switch test object successively to signal processor between the starting period, and then the connection line realizing each storage card 6 switches.When namely running in manual test portion, operating personnel send single step selection instruction by clicking or press single step button 9 to signal processor, and signal processor sends switching command according to the instruction received to electronic switch chip and then realizes the switching of tested object.Such as: proving installation, when testing a four-in-one draw-in groove, plugs A, B, C, D tetra-storage cards 6 respectively in four card-inserted devices 2 of proving installation.When proving installation will export four storage cards 6 be in four card-inserted devices 2 successively data by order are from left to right to detect each subcard groove function of four-in-one draw-in groove, staff can click single step button 9, proving installation is made to realize exporting the data of A card, (namely in All-in-One draw-in groove, the subcard groove of corresponding A card is tested by rear) after data output is completed until A card, staff continues to click single step button 9 with the data output making proving installation realize B card, by that analogy till D card completes data output, now four-in-one draw-in groove is completed.
Further, as shown in Figure 1, proving installation also comprise be located on described matrix 1 and by the second change-over switch 8 carry out open and close control sequential testing portion and interrupt test portion, namely select opening sequence test department or interrupt test portion by the second change-over switch 8.As shown in Figure 4 and Figure 5, this second change-over switch 8 is electrically connected with signal processor simultaneously, carries out following operation during to run in manual test portion:
A, sequential testing portion can transmit sequential testing signal to signal processor after starting.Namely signal processor can after sequential testing portion starts the only sequential testing signal that transmits of receiver, and according to this signal successively switch test object, that is, in All-in-One draw-in groove, the test of each subcard groove is carried out successively one by one.If staff now clicks single step button 9, although single step button 9 can send single step selection instruction to signal processor, signal processor can not receive this selection instruction and carry out switching action according to this instruction.That is, after sequential testing portion starts, the switching of tested object is not by the impact of single step button 9.Such as: when making it run by the second change-over switch 8 opening sequence test department, if proving installation is exporting the data of A card, if when so now staff wants by clicking single step button 9 and exporting the data of B card, the single step selection instruction that proving installation can not accept single step button 9 exports the data of B card immediately, but continue the data exporting A card, until the data of A card export complete corresponding subcard groove has been tested after, then export the data of B card.Namely the subcard groove corresponding with B card is tested, by that analogy until the data completing A, B, C, D tetra-card one by one export.
B, interrupt test portion can disconnect the current card-inserted device 2 be in connection based on user to the trigger action of single step button 9.Namely, mutex relation between sequential testing portion and interrupt test portion, after interruption test department starts, if when staff wants to disconnect the card-inserted device 2 be in connection, by clicking single step button 9 to the signal of signal processor transmission for disconnecting above-mentioned card-inserted device 2.Signal processor transmits open command to electronic switch chip after receiving this signal, synchronous signal processor or by preset testing sequence again to electronic switch chip output switching instruction successively, or according to single step button 9 to its single step selection instruction sent to correspondingly the instruction of electronic switch chip output switching.Namely now staff can repeatedly press single step button 9 as required until test splice 5 and the card-inserted device 2 corresponding with the subcard groove that will test are communicated with, and can jump carry out with the switching realized between tested object.Such as: when making it run by the second change-over switch 8 opens interrupters test department, proving installation is exporting the data of A card, so now clicks single step button 9, proving installation can stop the data of output A card immediately and change the data exporting B card into; Or staff can double hit three single step buttons 9, now proving installation can change the data of output C card into after stopping exporting the data of A card.
Usually in the proper testing program of All-in-One draw-in groove, operation sequential testing portion can be adopted to carry out in order to make the test of each subcard groove in All-in-One draw-in groove, so not only can avoid testing chaotic phenomenon to occur, the phenomenon that generation staff causes test to be interrupted due to misoperation can also be avoided.And interrupt test portion normally uses when spot-check certain the subcard groove in All-in-One draw-in groove.Preferably, continue composition graphs 1, carrying out the title of the storage card 6 of data output in order to clearer, blunt display, the proving installation in the present embodiment is also provided with and card-inserted device 2 pilot lamp 11 one to one on matrix 1, is in the title of the storage card 6 in test for display.
Above embodiment is only exemplary embodiment of the present invention, and be not used in restriction the present invention, protection scope of the present invention is defined by the claims.Those skilled in the art can in essence of the present invention and protection domain, and make various amendment or equivalent replacement to the present invention, this amendment or equivalent replacement also should be considered as dropping in protection scope of the present invention.
Claims (8)
1. a proving installation, for testing the function of the All-in-One draw-in groove on electronic equipment, it is characterized in that, described proving installation comprises:
Matrix;
Multiple card-inserted device, to be all located on described matrix and the different types of storage card of each correspondence;
Be located at the test splice for being connected with described All-in-One draw-in groove on described matrix, described test splice has the link that can simultaneously be electrically connected with each electrical interface of described All-in-One draw-in groove; And
Be located on described matrix and the regulation and control portion be electrically connected with signaling interface and the described test splice of described electronic equipment respectively, described regulation and control portion is configured to according to the selection instruction received from the signaling interface of described electronic equipment and switches to a card-inserted device corresponding with described multiple card-inserted device to be electrically connected, and is electrically connected by described regulation and control portion to make described correspondence card-inserted device with described test splice.
2. proving installation according to claim 1, it is characterized in that, the signal processor that described regulation and control portion comprises electronic switch chip and is electrically connected with signaling interface and the electronic switch chip of described electronic equipment respectively, described signal processor is configured to according to described selection instruction to the instruction of described electronic switch chip output switching.
3. proving installation according to claim 2, it is characterized in that, described proving installation also comprises the single step button be located on described matrix, the first change-over switch and carries out the manual test portion that switches and test department automatically by the first change-over switch, and described single step button and the first change-over switch are all electrically connected with described signal processor;
Described single step key configurations is only can start when described manual test portion runs, and under the trigger action of user, can send single step selection instruction to described signal processor between the starting period;
Described signal processor is also configured to when receiving described single step selection instruction to correspondingly the instruction of described electronic switch chip output switching, and to be configured to when described automatic test department runs according to default testing sequence to the instruction of described electronic switch chip output switching.
4. proving installation according to claim 3, it is characterized in that, described tester also comprises to be located on described matrix and to be carried out sequential testing portion and the interrupt test portion of switch control rule by the second change-over switch, and described second change-over switch is electrically connected with described signal processor;
Described sequential testing portion is configured to when transmitting sequential testing signal when described manual test portion run duration starts to described signal processor;
Described interrupt test portion is configured to when disconnecting the current described card-inserted device that be in connection based on user to the trigger action of described single step button when described manual test portion run duration starts;
Described signal processor is also configured to when described interrupt test portion starts, itself or by preset testing sequence again to the output switching instruction successively of described electronic switch chip, or according to described single step button to its single step selection instruction sent to correspondingly the instruction of described electronic switch chip output switching.
5. proving installation according to claim 4, is characterized in that, described tester also comprises the multiple pilot lamp be located on described matrix, and described multiple pilot lamp and described card-inserted device one_to_one corresponding are to indicate the current storage card be in test.
6. proving installation according to claim 4, it is characterized in that, described tester also comprises being located on described matrix and turning with the USB that described signal processor is electrically connected and is connected in series mouth, and described USB turns data line serial connection mouth being connected with the signaling interface for connecting described electronic equipment.
7. the proving installation according to any one of claim 1-6, is characterized in that, described matrix is a plate body.
8. the proving installation according to any one of claim 1-7, is characterized in that, described electronic equipment is notebook computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610052795.XA CN105510755A (en) | 2016-01-25 | 2016-01-25 | Testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610052795.XA CN105510755A (en) | 2016-01-25 | 2016-01-25 | Testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105510755A true CN105510755A (en) | 2016-04-20 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610052795.XA Pending CN105510755A (en) | 2016-01-25 | 2016-01-25 | Testing device |
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| CN (1) | CN105510755A (en) |
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| CN107423196A (en) * | 2017-07-07 | 2017-12-01 | Tcl移动通信科技（宁波）有限公司 | A kind of more neck condition detection method, detection device and mobile terminals |
| CN108008285A (en) * | 2017-12-04 | 2018-05-08 | 丰顺县培英电声有限公司 | A kind of vehicle multimedia system test device and its method |
| WO2019071530A1 (en) * | 2017-10-12 | 2019-04-18 | 深圳传音通讯有限公司 | Testing method and testing device applicable to expansion card of intelligent apparatus |
| CN111650537A (en) * | 2020-06-17 | 2020-09-11 | 东莞华贝电子科技有限公司 | Auxiliary detection circuit, device, main board and terminal equipment |
| CN112259154A (en) * | 2020-11-16 | 2021-01-22 | 深圳市硅格半导体有限公司 | Automatic recording and testing system and method for card-inserting equipment |
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| CN112259154A (en) * | 2020-11-16 | 2021-01-22 | 深圳市硅格半导体有限公司 | Automatic recording and testing system and method for card-inserting equipment |
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